CN101681800B - 图案化的导体、半导体和电介质材料的印刷方法 - Google Patents
图案化的导体、半导体和电介质材料的印刷方法 Download PDFInfo
- Publication number
- CN101681800B CN101681800B CN2008800147418A CN200880014741A CN101681800B CN 101681800 B CN101681800 B CN 101681800B CN 2008800147418 A CN2008800147418 A CN 2008800147418A CN 200880014741 A CN200880014741 A CN 200880014741A CN 101681800 B CN101681800 B CN 101681800B
- Authority
- CN
- China
- Prior art keywords
- pattern
- printing
- substrate
- composition
- ink
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/20—Deposition of semiconductor materials on a substrate, e.g. epitaxial growth solid phase epitaxy
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09D—COATING COMPOSITIONS, e.g. PAINTS, VARNISHES OR LACQUERS; FILLING PASTES; CHEMICAL PAINT OR INK REMOVERS; INKS; CORRECTING FLUIDS; WOODSTAINS; PASTES OR SOLIDS FOR COLOURING OR PRINTING; USE OF MATERIALS THEREFOR
- C09D5/00—Coating compositions, e.g. paints, varnishes or lacquers, characterised by their physical nature or the effects produced; Filling pastes
- C09D5/24—Electrically-conducting paints
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09D—COATING COMPOSITIONS, e.g. PAINTS, VARNISHES OR LACQUERS; FILLING PASTES; CHEMICAL PAINT OR INK REMOVERS; INKS; CORRECTING FLUIDS; WOODSTAINS; PASTES OR SOLIDS FOR COLOURING OR PRINTING; USE OF MATERIALS THEREFOR
- C09D11/00—Inks
- C09D11/02—Printing inks
- C09D11/10—Printing inks based on artificial resins
- C09D11/101—Inks specially adapted for printing processes involving curing by wave energy or particle radiation, e.g. with UV-curing following the printing
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09D—COATING COMPOSITIONS, e.g. PAINTS, VARNISHES OR LACQUERS; FILLING PASTES; CHEMICAL PAINT OR INK REMOVERS; INKS; CORRECTING FLUIDS; WOODSTAINS; PASTES OR SOLIDS FOR COLOURING OR PRINTING; USE OF MATERIALS THEREFOR
- C09D11/00—Inks
- C09D11/30—Inkjet printing inks
- C09D11/32—Inkjet printing inks characterised by colouring agents
- C09D11/322—Pigment inks
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09D—COATING COMPOSITIONS, e.g. PAINTS, VARNISHES OR LACQUERS; FILLING PASTES; CHEMICAL PAINT OR INK REMOVERS; INKS; CORRECTING FLUIDS; WOODSTAINS; PASTES OR SOLIDS FOR COLOURING OR PRINTING; USE OF MATERIALS THEREFOR
- C09D11/00—Inks
- C09D11/30—Inkjet printing inks
- C09D11/36—Inkjet printing inks based on non-aqueous solvents
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09D—COATING COMPOSITIONS, e.g. PAINTS, VARNISHES OR LACQUERS; FILLING PASTES; CHEMICAL PAINT OR INK REMOVERS; INKS; CORRECTING FLUIDS; WOODSTAINS; PASTES OR SOLIDS FOR COLOURING OR PRINTING; USE OF MATERIALS THEREFOR
- C09D11/00—Inks
- C09D11/54—Inks based on two liquids, one liquid being the ink, the other liquid being a reaction solution, a fixer or a treatment solution for the ink
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01B—CABLES; CONDUCTORS; INSULATORS; SELECTION OF MATERIALS FOR THEIR CONDUCTIVE, INSULATING OR DIELECTRIC PROPERTIES
- H01B3/00—Insulators or insulating bodies characterised by the insulating materials; Selection of materials for their insulating or dielectric properties
- H01B3/02—Insulators or insulating bodies characterised by the insulating materials; Selection of materials for their insulating or dielectric properties mainly consisting of inorganic substances
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02518—Deposited layers
- H01L21/02521—Materials
- H01L21/02524—Group 14 semiconducting materials
- H01L21/02532—Silicon, silicon germanium, germanium
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02518—Deposited layers
- H01L21/02587—Structure
- H01L21/0259—Microstructure
- H01L21/02601—Nanoparticles
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02612—Formation types
- H01L21/02617—Deposition types
- H01L21/02623—Liquid deposition
- H01L21/02628—Liquid deposition using solutions
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/28—Manufacture of electrodes on semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/268
- H01L21/28008—Making conductor-insulator-semiconductor electrodes
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D30/00—Field-effect transistors [FET]
- H10D30/01—Manufacture or treatment
- H10D30/021—Manufacture or treatment of FETs having insulated gates [IGFET]
- H10D30/031—Manufacture or treatment of FETs having insulated gates [IGFET] of thin-film transistors [TFT]
- H10D30/0321—Manufacture or treatment of FETs having insulated gates [IGFET] of thin-film transistors [TFT] comprising silicon, e.g. amorphous silicon or polysilicon
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D30/00—Field-effect transistors [FET]
- H10D30/60—Insulated-gate field-effect transistors [IGFET]
- H10D30/67—Thin-film transistors [TFT]
- H10D30/674—Thin-film transistors [TFT] characterised by the active materials
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D30/00—Field-effect transistors [FET]
- H10D30/60—Insulated-gate field-effect transistors [IGFET]
- H10D30/67—Thin-film transistors [TFT]
- H10D30/6757—Thin-film transistors [TFT] characterised by the structure of the channel, e.g. transverse or longitudinal shape or doping profile
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y40/00—Manufacture or treatment of nanostructures
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D30/00—Field-effect transistors [FET]
- H10D30/01—Manufacture or treatment
- H10D30/021—Manufacture or treatment of FETs having insulated gates [IGFET]
- H10D30/031—Manufacture or treatment of FETs having insulated gates [IGFET] of thin-film transistors [TFT]
- H10D30/0312—Manufacture or treatment of FETs having insulated gates [IGFET] of thin-film transistors [TFT] characterised by the gate electrodes
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D86/00—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates
- H10D86/01—Manufacture or treatment
- H10D86/021—Manufacture or treatment of multiple TFTs
- H10D86/0241—Manufacture or treatment of multiple TFTs using liquid deposition, e.g. printing
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T428/00—Stock material or miscellaneous articles
- Y10T428/24—Structurally defined web or sheet [e.g., overall dimension, etc.]
- Y10T428/24802—Discontinuous or differential coating, impregnation or bond [e.g., artwork, printing, retouched photograph, etc.]
Landscapes
- Engineering & Computer Science (AREA)
- Chemical & Material Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Materials Engineering (AREA)
- Wood Science & Technology (AREA)
- Organic Chemistry (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Nanotechnology (AREA)
- Crystallography & Structural Chemistry (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Inorganic Chemistry (AREA)
- Thin Film Transistor (AREA)
- Inks, Pencil-Leads, Or Crayons (AREA)
- Liquid Deposition Of Substances Of Which Semiconductor Devices Are Composed (AREA)
- Electrodes Of Semiconductors (AREA)
- Silicon Compounds (AREA)
- Formation Of Insulating Films (AREA)
- Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
Applications Claiming Priority (7)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US92798407P | 2007-05-04 | 2007-05-04 | |
| US60/927,984 | 2007-05-04 | ||
| US99733507P | 2007-10-01 | 2007-10-01 | |
| US60/997,335 | 2007-10-01 | ||
| US12/114,741 | 2008-05-02 | ||
| US12/114,741 US8530589B2 (en) | 2007-05-04 | 2008-05-02 | Print processing for patterned conductor, semiconductor and dielectric materials |
| PCT/US2008/062586 WO2008137811A2 (en) | 2007-05-04 | 2008-05-03 | Print processing for patterned conductor, semiconductor and dielectric materials |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN101681800A CN101681800A (zh) | 2010-03-24 |
| CN101681800B true CN101681800B (zh) | 2013-01-30 |
Family
ID=39944222
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN2008800147418A Active CN101681800B (zh) | 2007-05-04 | 2008-05-03 | 图案化的导体、半导体和电介质材料的印刷方法 |
Country Status (6)
| Country | Link |
|---|---|
| US (2) | US8530589B2 (enExample) |
| EP (1) | EP2145350B1 (enExample) |
| JP (1) | JP5681878B2 (enExample) |
| KR (1) | KR101526021B1 (enExample) |
| CN (1) | CN101681800B (enExample) |
| WO (1) | WO2008137811A2 (enExample) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI735435B (zh) | 2015-03-30 | 2021-08-11 | 德商麥克專利有限公司 | 有機功能性材料之配方 |
Families Citing this family (40)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7494903B2 (en) * | 2007-01-29 | 2009-02-24 | Eastman Kodak Company | Doped nanoparticle semiconductor charge transport layer |
| US8424176B2 (en) * | 2008-11-25 | 2013-04-23 | Kovio, Inc. | Methods of forming tunable capacitors |
| KR101134448B1 (ko) | 2009-03-10 | 2012-04-09 | 서울대학교산학협력단 | 게르마늄 계열의 필름 제조 방법 |
| DE102009002758A1 (de) * | 2009-04-30 | 2010-11-11 | Evonik Degussa Gmbh | Bandgap Tailoring von Solarzellen aus Flüssigsilan mittels Germanium-Zugabe |
| KR20100128897A (ko) * | 2009-05-29 | 2010-12-08 | 주식회사 동진디스플레이재료 | 인쇄 패턴 형성 방법 |
| US7910393B2 (en) | 2009-06-17 | 2011-03-22 | Innovalight, Inc. | Methods for forming a dual-doped emitter on a silicon substrate with a sub-critical shear thinning nanoparticle fluid |
| WO2010149579A2 (de) * | 2009-06-22 | 2010-12-29 | Basf Se | Verfahren zur herstellung einer strukturierten metallischen beschichtung |
| DE102009056731A1 (de) * | 2009-12-04 | 2011-06-09 | Rev Renewable Energy Ventures, Inc. | Halogenierte Polysilane und Polygermane |
| CN102822985B (zh) * | 2010-04-06 | 2016-08-03 | 薄膜电子有限公司 | 外延结构、其形成方法及包含该结构的器件 |
| GB201007669D0 (en) * | 2010-05-07 | 2010-06-23 | Epigem Ltd | Composite electrode for molecular electronic devices and method of manufacture thereof |
| US8895962B2 (en) * | 2010-06-29 | 2014-11-25 | Nanogram Corporation | Silicon/germanium nanoparticle inks, laser pyrolysis reactors for the synthesis of nanoparticles and associated methods |
| US8377738B2 (en) * | 2010-07-01 | 2013-02-19 | Sunpower Corporation | Fabrication of solar cells with counter doping prevention |
| DE102010031187A1 (de) * | 2010-07-09 | 2012-01-12 | Robert Bosch Gmbh | Schichtdicken optimierendes Jettlayout |
| KR20120052043A (ko) * | 2010-11-15 | 2012-05-23 | 삼성전자주식회사 | 잉크젯 프린트용 기판의 표면 개질 방법 |
| TWI511315B (zh) * | 2010-12-10 | 2015-12-01 | Teijin Ltd | Semiconductor laminates, semiconductor devices, and the like |
| JP5578128B2 (ja) * | 2011-03-31 | 2014-08-27 | コニカミノルタ株式会社 | 導電性パターン部材形成方法 |
| WO2012145473A1 (en) * | 2011-04-21 | 2012-10-26 | Linde Aktiengesellschaft | Dry fluorine texturing of crystalline silicon surfaces for enhanced photovoltaic production efficiency |
| US8900654B2 (en) * | 2011-07-29 | 2014-12-02 | Thin Film Electronics, Inc. | Methods of polymerizing silanes and cyclosilanes using N-heterocyclic carbenes, metal complexes having N-heterocyclic carbene ligands, and lanthanide compounds |
| KR20140090275A (ko) * | 2012-11-21 | 2014-07-17 | 삼성전자주식회사 | 잉크젯 프린팅 기법을 이용한 도전성 패턴 형성 방법 |
| US20140179056A1 (en) * | 2012-12-21 | 2014-06-26 | Michael MORSE | Laser-absorbing seed layer for solar cell conductive contact |
| US9132622B2 (en) | 2013-03-04 | 2015-09-15 | Uni-Pixel Displays, Inc. | Method of printing uniform line widths with angle effect |
| JP2016519640A (ja) * | 2013-03-15 | 2016-07-07 | エヌディーエスユー リサーチ ファウンデーション | 液体シランおよびヘテロ原子添加物を処理により形成されるシリコン材料 |
| WO2014144862A2 (en) | 2013-03-15 | 2014-09-18 | Ndsu Research Foundation | Synthesis of silicon containing materials using liquid hydrosilane compositions through direct injection |
| KR102442752B1 (ko) | 2013-05-20 | 2022-09-14 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치 |
| JP6400336B2 (ja) | 2013-06-05 | 2018-10-03 | 株式会社半導体エネルギー研究所 | 半導体装置 |
| DE102013010101A1 (de) | 2013-06-18 | 2014-12-18 | Evonik Industries Ag | Formulierungen umfassend Hydridosilane und Hydridosilan-Oligomere, Verfahren zu ihrer Herstellung und ihrer Verwendung |
| DE102013010102A1 (de) | 2013-06-18 | 2014-12-18 | Evonik Industries Ag | Formulierungen umfassend Hydridosilane und Hydridosilan-Oligomere, Verfahren zu ihrer Herstellung und ihrer Verwendung |
| DE102013010099B4 (de) | 2013-06-18 | 2015-07-09 | Evonik Industries Ag | Verfahren zur Herstellung strukturierter Beschichtungen, mit dem Verfahren hergestellte strukturierte Beschichtungen und ihre Verwendung |
| JP6322503B2 (ja) | 2013-07-16 | 2018-05-09 | 株式会社半導体エネルギー研究所 | 半導体装置 |
| TWI548005B (zh) * | 2014-01-24 | 2016-09-01 | 環旭電子股份有限公司 | 選擇性電子封裝模組的製造方法 |
| EP2960059B1 (en) | 2014-06-25 | 2018-10-24 | Universal Display Corporation | Systems and methods of modulating flow during vapor jet deposition of organic materials |
| US11220737B2 (en) * | 2014-06-25 | 2022-01-11 | Universal Display Corporation | Systems and methods of modulating flow during vapor jet deposition of organic materials |
| US11267012B2 (en) | 2014-06-25 | 2022-03-08 | Universal Display Corporation | Spatial control of vapor condensation using convection |
| WO2016093145A1 (ja) | 2014-12-12 | 2016-06-16 | 東洋鋼鈑株式会社 | 金属めっき被覆ステンレス材の製造方法 |
| WO2016150549A2 (de) * | 2015-03-23 | 2016-09-29 | Merck Patent Gmbh | Druckbare tinte zur verwendung als diffusions- und legierungsbarriere zur herstellung von hocheffizienten kristallinen siliziumsolarzellen |
| EP3304558B1 (en) * | 2015-06-05 | 2023-09-06 | Australian Advanced Materials Pty Ltd | A memory structure for use in resistive random access memory devices and method for use in manufacturing a data storage device |
| US10566534B2 (en) | 2015-10-12 | 2020-02-18 | Universal Display Corporation | Apparatus and method to deliver organic material via organic vapor-jet printing (OVJP) |
| JP6568953B2 (ja) * | 2015-12-24 | 2019-08-28 | 株式会社フジクラ | 配線基板の製造方法及び配線基板 |
| CN108467628A (zh) * | 2018-04-18 | 2018-08-31 | 湖南省国银新材料有限公司 | 一种半导体纳米墨水 |
| CN110970308B (zh) * | 2018-09-30 | 2023-07-21 | 中国科学院苏州纳米技术与纳米仿生研究所 | 薄膜晶体管及其异质结有源层的制作方法 |
Family Cites Families (32)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5652019A (en) * | 1995-10-10 | 1997-07-29 | Rockwell International Corporation | Method for producing resistive gradients on substrates and articles produced thereby |
| JPH09237927A (ja) | 1995-12-26 | 1997-09-09 | Toshiba Corp | 半導体薄膜形成方法および太陽電池の製造方法 |
| US6014121A (en) * | 1995-12-28 | 2000-01-11 | Canon Kabushiki Kaisha | Display panel and apparatus capable of resolution conversion |
| BR9705156A (pt) * | 1996-10-25 | 2000-01-04 | Massachusetts Inst Technology | Processo e sistema de fabricar um componente que consiste em partes constituìdas de diferentes materiais |
| US5874197A (en) * | 1997-09-18 | 1999-02-23 | E. I. Du Pont De Nemours And Company | Thermal assisted photosensitive composition and method thereof |
| DE69840914D1 (de) * | 1997-10-14 | 2009-07-30 | Patterning Technologies Ltd | Methode zur Herstellung eines elektrischen Kondensators |
| US6294401B1 (en) * | 1998-08-19 | 2001-09-25 | Massachusetts Institute Of Technology | Nanoparticle-based electrical, chemical, and mechanical structures and methods of making same |
| WO2000010736A1 (en) * | 1998-08-21 | 2000-03-02 | Sri International | Printing of electronic circuits and components |
| CN1294626C (zh) | 1999-03-30 | 2007-01-10 | 精工爱普生株式会社 | 硅膜的形成方法和喷墨用油墨组合物 |
| TWI281921B (en) * | 2000-03-13 | 2007-06-01 | Jsr Corp | Novel cyclosilane compound, and solution composition and process for forming a silicon film |
| TW555690B (en) * | 2001-08-14 | 2003-10-01 | Jsr Corp | Silane composition, silicon film forming method and solar cell production method |
| US7629017B2 (en) * | 2001-10-05 | 2009-12-08 | Cabot Corporation | Methods for the deposition of conductive electronic features |
| US20060001726A1 (en) * | 2001-10-05 | 2006-01-05 | Cabot Corporation | Printable conductive features and processes for making same |
| US6951666B2 (en) * | 2001-10-05 | 2005-10-04 | Cabot Corporation | Precursor compositions for the deposition of electrically conductive features |
| JP2003313299A (ja) * | 2002-04-22 | 2003-11-06 | Seiko Epson Corp | 高次シラン組成物及び該組成物を用いたシリコン膜の形成方法 |
| US7390597B2 (en) * | 2002-06-13 | 2008-06-24 | Dai Nippon Printing Co., Ltd. | Method for manufacturing color filter |
| GB2391385A (en) * | 2002-07-26 | 2004-02-04 | Seiko Epson Corp | Patterning method by forming indent region to control spreading of liquid material deposited onto substrate |
| GB0301089D0 (en) * | 2003-01-17 | 2003-02-19 | Plastic Logic Ltd | Active layer islands |
| JP4042685B2 (ja) * | 2003-03-26 | 2008-02-06 | セイコーエプソン株式会社 | トランジスタの製造方法 |
| US7879696B2 (en) * | 2003-07-08 | 2011-02-01 | Kovio, Inc. | Compositions and methods for forming a semiconducting and/or silicon-containing film, and structures formed therefrom |
| US7618704B2 (en) * | 2003-09-29 | 2009-11-17 | E.I. Du Pont De Nemours And Company | Spin-printing of electronic and display components |
| JP2005219981A (ja) | 2004-02-06 | 2005-08-18 | Seiko Epson Corp | 高次シラン溶液の製造方法、シリコン膜の形成方法、シリコン膜、tft及び電気光学装置 |
| JP2005223268A (ja) * | 2004-02-09 | 2005-08-18 | Seiko Epson Corp | 薄膜トランジスタの製造方法、ディスプレイの製造方法及びディスプレイ |
| US7531294B2 (en) * | 2004-03-25 | 2009-05-12 | Semiconductor Energy Laboratory Co., Ltd. | Method for forming film pattern, method for manufacturing semiconductor device, liquid crystal television, and EL television |
| WO2006076610A2 (en) * | 2005-01-14 | 2006-07-20 | Cabot Corporation | Controlling ink migration during the formation of printable electronic features |
| PL1853671T3 (pl) * | 2005-03-04 | 2014-01-31 | Inktec Co Ltd | Tusze przewodzące i sposób ich wytwarzania |
| JP4725146B2 (ja) * | 2005-03-17 | 2011-07-13 | セイコーエプソン株式会社 | 高次シラン組成物、膜付基板の製造方法、電気光学装置および電子デバイス |
| US7390745B2 (en) * | 2005-09-23 | 2008-06-24 | International Business Machines Corporation | Pattern enhancement by crystallographic etching |
| JP5888831B2 (ja) * | 2005-10-05 | 2016-03-22 | シン フィルム エレクトロニクス エーエスエー | 架橋済みポリマー及びその製造方法 |
| EP1957608A2 (en) * | 2005-10-28 | 2008-08-20 | Cabot Corporation | Luminescent compositions, methods for making luminescent compositions and inks incorporating the same |
| US7709307B2 (en) * | 2006-08-24 | 2010-05-04 | Kovio, Inc. | Printed non-volatile memory |
| WO2010011974A1 (en) * | 2008-07-24 | 2010-01-28 | Kovio, Inc. | Aluminum inks and methods of making the same, methods for depositing aluminum inks, and films formed by printing and/or depositing an aluminum ink |
-
2008
- 2008-05-02 US US12/114,741 patent/US8530589B2/en active Active
- 2008-05-03 JP JP2010506708A patent/JP5681878B2/ja active Active
- 2008-05-03 KR KR1020097022967A patent/KR101526021B1/ko active Active
- 2008-05-03 CN CN2008800147418A patent/CN101681800B/zh active Active
- 2008-05-03 EP EP08755038.0A patent/EP2145350B1/en active Active
- 2008-05-03 WO PCT/US2008/062586 patent/WO2008137811A2/en not_active Ceased
-
2013
- 2013-08-23 US US13/975,231 patent/US9045653B2/en active Active
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI735435B (zh) | 2015-03-30 | 2021-08-11 | 德商麥克專利有限公司 | 有機功能性材料之配方 |
Also Published As
| Publication number | Publication date |
|---|---|
| US20130344301A1 (en) | 2013-12-26 |
| EP2145350A2 (en) | 2010-01-20 |
| US9045653B2 (en) | 2015-06-02 |
| EP2145350B1 (en) | 2020-04-15 |
| US8530589B2 (en) | 2013-09-10 |
| WO2008137811A3 (en) | 2009-12-30 |
| CN101681800A (zh) | 2010-03-24 |
| US20090065776A1 (en) | 2009-03-12 |
| JP2010526445A (ja) | 2010-07-29 |
| JP5681878B2 (ja) | 2015-03-11 |
| KR101526021B1 (ko) | 2015-06-04 |
| WO2008137811A2 (en) | 2008-11-13 |
| EP2145350A4 (en) | 2011-10-26 |
| KR20100016173A (ko) | 2010-02-12 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN101681800B (zh) | 图案化的导体、半导体和电介质材料的印刷方法 | |
| US8426905B2 (en) | Profile engineered, electrically active thin film devices | |
| US8796125B2 (en) | Printed, self-aligned, top gate thin film transistor | |
| CN102822985B (zh) | 外延结构、其形成方法及包含该结构的器件 | |
| KR20110046439A (ko) | 알루미늄 잉크 및 이의 제조 방법, 알루미늄 잉크 증착 방법 및 알루미늄 잉크의 인쇄 및/또는 증착에 의해 형성된 필름 | |
| US9224600B2 (en) | Method of manufacturing part of a thin-film device using an ink comprising a material precursor | |
| US9620625B2 (en) | Manufacturing a submicron structure using a liquid precursor | |
| US9155202B2 (en) | Print compatible designs and layout schemes for printed electronics | |
| CN100562978C (zh) | 印刷式自对准上闸极薄膜晶体管 |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| ASS | Succession or assignment of patent right |
Owner name: FILM ELECTRONIC CO., LTD. Free format text: FORMER OWNER: KOVIO INC. Effective date: 20141105 |
|
| C41 | Transfer of patent application or patent right or utility model | ||
| TR01 | Transfer of patent right |
Effective date of registration: 20141105 Address after: Oslo, Norway Patentee after: THIN FILM ELECTRONICS ASA Address before: California, USA Patentee before: KOVIO, Inc. |