CN102859882B - 具有积分非线性度校正的逐次逼近寄存器模拟/数字转换器 - Google Patents
具有积分非线性度校正的逐次逼近寄存器模拟/数字转换器 Download PDFInfo
- Publication number
- CN102859882B CN102859882B CN201080066077.9A CN201080066077A CN102859882B CN 102859882 B CN102859882 B CN 102859882B CN 201080066077 A CN201080066077 A CN 201080066077A CN 102859882 B CN102859882 B CN 102859882B
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- capacitor
- correction
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Classifications
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M1/00—Analogue/digital conversion; Digital/analogue conversion
- H03M1/10—Calibration or testing
- H03M1/1009—Calibration
- H03M1/1033—Calibration over the full range of the converter, e.g. for correcting differential non-linearity
- H03M1/1038—Calibration over the full range of the converter, e.g. for correcting differential non-linearity by storing corrected or correction values in one or more digital look-up tables
- H03M1/1047—Calibration over the full range of the converter, e.g. for correcting differential non-linearity by storing corrected or correction values in one or more digital look-up tables using an auxiliary digital/analogue converter for adding the correction values to the analogue signal
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M1/00—Analogue/digital conversion; Digital/analogue conversion
- H03M1/12—Analogue/digital converters
- H03M1/34—Analogue value compared with reference values
- H03M1/38—Analogue value compared with reference values sequentially only, e.g. successive approximation type
- H03M1/46—Analogue value compared with reference values sequentially only, e.g. successive approximation type with digital/analogue converter for supplying reference values to converter
- H03M1/466—Analogue value compared with reference values sequentially only, e.g. successive approximation type with digital/analogue converter for supplying reference values to converter using switched capacitors
- H03M1/468—Analogue value compared with reference values sequentially only, e.g. successive approximation type with digital/analogue converter for supplying reference values to converter using switched capacitors in which the input S/H circuit is merged with the feedback DAC array
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M1/00—Analogue/digital conversion; Digital/analogue conversion
- H03M1/66—Digital/analogue converters
- H03M1/74—Simultaneous conversion
- H03M1/80—Simultaneous conversion using weighted impedances
- H03M1/802—Simultaneous conversion using weighted impedances using capacitors, e.g. neuron-mos transistors, charge coupled devices
- H03M1/804—Simultaneous conversion using weighted impedances using capacitors, e.g. neuron-mos transistors, charge coupled devices with charge redistribution
Landscapes
- Physics & Mathematics (AREA)
- Nonlinear Science (AREA)
- Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- Analogue/Digital Conversion (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US12/799,323 | 2010-04-22 | ||
| US12/799,323 US8223044B2 (en) | 2010-04-22 | 2010-04-22 | INL correction circuitry and method for SAR ADC |
| PCT/US2010/062014 WO2011133193A1 (en) | 2010-04-22 | 2010-12-23 | Successive approximation register analog-to-digital converter with integral non-linearity correction |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN102859882A CN102859882A (zh) | 2013-01-02 |
| CN102859882B true CN102859882B (zh) | 2016-01-27 |
Family
ID=44815346
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201080066077.9A Active CN102859882B (zh) | 2010-04-22 | 2010-12-23 | 具有积分非线性度校正的逐次逼近寄存器模拟/数字转换器 |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US8223044B2 (enExample) |
| JP (1) | JP5946443B2 (enExample) |
| CN (1) | CN102859882B (enExample) |
| WO (1) | WO2011133193A1 (enExample) |
Families Citing this family (55)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2011028674A2 (en) * | 2009-09-01 | 2011-03-10 | The Regents Of The University Of Michigan | Low-power area-efficient sar adc using dual capacitor arrays |
| JP2012151561A (ja) * | 2011-01-17 | 2012-08-09 | Seiko Epson Corp | A/d変換回路、集積回路装置及び電子機器 |
| US8581770B2 (en) * | 2011-05-04 | 2013-11-12 | Texas Instruments Incorporated | Zero-power sampling SAR ADC circuit and method |
| US20130002468A1 (en) * | 2011-06-28 | 2013-01-03 | International Business Machines Corporation | Analog-digital converter |
| US9007253B2 (en) * | 2011-12-21 | 2015-04-14 | Realtek Semiconductor Corp. | Successive-approximation-register analog-to-digital converter and method thereof |
| JP2013150117A (ja) * | 2012-01-18 | 2013-08-01 | Toshiba Corp | アナログデジタル変換器および受信機 |
| US8599059B1 (en) * | 2012-09-07 | 2013-12-03 | Mediatek Inc. | Successive approximation register analog-digital converter and method for operating the same |
| US8730074B1 (en) * | 2013-01-14 | 2014-05-20 | Intel Corporation | Successive approximation analog-to-digital conversion with gain control for tuners |
| US8957712B2 (en) * | 2013-03-15 | 2015-02-17 | Qualcomm Incorporated | Mixed signal TDC with embedded T2V ADC |
| US8981982B2 (en) * | 2013-04-05 | 2015-03-17 | Maxlinear, Inc. | Multi-zone data converters |
| US9246503B1 (en) * | 2013-09-09 | 2016-01-26 | Ateeda Ltd. | Built in self-test |
| GB201403082D0 (en) | 2014-02-21 | 2014-04-09 | Ibm | Analog-digital converter |
| US9154152B1 (en) * | 2014-03-14 | 2015-10-06 | Mediatek Inc. | Calibration and noise reduction of analog to digital converters |
| US10038454B2 (en) | 2014-04-29 | 2018-07-31 | Synopsys, Inc. | Reference voltage generator for an analog-digital converter and method for analog-digital conversion |
| US9071265B1 (en) | 2014-08-12 | 2015-06-30 | Freescale Semiconductor, Inc. | Successive approximation analog-to-digital converter with linearity error correction |
| US9473165B2 (en) | 2014-08-21 | 2016-10-18 | Qualcomm Incorporated | Reducing signal dependence for CDAC reference voltage |
| US9930284B2 (en) | 2014-12-29 | 2018-03-27 | Institute Of Semiconductors, Chinese Academy Of Sciences | Analog readout preprocessing circuit for CMOS image sensor and control method thereof |
| KR102210273B1 (ko) | 2014-12-29 | 2021-01-29 | 에스케이하이닉스 주식회사 | 오차를 보정하는 아날로그 디지털 컨버터 |
| EP3059867B1 (en) * | 2015-02-19 | 2020-07-08 | Stichting IMEC Nederland | Circuit and method for dac mismatch error detection and correction in an adc |
| WO2016203522A1 (ja) * | 2015-06-15 | 2016-12-22 | オリンパス株式会社 | 逐次比較型a/d変換装置 |
| KR20170010515A (ko) | 2015-07-20 | 2017-02-01 | 삼성전자주식회사 | 적분기 및 sar adc를 포함하는 반도체 장치 |
| CN106936432B (zh) * | 2015-12-29 | 2021-01-26 | 上海贝岭股份有限公司 | 流水线adc的第一级电容校准方法 |
| US10291249B2 (en) * | 2016-07-18 | 2019-05-14 | Analog Devices, Inc. | Common mode rejection in a reservoir capacitor SAR converter |
| CN106788436B (zh) * | 2016-11-09 | 2020-05-22 | 上海芯圣电子股份有限公司 | 应用于saradc中的pip电容阵列的电压系数校准方法 |
| JP6445746B2 (ja) * | 2016-12-21 | 2018-12-26 | オリンパス株式会社 | 逐次比較型a/d変換装置、撮像装置、内視鏡および設定方法 |
| KR20180105027A (ko) * | 2017-03-14 | 2018-09-27 | 에스케이하이닉스 주식회사 | 분할-커패시터 기반의 디지털-아날로그 변환기를 갖는 축차 근사형 아날로그-디지털 컨버터 |
| US10897262B2 (en) * | 2017-03-20 | 2021-01-19 | Texas Instruments Incorporated | Methods and apparatus to determine non linearity in analog-to-digital converters |
| US10574248B2 (en) * | 2017-08-14 | 2020-02-25 | Mediatek Inc. | Successive approximation register analog-to-digital converter and associated control method |
| TWI657666B (zh) * | 2017-10-31 | 2019-04-21 | 聯陽半導體股份有限公司 | 類比至數位轉換器及其校正方法以及校正設備 |
| US10720933B2 (en) * | 2017-11-02 | 2020-07-21 | Analog Devices, Inc. | Comparator error suppression |
| JP7200476B2 (ja) | 2017-12-28 | 2023-01-10 | セイコーエプソン株式会社 | 回路装置、振動デバイス、電子機器及び移動体 |
| JP7077617B2 (ja) * | 2017-12-28 | 2022-05-31 | セイコーエプソン株式会社 | 回路装置、振動デバイス、電子機器及び移動体 |
| WO2019138804A1 (ja) * | 2018-01-12 | 2019-07-18 | ソニーセミコンダクタソリューションズ株式会社 | 逐次比較アナログデジタル変換器 |
| US10574249B2 (en) * | 2018-05-02 | 2020-02-25 | Apple Inc. | Capacitor structure with correlated error mitigation and improved systematic mismatch in technologies with multiple patterning |
| WO2019224900A1 (ja) * | 2018-05-22 | 2019-11-28 | オリンパス株式会社 | デジタルアナログ変換器、アナログデジタル変換器、信号処理装置、固体撮像装置、および駆動方法 |
| US10516411B1 (en) | 2018-07-11 | 2019-12-24 | Analog Devices Global Unlimited Company | Common mode rejection in reservoir capacitor analog-to-digital converter |
| TWI673956B (zh) * | 2018-10-17 | 2019-10-01 | 創意電子股份有限公司 | 校準方法和校準系統 |
| CN109408970B (zh) * | 2018-10-29 | 2019-10-11 | 合肥本源量子计算科技有限责任公司 | 一种模数转换方法、装置及一种模数转换器 |
| US10483995B1 (en) * | 2019-02-22 | 2019-11-19 | Caelus Technologies Limited | Calibration of radix errors using Least-Significant-Bit (LSB) averaging in a Successive-Approximation Register Analog-Digital Converter (SAR-ADC) during a fully self-calibrating routine |
| CN111865318B (zh) * | 2019-04-30 | 2024-06-21 | 瑞昱半导体股份有限公司 | 模拟数字转换装置及其电容调整方法 |
| JP7595575B2 (ja) * | 2019-08-29 | 2024-12-06 | ヌヴォトンテクノロジージャパン株式会社 | 半導体回路 |
| US10886933B1 (en) * | 2019-10-18 | 2021-01-05 | Texas Instruments Incorporated | Analog-to-digital converter |
| CN113141182B (zh) * | 2020-01-20 | 2024-06-21 | 瑞昱半导体股份有限公司 | 模拟数字转换器装置与电容权重修正方法 |
| JP7565691B2 (ja) * | 2020-02-07 | 2024-10-11 | 旭化成エレクトロニクス株式会社 | 逐次比較ad変換器 |
| US11018681B1 (en) | 2020-03-18 | 2021-05-25 | Analog Devices International Unlimited Company | Digital-to-analog converter waveform generator |
| CN111490791B (zh) * | 2020-05-13 | 2023-04-07 | 深圳芥子科技有限公司 | 一种增量逐次逼近模数转换器 |
| CN114079465B (zh) * | 2020-08-12 | 2024-08-20 | 财团法人成大研究发展基金会 | 循序渐进式模拟至数字转换器 |
| CN112383307B (zh) * | 2020-11-03 | 2022-02-01 | 北京智芯微电子科技有限公司 | 基于数据处理的模数转换装置的校准方法、装置及系统 |
| US11146282B1 (en) * | 2021-01-04 | 2021-10-12 | Caelus Technologies Limited | Calibration of residual errors using least-mean-squares (LMS) and stochastic-gradient methods for an analog-to-digital converter (ADC) with a pre-calibrated lookup table |
| GB2605466A (en) * | 2021-06-21 | 2022-10-05 | Nordic Semiconductor Asa | Error-feedback SAR-ADC |
| EP4125220A1 (en) | 2021-07-28 | 2023-02-01 | Socionext Inc. | Linearity and/or gain in mixed-signal circuitry |
| TWI764841B (zh) * | 2021-10-06 | 2022-05-11 | 中原大學 | 逐次逼近類比數位轉換器、校正方法以及校正系統 |
| CN115664418B (zh) * | 2022-12-28 | 2023-02-28 | 江苏润石科技有限公司 | 基于非线性误差的sar adc的精度校准方法及装置 |
| TW202437708A (zh) | 2023-03-10 | 2024-09-16 | 聯華電子股份有限公司 | 類比數位轉換器 |
| US12388462B2 (en) * | 2023-03-14 | 2025-08-12 | Taiwan Semiconductor Manufacturing Company, Ltd. | Monotonic hybrid capacitor digital-to-analog converter |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1945978A (zh) * | 2005-05-27 | 2007-04-11 | 阿纳洛格装置公司 | 采用积分非线性误差整形的流水线adc |
Family Cites Families (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH03280719A (ja) * | 1990-03-29 | 1991-12-11 | Sanyo Electric Co Ltd | A/d変換器 |
| JPH0786947A (ja) * | 1993-09-09 | 1995-03-31 | Hitachi Ltd | A/d変換器 |
| DE102004049348A1 (de) | 2004-10-08 | 2006-04-20 | Micronas Gmbh | Verfahren sowie Einrichtung zur Kompensation von Kennlinienfehlern eines Analog-Digital-Wandlers |
| US7286075B2 (en) | 2005-11-14 | 2007-10-23 | Analog Devices, Inc. | Analog to digital converter with dither |
| US7605741B2 (en) | 2005-12-08 | 2009-10-20 | Analog Devices, Inc. | Digitally corrected SAR converter including a correction DAC |
| US7501965B2 (en) | 2007-02-06 | 2009-03-10 | Texas Instruments Incorporated | Correcting for errors that cause generated digital codes to deviate from expected values in an ADC |
| JP4921255B2 (ja) * | 2007-06-22 | 2012-04-25 | ルネサスエレクトロニクス株式会社 | 逐次型ad変換器 |
| KR101182402B1 (ko) | 2008-11-19 | 2012-09-13 | 한국전자통신연구원 | 순차 접근 아날로그-디지털 변환기 |
| DE102009005770B4 (de) * | 2009-01-23 | 2012-01-26 | Texas Instruments Deutschland Gmbh | SAR-ADC und Verfahren mit INL-Kompensation |
-
2010
- 2010-04-22 US US12/799,323 patent/US8223044B2/en active Active
- 2010-12-23 WO PCT/US2010/062014 patent/WO2011133193A1/en not_active Ceased
- 2010-12-23 CN CN201080066077.9A patent/CN102859882B/zh active Active
- 2010-12-23 JP JP2013506130A patent/JP5946443B2/ja active Active
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1945978A (zh) * | 2005-05-27 | 2007-04-11 | 阿纳洛格装置公司 | 采用积分非线性误差整形的流水线adc |
Also Published As
| Publication number | Publication date |
|---|---|
| WO2011133193A1 (en) | 2011-10-27 |
| JP2013526179A (ja) | 2013-06-20 |
| US8223044B2 (en) | 2012-07-17 |
| CN102859882A (zh) | 2013-01-02 |
| US20110260899A1 (en) | 2011-10-27 |
| JP5946443B2 (ja) | 2016-07-06 |
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