ATE304178T1 - Abtatsprüfgerät zum testen der kontinuität von unbestückten gedruckten schaltungen - Google Patents

Abtatsprüfgerät zum testen der kontinuität von unbestückten gedruckten schaltungen

Info

Publication number
ATE304178T1
ATE304178T1 AT99250268T AT99250268T ATE304178T1 AT E304178 T1 ATE304178 T1 AT E304178T1 AT 99250268 T AT99250268 T AT 99250268T AT 99250268 T AT99250268 T AT 99250268T AT E304178 T1 ATE304178 T1 AT E304178T1
Authority
AT
Austria
Prior art keywords
test
unit under
testing
continuity
under test
Prior art date
Application number
AT99250268T
Other languages
English (en)
Inventor
Mark A Swart
Original Assignee
Capital Formation Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Capital Formation Inc filed Critical Capital Formation Inc
Application granted granted Critical
Publication of ATE304178T1 publication Critical patent/ATE304178T1/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/302—Contactless testing
    • G01R31/304—Contactless testing of printed or hybrid circuits
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/2805—Bare printed circuit boards

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Monitoring And Testing Of Exchanges (AREA)
  • Tests Of Electronic Circuits (AREA)
AT99250268T 1999-01-22 1999-08-10 Abtatsprüfgerät zum testen der kontinuität von unbestückten gedruckten schaltungen ATE304178T1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US09/236,029 US6191600B1 (en) 1999-01-22 1999-01-22 Scan test apparatus for continuity testing of bare printed circuit boards

Publications (1)

Publication Number Publication Date
ATE304178T1 true ATE304178T1 (de) 2005-09-15

Family

ID=22887831

Family Applications (1)

Application Number Title Priority Date Filing Date
AT99250268T ATE304178T1 (de) 1999-01-22 1999-08-10 Abtatsprüfgerät zum testen der kontinuität von unbestückten gedruckten schaltungen

Country Status (9)

Country Link
US (1) US6191600B1 (de)
EP (1) EP1022572B1 (de)
JP (1) JP3111069B2 (de)
KR (1) KR100345024B1 (de)
CN (1) CN1150405C (de)
AT (1) ATE304178T1 (de)
DE (1) DE69927126T2 (de)
HK (1) HK1028915A1 (de)
TW (1) TW521150B (de)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6788078B2 (en) * 2001-11-16 2004-09-07 Delaware Capital Formation, Inc. Apparatus for scan testing printed circuit boards
EP1724599B1 (de) * 2005-05-20 2007-08-22 Agilent Technologies, Inc. Prüfvorrichtung mit Anpassung des Prüfparameters
DE102009004555A1 (de) 2009-01-14 2010-09-30 Atg Luther & Maelzer Gmbh Verfahren zum Prüfen von Leiterplatten
KR101365996B1 (ko) * 2012-05-15 2014-02-24 서울대학교산학협력단 유연 기판 구조체의 열화특성 평가방법
CN103454570B (zh) * 2012-05-29 2016-05-18 纬创资通股份有限公司 电路布局的短路检测方法与电路布局的短路检测装置
CN106211562A (zh) * 2016-08-30 2016-12-07 苏州良基电子科技有限公司 一种电路板

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3629702A (en) * 1970-03-09 1971-12-21 Hazeltine Corp Automatic tester for a plurality of discrete electrical components supplied in a repetitive predetermined sequence
US4836797A (en) * 1986-12-16 1989-06-06 Sym-Tek Systems, Inc. Electrical device contactor
GB2267970B (en) 1992-06-11 1995-10-04 Northern Telecom Ltd Monitoring the quality of unpopulated printed circuit boards
US5506510A (en) * 1994-05-18 1996-04-09 Genrad, Inc. Adaptive alignment probe fixture for circuit board tester
JP3821171B2 (ja) 1995-11-10 2006-09-13 オー・エイチ・ティー株式会社 検査装置及び検査方法
DE19730516A1 (de) 1997-07-03 1999-01-07 Luther & Maelzer Gmbh Leiterplattenprüfvorrichtung

Also Published As

Publication number Publication date
HK1028915A1 (en) 2001-03-09
DE69927126D1 (de) 2005-10-13
DE69927126T2 (de) 2006-06-22
JP3111069B2 (ja) 2000-11-20
TW521150B (en) 2003-02-21
CN1150405C (zh) 2004-05-19
EP1022572B1 (de) 2005-09-07
CN1262442A (zh) 2000-08-09
KR100345024B1 (ko) 2002-07-24
EP1022572A1 (de) 2000-07-26
KR20000052323A (ko) 2000-08-16
JP2000214207A (ja) 2000-08-04
US6191600B1 (en) 2001-02-20

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Legal Events

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RER Ceased as to paragraph 5 lit. 3 law introducing patent treaties