TW200510264A - Growth of ultra-high purity silicon carbide crystals in an ambient containing hydrogen - Google Patents
Growth of ultra-high purity silicon carbide crystals in an ambient containing hydrogenInfo
- Publication number
- TW200510264A TW200510264A TW093122581A TW93122581A TW200510264A TW 200510264 A TW200510264 A TW 200510264A TW 093122581 A TW093122581 A TW 093122581A TW 93122581 A TW93122581 A TW 93122581A TW 200510264 A TW200510264 A TW 200510264A
- Authority
- TW
- Taiwan
- Prior art keywords
- silicon carbide
- crystal
- growth
- source powder
- ambient
- Prior art date
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B23/00—Single-crystal growth by condensing evaporated or sublimed materials
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B29/00—Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
- C30B29/10—Inorganic compounds or compositions
- C30B29/36—Carbides
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Crystallography & Structural Chemistry (AREA)
- Materials Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Inorganic Chemistry (AREA)
- Crystals, And After-Treatments Of Crystals (AREA)
- Carbon And Carbon Compounds (AREA)
- Pharmaceuticals Containing Other Organic And Inorganic Compounds (AREA)
- Toys (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US10/628,189 US7147715B2 (en) | 2003-07-28 | 2003-07-28 | Growth of ultra-high purity silicon carbide crystals in an ambient containing hydrogen |
Publications (1)
Publication Number | Publication Date |
---|---|
TW200510264A true TW200510264A (en) | 2005-03-16 |
Family
ID=34103327
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW093122581A TW200510264A (en) | 2003-07-28 | 2004-07-28 | Growth of ultra-high purity silicon carbide crystals in an ambient containing hydrogen |
Country Status (10)
Country | Link |
---|---|
US (1) | US7147715B2 (zh) |
EP (1) | EP1664397B1 (zh) |
JP (1) | JP4891767B2 (zh) |
KR (1) | KR20060065661A (zh) |
CN (1) | CN100451184C (zh) |
AT (1) | ATE453000T1 (zh) |
CA (1) | CA2533934A1 (zh) |
DE (1) | DE602004024800D1 (zh) |
TW (1) | TW200510264A (zh) |
WO (1) | WO2005012603A1 (zh) |
Families Citing this family (26)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7601441B2 (en) * | 2002-06-24 | 2009-10-13 | Cree, Inc. | One hundred millimeter high purity semi-insulating single crystal silicon carbide wafer |
US6814801B2 (en) * | 2002-06-24 | 2004-11-09 | Cree, Inc. | Method for producing semi-insulating resistivity in high purity silicon carbide crystals |
US7316747B2 (en) * | 2002-06-24 | 2008-01-08 | Cree, Inc. | Seeded single crystal silicon carbide growth and resulting crystals |
US7220313B2 (en) * | 2003-07-28 | 2007-05-22 | Cree, Inc. | Reducing nitrogen content in silicon carbide crystals by sublimation growth in a hydrogen-containing ambient |
US7192482B2 (en) * | 2004-08-10 | 2007-03-20 | Cree, Inc. | Seed and seedholder combinations for high quality growth of large silicon carbide single crystals |
US7294324B2 (en) * | 2004-09-21 | 2007-11-13 | Cree, Inc. | Low basal plane dislocation bulk grown SiC wafers |
US7314521B2 (en) | 2004-10-04 | 2008-01-01 | Cree, Inc. | Low micropipe 100 mm silicon carbide wafer |
US7314520B2 (en) | 2004-10-04 | 2008-01-01 | Cree, Inc. | Low 1c screw dislocation 3 inch silicon carbide wafer |
US7422634B2 (en) * | 2005-04-07 | 2008-09-09 | Cree, Inc. | Three inch silicon carbide wafer with low warp, bow, and TTV |
KR100775983B1 (ko) | 2005-09-29 | 2007-11-15 | 네오세미테크 주식회사 | 반절연 탄화규소 단결정 성장방법 |
KR100845946B1 (ko) * | 2007-01-10 | 2008-07-11 | 동의대학교 산학협력단 | SiC 단결정 성장방법 |
US8163086B2 (en) * | 2007-08-29 | 2012-04-24 | Cree, Inc. | Halogen assisted physical vapor transport method for silicon carbide growth |
JP5336307B2 (ja) * | 2009-09-04 | 2013-11-06 | 株式会社ブリヂストン | 炭化珪素単結晶の製造方法 |
KR101854731B1 (ko) * | 2011-07-28 | 2018-05-04 | 엘지이노텍 주식회사 | 잉곳 제조 방법 |
JP5219230B1 (ja) * | 2012-09-04 | 2013-06-26 | エルシード株式会社 | SiC蛍光材料及びその製造方法並びに発光素子 |
CN102965733B (zh) * | 2012-11-02 | 2015-11-18 | 中国科学院物理研究所 | 一种无石墨包裹物的导电碳化硅晶体生长工艺 |
US10322936B2 (en) | 2013-05-02 | 2019-06-18 | Pallidus, Inc. | High purity polysilocarb materials, applications and processes |
US11091370B2 (en) | 2013-05-02 | 2021-08-17 | Pallidus, Inc. | Polysilocarb based silicon carbide materials, applications and devices |
US9919972B2 (en) | 2013-05-02 | 2018-03-20 | Melior Innovations, Inc. | Pressed and self sintered polymer derived SiC materials, applications and devices |
US9657409B2 (en) | 2013-05-02 | 2017-05-23 | Melior Innovations, Inc. | High purity SiOC and SiC, methods compositions and applications |
CN103320851A (zh) * | 2013-06-05 | 2013-09-25 | 中国科学院上海硅酸盐研究所 | 大尺寸15r 碳化硅晶体的制备方法 |
CN104947182A (zh) * | 2015-07-16 | 2015-09-30 | 中国电子科技集团公司第四十六研究所 | 一种快速生长大尺寸高纯半绝缘碳化硅单晶的方法 |
JP6578994B2 (ja) | 2016-03-04 | 2019-09-25 | 株式会社デンソー | 炭化珪素にて構成される半導体基板およびその製造方法 |
CN108118394B (zh) * | 2017-12-28 | 2020-07-17 | 河北同光晶体有限公司 | 一种降低碳化硅单晶中氮杂质含量的方法 |
JP2023508691A (ja) | 2019-12-27 | 2023-03-03 | ウルフスピード インコーポレイテッド | 大口径炭化ケイ素ウェハ |
US12024794B2 (en) | 2021-06-17 | 2024-07-02 | Wolfspeed, Inc. | Reduced optical absorption for silicon carbide crystalline materials |
Family Cites Families (15)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
NL87348C (zh) * | 1954-03-19 | 1900-01-01 | ||
GB8816632D0 (en) * | 1988-07-13 | 1988-08-17 | Raychem Ltd | Electrical device |
US5119540A (en) * | 1990-07-24 | 1992-06-09 | Cree Research, Inc. | Apparatus for eliminating residual nitrogen contamination in epitaxial layers of silicon carbide and resulting product |
GB9206086D0 (en) | 1992-03-20 | 1992-05-06 | Philips Electronics Uk Ltd | Manufacturing electronic devices comprising,e.g.tfts and mims |
US5709745A (en) * | 1993-01-25 | 1998-01-20 | Ohio Aerospace Institute | Compound semi-conductors and controlled doping thereof |
US5611955A (en) * | 1993-10-18 | 1997-03-18 | Northrop Grumman Corp. | High resistivity silicon carbide substrates for high power microwave devices |
JPH08208380A (ja) | 1995-01-25 | 1996-08-13 | Nippon Steel Corp | 単結晶炭化珪素の製造方法 |
US5718760A (en) * | 1996-02-05 | 1998-02-17 | Cree Research, Inc. | Growth of colorless silicon carbide crystals |
US6201342B1 (en) * | 1997-06-30 | 2001-03-13 | The United States Of America As Represented By The Secretary Of The Navy | Automatically sharp field emission cathodes |
DE59901313D1 (de) * | 1998-07-13 | 2002-05-29 | Siemens Ag | VERFAHREN ZUR ZÜCHTUNG VON SiC-EINKRISTALLEN |
US6218680B1 (en) * | 1999-05-18 | 2001-04-17 | Cree, Inc. | Semi-insulating silicon carbide without vanadium domination |
DE50004010D1 (de) * | 1999-07-07 | 2003-11-13 | Siemens Ag | Verfahren zur sublimationszüchtung eines sic-einkristalls mit aufheizen unter züchtungsdruck |
JP3920103B2 (ja) * | 2002-01-31 | 2007-05-30 | 大阪府 | 絶縁層埋め込み型半導体炭化シリコン基板の製造方法及びその製造装置 |
US7220313B2 (en) * | 2003-07-28 | 2007-05-22 | Cree, Inc. | Reducing nitrogen content in silicon carbide crystals by sublimation growth in a hydrogen-containing ambient |
JP2004099340A (ja) * | 2002-09-05 | 2004-04-02 | Nippon Steel Corp | 炭化珪素単結晶育成用種結晶と炭化珪素単結晶インゴット及びその製造方法 |
-
2003
- 2003-07-28 US US10/628,189 patent/US7147715B2/en not_active Expired - Lifetime
-
2004
- 2004-07-26 EP EP04779095A patent/EP1664397B1/en not_active Expired - Lifetime
- 2004-07-26 JP JP2006521949A patent/JP4891767B2/ja not_active Expired - Lifetime
- 2004-07-26 CN CNB2004800264165A patent/CN100451184C/zh not_active Expired - Lifetime
- 2004-07-26 WO PCT/US2004/023861 patent/WO2005012603A1/en active Search and Examination
- 2004-07-26 AT AT04779095T patent/ATE453000T1/de not_active IP Right Cessation
- 2004-07-26 CA CA002533934A patent/CA2533934A1/en not_active Abandoned
- 2004-07-26 KR KR1020067002078A patent/KR20060065661A/ko not_active Application Discontinuation
- 2004-07-26 DE DE602004024800T patent/DE602004024800D1/de not_active Expired - Lifetime
- 2004-07-28 TW TW093122581A patent/TW200510264A/zh unknown
Also Published As
Publication number | Publication date |
---|---|
US7147715B2 (en) | 2006-12-12 |
JP4891767B2 (ja) | 2012-03-07 |
JP2007500668A (ja) | 2007-01-18 |
DE602004024800D1 (de) | 2010-02-04 |
EP1664397A1 (en) | 2006-06-07 |
ATE453000T1 (de) | 2010-01-15 |
CN100451184C (zh) | 2009-01-14 |
US20050145164A9 (en) | 2005-07-07 |
US20050022724A1 (en) | 2005-02-03 |
CA2533934A1 (en) | 2005-02-10 |
WO2005012603A1 (en) | 2005-02-10 |
CN1849417A (zh) | 2006-10-18 |
KR20060065661A (ko) | 2006-06-14 |
EP1664397B1 (en) | 2009-12-23 |
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