CN101040290A - 半导体组件的晶粒跟踪装置及其测试设备 - Google Patents

半导体组件的晶粒跟踪装置及其测试设备 Download PDF

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Publication number
CN101040290A
CN101040290A CNA2005800352387A CN200580035238A CN101040290A CN 101040290 A CN101040290 A CN 101040290A CN A2005800352387 A CNA2005800352387 A CN A2005800352387A CN 200580035238 A CN200580035238 A CN 200580035238A CN 101040290 A CN101040290 A CN 101040290A
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China
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die
string
strings
source object
pointer
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CNA2005800352387A
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English (en)
Chinese (zh)
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高弘隆
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Applied Materials Inc
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Applied Materials Inc
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    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06Q—INFORMATION AND COMMUNICATION TECHNOLOGY [ICT] SPECIALLY ADAPTED FOR ADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL OR SUPERVISORY PURPOSES; SYSTEMS OR METHODS SPECIALLY ADAPTED FOR ADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL OR SUPERVISORY PURPOSES, NOT OTHERWISE PROVIDED FOR
    • G06Q10/00—Administration; Management
    • G06Q10/06—Resources, workflows, human or project management; Enterprise or organisation planning; Enterprise or organisation modelling
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
    • H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
    • H01L21/304—Mechanical treatment, e.g. grinding, polishing, cutting
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06Q—INFORMATION AND COMMUNICATION TECHNOLOGY [ICT] SPECIALLY ADAPTED FOR ADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL OR SUPERVISORY PURPOSES; SYSTEMS OR METHODS SPECIALLY ADAPTED FOR ADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL OR SUPERVISORY PURPOSES, NOT OTHERWISE PROVIDED FOR
    • G06Q10/00—Administration; Management
    • G06Q10/08—Logistics, e.g. warehousing, loading or distribution; Inventory or stock management
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof

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  • Engineering & Computer Science (AREA)
  • Business, Economics & Management (AREA)
  • Economics (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Strategic Management (AREA)
  • Human Resources & Organizations (AREA)
  • Entrepreneurship & Innovation (AREA)
  • Quality & Reliability (AREA)
  • Development Economics (AREA)
  • Theoretical Computer Science (AREA)
  • General Business, Economics & Management (AREA)
  • Tourism & Hospitality (AREA)
  • Operations Research (AREA)
  • Marketing (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Game Theory and Decision Science (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Educational Administration (AREA)
  • Power Engineering (AREA)
  • General Factory Administration (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
CNA2005800352387A 2004-10-15 2005-10-12 半导体组件的晶粒跟踪装置及其测试设备 Pending CN101040290A (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US61880504P 2004-10-15 2004-10-15
US60/618,805 2004-10-15

Publications (1)

Publication Number Publication Date
CN101040290A true CN101040290A (zh) 2007-09-19

Family

ID=35754092

Family Applications (1)

Application Number Title Priority Date Filing Date
CNA2005800352387A Pending CN101040290A (zh) 2004-10-15 2005-10-12 半导体组件的晶粒跟踪装置及其测试设备

Country Status (7)

Country Link
US (2) US7343214B2 (cg-RX-API-DMAC7.html)
EP (1) EP1810326A1 (cg-RX-API-DMAC7.html)
JP (1) JP2008517465A (cg-RX-API-DMAC7.html)
KR (1) KR20070085369A (cg-RX-API-DMAC7.html)
CN (1) CN101040290A (cg-RX-API-DMAC7.html)
TW (1) TW200629026A (cg-RX-API-DMAC7.html)
WO (1) WO2006044399A1 (cg-RX-API-DMAC7.html)

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Also Published As

Publication number Publication date
KR20070085369A (ko) 2007-08-27
JP2008517465A (ja) 2008-05-22
TW200629026A (en) 2006-08-16
WO2006044399A1 (en) 2006-04-27
EP1810326A1 (en) 2007-07-25
US20080071413A1 (en) 2008-03-20
US20060085089A1 (en) 2006-04-20
US7343214B2 (en) 2008-03-11

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Open date: 20070919