AU2003241973A1 - Electronic component test instrument - Google Patents

Electronic component test instrument

Info

Publication number
AU2003241973A1
AU2003241973A1 AU2003241973A AU2003241973A AU2003241973A1 AU 2003241973 A1 AU2003241973 A1 AU 2003241973A1 AU 2003241973 A AU2003241973 A AU 2003241973A AU 2003241973 A AU2003241973 A AU 2003241973A AU 2003241973 A1 AU2003241973 A1 AU 2003241973A1
Authority
AU
Australia
Prior art keywords
electronic component
test instrument
component test
instrument
electronic
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
AU2003241973A
Other languages
English (en)
Inventor
Akihiko Ito
Kazuyuki Yamashita
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Advantest Corp
Original Assignee
Advantest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corp filed Critical Advantest Corp
Publication of AU2003241973A1 publication Critical patent/AU2003241973A1/en
Abandoned legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2893—Handling, conveying or loading, e.g. belts, boats, vacuum fingers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
    • G01R31/2887—Features relating to contacting the IC under test, e.g. probe heads; chucks involving moving the probe head or the IC under test; docking stations
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
AU2003241973A 2003-05-30 2003-05-30 Electronic component test instrument Abandoned AU2003241973A1 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2003/006834 WO2004106953A1 (ja) 2003-05-30 2003-05-30 電子部品試験装置

Publications (1)

Publication Number Publication Date
AU2003241973A1 true AU2003241973A1 (en) 2005-01-21

Family

ID=33485799

Family Applications (1)

Application Number Title Priority Date Filing Date
AU2003241973A Abandoned AU2003241973A1 (en) 2003-05-30 2003-05-30 Electronic component test instrument

Country Status (7)

Country Link
US (1) US20060290369A1 (ja)
JP (1) JP4331165B2 (ja)
KR (1) KR100751842B1 (ja)
CN (1) CN100498361C (ja)
AU (1) AU2003241973A1 (ja)
TW (1) TW200506394A (ja)
WO (1) WO2004106953A1 (ja)

Families Citing this family (27)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
AU2003241977A1 (en) * 2003-05-30 2005-01-21 Advantest Corporation Electronic component test instrument
KR101106972B1 (ko) * 2006-10-27 2012-01-20 가부시키가이샤 아드반테스트 전자부품 시험장치
CN101342532B (zh) * 2007-07-13 2013-05-01 鸿劲科技股份有限公司 记忆体ic检测分类机
MY160276A (en) 2009-08-18 2017-02-28 Multitest Elektronische Systeme Gmbh An elastic unit as a separate elastic member to be mounted at an elastic unit receiving section of an align fixture
MY152434A (en) * 2009-08-18 2014-09-30 Multitest Elektronische Syst System for post-processing of electronic components
MY151553A (en) * 2009-08-18 2014-06-13 Multitest Elektronische Syst Two abutting sections of an align fixture together floatingly engaging an electronic component
MY152834A (en) * 2009-08-18 2014-11-28 Multitest Elektronische Syst An elastic unit for clamping an electronic component and extending below an electronic component receiving volume of an align fixture
US20110046228A1 (en) * 2009-08-20 2011-02-24 Mutual Pharmaceutical Company, Inc. Methods for administration of colchicine with grapefruit juice
JP2011086880A (ja) * 2009-10-19 2011-04-28 Advantest Corp 電子部品実装装置および電子部品の実装方法
KR20110093456A (ko) * 2010-02-12 2011-08-18 삼성전자주식회사 반도체 패키지의 인서트 수납장치
KR20110099556A (ko) * 2010-03-02 2011-09-08 삼성전자주식회사 반도체 패키지 테스트장치
JP2013053991A (ja) * 2011-09-06 2013-03-21 Seiko Epson Corp ハンドラー及び部品検査装置
KR101183690B1 (ko) * 2011-11-28 2012-09-17 (주)이엔씨테크 제습기능을 갖춘 낸드 플래시 메모리용 핫/콜드 테스트 장비
US20130335110A1 (en) * 2012-06-15 2013-12-19 Polyvalor, Limited Partnership Planar circuit test fixture
DE102013113580B4 (de) 2013-12-05 2018-03-08 Multitest Elektronische Systeme Gmbh Verfahren zum Positionieren eines Trägers mit einer Vielzahl elektronischer Bauteile in einer Einrichtung zum Prüfen der elektronischen Bauteile
US9588142B2 (en) * 2014-10-24 2017-03-07 Advantest Corporation Electronic device handling apparatus and electronic device testing apparatus
CN105005160B (zh) * 2015-07-29 2018-03-06 句容骏成电子有限公司 一种lcd管脚检测装置
KR102391516B1 (ko) * 2015-10-08 2022-04-27 삼성전자주식회사 반도체 테스트 장치
CN106180004B (zh) * 2016-08-08 2022-10-28 深圳市华力宇电子科技有限公司 指纹分选机的控制系统及控制方法
WO2018146374A1 (en) * 2017-02-10 2018-08-16 Optofidelity Oy Method, an all-in-one tester and computer program product
EP3729115A4 (en) * 2017-12-19 2021-12-22 Boston Semi Equipment, LLC ENTRY AND PLACEMENT MANIPULATOR WITHOUT KIT
WO2020124979A1 (en) * 2018-12-21 2020-06-25 Huawei Technologies Co., Ltd. A portable, integrated antenna test bed with built-in turntable
EP3916341A4 (en) 2019-01-24 2022-03-23 Koh Young Technology Inc. TEST DEVICE JIG, TEST DEVICE, TEST ASSEMBLY, AND OBJECT TESTING METHOD USING THE SAME
US11282730B2 (en) * 2019-08-02 2022-03-22 Rohinni, LLC Bridge apparatus for semiconductor die transfer
DE102020117586B4 (de) * 2020-07-03 2022-03-24 Deutronic Elektronik Gmbh Vorrichtung zum Prüfen von Bauteilen elektrischer Maschinen, insbesondere Statoren und Rotoren
TWI766650B (zh) * 2021-04-19 2022-06-01 力成科技股份有限公司 半導體元件的測試頭組件
US11693026B2 (en) * 2021-10-22 2023-07-04 Advantest Corporation Test carrier

Family Cites Families (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
BE757111A (fr) * 1969-10-07 1971-03-16 Western Electric Co Procede pour manipuler des dispositifs a micropoutres a un poste d'essai
JP2544015Y2 (ja) * 1990-10-15 1997-08-13 株式会社アドバンテスト Ｉｃ試験装置
US5227717A (en) * 1991-12-03 1993-07-13 Sym-Tek Systems, Inc. Contact assembly for automatic test handler
JPH06309436A (ja) * 1993-04-23 1994-11-04 Ando Electric Co Ltd Ｑｆｐ型ｉｃ用ｉｃソケットの位置検出方法
US5708222A (en) * 1994-08-01 1998-01-13 Tokyo Electron Limited Inspection apparatus, transportation apparatus, and temperature control apparatus
JPH08236594A (ja) * 1995-02-28 1996-09-13 Hitachi Ltd 半導体装置の検査装置
JP3138201B2 (ja) * 1995-12-22 2001-02-26 株式会社しなのエレクトロニクス Ｉｃテストハンドラ
JPH09211067A (ja) * 1996-01-29 1997-08-15 Toshiba Corp 半導体装置の試験装置
JPH1022365A (ja) * 1996-07-04 1998-01-23 Mitsubishi Electric Corp 位置決め装置
JP3019005B2 (ja) * 1996-10-16 2000-03-13 日本電気株式会社 Ｌｓｉハンドラ
TW379285B (en) * 1997-07-02 2000-01-11 Advantest Corp Testing device for semiconductor components and the testing trays used in the testing apparatus
JP3951436B2 (ja) * 1998-04-01 2007-08-01 株式会社アドバンテスト Ｉｃ試験装置
KR100269948B1 (ko) * 1998-08-07 2000-10-16 윤종용 반도체 번-인 공정의 반도체 디바이스 추출/삽입 및자동분류장치
KR100486412B1 (ko) * 2000-10-18 2005-05-03 (주)테크윙 테스트 핸들러의 테스트 트레이 인서트
US6707552B2 (en) * 2000-12-18 2004-03-16 Triquint Technology Holding Co. High precision laser bar test fixture
KR100392229B1 (ko) * 2001-01-09 2003-07-22 미래산업 주식회사 반도체 소자 테스트 핸들러의 인덱스헤드
JP4451992B2 (ja) * 2001-02-28 2010-04-14 株式会社アドバンテスト 試験用電子部品搬送媒体、電子部品試験装置および試験方法
US6474477B1 (en) * 2001-05-02 2002-11-05 Ching T. Chang Carrier assembly for semiconductor IC (integrated circuit) packages
KR100471357B1 (ko) * 2002-07-24 2005-03-10 미래산업 주식회사 반도체 소자 테스트 핸들러용 캐리어 모듈
US6873169B1 (en) * 2004-03-11 2005-03-29 Mirae Corporation Carrier module for semiconductor device test handler

Also Published As

Publication number Publication date
JP4331165B2 (ja) 2009-09-16
WO2004106944A2 (ja) 2004-12-09
TWI335992B (ja) 2011-01-11
US20060290369A1 (en) 2006-12-28
KR20060009362A (ko) 2006-01-31
KR100751842B1 (ko) 2007-08-24
WO2004106944A3 (ja) 2005-02-17
CN100498361C (zh) 2009-06-10
CN1788206A (zh) 2006-06-14
JPWO2004106944A1 (ja) 2006-07-20
TW200506394A (en) 2005-02-16
WO2004106953A1 (ja) 2004-12-09

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Legal Events

Date Code Title Description
MK6 Application lapsed section 142(2)(f)/reg. 8.3(3) - pct applic. not entering national phase