CN100523736C - 输出放大电路及采用该输出放大电路的传感器装置 - Google Patents
输出放大电路及采用该输出放大电路的传感器装置 Download PDFInfo
- Publication number
- CN100523736C CN100523736C CNB2005101087501A CN200510108750A CN100523736C CN 100523736 C CN100523736 C CN 100523736C CN B2005101087501 A CNB2005101087501 A CN B2005101087501A CN 200510108750 A CN200510108750 A CN 200510108750A CN 100523736 C CN100523736 C CN 100523736C
- Authority
- CN
- China
- Prior art keywords
- voltage
- input
- output
- amplifier
- operational amplifier
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 230000001133 acceleration Effects 0.000 claims abstract description 60
- 230000001105 regulatory effect Effects 0.000 claims abstract description 9
- 230000008676 import Effects 0.000 claims description 17
- 230000009699 differential effect Effects 0.000 abstract 1
- 230000000694 effects Effects 0.000 description 4
- 230000006872 improvement Effects 0.000 description 4
- 230000008859 change Effects 0.000 description 3
- NAWXUBYGYWOOIX-SFHVURJKSA-N (2s)-2-[[4-[2-(2,4-diaminoquinazolin-6-yl)ethyl]benzoyl]amino]-4-methylidenepentanedioic acid Chemical class C1=CC2=NC(N)=NC(N)=C2C=C1CCC1=CC=C(C(=O)N[C@@H](CC(=C)C(O)=O)C(O)=O)C=C1 NAWXUBYGYWOOIX-SFHVURJKSA-N 0.000 description 2
- 230000009471 action Effects 0.000 description 2
- 230000003321 amplification Effects 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- 238000003199 nucleic acid amplification method Methods 0.000 description 2
- 238000010586 diagram Methods 0.000 description 1
- 238000007599 discharging Methods 0.000 description 1
- 230000033001 locomotion Effects 0.000 description 1
- 230000004044 response Effects 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
Images
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01P—MEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION, OR SHOCK; INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT
- G01P15/00—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration
- G01P15/02—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses
- G01P15/08—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values
- G01P15/12—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values by alteration of electrical resistance
- G01P15/123—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values by alteration of electrical resistance by piezo-resistive elements, e.g. semiconductor strain gauges
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F3/00—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements
- H03F3/45—Differential amplifiers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01P—MEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION, OR SHOCK; INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT
- G01P15/00—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration
Abstract
Description
Claims (4)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2004364310A JP4515241B2 (ja) | 2004-12-16 | 2004-12-16 | 出力増幅回路及びそれを用いたセンサ装置 |
JP364310/04 | 2004-12-16 |
Publications (2)
Publication Number | Publication Date |
---|---|
CN1789919A CN1789919A (zh) | 2006-06-21 |
CN100523736C true CN100523736C (zh) | 2009-08-05 |
Family
ID=36594036
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CNB2005101087501A Expired - Fee Related CN100523736C (zh) | 2004-12-16 | 2005-09-30 | 输出放大电路及采用该输出放大电路的传感器装置 |
Country Status (4)
Country | Link |
---|---|
US (1) | US7117714B2 (zh) |
JP (1) | JP4515241B2 (zh) |
KR (1) | KR101127891B1 (zh) |
CN (1) | CN100523736C (zh) |
Families Citing this family (22)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP2075910A1 (en) * | 2007-12-28 | 2009-07-01 | Varian B.V. | Instrumentation amplification with input offset adjustment |
JP4956573B2 (ja) | 2009-03-19 | 2012-06-20 | 株式会社東芝 | 増幅回路及び磁気センサ |
US8138830B2 (en) * | 2009-04-03 | 2012-03-20 | Qualcomm, Incorporated | Variable gain instrumentation amplifier |
JP5291587B2 (ja) * | 2009-09-25 | 2013-09-18 | セイコーインスツル株式会社 | オペアンプ |
CN101825476B (zh) * | 2010-05-10 | 2012-03-28 | 上海信翊电气控制技术有限公司 | 一种高精度的信号检测放大电路 |
US8823364B2 (en) * | 2010-10-28 | 2014-09-02 | Measurement Specialties, Inc. | DC responsive transducer with on-board user actuated auto-zero |
US9157822B2 (en) * | 2011-02-01 | 2015-10-13 | Kulite Semiconductor Products, Inc. | Electronic interface for LVDT-type pressure transducers using piezoresistive sensors |
TWI477780B (zh) * | 2011-10-12 | 2015-03-21 | Richwave Technology Corp | 壓阻式z軸加速度感測器 |
CN102928160A (zh) * | 2012-11-21 | 2013-02-13 | 昆山北极光电子科技有限公司 | 一种机械的动平衡测量方法 |
WO2014203525A1 (ja) | 2013-06-19 | 2014-12-24 | 旭化成エレクトロニクス株式会社 | 増幅回路及び増幅回路icチップ |
DE102015101741B4 (de) * | 2014-02-14 | 2021-02-11 | Analog Devices Global | Verstärker mit Offset-Kompensation |
US9385673B2 (en) * | 2014-02-14 | 2016-07-05 | Analog Devices Global | Amplifier with offset compensation |
JP6138074B2 (ja) * | 2014-03-07 | 2017-05-31 | 三菱電機株式会社 | 信号伝達回路 |
JP2015177205A (ja) * | 2014-03-13 | 2015-10-05 | ヤマハ株式会社 | オフセットキャンセル回路 |
CN103869863B (zh) * | 2014-03-25 | 2015-06-24 | 成都国科海博信息技术股份有限公司 | 传感器调理电路 |
JP2016086230A (ja) * | 2014-10-23 | 2016-05-19 | 旭化成エレクトロニクス株式会社 | センサ装置 |
CN105547341B (zh) * | 2014-10-31 | 2018-07-27 | 南京河海南自水电自动化有限公司 | 一种测量五线制差动电阻式传感器的装置和方法 |
JP2019092103A (ja) * | 2017-11-16 | 2019-06-13 | アズビル株式会社 | 計装アンプ |
JP2019092104A (ja) * | 2017-11-16 | 2019-06-13 | アズビル株式会社 | 計装アンプ |
JP7150450B2 (ja) * | 2018-03-28 | 2022-10-11 | Ntn株式会社 | 加速度検出装置およびそれを備える軸受装置 |
JP7412881B2 (ja) * | 2018-11-13 | 2024-01-15 | ローム株式会社 | 増幅器 |
JP2020191045A (ja) | 2019-05-24 | 2020-11-26 | セイコーエプソン株式会社 | 指示体、表示システムおよび動作方法 |
Family Cites Families (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2737481B2 (ja) * | 1991-10-02 | 1998-04-08 | 日本電気株式会社 | 半導体加速度センサー |
JP2863758B2 (ja) * | 1991-10-18 | 1999-03-03 | 山武ハネウエル 株式会社 | 入力オフセット電圧補正装置 |
JP3136888B2 (ja) | 1994-03-08 | 2001-02-19 | 日産自動車株式会社 | 加速度センサの感度調整装置 |
JP3274034B2 (ja) * | 1994-12-26 | 2002-04-15 | 三菱電機株式会社 | 半導体加速度検出装置 |
JP3609152B2 (ja) * | 1995-06-13 | 2005-01-12 | 沖電気工業株式会社 | オフセットキャンセル回路とそれを用いたオフセットキャンセルシステム |
JPH0961189A (ja) * | 1995-08-28 | 1997-03-07 | Matsushita Electric Works Ltd | センサ用検出回路 |
JPH09318653A (ja) * | 1996-05-28 | 1997-12-12 | Mitsubishi Electric Corp | 半導体センサ及びその出力調整方法 |
JPH11160347A (ja) * | 1997-11-28 | 1999-06-18 | Matsushita Electric Works Ltd | センサ回路 |
JP3816728B2 (ja) * | 2000-06-29 | 2006-08-30 | 株式会社クボタ | 増幅回路 |
JP2003215172A (ja) | 2002-01-23 | 2003-07-30 | Seiko Epson Corp | 充放電電流検出回路および可変抵抗器 |
-
2004
- 2004-12-16 JP JP2004364310A patent/JP4515241B2/ja active Active
-
2005
- 2005-09-29 US US11/237,977 patent/US7117714B2/en not_active Expired - Fee Related
- 2005-09-30 CN CNB2005101087501A patent/CN100523736C/zh not_active Expired - Fee Related
- 2005-10-18 KR KR1020050097935A patent/KR101127891B1/ko active IP Right Grant
Also Published As
Publication number | Publication date |
---|---|
JP2006174122A (ja) | 2006-06-29 |
KR101127891B1 (ko) | 2012-03-22 |
CN1789919A (zh) | 2006-06-21 |
US7117714B2 (en) | 2006-10-10 |
US20060130583A1 (en) | 2006-06-22 |
JP4515241B2 (ja) | 2010-07-28 |
KR20060069244A (ko) | 2006-06-21 |
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Legal Events
Date | Code | Title | Description |
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C06 | Publication | ||
PB01 | Publication | ||
C10 | Entry into substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
C14 | Grant of patent or utility model | ||
GR01 | Patent grant | ||
ASS | Succession or assignment of patent right |
Owner name: OKI SEMICONDUCTOR CO., LTD. Free format text: FORMER OWNER: OKI ELECTRIC INDUSTRY CO., LTD. Effective date: 20131125 |
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C41 | Transfer of patent application or patent right or utility model | ||
TR01 | Transfer of patent right |
Effective date of registration: 20131125 Address after: Tokyo, Japan, Japan Patentee after: Lapis Semiconductor Co., Ltd. Address before: Tokyo port area, Japan Patentee before: Oki Electric Industry Co., Ltd. |
|
C56 | Change in the name or address of the patentee | ||
CP02 | Change in the address of a patent holder |
Address after: Yokohama City, Kanagawa Prefecture, Japan Patentee after: Lapis Semiconductor Co., Ltd. Address before: Tokyo, Japan, Japan Patentee before: Lapis Semiconductor Co., Ltd. |
|
CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20090805 Termination date: 20160930 |
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CF01 | Termination of patent right due to non-payment of annual fee |