ATE357045T1 - Matrixadressierbares array integrierter transistor-/speicherstrukturen - Google Patents
Matrixadressierbares array integrierter transistor-/speicherstrukturenInfo
- Publication number
- ATE357045T1 ATE357045T1 AT02804659T AT02804659T ATE357045T1 AT E357045 T1 ATE357045 T1 AT E357045T1 AT 02804659 T AT02804659 T AT 02804659T AT 02804659 T AT02804659 T AT 02804659T AT E357045 T1 ATE357045 T1 AT E357045T1
- Authority
- AT
- Austria
- Prior art keywords
- electrode
- electrodes
- source
- recess
- transistor
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
- H01L21/77—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D84/00—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
- H10D84/80—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers characterised by the integration of at least one component covered by groups H10D12/00 or H10D30/00, e.g. integration of IGFETs
- H10D84/82—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers characterised by the integration of at least one component covered by groups H10D12/00 or H10D30/00, e.g. integration of IGFETs of only field-effect components
- H10D84/83—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers characterised by the integration of at least one component covered by groups H10D12/00 or H10D30/00, e.g. integration of IGFETs of only field-effect components of only insulated-gate FETs [IGFET]
- H10D84/85—Complementary IGFETs, e.g. CMOS
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D84/00—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
- H10D84/01—Manufacture or treatment
- H10D84/0123—Integrating together multiple components covered by H10D12/00 or H10D30/00, e.g. integrating multiple IGBTs
- H10D84/0126—Integrating together multiple components covered by H10D12/00 or H10D30/00, e.g. integrating multiple IGBTs the components including insulated gates, e.g. IGFETs
- H10D84/0165—Integrating together multiple components covered by H10D12/00 or H10D30/00, e.g. integrating multiple IGBTs the components including insulated gates, e.g. IGFETs the components including complementary IGFETs, e.g. CMOS devices
- H10D84/0167—Manufacturing their channels
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D84/00—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
- H10D84/01—Manufacture or treatment
- H10D84/0123—Integrating together multiple components covered by H10D12/00 or H10D30/00, e.g. integrating multiple IGBTs
- H10D84/0126—Integrating together multiple components covered by H10D12/00 or H10D30/00, e.g. integrating multiple IGBTs the components including insulated gates, e.g. IGFETs
- H10D84/0165—Integrating together multiple components covered by H10D12/00 or H10D30/00, e.g. integrating multiple IGBTs the components including insulated gates, e.g. IGFETs the components including complementary IGFETs, e.g. CMOS devices
- H10D84/0172—Manufacturing their gate conductors
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D84/00—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
- H10D84/01—Manufacture or treatment
- H10D84/02—Manufacture or treatment characterised by using material-based technologies
- H10D84/03—Manufacture or treatment characterised by using material-based technologies using Group IV technology, e.g. silicon technology or silicon-carbide [SiC] technology
- H10D84/038—Manufacture or treatment characterised by using material-based technologies using Group IV technology, e.g. silicon technology or silicon-carbide [SiC] technology using silicon technology, e.g. SiGe
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Physics & Mathematics (AREA)
- Power Engineering (AREA)
- Semiconductor Memories (AREA)
- Non-Volatile Memory (AREA)
- Thin Film Transistor (AREA)
- Dram (AREA)
- Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| NO20016041A NO20016041A (no) | 2001-12-10 | 2001-12-10 | Matriseadresserbar gruppe av integrerte transistor/minnestrukturer |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| ATE357045T1 true ATE357045T1 (de) | 2007-04-15 |
Family
ID=19913138
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| AT02804659T ATE357045T1 (de) | 2001-12-10 | 2002-11-18 | Matrixadressierbares array integrierter transistor-/speicherstrukturen |
Country Status (11)
| Country | Link |
|---|---|
| EP (1) | EP1451825B1 (de) |
| JP (1) | JP2005512338A (de) |
| KR (1) | KR100556089B1 (de) |
| CN (1) | CN1602531A (de) |
| AT (1) | ATE357045T1 (de) |
| AU (1) | AU2002366675A1 (de) |
| CA (1) | CA2466153C (de) |
| DE (1) | DE60218887D1 (de) |
| NO (1) | NO20016041A (de) |
| RU (1) | RU2287205C2 (de) |
| WO (1) | WO2003050814A1 (de) |
Families Citing this family (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US8120082B2 (en) | 2005-09-12 | 2012-02-21 | University of Seoul, Foundation of Industry-Academic Cooperation | Ferroelectric memory device and method for manufacturing the same |
| KR100988227B1 (ko) * | 2005-09-12 | 2010-10-18 | 서울시립대학교 산학협력단 | 강유전체 메모리장치 및 그 제조방법 |
| EP1808863A1 (de) * | 2006-01-16 | 2007-07-18 | Deutsche Thomson-Brandt Gmbh | Verfahren und Vorrichtung zur Aufzeichnung von Hochgeschwindigkeitseingabedaten auf einer Speichergerätematrix |
| KR101245293B1 (ko) * | 2006-01-19 | 2013-03-19 | 서울시립대학교 산학협력단 | 강유전체 메모리의 제조를 위한 강유전 물질 |
| US10163917B2 (en) * | 2016-11-01 | 2018-12-25 | Micron Technology, Inc. | Cell disturb prevention using a leaker device to reduce excess charge from an electronic device |
| CN112908368B (zh) * | 2021-02-04 | 2023-03-21 | 清华大学 | 基于单片三维异质集成的三态内容寻址存储器 |
Family Cites Families (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4952031A (en) * | 1987-06-19 | 1990-08-28 | Victor Company Of Japan, Ltd. | Liquid crystal display device |
| RU2054753C1 (ru) * | 1993-03-19 | 1996-02-20 | Институт физики полупроводников СО РАН | Устройство считывания на приборах с зарядовой связью для двумерных приемников изображения |
| JPH07106450A (ja) * | 1993-10-08 | 1995-04-21 | Olympus Optical Co Ltd | 強誘電体ゲートトランジスタメモリ |
| DE69739045D1 (de) * | 1997-08-27 | 2008-11-27 | St Microelectronics Srl | Herstellungsverfahren für elektronische Speicherbauelemente mit virtueller Masse |
| US6072716A (en) * | 1999-04-14 | 2000-06-06 | Massachusetts Institute Of Technology | Memory structures and methods of making same |
| US6473388B1 (en) * | 2000-08-31 | 2002-10-29 | Hewlett Packard Company | Ultra-high density information storage device based on modulated cathodoconductivity |
-
2001
- 2001-12-10 NO NO20016041A patent/NO20016041A/no unknown
-
2002
- 2002-11-18 JP JP2003551784A patent/JP2005512338A/ja not_active Abandoned
- 2002-11-18 AT AT02804659T patent/ATE357045T1/de not_active IP Right Cessation
- 2002-11-18 CN CNA028245377A patent/CN1602531A/zh active Pending
- 2002-11-18 RU RU2004120776/28A patent/RU2287205C2/ru not_active IP Right Cessation
- 2002-11-18 WO PCT/NO2002/000426 patent/WO2003050814A1/en not_active Ceased
- 2002-11-18 DE DE60218887T patent/DE60218887D1/de not_active Expired - Lifetime
- 2002-11-18 CA CA002466153A patent/CA2466153C/en not_active Expired - Fee Related
- 2002-11-18 AU AU2002366675A patent/AU2002366675A1/en not_active Abandoned
- 2002-11-18 EP EP02804659A patent/EP1451825B1/de not_active Expired - Lifetime
- 2002-11-18 KR KR1020047008856A patent/KR100556089B1/ko not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| WO2003050814A1 (en) | 2003-06-19 |
| EP1451825A1 (de) | 2004-09-01 |
| KR100556089B1 (ko) | 2006-03-03 |
| JP2005512338A (ja) | 2005-04-28 |
| CN1602531A (zh) | 2005-03-30 |
| CA2466153A1 (en) | 2003-06-19 |
| AU2002366675A1 (en) | 2003-06-23 |
| NO20016041D0 (no) | 2001-12-10 |
| CA2466153C (en) | 2007-01-23 |
| KR20040064733A (ko) | 2004-07-19 |
| NO314736B1 (no) | 2003-05-12 |
| EP1451825B1 (de) | 2007-03-14 |
| DE60218887D1 (de) | 2007-04-26 |
| RU2287205C2 (ru) | 2006-11-10 |
| NO20016041A (no) | 2003-05-12 |
| RU2004120776A (ru) | 2005-09-20 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| RER | Ceased as to paragraph 5 lit. 3 law introducing patent treaties |