ATE285078T1 - Vorrichtung und verfahren zur prüfung von unbestückten gedruckten schaltungen - Google Patents

Vorrichtung und verfahren zur prüfung von unbestückten gedruckten schaltungen

Info

Publication number
ATE285078T1
ATE285078T1 AT01978274T AT01978274T ATE285078T1 AT E285078 T1 ATE285078 T1 AT E285078T1 AT 01978274 T AT01978274 T AT 01978274T AT 01978274 T AT01978274 T AT 01978274T AT E285078 T1 ATE285078 T1 AT E285078T1
Authority
AT
Austria
Prior art keywords
signals
preferred embodiments
electrical field
fixed intervals
signal generator
Prior art date
Application number
AT01978274T
Other languages
English (en)
Inventor
Jim Sabey
Original Assignee
Mania Entwicklungsgmbh
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mania Entwicklungsgmbh filed Critical Mania Entwicklungsgmbh
Application granted granted Critical
Publication of ATE285078T1 publication Critical patent/ATE285078T1/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/302—Contactless testing
    • G01R31/312—Contactless testing by capacitive methods
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/2805—Bare printed circuit boards
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
    • G01R31/2887—Features relating to contacting the IC under test, e.g. probe heads; chucks involving moving the probe head or the IC under test; docking stations

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
  • Tests Of Electronic Circuits (AREA)
AT01978274T 2001-08-10 2001-08-10 Vorrichtung und verfahren zur prüfung von unbestückten gedruckten schaltungen ATE285078T1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/EP2001/009293 WO2003014754A1 (en) 2001-08-10 2001-08-10 Apparatus and methods for testing bare circuit boards

Publications (1)

Publication Number Publication Date
ATE285078T1 true ATE285078T1 (de) 2005-01-15

Family

ID=8164541

Family Applications (1)

Application Number Title Priority Date Filing Date
AT01978274T ATE285078T1 (de) 2001-08-10 2001-08-10 Vorrichtung und verfahren zur prüfung von unbestückten gedruckten schaltungen

Country Status (6)

Country Link
EP (1) EP1415166B1 (de)
JP (1) JP2005517153A (de)
CN (1) CN100340864C (de)
AT (1) ATE285078T1 (de)
DE (1) DE60107881T2 (de)
WO (1) WO2003014754A1 (de)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102008030545A1 (de) * 2008-06-27 2010-01-07 Siemens Aktiengesellschaft Vorrichtung und Verfahren zur berührungslosen Ankontaktierung von leitfähigen Strukturen, insbesondere von Dünnschicht-Transistor-Flüssigkristallanzeigen (Thin Film Transistor Liquid Crystal Displays)
TWI468709B (zh) * 2013-01-25 2015-01-11 Hon Tech Inc Electronic components operating device and its application of detection equipment
CN105425094B (zh) * 2015-11-24 2018-04-27 深圳怡化电脑股份有限公司 一种pcba短路点检测方法及装置
GB2545496B (en) * 2015-12-18 2020-06-03 Teraview Ltd A Test System
KR102387464B1 (ko) * 2017-10-12 2022-04-15 삼성전자주식회사 배선 회로 테스트 장치 및 방법과, 그 방법을 포함한 반도체 소자 제조방법
CN109696616A (zh) * 2019-01-30 2019-04-30 大族激光科技产业集团股份有限公司 飞针测试机的测试方法及装置

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3558434B2 (ja) * 1995-11-30 2004-08-25 富士通オートメーション株式会社 電気的配線検査方法及び装置
CA2174784C (en) * 1996-04-23 1999-07-13 George Guozhen Zhong Automatic multi-probe pwb tester
IT1290345B1 (it) * 1997-02-18 1998-10-22 Circuit Line Spa Metodo e dispositivo per la correzione dell'errore di allineamento fra aghi di test e punti di test nella fase di test elettrico di
GB2353399A (en) * 1999-08-20 2001-02-21 3Com Corp Testing printed or integrated circuits

Also Published As

Publication number Publication date
DE60107881D1 (de) 2005-01-20
WO2003014754A1 (en) 2003-02-20
DE60107881T2 (de) 2005-12-22
EP1415166A1 (de) 2004-05-06
CN1543574A (zh) 2004-11-03
EP1415166B1 (de) 2004-12-15
JP2005517153A (ja) 2005-06-09
CN100340864C (zh) 2007-10-03

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Legal Events

Date Code Title Description
RER Ceased as to paragraph 5 lit. 3 law introducing patent treaties