CN102928774A - 用于混合信号集成电路的可测性电路 - Google Patents
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Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN103376399A (zh) * | 2012-04-24 | 2013-10-30 | 北京兆易创新科技股份有限公司 | 一种逻辑电路 |
CN104715793A (zh) * | 2013-12-11 | 2015-06-17 | 上海华虹宏力半导体制造有限公司 | 用于模拟存储器ip读功耗的电路 |
CN116106779A (zh) * | 2023-04-10 | 2023-05-12 | 盈力半导体(上海)有限公司 | 一种使能信号处理电路、降压式变换电路及芯片 |
CN116256622A (zh) * | 2023-05-15 | 2023-06-13 | 苏州贝克微电子股份有限公司 | 一种芯片的测试模式控制电路及控制方法 |
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US20050024075A1 (en) * | 2003-08-01 | 2005-02-03 | Ashok Srivastava | IDDQ testing of CMOS mixed-signal integrated circuits |
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CN101365956A (zh) * | 2006-01-09 | 2009-02-11 | Nxp股份有限公司 | 可测试的集成电路及集成电路的测试方法 |
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CN102117343A (zh) * | 2009-12-30 | 2011-07-06 | 上海华虹集成电路有限责任公司 | 用于数模混合信号芯片的可测性电路 |
CN102565681A (zh) * | 2011-12-05 | 2012-07-11 | 北京创毅视讯科技有限公司 | 混合信号芯片中测试模拟电路的装置和方法 |
CN202886554U (zh) * | 2012-11-15 | 2013-04-17 | 福建一丁芯光通信科技有限公司 | 用于混合信号集成电路的可测性电路 |
-
2012
- 2012-11-15 CN CN201210460916.6A patent/CN102928774B/zh active Active
Patent Citations (10)
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US20050024075A1 (en) * | 2003-08-01 | 2005-02-03 | Ashok Srivastava | IDDQ testing of CMOS mixed-signal integrated circuits |
US20060197697A1 (en) * | 2005-03-03 | 2006-09-07 | Semiconductor Technology Academic Research Center | On-chip signal waveform measurement apparatus for measuring signal waveforms at detection points on IC chip |
US20070090848A1 (en) * | 2005-10-25 | 2007-04-26 | Freescale Semiconductor Inc. | Design-for-test circuit for low pin count devices |
CN101365956A (zh) * | 2006-01-09 | 2009-02-11 | Nxp股份有限公司 | 可测试的集成电路及集成电路的测试方法 |
JP2008232644A (ja) * | 2007-03-16 | 2008-10-02 | Matsushita Electric Ind Co Ltd | 半導体集積回路のテストシステム |
CN101675349A (zh) * | 2007-05-02 | 2010-03-17 | Nxp股份有限公司 | Ic测试方法和设备 |
CN101303392A (zh) * | 2008-06-04 | 2008-11-12 | 北京中星微电子有限公司 | 一种数字逻辑芯片及其可测试设计的方法 |
CN102117343A (zh) * | 2009-12-30 | 2011-07-06 | 上海华虹集成电路有限责任公司 | 用于数模混合信号芯片的可测性电路 |
CN102565681A (zh) * | 2011-12-05 | 2012-07-11 | 北京创毅视讯科技有限公司 | 混合信号芯片中测试模拟电路的装置和方法 |
CN202886554U (zh) * | 2012-11-15 | 2013-04-17 | 福建一丁芯光通信科技有限公司 | 用于混合信号集成电路的可测性电路 |
Non-Patent Citations (2)
Title |
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张玥等: "集成电路可测性设计IO复用方法", 《集成电路设计与应用》 * |
王玺: "模数混合信号系统级芯片的测试与可测性设计研究", 《中国优秀硕士学位论文全文数据库信息科技辑》 * |
Cited By (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN103376399A (zh) * | 2012-04-24 | 2013-10-30 | 北京兆易创新科技股份有限公司 | 一种逻辑电路 |
CN103376399B (zh) * | 2012-04-24 | 2015-08-05 | 北京兆易创新科技股份有限公司 | 一种逻辑电路 |
CN104715793A (zh) * | 2013-12-11 | 2015-06-17 | 上海华虹宏力半导体制造有限公司 | 用于模拟存储器ip读功耗的电路 |
CN104715793B (zh) * | 2013-12-11 | 2018-02-06 | 上海华虹宏力半导体制造有限公司 | 用于模拟存储器ip读功耗的电路 |
CN116106779A (zh) * | 2023-04-10 | 2023-05-12 | 盈力半导体(上海)有限公司 | 一种使能信号处理电路、降压式变换电路及芯片 |
CN116256622A (zh) * | 2023-05-15 | 2023-06-13 | 苏州贝克微电子股份有限公司 | 一种芯片的测试模式控制电路及控制方法 |
CN116256622B (zh) * | 2023-05-15 | 2023-08-08 | 苏州贝克微电子股份有限公司 | 一种芯片的测试模式控制电路及控制方法 |
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