CN101779135B - 自动触点对准工具 - Google Patents

自动触点对准工具 Download PDF

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Publication number
CN101779135B
CN101779135B CN200880103158.4A CN200880103158A CN101779135B CN 101779135 B CN101779135 B CN 101779135B CN 200880103158 A CN200880103158 A CN 200880103158A CN 101779135 B CN101779135 B CN 101779135B
Authority
CN
China
Prior art keywords
test
contacts
electronic component
contact
testing machine
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
CN200880103158.4A
Other languages
English (en)
Chinese (zh)
Other versions
CN101779135A (zh
Inventor
戴维·牛顿
乔恩·保尔森
巴里·克林格
李锡
斯潘塞·巴雷特
亚斯米内·卢
肯特·鲁滨逊
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Electro Scientific Industries Inc
Original Assignee
Electro Scientific Industries Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Electro Scientific Industries Inc filed Critical Electro Scientific Industries Inc
Publication of CN101779135A publication Critical patent/CN101779135A/zh
Application granted granted Critical
Publication of CN101779135B publication Critical patent/CN101779135B/zh
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

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Classifications

    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B07—SEPARATING SOLIDS FROM SOLIDS; SORTING
    • B07C—POSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
    • B07C5/00—Sorting according to a characteristic or feature of the articles or material being sorted, e.g. by control effected by devices which detect or measure such characteristic or feature; Sorting by manually actuated devices, e.g. switches
    • B07C5/34—Sorting according to other particular properties
    • B07C5/344—Sorting according to other particular properties according to electric or electromagnetic properties
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06794—Devices for sensing when probes are in contact, or in position to contact, with measured object
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
    • G01R31/2891—Features relating to contacting the IC under test, e.g. probe heads; chucks related to sensing or controlling of force, position, temperature

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Measuring Leads Or Probes (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
CN200880103158.4A 2007-08-14 2008-08-13 自动触点对准工具 Expired - Fee Related CN101779135B (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US11/838,706 2007-08-14
US11/838,706 US7557594B2 (en) 2007-08-14 2007-08-14 Automated contact alignment tool
PCT/US2008/073048 WO2009023727A2 (en) 2007-08-14 2008-08-13 Automated contact alignment tool

Publications (2)

Publication Number Publication Date
CN101779135A CN101779135A (zh) 2010-07-14
CN101779135B true CN101779135B (zh) 2013-08-28

Family

ID=40351470

Family Applications (1)

Application Number Title Priority Date Filing Date
CN200880103158.4A Expired - Fee Related CN101779135B (zh) 2007-08-14 2008-08-13 自动触点对准工具

Country Status (6)

Country Link
US (2) US7557594B2 (enExample)
JP (1) JP5324577B2 (enExample)
KR (1) KR101209556B1 (enExample)
CN (1) CN101779135B (enExample)
TW (1) TWI429929B (enExample)
WO (1) WO2009023727A2 (enExample)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8159243B2 (en) * 2008-11-13 2012-04-17 Dcg Systems, Inc. Probe tip to device pad alignment in obscured view probing applications
JP4807890B2 (ja) * 2009-07-13 2011-11-02 ハイメカ株式会社 電子部品の整列装置および整列方法
TWM430614U (en) * 2011-12-21 2012-06-01 Youngtek Electronics Corp Fiber optic light guiding top cover structure
CN112845167B (zh) * 2021-01-05 2024-01-26 常熟市天银机电股份有限公司 电机保护器的动触点弹簧片弹性全自动检测装置
CN114415000B (zh) * 2022-03-29 2022-07-12 深圳市永达电子信息股份有限公司 一种mark点的假压对齐装置及方法

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1167921A (zh) * 1996-04-23 1997-12-17 钟国桢 自动多探针印刷电路板测试设备和方法
CN1639577A (zh) * 2002-03-22 2005-07-13 电子科学工业公司 测试探针对准设备
CN1668929A (zh) * 2002-07-16 2005-09-14 雅赫测试系统公司 一种将测试部件电连接到测试机以对测试部件上的电子线路进行测试的装置

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH05196681A (ja) * 1991-06-26 1993-08-06 Digital Equip Corp <Dec> 連続移動する電気回路の相互接続試験方法及び装置
US5842579A (en) * 1995-11-16 1998-12-01 Electro Scientific Industries, Inc. Electrical circuit component handler
JPH11271374A (ja) * 1998-03-20 1999-10-08 Anritsu Corp 電子部品検査装置及び方法
US20060026224A1 (en) * 2004-07-30 2006-02-02 Merkli Patrick P Method and circuit for combined multiplication and division
GB2434211B (en) * 2004-11-22 2009-09-23 Electro Scient Ind Inc Method and machine for repetitive testing of an electrical component

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1167921A (zh) * 1996-04-23 1997-12-17 钟国桢 自动多探针印刷电路板测试设备和方法
CN1639577A (zh) * 2002-03-22 2005-07-13 电子科学工业公司 测试探针对准设备
CN1668929A (zh) * 2002-07-16 2005-09-14 雅赫测试系统公司 一种将测试部件电连接到测试机以对测试部件上的电子线路进行测试的装置

Also Published As

Publication number Publication date
KR20100049054A (ko) 2010-05-11
CN101779135A (zh) 2010-07-14
US7557594B2 (en) 2009-07-07
US20090224789A1 (en) 2009-09-10
US20090045830A1 (en) 2009-02-19
TW200931444A (en) 2009-07-16
WO2009023727A3 (en) 2009-04-23
TWI429929B (zh) 2014-03-11
US7750653B2 (en) 2010-07-06
JP5324577B2 (ja) 2013-10-23
KR101209556B1 (ko) 2012-12-10
WO2009023727A2 (en) 2009-02-19
JP2010537169A (ja) 2010-12-02

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Granted publication date: 20130828

CF01 Termination of patent right due to non-payment of annual fee