HK1135462A1 - Interferometry testing of lenses, and systems and devices for same - Google Patents

Interferometry testing of lenses, and systems and devices for same

Info

Publication number
HK1135462A1
HK1135462A1 HK10102046.8A HK10102046A HK1135462A1 HK 1135462 A1 HK1135462 A1 HK 1135462A1 HK 10102046 A HK10102046 A HK 10102046A HK 1135462 A1 HK1135462 A1 HK 1135462A1
Authority
HK
Hong Kong
Prior art keywords
lenses
systems
devices
same
interferometry
Prior art date
Application number
HK10102046.8A
Other languages
English (en)
Chinese (zh)
Inventor
Gregory A Williby
Russell T Spaulding
Larry G Jones
James W Haywood
Jr John Edward Greivenkamp
Original Assignee
Johnson & Johnson Vision Care
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Family has litigation
First worldwide family litigation filed litigation Critical https://patents.darts-ip.com/?family=39327060&utm_source=google_patent&utm_medium=platform_link&utm_campaign=public_patent_search&patent=HK1135462(A1) "Global patent litigation dataset” by Darts-ip is licensed under a Creative Commons Attribution 4.0 International License.
Application filed by Johnson & Johnson Vision Care filed Critical Johnson & Johnson Vision Care
Publication of HK1135462A1 publication Critical patent/HK1135462A1/xx

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/02—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations
    • G01N35/025—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations having a carousel or turntable for reaction cells or cuvettes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02015—Interferometers characterised by the beam path configuration
    • G01B9/02024—Measuring in transmission, i.e. light traverses the object
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02041—Interferometers characterised by particular imaging or detection techniques
    • G01B9/02048—Rough and fine measurement
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02055—Reduction or prevention of errors; Testing; Calibration
    • G01B9/0207—Error reduction by correction of the measurement signal based on independently determined error sources, e.g. using a reference interferometer
    • G01B9/02072—Error reduction by correction of the measurement signal based on independently determined error sources, e.g. using a reference interferometer by calibration or testing of interferometer
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02—Testing optical properties
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02—Testing optical properties
    • G01M11/0285—Testing optical properties by measuring material or chromatic transmission properties
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/01—Arrangements or apparatus for facilitating the optical investigation
    • G01N21/03—Cuvette constructions
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/02—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B2290/00—Aspects of interferometers not specifically covered by any group under G01B9/02
    • G01B2290/45—Multiple detectors for detecting interferometer signals

Landscapes

  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Pathology (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Instruments For Measurement Of Length By Optical Means (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Eyeglasses (AREA)
  • Mounting And Adjusting Of Optical Elements (AREA)
  • Optical Measuring Cells (AREA)
HK10102046.8A 2006-12-21 2010-02-26 Interferometry testing of lenses, and systems and devices for same HK1135462A1 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US87131906P 2006-12-21 2006-12-21
PCT/US2007/088583 WO2008080074A2 (en) 2006-12-21 2007-12-21 Interferometry testing of lenses, and systems and devices for same

Publications (1)

Publication Number Publication Date
HK1135462A1 true HK1135462A1 (en) 2010-06-04

Family

ID=39327060

Family Applications (2)

Application Number Title Priority Date Filing Date
HK10102046.8A HK1135462A1 (en) 2006-12-21 2010-02-26 Interferometry testing of lenses, and systems and devices for same
HK10107112.6A HK1140811A1 (en) 2006-12-21 2010-07-23 Interferometry testing of lenses, and systems and devices for same

Family Applications After (1)

Application Number Title Priority Date Filing Date
HK10107112.6A HK1140811A1 (en) 2006-12-21 2010-07-23 Interferometry testing of lenses, and systems and devices for same

Country Status (13)

Country Link
US (2) US7688453B2 (es)
EP (2) EP2097712B1 (es)
JP (3) JP5813288B2 (es)
KR (2) KR101404427B1 (es)
CN (2) CN101688767B (es)
AR (4) AR064644A1 (es)
AU (2) AU2007336799B2 (es)
BR (2) BRPI0720851B1 (es)
CA (2) CA2672900C (es)
HK (2) HK1135462A1 (es)
SG (1) SG177910A1 (es)
TW (2) TWI434023B (es)
WO (2) WO2008080074A2 (es)

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Also Published As

Publication number Publication date
KR101404427B1 (ko) 2014-06-10
JP2010515024A (ja) 2010-05-06
WO2008080076A3 (en) 2008-08-21
KR101387994B1 (ko) 2014-04-22
TWI449893B (zh) 2014-08-21
EP2097712A2 (en) 2009-09-09
SG177910A1 (en) 2012-02-28
WO2008080076A2 (en) 2008-07-03
KR20090122178A (ko) 2009-11-26
US20080285019A1 (en) 2008-11-20
CA2672900A1 (en) 2008-07-03
CN101688767B (zh) 2012-03-21
AU2007336715B2 (en) 2012-10-11
JP5813288B2 (ja) 2015-11-17
CN101680742A (zh) 2010-03-24
EP2095063A2 (en) 2009-09-02
JP2010515025A (ja) 2010-05-06
AR100140A2 (es) 2016-09-14
AR086258A2 (es) 2013-12-04
CN101680742B (zh) 2011-12-14
CA2672900C (en) 2015-02-17
WO2008080076B1 (en) 2008-10-23
AU2007336799A1 (en) 2008-07-03
HK1140811A1 (en) 2010-10-22
WO2008080074A3 (en) 2008-10-09
EP2095063B1 (en) 2018-04-04
EP2097712B1 (en) 2014-10-15
CA2673200C (en) 2016-02-02
AU2007336715A1 (en) 2008-07-03
CN101688767A (zh) 2010-03-31
JP2013238619A (ja) 2013-11-28
TW200848699A (en) 2008-12-16
AU2007336799B2 (en) 2013-10-24
JP5833063B2 (ja) 2015-12-16
WO2008080074A2 (en) 2008-07-03
US8427636B2 (en) 2013-04-23
US7688453B2 (en) 2010-03-30
KR20090122422A (ko) 2009-11-30
TWI434023B (zh) 2014-04-11
BRPI0720499A2 (pt) 2014-02-04
US20080151236A1 (en) 2008-06-26
TW200848713A (en) 2008-12-16
AR064644A1 (es) 2009-04-15
BRPI0720851A2 (pt) 2018-07-24
CA2673200A1 (en) 2008-07-03
BRPI0720851B1 (pt) 2019-10-08
AR064643A1 (es) 2009-04-15
JP5122581B2 (ja) 2013-01-16

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