ATE429014T1 - Strombegrenztes latch - Google Patents

Strombegrenztes latch

Info

Publication number
ATE429014T1
ATE429014T1 AT03812793T AT03812793T ATE429014T1 AT E429014 T1 ATE429014 T1 AT E429014T1 AT 03812793 T AT03812793 T AT 03812793T AT 03812793 T AT03812793 T AT 03812793T AT E429014 T1 ATE429014 T1 AT E429014T1
Authority
AT
Austria
Prior art keywords
latch
current
data changes
circuit
supplies
Prior art date
Application number
AT03812793T
Other languages
English (en)
Inventor
Chi-Ming Wang
Kuo-Lung Chen
Shouchang Tsao
Original Assignee
Sandisk Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sandisk Corp filed Critical Sandisk Corp
Application granted granted Critical
Publication of ATE429014T1 publication Critical patent/ATE429014T1/de

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/06—Auxiliary circuits, e.g. for writing into memory
    • G11C16/10—Programming or data input circuits
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/06—Auxiliary circuits, e.g. for writing into memory
    • G11C16/10—Programming or data input circuits
    • G11C16/12—Programming voltage switching circuits
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/04—Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS
    • G11C16/0483—Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS comprising cells having several storage transistors connected in series
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/06—Auxiliary circuits, e.g. for writing into memory
    • G11C16/30—Power supply circuits
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C5/00—Details of stores covered by group G11C11/00
    • G11C5/14—Power supply arrangements, e.g. power down, chip selection or deselection, layout of wirings or power grids, or multiple supply levels
    • G11C5/147—Voltage reference generators, voltage or current regulators; Internally lowered supply levels; Compensation for voltage drops

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Non-Volatile Memory (AREA)
  • Read Only Memory (AREA)
  • Oscillators With Electromechanical Resonators (AREA)
  • Semiconductor Memories (AREA)
  • Amplifiers (AREA)
  • Control Of Indicators Other Than Cathode Ray Tubes (AREA)
AT03812793T 2002-12-06 2003-12-01 Strombegrenztes latch ATE429014T1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US10/313,738 US7339822B2 (en) 2002-12-06 2002-12-06 Current-limited latch
PCT/US2003/038328 WO2004053883A2 (en) 2002-12-06 2003-12-01 Current-limited latch

Publications (1)

Publication Number Publication Date
ATE429014T1 true ATE429014T1 (de) 2009-05-15

Family

ID=32468331

Family Applications (1)

Application Number Title Priority Date Filing Date
AT03812793T ATE429014T1 (de) 2002-12-06 2003-12-01 Strombegrenztes latch

Country Status (10)

Country Link
US (2) US7339822B2 (de)
EP (1) EP1586096B1 (de)
JP (1) JP4603892B2 (de)
KR (1) KR101030680B1 (de)
CN (1) CN100552808C (de)
AT (1) ATE429014T1 (de)
AU (1) AU2003297625A1 (de)
DE (1) DE60327257D1 (de)
TW (1) TWI320573B (de)
WO (1) WO2004053883A2 (de)

Families Citing this family (32)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW569221B (en) * 2002-09-11 2004-01-01 Elan Microelectronics Corp Chip having on-system programmable nonvolatile memory and off-system programmable nonvolatile memory, and forming method and programming method of the same
US7339822B2 (en) 2002-12-06 2008-03-04 Sandisk Corporation Current-limited latch
US7205758B1 (en) * 2004-02-02 2007-04-17 Transmeta Corporation Systems and methods for adjusting threshold voltage
US7816742B1 (en) 2004-09-30 2010-10-19 Koniaris Kleanthes G Systems and methods for integrated circuits comprising multiple body biasing domains
US7859062B1 (en) 2004-02-02 2010-12-28 Koniaris Kleanthes G Systems and methods for integrated circuits comprising multiple body biasing domains
US7072217B2 (en) * 2004-02-24 2006-07-04 Micron Technology, Inc. Multi-state memory cell with asymmetric charge trapping
US7509504B1 (en) 2004-09-30 2009-03-24 Transmeta Corporation Systems and methods for control of integrated circuits comprising body biasing systems
CN100570743C (zh) * 2005-01-25 2009-12-16 北极光股份有限公司 单晶片磁电阻式存储器
US7352626B1 (en) 2005-08-29 2008-04-01 Spansion Llc Voltage regulator with less overshoot and faster settling time
US7295475B2 (en) * 2005-09-20 2007-11-13 Spansion Llc Flash memory programming using an indication bit to interpret state
US8358543B1 (en) 2005-09-20 2013-01-22 Spansion Llc Flash memory programming with data dependent control of source lines
US7512029B2 (en) 2006-06-09 2009-03-31 Micron Technology, Inc. Method and apparatus for managing behavior of memory devices
US7602217B2 (en) * 2007-08-16 2009-10-13 Globalfoundries Inc. Level shifter circuit with pre-charge/pre-discharge
CN101551688B (zh) * 2008-04-03 2011-11-16 瑞鼎科技股份有限公司 限流电路及具有限流电路的电子装置
CN101587688B (zh) * 2008-05-19 2011-11-09 联咏科技股份有限公司 电源顺序控制电路及所应用的栅极驱动器与液晶显示面板
WO2011020225A1 (zh) * 2009-08-18 2011-02-24 东南大学 一种亚阈值存储单元阵列容量和密度的增强电路
CN102457263A (zh) * 2010-11-01 2012-05-16 天钰科技股份有限公司 改良位准移位器的电路及方法
US9424938B2 (en) 2011-06-09 2016-08-23 Micron Technology, Inc. Reduced voltage nonvolatile flash memory
FR2980025A1 (fr) * 2011-09-12 2013-03-15 St Microelectronics Rousset Memoire eeprom protegee contre le claquage de transistors de controle de grille
KR20130125570A (ko) * 2012-05-09 2013-11-19 에스케이하이닉스 주식회사 반도체 메모리 장치 및 그것의 동작 방법
US8976594B2 (en) 2012-05-15 2015-03-10 Micron Technology, Inc. Memory read apparatus and methods
US9064551B2 (en) 2012-05-15 2015-06-23 Micron Technology, Inc. Apparatuses and methods for coupling load current to a common source
US9246493B2 (en) * 2012-08-01 2016-01-26 Renesas Electronics Corporation Level shift circuit and semiconductor device
US9064577B2 (en) 2012-12-06 2015-06-23 Micron Technology, Inc. Apparatuses and methods to control body potential in memory operations
US8995188B2 (en) * 2013-04-17 2015-03-31 Micron Technology, Inc. Sharing support circuitry in a memory
FR3012672B1 (fr) 2013-10-31 2017-04-14 Stmicroelectronics Rousset Cellule memoire comprenant des grilles de controle horizontale et verticale non auto-alignees
FR3012673B1 (fr) 2013-10-31 2017-04-14 St Microelectronics Rousset Memoire programmable par injection de porteurs chauds et procede de programmation d'une telle memoire
FR3017746B1 (fr) 2014-02-18 2016-05-27 Stmicroelectronics Rousset Cellule memoire verticale ayant un implant drain-source flottant non auto-aligne
US10176880B1 (en) 2017-07-01 2019-01-08 Intel Corporation Selective body reset operation for three dimensional (3D) NAND memory
CN107727923A (zh) * 2017-08-29 2018-02-23 宁德时代新能源科技股份有限公司 高压采样电路和电池管理系统
US11386961B2 (en) * 2019-12-20 2022-07-12 Sandisk Technologies Llc Centralized fixed rate serializer and deserializer for bad column management in non-volatile memory
TWI895818B (zh) * 2023-10-17 2025-09-01 國立虎尾科技大學 在航天器材中使用之限流保護電路以及使用其之航天器材電源系統

Family Cites Families (39)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4342102A (en) * 1980-06-18 1982-07-27 Signetics Corporation Semiconductor memory array
US5099297A (en) * 1988-02-05 1992-03-24 Emanuel Hazani EEPROM cell structure and architecture with programming and erase terminals shared between several cells
US5095344A (en) * 1988-06-08 1992-03-10 Eliyahou Harari Highly compact eprom and flash eeprom devices
EP0935255A2 (de) * 1989-04-13 1999-08-11 SanDisk Corporation EEprom-System mit Blocklöschung
US5313432A (en) * 1990-05-23 1994-05-17 Texas Instruments Incorporated Segmented, multiple-decoder memory array and method for programming a memory array
US5343063A (en) * 1990-12-18 1994-08-30 Sundisk Corporation Dense vertical programmable read only memory cell structure and processes for making them
US5270979A (en) * 1991-03-15 1993-12-14 Sundisk Corporation Method for optimum erasing of EEPROM
US6230233B1 (en) * 1991-09-13 2001-05-08 Sandisk Corporation Wear leveling techniques for flash EEPROM systems
US5712180A (en) * 1992-01-14 1998-01-27 Sundisk Corporation EEPROM with split gate source side injection
US6222762B1 (en) * 1992-01-14 2001-04-24 Sandisk Corporation Multi-state memory
US5334890A (en) * 1992-10-30 1994-08-02 United Memories, Inc. Sense amplifier clock driver
US5668758A (en) * 1995-01-26 1997-09-16 Macronix Int'l Co., Ltd. Decoded wordline driver with positive and negative voltage modes
US5745410A (en) 1995-11-17 1998-04-28 Macronix International Co., Ltd. Method and system for soft programming algorithm
US5777924A (en) * 1997-06-05 1998-07-07 Aplus Integrated Circuits, Inc. Flash memory array and decoding architecture
USRE37419E1 (en) * 1997-06-05 2001-10-23 Aplus Flash Technology Inc. Flash memory array and decoding architecture
US6150687A (en) * 1997-07-08 2000-11-21 Micron Technology, Inc. Memory cell having a vertical transistor with buried source/drain and dual gates
JP3425340B2 (ja) * 1997-10-09 2003-07-14 株式会社東芝 不揮発性半導体記憶装置
GB2364838B (en) 1998-03-04 2002-03-20 Fujitsu Ltd Mixed-signal circuitry and integrated circuit devices
JP3389856B2 (ja) * 1998-03-24 2003-03-24 日本電気株式会社 半導体装置
US6429495B2 (en) * 1998-06-17 2002-08-06 Mitsubishi Denki Kabushiki Kaisha Semiconductor device with address programming circuit
US6333866B1 (en) * 1998-09-28 2001-12-25 Texas Instruments Incorporated Semiconductor device array having dense memory cell array and heirarchical bit line scheme
US6104665A (en) * 1998-12-04 2000-08-15 Macronix International Co., Ltd. Enhanced word line driver to reduce gate capacitance for low voltage applications
JP2000195284A (ja) * 1998-12-24 2000-07-14 Toshiba Corp ラッチ型レベルシフト回路
US6324110B1 (en) * 1999-03-12 2001-11-27 Monolithic Systems Technology, Inc. High-speed read-write circuitry for semi-conductor memory
EP1061525B1 (de) * 1999-06-17 2006-03-08 STMicroelectronics S.r.l. Zeilendekodierer für nichtflüchtigen Speicher zur wahlfreien positiven und negativen Vorspannungseinstellung von Wortleitungen
JP2001028427A (ja) * 1999-07-14 2001-01-30 Mitsubishi Electric Corp 不揮発性半導体記憶装置
TW509943B (en) * 1999-10-06 2002-11-11 Ind Tech Res Inst Hidden-type refreshed 2P2N pseudo static random access memory and its refreshing method
US6445621B1 (en) * 2000-01-21 2002-09-03 Mosel Vitelic, Inc. Dynamic data amplifier with built-in voltage level shifting
JP4057756B2 (ja) * 2000-03-01 2008-03-05 松下電器産業株式会社 半導体集積回路
JP3534681B2 (ja) * 2000-06-01 2004-06-07 松下電器産業株式会社 半導体記憶装置
EP1265252A1 (de) * 2001-06-05 2002-12-11 STMicroelectronics S.r.l. Ein Verfahren zur sektorweisen Löschung und Löschverifikation für einen nichtflüchtigen Flash EEPROM-Speicher
US6704241B1 (en) * 2002-09-06 2004-03-09 Winbond Electronics Corporation Memory architecture with vertical and horizontal row decoding
ITRM20010525A1 (it) * 2001-08-30 2003-02-28 St Microelectronics Srl Memoria eeprom flash cancellabile per righe.
JP4004809B2 (ja) * 2001-10-24 2007-11-07 株式会社東芝 半導体装置及びその動作方法
US6639824B1 (en) * 2002-09-19 2003-10-28 Infineon Technologies Aktiengesellschaft Memory architecture
US6908817B2 (en) 2002-10-09 2005-06-21 Sandisk Corporation Flash memory array with increased coupling between floating and control gates
US7339822B2 (en) 2002-12-06 2008-03-04 Sandisk Corporation Current-limited latch
JP4497874B2 (ja) 2002-12-13 2010-07-07 株式会社ルネサステクノロジ 半導体集積回路及びicカード
ITBO20030703A1 (it) * 2003-11-21 2005-05-22 Gd Spa Unita' di alimentazione e trasporto tabacco in una

Also Published As

Publication number Publication date
AU2003297625A8 (en) 2004-06-30
EP1586096B1 (de) 2009-04-15
TW200421350A (en) 2004-10-16
KR20050098836A (ko) 2005-10-12
EP1586096A2 (de) 2005-10-19
TWI320573B (en) 2010-02-11
AU2003297625A1 (en) 2004-06-30
JP2006509327A (ja) 2006-03-16
US7319630B2 (en) 2008-01-15
CN1720585A (zh) 2006-01-11
WO2004053883A3 (en) 2005-03-17
JP4603892B2 (ja) 2010-12-22
DE60327257D1 (de) 2009-05-28
US20050101236A1 (en) 2005-05-12
WO2004053883A2 (en) 2004-06-24
KR101030680B1 (ko) 2011-04-22
US7339822B2 (en) 2008-03-04
US20040109354A1 (en) 2004-06-10
CN100552808C (zh) 2009-10-21

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