CN101377530A - 半导体器件测试图形交互式布局的方法 - Google Patents
半导体器件测试图形交互式布局的方法 Download PDFInfo
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类型 | 镜像 | 旋转(逆时针) |
N | 否 | 否 |
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E | 否 | 270 |
FE | X轴 | 90 |
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CN101377530A true CN101377530A (zh) | 2009-03-04 |
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Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101847164B (zh) * | 2009-03-25 | 2012-05-30 | 北京兆易创新科技有限公司 | 一种sram版图制作方法及装置 |
CN101847165B (zh) * | 2009-03-25 | 2012-07-04 | 北京兆易创新科技有限公司 | 一种存储器器件的版图绘制方法及装置 |
CN102662143A (zh) * | 2012-04-24 | 2012-09-12 | 合肥工业大学 | 一种电路测试中可视化选取待测器件的方法 |
CN102981114A (zh) * | 2012-12-10 | 2013-03-20 | 深圳深爱半导体股份有限公司 | 晶圆中芯片的测试方法 |
CN104977518A (zh) * | 2014-04-09 | 2015-10-14 | 中芯国际集成电路制造(上海)有限公司 | 一种晶圆出货检验方法 |
Family Cites Families (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN1702656A (zh) * | 2005-06-23 | 2005-11-30 | 复旦大学 | 一种基于权重的平面布图规划方法 |
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2007
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Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101847164B (zh) * | 2009-03-25 | 2012-05-30 | 北京兆易创新科技有限公司 | 一种sram版图制作方法及装置 |
CN101847165B (zh) * | 2009-03-25 | 2012-07-04 | 北京兆易创新科技有限公司 | 一种存储器器件的版图绘制方法及装置 |
CN102662143A (zh) * | 2012-04-24 | 2012-09-12 | 合肥工业大学 | 一种电路测试中可视化选取待测器件的方法 |
CN102981114A (zh) * | 2012-12-10 | 2013-03-20 | 深圳深爱半导体股份有限公司 | 晶圆中芯片的测试方法 |
CN104977518A (zh) * | 2014-04-09 | 2015-10-14 | 中芯国际集成电路制造(上海)有限公司 | 一种晶圆出货检验方法 |
CN104977518B (zh) * | 2014-04-09 | 2018-05-01 | 中芯国际集成电路制造(上海)有限公司 | 一种晶圆出货检验方法 |
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CN101377530B (zh) | 2011-02-02 |
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