AT310253B - Verfahren zur Herstellung von Halbleitern, insbesondere Halbleiterdioden - Google Patents

Verfahren zur Herstellung von Halbleitern, insbesondere Halbleiterdioden

Info

Publication number
AT310253B
AT310253B AT993069A AT993069A AT310253B AT 310253 B AT310253 B AT 310253B AT 993069 A AT993069 A AT 993069A AT 993069 A AT993069 A AT 993069A AT 310253 B AT310253 B AT 310253B
Authority
AT
Austria
Prior art keywords
semiconductors
production
semiconductor diodes
particular semiconductor
diodes
Prior art date
Application number
AT993069A
Other languages
English (en)
Original Assignee
Lucas Industries Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Lucas Industries Ltd filed Critical Lucas Industries Ltd
Application granted granted Critical
Publication of AT310253B publication Critical patent/AT310253B/de

Links

Classifications

    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P14/00—Formation of materials, e.g. in the shape of layers or pillars
    • H10P14/60—Formation of materials, e.g. in the shape of layers or pillars of insulating materials
    • H10P14/69—Inorganic materials
    • H10P14/692—Inorganic materials composed of oxides, glassy oxides or oxide-based glasses
    • H10P14/6921—Inorganic materials composed of oxides, glassy oxides or oxide-based glasses containing silicon
    • H10P14/6922—Inorganic materials composed of oxides, glassy oxides or oxide-based glasses containing silicon the material containing Si, O and at least one of H, N, C, F or other non-metal elements, e.g. SiOC, SiOC:H or SiONC
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P14/00—Formation of materials, e.g. in the shape of layers or pillars
    • H10P14/60—Formation of materials, e.g. in the shape of layers or pillars of insulating materials
    • H10P14/63—Formation of materials, e.g. in the shape of layers or pillars of insulating materials characterised by the formation processes
    • H10P14/6326—Deposition processes
    • H10P14/6342—Liquid deposition, e.g. spin-coating, sol-gel techniques or spray coating
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P14/00—Formation of materials, e.g. in the shape of layers or pillars
    • H10P14/60—Formation of materials, e.g. in the shape of layers or pillars of insulating materials
    • H10P14/65—Formation of materials, e.g. in the shape of layers or pillars of insulating materials characterised by treatments performed before or after the formation of the materials
    • H10P14/6516—Formation of materials, e.g. in the shape of layers or pillars of insulating materials characterised by treatments performed before or after the formation of the materials of treatments performed after formation of the materials
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P54/00—Cutting or separating of wafers, substrates or parts of devices
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
    • H10P72/70—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping
    • H10P72/74—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using temporarily an auxiliary support
    • H10P72/7402—Wafer tapes, e.g. grinding or dicing support tapes
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P95/00—Generic processes or apparatus for manufacture or treatments not covered by the other groups of this subclass
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W74/00—Encapsulations, e.g. protective coatings
    • H10W74/10—Encapsulations, e.g. protective coatings characterised by their shape or disposition
    • H10W74/131—Encapsulations, e.g. protective coatings characterised by their shape or disposition the semiconductor body being only partially enclosed
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
    • H10P72/70—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping
    • H10P72/74—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using temporarily an auxiliary support
    • H10P72/7416—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using temporarily an auxiliary support used during dicing or grinding
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S438/00—Semiconductor device manufacturing: process
    • Y10S438/977—Thinning or removal of substrate
AT993069A 1968-10-28 1969-10-21 Verfahren zur Herstellung von Halbleitern, insbesondere Halbleiterdioden AT310253B (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
GB5103568 1968-10-28
GB24991/69A GB1285708A (en) 1968-10-28 1968-10-28 Semi-conductor devices

Publications (1)

Publication Number Publication Date
AT310253B true AT310253B (de) 1973-09-25

Family

ID=26257416

Family Applications (1)

Application Number Title Priority Date Filing Date
AT993069A AT310253B (de) 1968-10-28 1969-10-21 Verfahren zur Herstellung von Halbleitern, insbesondere Halbleiterdioden

Country Status (12)

Country Link
US (1) US3756872A (de)
AT (1) AT310253B (de)
BE (1) BE740836A (de)
CH (1) CH522955A (de)
CS (1) CS168552B2 (de)
DE (1) DE1954265A1 (de)
DK (1) DK135071B (de)
ES (2) ES373341A1 (de)
FR (1) FR2021690B1 (de)
GB (1) GB1285708A (de)
NL (1) NL154868B (de)
SE (2) SE376684B (de)

Families Citing this family (21)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1335201A (en) * 1970-05-21 1973-10-24 Lucas Industries Ltd Method of manufacturing semi-conductor devices
FR2100997B1 (de) * 1970-08-04 1973-12-21 Silec Semi Conducteurs
JPS5527463B2 (de) * 1973-02-28 1980-07-21
IT1059086B (it) * 1976-04-14 1982-05-31 Ates Componenti Elettron Procedimento per la passivazione di dispositivi a semiconduttore di potenza ad alta tensione inversa
DE2929339A1 (de) * 1978-07-24 1980-02-14 Citizen Watch Co Ltd Halbleiteranordnung
US4624724A (en) * 1985-01-17 1986-11-25 General Electric Company Method of making integrated circuit silicon die composite having hot melt adhesive on its silicon base
DE3621796A1 (de) * 1986-06-30 1988-01-07 Siemens Ag Verfahren zur verbesserung der nebensprechdaempfung bei einer optisch-elektronischen sensoranordnung
US4904610A (en) * 1988-01-27 1990-02-27 General Instrument Corporation Wafer level process for fabricating passivated semiconductor devices
US5545291A (en) * 1993-12-17 1996-08-13 The Regents Of The University Of California Method for fabricating self-assembling microstructures
US6864570B2 (en) * 1993-12-17 2005-03-08 The Regents Of The University Of California Method and apparatus for fabricating self-assembling microstructures
US5904545A (en) * 1993-12-17 1999-05-18 The Regents Of The University Of California Apparatus for fabricating self-assembling microstructures
DE19604405C2 (de) * 1996-02-07 2002-10-10 Micronas Gmbh Verfahren zum Vereinzeln von in einem Körper enthaltenen elektronischen Elementen
FR2782843B1 (fr) * 1998-08-25 2000-09-29 Commissariat Energie Atomique Procede d'isolation physique de regions d'une plaque de substrat
DE10055763A1 (de) * 2000-11-10 2002-05-23 Infineon Technologies Ag Verfahren zur Herstellung einer hochtemperaturfesten Verbindung zwischen zwei Wafern
DE10158307A1 (de) * 2001-11-28 2003-02-20 Infineon Technologies Ag Verfahren zum Anschließen von Schaltungseinheiten auf Wafer-Skale-Ebene durch Dehnen einer Folie
TWI232560B (en) * 2002-04-23 2005-05-11 Sanyo Electric Co Semiconductor device and its manufacture
TWI229435B (en) * 2002-06-18 2005-03-11 Sanyo Electric Co Manufacture of semiconductor device
TWI227550B (en) * 2002-10-30 2005-02-01 Sanyo Electric Co Semiconductor device manufacturing method
JP4401181B2 (ja) * 2003-08-06 2010-01-20 三洋電機株式会社 半導体装置及びその製造方法
JP4018096B2 (ja) * 2004-10-05 2007-12-05 松下電器産業株式会社 半導体ウェハの分割方法、及び半導体素子の製造方法
TWI324800B (en) * 2005-12-28 2010-05-11 Sanyo Electric Co Method for manufacturing semiconductor device

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3260634A (en) * 1961-02-17 1966-07-12 Motorola Inc Method of etching a semiconductor wafer to provide tapered dice
FR1486041A (fr) * 1965-07-07 1967-06-23 Westinghouse Electric Corp Dispositif de protection des jonctions d'un dispositif semi-conducteur
GB1118536A (en) * 1966-09-30 1968-07-03 Standard Telephones Cables Ltd Improvements in or relating to semiconductor devices

Also Published As

Publication number Publication date
DK135071B (da) 1977-02-28
NL6916239A (de) 1970-05-01
US3756872A (en) 1973-09-04
BE740836A (de) 1970-04-01
ES399979A1 (es) 1975-06-16
GB1285708A (en) 1972-08-16
DE1954265A1 (de) 1970-05-27
FR2021690A1 (de) 1970-07-24
FR2021690B1 (de) 1974-05-03
CH522955A (de) 1972-05-15
ES373341A1 (es) 1972-05-16
DK135071C (de) 1977-08-01
SE363930B (de) 1974-02-04
NL154868B (nl) 1977-10-17
CS168552B2 (de) 1976-06-29
SE376684B (de) 1975-06-02

Similar Documents

Publication Publication Date Title
CH503376A (de) Verfahren zum Zusammenstellen von Maskensätzen, insbesondere für die Herstellung von Halbleitervorrichtungen
DE1918845B2 (de) Verfahren zur herstellung von halbleiteranordnungen
CH392699A (de) Verfahren zur Herstellung von Halbleiter-Gleichrichteranordnungen mit tablettenförmigen Gleichrichterelementen
AT269243B (de) Verfahren zur Herstellung von insbesondere als Thermogenerator verwendbaren homogenen Körpern aus Germanium-Silicium
CH389783A (de) Verfahren zur Herstellung von Halbleiteranordnungen mit pn-Übergang
AT266219B (de) Verfahren zur Herstellung von Halbleiteranordnungen
CH432662A (de) Verfahren zur Herstellung von Gallium-Arsenid-Transistoren
AT303563B (de) Verfahren zur Herstellung von Formkörpern, insbesondere von Schleifkörpern
CH549010A (de) Verfahren zur herstellung von novenamin.
CH557861A (de) Verfahren zur herstellung von perinonfarbstoffen.
CH548345A (de) Verfahren zur herstellung von vanadinoxitrichlorid.
CH512824A (de) Verfahren zur Herstellung von Halbleitervorrichtungen
AT282193B (de) Verfahren zur Herstellung von gießfähigen Organosiloxanblockmischpolymerisaten
CH531257A (de) Verfahren zur Herstellung von Halbleiter-Gleichrichter-Anordnungen
CH428675A (de) Verfahren zur Gewinnung von reinstem Halbleitermaterial, insbesondere Silizium
AT310954B (de) Verfahren zur Herstellung optisch aktiver Verbindungen, insbesondere Secosteroide
AT303686B (de) Verfahren zur Herstellung von Halbleiterverbindungen
CH427041A (de) Verfahren zur Herstellung von Halbleitervorrichtungen, insbesondere von Tunneldioden
CH461639A (de) Verfahren zur Herstellung eines elektrolumineszierenden Halbleiterelementes
CH524039A (de) Verfahren zur Herstellung von Bauteilen, insbesondere von Mauerwerk, aus Bauelementen
AT251649B (de) Verfahren zur Herstellung von Halbleiteranordnungen, wie Transistoren und Dioden
AT270754B (de) Verfahren zur Herstellung von Kristallen, insbesondere für Halbleitervorrichtungen
CH414570A (de) Verfahren zur Gewinnung von reinstem Halbleitermaterial, insbesondere Silizium
AT296226B (de) Verfahren zur Herstellung von hochreinem Galliumarsenid
CH497792A (de) Verfahren zur Herstellung von Halbleitervorrichtungen

Legal Events

Date Code Title Description
ELJ Ceased due to non-payment of the annual fee