CN100520290C - 检查装置和检查方法 - Google Patents
检查装置和检查方法 Download PDFInfo
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- CN100520290C CN100520290C CNB2007101023123A CN200710102312A CN100520290C CN 100520290 C CN100520290 C CN 100520290C CN B2007101023123 A CNB2007101023123 A CN B2007101023123A CN 200710102312 A CN200710102312 A CN 200710102312A CN 100520290 C CN100520290 C CN 100520290C
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Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
- G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
- G01N21/3581—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light using far infrared light; using Terahertz radiation
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- Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Health & Medical Sciences (AREA)
- Analytical Chemistry (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Toxicology (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2006125670A JP4709059B2 (ja) | 2006-04-28 | 2006-04-28 | 検査装置及び検査方法 |
| JP2006125670 | 2006-04-28 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN101063609A CN101063609A (zh) | 2007-10-31 |
| CN100520290C true CN100520290C (zh) | 2009-07-29 |
Family
ID=38436785
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CNB2007101023123A Expired - Fee Related CN100520290C (zh) | 2006-04-28 | 2007-04-27 | 检查装置和检查方法 |
Country Status (6)
| Country | Link |
|---|---|
| US (2) | US7557588B2 (cg-RX-API-DMAC10.html) |
| EP (1) | EP1850115B1 (cg-RX-API-DMAC10.html) |
| JP (1) | JP4709059B2 (cg-RX-API-DMAC10.html) |
| CN (1) | CN100520290C (cg-RX-API-DMAC10.html) |
| AT (1) | ATE426798T1 (cg-RX-API-DMAC10.html) |
| DE (1) | DE602007000740D1 (cg-RX-API-DMAC10.html) |
Families Citing this family (31)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP4217646B2 (ja) * | 2004-03-26 | 2009-02-04 | キヤノン株式会社 | 認証方法及び認証装置 |
| JP4250603B2 (ja) * | 2005-03-28 | 2009-04-08 | キヤノン株式会社 | テラヘルツ波の発生素子、及びその製造方法 |
| JP4390147B2 (ja) * | 2005-03-28 | 2009-12-24 | キヤノン株式会社 | 周波数可変発振器 |
| JP2006275910A (ja) * | 2005-03-30 | 2006-10-12 | Canon Inc | 位置センシング装置及び位置センシング方法 |
| JP4402026B2 (ja) | 2005-08-30 | 2010-01-20 | キヤノン株式会社 | センシング装置 |
| JP4773839B2 (ja) * | 2006-02-15 | 2011-09-14 | キヤノン株式会社 | 対象物の情報を検出する検出装置 |
| JP4898472B2 (ja) | 2006-04-11 | 2012-03-14 | キヤノン株式会社 | 検査装置 |
| JP5006642B2 (ja) | 2006-05-31 | 2012-08-22 | キヤノン株式会社 | テラヘルツ波発振器 |
| JP5196750B2 (ja) | 2006-08-25 | 2013-05-15 | キヤノン株式会社 | 発振素子 |
| JP4873746B2 (ja) * | 2006-12-21 | 2012-02-08 | キヤノン株式会社 | 発振素子 |
| US7869036B2 (en) * | 2007-08-31 | 2011-01-11 | Canon Kabushiki Kaisha | Analysis apparatus for analyzing a specimen by obtaining electromagnetic spectrum information |
| JP5144175B2 (ja) * | 2007-08-31 | 2013-02-13 | キヤノン株式会社 | 電磁波を用いる検査装置及び検査方法 |
| JP5186176B2 (ja) * | 2007-10-19 | 2013-04-17 | 株式会社ジェーシービー | 認証システム及び認証用可搬媒体 |
| JP4807707B2 (ja) * | 2007-11-30 | 2011-11-02 | キヤノン株式会社 | 波形情報取得装置 |
| JP4975001B2 (ja) * | 2007-12-28 | 2012-07-11 | キヤノン株式会社 | 波形情報取得装置及び波形情報取得方法 |
| JP4834718B2 (ja) * | 2008-01-29 | 2011-12-14 | キヤノン株式会社 | パルスレーザ装置、テラヘルツ発生装置、テラヘルツ計測装置及びテラヘルツトモグラフィー装置 |
| JP5357531B2 (ja) * | 2008-02-05 | 2013-12-04 | キヤノン株式会社 | 情報取得装置及び情報取得方法 |
| JP5178398B2 (ja) * | 2008-08-27 | 2013-04-10 | キヤノン株式会社 | 光伝導素子 |
| JP5665305B2 (ja) * | 2008-12-25 | 2015-02-04 | キヤノン株式会社 | 分析装置 |
| JP5612842B2 (ja) | 2009-09-07 | 2014-10-22 | キヤノン株式会社 | 発振器 |
| JP5654760B2 (ja) | 2010-03-02 | 2015-01-14 | キヤノン株式会社 | 光素子 |
| JP2013167591A (ja) * | 2012-02-17 | 2013-08-29 | Murata Mfg Co Ltd | 物質センシング方法及び物質センシング装置 |
| DE202013003163U1 (de) * | 2013-04-04 | 2013-05-27 | Hübner GmbH | Vorrichtung zur Identifizierung von Stoffen in z. B. einer Postsendung |
| CN103604985B (zh) * | 2013-10-25 | 2016-04-27 | 西北核技术研究所 | 一种大功率微波脉冲圆波导探测结构及方法 |
| EP3069120B1 (en) * | 2013-11-15 | 2024-08-14 | Luna Innovations Incorporated | System for determining at least one property of a sheet dielectric sample using terahertz radiation |
| CN105057231B (zh) * | 2015-08-21 | 2017-07-28 | 爱德森(厦门)电子有限公司 | 一种在线电磁材质分选的方法 |
| CN106353634A (zh) * | 2016-10-17 | 2017-01-25 | 深圳市太赫兹科技创新研究院 | 太赫兹时域反射系统 |
| KR102285056B1 (ko) * | 2019-10-31 | 2021-08-04 | 주식회사 마인즈아이 | 테라헤르츠파 분광기술 기반 계측시스템 |
| CN115468928B (zh) * | 2021-06-10 | 2025-09-16 | 上海理工大学 | 光检测载片及所适用的检测处理方法 |
| CN115121550B (zh) * | 2022-06-27 | 2025-02-14 | 江苏大学 | 一种晶圆清洗装置及其方法 |
| CN115825582B (zh) * | 2022-11-01 | 2023-11-03 | 深圳技术大学 | 一种便携式微气象电磁参数测试装置 |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1614391A (zh) * | 2003-11-03 | 2005-05-11 | 中国科学院上海应用物理研究所 | 中草药真伪及质量鉴别的快速无损分析方法 |
Family Cites Families (28)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP3211100B2 (ja) * | 1991-11-18 | 2001-09-25 | 長野日本無線株式会社 | 分注装置 |
| US6593753B2 (en) * | 1994-07-26 | 2003-07-15 | Phase Dynamics, Inc. | System and method for monitoring substances and reactions |
| US6297489B1 (en) * | 1996-05-02 | 2001-10-02 | Hamamatsu Photonics K.K. | Electron tube having a photoelectron confining mechanism |
| US5929644A (en) * | 1997-01-30 | 1999-07-27 | Tlc Precision Wafer Technology, Inc. | Non-destructive method and apparatus for monitoring a selected semiconductor characteristic of a semiconductor sample during fabrication |
| US7152007B2 (en) * | 2000-02-28 | 2006-12-19 | Tera View Limited | Imaging apparatus and method |
| JP4425420B2 (ja) * | 2000-04-03 | 2010-03-03 | 独立行政法人理化学研究所 | マイクロアレイ作製装置 |
| DE10192655D2 (de) * | 2000-07-10 | 2003-06-12 | Haring Bolivar Peter | Verfahren zum Nachweis von Polynucleotidsequenzen |
| JP4025055B2 (ja) * | 2001-11-05 | 2007-12-19 | 独立行政法人理化学研究所 | 固定化装置 |
| US20040066207A1 (en) * | 2002-10-05 | 2004-04-08 | Bottoms Wilmer R. | Flexible DUT interface assembly |
| DE10257225B3 (de) | 2002-12-07 | 2004-04-08 | Technische Universität Braunschweig Carolo-Wilhelmina | Messeinrichtung zur Molekularanalyse chemischer oder biologischer Substanzen |
| KR100988085B1 (ko) * | 2003-06-24 | 2010-10-18 | 삼성전자주식회사 | 고밀도 플라즈마 처리 장치 |
| EP1642153B1 (en) * | 2003-06-25 | 2009-10-28 | Canon Kabushiki Kaisha | High frequency electrical signal control device and sensing system |
| JP3950820B2 (ja) * | 2003-06-25 | 2007-08-01 | キヤノン株式会社 | 高周波電気信号制御装置及びセンシングシステム |
| JP4533044B2 (ja) | 2003-08-27 | 2010-08-25 | キヤノン株式会社 | センサ |
| JP4136858B2 (ja) | 2003-09-12 | 2008-08-20 | キヤノン株式会社 | 位置検出装置、及び情報入力装置 |
| JP2005157601A (ja) | 2003-11-25 | 2005-06-16 | Canon Inc | 電磁波による積層状物体計数装置及び計数方法 |
| JP4505629B2 (ja) * | 2004-01-19 | 2010-07-21 | 国立大学法人静岡大学 | 界面検出装置及び界面検出方法 |
| JP4217646B2 (ja) | 2004-03-26 | 2009-02-04 | キヤノン株式会社 | 認証方法及び認証装置 |
| JP4546326B2 (ja) | 2004-07-30 | 2010-09-15 | キヤノン株式会社 | センシング装置 |
| JP4390147B2 (ja) | 2005-03-28 | 2009-12-24 | キヤノン株式会社 | 周波数可変発振器 |
| JP4250603B2 (ja) | 2005-03-28 | 2009-04-08 | キヤノン株式会社 | テラヘルツ波の発生素子、及びその製造方法 |
| JP2006275910A (ja) | 2005-03-30 | 2006-10-12 | Canon Inc | 位置センシング装置及び位置センシング方法 |
| JP4402026B2 (ja) | 2005-08-30 | 2010-01-20 | キヤノン株式会社 | センシング装置 |
| JP4773839B2 (ja) | 2006-02-15 | 2011-09-14 | キヤノン株式会社 | 対象物の情報を検出する検出装置 |
| JP4481946B2 (ja) | 2006-03-17 | 2010-06-16 | キヤノン株式会社 | 検出素子及び画像形成装置 |
| JP5132146B2 (ja) | 2006-03-17 | 2013-01-30 | キヤノン株式会社 | 分析方法、分析装置、及び検体保持部材 |
| JP4898472B2 (ja) | 2006-04-11 | 2012-03-14 | キヤノン株式会社 | 検査装置 |
| JP5196750B2 (ja) | 2006-08-25 | 2013-05-15 | キヤノン株式会社 | 発振素子 |
-
2006
- 2006-04-28 JP JP2006125670A patent/JP4709059B2/ja not_active Expired - Fee Related
-
2007
- 2007-03-27 US US11/727,588 patent/US7557588B2/en not_active Expired - Fee Related
- 2007-04-05 EP EP20070105745 patent/EP1850115B1/en not_active Not-in-force
- 2007-04-05 AT AT07105745T patent/ATE426798T1/de not_active IP Right Cessation
- 2007-04-05 DE DE200760000740 patent/DE602007000740D1/de active Active
- 2007-04-27 CN CNB2007101023123A patent/CN100520290C/zh not_active Expired - Fee Related
-
2009
- 2009-04-13 US US12/385,557 patent/US7782067B2/en not_active Expired - Fee Related
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1614391A (zh) * | 2003-11-03 | 2005-05-11 | 中国科学院上海应用物理研究所 | 中草药真伪及质量鉴别的快速无损分析方法 |
Also Published As
| Publication number | Publication date |
|---|---|
| JP4709059B2 (ja) | 2011-06-22 |
| US7557588B2 (en) | 2009-07-07 |
| EP1850115A1 (en) | 2007-10-31 |
| JP2007298358A (ja) | 2007-11-15 |
| ATE426798T1 (de) | 2009-04-15 |
| EP1850115B1 (en) | 2009-03-25 |
| US7782067B2 (en) | 2010-08-24 |
| DE602007000740D1 (de) | 2009-05-07 |
| US20070252604A1 (en) | 2007-11-01 |
| CN101063609A (zh) | 2007-10-31 |
| US20090201030A1 (en) | 2009-08-13 |
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Granted publication date: 20090729 Termination date: 20170427 |