KR101209556B1 - 자동화된 콘택트 정렬기구 - Google Patents

자동화된 콘택트 정렬기구 Download PDF

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Publication number
KR101209556B1
KR101209556B1 KR1020107002408A KR20107002408A KR101209556B1 KR 101209556 B1 KR101209556 B1 KR 101209556B1 KR 1020107002408 A KR1020107002408 A KR 1020107002408A KR 20107002408 A KR20107002408 A KR 20107002408A KR 101209556 B1 KR101209556 B1 KR 101209556B1
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KR
South Korea
Prior art keywords
test
electronic component
inspection device
contacts
contact
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
KR1020107002408A
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English (en)
Korean (ko)
Other versions
KR20100049054A (ko
Inventor
데이비드 뉴튼
존 파울젠
베리 클링거
쉬 리
스펜서 바렛
자스민 루
켄트 로빈슨
Original Assignee
일렉트로 싸이언티픽 인더스트리이즈 인코포레이티드
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 일렉트로 싸이언티픽 인더스트리이즈 인코포레이티드 filed Critical 일렉트로 싸이언티픽 인더스트리이즈 인코포레이티드
Publication of KR20100049054A publication Critical patent/KR20100049054A/ko
Application granted granted Critical
Publication of KR101209556B1 publication Critical patent/KR101209556B1/ko
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

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    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B07—SEPARATING SOLIDS FROM SOLIDS; SORTING
    • B07C—POSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
    • B07C5/00—Sorting according to a characteristic or feature of the articles or material being sorted, e.g. by control effected by devices which detect or measure such characteristic or feature; Sorting by manually actuated devices, e.g. switches
    • B07C5/34—Sorting according to other particular properties
    • B07C5/344—Sorting according to other particular properties according to electric or electromagnetic properties
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06794—Devices for sensing when probes are in contact, or in position to contact, with measured object
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
    • G01R31/2891—Features relating to contacting the IC under test, e.g. probe heads; chucks related to sensing or controlling of force, position, temperature

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Measuring Leads Or Probes (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
KR1020107002408A 2007-08-14 2008-08-13 자동화된 콘택트 정렬기구 Expired - Fee Related KR101209556B1 (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US11/838,706 US7557594B2 (en) 2007-08-14 2007-08-14 Automated contact alignment tool
US11/838,706 2007-08-14

Publications (2)

Publication Number Publication Date
KR20100049054A KR20100049054A (ko) 2010-05-11
KR101209556B1 true KR101209556B1 (ko) 2012-12-10

Family

ID=40351470

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020107002408A Expired - Fee Related KR101209556B1 (ko) 2007-08-14 2008-08-13 자동화된 콘택트 정렬기구

Country Status (6)

Country Link
US (2) US7557594B2 (enExample)
JP (1) JP5324577B2 (enExample)
KR (1) KR101209556B1 (enExample)
CN (1) CN101779135B (enExample)
TW (1) TWI429929B (enExample)
WO (1) WO2009023727A2 (enExample)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8159243B2 (en) * 2008-11-13 2012-04-17 Dcg Systems, Inc. Probe tip to device pad alignment in obscured view probing applications
JP4807890B2 (ja) * 2009-07-13 2011-11-02 ハイメカ株式会社 電子部品の整列装置および整列方法
TWM430614U (en) * 2011-12-21 2012-06-01 Youngtek Electronics Corp Fiber optic light guiding top cover structure
CN112845167B (zh) * 2021-01-05 2024-01-26 常熟市天银机电股份有限公司 电机保护器的动触点弹簧片弹性全自动检测装置
CN114415000B (zh) * 2022-03-29 2022-07-12 深圳市永达电子信息股份有限公司 一种mark点的假压对齐装置及方法

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20060026224A1 (en) 2004-07-30 2006-02-02 Merkli Patrick P Method and circuit for combined multiplication and division
US7119566B2 (en) 2002-03-22 2006-10-10 Electro Scientific Industries, Inc. Test probe alignment apparatus
US20060232279A1 (en) 2004-11-22 2006-10-19 Garcia Douglas J Method and machine for repetitive testing of an electrical component

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH05196681A (ja) * 1991-06-26 1993-08-06 Digital Equip Corp <Dec> 連続移動する電気回路の相互接続試験方法及び装置
US5842579A (en) * 1995-11-16 1998-12-01 Electro Scientific Industries, Inc. Electrical circuit component handler
CA2174784C (en) * 1996-04-23 1999-07-13 George Guozhen Zhong Automatic multi-probe pwb tester
JPH11271374A (ja) * 1998-03-20 1999-10-08 Anritsu Corp 電子部品検査装置及び方法
AU2003249276A1 (en) * 2002-07-16 2004-02-02 Aehr Test Systems Assembly for connecting a test device to an object to be tested

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7119566B2 (en) 2002-03-22 2006-10-10 Electro Scientific Industries, Inc. Test probe alignment apparatus
US20060026224A1 (en) 2004-07-30 2006-02-02 Merkli Patrick P Method and circuit for combined multiplication and division
US20060232279A1 (en) 2004-11-22 2006-10-19 Garcia Douglas J Method and machine for repetitive testing of an electrical component

Also Published As

Publication number Publication date
TWI429929B (zh) 2014-03-11
TW200931444A (en) 2009-07-16
WO2009023727A2 (en) 2009-02-19
JP2010537169A (ja) 2010-12-02
JP5324577B2 (ja) 2013-10-23
WO2009023727A3 (en) 2009-04-23
KR20100049054A (ko) 2010-05-11
US20090045830A1 (en) 2009-02-19
US7557594B2 (en) 2009-07-07
CN101779135A (zh) 2010-07-14
US20090224789A1 (en) 2009-09-10
US7750653B2 (en) 2010-07-06
CN101779135B (zh) 2013-08-28

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