TW200705376A - Diamond conditioning of soft chemical mechanical planarization/polishing (CMP) polishing pads - Google Patents
Diamond conditioning of soft chemical mechanical planarization/polishing (CMP) polishing padsInfo
- Publication number
- TW200705376A TW200705376A TW095113436A TW95113436A TW200705376A TW 200705376 A TW200705376 A TW 200705376A TW 095113436 A TW095113436 A TW 095113436A TW 95113436 A TW95113436 A TW 95113436A TW 200705376 A TW200705376 A TW 200705376A
- Authority
- TW
- Taiwan
- Prior art keywords
- polishing
- cmp
- chemical mechanical
- mechanical planarization
- pads
- Prior art date
Links
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B53/00—Devices or means for dressing or conditioning abrasive surfaces
- B24B53/017—Devices or means for dressing, cleaning or otherwise conditioning lapping tools
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/04—Lapping machines or devices; Accessories designed for working plane surfaces
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B53/00—Devices or means for dressing or conditioning abrasive surfaces
- B24B53/007—Cleaning of grinding wheels
Abstract
Conditioning of chemical mechanical planarization (CMP) using conventional diamond-embedded abrasive strips are well suited to condition conventional "hard" polishing but not soft polishing pads because the diamonds not only remove waste material, but they also damage the polishing surface of the pad. Embodiments of the present invention condition soft polishing pads using diamond strips without damaging the soft polishing pad.
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US10/402,578 US20040192178A1 (en) | 2003-03-28 | 2003-03-28 | Diamond conditioning of soft chemical mechanical planarization/polishing (CMP) polishing pads |
Publications (2)
Publication Number | Publication Date |
---|---|
TW200705376A true TW200705376A (en) | 2007-02-01 |
TWI303406B TWI303406B (en) | 2008-11-21 |
Family
ID=32989732
Family Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW092136019A TWI286502B (en) | 2003-03-28 | 2003-12-18 | Diamond conditioning of soft chemical mechanical planarization/polishing (CMP) polishing pads |
TW095113436A TWI303406B (en) | 2003-03-28 | 2003-12-18 | Diamond conditioning of soft chemical mechanical planarization/polishing (cmp) polishing pads |
Family Applications Before (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW092136019A TWI286502B (en) | 2003-03-28 | 2003-12-18 | Diamond conditioning of soft chemical mechanical planarization/polishing (CMP) polishing pads |
Country Status (7)
Country | Link |
---|---|
US (2) | US20040192178A1 (en) |
EP (1) | EP1641596A1 (en) |
KR (1) | KR100818591B1 (en) |
CN (1) | CN1694783A (en) |
AU (1) | AU2003297156A1 (en) |
TW (2) | TWI286502B (en) |
WO (1) | WO2004094106A1 (en) |
Families Citing this family (25)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US9199357B2 (en) | 1997-04-04 | 2015-12-01 | Chien-Min Sung | Brazed diamond tools and methods for making the same |
US9238207B2 (en) | 1997-04-04 | 2016-01-19 | Chien-Min Sung | Brazed diamond tools and methods for making the same |
US9409280B2 (en) | 1997-04-04 | 2016-08-09 | Chien-Min Sung | Brazed diamond tools and methods for making the same |
US9463552B2 (en) | 1997-04-04 | 2016-10-11 | Chien-Min Sung | Superbrasvie tools containing uniformly leveled superabrasive particles and associated methods |
US9221154B2 (en) | 1997-04-04 | 2015-12-29 | Chien-Min Sung | Diamond tools and methods for making the same |
US9868100B2 (en) | 1997-04-04 | 2018-01-16 | Chien-Min Sung | Brazed diamond tools and methods for making the same |
JP2005144298A (en) * | 2003-11-13 | 2005-06-09 | Seiko Epson Corp | Surface washing and modification method and surface washing and modification apparatus |
US7762872B2 (en) | 2004-08-24 | 2010-07-27 | Chien-Min Sung | Superhard cutters and associated methods |
US7658666B2 (en) | 2004-08-24 | 2010-02-09 | Chien-Min Sung | Superhard cutters and associated methods |
US20070060026A1 (en) | 2005-09-09 | 2007-03-15 | Chien-Min Sung | Methods of bonding superabrasive particles in an organic matrix |
US9724802B2 (en) | 2005-05-16 | 2017-08-08 | Chien-Min Sung | CMP pad dressers having leveled tips and associated methods |
US8398466B2 (en) | 2006-11-16 | 2013-03-19 | Chien-Min Sung | CMP pad conditioners with mosaic abrasive segments and associated methods |
US9138862B2 (en) | 2011-05-23 | 2015-09-22 | Chien-Min Sung | CMP pad dresser having leveled tips and associated methods |
US8974270B2 (en) | 2011-05-23 | 2015-03-10 | Chien-Min Sung | CMP pad dresser having leveled tips and associated methods |
US8393934B2 (en) | 2006-11-16 | 2013-03-12 | Chien-Min Sung | CMP pad dressers with hybridized abrasive surface and related methods |
US8678878B2 (en) | 2009-09-29 | 2014-03-25 | Chien-Min Sung | System for evaluating and/or improving performance of a CMP pad dresser |
US20090061743A1 (en) * | 2007-08-29 | 2009-03-05 | Stephen Jew | Method of soft pad preparation to reduce removal rate ramp-up effect and to stabilize defect rate |
TW200929348A (en) * | 2007-11-21 | 2009-07-01 | Jian-Min Sung | Examination method for trimming chemical mechanical polishing pad and related system thereof |
TWI388402B (en) | 2007-12-06 | 2013-03-11 | Methods for orienting superabrasive particles on a surface and associated tools | |
US8758091B2 (en) | 2010-04-06 | 2014-06-24 | Massachusetts Institute Of Technology | Chemical-mechanical polishing pad conditioning system |
WO2012040374A2 (en) | 2010-09-21 | 2012-03-29 | Ritedia Corporation | Superabrasive tools having substantially leveled particle tips and associated methods |
US9238295B2 (en) | 2013-05-31 | 2016-01-19 | Rohm And Haas Electronic Materials Cmp Holdings, Inc. | Soft and conditionable chemical mechanical window polishing pad |
US9233451B2 (en) | 2013-05-31 | 2016-01-12 | Rohm And Haas Electronic Materials Cmp Holdings, Inc. | Soft and conditionable chemical mechanical polishing pad stack |
US9238296B2 (en) | 2013-05-31 | 2016-01-19 | Rohm And Haas Electronic Materials Cmp Holdings, Inc. | Multilayer chemical mechanical polishing pad stack with soft and conditionable polishing layer |
CN113183031A (en) * | 2021-05-20 | 2021-07-30 | 杭州众硅电子科技有限公司 | Dressing head rotating part, polishing pad dressing head and dresser |
Family Cites Families (24)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3863395A (en) * | 1974-02-19 | 1975-02-04 | Shugart Associates Inc | Apparatus for polishing a spherical surface on a magnetic recording transducer |
US4739759A (en) * | 1985-02-26 | 1988-04-26 | Concept, Inc. | Microprocessor controlled electrosurgical generator |
US4927432A (en) * | 1986-03-25 | 1990-05-22 | Rodel, Inc. | Pad material for grinding, lapping and polishing |
US5585147A (en) * | 1994-06-28 | 1996-12-17 | Matsushita Electric Works, Ltd. | Process for a surface treatment of a glass fabric |
US5611943A (en) * | 1995-09-29 | 1997-03-18 | Intel Corporation | Method and apparatus for conditioning of chemical-mechanical polishing pads |
EP0779655A3 (en) * | 1995-12-14 | 1997-07-16 | International Business Machines Corporation | A method of chemically-mechanically polishing an electronic component |
US5990010A (en) * | 1997-04-08 | 1999-11-23 | Lsi Logic Corporation | Pre-conditioning polishing pads for chemical-mechanical polishing |
JP3676030B2 (en) * | 1997-04-10 | 2005-07-27 | 株式会社東芝 | Polishing pad dressing method and semiconductor device manufacturing method |
JP3231659B2 (en) * | 1997-04-28 | 2001-11-26 | 日本電気株式会社 | Automatic polishing equipment |
US5885147A (en) * | 1997-05-12 | 1999-03-23 | Integrated Process Equipment Corp. | Apparatus for conditioning polishing pads |
US6045435A (en) * | 1997-08-04 | 2000-04-04 | Motorola, Inc. | Low selectivity chemical mechanical polishing (CMP) process for use on integrated circuit metal interconnects |
KR19990074921A (en) * | 1998-03-16 | 1999-10-05 | 윤종용 | Polishing Pad Conditioner in Wafer Polishing Equipment |
US6354915B1 (en) * | 1999-01-21 | 2002-03-12 | Rodel Holdings Inc. | Polishing pads and methods relating thereto |
US6273797B1 (en) * | 1999-11-19 | 2001-08-14 | International Business Machines Corporation | In-situ automated CMP wedge conditioner |
US6419553B2 (en) * | 2000-01-04 | 2002-07-16 | Rodel Holdings, Inc. | Methods for break-in and conditioning a fixed abrasive polishing pad |
US6340326B1 (en) * | 2000-01-28 | 2002-01-22 | Lam Research Corporation | System and method for controlled polishing and planarization of semiconductor wafers |
US20010029155A1 (en) * | 2000-01-31 | 2001-10-11 | Applied Materials, Inc. | Multi-step conditioning process |
US6800020B1 (en) * | 2000-10-02 | 2004-10-05 | Lam Research Corporation | Web-style pad conditioning system and methods for implementing the same |
US6514127B2 (en) * | 2000-11-30 | 2003-02-04 | Taiwan Semiconductor Manufacturing Co., Ltd. | Conditioner set for chemical-mechanical polishing station |
US20020100743A1 (en) * | 2000-12-05 | 2002-08-01 | Bonner Benjamin A. | Multi-step polish process to control uniformity when using a selective slurry on patterned wafers |
US6409580B1 (en) * | 2001-03-26 | 2002-06-25 | Speedfam-Ipec Corporation | Rigid polishing pad conditioner for chemical mechanical polishing tool |
TW492065B (en) * | 2001-07-20 | 2002-06-21 | United Microelectronics Corp | Structure of polishing pad conditioner and method of use |
US6852020B2 (en) * | 2003-01-22 | 2005-02-08 | Raytech Innovative Solutions, Inc. | Polishing pad for use in chemical—mechanical planarization of semiconductor wafers and method of making same |
US7037184B2 (en) * | 2003-01-22 | 2006-05-02 | Raytech Innovation Solutions, Llc | Polishing pad for use in chemical-mechanical planarization of semiconductor wafers and method of making same |
-
2003
- 2003-03-28 US US10/402,578 patent/US20040192178A1/en not_active Abandoned
- 2003-12-15 KR KR1020057018192A patent/KR100818591B1/en not_active IP Right Cessation
- 2003-12-15 CN CNA2003801007898A patent/CN1694783A/en active Pending
- 2003-12-15 WO PCT/US2003/039969 patent/WO2004094106A1/en not_active Application Discontinuation
- 2003-12-15 AU AU2003297156A patent/AU2003297156A1/en not_active Abandoned
- 2003-12-15 EP EP03816708A patent/EP1641596A1/en not_active Withdrawn
- 2003-12-18 TW TW092136019A patent/TWI286502B/en not_active IP Right Cessation
- 2003-12-18 TW TW095113436A patent/TWI303406B/en active
-
2006
- 2006-04-12 US US11/402,449 patent/US20060183410A1/en not_active Abandoned
Also Published As
Publication number | Publication date |
---|---|
TWI303406B (en) | 2008-11-21 |
AU2003297156A1 (en) | 2004-11-19 |
EP1641596A1 (en) | 2006-04-05 |
US20040192178A1 (en) | 2004-09-30 |
TW200418612A (en) | 2004-10-01 |
TWI286502B (en) | 2007-09-11 |
CN1694783A (en) | 2005-11-09 |
WO2004094106A1 (en) | 2004-11-04 |
KR20050112113A (en) | 2005-11-29 |
US20060183410A1 (en) | 2006-08-17 |
KR100818591B1 (en) | 2008-04-02 |
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