ATE453000T1 - Züchten von ultrahochreinen siliciumcarbidkristallen in wasserstoffhaltiger umgebung - Google Patents

Züchten von ultrahochreinen siliciumcarbidkristallen in wasserstoffhaltiger umgebung

Info

Publication number
ATE453000T1
ATE453000T1 AT04779095T AT04779095T ATE453000T1 AT E453000 T1 ATE453000 T1 AT E453000T1 AT 04779095 T AT04779095 T AT 04779095T AT 04779095 T AT04779095 T AT 04779095T AT E453000 T1 ATE453000 T1 AT E453000T1
Authority
AT
Austria
Prior art keywords
silicon carbide
crystal
hydrogen
source powder
growth chamber
Prior art date
Application number
AT04779095T
Other languages
German (de)
English (en)
Inventor
David Malta
Jason Jenny
Hudson Hobgood
Valeri Tsvetkov
Original Assignee
Cree Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Cree Inc filed Critical Cree Inc
Application granted granted Critical
Publication of ATE453000T1 publication Critical patent/ATE453000T1/de

Links

Classifications

    • CCHEMISTRY; METALLURGY
    • C30CRYSTAL GROWTH
    • C30BSINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
    • C30B23/00Single-crystal growth by condensing evaporated or sublimed materials
    • CCHEMISTRY; METALLURGY
    • C30CRYSTAL GROWTH
    • C30BSINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
    • C30B29/00Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
    • C30B29/10Inorganic compounds or compositions
    • C30B29/36Carbides

Landscapes

  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Materials Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Inorganic Chemistry (AREA)
  • Crystals, And After-Treatments Of Crystals (AREA)
  • Carbon And Carbon Compounds (AREA)
  • Pharmaceuticals Containing Other Organic And Inorganic Compounds (AREA)
  • Toys (AREA)
AT04779095T 2003-07-28 2004-07-26 Züchten von ultrahochreinen siliciumcarbidkristallen in wasserstoffhaltiger umgebung ATE453000T1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US10/628,189 US7147715B2 (en) 2003-07-28 2003-07-28 Growth of ultra-high purity silicon carbide crystals in an ambient containing hydrogen
PCT/US2004/023861 WO2005012603A1 (en) 2003-07-28 2004-07-26 Growth of ulta-high purity silicon carbide crystals in an ambient containing hydrogen

Publications (1)

Publication Number Publication Date
ATE453000T1 true ATE453000T1 (de) 2010-01-15

Family

ID=34103327

Family Applications (1)

Application Number Title Priority Date Filing Date
AT04779095T ATE453000T1 (de) 2003-07-28 2004-07-26 Züchten von ultrahochreinen siliciumcarbidkristallen in wasserstoffhaltiger umgebung

Country Status (10)

Country Link
US (1) US7147715B2 (enExample)
EP (1) EP1664397B1 (enExample)
JP (1) JP4891767B2 (enExample)
KR (1) KR20060065661A (enExample)
CN (1) CN100451184C (enExample)
AT (1) ATE453000T1 (enExample)
CA (1) CA2533934A1 (enExample)
DE (1) DE602004024800D1 (enExample)
TW (1) TW200510264A (enExample)
WO (1) WO2005012603A1 (enExample)

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US6814801B2 (en) * 2002-06-24 2004-11-09 Cree, Inc. Method for producing semi-insulating resistivity in high purity silicon carbide crystals
US7220313B2 (en) * 2003-07-28 2007-05-22 Cree, Inc. Reducing nitrogen content in silicon carbide crystals by sublimation growth in a hydrogen-containing ambient
US7601441B2 (en) * 2002-06-24 2009-10-13 Cree, Inc. One hundred millimeter high purity semi-insulating single crystal silicon carbide wafer
US7316747B2 (en) * 2002-06-24 2008-01-08 Cree, Inc. Seeded single crystal silicon carbide growth and resulting crystals
US7192482B2 (en) * 2004-08-10 2007-03-20 Cree, Inc. Seed and seedholder combinations for high quality growth of large silicon carbide single crystals
US7294324B2 (en) * 2004-09-21 2007-11-13 Cree, Inc. Low basal plane dislocation bulk grown SiC wafers
US7314520B2 (en) 2004-10-04 2008-01-01 Cree, Inc. Low 1c screw dislocation 3 inch silicon carbide wafer
US7314521B2 (en) 2004-10-04 2008-01-01 Cree, Inc. Low micropipe 100 mm silicon carbide wafer
US7422634B2 (en) * 2005-04-07 2008-09-09 Cree, Inc. Three inch silicon carbide wafer with low warp, bow, and TTV
KR100775983B1 (ko) 2005-09-29 2007-11-15 네오세미테크 주식회사 반절연 탄화규소 단결정 성장방법
KR100845946B1 (ko) * 2007-01-10 2008-07-11 동의대학교 산학협력단 SiC 단결정 성장방법
US8163086B2 (en) * 2007-08-29 2012-04-24 Cree, Inc. Halogen assisted physical vapor transport method for silicon carbide growth
JP5336307B2 (ja) * 2009-09-04 2013-11-06 株式会社ブリヂストン 炭化珪素単結晶の製造方法
KR101854731B1 (ko) * 2011-07-28 2018-05-04 엘지이노텍 주식회사 잉곳 제조 방법
JP5219230B1 (ja) * 2012-09-04 2013-06-26 エルシード株式会社 SiC蛍光材料及びその製造方法並びに発光素子
CN102965733B (zh) * 2012-11-02 2015-11-18 中国科学院物理研究所 一种无石墨包裹物的导电碳化硅晶体生长工艺
US9919972B2 (en) 2013-05-02 2018-03-20 Melior Innovations, Inc. Pressed and self sintered polymer derived SiC materials, applications and devices
US9657409B2 (en) 2013-05-02 2017-05-23 Melior Innovations, Inc. High purity SiOC and SiC, methods compositions and applications
US11091370B2 (en) 2013-05-02 2021-08-17 Pallidus, Inc. Polysilocarb based silicon carbide materials, applications and devices
US10322936B2 (en) 2013-05-02 2019-06-18 Pallidus, Inc. High purity polysilocarb materials, applications and processes
CN103320851A (zh) * 2013-06-05 2013-09-25 中国科学院上海硅酸盐研究所 大尺寸15r 碳化硅晶体的制备方法
CN104947182A (zh) * 2015-07-16 2015-09-30 中国电子科技集团公司第四十六研究所 一种快速生长大尺寸高纯半绝缘碳化硅单晶的方法
JP6578994B2 (ja) 2016-03-04 2019-09-25 株式会社デンソー 炭化珪素にて構成される半導体基板およびその製造方法
CA3058399A1 (en) 2017-03-29 2018-10-04 Pallidus, Inc. Sic volumetric shapes and methods of forming boules
CN108118394B (zh) * 2017-12-28 2020-07-17 河北同光晶体有限公司 一种降低碳化硅单晶中氮杂质含量的方法
JP6806270B1 (ja) 2019-06-20 2021-01-06 三菱電機株式会社 炭化ケイ素単結晶、半導体素子
US12054850B2 (en) 2019-12-27 2024-08-06 Wolfspeed, Inc. Large diameter silicon carbide wafers
US12125701B2 (en) 2020-12-15 2024-10-22 Wolfspeed, Inc. Large dimension silicon carbide single crystalline materials with reduced crystallographic stress
US12024794B2 (en) 2021-06-17 2024-07-02 Wolfspeed, Inc. Reduced optical absorption for silicon carbide crystalline materials

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NL87348C (enExample) 1954-03-19 1900-01-01
GB8816632D0 (en) 1988-07-13 1988-08-17 Raychem Ltd Electrical device
US5119540A (en) 1990-07-24 1992-06-09 Cree Research, Inc. Apparatus for eliminating residual nitrogen contamination in epitaxial layers of silicon carbide and resulting product
GB9206086D0 (en) 1992-03-20 1992-05-06 Philips Electronics Uk Ltd Manufacturing electronic devices comprising,e.g.tfts and mims
US5709745A (en) 1993-01-25 1998-01-20 Ohio Aerospace Institute Compound semi-conductors and controlled doping thereof
US5611955A (en) 1993-10-18 1997-03-18 Northrop Grumman Corp. High resistivity silicon carbide substrates for high power microwave devices
JPH08208380A (ja) 1995-01-25 1996-08-13 Nippon Steel Corp 単結晶炭化珪素の製造方法
US5718760A (en) 1996-02-05 1998-02-17 Cree Research, Inc. Growth of colorless silicon carbide crystals
US6201342B1 (en) 1997-06-30 2001-03-13 The United States Of America As Represented By The Secretary Of The Navy Automatically sharp field emission cathodes
DE59901313D1 (de) * 1998-07-13 2002-05-29 Siemens Ag VERFAHREN ZUR ZÜCHTUNG VON SiC-EINKRISTALLEN
US6218680B1 (en) 1999-05-18 2001-04-17 Cree, Inc. Semi-insulating silicon carbide without vanadium domination
JP4605961B2 (ja) * 1999-07-07 2011-01-05 エスアイクリスタル アクチエンゲゼルシャフト SiC単結晶を成長圧力下に加熱して昇華成長させる方法
JP3920103B2 (ja) * 2002-01-31 2007-05-30 大阪府 絶縁層埋め込み型半導体炭化シリコン基板の製造方法及びその製造装置
US7220313B2 (en) * 2003-07-28 2007-05-22 Cree, Inc. Reducing nitrogen content in silicon carbide crystals by sublimation growth in a hydrogen-containing ambient
JP2004099340A (ja) * 2002-09-05 2004-04-02 Nippon Steel Corp 炭化珪素単結晶育成用種結晶と炭化珪素単結晶インゴット及びその製造方法

Also Published As

Publication number Publication date
CN1849417A (zh) 2006-10-18
CA2533934A1 (en) 2005-02-10
JP2007500668A (ja) 2007-01-18
CN100451184C (zh) 2009-01-14
US7147715B2 (en) 2006-12-12
US20050145164A9 (en) 2005-07-07
KR20060065661A (ko) 2006-06-14
US20050022724A1 (en) 2005-02-03
EP1664397B1 (en) 2009-12-23
EP1664397A1 (en) 2006-06-07
JP4891767B2 (ja) 2012-03-07
DE602004024800D1 (de) 2010-02-04
TW200510264A (en) 2005-03-16
WO2005012603A1 (en) 2005-02-10

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