DE3701652A1 - Ueberwachung von bondparametern waehrend des bondvorganges - Google Patents
Ueberwachung von bondparametern waehrend des bondvorgangesInfo
- Publication number
- DE3701652A1 DE3701652A1 DE19873701652 DE3701652A DE3701652A1 DE 3701652 A1 DE3701652 A1 DE 3701652A1 DE 19873701652 DE19873701652 DE 19873701652 DE 3701652 A DE3701652 A DE 3701652A DE 3701652 A1 DE3701652 A1 DE 3701652A1
- Authority
- DE
- Germany
- Prior art keywords
- bonding
- amplitude
- arm
- monitoring
- ultrasound
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000000034 method Methods 0.000 title claims abstract description 13
- 238000012544 monitoring process Methods 0.000 title claims abstract description 12
- 238000002604 ultrasonography Methods 0.000 claims abstract description 15
- 238000011156 evaluation Methods 0.000 claims description 9
- 238000003801 milling Methods 0.000 claims description 6
- 238000005259 measurement Methods 0.000 claims description 4
- 230000003321 amplification Effects 0.000 claims 1
- 238000003199 nucleic acid amplification method Methods 0.000 claims 1
- 108090000623 proteins and genes Proteins 0.000 claims 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 2
- 229910052782 aluminium Inorganic materials 0.000 description 2
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 2
- 229910052737 gold Inorganic materials 0.000 description 2
- 239000010931 gold Substances 0.000 description 2
- 238000005452 bending Methods 0.000 description 1
- 238000011157 data evaluation Methods 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 230000018109 developmental process Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 230000003993 interaction Effects 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
- H01L24/85—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a wire connector
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K20/00—Non-electric welding by applying impact or other pressure, with or without the application of heat, e.g. cladding or plating
- B23K20/002—Non-electric welding by applying impact or other pressure, with or without the application of heat, e.g. cladding or plating specially adapted for particular articles or work
- B23K20/004—Wire welding
- B23K20/005—Capillary welding
- B23K20/007—Ball bonding
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K20/00—Non-electric welding by applying impact or other pressure, with or without the application of heat, e.g. cladding or plating
- B23K20/10—Non-electric welding by applying impact or other pressure, with or without the application of heat, e.g. cladding or plating making use of vibrations, e.g. ultrasonic welding
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K31/00—Processes relevant to this subclass, specially adapted for particular articles or purposes, but not covered by only one of the preceding main groups
- B23K31/12—Processes relevant to this subclass, specially adapted for particular articles or purposes, but not covered by only one of the preceding main groups relating to investigating the properties, e.g. the weldability, of materials
- B23K31/125—Weld quality monitoring
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
- B29C—SHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
- B29C65/00—Joining or sealing of preformed parts, e.g. welding of plastics materials; Apparatus therefor
- B29C65/02—Joining or sealing of preformed parts, e.g. welding of plastics materials; Apparatus therefor by heating, with or without pressure
- B29C65/08—Joining or sealing of preformed parts, e.g. welding of plastics materials; Apparatus therefor by heating, with or without pressure using ultrasonic vibrations
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
- B29C—SHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
- B29C66/00—General aspects of processes or apparatus for joining preformed parts
- B29C66/90—Measuring or controlling the joining process
- B29C66/92—Measuring or controlling the joining process by measuring or controlling the pressure, the force, the mechanical power or the displacement of the joining tools
- B29C66/922—Measuring or controlling the joining process by measuring or controlling the pressure, the force, the mechanical power or the displacement of the joining tools by measuring the pressure, the force, the mechanical power or the displacement of the joining tools
- B29C66/9221—Measuring or controlling the joining process by measuring or controlling the pressure, the force, the mechanical power or the displacement of the joining tools by measuring the pressure, the force, the mechanical power or the displacement of the joining tools by measuring the pressure, the force or the mechanical power
- B29C66/92211—Measuring or controlling the joining process by measuring or controlling the pressure, the force, the mechanical power or the displacement of the joining tools by measuring the pressure, the force, the mechanical power or the displacement of the joining tools by measuring the pressure, the force or the mechanical power with special measurement means or methods
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
- B29C—SHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
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- B29C66/90—Measuring or controlling the joining process
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- B29C66/9515—Measuring or controlling the joining process by measuring or controlling specific variables not covered by groups B29C66/91 - B29C66/94 by measuring or controlling the vibration frequency and/or the vibration amplitude of vibrating joining tools, e.g. of ultrasonic welding tools by measuring their vibration amplitude
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- B—PERFORMING OPERATIONS; TRANSPORTING
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- B29C—SHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
- B29C66/00—General aspects of processes or apparatus for joining preformed parts
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- B29C66/96—Measuring or controlling the joining process characterised by the method for implementing the controlling of the joining process
- B29C66/961—Measuring or controlling the joining process characterised by the method for implementing the controlling of the joining process involving a feedback loop mechanism, e.g. comparison with a desired value
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- B29C66/9513—Measuring or controlling the joining process by measuring or controlling specific variables not covered by groups B29C66/91 - B29C66/94 by measuring or controlling the vibration frequency and/or the vibration amplitude of vibrating joining tools, e.g. of ultrasonic welding tools characterised by specific vibration frequency values or ranges
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- H01L2224/45138—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron (B), silicon (Si), germanium (Ge), arsenic (As), antimony (Sb), tellurium (Te) and polonium (Po), and alloys thereof the principal constituent melting at a temperature of greater than or equal to 950°C and less than 1550°C
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Landscapes
- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Quality & Reliability (AREA)
- Manufacturing & Machinery (AREA)
- Wire Bonding (AREA)
- Measurement Of Mechanical Vibrations Or Ultrasonic Waves (AREA)
- Pretreatment Of Seeds And Plants (AREA)
- Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
- Die Bonding (AREA)
Priority Applications (6)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE19873701652 DE3701652A1 (de) | 1987-01-21 | 1987-01-21 | Ueberwachung von bondparametern waehrend des bondvorganges |
US07/140,122 US4854494A (en) | 1987-01-21 | 1987-12-31 | Monitoring bond parameters during the bonding process |
DE3851900T DE3851900D1 (de) | 1987-01-21 | 1988-01-07 | Überwachung von Bondparametern während des Bondvorganges. |
EP88100121A EP0275877B1 (de) | 1987-01-21 | 1988-01-07 | Überwachung von Bondparametern während des Bondvorganges |
AT88100121T ATE113225T1 (de) | 1987-01-21 | 1988-01-07 | Überwachung von bondparametern während des bondvorganges. |
JP63007388A JPS63191927A (ja) | 1987-01-21 | 1988-01-14 | ボンデイング工程中のボンデイングパラメータ監視装置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE19873701652 DE3701652A1 (de) | 1987-01-21 | 1987-01-21 | Ueberwachung von bondparametern waehrend des bondvorganges |
Publications (2)
Publication Number | Publication Date |
---|---|
DE3701652A1 true DE3701652A1 (de) | 1988-08-04 |
DE3701652C2 DE3701652C2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) | 1992-06-17 |
Family
ID=6319221
Family Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE19873701652 Granted DE3701652A1 (de) | 1987-01-21 | 1987-01-21 | Ueberwachung von bondparametern waehrend des bondvorganges |
DE3851900T Expired - Fee Related DE3851900D1 (de) | 1987-01-21 | 1988-01-07 | Überwachung von Bondparametern während des Bondvorganges. |
Family Applications After (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE3851900T Expired - Fee Related DE3851900D1 (de) | 1987-01-21 | 1988-01-07 | Überwachung von Bondparametern während des Bondvorganges. |
Country Status (5)
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE4443716A1 (de) * | 1994-12-09 | 1996-06-13 | Hottinger Messtechnik Baldwin | Kraftmeßvorrichtung zur Messung der Zugspannung von Fäden, Bändern oder dergleichen sowie Federblatt und Verfahren zur Herstellung eines Federblatts |
DE4447073C1 (de) * | 1994-12-29 | 1996-07-18 | Bosch Gmbh Robert | Verfahren zum Prüfen von durch Ultraschalldrahtbonden hergestellten Verbindungen |
WO2001078482A1 (de) * | 2000-04-05 | 2001-10-18 | Siemens Production And Logistics Systems Ag | Bestückvorrichtung mit einer einrichtung zum messen der aufsetzkraft |
DE19709912B4 (de) * | 1996-03-11 | 2004-04-08 | National Semiconductor Corp.(N.D.Ges.D.Staates Delaware), Santa Clara | Ultraschallbondvorrichtung |
WO2005116593A1 (de) * | 2004-05-28 | 2005-12-08 | Schunk Ultraschalltechnik Gmbh | Verfahren zum messen und/oder regeln der schwingungsamplitude eines ultraschallschwingers sowie ultraschallschweissvorrichtung |
US8020746B2 (en) | 2006-09-05 | 2011-09-20 | Technische Universitaet Berlin | Method and device for controlling the generation of ultrasonic wire bonds |
Families Citing this family (56)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH088271B2 (ja) * | 1988-11-01 | 1996-01-29 | 株式会社新川 | ワイヤボンデイング装置 |
JP2708222B2 (ja) * | 1989-03-31 | 1998-02-04 | 株式会社東芝 | ボンディング装置 |
JPH0353137A (ja) * | 1989-07-20 | 1991-03-07 | Yakichi Higo | 応力測定法 |
US5065933A (en) * | 1990-09-19 | 1991-11-19 | At&T Bell Laboratories | Electronic device manipulating apparatus and method |
DE59104416D1 (de) * | 1991-02-15 | 1995-03-09 | Esec Sa | Verfahren und Einrichtung zur Messung der Schwingungsamplitude an einem Energietransducer. |
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JPH0547860A (ja) * | 1991-08-08 | 1993-02-26 | Shinkawa Ltd | ワイヤボンデイング方法 |
JP3128702B2 (ja) * | 1991-09-11 | 2001-01-29 | 株式会社新川 | ボンデイング装置のデータ設定モード変更方法及び装置 |
DE4131565C2 (de) * | 1991-09-18 | 2002-04-25 | Bleich Karl Heinz | Verfahren zur Optimierung des Schweißprozesses bei Bondverfahren |
US5201453A (en) * | 1991-09-30 | 1993-04-13 | Texas Instruments Incorporated | Linear, direct-drive microelectronic bonding apparatus and method |
US5186378A (en) * | 1991-09-30 | 1993-02-16 | Texas Instruments Incorporated | Method and apparatus for transducer heating in low temperature bonding |
US5201454A (en) * | 1991-09-30 | 1993-04-13 | Texas Instruments Incorporated | Process for enhanced intermetallic growth in IC interconnections |
US5244140A (en) * | 1991-09-30 | 1993-09-14 | Texas Instruments Incorporated | Ultrasonic bonding process beyond 125 khz |
ATE147672T1 (de) * | 1991-10-30 | 1997-02-15 | F&K Delvotec Bondtechnik Gmbh | Steuerungssystem |
JP2981948B2 (ja) * | 1992-03-12 | 1999-11-22 | 株式会社新川 | ワイヤクランパ |
US5170929A (en) * | 1992-05-29 | 1992-12-15 | International Business Machines Corporation | Ultrasonic adhesion/dehesion monitoring apparatus with acoustic transducer means |
US5230458A (en) * | 1992-06-23 | 1993-07-27 | National Semiconductor Corp. | Interconnect formation utilizing real-time feedback |
JPH06331678A (ja) * | 1993-05-13 | 1994-12-02 | Internatl Business Mach Corp <Ibm> | 電子部品のリード接続を検査する方法および装置 |
DE4335108C1 (de) * | 1993-10-14 | 1995-01-05 | Schunk Ultraschalltechnik Gmbh | Verfahren und Vorrichtung zum Kompaktieren und anschließenden Schweißen von elektrischen Leitern |
US5578888A (en) * | 1994-12-05 | 1996-11-26 | Kulicke And Soffa Investments, Inc. | Multi resonance unibody ultrasonic transducer |
US5608172A (en) * | 1995-03-16 | 1997-03-04 | Texas Instruments Incorporated | Die bond touch down detector |
US5868300A (en) * | 1995-06-29 | 1999-02-09 | Orthodyne Electronics Corporation | Articulated wire bonder |
EP0857535B1 (en) * | 1997-02-06 | 2003-06-25 | F & K Delvotec Bondtechnik GmbH | Bonding head for a wire bonding machine |
DE19753740C1 (de) | 1997-12-04 | 1999-07-15 | Herrmann Ultraschalltechnik | Vorrichtung zum Bearbeiten einer Materialbahn |
US20020117012A1 (en) * | 1999-03-29 | 2002-08-29 | Lec Ryszard Marian | Torque measuring piezoelectric device and method |
DE19917372B4 (de) * | 1999-04-16 | 2009-01-02 | Prüftechnik Dieter Busch AG | Meßgerät zum Erfassen der Temperatur und der Schwingungen einer Oberfläche |
US6190497B1 (en) | 1999-04-23 | 2001-02-20 | The Hong Kong Polytechnic University | Ultrasonic transducer |
SG83815A1 (en) * | 1999-09-23 | 2001-10-16 | Esec Trading Sa | Ultrasonic wire bonder with a sensor for the control of the bond force |
WO2004073914A1 (en) * | 1999-11-10 | 2004-09-02 | Asm Technology Singapore Pte Ltd. | Force sensing apparatus |
US6827247B1 (en) * | 1999-12-08 | 2004-12-07 | Asm Technology Singapore Pte Ltd. | Apparatus for detecting the oscillation amplitude of an oscillating object |
US6279810B1 (en) * | 2000-02-23 | 2001-08-28 | Asm Assembly Automation Ltd | Piezoelectric sensor for measuring bonding parameters |
US6286747B1 (en) | 2000-03-24 | 2001-09-11 | Hong Kong Polytechnic University | Ultrasonic transducer |
JP2002368036A (ja) * | 2001-06-11 | 2002-12-20 | Nec Kyushu Ltd | ワイアボンディング装置 |
US6644533B2 (en) | 2001-07-03 | 2003-11-11 | Asm Technology Singapore Pte. Ltd. | Force sensing apparatus |
EP1310319B1 (de) | 2001-11-07 | 2006-09-06 | F & K Delvotec Bondtechnik GmbH | Prüfverfahren für Bondverbindungen und Drahtbonder |
DE10160228A1 (de) * | 2001-12-07 | 2003-06-18 | Hesse & Knipps Gmbh | Kreuztransducer |
KR20030066344A (ko) * | 2002-02-01 | 2003-08-09 | 에섹 트레이딩 에스에이 | 와이어본더로 접합시에 최적의 접합 파라미터들을결정하기 위한 방법 |
JP2004047944A (ja) * | 2002-05-22 | 2004-02-12 | Nec Corp | 接合装置および接合の良否判別方法を有する接合方法 |
EP1447204A1 (de) * | 2003-02-12 | 2004-08-18 | Telsonic Holding AG | Vorrichtung und Verfahren zum Bearbeiten von Bauteilen |
DE10314499B4 (de) * | 2003-03-27 | 2005-03-10 | Angewandte Physik Mbh Ges | Vorrichtung zum Drahtbonden |
DE102004045575A1 (de) | 2004-09-17 | 2006-04-06 | Hesse & Knipps Gmbh | Ultraschalltransducer mit einem in der Lagerung angeordneten Sensor |
DE102005044048B4 (de) | 2004-09-30 | 2007-05-03 | Unaxis International Trading Ltd. | Wire Bonder |
US7958790B2 (en) * | 2005-09-29 | 2011-06-14 | Cornell Research Foundation, Inc. | Biaxial load cell with highly anisotropic force resolutions |
US7819013B2 (en) * | 2006-07-05 | 2010-10-26 | The Hong Kong Polytechnic University | Method and apparatus for measuring oscillation amplitude of an ultrasonic device |
JP4679454B2 (ja) * | 2006-07-13 | 2011-04-27 | 株式会社新川 | ワイヤボンディング装置 |
DE102006049624B4 (de) * | 2006-10-20 | 2016-07-14 | Hesse Gmbh | Ultraschallbonder |
US7698926B2 (en) * | 2007-04-26 | 2010-04-20 | Honeywell International Inc. | Electrical connection of energy harvesting devices |
DE102007054626A1 (de) * | 2007-11-12 | 2009-05-14 | Hesse & Knipps Gmbh | Verfahren und Vorrichtung zum Ultraschallbonden |
CH700729B1 (de) * | 2008-02-29 | 2010-10-15 | Oerlikon Assembly Equipment Ag | Wire Bonder. |
KR100967526B1 (ko) * | 2008-04-25 | 2010-07-05 | 에스티에스반도체통신 주식회사 | 광폭 리드 프레임을 위한 반도체 패키지 제조 장치 및 이를이용한 반도체 패키지 제조 방법 |
KR100996264B1 (ko) * | 2008-04-25 | 2010-11-23 | 에스티에스반도체통신 주식회사 | 광폭 리드 프레임을 위한 반도체 패키지 제조 장치 및 이를이용한 반도체 패키지 제조 방법 |
US8056792B2 (en) * | 2009-05-05 | 2011-11-15 | Branson Ultrasonics Corporation | Scalloped horn |
IL247408B (en) | 2016-08-21 | 2018-03-29 | Elbit Systems Ltd | A system and method for identifying weaknesses in the adhesion between structural elements |
DE102017101736A1 (de) | 2017-01-30 | 2018-08-02 | F&K Delvotec Bondtechnik Gmbh | Verfahren zur Herstellung von Drahtbondverbindungen und Anordnung zur Durchführung des Verfahrens |
CN116420221A (zh) * | 2020-11-05 | 2023-07-11 | 库利克和索夫工业公司 | 操作焊线机的方法,包括监测焊线机上焊接力精度的方法及相关方法 |
EP4001913A1 (en) | 2020-11-17 | 2022-05-25 | Mobile Locker NV | Storage device with integrated substance detection system |
Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3453540A (en) * | 1965-12-23 | 1969-07-01 | Rca Corp | Circuit that analyzes transient signals in both the time and frequency domains |
US3827619A (en) * | 1973-01-19 | 1974-08-06 | Us Navy | Ultrasonic bond monitor |
DE3233629A1 (de) * | 1981-09-10 | 1983-03-17 | Raytheon Co., 02173 Lexington, Mass. | Verfahren und einrichtung zur herstellung von verbindungen mittels ultraschall |
DE3333601A1 (de) * | 1982-09-16 | 1984-03-22 | Tokyo Shibaura Denki K.K., Kawasaki, Kanagawa | Drahtanschluss- bzw. verdrahtungsvorrichtung |
DD219338A1 (de) * | 1983-11-15 | 1985-02-27 | Fz Elektronik Teltow Veb | Verfahren zum ultraschallschweissen |
DE3435511A1 (de) * | 1984-09-27 | 1986-04-03 | Bayerische Motoren Werke AG, 8000 München | Elektrode |
Family Cites Families (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS4732900Y1 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) * | 1970-05-16 | 1972-10-04 | ||
US3794236A (en) * | 1973-05-07 | 1974-02-26 | Raytheon Co | Monitoring and control means for evaluating the performance of vibratory-type devices |
GB1506164A (en) * | 1974-07-09 | 1978-04-05 | Mullard Ltd | Ultrasonic bonding apparatus |
SU677852A1 (ru) * | 1977-07-05 | 1979-08-05 | Предприятие П/Я Р-6495 | Устройство дл контрол качества соединений при ультразвуковой микросварке |
JPS5824438Y2 (ja) * | 1978-09-20 | 1983-05-25 | 日本電気株式会社 | ワイヤボンダ |
DE2901253A1 (de) * | 1979-01-13 | 1980-07-24 | Dieter Spahn | Elektronisches system-pruefgeraet fuer die kontaktlose messung von mechanischen schwingungen im infra- und ultraschallbereich |
DE2937538A1 (de) * | 1979-09-17 | 1981-03-19 | Siemens AG, 1000 Berlin und 8000 München | Verfahren zur steuerung von ultraschall-schweissvorgaengen |
JPS57166042A (en) * | 1981-04-06 | 1982-10-13 | Toshiba Corp | Ultrasonic bonding device |
US4603802A (en) * | 1984-02-27 | 1986-08-05 | Fairchild Camera & Instrument Corporation | Variation and control of bond force |
-
1987
- 1987-01-21 DE DE19873701652 patent/DE3701652A1/de active Granted
- 1987-12-31 US US07/140,122 patent/US4854494A/en not_active Expired - Fee Related
-
1988
- 1988-01-07 AT AT88100121T patent/ATE113225T1/de not_active IP Right Cessation
- 1988-01-07 DE DE3851900T patent/DE3851900D1/de not_active Expired - Fee Related
- 1988-01-07 EP EP88100121A patent/EP0275877B1/de not_active Expired - Lifetime
- 1988-01-14 JP JP63007388A patent/JPS63191927A/ja active Granted
Patent Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3453540A (en) * | 1965-12-23 | 1969-07-01 | Rca Corp | Circuit that analyzes transient signals in both the time and frequency domains |
US3827619A (en) * | 1973-01-19 | 1974-08-06 | Us Navy | Ultrasonic bond monitor |
DE3233629A1 (de) * | 1981-09-10 | 1983-03-17 | Raytheon Co., 02173 Lexington, Mass. | Verfahren und einrichtung zur herstellung von verbindungen mittels ultraschall |
DE3333601A1 (de) * | 1982-09-16 | 1984-03-22 | Tokyo Shibaura Denki K.K., Kawasaki, Kanagawa | Drahtanschluss- bzw. verdrahtungsvorrichtung |
DD219338A1 (de) * | 1983-11-15 | 1985-02-27 | Fz Elektronik Teltow Veb | Verfahren zum ultraschallschweissen |
DE3435511A1 (de) * | 1984-09-27 | 1986-04-03 | Bayerische Motoren Werke AG, 8000 München | Elektrode |
Non-Patent Citations (2)
Title |
---|
DE-Z: DVS-Berichte, Bd. 40, Nov. 1976, S. 122 bis 126 * |
US-Z: Solid State Technology, Bd. 20, H. 3, S. 50 bis 56 * |
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE4443716A1 (de) * | 1994-12-09 | 1996-06-13 | Hottinger Messtechnik Baldwin | Kraftmeßvorrichtung zur Messung der Zugspannung von Fäden, Bändern oder dergleichen sowie Federblatt und Verfahren zur Herstellung eines Federblatts |
DE4447073C1 (de) * | 1994-12-29 | 1996-07-18 | Bosch Gmbh Robert | Verfahren zum Prüfen von durch Ultraschalldrahtbonden hergestellten Verbindungen |
DE19709912B4 (de) * | 1996-03-11 | 2004-04-08 | National Semiconductor Corp.(N.D.Ges.D.Staates Delaware), Santa Clara | Ultraschallbondvorrichtung |
WO2001078482A1 (de) * | 2000-04-05 | 2001-10-18 | Siemens Production And Logistics Systems Ag | Bestückvorrichtung mit einer einrichtung zum messen der aufsetzkraft |
WO2005116593A1 (de) * | 2004-05-28 | 2005-12-08 | Schunk Ultraschalltechnik Gmbh | Verfahren zum messen und/oder regeln der schwingungsamplitude eines ultraschallschwingers sowie ultraschallschweissvorrichtung |
US8020746B2 (en) | 2006-09-05 | 2011-09-20 | Technische Universitaet Berlin | Method and device for controlling the generation of ultrasonic wire bonds |
Also Published As
Publication number | Publication date |
---|---|
EP0275877A2 (de) | 1988-07-27 |
JPH0552064B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) | 1993-08-04 |
ATE113225T1 (de) | 1994-11-15 |
JPS63191927A (ja) | 1988-08-09 |
DE3851900D1 (de) | 1994-12-01 |
EP0275877A3 (de) | 1991-03-06 |
US4854494A (en) | 1989-08-08 |
EP0275877B1 (de) | 1994-10-26 |
DE3701652C2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) | 1992-06-17 |
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