ATE113225T1 - Überwachung von bondparametern während des bondvorganges. - Google Patents
Überwachung von bondparametern während des bondvorganges.Info
- Publication number
- ATE113225T1 ATE113225T1 AT88100121T AT88100121T ATE113225T1 AT E113225 T1 ATE113225 T1 AT E113225T1 AT 88100121 T AT88100121 T AT 88100121T AT 88100121 T AT88100121 T AT 88100121T AT E113225 T1 ATE113225 T1 AT E113225T1
- Authority
- AT
- Austria
- Prior art keywords
- bonding
- monitoring
- parameters during
- measured
- machines
- Prior art date
Links
- 238000000034 method Methods 0.000 title abstract 5
- 238000012544 monitoring process Methods 0.000 title abstract 3
- 238000002604 ultrasonography Methods 0.000 abstract 2
Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
- H01L24/85—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a wire connector
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K20/00—Non-electric welding by applying impact or other pressure, with or without the application of heat, e.g. cladding or plating
- B23K20/002—Non-electric welding by applying impact or other pressure, with or without the application of heat, e.g. cladding or plating specially adapted for particular articles or work
- B23K20/004—Wire welding
- B23K20/005—Capillary welding
- B23K20/007—Ball bonding
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K20/00—Non-electric welding by applying impact or other pressure, with or without the application of heat, e.g. cladding or plating
- B23K20/10—Non-electric welding by applying impact or other pressure, with or without the application of heat, e.g. cladding or plating making use of vibrations, e.g. ultrasonic welding
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K31/00—Processes relevant to this subclass, specially adapted for particular articles or purposes, but not covered by only one of the preceding main groups
- B23K31/12—Processes relevant to this subclass, specially adapted for particular articles or purposes, but not covered by only one of the preceding main groups relating to investigating the properties, e.g. the weldability, of materials
- B23K31/125—Weld quality monitoring
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
- B29C—SHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
- B29C65/00—Joining or sealing of preformed parts, e.g. welding of plastics materials; Apparatus therefor
- B29C65/02—Joining or sealing of preformed parts, e.g. welding of plastics materials; Apparatus therefor by heating, with or without pressure
- B29C65/08—Joining or sealing of preformed parts, e.g. welding of plastics materials; Apparatus therefor by heating, with or without pressure using ultrasonic vibrations
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
- B29C—SHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
- B29C66/00—General aspects of processes or apparatus for joining preformed parts
- B29C66/90—Measuring or controlling the joining process
- B29C66/92—Measuring or controlling the joining process by measuring or controlling the pressure, the force, the mechanical power or the displacement of the joining tools
- B29C66/922—Measuring or controlling the joining process by measuring or controlling the pressure, the force, the mechanical power or the displacement of the joining tools by measuring the pressure, the force, the mechanical power or the displacement of the joining tools
- B29C66/9221—Measuring or controlling the joining process by measuring or controlling the pressure, the force, the mechanical power or the displacement of the joining tools by measuring the pressure, the force, the mechanical power or the displacement of the joining tools by measuring the pressure, the force or the mechanical power
- B29C66/92211—Measuring or controlling the joining process by measuring or controlling the pressure, the force, the mechanical power or the displacement of the joining tools by measuring the pressure, the force, the mechanical power or the displacement of the joining tools by measuring the pressure, the force or the mechanical power with special measurement means or methods
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
- B29C—SHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
- B29C66/00—General aspects of processes or apparatus for joining preformed parts
- B29C66/90—Measuring or controlling the joining process
- B29C66/95—Measuring or controlling the joining process by measuring or controlling specific variables not covered by groups B29C66/91 - B29C66/94
- B29C66/951—Measuring or controlling the joining process by measuring or controlling specific variables not covered by groups B29C66/91 - B29C66/94 by measuring or controlling the vibration frequency and/or the vibration amplitude of vibrating joining tools, e.g. of ultrasonic welding tools
- B29C66/9515—Measuring or controlling the joining process by measuring or controlling specific variables not covered by groups B29C66/91 - B29C66/94 by measuring or controlling the vibration frequency and/or the vibration amplitude of vibrating joining tools, e.g. of ultrasonic welding tools by measuring their vibration amplitude
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
- B29C—SHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
- B29C66/00—General aspects of processes or apparatus for joining preformed parts
- B29C66/90—Measuring or controlling the joining process
- B29C66/96—Measuring or controlling the joining process characterised by the method for implementing the controlling of the joining process
- B29C66/961—Measuring or controlling the joining process characterised by the method for implementing the controlling of the joining process involving a feedback loop mechanism, e.g. comparison with a desired value
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- B—PERFORMING OPERATIONS; TRANSPORTING
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- B29C66/00—General aspects of processes or apparatus for joining preformed parts
- B29C66/90—Measuring or controlling the joining process
- B29C66/91—Measuring or controlling the joining process by measuring or controlling the temperature, the heat or the thermal flux
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- B—PERFORMING OPERATIONS; TRANSPORTING
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- B29C—SHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
- B29C66/00—General aspects of processes or apparatus for joining preformed parts
- B29C66/90—Measuring or controlling the joining process
- B29C66/94—Measuring or controlling the joining process by measuring or controlling the time
- B29C66/944—Measuring or controlling the joining process by measuring or controlling the time by controlling or regulating the time
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
- B29C—SHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
- B29C66/00—General aspects of processes or apparatus for joining preformed parts
- B29C66/90—Measuring or controlling the joining process
- B29C66/95—Measuring or controlling the joining process by measuring or controlling specific variables not covered by groups B29C66/91 - B29C66/94
- B29C66/951—Measuring or controlling the joining process by measuring or controlling specific variables not covered by groups B29C66/91 - B29C66/94 by measuring or controlling the vibration frequency and/or the vibration amplitude of vibrating joining tools, e.g. of ultrasonic welding tools
- B29C66/9513—Measuring or controlling the joining process by measuring or controlling specific variables not covered by groups B29C66/91 - B29C66/94 by measuring or controlling the vibration frequency and/or the vibration amplitude of vibrating joining tools, e.g. of ultrasonic welding tools characterised by specific vibration frequency values or ranges
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- H01L2224/42—Wire connectors; Manufacturing methods related thereto
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- H01L2224/451—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron (B), silicon (Si), germanium (Ge), arsenic (As), antimony (Sb), tellurium (Te) and polonium (Po), and alloys thereof
- H01L2224/45117—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron (B), silicon (Si), germanium (Ge), arsenic (As), antimony (Sb), tellurium (Te) and polonium (Po), and alloys thereof the principal constituent melting at a temperature of greater than or equal to 400°C and less than 950°C
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- H01L2224/42—Wire connectors; Manufacturing methods related thereto
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- H01L2224/451—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron (B), silicon (Si), germanium (Ge), arsenic (As), antimony (Sb), tellurium (Te) and polonium (Po), and alloys thereof
- H01L2224/45138—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron (B), silicon (Si), germanium (Ge), arsenic (As), antimony (Sb), tellurium (Te) and polonium (Po), and alloys thereof the principal constituent melting at a temperature of greater than or equal to 950°C and less than 1550°C
- H01L2224/45144—Gold (Au) as principal constituent
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- H01L2224/85201—Compression bonding
- H01L2224/85205—Ultrasonic bonding
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- H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L24/42—Wire connectors; Manufacturing methods related thereto
- H01L24/44—Structure, shape, material or disposition of the wire connectors prior to the connecting process
- H01L24/45—Structure, shape, material or disposition of the wire connectors prior to the connecting process of an individual wire connector
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- H01L2924/0001—Technical content checked by a classifier
- H01L2924/00014—Technical content checked by a classifier the subject-matter covered by the group, the symbol of which is combined with the symbol of this group, being disclosed without further technical details
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- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/19—Details of hybrid assemblies other than the semiconductor or other solid state devices to be connected
- H01L2924/1901—Structure
- H01L2924/1904—Component type
- H01L2924/19043—Component type being a resistor
Landscapes
- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Manufacturing & Machinery (AREA)
- Quality & Reliability (AREA)
- Wire Bonding (AREA)
- Measurement Of Mechanical Vibrations Or Ultrasonic Waves (AREA)
- Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
- Die Bonding (AREA)
- Pretreatment Of Seeds And Plants (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE19873701652 DE3701652A1 (de) | 1987-01-21 | 1987-01-21 | Ueberwachung von bondparametern waehrend des bondvorganges |
Publications (1)
Publication Number | Publication Date |
---|---|
ATE113225T1 true ATE113225T1 (de) | 1994-11-15 |
Family
ID=6319221
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
AT88100121T ATE113225T1 (de) | 1987-01-21 | 1988-01-07 | Überwachung von bondparametern während des bondvorganges. |
Country Status (5)
Families Citing this family (62)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH088271B2 (ja) * | 1988-11-01 | 1996-01-29 | 株式会社新川 | ワイヤボンデイング装置 |
JP2708222B2 (ja) * | 1989-03-31 | 1998-02-04 | 株式会社東芝 | ボンディング装置 |
JPH0353137A (ja) * | 1989-07-20 | 1991-03-07 | Yakichi Higo | 応力測定法 |
US5065933A (en) * | 1990-09-19 | 1991-11-19 | At&T Bell Laboratories | Electronic device manipulating apparatus and method |
ATE117611T1 (de) * | 1991-02-15 | 1995-02-15 | Esec Sa | Verfahren und einrichtung zur messung der schwingungsamplitude an einem energietransducer. |
JP2665080B2 (ja) * | 1991-08-02 | 1997-10-22 | 山形日本電気株式会社 | 半導体製造装置 |
JPH0547860A (ja) * | 1991-08-08 | 1993-02-26 | Shinkawa Ltd | ワイヤボンデイング方法 |
JP3128702B2 (ja) * | 1991-09-11 | 2001-01-29 | 株式会社新川 | ボンデイング装置のデータ設定モード変更方法及び装置 |
DE4131565C2 (de) * | 1991-09-18 | 2002-04-25 | Bleich Karl Heinz | Verfahren zur Optimierung des Schweißprozesses bei Bondverfahren |
US5201453A (en) * | 1991-09-30 | 1993-04-13 | Texas Instruments Incorporated | Linear, direct-drive microelectronic bonding apparatus and method |
US5201454A (en) * | 1991-09-30 | 1993-04-13 | Texas Instruments Incorporated | Process for enhanced intermetallic growth in IC interconnections |
US5244140A (en) * | 1991-09-30 | 1993-09-14 | Texas Instruments Incorporated | Ultrasonic bonding process beyond 125 khz |
US5186378A (en) * | 1991-09-30 | 1993-02-16 | Texas Instruments Incorporated | Method and apparatus for transducer heating in low temperature bonding |
DE69216761T2 (de) * | 1991-10-30 | 1997-07-03 | F & K Delvotev Bondtechgmbh | Steuerungssystem |
JP2981948B2 (ja) * | 1992-03-12 | 1999-11-22 | 株式会社新川 | ワイヤクランパ |
US5170929A (en) * | 1992-05-29 | 1992-12-15 | International Business Machines Corporation | Ultrasonic adhesion/dehesion monitoring apparatus with acoustic transducer means |
US5230458A (en) * | 1992-06-23 | 1993-07-27 | National Semiconductor Corp. | Interconnect formation utilizing real-time feedback |
JPH06331678A (ja) * | 1993-05-13 | 1994-12-02 | Internatl Business Mach Corp <Ibm> | 電子部品のリード接続を検査する方法および装置 |
DE4335108C1 (de) * | 1993-10-14 | 1995-01-05 | Schunk Ultraschalltechnik Gmbh | Verfahren und Vorrichtung zum Kompaktieren und anschließenden Schweißen von elektrischen Leitern |
US5578888A (en) * | 1994-12-05 | 1996-11-26 | Kulicke And Soffa Investments, Inc. | Multi resonance unibody ultrasonic transducer |
DE4443716A1 (de) * | 1994-12-09 | 1996-06-13 | Hottinger Messtechnik Baldwin | Kraftmeßvorrichtung zur Messung der Zugspannung von Fäden, Bändern oder dergleichen sowie Federblatt und Verfahren zur Herstellung eines Federblatts |
DE4447073C1 (de) * | 1994-12-29 | 1996-07-18 | Bosch Gmbh Robert | Verfahren zum Prüfen von durch Ultraschalldrahtbonden hergestellten Verbindungen |
US5608172A (en) * | 1995-03-16 | 1997-03-04 | Texas Instruments Incorporated | Die bond touch down detector |
US5868300A (en) * | 1995-06-29 | 1999-02-09 | Orthodyne Electronics Corporation | Articulated wire bonder |
US5607096A (en) * | 1996-03-11 | 1997-03-04 | National Semiconductor Corporation | Apparatus and method for ultrasonic bonding lead frames and bonding wires in semiconductor packaging applications |
EP0857535B1 (en) * | 1997-02-06 | 2003-06-25 | F & K Delvotec Bondtechnik GmbH | Bonding head for a wire bonding machine |
DE19753740C1 (de) * | 1997-12-04 | 1999-07-15 | Herrmann Ultraschalltechnik | Vorrichtung zum Bearbeiten einer Materialbahn |
US20020117012A1 (en) * | 1999-03-29 | 2002-08-29 | Lec Ryszard Marian | Torque measuring piezoelectric device and method |
DE19917372B4 (de) * | 1999-04-16 | 2009-01-02 | Prüftechnik Dieter Busch AG | Meßgerät zum Erfassen der Temperatur und der Schwingungen einer Oberfläche |
US6190497B1 (en) | 1999-04-23 | 2001-02-20 | The Hong Kong Polytechnic University | Ultrasonic transducer |
SG83815A1 (en) * | 1999-09-23 | 2001-10-16 | Esec Trading Sa | Ultrasonic wire bonder with a sensor for the control of the bond force |
WO2004073914A1 (en) * | 1999-11-10 | 2004-09-02 | Asm Technology Singapore Pte Ltd. | Force sensing apparatus |
US6827247B1 (en) * | 1999-12-08 | 2004-12-07 | Asm Technology Singapore Pte Ltd. | Apparatus for detecting the oscillation amplitude of an oscillating object |
US6279810B1 (en) * | 2000-02-23 | 2001-08-28 | Asm Assembly Automation Ltd | Piezoelectric sensor for measuring bonding parameters |
US6286747B1 (en) | 2000-03-24 | 2001-09-11 | Hong Kong Polytechnic University | Ultrasonic transducer |
DE10016998C1 (de) * | 2000-04-05 | 2001-09-13 | Siemens Ag | Bestückvorrichtung mit einer Einrichtung zum Messen der Aufsetzkraft |
JP2002368036A (ja) * | 2001-06-11 | 2002-12-20 | Nec Kyushu Ltd | ワイアボンディング装置 |
US6644533B2 (en) | 2001-07-03 | 2003-11-11 | Asm Technology Singapore Pte. Ltd. | Force sensing apparatus |
DE50110953D1 (de) * | 2001-11-07 | 2006-10-19 | F & K Delvotec Bondtech Gmbh | Prüfverfahren für Bondverbindungen und Drahtbonder |
DE10160228A1 (de) * | 2001-12-07 | 2003-06-18 | Hesse & Knipps Gmbh | Kreuztransducer |
KR20030066344A (ko) * | 2002-02-01 | 2003-08-09 | 에섹 트레이딩 에스에이 | 와이어본더로 접합시에 최적의 접합 파라미터들을결정하기 위한 방법 |
JP2004047944A (ja) * | 2002-05-22 | 2004-02-12 | Nec Corp | 接合装置および接合の良否判別方法を有する接合方法 |
EP1447204A1 (de) * | 2003-02-12 | 2004-08-18 | Telsonic Holding AG | Vorrichtung und Verfahren zum Bearbeiten von Bauteilen |
DE10314499B4 (de) * | 2003-03-27 | 2005-03-10 | Angewandte Physik Mbh Ges | Vorrichtung zum Drahtbonden |
DE102004026826B4 (de) * | 2004-05-28 | 2010-01-14 | Schunk Ultraschalltechnik Gmbh | Ultraschallschweißvorrichtung und Konverter einer Ultraschallschweißvorrichtung |
DE102004045575A1 (de) | 2004-09-17 | 2006-04-06 | Hesse & Knipps Gmbh | Ultraschalltransducer mit einem in der Lagerung angeordneten Sensor |
DE102005044048B4 (de) | 2004-09-30 | 2007-05-03 | Unaxis International Trading Ltd. | Wire Bonder |
US7958790B2 (en) * | 2005-09-29 | 2011-06-14 | Cornell Research Foundation, Inc. | Biaxial load cell with highly anisotropic force resolutions |
US7819013B2 (en) * | 2006-07-05 | 2010-10-26 | The Hong Kong Polytechnic University | Method and apparatus for measuring oscillation amplitude of an ultrasonic device |
JP4679454B2 (ja) * | 2006-07-13 | 2011-04-27 | 株式会社新川 | ワイヤボンディング装置 |
DE602006015192D1 (de) | 2006-09-05 | 2010-08-12 | Fraunhofer Ges Forschung | Verfahren und Vorrichtung zur Regelung der Herstellung von Drahtbondverbindungen |
DE102006049624B4 (de) * | 2006-10-20 | 2016-07-14 | Hesse Gmbh | Ultraschallbonder |
US7698926B2 (en) * | 2007-04-26 | 2010-04-20 | Honeywell International Inc. | Electrical connection of energy harvesting devices |
DE102007054626A1 (de) * | 2007-11-12 | 2009-05-14 | Hesse & Knipps Gmbh | Verfahren und Vorrichtung zum Ultraschallbonden |
CH700729B1 (de) * | 2008-02-29 | 2010-10-15 | Oerlikon Assembly Equipment Ag | Wire Bonder. |
KR100996264B1 (ko) * | 2008-04-25 | 2010-11-23 | 에스티에스반도체통신 주식회사 | 광폭 리드 프레임을 위한 반도체 패키지 제조 장치 및 이를이용한 반도체 패키지 제조 방법 |
KR100967526B1 (ko) * | 2008-04-25 | 2010-07-05 | 에스티에스반도체통신 주식회사 | 광폭 리드 프레임을 위한 반도체 패키지 제조 장치 및 이를이용한 반도체 패키지 제조 방법 |
US8056792B2 (en) * | 2009-05-05 | 2011-11-15 | Branson Ultrasonics Corporation | Scalloped horn |
IL247408B (en) | 2016-08-21 | 2018-03-29 | Elbit Systems Ltd | A system and method for identifying weaknesses in the adhesion between structural elements |
DE102017101736A1 (de) | 2017-01-30 | 2018-08-02 | F&K Delvotec Bondtechnik Gmbh | Verfahren zur Herstellung von Drahtbondverbindungen und Anordnung zur Durchführung des Verfahrens |
JP2023548578A (ja) * | 2020-11-05 | 2023-11-17 | クリック アンド ソッファ インダストリーズ、インク. | ワイヤボンディング装置におけるボンディング力の精度を監視する方法を含む、ワイヤボンディング装置を動作させる方法、および関連する方法 |
EP4001913A1 (en) | 2020-11-17 | 2022-05-25 | Mobile Locker NV | Storage device with integrated substance detection system |
Family Cites Families (15)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3453540A (en) * | 1965-12-23 | 1969-07-01 | Rca Corp | Circuit that analyzes transient signals in both the time and frequency domains |
JPS4732900Y1 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) * | 1970-05-16 | 1972-10-04 | ||
US3827619A (en) * | 1973-01-19 | 1974-08-06 | Us Navy | Ultrasonic bond monitor |
US3794236A (en) * | 1973-05-07 | 1974-02-26 | Raytheon Co | Monitoring and control means for evaluating the performance of vibratory-type devices |
GB1506164A (en) * | 1974-07-09 | 1978-04-05 | Mullard Ltd | Ultrasonic bonding apparatus |
SU677852A1 (ru) * | 1977-07-05 | 1979-08-05 | Предприятие П/Я Р-6495 | Устройство дл контрол качества соединений при ультразвуковой микросварке |
JPS5824438Y2 (ja) * | 1978-09-20 | 1983-05-25 | 日本電気株式会社 | ワイヤボンダ |
DE2901253A1 (de) * | 1979-01-13 | 1980-07-24 | Dieter Spahn | Elektronisches system-pruefgeraet fuer die kontaktlose messung von mechanischen schwingungen im infra- und ultraschallbereich |
DE2937538A1 (de) * | 1979-09-17 | 1981-03-19 | Siemens AG, 1000 Berlin und 8000 München | Verfahren zur steuerung von ultraschall-schweissvorgaengen |
JPS57166042A (en) * | 1981-04-06 | 1982-10-13 | Toshiba Corp | Ultrasonic bonding device |
US4373653A (en) * | 1981-09-10 | 1983-02-15 | Raytheon Company | Method and apparatus for ultrasonic bonding |
JPS5950536A (ja) * | 1982-09-16 | 1984-03-23 | Toshiba Corp | ワイヤボンデイング装置 |
DD219338A1 (de) * | 1983-11-15 | 1985-02-27 | Fz Elektronik Teltow Veb | Verfahren zum ultraschallschweissen |
US4603802A (en) * | 1984-02-27 | 1986-08-05 | Fairchild Camera & Instrument Corporation | Variation and control of bond force |
DE3435511A1 (de) * | 1984-09-27 | 1986-04-03 | Bayerische Motoren Werke AG, 8000 München | Elektrode |
-
1987
- 1987-01-21 DE DE19873701652 patent/DE3701652A1/de active Granted
- 1987-12-31 US US07/140,122 patent/US4854494A/en not_active Expired - Fee Related
-
1988
- 1988-01-07 EP EP88100121A patent/EP0275877B1/de not_active Expired - Lifetime
- 1988-01-07 DE DE3851900T patent/DE3851900D1/de not_active Expired - Fee Related
- 1988-01-07 AT AT88100121T patent/ATE113225T1/de not_active IP Right Cessation
- 1988-01-14 JP JP63007388A patent/JPS63191927A/ja active Granted
Also Published As
Publication number | Publication date |
---|---|
DE3851900D1 (de) | 1994-12-01 |
EP0275877A2 (de) | 1988-07-27 |
JPS63191927A (ja) | 1988-08-09 |
DE3701652C2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) | 1992-06-17 |
JPH0552064B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) | 1993-08-04 |
EP0275877B1 (de) | 1994-10-26 |
US4854494A (en) | 1989-08-08 |
EP0275877A3 (de) | 1991-03-06 |
DE3701652A1 (de) | 1988-08-04 |
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