CN102142267B - 半导体存储器的数据输出电路和相关方法 - Google Patents
半导体存储器的数据输出电路和相关方法 Download PDFInfo
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- CN102142267B CN102142267B CN201010571983.6A CN201010571983A CN102142267B CN 102142267 B CN102142267 B CN 102142267B CN 201010571983 A CN201010571983 A CN 201010571983A CN 102142267 B CN102142267 B CN 102142267B
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- sensor amplifier
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- 239000004065 semiconductor Substances 0.000 title claims abstract description 27
- 238000000034 method Methods 0.000 title claims abstract description 10
- 230000004044 response Effects 0.000 claims description 51
- 230000005540 biological transmission Effects 0.000 claims description 15
- 230000006690 co-activation Effects 0.000 claims description 13
- 230000004913 activation Effects 0.000 claims 6
- 230000015654 memory Effects 0.000 claims 2
- 101100522354 Triticum aestivum PINB gene Proteins 0.000 description 10
- 238000010586 diagram Methods 0.000 description 4
- 230000008901 benefit Effects 0.000 description 3
- 230000008878 coupling Effects 0.000 description 2
- 238000010168 coupling process Methods 0.000 description 2
- 238000005859 coupling reaction Methods 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- 230000004069 differentiation Effects 0.000 description 1
- 230000002093 peripheral effect Effects 0.000 description 1
- 230000009467 reduction Effects 0.000 description 1
- 230000007704 transition Effects 0.000 description 1
Classifications
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
- G11C7/10—Input/output [I/O] data interface arrangements, e.g. I/O data control circuits, I/O data buffers
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/04—Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS
- G11C16/0483—Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS comprising cells having several storage transistors connected in series
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/06—Auxiliary circuits, e.g. for writing into memory
- G11C16/26—Sensing or reading circuits; Data output circuits
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/06—Auxiliary circuits, e.g. for writing into memory
- G11C16/32—Timing circuits
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
- G11C7/10—Input/output [I/O] data interface arrangements, e.g. I/O data control circuits, I/O data buffers
- G11C7/1006—Data managing, e.g. manipulating data before writing or reading out, data bus switches or control circuits therefor
- G11C7/1012—Data reordering during input/output, e.g. crossbars, layers of multiplexers, shifting or rotating
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
- G11C7/10—Input/output [I/O] data interface arrangements, e.g. I/O data control circuits, I/O data buffers
- G11C7/1015—Read-write modes for single port memories, i.e. having either a random port or a serial port
- G11C7/1039—Read-write modes for single port memories, i.e. having either a random port or a serial port using pipelining techniques, i.e. using latches between functional memory parts, e.g. row/column decoders, I/O buffers, sense amplifiers
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
- G11C7/10—Input/output [I/O] data interface arrangements, e.g. I/O data control circuits, I/O data buffers
- G11C7/1048—Data bus control circuits, e.g. precharging, presetting, equalising
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
- G11C7/10—Input/output [I/O] data interface arrangements, e.g. I/O data control circuits, I/O data buffers
- G11C7/1051—Data output circuits, e.g. read-out amplifiers, data output buffers, data output registers, data output level conversion circuits
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
- G11C7/10—Input/output [I/O] data interface arrangements, e.g. I/O data control circuits, I/O data buffers
- G11C7/1051—Data output circuits, e.g. read-out amplifiers, data output buffers, data output registers, data output level conversion circuits
- G11C7/106—Data output latches
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
- G11C7/10—Input/output [I/O] data interface arrangements, e.g. I/O data control circuits, I/O data buffers
- G11C7/1051—Data output circuits, e.g. read-out amplifiers, data output buffers, data output registers, data output level conversion circuits
- G11C7/1066—Output synchronization
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
- G11C7/10—Input/output [I/O] data interface arrangements, e.g. I/O data control circuits, I/O data buffers
- G11C7/1051—Data output circuits, e.g. read-out amplifiers, data output buffers, data output registers, data output level conversion circuits
- G11C7/1069—I/O lines read out arrangements
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Dram (AREA)
- Static Random-Access Memory (AREA)
- Logic Circuits (AREA)
Abstract
Description
Claims (18)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR10-2010-0008695 | 2010-01-29 | ||
KR1020100008695A KR20110088947A (ko) | 2010-01-29 | 2010-01-29 | 반도체 메모리의 데이터 출력 회로 |
Publications (2)
Publication Number | Publication Date |
---|---|
CN102142267A CN102142267A (zh) | 2011-08-03 |
CN102142267B true CN102142267B (zh) | 2015-10-07 |
Family
ID=44341551
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN201010571983.6A Active CN102142267B (zh) | 2010-01-29 | 2010-12-03 | 半导体存储器的数据输出电路和相关方法 |
Country Status (5)
Country | Link |
---|---|
US (1) | US8369160B2 (zh) |
JP (1) | JP2011159377A (zh) |
KR (1) | KR20110088947A (zh) |
CN (1) | CN102142267B (zh) |
TW (1) | TWI496158B (zh) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR102432934B1 (ko) | 2015-12-02 | 2022-08-17 | 에스케이하이닉스 주식회사 | 적층형 반도체 장치 |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6163501A (en) * | 1999-03-08 | 2000-12-19 | Kabushiki Kaisha Toshiba | Synchronous semiconductor memory device |
US6201760B1 (en) * | 1998-12-30 | 2001-03-13 | Hyundai Electronics Industries Co., Ltd. | Apparatus and method for performing data read operation in DDR SDRAM |
CN101404184A (zh) * | 2007-10-04 | 2009-04-08 | 松下电器产业株式会社 | 半导体存储装置 |
CN101572118A (zh) * | 2008-04-29 | 2009-11-04 | 三星电子株式会社 | 半导体存储器装置及其存取方法 |
Family Cites Families (28)
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JPS6029998A (ja) * | 1983-07-28 | 1985-02-15 | Nec Corp | ダイナミツクメモリ |
JPS62114194A (ja) * | 1985-11-13 | 1987-05-25 | Mitsubishi Electric Corp | 半導体記憶装置 |
US4800530A (en) * | 1986-08-19 | 1989-01-24 | Kabushiki Kasiha Toshiba | Semiconductor memory system with dynamic random access memory cells |
JPS6443894A (en) * | 1987-08-10 | 1989-02-16 | Nec Corp | Semiconductor memory |
JPS6455794A (en) * | 1987-08-26 | 1989-03-02 | Nec Corp | Semiconductor memory |
JPH02185794A (ja) * | 1989-01-11 | 1990-07-20 | Sharp Corp | 半導体記憶装置 |
JPH08315567A (ja) * | 1995-05-22 | 1996-11-29 | Mitsubishi Electric Corp | 半導体記憶装置 |
JP2000029925A (ja) | 1998-07-15 | 2000-01-28 | Fujitsu Ltd | クロストークノイズ計算方法及び記憶媒体 |
KR100296912B1 (ko) * | 1998-12-24 | 2001-08-07 | 박종섭 | 반도체 장치의 파이프 카운터 신호 발생 장치 |
US6294937B1 (en) * | 1999-05-25 | 2001-09-25 | Lsi Logic Corporation | Method and apparatus for self correcting parallel I/O circuitry |
KR100341576B1 (ko) * | 1999-06-28 | 2002-06-22 | 박종섭 | 반도체메모리장치의 파이프데이터 입력 제어 방법 및 장치 |
US6496889B1 (en) * | 1999-09-17 | 2002-12-17 | Rambus Inc. | Chip-to-chip communication system using an ac-coupled bus and devices employed in same |
KR100331554B1 (ko) * | 1999-09-27 | 2002-04-06 | 윤종용 | 인접된 커패시터 사이의 크로스토크가 억제된 반도체 소자의 커패시터 어레이 및 그 제조방법 |
JP2001167572A (ja) * | 1999-12-08 | 2001-06-22 | Hitachi Ltd | 伝送回路とこれを用いた半導体集積回路および半導体メモリ |
JP4684394B2 (ja) | 2000-07-05 | 2011-05-18 | エルピーダメモリ株式会社 | 半導体集積回路装置 |
US6556494B2 (en) * | 2001-03-14 | 2003-04-29 | Micron Technology, Inc. | High frequency range four bit prefetch output data path |
US6813207B2 (en) * | 2002-01-11 | 2004-11-02 | Kabushiki Kaisha Toshiba | Semiconductor memory device |
US6754120B1 (en) * | 2003-02-11 | 2004-06-22 | Rambus Inc. | DRAM output circuitry supporting sequential data capture to reduce core access times |
KR100543908B1 (ko) * | 2003-05-30 | 2006-01-23 | 주식회사 하이닉스반도체 | 저전력과 고주파에 유리한 데이터 입력 제어부를 구비하는동기식 반도체 메모리 장치 |
KR100562985B1 (ko) | 2003-12-30 | 2006-03-23 | 주식회사 하이닉스반도체 | 반도체 소자의 금속배선 형성방법 |
JP4221329B2 (ja) * | 2004-04-28 | 2009-02-12 | パナソニック株式会社 | 半導体記憶装置 |
KR100694418B1 (ko) * | 2004-11-15 | 2007-03-12 | 주식회사 하이닉스반도체 | 메모리 장치의 병렬 압축 테스트 회로 |
KR100911197B1 (ko) * | 2007-12-27 | 2009-08-06 | 주식회사 하이닉스반도체 | 반도체 메모리 장치의 데이터 출력 회로 |
US8594114B2 (en) * | 2008-05-29 | 2013-11-26 | Promos Technologies Pte. Ltd. | Shielding of datalines with physical placement based on time staggered access |
JP5195140B2 (ja) * | 2008-08-06 | 2013-05-08 | 富士通セミコンダクター株式会社 | 半導体メモリおよびメモリシステム |
KR101003119B1 (ko) * | 2008-11-18 | 2010-12-21 | 주식회사 하이닉스반도체 | 반도체 집적회로의 데이터 라이트 장치 |
JP4945616B2 (ja) * | 2009-09-18 | 2012-06-06 | 株式会社日立製作所 | ディジタルインターフェースを有する半導体装置 |
JP5650475B2 (ja) * | 2010-09-14 | 2015-01-07 | ピーエスフォー ルクスコ エスエイアールエルPS4 Luxco S.a.r.l. | 半導体装置及びその制御方法 |
-
2010
- 2010-01-29 KR KR1020100008695A patent/KR20110088947A/ko not_active Application Discontinuation
- 2010-07-16 US US12/838,342 patent/US8369160B2/en active Active
- 2010-07-20 TW TW099123780A patent/TWI496158B/zh not_active IP Right Cessation
- 2010-11-29 JP JP2010264592A patent/JP2011159377A/ja active Pending
- 2010-12-03 CN CN201010571983.6A patent/CN102142267B/zh active Active
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6201760B1 (en) * | 1998-12-30 | 2001-03-13 | Hyundai Electronics Industries Co., Ltd. | Apparatus and method for performing data read operation in DDR SDRAM |
US6163501A (en) * | 1999-03-08 | 2000-12-19 | Kabushiki Kaisha Toshiba | Synchronous semiconductor memory device |
CN101404184A (zh) * | 2007-10-04 | 2009-04-08 | 松下电器产业株式会社 | 半导体存储装置 |
CN101572118A (zh) * | 2008-04-29 | 2009-11-04 | 三星电子株式会社 | 半导体存储器装置及其存取方法 |
Also Published As
Publication number | Publication date |
---|---|
JP2011159377A (ja) | 2011-08-18 |
CN102142267A (zh) | 2011-08-03 |
KR20110088947A (ko) | 2011-08-04 |
TWI496158B (zh) | 2015-08-11 |
US8369160B2 (en) | 2013-02-05 |
US20110188323A1 (en) | 2011-08-04 |
TW201126532A (en) | 2011-08-01 |
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C06 | Publication | ||
PB01 | Publication | ||
C10 | Entry into substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
C14 | Grant of patent or utility model | ||
GR01 | Patent grant | ||
CP03 | Change of name, title or address | ||
CP03 | Change of name, title or address |
Address after: Gyeonggi Do, South Korea Patentee after: Sk Hynix Inc. Country or region after: Republic of Korea Address before: Gyeonggi Do, South Korea Patentee before: HYNIX SEMICONDUCTOR Inc. Country or region before: Republic of Korea |
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TR01 | Transfer of patent right | ||
TR01 | Transfer of patent right |
Effective date of registration: 20240613 Address after: American Texas Patentee after: Mimi IP Co.,Ltd. Country or region after: U.S.A. Address before: Gyeonggi Do, South Korea Patentee before: Sk Hynix Inc. Country or region before: Republic of Korea |