CA2256763A1 - Conductors for integrated circuits - Google Patents

Conductors for integrated circuits Download PDF

Info

Publication number
CA2256763A1
CA2256763A1 CA002256763A CA2256763A CA2256763A1 CA 2256763 A1 CA2256763 A1 CA 2256763A1 CA 002256763 A CA002256763 A CA 002256763A CA 2256763 A CA2256763 A CA 2256763A CA 2256763 A1 CA2256763 A1 CA 2256763A1
Authority
CA
Canada
Prior art keywords
substrate
conductor
inductor
trenches
plates
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
CA002256763A
Other languages
English (en)
French (fr)
Inventor
Ted Johansson
Hans Erik Norstrom
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Telefonaktiebolaget LM Ericsson AB
Original Assignee
Individual
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Individual filed Critical Individual
Publication of CA2256763A1 publication Critical patent/CA2256763A1/en
Abandoned legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L28/00Passive two-terminal components without a potential-jump or surface barrier for integrated circuits; Details thereof; Multistep manufacturing processes therefor
    • H01L28/10Inductors
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/40Electrodes ; Multistep manufacturing processes therefor
    • H01L29/43Electrodes ; Multistep manufacturing processes therefor characterised by the materials of which they are formed
    • H01L29/49Metal-insulator-semiconductor electrodes, e.g. gates of MOSFET
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/52Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames
    • H01L23/522Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames including external interconnections consisting of a multilayer structure of conductive and insulating layers inseparably formed on the semiconductor body
    • H01L23/5227Inductive arrangements or effects of, or between, wiring layers
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/58Structural electrical arrangements for semiconductor devices not otherwise provided for, e.g. in combination with batteries
    • H01L23/64Impedance arrangements
    • H01L23/645Inductive arrangements
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/0001Technical content checked by a classifier
    • H01L2924/0002Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00

Landscapes

  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Computer Hardware Design (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Ceramic Engineering (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Coils Or Transformers For Communication (AREA)
CA002256763A 1996-05-31 1997-05-30 Conductors for integrated circuits Abandoned CA2256763A1 (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
SE9602191-0 1996-05-31
SE9602191A SE510443C2 (sv) 1996-05-31 1996-05-31 Induktorer för integrerade kretsar
PCT/SE1997/000954 WO1997045873A1 (en) 1996-05-31 1997-05-30 Conductors for integrated circuits

Publications (1)

Publication Number Publication Date
CA2256763A1 true CA2256763A1 (en) 1997-12-04

Family

ID=20402861

Family Applications (1)

Application Number Title Priority Date Filing Date
CA002256763A Abandoned CA2256763A1 (en) 1996-05-31 1997-05-30 Conductors for integrated circuits

Country Status (8)

Country Link
EP (1) EP0902974A1 (zh)
JP (1) JP2000511350A (zh)
KR (1) KR100298480B1 (zh)
CN (1) CN1220778A (zh)
AU (1) AU3113097A (zh)
CA (1) CA2256763A1 (zh)
SE (1) SE510443C2 (zh)
WO (1) WO1997045873A1 (zh)

Families Citing this family (25)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1021828B1 (en) 1997-07-11 2010-01-06 Infineon Technologies AG A process for manufacturing ic-components to be used at radio frequencies
KR19990055422A (ko) * 1997-12-27 1999-07-15 정선종 실리콘 기판에서의 인덕터 장치 및 그 제조 방법
JP3942264B2 (ja) * 1998-03-11 2007-07-11 富士通株式会社 半導体基板上に形成されるインダクタンス素子
DE19810825A1 (de) * 1998-03-12 1999-09-16 Siemens Ag Integrierte elektronische Schaltungsanordnung und Verfahren zu ihrer Herstellung
EP0966040A1 (en) * 1998-06-19 1999-12-22 International Business Machines Corporation Passive component above isolation trenches
KR20000011585A (ko) * 1998-07-28 2000-02-25 윤덕용 반도체소자및그제조방법
US6278186B1 (en) * 1998-08-26 2001-08-21 Intersil Corporation Parasitic current barriers
DE19910983A1 (de) * 1999-03-12 2000-09-21 Bosch Gmbh Robert Vorrichtung und Verfahren zur Bestimmung der lateralen Unterätzung einer strukturierten Oberflächenschicht
WO2001004953A1 (en) * 1999-07-08 2001-01-18 Korea Advanced Institute Of Science And Technology Method for manufacturing a semiconductor device having a metal layer floating over a substrate
DE19944306B4 (de) * 1999-09-15 2005-05-19 Infineon Technologies Ag Integrierte Halbleiterschaltung mit integrierter Spule und Verfahren zu deren Herstellung
SG98398A1 (en) * 2000-05-25 2003-09-19 Inst Of Microelectronics Integrated circuit inductor
FR2810451A1 (fr) * 2000-06-20 2001-12-21 Koninkl Philips Electronics Nv Circuit integre incluant un element inductif de facteur de qualite eleve et presentant une grande compacite
KR20020014225A (ko) * 2000-08-17 2002-02-25 박종섭 미세 인덕터와 중첩되는 트렌치 내에 절연막을 구비하는집적 소자 및 그 제조 방법
DE10041084A1 (de) * 2000-08-22 2002-03-14 Infineon Technologies Ag Verfahren zur Bildung eines dielektrischen Gebiets in einem Halbleitersubstrat
DE10041691A1 (de) * 2000-08-24 2002-03-14 Infineon Technologies Ag Halbleiteranordnung
EP1213762A1 (fr) * 2000-12-05 2002-06-12 Koninklijke Philips Electronics N.V. Dispositif d'isolation d'un élement électrique
WO2003054955A2 (de) 2001-12-13 2003-07-03 Austriamicrosystems Ag Siliziumsubstrat mit einer isolierschicht mit teilgebieten und entsprechende anordnung
DE10163460B4 (de) * 2001-12-21 2010-05-27 Austriamicrosystems Ag Siliziumsubstrat mit einer Isolierschicht und Anordnung mit einem Siliziumsubstrat mit einer Isolierschicht
DE102004022139B4 (de) * 2004-05-05 2007-10-18 Atmel Germany Gmbh Verfahren zur Herstellung einer Spiralinduktivität auf einem Substrat und nach einem derartigen Verfahren hergestelltes Bauelement
JP3927565B2 (ja) * 2004-06-25 2007-06-13 インターナショナル・ビジネス・マシーンズ・コーポレーション 磁気コアを有するオンチップ・インダクタ
CN101149761B (zh) * 2006-09-20 2012-02-08 爱斯泰克(上海)高频通讯技术有限公司 硅基螺旋电感器件等效电路双π非对称模型参数的提取方法
CN102208405B (zh) * 2010-08-24 2015-11-25 华东师范大学 平面螺旋电感
CN102456612A (zh) * 2010-10-27 2012-05-16 上海华虹Nec电子有限公司 半导体集成电感的制作方法及结构
JP5699905B2 (ja) * 2011-10-28 2015-04-15 株式会社デンソー 半導体装置
CN114823638A (zh) * 2022-04-27 2022-07-29 电子科技大学 一种低寄生电容集成电感结构

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0377360A (ja) * 1989-08-18 1991-04-02 Mitsubishi Electric Corp 半導体装置
US5336921A (en) * 1992-01-27 1994-08-09 Motorola, Inc. Vertical trench inductor
WO1994017558A1 (en) * 1993-01-29 1994-08-04 The Regents Of The University Of California Monolithic passive component
WO1996002070A2 (en) * 1994-07-12 1996-01-25 National Semiconductor Corporation Integrated circuit comprising a trench isolation structure and an oxygen barrier layer and method for forming the integrated circuit
US5446311A (en) * 1994-09-16 1995-08-29 International Business Machines Corporation High-Q inductors in silicon technology without expensive metalization

Also Published As

Publication number Publication date
KR20000010660A (ko) 2000-02-25
KR100298480B1 (ko) 2001-08-07
JP2000511350A (ja) 2000-08-29
AU3113097A (en) 1998-01-05
SE9602191D0 (sv) 1996-05-31
SE9602191L (sv) 1997-12-01
WO1997045873A1 (en) 1997-12-04
SE510443C2 (sv) 1999-05-25
EP0902974A1 (en) 1999-03-24
CN1220778A (zh) 1999-06-23

Similar Documents

Publication Publication Date Title
CA2256763A1 (en) Conductors for integrated circuits
US7436281B2 (en) Method to improve inductance with a high-permeability slotted plate core in an integrated circuit
KR100939648B1 (ko) 반도체 기판에 형성되는 다층 인덕터
KR100308437B1 (ko) 금속충전비아플러그를사용한vlsi커패시터와하이qvlsi인덕터및그제조방법
US6903918B1 (en) Shielded planar capacitor
US8653926B2 (en) Inductive and capacitive elements for semiconductor technologies with minimum pattern density requirements
US6031445A (en) Transformer for integrated circuits
US8362589B2 (en) Integrated capacitor with cabled plates
KR101084959B1 (ko) 반도체 기판에 형성된 스파이럴 인덕터 및 인덕터 형성 방법
JP2004521536A (ja) 高周波プリント回路基板ビア
US11393787B2 (en) Conductor design for integrated magnetic devices
JP4584533B2 (ja) 半導体基板中に形成された薄膜多層高qトランスフォーマ
US20070045816A1 (en) Electronic package with improved current carrying capability and method of forming the same
US20070217122A1 (en) Capacitor
US8327523B2 (en) High density planarized inductor and method of making the same
US6924725B2 (en) Coil on a semiconductor substrate and method for its production
KR100938501B1 (ko) 인덕터 및 그 제조 방법
US8004061B1 (en) Conductive trace with reduced RF impedance resulting from the skin effect
US7223680B1 (en) Method of forming a dual damascene metal trace with reduced RF impedance resulting from the skin effect
US6504109B1 (en) Micro-strip circuit for loss reduction
KR100709782B1 (ko) 고주파 반도체 수동 소자 및 그 제조 방법
Chong et al. Three-dimensional impedance engineering for mixed-signal system-on-chip applications

Legal Events

Date Code Title Description
EEER Examination request
FZDE Dead