AR086258A2 - Aparato y metodo para probar una lente - Google Patents
Aparato y metodo para probar una lenteInfo
- Publication number
- AR086258A2 AR086258A2 ARP120101560A ARP120101560A AR086258A2 AR 086258 A2 AR086258 A2 AR 086258A2 AR P120101560 A ARP120101560 A AR P120101560A AR P120101560 A ARP120101560 A AR P120101560A AR 086258 A2 AR086258 A2 AR 086258A2
- Authority
- AR
- Argentina
- Prior art keywords
- light
- collimated
- coherent
- propagates
- arm
- Prior art date
Links
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
- G01N35/02—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations
- G01N35/025—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations having a carousel or turntable for reaction cells or cuvettes
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
- G01B9/02015—Interferometers characterised by the beam path configuration
- G01B9/02024—Measuring in transmission, i.e. light traverses the object
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
- G01B9/02041—Interferometers characterised by particular imaging or detection techniques
- G01B9/02048—Rough and fine measurement
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
- G01B9/02055—Reduction or prevention of errors; Testing; Calibration
- G01B9/0207—Error reduction by correction of the measurement signal based on independently determined error sources, e.g. using a reference interferometer
- G01B9/02072—Error reduction by correction of the measurement signal based on independently determined error sources, e.g. using a reference interferometer by calibration or testing of interferometer
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
- G01M11/02—Testing optical properties
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
- G01M11/02—Testing optical properties
- G01M11/0285—Testing optical properties by measuring material or chromatic transmission properties
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/01—Arrangements or apparatus for facilitating the optical investigation
- G01N21/03—Cuvette constructions
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
- G01N35/02—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B2290/00—Aspects of interferometers not specifically covered by any group under G01B9/02
- G01B2290/45—Multiple detectors for detecting interferometer signals
Landscapes
- General Physics & Mathematics (AREA)
- Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Pathology (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Testing Of Optical Devices Or Fibers (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
- Instruments For Measurement Of Length By Optical Means (AREA)
- Mounting And Adjusting Of Optical Elements (AREA)
- Optical Measuring Cells (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Eyeglasses (AREA)
Abstract
Un aparato y método para probar una lente. El aparato comprende una fuente de luz coherente configurada para proporcionar un haz de luz coherente expandido colimado; un primer divisor de haz configurado para dividir el haz de luz coherente expandido colimado que incide sobre este en un primer haz de luz coherente colimado y un segundo haz de luz coherente colimado, donde el primer haz de luz coherente colimado forma un brazo de referencia para medición que prácticamente está ópticamente inalterado desde el primer haz de luz coherente colimado; y el segundo haz de luz coherente colimado forma un brazo de prueba; la longitud del trayecto óptico del brazo de prueba es prácticamente igual a la longitud del trayecto óptico del brazo de referencia; y el brazo de prueba está orientado verticalmente para que la luz lo atraviese en dirección descendente; una cubeta que está ubicada dentro del brazo de prueba y configurada para contener una lente sumergida en una solución de forma tal que mitigue los efectos ópticos debidos a la gravedad; y propagar el segundo haz de luz coherente colimado en dirección descendente a través de una lente; un modulador de fase configurado para alterar una fase óptica de uno entre el primer haz de luz coherente colimado y el segundo haz de luz coherente colimado; un segundo divisor de haz configurado para proporcionar un primer haz combinado y un segundo haz combinado al combinar el primer haz de luz coherente colimado que se propaga desde el brazo de referencia para medición y el segundo haz de luz coherente colimado que se propaga desde el brazo de prueba, donde el primer haz combinado se propaga en una primera dirección; el segundo haz combinado se propaga en una segunda dirección; el primer haz combinado indica un primer patrón de interferencia entre el primer haz de luz coherente colimado que se propaga desde el brazo de referencia para medición y el segundo haz de luz coherente colimado que se propaga desde el brazo de prueba; y el segundo haz combinado indica un segundo patrón de interferencia entre el primer haz de luz coherente colimado que se propaga desde el brazo de referencia para medición y el segundo haz de luz coherente colimado que se propaga desde el brazo de prueba; un primer detector configurado para registrar, con una primera resolución y un primer campo visual, el primer patrón de interferencia; y un segundo detector configurado para registrar, con una segunda resolución y un segundo campo visual, el segundo patrón de Interferencia.
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US87131906P | 2006-12-21 | 2006-12-21 |
Publications (1)
Publication Number | Publication Date |
---|---|
AR086258A2 true AR086258A2 (es) | 2013-12-04 |
Family
ID=39327060
Family Applications (4)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
ARP070105812A AR064644A1 (es) | 2006-12-21 | 2007-12-21 | Pruebas por interferometria de lentes y sistemas y dispositivos para las mismas y metodo |
ARP070105811A AR064643A1 (es) | 2006-12-21 | 2007-12-21 | Cubeta para lente oftalmica |
ARP120101560A AR086258A2 (es) | 2006-12-21 | 2012-05-03 | Aparato y metodo para probar una lente |
ARP150101182A AR100140A2 (es) | 2006-12-21 | 2015-04-20 | Aparato y método de prueba de lentes |
Family Applications Before (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
ARP070105812A AR064644A1 (es) | 2006-12-21 | 2007-12-21 | Pruebas por interferometria de lentes y sistemas y dispositivos para las mismas y metodo |
ARP070105811A AR064643A1 (es) | 2006-12-21 | 2007-12-21 | Cubeta para lente oftalmica |
Family Applications After (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
ARP150101182A AR100140A2 (es) | 2006-12-21 | 2015-04-20 | Aparato y método de prueba de lentes |
Country Status (13)
Country | Link |
---|---|
US (2) | US7688453B2 (es) |
EP (2) | EP2097712B1 (es) |
JP (3) | JP5122581B2 (es) |
KR (2) | KR101404427B1 (es) |
CN (2) | CN101680742B (es) |
AR (4) | AR064644A1 (es) |
AU (2) | AU2007336715B2 (es) |
BR (2) | BRPI0720499A2 (es) |
CA (2) | CA2672900C (es) |
HK (2) | HK1135462A1 (es) |
SG (1) | SG177910A1 (es) |
TW (2) | TWI449893B (es) |
WO (2) | WO2008080076A2 (es) |
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JP2005345288A (ja) * | 2004-06-03 | 2005-12-15 | Olympus Corp | マッハツェンダー干渉計及びマッハツェンダー干渉計による光学素子の検査方法 |
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