CN100439922C - 显示用面板的检查装置 - Google Patents

显示用面板的检查装置 Download PDF

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Publication number
CN100439922C
CN100439922C CNB200510130433XA CN200510130433A CN100439922C CN 100439922 C CN100439922 C CN 100439922C CN B200510130433X A CNB200510130433X A CN B200510130433XA CN 200510130433 A CN200510130433 A CN 200510130433A CN 100439922 C CN100439922 C CN 100439922C
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China
Prior art keywords
foreign matter
panel
display panel
testing fixture
electrode
Prior art date
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CNB200510130433XA
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English (en)
Chinese (zh)
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CN1790032A (zh
Inventor
安斋正行
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Micronics Japan Co Ltd
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Micronics Japan Co Ltd
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Publication of CN1790032A publication Critical patent/CN1790032A/zh
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Publication of CN100439922C publication Critical patent/CN100439922C/zh
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/94—Investigating contamination, e.g. dust
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/1306—Details
    • G02F1/1309—Repairing; Testing
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70—SSIS architectures; Circuits associated therewith
    • H04N25/701—Line sensors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N2021/9513—Liquid crystal panels

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Pathology (AREA)
  • Nonlinear Science (AREA)
  • Health & Medical Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Engineering & Computer Science (AREA)
  • Optics & Photonics (AREA)
  • Devices For Indicating Variable Information By Combining Individual Elements (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Liquid Crystal (AREA)
  • Cleaning In General (AREA)
CNB200510130433XA 2004-12-17 2005-12-09 显示用面板的检查装置 Active CN100439922C (zh)

Applications Claiming Priority (6)

Application Number Priority Date Filing Date Title
JPJP2004365547 2004-12-17
JP2004365547 2004-12-17
JP2004365547 2004-12-17
JPJP2005293430 2005-10-06
JP2005293430 2005-10-06
JP2005293430A JP2006194858A (ja) 2004-12-17 2005-10-06 表示用パネルの検査装置

Publications (2)

Publication Number Publication Date
CN1790032A CN1790032A (zh) 2006-06-21
CN100439922C true CN100439922C (zh) 2008-12-03

Family

ID=36801038

Family Applications (1)

Application Number Title Priority Date Filing Date
CNB200510130433XA Active CN100439922C (zh) 2004-12-17 2005-12-09 显示用面板的检查装置

Country Status (4)

Country Link
JP (1) JP2006194858A (ko)
KR (1) KR100829892B1 (ko)
CN (1) CN100439922C (ko)
TW (1) TW200622386A (ko)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4800874B2 (ja) * 2006-08-11 2011-10-26 株式会社日本マイクロニクス 表示パネルのための検査装置、プローブユニットおよびプローブ組立体
JP2008134439A (ja) * 2006-11-28 2008-06-12 Matsushita Electric Ind Co Ltd フラットパネル供給方法及びフラットパネル組立装置
CN101211021B (zh) * 2006-12-27 2010-08-25 富士迈半导体精密工业（上海）有限公司 面板检测装置
KR100870152B1 (ko) * 2008-04-07 2008-11-24 (주)유비프리시젼 Ｌｃｄ 검사 장비용 프로브 유니트의 자동 변경 장치
KR101033776B1 (ko) * 2009-08-03 2011-05-13 주식회사 탑 엔지니어링 클리너를 구비한 어레이 테스트 장치
TWI417599B (zh) * 2009-09-28 2013-12-01 Au Optronics Xiamen Corp 異方性導電膜之貼附設備及貼附方法
KR20120077291A (ko) * 2010-12-30 2012-07-10 주식회사 탑 엔지니어링 어레이 테스트 장치
KR20150066018A (ko) * 2013-12-05 2015-06-16 주식회사 이엘피 Ａｍｏｌｅｄ 패널 검사를 위한 표시 패널 검사 장치 및 그 방법
KR101682378B1 (ko) * 2014-09-24 2016-12-07 주식회사 디이엔티 액정표시패널의 검사장치
CN105785260A (zh) * 2016-05-25 2016-07-20 上海华岭集成电路技术股份有限公司 防止晶圆测试探针台撞针的装置及方法
KR102112555B1 (ko) * 2019-11-21 2020-05-19 케이맥(주) 이종 사이즈 디스플레이 패널 검사 장치
JP2022061531A (ja) * 2020-10-07 2022-04-19 日本電気硝子株式会社 ガラス板の製造方法

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN2153632Y (zh) * 1993-03-19 1994-01-19 四川石油管理局测井公司 双侧向主电极检测器
JPH11237847A (ja) * 1998-02-24 1999-08-31 Sharp Corp 液晶パネルの自動検査装置
JP2003295281A (ja) * 2002-04-03 2003-10-15 Canon Inc 撮像装置及び動作処理方法及びプログラム及び記憶媒体
JP2004302836A (ja) * 2003-03-31 2004-10-28 Nippon Conlux Co Ltd 紙葉類識別装置および方法

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02116703A (ja) * 1988-10-27 1990-05-01 Matsushita Electric Ind Co Ltd ガラス基板上の回路パターンの検査装置
JP2808123B2 (ja) * 1988-11-16 1998-10-08 キヤノン株式会社 異物検出装置
KR0147600B1 (ko) * 1994-09-13 1998-08-01 김광호 음극선관 패널의 결함 검사장치
JP2000019063A (ja) * 1998-07-06 2000-01-21 Sokkia Co Ltd プラズマディスプレイパネルの電極パターン検査装置
KR20030060243A (ko) * 2002-01-07 2003-07-16 엘지전자 주식회사 평판 디스플레이 자동 검사장치

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN2153632Y (zh) * 1993-03-19 1994-01-19 四川石油管理局测井公司 双侧向主电极检测器
JPH11237847A (ja) * 1998-02-24 1999-08-31 Sharp Corp 液晶パネルの自動検査装置
JP2003295281A (ja) * 2002-04-03 2003-10-15 Canon Inc 撮像装置及び動作処理方法及びプログラム及び記憶媒体
JP2004302836A (ja) * 2003-03-31 2004-10-28 Nippon Conlux Co Ltd 紙葉類識別装置および方法

Non-Patent Citations (2)

* Cited by examiner, † Cited by third party
Title
双轴压力下岩样自电位变化实验的新结果. 郝锦琦，刘力强，龙海丽，马胜利，郭子祺，钱书清，周建国.地球物理学报，第47卷第3期. 2004
双轴压力下岩样自电位变化实验的新结果. 郝锦琦，刘力强，龙海丽，马胜利，郭子祺，钱书清，周建国.地球物理学报，第47卷第3期. 2004 *

Also Published As

Publication number Publication date
TW200622386A (en) 2006-07-01
CN1790032A (zh) 2006-06-21
KR20060069260A (ko) 2006-06-21
KR100829892B1 (ko) 2008-05-16
JP2006194858A (ja) 2006-07-27

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