ATE541309T1 - System zum modifizieren kleiner strukturen - Google Patents

System zum modifizieren kleiner strukturen

Info

Publication number
ATE541309T1
ATE541309T1 AT05075796T AT05075796T ATE541309T1 AT E541309 T1 ATE541309 T1 AT E541309T1 AT 05075796 T AT05075796 T AT 05075796T AT 05075796 T AT05075796 T AT 05075796T AT E541309 T1 ATE541309 T1 AT E541309T1
Authority
AT
Austria
Prior art keywords
charge transfer
small structures
transfer mechanism
modifying small
immerse
Prior art date
Application number
AT05075796T
Other languages
English (en)
Inventor
George Y Gu
Neil J Bassom
Thomas J Gannon
Kun Liu
Original Assignee
Fei Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fei Co filed Critical Fei Co
Application granted granted Critical
Publication of ATE541309T1 publication Critical patent/ATE541309T1/de

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/70Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
    • H01L21/71Manufacture of specific parts of devices defined in group H01L21/70
    • H01L21/768Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics
    • H01L21/76838Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics characterised by the formation and the after-treatment of the conductors
    • H01L21/76886Modifying permanently or temporarily the pattern or the conductivity of conductive members, e.g. formation of alloys, reduction of contact resistances
    • H01L21/76892Modifying permanently or temporarily the pattern or the conductivity of conductive members, e.g. formation of alloys, reduction of contact resistances modifying the pattern
    • H01L21/76894Modifying permanently or temporarily the pattern or the conductivity of conductive members, e.g. formation of alloys, reduction of contact resistances modifying the pattern using a laser, e.g. laser cutting, laser direct writing, laser repair
    • CCHEMISTRY; METALLURGY
    • C25ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
    • C25DPROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
    • C25D3/00Electroplating: Baths therefor
    • C25D3/66Electroplating: Baths therefor from melts
    • C25D3/665Electroplating: Baths therefor from melts from ionic liquids
    • CCHEMISTRY; METALLURGY
    • C25ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
    • C25DPROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
    • C25D5/00Electroplating characterised by the process; Pretreatment or after-treatment of workpieces
    • C25D5/02Electroplating of selected surface areas
    • CCHEMISTRY; METALLURGY
    • C25ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
    • C25FPROCESSES FOR THE ELECTROLYTIC REMOVAL OF MATERIALS FROM OBJECTS; APPARATUS THEREFOR
    • C25F3/00Electrolytic etching or polishing
    • C25F3/02Etching
    • C25F3/12Etching of semiconducting materials
    • CCHEMISTRY; METALLURGY
    • C25ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
    • C25FPROCESSES FOR THE ELECTROLYTIC REMOVAL OF MATERIALS FROM OBJECTS; APPARATUS THEREFOR
    • C25F3/00Electrolytic etching or polishing
    • C25F3/02Etching
    • C25F3/14Etching locally
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/02104Forming layers
    • H01L21/02365Forming inorganic semiconducting materials on a substrate
    • H01L21/02612Formation types
    • H01L21/02617Deposition types
    • H01L21/0262Reduction or decomposition of gaseous compounds, e.g. CVD
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/28Manufacture of electrodes on semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/268
    • H01L21/283Deposition of conductive or insulating materials for electrodes conducting electric current
    • H01L21/288Deposition of conductive or insulating materials for electrodes conducting electric current from a liquid, e.g. electrolytic deposition
    • H01L21/2885Deposition of conductive or insulating materials for electrodes conducting electric current from a liquid, e.g. electrolytic deposition using an external electrical current, i.e. electro-deposition
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/30Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
    • H01L21/31Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to form insulating layers thereon, e.g. for masking or by using photolithographic techniques; After treatment of these layers; Selection of materials for these layers
    • H01L21/3205Deposition of non-insulating-, e.g. conductive- or resistive-, layers on insulating layers; After-treatment of these layers
    • H01L21/321After treatment
    • H01L21/3213Physical or chemical etching of the layers, e.g. to produce a patterned layer from a pre-deposited extensive layer
    • H01L21/32133Physical or chemical etching of the layers, e.g. to produce a patterned layer from a pre-deposited extensive layer by chemical means only
    • H01L21/32134Physical or chemical etching of the layers, e.g. to produce a patterned layer from a pre-deposited extensive layer by chemical means only by liquid etching only
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/70Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
    • H01L21/71Manufacture of specific parts of devices defined in group H01L21/70
    • H01L21/768Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics
    • H01L21/76838Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics characterised by the formation and the after-treatment of the conductors
    • H01L21/76886Modifying permanently or temporarily the pattern or the conductivity of conductive members, e.g. formation of alloys, reduction of contact resistances
    • H01L21/76892Modifying permanently or temporarily the pattern or the conductivity of conductive members, e.g. formation of alloys, reduction of contact resistances modifying the pattern

Landscapes

  • Engineering & Computer Science (AREA)
  • Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Physics & Mathematics (AREA)
  • Organic Chemistry (AREA)
  • Metallurgy (AREA)
  • Materials Engineering (AREA)
  • Electrochemistry (AREA)
  • Manufacturing & Machinery (AREA)
  • Power Engineering (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Computer Hardware Design (AREA)
  • General Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Optics & Photonics (AREA)
  • General Chemical & Material Sciences (AREA)
  • Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
  • Manufacturing Of Printed Wiring (AREA)
  • Physical Or Chemical Processes And Apparatus (AREA)
  • Electrodes Of Semiconductors (AREA)
AT05075796T 2004-04-13 2005-04-07 System zum modifizieren kleiner strukturen ATE541309T1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US56170104P 2004-04-13 2004-04-13
US11/081,934 US7674706B2 (en) 2004-04-13 2005-03-16 System for modifying small structures using localized charge transfer mechanism to remove or deposit material

Publications (1)

Publication Number Publication Date
ATE541309T1 true ATE541309T1 (de) 2012-01-15

Family

ID=34938141

Family Applications (1)

Application Number Title Priority Date Filing Date
AT05075796T ATE541309T1 (de) 2004-04-13 2005-04-07 System zum modifizieren kleiner strukturen

Country Status (6)

Country Link
US (2) US7674706B2 (de)
EP (1) EP1610377B1 (de)
JP (1) JP5285833B2 (de)
KR (3) KR20060092786A (de)
AT (1) ATE541309T1 (de)
TW (2) TWI411043B (de)

Families Citing this family (45)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2007083756A1 (ja) * 2006-01-20 2007-07-26 Juridical Foundation Osaka Industrial Promotion Organization 電子顕微鏡用チャージアップ防止液状媒体、及びそれを用いた試料観察方法
US20090321946A1 (en) * 2006-08-01 2009-12-31 Nxp, B.V. Process for fabricating an integrated electronic circuit incorporating a process requiring a voltage threshold between a metal layer and a substrate
JP5181105B2 (ja) * 2007-03-02 2013-04-10 株式会社日立ハイテクサイエンス 集積回路の修正配線形成方法
US8278220B2 (en) * 2008-08-08 2012-10-02 Fei Company Method to direct pattern metals on a substrate
EP2199434A1 (de) 2008-12-19 2010-06-23 FEI Company Verfahren zur Bildung von mikroskopischen Strukturen auf einem Substrat
US8377722B2 (en) * 2010-02-10 2013-02-19 International Business Machines Corporation Methods of forming structures with a focused ion beam for use in atomic force probing and structures for use in atomic force probing
US8853078B2 (en) 2011-01-30 2014-10-07 Fei Company Method of depositing material
US9090973B2 (en) 2011-01-31 2015-07-28 Fei Company Beam-induced deposition of low-resistivity material
CN108262695A (zh) 2011-06-30 2018-07-10 圣戈本陶瓷及塑料股份有限公司 包括氮化硅磨粒的磨料制品
EP2739770A4 (de) * 2011-08-02 2015-06-03 Massachusetts Inst Technology Abstimmung einer nanoskaligen korngrössenverteilung in mehrschichtigen elektroplattierten legierungen mittels ionischer lösungen mit a1-mn- und ähnlichen legierungen
US9255339B2 (en) 2011-09-19 2016-02-09 Fei Company Localized, in-vacuum modification of small structures
US9517546B2 (en) 2011-09-26 2016-12-13 Saint-Gobain Ceramics & Plastics, Inc. Abrasive articles including abrasive particulate materials, coated abrasives using the abrasive particulate materials and methods of forming
EP2797715A4 (de) 2011-12-30 2016-04-20 Saint Gobain Ceramics Geformte schleifpartikel und verfahren zu ihrer herstellung
WO2013106602A1 (en) 2012-01-10 2013-07-18 Saint-Gobain Ceramics & Plastics, Inc. Abrasive particles having particular shapes and methods of forming such particles
WO2013106597A1 (en) 2012-01-10 2013-07-18 Saint-Gobain Ceramics & Plastics, Inc. Abrasive particles having complex shapes and methods of forming same
WO2013177446A1 (en) 2012-05-23 2013-11-28 Saint-Gobain Ceramics & Plastics, Inc. Shaped abrasive particles and methods of forming same
EP2866977B8 (de) 2012-06-29 2023-01-18 Saint-Gobain Ceramics & Plastics, Inc. Schleifpartikel mit besonderen formen und verfahren zur formung solcher partikel
EP2906392A4 (de) 2012-10-15 2016-07-13 Saint Gobain Abrasives Inc Schleifpartikel mit besonderen formen und verfahren zur formung solcher partikel
JP2014107469A (ja) * 2012-11-29 2014-06-09 Tokyo Electron Ltd 半導体装置の製造方法及び製造装置
US9044781B2 (en) * 2012-12-04 2015-06-02 Fei Company Microfluidics delivery systems
WO2014106173A1 (en) 2012-12-31 2014-07-03 Saint-Gobain Ceramics & Plastics, Inc. Particulate materials and methods of forming same
PL2978566T3 (pl) 2013-03-29 2024-07-15 Saint-Gobain Abrasives, Inc. Cząstki ścierne o określonych kształtach i sposoby formowania takich cząstek
TW201502263A (zh) 2013-06-28 2015-01-16 Saint Gobain Ceramics 包含成形研磨粒子之研磨物品
RU2643004C2 (ru) 2013-09-30 2018-01-29 Сен-Гобен Серэмикс Энд Пластикс, Инк. Формованные абразивные частицы и способы их получения
EP3066341B1 (de) * 2013-11-04 2021-03-24 Aerojet Rocketdyne, Inc. Bodenbasierte systeme und verfahren zum testen von reaktionstriebwerken
US9566689B2 (en) 2013-12-31 2017-02-14 Saint-Gobain Abrasives, Inc. Abrasive article including shaped abrasive particles
US9771507B2 (en) 2014-01-31 2017-09-26 Saint-Gobain Ceramics & Plastics, Inc. Shaped abrasive particle including dopant material and method of forming same
WO2015160854A1 (en) 2014-04-14 2015-10-22 Saint-Gobain Ceramics & Plastics, Inc. Abrasive article including shaped abrasive particles
EP3131705A4 (de) 2014-04-14 2017-12-06 Saint-Gobain Ceramics and Plastics, Inc. Schleifartikel mit geformten schleifpartikeln
US9902045B2 (en) 2014-05-30 2018-02-27 Saint-Gobain Abrasives, Inc. Method of using an abrasive article including shaped abrasive particles
US9914864B2 (en) 2014-12-23 2018-03-13 Saint-Gobain Ceramics & Plastics, Inc. Shaped abrasive particles and method of forming same
US9707529B2 (en) 2014-12-23 2017-07-18 Saint-Gobain Ceramics & Plastics, Inc. Composite shaped abrasive particles and method of forming same
US9676981B2 (en) 2014-12-24 2017-06-13 Saint-Gobain Ceramics & Plastics, Inc. Shaped abrasive particle fractions and method of forming same
EP3043372B1 (de) 2015-01-12 2017-01-04 Fei Company Verfahren zur Modifizierung einer Probenoberflächenschicht aus einer mikroskopischen Probe
TWI634200B (zh) 2015-03-31 2018-09-01 聖高拜磨料有限公司 固定磨料物品及其形成方法
US10196551B2 (en) 2015-03-31 2019-02-05 Saint-Gobain Abrasives, Inc. Fixed abrasive articles and methods of forming same
CA2988012C (en) 2015-06-11 2021-06-29 Saint-Gobain Ceramics & Plastics, Inc. Abrasive article including shaped abrasive particles
EP4071224A3 (de) 2016-05-10 2023-01-04 Saint-Gobain Ceramics and Plastics, Inc. Verfahren zur formung von schleifpartikeln
US11230653B2 (en) 2016-09-29 2022-01-25 Saint-Gobain Abrasives, Inc. Fixed abrasive articles and methods of forming same
US10759024B2 (en) 2017-01-31 2020-09-01 Saint-Gobain Ceramics & Plastics, Inc. Abrasive article including shaped abrasive particles
US10563105B2 (en) 2017-01-31 2020-02-18 Saint-Gobain Ceramics & Plastics, Inc. Abrasive article including shaped abrasive particles
US20180322972A1 (en) * 2017-05-04 2018-11-08 General Electric Company System and method for making a solid target within a production chamber of a target assembly
US10865148B2 (en) 2017-06-21 2020-12-15 Saint-Gobain Ceramics & Plastics, Inc. Particulate materials and methods of forming same
KR102619877B1 (ko) 2019-09-11 2024-01-03 삼성전자주식회사 기판 처리 장치
US20210280765A1 (en) * 2020-03-06 2021-09-09 The Board Of Trustees Of The University Of Alabama Superconducting carrier and cables for quantum device chips and method of fabrication

Family Cites Families (27)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3408274A (en) * 1965-07-29 1968-10-29 Du Pont Electrolytic method of adjusting the resistance of palladium glaze resistors
DE1812130C3 (de) * 1968-12-02 1975-01-16 Telefunken Patentverwertungsgesellschaft Mbh, 7900 Ulm Verfahren zum Herstellen einer Halbleiter- oder Dickfilmanordnung
JPS62281349A (ja) * 1986-05-29 1987-12-07 Seiko Instr & Electronics Ltd 金属パタ−ン膜の形成方法及びその装置
JPS63210845A (ja) * 1987-02-27 1988-09-01 Hitachi Ltd 欠陥修正方法
JP2733244B2 (ja) * 1988-04-07 1998-03-30 株式会社日立製作所 配線形成方法
US4952290A (en) * 1989-03-16 1990-08-28 Amp Incorporated Waste water treatment and recovery system
US5104684A (en) * 1990-05-25 1992-04-14 Massachusetts Institute Of Technology Ion beam induced deposition of metals
JP3332439B2 (ja) * 1993-01-26 2002-10-07 株式会社東芝 分析試料作製装置及びその使用方法
JP3254048B2 (ja) 1993-06-30 2002-02-04 セイコーインスツルメンツ株式会社 金属パターン膜形成方法
AU2914095A (en) * 1994-06-28 1996-01-25 Fei Company Charged particle deposition of electrically insulating films
JP3523346B2 (ja) * 1994-11-11 2004-04-26 株式会社ルネサステクノロジ 半導体装置における配線修正方法
WO1999030345A1 (en) * 1997-12-08 1999-06-17 Philips Electron Optics B.V. Environmental sem with a magnetic field for improved secondary electron detection
EP1125120A1 (de) * 1998-10-27 2001-08-22 President And Fellows of Harvard College Biologische ionenkanälen im nanometerbereich hergestellte detektoren
JP2000232078A (ja) * 1999-02-10 2000-08-22 Toshiba Corp メッキ方法及びメッキ装置
US6319831B1 (en) * 1999-03-18 2001-11-20 Taiwan Semiconductor Manufacturing Company Gap filling by two-step plating
JP3541931B2 (ja) * 1999-05-17 2004-07-14 富士ゼロックス株式会社 電着膜形成方法、電極形成方法および電着膜形成装置
GB9930719D0 (en) * 1999-12-24 2000-02-16 Central Research Lab Ltd Apparatus for and method of making electrical measurements on an object in a m edium
US6867448B1 (en) * 2000-08-31 2005-03-15 Micron Technology, Inc. Electro-mechanically polished structure
US6693358B2 (en) * 2000-10-23 2004-02-17 Matsushita Electric Industrial Co., Ltd. Semiconductor chip, wiring board and manufacturing process thereof as well as semiconductor device
US20020074494A1 (en) * 2000-12-15 2002-06-20 Lundquist Theodore R. Precise, in-situ endpoint detection for charged particle beam processing
JP2002217287A (ja) * 2001-01-17 2002-08-02 Mitsubishi Electric Corp 半導体装置およびその製造方法
US6696360B2 (en) * 2001-03-15 2004-02-24 Micron Technology, Inc. Barrier-metal-free copper damascene technology using atomic hydrogen enhanced reflow
US6670717B2 (en) * 2001-10-15 2003-12-30 International Business Machines Corporation Structure and method for charge sensitive electrical devices
KR100465063B1 (ko) * 2002-04-01 2005-01-06 주식회사 하이닉스반도체 반도체 소자의 금속배선 형성방법
US6974768B1 (en) * 2003-01-15 2005-12-13 Novellus Systems, Inc. Methods of providing an adhesion layer for adhesion of barrier and/or seed layers to dielectric films
JP2004221449A (ja) * 2003-01-17 2004-08-05 Sumitomo Metal Mining Co Ltd 多層配線基板およびその製造方法
US7087927B1 (en) * 2003-07-22 2006-08-08 National Semiconductor Corporation Semiconductor die with an editing structure

Also Published As

Publication number Publication date
EP1610377B1 (de) 2012-01-11
EP1610377A2 (de) 2005-12-28
TWI411043B (zh) 2013-10-01
EP1610377A3 (de) 2009-04-29
KR101290561B1 (ko) 2013-08-07
US7674706B2 (en) 2010-03-09
KR101290681B1 (ko) 2013-07-31
US8163641B2 (en) 2012-04-24
KR20060092786A (ko) 2006-08-23
TWI493625B (zh) 2015-07-21
TW200608492A (en) 2006-03-01
KR20130032889A (ko) 2013-04-02
KR20120002503A (ko) 2012-01-05
US20100151679A1 (en) 2010-06-17
US20050227484A1 (en) 2005-10-13
TW201342479A (zh) 2013-10-16
JP2005303319A (ja) 2005-10-27
JP5285833B2 (ja) 2013-09-11

Similar Documents

Publication Publication Date Title
ATE541309T1 (de) System zum modifizieren kleiner strukturen
EP2570519A3 (de) Lokalisierte in-Vakuum-Modifizierung kleiner Strukturen
ATE445912T1 (de) Solarzellenmarkierverfahren und solarzelle
ATE505285T1 (de) Vorrichtung zur erzeugung eines negativ geladenen reduzierenden ionengases
MY146519A (en) Method and apparatus for applying a voltage to a substrate during plating
TW200717587A (en) Semiconductor substrate process using an optically writable carbon-containing mask
EP1975719A3 (de) Verfahren zur Resiststrukturbildung und damit hergestellte Halbleitervorrichtung
EA200702176A1 (ru) Кнопочный переключатель
DK1927275T3 (da) Trykskabelon til en SMT-proces og fremgangsmåde til dens belægning
ATE549433T1 (de) Intermetallische verbindungen
ATE442867T1 (de) Laserdekontaminierung der oberfläche eines formteils
DE50212422D1 (de) Apatitbeschichteter metallischer Werkstoff, Verfahren zu dessen Herstellung sowie Verwendung
JP2002294483A5 (de)
ATE434264T1 (de) Verfahren zum zusammenbau einer doppelseitigen schaltungskomponente
CN103226425B (zh) Ogs电容触摸屏盖板玻璃的加工方法
MY109058A (en) Method for the electrolytic removal of plastic mold flash or bleed from the surfaces of semiconductor devices or similar electronic components and the solution composition to be used with this method
ATE542928T1 (de) Verfahren zum allseitigen beschichten von gegenständen
ATE415701T1 (de) Vorrichtung zum aetzen grossflaechiger halbleiterscheiben
MY142216A (en) Graft pattern forming method and conductive pattern forming method
ATE417371T1 (de) Elektrochemische vorrichtung
JP2010093245A5 (ja) 露光装置、メンテナンス方法、及びデバイス製造方法
KR100779153B1 (ko) 어닐링 장치
PL424002A1 (pl) Kompaktowa komora pomiarowa kompatybilna z układem szczypiec optycznych w warunkach kontrolowanego stężenia tlenu
KR20110029901A (ko) 레이저를 이용한 부분 도금 장치 및 부분 도금 방법
TW200738386A (en) Laser machining apparatus and window cell