DE60107881D1 - Vorrichtung und verfahren zur prüfung von unbestückten gedruckten schaltungen - Google Patents

Vorrichtung und verfahren zur prüfung von unbestückten gedruckten schaltungen

Info

Publication number
DE60107881D1
DE60107881D1 DE60107881T DE60107881T DE60107881D1 DE 60107881 D1 DE60107881 D1 DE 60107881D1 DE 60107881 T DE60107881 T DE 60107881T DE 60107881 T DE60107881 T DE 60107881T DE 60107881 D1 DE60107881 D1 DE 60107881D1
Authority
DE
Germany
Prior art keywords
signals
preferred embodiments
electrical field
fixed intervals
signal generator
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE60107881T
Other languages
English (en)
Other versions
DE60107881T2 (de
Inventor
Jim Sabey
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
MANIA TECHNOLOGIE BELGIUM N.V., GENT, BE
Original Assignee
MANIA ENTWICKLUNGSGMBH
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by MANIA ENTWICKLUNGSGMBH filed Critical MANIA ENTWICKLUNGSGMBH
Publication of DE60107881D1 publication Critical patent/DE60107881D1/de
Application granted granted Critical
Publication of DE60107881T2 publication Critical patent/DE60107881T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/302—Contactless testing
    • G01R31/312—Contactless testing by capacitive methods
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/2805—Bare printed circuit boards
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
    • G01R31/2887—Features relating to contacting the IC under test, e.g. probe heads; chucks involving moving the probe head or the IC under test; docking stations
DE60107881T 2001-08-10 2001-08-10 Vorrichtung und verfahren zur prüfung von unbestückten gedruckten schaltungen Expired - Fee Related DE60107881T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/EP2001/009293 WO2003014754A1 (en) 2001-08-10 2001-08-10 Apparatus and methods for testing bare circuit boards

Publications (2)

Publication Number Publication Date
DE60107881D1 true DE60107881D1 (de) 2005-01-20
DE60107881T2 DE60107881T2 (de) 2005-12-22

Family

ID=8164541

Family Applications (1)

Application Number Title Priority Date Filing Date
DE60107881T Expired - Fee Related DE60107881T2 (de) 2001-08-10 2001-08-10 Vorrichtung und verfahren zur prüfung von unbestückten gedruckten schaltungen

Country Status (6)

Country Link
EP (1) EP1415166B1 (de)
JP (1) JP2005517153A (de)
CN (1) CN100340864C (de)
AT (1) ATE285078T1 (de)
DE (1) DE60107881T2 (de)
WO (1) WO2003014754A1 (de)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102008030545A1 (de) * 2008-06-27 2010-01-07 Siemens Aktiengesellschaft Vorrichtung und Verfahren zur berührungslosen Ankontaktierung von leitfähigen Strukturen, insbesondere von Dünnschicht-Transistor-Flüssigkristallanzeigen (Thin Film Transistor Liquid Crystal Displays)
TWI468709B (zh) * 2013-01-25 2015-01-11 Hon Tech Inc Electronic components operating device and its application of detection equipment
CN105425094B (zh) * 2015-11-24 2018-04-27 深圳怡化电脑股份有限公司 一种pcba短路点检测方法及装置
GB2545496B (en) 2015-12-18 2020-06-03 Teraview Ltd A Test System
KR102387464B1 (ko) * 2017-10-12 2022-04-15 삼성전자주식회사 배선 회로 테스트 장치 및 방법과, 그 방법을 포함한 반도체 소자 제조방법
CN109696616A (zh) * 2019-01-30 2019-04-30 大族激光科技产业集团股份有限公司 飞针测试机的测试方法及装置

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3558434B2 (ja) * 1995-11-30 2004-08-25 富士通オートメーション株式会社 電気的配線検査方法及び装置
CA2174784C (en) * 1996-04-23 1999-07-13 George Guozhen Zhong Automatic multi-probe pwb tester
IT1290345B1 (it) * 1997-02-18 1998-10-22 Circuit Line Spa Metodo e dispositivo per la correzione dell'errore di allineamento fra aghi di test e punti di test nella fase di test elettrico di
GB2353399A (en) * 1999-08-20 2001-02-21 3Com Corp Testing printed or integrated circuits

Also Published As

Publication number Publication date
CN100340864C (zh) 2007-10-03
JP2005517153A (ja) 2005-06-09
WO2003014754A1 (en) 2003-02-20
EP1415166B1 (de) 2004-12-15
ATE285078T1 (de) 2005-01-15
DE60107881T2 (de) 2005-12-22
EP1415166A1 (de) 2004-05-06
CN1543574A (zh) 2004-11-03

Similar Documents

Publication Publication Date Title
US5517110A (en) Contactless test method and system for testing printed circuit boards
WO2006039395A3 (en) Method for testing semiconductor devices and an apparatus therefor
JPH04309875A (ja) インサーキット試験装置
JPH09264919A (ja) 基板検査方法及び装置
EP0862061B1 (de) Verfahren und Vorrichtung zum Prüfen von Leiterplatten
US6734681B2 (en) Apparatus and methods for testing circuit boards
DE3674000D1 (de) Verfahren und vorrichtung zum elektrischen pruefen von leiterplatten.
DE50108516D1 (de) Verfahren und Vorrichtung zum Prüfen von Leiterplatten
TW200508615A (en) Electronic component test apparatus
JPH04213079A (ja) 任意波形の検査システム
ATE456058T1 (de) Verfahren und vorrichtung zum prüfen von sockeln in der schaltung
DE60107881D1 (de) Vorrichtung und verfahren zur prüfung von unbestückten gedruckten schaltungen
MY122960A (en) Method and apparatus for testing electronic devices
SG129234A1 (en) Adapter method and apparatus for interfacing a tester with a device under test
JP3717241B2 (ja) 基板検査方法及び装置
JPS62269075A (ja) プリント基板検査装置
JP2000346894A (ja) 配線板の検査装置および検査方法
JPH10142271A (ja) 回路基板のパターン静電容量測定方法
JP3271605B2 (ja) プリント基板の半田付け不良検出装置
JP2000346898A (ja) 配線板の検査装置および検査方法
JPS59206776A (ja) プリント配線板の検査装置
JPH0815361A (ja) プリント配線板の検査方法
JPH05347335A (ja) プローブカード
JP2004144759A (ja) 検査装置及び検査方法
JPH08110362A (ja) 微細パターンを含むプリント配線板の導通検査方法

Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8327 Change in the person/name/address of the patent owner

Owner name: MANIA TECHNOLOGIE BELGIUM N.V., GENT, BE

8328 Change in the person/name/address of the agent

Representative=s name: RUSCHKE HARTMANN MADGWICK & SEIDE PATENT- UND RECH

8339 Ceased/non-payment of the annual fee