ATE421769T1 - Cmp-zusammensetzung mit einem tensid - Google Patents
Cmp-zusammensetzung mit einem tensidInfo
- Publication number
- ATE421769T1 ATE421769T1 AT05817425T AT05817425T ATE421769T1 AT E421769 T1 ATE421769 T1 AT E421769T1 AT 05817425 T AT05817425 T AT 05817425T AT 05817425 T AT05817425 T AT 05817425T AT E421769 T1 ATE421769 T1 AT E421769T1
- Authority
- AT
- Austria
- Prior art keywords
- substrate
- surfactant
- cmp composition
- polishing
- polishing composition
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
- G11B5/00—Recording by magnetisation or demagnetisation of a record carrier; Reproducing by magnetic means; Record carriers therefor
- G11B5/84—Processes or apparatus specially adapted for manufacturing record carriers
- G11B5/8404—Processes or apparatus specially adapted for manufacturing record carriers manufacturing base layers
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P52/00—Grinding, lapping or polishing of wafers, substrates or parts of devices
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09G—POLISHING COMPOSITIONS; SKI WAXES
- C09G1/00—Polishing compositions
- C09G1/02—Polishing compositions containing abrasives or grinding agents
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09K—MATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FOR ELSEWHERE
- C09K3/00—Materials not provided for elsewhere
- C09K3/14—Anti-slip materials; Abrasives
- C09K3/1454—Abrasive powders, suspensions and pastes for polishing
- C09K3/1463—Aqueous liquid suspensions
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P52/00—Grinding, lapping or polishing of wafers, substrates or parts of devices
- H10P52/40—Chemomechanical polishing [CMP]
- H10P52/403—Chemomechanical polishing [CMP] of conductive or resistive materials
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Organic Chemistry (AREA)
- Manufacturing & Machinery (AREA)
- Materials Engineering (AREA)
- Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
- Manufacturing Of Magnetic Record Carriers (AREA)
- Organic Insulating Materials (AREA)
- Dental Preparations (AREA)
- Glass Compositions (AREA)
- Agricultural Chemicals And Associated Chemicals (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US10/975,585 US7524347B2 (en) | 2004-10-28 | 2004-10-28 | CMP composition comprising surfactant |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| ATE421769T1 true ATE421769T1 (de) | 2009-02-15 |
Family
ID=35840204
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| AT05817425T ATE421769T1 (de) | 2004-10-28 | 2005-10-21 | Cmp-zusammensetzung mit einem tensid |
Country Status (11)
| Country | Link |
|---|---|
| US (1) | US7524347B2 (de) |
| EP (1) | EP1829093B1 (de) |
| JP (1) | JP4965451B2 (de) |
| KR (1) | KR101109300B1 (de) |
| CN (2) | CN101044600A (de) |
| AT (1) | ATE421769T1 (de) |
| DE (1) | DE602005012546D1 (de) |
| IL (1) | IL182536A (de) |
| MY (1) | MY143941A (de) |
| TW (1) | TWI313703B (de) |
| WO (1) | WO2006049912A2 (de) |
Families Citing this family (56)
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| JP2005244123A (ja) * | 2004-02-27 | 2005-09-08 | Fujimi Inc | 研磨用組成物 |
| US7531105B2 (en) * | 2004-11-05 | 2009-05-12 | Cabot Microelectronics Corporation | Polishing composition and method for high silicon nitride to silicon oxide removal rate ratios |
| US7504044B2 (en) | 2004-11-05 | 2009-03-17 | Cabot Microelectronics Corporation | Polishing composition and method for high silicon nitride to silicon oxide removal rate ratios |
| KR100684877B1 (ko) * | 2005-01-05 | 2007-02-20 | 삼성전자주식회사 | 슬러리 조성물 및 이를 이용한 화학적 기계적 연마 공정을포함하는 반도체 소자 제조 방법 |
| US20080096385A1 (en) * | 2006-09-27 | 2008-04-24 | Hynix Semiconductor Inc. | Slurry composition for forming tungsten pattern and method for manufacturing semiconductor device using the same |
| US20080148652A1 (en) * | 2006-12-21 | 2008-06-26 | Junaid Ahmed Siddiqui | Compositions for chemical mechanical planarization of copper |
| CN103045099B (zh) * | 2007-09-14 | 2015-03-25 | 安集微电子(上海)有限公司 | 用于抛光多晶硅的化学机械抛光液 |
| WO2009034933A1 (ja) * | 2007-09-14 | 2009-03-19 | Kao Corporation | 垂直磁気記録方式ハードディスク用基板用水系洗浄剤組成物 |
| WO2009041697A1 (ja) * | 2007-09-28 | 2009-04-02 | Nitta Haas Incorporated | 研磨用組成物 |
| US7905994B2 (en) * | 2007-10-03 | 2011-03-15 | Moses Lake Industries, Inc. | Substrate holder and electroplating system |
| JP4981750B2 (ja) * | 2007-10-29 | 2012-07-25 | 花王株式会社 | ハードディスク基板用研磨液組成物 |
| CN101177591B (zh) * | 2007-12-07 | 2010-06-02 | 天长市华润清洗科技有限公司 | 金属抛光剂及其制备方法 |
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| US20090188553A1 (en) * | 2008-01-25 | 2009-07-30 | Emat Technology, Llc | Methods of fabricating solar-cell structures and resulting solar-cell structures |
| US8247326B2 (en) * | 2008-07-10 | 2012-08-21 | Cabot Microelectronics Corporation | Method of polishing nickel-phosphorous |
| KR101485630B1 (ko) | 2008-07-11 | 2015-01-22 | 니타 하스 인코포레이티드 | 연마 조성물 |
| CN101638557A (zh) * | 2008-08-01 | 2010-02-03 | 安集微电子(上海)有限公司 | 一种化学机械抛光液 |
| CN101665661A (zh) * | 2008-09-05 | 2010-03-10 | 安集微电子科技(上海)有限公司 | 胺类化合物的应用以及一种化学机械抛光液 |
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| KR101178717B1 (ko) | 2008-12-22 | 2012-08-31 | 제일모직주식회사 | 다결정 실리콘 연마용 cmp 슬러리 조성물 및 이를 이용한 연마 방법 |
| US8226841B2 (en) * | 2009-02-03 | 2012-07-24 | Cabot Microelectronics Corporation | Polishing composition for nickel-phosphorous memory disks |
| US8262894B2 (en) | 2009-04-30 | 2012-09-11 | Moses Lake Industries, Inc. | High speed copper plating bath |
| US9330703B2 (en) * | 2009-06-04 | 2016-05-03 | Cabot Microelectronics Corporation | Polishing composition for nickel-phosphorous memory disks |
| US8883034B2 (en) * | 2009-09-16 | 2014-11-11 | Brian Reiss | Composition and method for polishing bulk silicon |
| JP5536433B2 (ja) * | 2009-12-11 | 2014-07-02 | 花王株式会社 | ハードディスク基板用研磨液組成物 |
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| KR20120020556A (ko) * | 2010-08-30 | 2012-03-08 | 삼성전자주식회사 | 화학적 기계적 연마 공정의 슬러리 조성물 및 이를 이용하는 상변화 메모리 소자의 형성 방법 |
| KR20120136881A (ko) * | 2011-06-10 | 2012-12-20 | 동우 화인켐 주식회사 | 결정성 실리콘 웨이퍼의 텍스쳐 에칭액 조성물 및 텍스쳐 에칭방법 |
| JP2013030235A (ja) * | 2011-07-27 | 2013-02-07 | Alphana Technology Co Ltd | 回転機器および回転機器を製造する方法 |
| US9039914B2 (en) * | 2012-05-23 | 2015-05-26 | Cabot Microelectronics Corporation | Polishing composition for nickel-phosphorous-coated memory disks |
| JP6272842B2 (ja) * | 2012-06-11 | 2018-01-31 | キャボット マイクロエレクトロニクス コーポレイション | モリブデン研磨のための組成物および方法 |
| JP5580441B2 (ja) * | 2013-03-05 | 2014-08-27 | 株式会社フジミインコーポレーテッド | 研磨用組成物及びそれを用いた研磨方法 |
| US9196283B1 (en) | 2013-03-13 | 2015-11-24 | Western Digital (Fremont), Llc | Method for providing a magnetic recording transducer using a chemical buffer |
| US8961807B2 (en) | 2013-03-15 | 2015-02-24 | Cabot Microelectronics Corporation | CMP compositions with low solids content and methods related thereto |
| SG11201602877RA (en) | 2013-10-18 | 2016-05-30 | Cabot Microelectronics Corp | Polishing composition and method for nickel-phosphorous coated memory disks |
| US9401104B2 (en) | 2014-05-05 | 2016-07-26 | Cabot Microelectronics Corporation | Polishing composition for edge roll-off improvement |
| TWI530557B (zh) * | 2014-05-29 | 2016-04-21 | 卡博特微電子公司 | 具高移除速率及低缺陷率之對氧化物與多晶矽及氮化物具有選擇性的cmp組合物 |
| WO2016097915A1 (en) * | 2014-12-16 | 2016-06-23 | Basf Se | Chemical mechanical polishing (cmp) composition for high effective polishing of substrates comprising germanium |
| US9828574B2 (en) | 2015-01-13 | 2017-11-28 | Cabot Microelectronics Corporation | Cleaning composition and method for cleaning semiconductor wafers after CMP |
| MY186924A (en) | 2015-04-06 | 2021-08-26 | Cmc Mat Inc | Cmp composition and methods for polishing rigid disks |
| US11193059B2 (en) | 2016-12-13 | 2021-12-07 | Current Lighting Solutions, Llc | Processes for preparing color stable red-emitting phosphor particles having small particle size |
| JP7077236B2 (ja) * | 2016-12-28 | 2022-05-30 | ニッタ・デュポン株式会社 | 研磨用組成物 |
| CN107541731A (zh) * | 2017-09-05 | 2018-01-05 | 江苏飞拓界面工程科技有限公司 | 一种铝及铝合金高效环保抛光液及其制备方法 |
| JP6894535B2 (ja) * | 2017-12-27 | 2021-06-30 | 花王株式会社 | アルミニウム製プラッタの製造方法 |
| JP7183863B2 (ja) * | 2018-03-13 | 2022-12-06 | Jsr株式会社 | 化学機械研磨用組成物及び化学機械研磨方法 |
| US10479911B1 (en) | 2018-06-05 | 2019-11-19 | Cabot Microelectronics Corporation | Composition and method for polishing memory hard disks exhibiting reduced edge roll off |
| JP2019131814A (ja) * | 2019-03-08 | 2019-08-08 | 株式会社フジミインコーポレーテッド | 研磨用組成物の製造方法 |
| WO2021231090A1 (en) * | 2020-05-11 | 2021-11-18 | Versum Materials Us, Llc | Novel pad-1 n-a-bottle (pib) technology for advanced chemical-mechanical planarization (cmp) slurries and processes |
| US12234383B2 (en) | 2020-05-29 | 2025-02-25 | Versum Materials Us, Llc | Low dishing oxide CMP polishing compositions for shallow trench isolation applications and methods of making thereof |
| EP4189026A4 (de) * | 2020-07-29 | 2024-07-31 | Versum Materials US, LLC | Pad-in-a-flasche (pib)-technologie zur chemisch-mechanischen planarisierung von kupfer und siliciumdurchkontaktierung (tsv) |
| CN112646151B (zh) * | 2020-12-09 | 2022-08-02 | 华南师范大学 | 一种可降解的生物基缓释型铅离子螯合剂及其制备方法和应用 |
| EP4284885A4 (de) * | 2021-01-26 | 2024-12-04 | CMC Materials LLC | Zusammensetzung und verfahren zum polieren von bordotiertem polysilicium |
| US12351775B2 (en) | 2021-05-14 | 2025-07-08 | Ecolab Usa Inc. | Neutralizing instrument reprocessing |
| KR102777957B1 (ko) * | 2024-07-05 | 2025-03-11 | 주식회사 상아케미컬 | 구리 에칭용 조성물 |
| KR102863362B1 (ko) * | 2024-10-18 | 2025-09-23 | 송창화 | 폐유를 이용한 에멀젼 연료유 제조 방법 |
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-
2004
- 2004-10-28 US US10/975,585 patent/US7524347B2/en not_active Expired - Lifetime
-
2005
- 2005-10-21 JP JP2007539010A patent/JP4965451B2/ja not_active Expired - Lifetime
- 2005-10-21 KR KR1020077011829A patent/KR101109300B1/ko not_active Expired - Fee Related
- 2005-10-21 EP EP05817425A patent/EP1829093B1/de not_active Expired - Lifetime
- 2005-10-21 CN CNA2005800360044A patent/CN101044600A/zh active Pending
- 2005-10-21 AT AT05817425T patent/ATE421769T1/de not_active IP Right Cessation
- 2005-10-21 CN CN201110150388.XA patent/CN102337080B/zh not_active Expired - Fee Related
- 2005-10-21 DE DE602005012546T patent/DE602005012546D1/de not_active Expired - Lifetime
- 2005-10-21 WO PCT/US2005/038028 patent/WO2006049912A2/en not_active Ceased
- 2005-10-26 TW TW094137531A patent/TWI313703B/zh active
- 2005-10-26 MY MYPI20055046A patent/MY143941A/en unknown
-
2007
- 2007-04-12 IL IL182536A patent/IL182536A/en not_active IP Right Cessation
Also Published As
| Publication number | Publication date |
|---|---|
| EP1829093A2 (de) | 2007-09-05 |
| JP2008517791A (ja) | 2008-05-29 |
| KR101109300B1 (ko) | 2012-01-31 |
| KR20070072617A (ko) | 2007-07-04 |
| CN101044600A (zh) | 2007-09-26 |
| WO2006049912A2 (en) | 2006-05-11 |
| TWI313703B (en) | 2009-08-21 |
| CN102337080B (zh) | 2016-01-20 |
| WO2006049912A3 (en) | 2006-10-26 |
| JP4965451B2 (ja) | 2012-07-04 |
| DE602005012546D1 (de) | 2009-03-12 |
| IL182536A (en) | 2014-06-30 |
| US20060096496A1 (en) | 2006-05-11 |
| US7524347B2 (en) | 2009-04-28 |
| TW200621961A (en) | 2006-07-01 |
| CN102337080A (zh) | 2012-02-01 |
| MY143941A (en) | 2011-07-29 |
| EP1829093B1 (de) | 2009-01-21 |
| IL182536A0 (en) | 2007-09-20 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| RER | Ceased as to paragraph 5 lit. 3 law introducing patent treaties |