CN103247716A - 太阳能电池的制造方法及太阳能电池的制造装置 - Google Patents

太阳能电池的制造方法及太阳能电池的制造装置 Download PDF

Info

Publication number
CN103247716A
CN103247716A CN2013100478428A CN201310047842A CN103247716A CN 103247716 A CN103247716 A CN 103247716A CN 2013100478428 A CN2013100478428 A CN 2013100478428A CN 201310047842 A CN201310047842 A CN 201310047842A CN 103247716 A CN103247716 A CN 103247716A
Authority
CN
China
Prior art keywords
ion implantation
tray
units
ion
stage
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN2013100478428A
Other languages
English (en)
Chinese (zh)
Inventor
村上喜信
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sumitomo Heavy Industries Ltd
Original Assignee
Sumitomo Heavy Industries Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sumitomo Heavy Industries Ltd filed Critical Sumitomo Heavy Industries Ltd
Publication of CN103247716A publication Critical patent/CN103247716A/zh
Pending legal-status Critical Current

Links

Images

Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10FINORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F71/00Manufacture or treatment of devices covered by this subclass
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/30Electron-beam or ion-beam tubes for localised treatment of objects
    • H01J37/317Electron-beam or ion-beam tubes for localised treatment of objects for changing properties of the objects or for applying thin layers thereon, e.g. for ion implantation
    • H01J37/3171Electron-beam or ion-beam tubes for localised treatment of objects for changing properties of the objects or for applying thin layers thereon, e.g. for ion implantation for ion implantation
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P30/00Ion implantation into wafers, substrates or parts of devices
    • H10P30/20Ion implantation into wafers, substrates or parts of devices into semiconductor materials, e.g. for doping
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P72/00Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
    • H10P72/04Apparatus for manufacture or treatment
    • H10P72/0451Apparatus for manufacturing or treating in a plurality of work-stations
    • H10P72/0468Apparatus for manufacturing or treating in a plurality of work-stations comprising a chamber adapted to a particular process
    • H10P72/0471Apparatus for manufacturing or treating in a plurality of work-stations comprising a chamber adapted to a particular process comprising at least one ion or electron beam chamber
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P72/00Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
    • H10P72/70Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping
    • H10P72/76Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using mechanical means, e.g. clamps or pinches
    • H10P72/7604Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using mechanical means, e.g. clamps or pinches the wafers being placed on a susceptor, stage or support
    • H10P72/7618Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using mechanical means, e.g. clamps or pinches the wafers being placed on a susceptor, stage or support characterised by a movable susceptor, stage or support, others than those only rotating on their own vertical axis, e.g. susceptors on a rotating carrousel
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02PCLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
    • Y02P70/00Climate change mitigation technologies in the production process for final industrial or consumer products
    • Y02P70/50Manufacturing or production processes characterised by the final manufactured product

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Photovoltaic Devices (AREA)
  • Physical Vapour Deposition (AREA)
CN2013100478428A 2012-02-06 2013-02-06 太阳能电池的制造方法及太阳能电池的制造装置 Pending CN103247716A (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2012023252A JP2013161969A (ja) 2012-02-06 2012-02-06 太陽電池の製造方法および太陽電池の製造装置
JP2012-023252 2012-02-06

Publications (1)

Publication Number Publication Date
CN103247716A true CN103247716A (zh) 2013-08-14

Family

ID=48927073

Family Applications (1)

Application Number Title Priority Date Filing Date
CN2013100478428A Pending CN103247716A (zh) 2012-02-06 2013-02-06 太阳能电池的制造方法及太阳能电池的制造装置

Country Status (4)

Country Link
JP (1) JP2013161969A (https=)
KR (1) KR101436489B1 (https=)
CN (1) CN103247716A (https=)
TW (1) TW201349548A (https=)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN106981540A (zh) * 2017-03-24 2017-07-25 东莞帕萨电子装备有限公司 离子注入跑片方法和离子注入跑片系统

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6088964B2 (ja) * 2013-12-13 2017-03-01 株式会社東芝 半導体製造装置

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1313409A (zh) * 2000-03-14 2001-09-19 株式会社Epon 通过离子注入形成导电区的方法
US20080296510A1 (en) * 2004-01-06 2008-12-04 Yasuhiko Kasama Ion Implantation System and Ion Implantation System
CN101921990A (zh) * 2009-06-11 2010-12-22 日新离子机器株式会社 离子注入装置

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005347543A (ja) * 2004-06-03 2005-12-15 Sharp Corp イオンドーピング方法およびイオンドーピング装置
JP2006279041A (ja) * 2005-03-22 2006-10-12 Applied Materials Inc イオンビームを使用する基板への注入
US8153513B2 (en) 2006-07-25 2012-04-10 Silicon Genesis Corporation Method and system for continuous large-area scanning implantation process
JP4530032B2 (ja) * 2007-11-29 2010-08-25 日新イオン機器株式会社 イオンビーム照射方法およびイオンビーム照射装置
KR20100028203A (ko) * 2008-09-04 2010-03-12 주식회사 동부하이텍 포토레지스트 팝핑을 방지하기 위한 이온주입방법

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1313409A (zh) * 2000-03-14 2001-09-19 株式会社Epon 通过离子注入形成导电区的方法
US20080296510A1 (en) * 2004-01-06 2008-12-04 Yasuhiko Kasama Ion Implantation System and Ion Implantation System
CN101921990A (zh) * 2009-06-11 2010-12-22 日新离子机器株式会社 离子注入装置

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN106981540A (zh) * 2017-03-24 2017-07-25 东莞帕萨电子装备有限公司 离子注入跑片方法和离子注入跑片系统

Also Published As

Publication number Publication date
TW201349548A (zh) 2013-12-01
JP2013161969A (ja) 2013-08-19
KR101436489B1 (ko) 2014-09-02
KR20130090818A (ko) 2013-08-14

Similar Documents

Publication Publication Date Title
CN103493178A (zh) 用于原子层沉积的设备与工艺
US20170076935A1 (en) Floating wafer track with lateral stabilization mechanism
KR102354414B1 (ko) 이온주입장치 및 이온주입장치의 제어방법
CN102262998B (zh) 离子注入装置
KR102269997B1 (ko) 성막 장치, 성막 시스템 및 성막 방법
CN110819949A (zh) 成膜装置、成膜系统以及成膜方法
KR100992937B1 (ko) 진공 처리 장치
KR20140069715A (ko) 대면적 원자층 증착 장치
CN103247716A (zh) 太阳能电池的制造方法及太阳能电池的制造装置
KR101412687B1 (ko) 이온주입방법, 반송용기 및 이온주입장치
KR20140062552A (ko) 기판처리모듈 및 그를 가지는 기판처리시스템
KR101117637B1 (ko) 이온 주입 시스템
KR101898066B1 (ko) 이온주입모듈 및 그를 가지는 이온주입시스템
CN102150208B (zh) 磁记录媒体制造装置
KR20110120186A (ko) 빔 전류 밀도 분포의 조정 목표 설정 방법 및 이온 주입 장치
KR101877337B1 (ko) 이온주입장치 및 그에 사용되는 트레이
JPS61113766A (ja) エンドステ−シヨン
CN102969214B (zh) 基板处理装置及具有其的基板处理系统
JP2013131367A (ja) イオン注入装置
KR102051978B1 (ko) 기판 처리 장치
JP6529914B2 (ja) 水素プラズマ処理装置および水素プラズマ処理方法
KR101425432B1 (ko) 기판 처리 장치
KR20130103881A (ko) 기판처리장치
KR20150041126A (ko) 반도체장치의 제조방법 및 반도체 제조장치
KR20130024496A (ko) 기판처리장치, 그를 가지는 기판처리시스템 및 기판처리방법

Legal Events

Date Code Title Description
C06 Publication
PB01 Publication
C10 Entry into substantive examination
SE01 Entry into force of request for substantive examination
C02 Deemed withdrawal of patent application after publication (patent law 2001)
WD01 Invention patent application deemed withdrawn after publication

Application publication date: 20130814