AR064644A1 - Pruebas por interferometria de lentes y sistemas y dispositivos para las mismas y metodo - Google Patents

Pruebas por interferometria de lentes y sistemas y dispositivos para las mismas y metodo

Info

Publication number
AR064644A1
AR064644A1 ARP070105812A ARP070105812A AR064644A1 AR 064644 A1 AR064644 A1 AR 064644A1 AR P070105812 A ARP070105812 A AR P070105812A AR P070105812 A ARP070105812 A AR P070105812A AR 064644 A1 AR064644 A1 AR 064644A1
Authority
AR
Argentina
Prior art keywords
lenses
lens
cuvette
preferably used
interferometry
Prior art date
Application number
ARP070105812A
Other languages
English (en)
Inventor
Larry G Jones
James W Haywood
Jr John Edward Greivenkamp
Russel T Spaulding
Gregory A Williby
Original Assignee
Univ Arizona
Johnson & Johnson Vision Care
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Family has litigation
First worldwide family litigation filed litigation Critical https://patents.darts-ip.com/?family=39327060&utm_source=google_patent&utm_medium=platform_link&utm_campaign=public_patent_search&patent=AR064644(A1) "Global patent litigation dataset” by Darts-ip is licensed under a Creative Commons Attribution 4.0 International License.
Application filed by Univ Arizona, Johnson & Johnson Vision Care filed Critical Univ Arizona
Publication of AR064644A1 publication Critical patent/AR064644A1/es

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/02—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations
    • G01N35/025—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations having a carousel or turntable for reaction cells or cuvettes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02015—Interferometers characterised by the beam path configuration
    • G01B9/02024—Measuring in transmission, i.e. light traverses the object
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02041—Interferometers characterised by particular imaging or detection techniques
    • G01B9/02048—Rough and fine measurement
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02055—Reduction or prevention of errors; Testing; Calibration
    • G01B9/0207—Error reduction by correction of the measurement signal based on independently determined error sources, e.g. using a reference interferometer
    • G01B9/02072—Error reduction by correction of the measurement signal based on independently determined error sources, e.g. using a reference interferometer by calibration or testing of interferometer
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02—Testing optical properties
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02—Testing optical properties
    • G01M11/0285—Testing optical properties by measuring material or chromatic transmission properties
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/01—Arrangements or apparatus for facilitating the optical investigation
    • G01N21/03—Cuvette constructions
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/02—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B2290/00—Aspects of interferometers not specifically covered by any group under G01B9/02
    • G01B2290/45—Multiple detectors for detecting interferometer signals

Landscapes

  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Pathology (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Instruments For Measurement Of Length By Optical Means (AREA)
  • Optical Measuring Cells (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Eyeglasses (AREA)
  • Mounting And Adjusting Of Optical Elements (AREA)

Abstract

Se usan preferentemente interferometros MZ (Mach-Zender) modificados para analizar el frene de onda asférico transmitido de una lente oftálmica montando la lente en una cubeta que tiene un carrusel giratorio que pueden cargar multiples lentes. Una solucion salina fresca de temperatura controlada es circulada alrededor de las lentes y la cubeta es posicionada en un brazo de pruebas vertical de la configuracion del interferometro. Se utiliza preferentemente un trazado de rayos invertido para eliminar aberraciones introducidas en el frente de onda cuando es representado por una imagen desde inmediatamente atrás de la lente al detector del interferometro.
ARP070105812A 2006-12-21 2007-12-21 Pruebas por interferometria de lentes y sistemas y dispositivos para las mismas y metodo AR064644A1 (es)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US87131906P 2006-12-21 2006-12-21

Publications (1)

Publication Number Publication Date
AR064644A1 true AR064644A1 (es) 2009-04-15

Family

ID=39327060

Family Applications (4)

Application Number Title Priority Date Filing Date
ARP070105812A AR064644A1 (es) 2006-12-21 2007-12-21 Pruebas por interferometria de lentes y sistemas y dispositivos para las mismas y metodo
ARP070105811A AR064643A1 (es) 2006-12-21 2007-12-21 Cubeta para lente oftalmica
ARP120101560A AR086258A2 (es) 2006-12-21 2012-05-03 Aparato y metodo para probar una lente
ARP150101182A AR100140A2 (es) 2006-12-21 2015-04-20 Aparato y método de prueba de lentes

Family Applications After (3)

Application Number Title Priority Date Filing Date
ARP070105811A AR064643A1 (es) 2006-12-21 2007-12-21 Cubeta para lente oftalmica
ARP120101560A AR086258A2 (es) 2006-12-21 2012-05-03 Aparato y metodo para probar una lente
ARP150101182A AR100140A2 (es) 2006-12-21 2015-04-20 Aparato y método de prueba de lentes

Country Status (13)

Country Link
US (2) US8427636B2 (es)
EP (2) EP2097712B1 (es)
JP (3) JP5813288B2 (es)
KR (2) KR101404427B1 (es)
CN (2) CN101688767B (es)
AR (4) AR064644A1 (es)
AU (2) AU2007336715B2 (es)
BR (2) BRPI0720851B1 (es)
CA (2) CA2672900C (es)
HK (2) HK1135462A1 (es)
SG (1) SG177910A1 (es)
TW (2) TWI449893B (es)
WO (2) WO2008080074A2 (es)

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Also Published As

Publication number Publication date
HK1140811A1 (en) 2010-10-22
BRPI0720851A2 (pt) 2018-07-24
CA2672900A1 (en) 2008-07-03
WO2008080076A2 (en) 2008-07-03
KR101404427B1 (ko) 2014-06-10
CA2673200A1 (en) 2008-07-03
AR064643A1 (es) 2009-04-15
CN101680742B (zh) 2011-12-14
HK1135462A1 (en) 2010-06-04
WO2008080074A3 (en) 2008-10-09
JP5833063B2 (ja) 2015-12-16
EP2097712B1 (en) 2014-10-15
WO2008080074A2 (en) 2008-07-03
US7688453B2 (en) 2010-03-30
TW200848713A (en) 2008-12-16
KR20090122178A (ko) 2009-11-26
CN101688767A (zh) 2010-03-31
WO2008080076B1 (en) 2008-10-23
TWI449893B (zh) 2014-08-21
AR100140A2 (es) 2016-09-14
EP2097712A2 (en) 2009-09-09
EP2095063A2 (en) 2009-09-02
KR20090122422A (ko) 2009-11-30
JP5813288B2 (ja) 2015-11-17
TWI434023B (zh) 2014-04-11
CA2673200C (en) 2016-02-02
AU2007336799A1 (en) 2008-07-03
BRPI0720499A2 (pt) 2014-02-04
JP2010515025A (ja) 2010-05-06
AU2007336715B2 (en) 2012-10-11
AU2007336715A1 (en) 2008-07-03
AU2007336799B2 (en) 2013-10-24
JP2013238619A (ja) 2013-11-28
EP2095063B1 (en) 2018-04-04
CN101688767B (zh) 2012-03-21
WO2008080076A3 (en) 2008-08-21
KR101387994B1 (ko) 2014-04-22
CN101680742A (zh) 2010-03-24
SG177910A1 (en) 2012-02-28
AR086258A2 (es) 2013-12-04
US8427636B2 (en) 2013-04-23
CA2672900C (en) 2015-02-17
BRPI0720851B1 (pt) 2019-10-08
US20080285019A1 (en) 2008-11-20
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TW200848699A (en) 2008-12-16
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