DE602008006312D1 - Schaltungsvorrichtung und Verfahren zur Messung von Taktschwankungen - Google Patents

Schaltungsvorrichtung und Verfahren zur Messung von Taktschwankungen

Info

Publication number
DE602008006312D1
DE602008006312D1 DE602008006312T DE602008006312T DE602008006312D1 DE 602008006312 D1 DE602008006312 D1 DE 602008006312D1 DE 602008006312 T DE602008006312 T DE 602008006312T DE 602008006312 T DE602008006312 T DE 602008006312T DE 602008006312 D1 DE602008006312 D1 DE 602008006312D1
Authority
DE
Germany
Prior art keywords
circuit device
measuring clock
clock fluctuations
clock signal
fluctuations
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
DE602008006312T
Other languages
English (en)
Inventor
Martin Saint-Laurent
Boris Andreev
Paul Bassett
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Qualcomm Inc
Original Assignee
Qualcomm Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Qualcomm Inc filed Critical Qualcomm Inc
Publication of DE602008006312D1 publication Critical patent/DE602008006312D1/de
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G04—HOROLOGY
    • G04F—TIME-INTERVAL MEASURING
    • G04F10/00—Apparatus for measuring unknown time intervals by electric means
    • G04F10/005—Time-to-digital converters [TDC]
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03L—AUTOMATIC CONTROL, STARTING, SYNCHRONISATION OR STABILISATION OF GENERATORS OF ELECTRONIC OSCILLATIONS OR PULSES
    • H03L7/00—Automatic control of frequency or phase; Synchronisation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/26—Measuring noise figure; Measuring signal-to-noise ratio
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31708—Analysis of signal quality
    • G01R31/31709—Jitter measurements; Jitter generators

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Pulse Circuits (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Manipulation Of Pulses (AREA)
  • Testing, Inspecting, Measuring Of Stereoscopic Televisions And Televisions (AREA)
  • Dc Digital Transmission (AREA)
  • Stabilization Of Oscillater, Synchronisation, Frequency Synthesizers (AREA)
  • Measuring Phase Differences (AREA)
DE602008006312T 2007-08-09 2008-03-19 Schaltungsvorrichtung und Verfahren zur Messung von Taktschwankungen Active DE602008006312D1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US11/836,220 US7816960B2 (en) 2007-08-09 2007-08-09 Circuit device and method of measuring clock jitter

Publications (1)

Publication Number Publication Date
DE602008006312D1 true DE602008006312D1 (de) 2011-06-01

Family

ID=39590275

Family Applications (1)

Application Number Title Priority Date Filing Date
DE602008006312T Active DE602008006312D1 (de) 2007-08-09 2008-03-19 Schaltungsvorrichtung und Verfahren zur Messung von Taktschwankungen

Country Status (14)

Country Link
US (1) US7816960B2 (de)
EP (1) EP2026469B1 (de)
JP (1) JP5318870B2 (de)
KR (1) KR101200233B1 (de)
CN (1) CN101779376B (de)
AT (1) ATE506754T1 (de)
BR (1) BRPI0815032A2 (de)
CA (1) CA2695373C (de)
DE (1) DE602008006312D1 (de)
ES (1) ES2365438T3 (de)
MX (1) MX2010001526A (de)
RU (1) RU2451391C2 (de)
TW (1) TWI366343B (de)
WO (1) WO2009021186A1 (de)

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US20130099835A1 (en) * 2011-10-25 2013-04-25 You-Wen Chang Calibration apparatus for performing phase detection/edge distance detection upon signals and related calibration method thereof
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US8866511B2 (en) * 2012-11-20 2014-10-21 Nvidia Corporation Matrix phase detector
US9110134B2 (en) * 2012-12-27 2015-08-18 Intel Corporation Input/output delay testing for devices utilizing on-chip delay generation
US8887120B1 (en) * 2013-12-27 2014-11-11 Freescale Semiconductor, Inc. Timing path slack monitoring system
CN103902484B (zh) * 2014-03-04 2017-11-21 深圳博用科技有限公司 一种芯片升级的自适应方法
US9606182B2 (en) 2014-06-16 2017-03-28 Samsung Electronics Co., Ltd. System on chip
US9490808B2 (en) * 2014-12-01 2016-11-08 Mediatek Inc. Sensing circuit
US10303204B2 (en) * 2015-05-27 2019-05-28 Mitsubishi Electric Corporation Clock diagnostic apparatus, clock diagnostic method, and computer readable medium
US9645602B2 (en) * 2015-09-23 2017-05-09 Qualcomm Incorporated Frequency sensor for side-channel attack
TWI585427B (zh) * 2016-05-24 2017-06-01 國立中央大學 延遲量測電路及其量測方法
KR102546302B1 (ko) * 2016-07-08 2023-06-21 삼성전자주식회사 클락 지터 측정 회로 및 이를 포함하는 반도체 장치
US10145892B2 (en) 2016-08-22 2018-12-04 International Business Machines Corporation Increasing the resolution of on-chip measurement circuits
CN106452693B (zh) * 2016-08-26 2019-04-30 西安空间无线电技术研究所 一种基于双频点噪底能量分析的时钟相位抖动测量方法
TWI637185B (zh) * 2017-01-03 2018-10-01 奇景光電股份有限公司 時脈抖動的內建自我測試電路
US20180205383A1 (en) * 2017-01-19 2018-07-19 Qualcomm Incorporated Digital Clock Generation and Variation Control Circuitry
US9893878B1 (en) * 2017-03-15 2018-02-13 Oracle International Corporation On-chip jitter measurement for clock circuits
CN108401445B (zh) * 2017-06-30 2021-11-19 深圳市大疆创新科技有限公司 用于测量时间的电路、方法及相关芯片、系统和设备
KR102410014B1 (ko) * 2017-08-03 2022-06-21 삼성전자주식회사 클락 지터 측정 회로 및 이를 포함하는 반도체 장치
CN108023576B (zh) * 2017-12-25 2021-02-02 北京无线电计量测试研究所 一种用于快沿脉冲发生器上升时间校准的方法
CN109062538B (zh) * 2018-07-10 2020-11-20 豪威科技(上海)有限公司 环形先进先出缓冲器及数据传输接口、系统、方法
WO2020061080A1 (en) * 2018-09-18 2020-03-26 Texas Instruments Incorporated Methods and apparatus to improve power converter on-time generation
US11879936B1 (en) * 2022-07-01 2024-01-23 Ampere Computing Llc On-die clock period jitter and duty cycle analyzer
CN115204083B (zh) * 2022-09-13 2023-02-28 摩尔线程智能科技(北京)有限责任公司 芯片静态时序分析方法、装置、电子设备及存储介质
US20240112720A1 (en) * 2022-09-30 2024-04-04 Advanced Micro Devices, Inc. Unmatched clock for command-address and data

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Also Published As

Publication number Publication date
CA2695373A1 (en) 2009-02-12
CA2695373C (en) 2013-07-23
EP2026469A1 (de) 2009-02-18
CN101779376B (zh) 2013-11-06
BRPI0815032A2 (pt) 2015-03-10
US20090039867A1 (en) 2009-02-12
WO2009021186A1 (en) 2009-02-12
ATE506754T1 (de) 2011-05-15
KR101200233B1 (ko) 2012-11-09
MX2010001526A (es) 2010-03-15
CN101779376A (zh) 2010-07-14
TWI366343B (en) 2012-06-11
US7816960B2 (en) 2010-10-19
RU2451391C2 (ru) 2012-05-20
EP2026469B1 (de) 2011-04-20
KR20100053632A (ko) 2010-05-20
TW200919968A (en) 2009-05-01
ES2365438T3 (es) 2011-10-05
JP2010536267A (ja) 2010-11-25
JP5318870B2 (ja) 2013-10-16
RU2010108218A (ru) 2011-10-27

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