ATE41077T1 - Mos-schaltung mit bestimmtem verhaeltnis geschwindigkeit/leistung. - Google Patents

Mos-schaltung mit bestimmtem verhaeltnis geschwindigkeit/leistung.

Info

Publication number
ATE41077T1
ATE41077T1 AT82111416T AT82111416T ATE41077T1 AT E41077 T1 ATE41077 T1 AT E41077T1 AT 82111416 T AT82111416 T AT 82111416T AT 82111416 T AT82111416 T AT 82111416T AT E41077 T1 ATE41077 T1 AT E41077T1
Authority
AT
Austria
Prior art keywords
channel
transistor
implant
section
power consumption
Prior art date
Application number
AT82111416T
Other languages
English (en)
Inventor
Douglas Parks Sheppard
Original Assignee
Thomson Components Mostek Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Thomson Components Mostek Corp filed Critical Thomson Components Mostek Corp
Application granted granted Critical
Publication of ATE41077T1 publication Critical patent/ATE41077T1/de

Links

Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D62/00Semiconductor bodies, or regions thereof, of devices having potential barriers
    • H10D62/10Shapes, relative sizes or dispositions of the regions of the semiconductor bodies; Shapes of the semiconductor bodies
    • H10D62/17Semiconductor regions connected to electrodes not carrying current to be rectified, amplified or switched, e.g. channel regions
    • H10D62/213Channel regions of field-effect devices
    • H10D62/221Channel regions of field-effect devices of FETs
    • H10D62/235Channel regions of field-effect devices of FETs of IGFETs
    • H10D62/299Channel regions of field-effect devices of FETs of IGFETs having lateral doping variations
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10BELECTRONIC MEMORY DEVICES
    • H10B20/00Read-only memory [ROM] devices
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D30/00Field-effect transistors [FET]
    • H10D30/60Insulated-gate field-effect transistors [IGFET]
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D84/00Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
    • H10D84/80Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers characterised by the integration of at least one component covered by groups H10D12/00 or H10D30/00, e.g. integration of IGFETs
    • H10D84/82Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers characterised by the integration of at least one component covered by groups H10D12/00 or H10D30/00, e.g. integration of IGFETs of only field-effect components
    • H10D84/83Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers characterised by the integration of at least one component covered by groups H10D12/00 or H10D30/00, e.g. integration of IGFETs of only field-effect components of only insulated-gate FETs [IGFET]
    • H10D84/8311Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers characterised by the integration of at least one component covered by groups H10D12/00 or H10D30/00, e.g. integration of IGFETs of only field-effect components of only insulated-gate FETs [IGFET] the IGFETs characterised by having different channel structures

Landscapes

  • Semiconductor Memories (AREA)
  • Read Only Memory (AREA)
  • Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
  • Amplifiers (AREA)
  • Logic Circuits (AREA)
  • Power Conversion In General (AREA)
  • Insulated Gate Type Field-Effect Transistor (AREA)
AT82111416T 1981-12-28 1982-12-09 Mos-schaltung mit bestimmtem verhaeltnis geschwindigkeit/leistung. ATE41077T1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US33490081A 1981-12-28 1981-12-28
EP82111416A EP0082999B1 (de) 1981-12-28 1982-12-09 MOS-Schaltung mit bestimmtem Verhältnis Geschwindigkeit/Leistung

Publications (1)

Publication Number Publication Date
ATE41077T1 true ATE41077T1 (de) 1989-03-15

Family

ID=23309356

Family Applications (1)

Application Number Title Priority Date Filing Date
AT82111416T ATE41077T1 (de) 1981-12-28 1982-12-09 Mos-schaltung mit bestimmtem verhaeltnis geschwindigkeit/leistung.

Country Status (5)

Country Link
EP (1) EP0082999B1 (de)
JP (2) JPH0638488B2 (de)
AT (1) ATE41077T1 (de)
CA (1) CA1211230A (de)
DE (1) DE3279496D1 (de)

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5629391B2 (de) * 1973-05-23 1981-07-08
JPS5198938A (de) * 1975-02-26 1976-08-31
US3995172A (en) * 1975-06-05 1976-11-30 International Business Machines Corporation Enhancement-and depletion-type field effect transistors connected in parallel
JPS6043693B2 (ja) * 1975-09-23 1985-09-30 株式会社東芝 駆動回路
JPS53130987A (en) * 1977-04-20 1978-11-15 Matsushita Electric Ind Co Ltd Semiconductor device and its manufacture

Also Published As

Publication number Publication date
EP0082999A2 (de) 1983-07-06
EP0082999A3 (en) 1985-04-17
JPH0638488B2 (ja) 1994-05-18
JPH0689987A (ja) 1994-03-29
CA1211230A (en) 1986-09-09
EP0082999B1 (de) 1989-03-01
DE3279496D1 (en) 1989-04-06
JPS58147073A (ja) 1983-09-01

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