CN102565568A - 电荷平板监视器 - Google Patents
电荷平板监视器 Download PDFInfo
- Publication number
- CN102565568A CN102565568A CN2011103539778A CN201110353977A CN102565568A CN 102565568 A CN102565568 A CN 102565568A CN 2011103539778 A CN2011103539778 A CN 2011103539778A CN 201110353977 A CN201110353977 A CN 201110353977A CN 102565568 A CN102565568 A CN 102565568A
- Authority
- CN
- China
- Prior art keywords
- main body
- assay plate
- measuring
- analyzer main
- flat panel
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
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Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R13/00—Arrangements for displaying electric variables or waveforms
- G01R13/02—Arrangements for displaying electric variables or waveforms for displaying measured electric variables in digital form
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/165—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01T—SPARK GAPS; OVERVOLTAGE ARRESTERS USING SPARK GAPS; SPARKING PLUGS; CORONA DEVICES; GENERATING IONS TO BE INTRODUCED INTO NON-ENCLOSED GASES
- H01T23/00—Apparatus for generating ions to be introduced into non-enclosed gases, e.g. into the atmosphere
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Elimination Of Static Electricity (AREA)
- Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2010250378A JP2012103056A (ja) | 2010-11-09 | 2010-11-09 | チャージプレートモニタ |
JP2010-250378 | 2010-11-09 |
Publications (1)
Publication Number | Publication Date |
---|---|
CN102565568A true CN102565568A (zh) | 2012-07-11 |
Family
ID=46267502
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN2011103539778A Pending CN102565568A (zh) | 2010-11-09 | 2011-11-09 | 电荷平板监视器 |
Country Status (4)
Country | Link |
---|---|
JP (1) | JP2012103056A (ko) |
KR (1) | KR20120049780A (ko) |
CN (1) | CN102565568A (ko) |
TW (1) | TW201219800A (ko) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN103336214A (zh) * | 2013-07-10 | 2013-10-02 | 深圳市华星光电技术有限公司 | 静电消除器的监控装置及其监控方法 |
CN110888154A (zh) * | 2018-09-10 | 2020-03-17 | Nrd有限责任公司 | 离子发生器监视系统和离子传感器 |
CN112858800A (zh) * | 2019-11-27 | 2021-05-28 | 鸿劲精密股份有限公司 | 作业分类设备的电荷侦测装置 |
Families Citing this family (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR101629915B1 (ko) | 2015-02-17 | 2016-06-13 | (주)동일기연 | 챠지 플레이트 모니터링 장치 |
KR102036009B1 (ko) * | 2017-12-05 | 2019-10-24 | 은성훈 | 이온 검출 장치 |
KR102148644B1 (ko) * | 2019-03-13 | 2020-08-28 | 주식회사 네오세미텍 | 토탈 이온 관리 시스템 및 관리 방법 |
KR102122268B1 (ko) * | 2019-03-15 | 2020-06-16 | 주식회사 제이테피언스 | 위치별 감쇠시간 측정을 통한 정전기 발생 방지 시스템 및 그 방법 |
KR102280765B1 (ko) * | 2021-02-05 | 2021-07-21 | 지문영 | 이오나이저 성능 평가 장치 및 그 방법 |
CN112986761B (zh) * | 2021-02-08 | 2022-08-16 | 苏州天华超净科技股份有限公司 | 静电消除器工作性能监测方法 |
KR102493135B1 (ko) * | 2021-02-18 | 2023-01-30 | 김선철 | 네트워크 기반의 소형 대전판을 가지는 챠지 플레이트 모니터링 장치 |
KR102504492B1 (ko) * | 2021-03-29 | 2023-02-28 | (주)선재하이테크 | 정전하 측정 센서모듈 및 이를 이용한 정전하 모니터링 시스템 |
Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5506507A (en) * | 1992-09-18 | 1996-04-09 | Sorbios Verfahrenstechnische Gerate Und Systeme Gmbh | Apparatus for measuring ions in a clean room gas flow using a spherical electrode |
CN1375061A (zh) * | 1999-04-21 | 2002-10-16 | 布鲁斯·T·威廉姆斯 | 浮动平板电压监视器 |
JP2003332094A (ja) * | 2002-05-09 | 2003-11-21 | Keyence Corp | 除電監視モニタ |
CN1951159A (zh) * | 2004-05-26 | 2007-04-18 | 修谷鲁电子机器股份有限公司 | 静电消除装置 |
JP2007180074A (ja) * | 2005-12-27 | 2007-07-12 | Olympus Corp | 静電気検出装置および基板検査装置 |
JP2008112707A (ja) * | 2006-10-03 | 2008-05-15 | Shishido Seidenki Kk | 帯電モニタ装置およびイオン生成装置の性能評価方法 |
Family Cites Families (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH1010809A (ja) * | 1996-06-21 | 1998-01-16 | Canon Inc | 画像形成装置および電位測定方法 |
JP2001013185A (ja) * | 1999-06-29 | 2001-01-19 | Hugle Electronics Inc | 帯電分布測定装置 |
JP3770547B2 (ja) * | 2002-03-01 | 2006-04-26 | ヒューグルエレクトロニクス株式会社 | イオナイザ制御システム |
-
2010
- 2010-11-09 JP JP2010250378A patent/JP2012103056A/ja active Pending
-
2011
- 2011-02-10 TW TW100104357A patent/TW201219800A/zh unknown
- 2011-02-11 KR KR1020110012270A patent/KR20120049780A/ko not_active Application Discontinuation
- 2011-11-09 CN CN2011103539778A patent/CN102565568A/zh active Pending
Patent Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5506507A (en) * | 1992-09-18 | 1996-04-09 | Sorbios Verfahrenstechnische Gerate Und Systeme Gmbh | Apparatus for measuring ions in a clean room gas flow using a spherical electrode |
CN1375061A (zh) * | 1999-04-21 | 2002-10-16 | 布鲁斯·T·威廉姆斯 | 浮动平板电压监视器 |
JP2003332094A (ja) * | 2002-05-09 | 2003-11-21 | Keyence Corp | 除電監視モニタ |
CN1951159A (zh) * | 2004-05-26 | 2007-04-18 | 修谷鲁电子机器股份有限公司 | 静电消除装置 |
JP2007180074A (ja) * | 2005-12-27 | 2007-07-12 | Olympus Corp | 静電気検出装置および基板検査装置 |
JP2008112707A (ja) * | 2006-10-03 | 2008-05-15 | Shishido Seidenki Kk | 帯電モニタ装置およびイオン生成装置の性能評価方法 |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN103336214A (zh) * | 2013-07-10 | 2013-10-02 | 深圳市华星光电技术有限公司 | 静电消除器的监控装置及其监控方法 |
WO2015003375A1 (zh) * | 2013-07-10 | 2015-01-15 | 深圳市华星光电技术有限公司 | 静电消除器的监控装置及其监控方法 |
CN110888154A (zh) * | 2018-09-10 | 2020-03-17 | Nrd有限责任公司 | 离子发生器监视系统和离子传感器 |
CN112858800A (zh) * | 2019-11-27 | 2021-05-28 | 鸿劲精密股份有限公司 | 作业分类设备的电荷侦测装置 |
Also Published As
Publication number | Publication date |
---|---|
TW201219800A (en) | 2012-05-16 |
KR20120049780A (ko) | 2012-05-17 |
JP2012103056A (ja) | 2012-05-31 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
C06 | Publication | ||
PB01 | Publication | ||
C10 | Entry into substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
C02 | Deemed withdrawal of patent application after publication (patent law 2001) | ||
WD01 | Invention patent application deemed withdrawn after publication |
Application publication date: 20120711 |