ATE205303T1 - Manipulator für einen testkopf einer automatischen testanlage - Google Patents

Manipulator für einen testkopf einer automatischen testanlage

Info

Publication number
ATE205303T1
ATE205303T1 AT95938274T AT95938274T ATE205303T1 AT E205303 T1 ATE205303 T1 AT E205303T1 AT 95938274 T AT95938274 T AT 95938274T AT 95938274 T AT95938274 T AT 95938274T AT E205303 T1 ATE205303 T1 AT E205303T1
Authority
AT
Austria
Prior art keywords
test head
manipulator
cable
test
vertical member
Prior art date
Application number
AT95938274T
Other languages
English (en)
Inventor
Alexander H Slocum
Carsten A Hochmuth
David H Levy
Sepehr Kiani
R Ryan Vallance
Original Assignee
Aesop Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Aesop Inc filed Critical Aesop Inc
Application granted granted Critical
Publication of ATE205303T1 publication Critical patent/ATE205303T1/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
    • G01R31/2887—Features relating to contacting the IC under test, e.g. probe heads; chucks involving moving the probe head or the IC under test; docking stations
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T74/00—Machine element or mechanism
    • Y10T74/20—Control lever and linkage systems
    • Y10T74/20207—Multiple controlling elements for single controlled element
    • Y10T74/20305—Robotic arm
    • Y10T74/20311—Robotic arm including power cable or connector
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T74/00—Machine element or mechanism
    • Y10T74/20—Control lever and linkage systems
    • Y10T74/20207—Multiple controlling elements for single controlled element
    • Y10T74/20341—Power elements as controlling elements

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Manipulator (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Numerical Control (AREA)
  • Measuring Leads Or Probes (AREA)
AT95938274T 1995-02-23 1995-10-11 Manipulator für einen testkopf einer automatischen testanlage ATE205303T1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US39264795A 1995-02-23 1995-02-23
PCT/US1995/013438 WO1996026446A1 (en) 1995-02-23 1995-10-11 Manipulator for automatic test equipment test head

Publications (1)

Publication Number Publication Date
ATE205303T1 true ATE205303T1 (de) 2001-09-15

Family

ID=23551455

Family Applications (1)

Application Number Title Priority Date Filing Date
AT95938274T ATE205303T1 (de) 1995-02-23 1995-10-11 Manipulator für einen testkopf einer automatischen testanlage

Country Status (6)

Country Link
US (1) US5931048A (de)
EP (1) EP0811167B1 (de)
JP (2) JP3869465B2 (de)
AT (1) ATE205303T1 (de)
DE (1) DE69522586T2 (de)
WO (1) WO1996026446A1 (de)

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US6828774B2 (en) * 2002-02-27 2004-12-07 Teradyne, Inc. Rear-mounted gimbal for supporting test head
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US6722215B2 (en) 2002-06-18 2004-04-20 Michael Caradonna Manipulator apparatus with low-cost compliance
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US7235964B2 (en) * 2003-03-31 2007-06-26 Intest Corporation Test head positioning system and method
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US8607935B2 (en) 2005-12-20 2013-12-17 Intuitive Surgical Operations, Inc. Guide systems for laminated spring assemblies
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TWI490513B (zh) 2006-12-29 2015-07-01 Intest Corp 用於使負載沿平移軸線平移之負載定位系統以及使負載達到平衡之方法
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US8763962B2 (en) 2007-05-07 2014-07-01 Intest Corporation Cradle and cable handler for a test head manipulator
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JP4514236B2 (ja) * 2008-02-25 2010-07-28 株式会社協同 プローブカード移載装置
JP4480796B1 (ja) * 2009-09-02 2010-06-16 株式会社アドバンテスト 試験装置、試験方法およびプログラム
US8981807B2 (en) * 2010-07-27 2015-03-17 Intest Corporation Positioner system and method of positioning
WO2013009817A1 (en) 2011-07-12 2013-01-17 Intest Corporation Method and apparatus for docking a test head with a peripheral
CN103558421B (zh) * 2013-11-02 2015-12-02 国家电网公司 用于断路器电气试验的接线杆
US10545173B2 (en) * 2013-11-26 2020-01-28 Commscope Connectivity Uk Limited Balunless test fixture
US10094854B2 (en) 2015-10-23 2018-10-09 Teradyne, Inc. Manipulator in automatic test equipment
KR102653657B1 (ko) * 2016-02-12 2024-04-03 (주)테크윙 반도체소자 테스트용 핸들러
KR101640749B1 (ko) * 2016-03-04 2016-07-19 (주)에스엠디에스피 모바일 모듈 및 이를 구비한 컨택 장치
JP7016874B2 (ja) 2016-10-10 2022-02-07 レイド－アッシュマン マニュファクチャリング インコーポレイテッド マニピュレータ
US20180364131A1 (en) * 2017-06-14 2018-12-20 Optofidelity Oy Testing apparatus
US11498207B2 (en) 2021-01-08 2022-11-15 Teradyne, Inc. Test head manipulator configured to address uncontrolled test head rotation

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Also Published As

Publication number Publication date
WO1996026446A1 (en) 1996-08-29
JP3869465B2 (ja) 2007-01-17
JP4589271B2 (ja) 2010-12-01
EP0811167B1 (de) 2001-09-05
EP0811167A1 (de) 1997-12-10
JPH11501722A (ja) 1999-02-09
US5931048A (en) 1999-08-03
DE69522586T2 (de) 2002-07-11
DE69522586D1 (de) 2001-10-11
JP2006322944A (ja) 2006-11-30

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Legal Events

Date Code Title Description
RER Ceased as to paragraph 5 lit. 3 law introducing patent treaties