CN101059454B - 检测装置和检测方法 - Google Patents
检测装置和检测方法 Download PDFInfo
- Publication number
- CN101059454B CN101059454B CN2007100965349A CN200710096534A CN101059454B CN 101059454 B CN101059454 B CN 101059454B CN 2007100965349 A CN2007100965349 A CN 2007100965349A CN 200710096534 A CN200710096534 A CN 200710096534A CN 101059454 B CN101059454 B CN 101059454B
- Authority
- CN
- China
- Prior art keywords
- holding member
- transmission path
- porous material
- thz wave
- thz
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
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Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
- G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
- G01N21/3581—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light using far infrared light; using Terahertz radiation
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/01—Arrangements or apparatus for facilitating the optical investigation
- G01N21/03—Cuvette constructions
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
- G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
- G01N21/3577—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing liquids, e.g. polluted water
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N22/00—Investigating or analysing materials by the use of microwaves or radio waves, i.e. electromagnetic waves with a wavelength of one millimetre or more
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/01—Arrangements or apparatus for facilitating the optical investigation
- G01N21/03—Cuvette constructions
- G01N2021/0346—Capillary cells; Microcells
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/01—Arrangements or apparatus for facilitating the optical investigation
- G01N21/03—Cuvette constructions
- G01N2021/0346—Capillary cells; Microcells
- G01N2021/035—Supports for sample drops
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Biochemistry (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Electromagnetism (AREA)
- Toxicology (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
- Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
Applications Claiming Priority (6)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2006-108563 | 2006-04-11 | ||
| JP2006108563 | 2006-04-11 | ||
| JP2006108563 | 2006-04-11 | ||
| JP2007023610 | 2007-02-02 | ||
| JP2007023610A JP4898472B2 (ja) | 2006-04-11 | 2007-02-02 | 検査装置 |
| JP2007-023610 | 2007-02-02 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN101059454A CN101059454A (zh) | 2007-10-24 |
| CN101059454B true CN101059454B (zh) | 2011-04-27 |
Family
ID=38231128
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN2007100965349A Expired - Fee Related CN101059454B (zh) | 2006-04-11 | 2007-04-11 | 检测装置和检测方法 |
Country Status (4)
| Country | Link |
|---|---|
| US (2) | US7560695B2 (cg-RX-API-DMAC10.html) |
| EP (1) | EP1845364A3 (cg-RX-API-DMAC10.html) |
| JP (1) | JP4898472B2 (cg-RX-API-DMAC10.html) |
| CN (1) | CN101059454B (cg-RX-API-DMAC10.html) |
Families Citing this family (52)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP4217646B2 (ja) * | 2004-03-26 | 2009-02-04 | キヤノン株式会社 | 認証方法及び認証装置 |
| JP4878180B2 (ja) * | 2005-03-24 | 2012-02-15 | キヤノン株式会社 | 電磁波を用いる検査装置 |
| JP4390147B2 (ja) * | 2005-03-28 | 2009-12-24 | キヤノン株式会社 | 周波数可変発振器 |
| JP4250603B2 (ja) * | 2005-03-28 | 2009-04-08 | キヤノン株式会社 | テラヘルツ波の発生素子、及びその製造方法 |
| JP2006275910A (ja) * | 2005-03-30 | 2006-10-12 | Canon Inc | 位置センシング装置及び位置センシング方法 |
| JP4402026B2 (ja) | 2005-08-30 | 2010-01-20 | キヤノン株式会社 | センシング装置 |
| JP4773839B2 (ja) * | 2006-02-15 | 2011-09-14 | キヤノン株式会社 | 対象物の情報を検出する検出装置 |
| JP4481946B2 (ja) | 2006-03-17 | 2010-06-16 | キヤノン株式会社 | 検出素子及び画像形成装置 |
| JP5132146B2 (ja) * | 2006-03-17 | 2013-01-30 | キヤノン株式会社 | 分析方法、分析装置、及び検体保持部材 |
| JP4732201B2 (ja) * | 2006-03-17 | 2011-07-27 | キヤノン株式会社 | 電磁波を用いたセンシング装置 |
| JP4829669B2 (ja) * | 2006-04-28 | 2011-12-07 | キヤノン株式会社 | 検体情報取得装置、及び検体情報取得方法 |
| JP4709059B2 (ja) | 2006-04-28 | 2011-06-22 | キヤノン株式会社 | 検査装置及び検査方法 |
| JP5006642B2 (ja) | 2006-05-31 | 2012-08-22 | キヤノン株式会社 | テラヘルツ波発振器 |
| JP5196750B2 (ja) | 2006-08-25 | 2013-05-15 | キヤノン株式会社 | 発振素子 |
| JP4873746B2 (ja) * | 2006-12-21 | 2012-02-08 | キヤノン株式会社 | 発振素子 |
| JP4977048B2 (ja) * | 2007-02-01 | 2012-07-18 | キヤノン株式会社 | アンテナ素子 |
| US8067739B2 (en) * | 2007-06-22 | 2011-11-29 | Canon Kabushiki Kaisha | Photoconductive element for generation and detection of terahertz wave |
| JP5144175B2 (ja) * | 2007-08-31 | 2013-02-13 | キヤノン株式会社 | 電磁波を用いる検査装置及び検査方法 |
| US7869036B2 (en) * | 2007-08-31 | 2011-01-11 | Canon Kabushiki Kaisha | Analysis apparatus for analyzing a specimen by obtaining electromagnetic spectrum information |
| JP5354971B2 (ja) * | 2007-08-31 | 2013-11-27 | キヤノン株式会社 | イメージング方法及び装置 |
| JP4807707B2 (ja) * | 2007-11-30 | 2011-11-02 | キヤノン株式会社 | 波形情報取得装置 |
| JP4975000B2 (ja) * | 2007-12-07 | 2012-07-11 | キヤノン株式会社 | 電磁波発生素子、電磁波集積素子、及び電磁波検出装置 |
| JP4975001B2 (ja) * | 2007-12-28 | 2012-07-11 | キヤノン株式会社 | 波形情報取得装置及び波形情報取得方法 |
| JP5341488B2 (ja) | 2008-01-18 | 2013-11-13 | キヤノン株式会社 | テラヘルツ波を測定するための装置及び方法 |
| JP4834718B2 (ja) * | 2008-01-29 | 2011-12-14 | キヤノン株式会社 | パルスレーザ装置、テラヘルツ発生装置、テラヘルツ計測装置及びテラヘルツトモグラフィー装置 |
| JP5328319B2 (ja) * | 2008-01-29 | 2013-10-30 | キヤノン株式会社 | テラヘルツ波を用いた検査装置及び検査方法 |
| JP5172467B2 (ja) * | 2008-05-22 | 2013-03-27 | 日本電信電話株式会社 | 血液中成分の定量分光分析法 |
| US20100067203A1 (en) * | 2008-07-08 | 2010-03-18 | T-Ray Science Inc. | Apparatus for carrying photoconductive integrated circuits |
| JP5178398B2 (ja) * | 2008-08-27 | 2013-04-10 | キヤノン株式会社 | 光伝導素子 |
| JP5665305B2 (ja) * | 2008-12-25 | 2015-02-04 | キヤノン株式会社 | 分析装置 |
| JP5612842B2 (ja) | 2009-09-07 | 2014-10-22 | キヤノン株式会社 | 発振器 |
| JP5632599B2 (ja) | 2009-09-07 | 2014-11-26 | キヤノン株式会社 | 発振器 |
| KR101291319B1 (ko) * | 2009-09-18 | 2013-07-30 | 한국전자통신연구원 | 테라헤르츠파 발생/검출기 및 그의 제조방법 |
| JP5735824B2 (ja) | 2011-03-04 | 2015-06-17 | キヤノン株式会社 | 情報取得装置及び情報取得方法 |
| EP2717037B1 (en) | 2011-06-01 | 2019-06-12 | Murata Manufacturing Co., Ltd. | Spectroscopic measurement method in reflection geometry |
| CN103884741A (zh) * | 2013-04-11 | 2014-06-25 | 闫玮祎 | 射频频率感应器 |
| WO2015118532A1 (en) | 2014-02-05 | 2015-08-13 | Vayyar Imaging Ltd | System devise and method for testing an object |
| WO2016174675A2 (en) | 2015-04-26 | 2016-11-03 | Vayyar Imaging Ltd | System devise and methods for measuring substances' dielectric properties using microwave sensors |
| WO2016174679A2 (en) | 2015-04-27 | 2016-11-03 | Vayyar Imaging Ltd | System and methods for calibrating an antenna array using targets |
| WO2016174680A1 (en) | 2015-04-29 | 2016-11-03 | Vayyar Imaging Ltd | System, device and methods for localization and orientation of a radio frequency antenna array |
| US10690760B2 (en) | 2015-05-05 | 2020-06-23 | Vayyar Imaging Ltd | System and methods for three dimensional modeling of an object using a radio frequency device |
| US10809372B2 (en) | 2015-05-11 | 2020-10-20 | Vayyar Imaging Ltd. | System, device and methods for imaging of objects using electromagnetic array |
| US10290948B2 (en) | 2015-08-02 | 2019-05-14 | Vayyar Imaging Ltd | System and method for radio frequency penetration imaging of an object |
| CN105486731B (zh) * | 2015-08-12 | 2018-08-21 | 成都市亿泰科技有限公司 | 基于太赫兹增强的无创血糖检测探头 |
| US10436896B2 (en) | 2015-11-29 | 2019-10-08 | Vayyar Imaging Ltd. | System, device and method for imaging of objects using signal clustering |
| EP3381547A1 (en) * | 2017-03-30 | 2018-10-03 | Canon Medical Systems Corporation | Specimen test apparatus |
| JP7288296B2 (ja) | 2017-12-13 | 2023-06-07 | キヤノン株式会社 | テラヘルツ波カメラおよび検出モジュール |
| JP7362409B2 (ja) | 2019-10-17 | 2023-10-17 | キヤノン株式会社 | 照明装置およびカメラシステム |
| CN112198468B (zh) * | 2020-09-11 | 2022-01-14 | 中国科学院金属研究所 | 一种波导法微波介质材料超低温复电磁参数测试装置 |
| JP7801938B2 (ja) | 2022-04-15 | 2026-01-19 | キヤノン株式会社 | アンテナ装置、通信装置、及び、撮像システム |
| JP7851175B2 (ja) | 2022-04-15 | 2026-04-24 | キヤノン株式会社 | アンテナ装置、通信装置、及び、撮像システム |
| JP2024147970A (ja) * | 2023-04-04 | 2024-10-17 | 浜松ホトニクス株式会社 | 吸着評価装置および吸着評価方法 |
Citations (3)
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| CN2363274Y (zh) * | 1998-12-31 | 2000-02-09 | 沈又珠 | 不相溶混装液体界面检测传感器 |
| CN2524239Y (zh) * | 2001-08-22 | 2002-12-04 | 王骞 | 液体混浊度测试传感器 |
| WO2005022129A1 (en) * | 2003-08-27 | 2005-03-10 | Canon Kabushiki Kaisha | Sensor for detecting a target substance in a fluid |
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| US5032975A (en) | 1987-08-07 | 1991-07-16 | Canon Kabushiki Kaisha | Controller for automatic assembling apparatus |
| JPH04326201A (ja) * | 1991-04-25 | 1992-11-16 | Nec Yamagata Ltd | 半導体装置 |
| US5470757A (en) * | 1991-06-25 | 1995-11-28 | Minnesota Mining And Manufacturing Company | Spectroscopic sample holder and method for using same |
| JPH05142142A (ja) * | 1991-11-18 | 1993-06-08 | Hitachi Ltd | 分光光度計 |
| JP3210159B2 (ja) | 1993-12-10 | 2001-09-17 | キヤノン株式会社 | 半導体レーザ、光源装置、光通信システム及び光通信方法 |
| JPH07229829A (ja) * | 1994-02-18 | 1995-08-29 | Hitachi Ltd | 全反射プリズムセル |
| JPH07307530A (ja) | 1994-03-17 | 1995-11-21 | Canon Inc | 偏波変調可能な半導体レーザ |
| US5659560A (en) | 1994-05-12 | 1997-08-19 | Canon Kabushiki Kaisha | Apparatus and method for driving oscillation polarization selective light source, and optical communication system using the same |
| US5764670A (en) | 1995-02-27 | 1998-06-09 | Canon Kabushiki Kaisha | Semiconductor laser apparatus requiring no external modulator, method of driving semiconductor laser device, and optical communication system using the semiconductor laser apparatus |
| DE19509094A1 (de) * | 1995-03-16 | 1996-09-26 | Boehringer Mannheim Gmbh | Quantitative Transmissionsspektroskopie unter Verwendung von Probenträgern mit Netzen |
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| JP2001042170A (ja) | 1999-07-28 | 2001-02-16 | Canon Inc | 光配線装置、その駆動方法およびそれを用いた電子機器 |
| ITMI20012030A1 (it) * | 2000-10-04 | 2003-03-28 | Sumitomo Chemical Co | Dispositivo per il controllo di animali nocivi e supporto per sostanze volatili da usare nello stesso |
| JP2002310882A (ja) | 2001-04-17 | 2002-10-23 | Canon Inc | 走査型プローブによる信号検出装置、該装置によるプローブ顕微鏡、及び走査型プローブによる信号検出方法、該方法を用いてサンプル表面を観察する観察方法 |
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| JP4136858B2 (ja) | 2003-09-12 | 2008-08-20 | キヤノン株式会社 | 位置検出装置、及び情報入力装置 |
| JP2005157601A (ja) | 2003-11-25 | 2005-06-16 | Canon Inc | 電磁波による積層状物体計数装置及び計数方法 |
| JP4217646B2 (ja) | 2004-03-26 | 2009-02-04 | キヤノン株式会社 | 認証方法及び認証装置 |
| JP4250573B2 (ja) | 2004-07-16 | 2009-04-08 | キヤノン株式会社 | 素子 |
| JP4546326B2 (ja) | 2004-07-30 | 2010-09-15 | キヤノン株式会社 | センシング装置 |
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| JP2006121643A (ja) | 2004-09-21 | 2006-05-11 | Canon Inc | 平面アンテナ |
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| JP4773839B2 (ja) | 2006-02-15 | 2011-09-14 | キヤノン株式会社 | 対象物の情報を検出する検出装置 |
| JP5132146B2 (ja) | 2006-03-17 | 2013-01-30 | キヤノン株式会社 | 分析方法、分析装置、及び検体保持部材 |
| JP4481946B2 (ja) | 2006-03-17 | 2010-06-16 | キヤノン株式会社 | 検出素子及び画像形成装置 |
| JP4709059B2 (ja) | 2006-04-28 | 2011-06-22 | キヤノン株式会社 | 検査装置及び検査方法 |
| JP5196750B2 (ja) | 2006-08-25 | 2013-05-15 | キヤノン株式会社 | 発振素子 |
-
2007
- 2007-02-02 JP JP2007023610A patent/JP4898472B2/ja not_active Expired - Fee Related
- 2007-03-28 US US11/727,673 patent/US7560695B2/en not_active Expired - Fee Related
- 2007-04-10 EP EP20070105871 patent/EP1845364A3/en not_active Withdrawn
- 2007-04-11 CN CN2007100965349A patent/CN101059454B/zh not_active Expired - Fee Related
-
2009
- 2009-04-24 US US12/429,939 patent/US7745791B2/en not_active Expired - Fee Related
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN2363274Y (zh) * | 1998-12-31 | 2000-02-09 | 沈又珠 | 不相溶混装液体界面检测传感器 |
| CN2524239Y (zh) * | 2001-08-22 | 2002-12-04 | 王骞 | 液体混浊度测试传感器 |
| WO2005022129A1 (en) * | 2003-08-27 | 2005-03-10 | Canon Kabushiki Kaisha | Sensor for detecting a target substance in a fluid |
Non-Patent Citations (2)
| Title |
|---|
| M. Nagel et al.Integrated THz technology for label-free genetic diagnostics.Applied Physics Letters80 1.2002,80(1),154-156. |
| M. Nagel et al.Integrated THz technology for label-free genetic diagnostics.Applied Physics Letters80 1.2002,80(1),154-156. * |
Also Published As
| Publication number | Publication date |
|---|---|
| CN101059454A (zh) | 2007-10-24 |
| US7560695B2 (en) | 2009-07-14 |
| US20090236529A1 (en) | 2009-09-24 |
| EP1845364A2 (en) | 2007-10-17 |
| US7745791B2 (en) | 2010-06-29 |
| JP4898472B2 (ja) | 2012-03-14 |
| US20070235718A1 (en) | 2007-10-11 |
| EP1845364A3 (en) | 2010-02-10 |
| JP2007304084A (ja) | 2007-11-22 |
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