CN101847165B - 一种存储器器件的版图绘制方法及装置 - Google Patents
一种存储器器件的版图绘制方法及装置 Download PDFInfo
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CN101847165B true CN101847165B (zh) | 2012-07-04 |
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Families Citing this family (6)
Publication number | Priority date | Publication date | Assignee | Title |
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CN102043884B (zh) * | 2010-12-29 | 2012-07-04 | 杭州广立微电子有限公司 | 一种减小版图文件大小的方法 |
CN102768689B (zh) * | 2011-04-30 | 2014-11-26 | 深圳光启高等理工研究院 | 一种超材料单元结构的绘制方法 |
CN103136385B (zh) * | 2011-11-23 | 2015-06-03 | 上海华虹宏力半导体制造有限公司 | 集成电路版图在缩小实验后自动连线的方法 |
CN103136394B (zh) * | 2011-11-28 | 2016-04-13 | 上海华虹宏力半导体制造有限公司 | 一种模块级版图设计的端口放置方法 |
CN106844809A (zh) * | 2015-12-04 | 2017-06-13 | 展讯通信(上海)有限公司 | 一种获取存储器宏单元尺寸的方法及装置 |
CN109002587A (zh) * | 2018-06-25 | 2018-12-14 | 中国电子科技集团公司第四十研究所 | 一种双面版图设计方法、双面版图及双面版图切割方法 |
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CN101201382A (zh) * | 2006-12-11 | 2008-06-18 | 上海华虹Nec电子有限公司 | 生成器件测试图形的方法 |
CN101377530A (zh) * | 2007-08-31 | 2009-03-04 | 上海华虹Nec电子有限公司 | 半导体器件测试图形交互式布局的方法 |
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CN101201382A (zh) * | 2006-12-11 | 2008-06-18 | 上海华虹Nec电子有限公司 | 生成器件测试图形的方法 |
CN101377530A (zh) * | 2007-08-31 | 2009-03-04 | 上海华虹Nec电子有限公司 | 半导体器件测试图形交互式布局的方法 |
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