BRPI0815032A2 - Dispositivo de circuito e método de medição de flutuação de fase de relógio - Google Patents

Dispositivo de circuito e método de medição de flutuação de fase de relógio

Info

Publication number
BRPI0815032A2
BRPI0815032A2 BRPI0815032-0A2A BRPI0815032A BRPI0815032A2 BR PI0815032 A2 BRPI0815032 A2 BR PI0815032A2 BR PI0815032 A BRPI0815032 A BR PI0815032A BR PI0815032 A2 BRPI0815032 A2 BR PI0815032A2
Authority
BR
Brazil
Prior art keywords
circuit device
measurement method
clock phase
float measurement
phase float
Prior art date
Application number
BRPI0815032-0A2A
Other languages
English (en)
Inventor
Martin Saint-Laurent
Boris Andreev
Paul Bassett
Original Assignee
Qualcomm Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Qualcomm Inc filed Critical Qualcomm Inc
Publication of BRPI0815032A2 publication Critical patent/BRPI0815032A2/pt

Links

Classifications

    • G—PHYSICS
    • G04—HOROLOGY
    • G04F—TIME-INTERVAL MEASURING
    • G04F10/00—Apparatus for measuring unknown time intervals by electric means
    • G04F10/005—Time-to-digital converters [TDC]
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03L—AUTOMATIC CONTROL, STARTING, SYNCHRONISATION, OR STABILISATION OF GENERATORS OF ELECTRONIC OSCILLATIONS OR PULSES
    • H03L7/00—Automatic control of frequency or phase; Synchronisation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/26—Measuring noise figure; Measuring signal-to-noise ratio
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31708—Analysis of signal quality
    • G01R31/31709—Jitter measurements; Jitter generators
BRPI0815032-0A2A 2007-08-09 2008-08-08 Dispositivo de circuito e método de medição de flutuação de fase de relógio BRPI0815032A2 (pt)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US11/836,220 US7816960B2 (en) 2007-08-09 2007-08-09 Circuit device and method of measuring clock jitter
PCT/US2008/072629 WO2009021186A1 (en) 2007-08-09 2008-08-08 Circuit device and method of measuring clock jitter

Publications (1)

Publication Number Publication Date
BRPI0815032A2 true BRPI0815032A2 (pt) 2015-03-10

Family

ID=39590275

Family Applications (1)

Application Number Title Priority Date Filing Date
BRPI0815032-0A2A BRPI0815032A2 (pt) 2007-08-09 2008-08-08 Dispositivo de circuito e método de medição de flutuação de fase de relógio

Country Status (14)

Country Link
US (1) US7816960B2 (pt)
EP (1) EP2026469B1 (pt)
JP (1) JP5318870B2 (pt)
KR (1) KR101200233B1 (pt)
CN (1) CN101779376B (pt)
AT (1) ATE506754T1 (pt)
BR (1) BRPI0815032A2 (pt)
CA (1) CA2695373C (pt)
DE (1) DE602008006312D1 (pt)
ES (1) ES2365438T3 (pt)
MX (1) MX2010001526A (pt)
RU (1) RU2451391C2 (pt)
TW (1) TWI366343B (pt)
WO (1) WO2009021186A1 (pt)

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TWI637185B (zh) * 2017-01-03 2018-10-01 奇景光電股份有限公司 時脈抖動的內建自我測試電路
US20180205383A1 (en) * 2017-01-19 2018-07-19 Qualcomm Incorporated Digital Clock Generation and Variation Control Circuitry
US9893878B1 (en) * 2017-03-15 2018-02-13 Oracle International Corporation On-chip jitter measurement for clock circuits
CN108401445B (zh) * 2017-06-30 2021-11-19 深圳市大疆创新科技有限公司 用于测量时间的电路、方法及相关芯片、系统和设备
KR102410014B1 (ko) * 2017-08-03 2022-06-21 삼성전자주식회사 클락 지터 측정 회로 및 이를 포함하는 반도체 장치
CN108023576B (zh) * 2017-12-25 2021-02-02 北京无线电计量测试研究所 一种用于快沿脉冲发生器上升时间校准的方法
CN109062538B (zh) * 2018-07-10 2020-11-20 豪威科技(上海)有限公司 环形先进先出缓冲器及数据传输接口、系统、方法
WO2020061080A1 (en) * 2018-09-18 2020-03-26 Texas Instruments Incorporated Methods and apparatus to improve power converter on-time generation
US11879936B1 (en) * 2022-07-01 2024-01-23 Ampere Computing Llc On-die clock period jitter and duty cycle analyzer
CN115204083B (zh) * 2022-09-13 2023-02-28 摩尔线程智能科技(北京)有限责任公司 芯片静态时序分析方法、装置、电子设备及存储介质

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Also Published As

Publication number Publication date
JP5318870B2 (ja) 2013-10-16
RU2010108218A (ru) 2011-10-27
WO2009021186A1 (en) 2009-02-12
ES2365438T3 (es) 2011-10-05
CN101779376A (zh) 2010-07-14
ATE506754T1 (de) 2011-05-15
KR101200233B1 (ko) 2012-11-09
DE602008006312D1 (de) 2011-06-01
RU2451391C2 (ru) 2012-05-20
KR20100053632A (ko) 2010-05-20
TWI366343B (en) 2012-06-11
CA2695373A1 (en) 2009-02-12
US7816960B2 (en) 2010-10-19
US20090039867A1 (en) 2009-02-12
MX2010001526A (es) 2010-03-15
CA2695373C (en) 2013-07-23
TW200919968A (en) 2009-05-01
JP2010536267A (ja) 2010-11-25
EP2026469A1 (en) 2009-02-18
CN101779376B (zh) 2013-11-06
EP2026469B1 (en) 2011-04-20

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Legal Events

Date Code Title Description
B08F Application dismissed because of non-payment of annual fees [chapter 8.6 patent gazette]

Free format text: REFERENTE A 7A ANUIDADE.

B08K Patent lapsed as no evidence of payment of the annual fee has been furnished to inpi [chapter 8.11 patent gazette]

Free format text: EM VIRTUDE DO ARQUIVAMENTO PUBLICADO NA RPI 2343 DE 01-12-2015 E CONSIDERANDO AUSENCIA DE MANIFESTACAO DENTRO DOS PRAZOS LEGAIS, INFORMO QUE CABE SER MANTIDO O ARQUIVAMENTO DO PEDIDO DE PATENTE, CONFORME O DISPOSTO NO ARTIGO 12, DA RESOLUCAO 113/2013.