DE69940767D1 - Zeitverzögerungsmessapparat für ein optisches Element - Google Patents

Zeitverzögerungsmessapparat für ein optisches Element

Info

Publication number
DE69940767D1
DE69940767D1 DE69940767T DE69940767T DE69940767D1 DE 69940767 D1 DE69940767 D1 DE 69940767D1 DE 69940767 T DE69940767 T DE 69940767T DE 69940767 T DE69940767 T DE 69940767T DE 69940767 D1 DE69940767 D1 DE 69940767D1
Authority
DE
Germany
Prior art keywords
measuring device
optical element
time delay
delay measuring
optical
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE69940767T
Other languages
English (en)
Inventor
Akihito Otani
Toshinobu Otsubo
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Anritsu Corp
Original Assignee
Anritsu Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Anritsu Corp filed Critical Anritsu Corp
Application granted granted Critical
Publication of DE69940767D1 publication Critical patent/DE69940767D1/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/30—Testing of optical devices, constituted by fibre optics or optical waveguides
    • G01M11/33—Testing of optical devices, constituted by fibre optics or optical waveguides with a light emitter being disposed at one fibre or waveguide end-face, and a light receiver at the other end-face
    • G01M11/331—Testing of optical devices, constituted by fibre optics or optical waveguides with a light emitter being disposed at one fibre or waveguide end-face, and a light receiver at the other end-face by using interferometer
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J7/00—Measuring velocity of light
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/30—Testing of optical devices, constituted by fibre optics or optical waveguides
    • G01M11/33—Testing of optical devices, constituted by fibre optics or optical waveguides with a light emitter being disposed at one fibre or waveguide end-face, and a light receiver at the other end-face
    • G01M11/332—Testing of optical devices, constituted by fibre optics or optical waveguides with a light emitter being disposed at one fibre or waveguide end-face, and a light receiver at the other end-face using discrete input signals
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/30—Testing of optical devices, constituted by fibre optics or optical waveguides
    • G01M11/33—Testing of optical devices, constituted by fibre optics or optical waveguides with a light emitter being disposed at one fibre or waveguide end-face, and a light receiver at the other end-face
    • G01M11/335—Testing of optical devices, constituted by fibre optics or optical waveguides with a light emitter being disposed at one fibre or waveguide end-face, and a light receiver at the other end-face using two or more input wavelengths
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/30—Testing of optical devices, constituted by fibre optics or optical waveguides
    • G01M11/33—Testing of optical devices, constituted by fibre optics or optical waveguides with a light emitter being disposed at one fibre or waveguide end-face, and a light receiver at the other end-face
    • G01M11/336—Testing of optical devices, constituted by fibre optics or optical waveguides with a light emitter being disposed at one fibre or waveguide end-face, and a light receiver at the other end-face by measuring polarization mode dispersion [PMD]
DE69940767T 1998-12-24 1999-12-08 Zeitverzögerungsmessapparat für ein optisches Element Expired - Lifetime DE69940767D1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP36685998A JP3631025B2 (ja) 1998-12-24 1998-12-24 波長分散測定装置及び偏波分散測定装置

Publications (1)

Publication Number Publication Date
DE69940767D1 true DE69940767D1 (de) 2009-06-04

Family

ID=18487864

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69940767T Expired - Lifetime DE69940767D1 (de) 1998-12-24 1999-12-08 Zeitverzögerungsmessapparat für ein optisches Element

Country Status (4)

Country Link
US (1) US6788410B1 (de)
EP (1) EP1014033B1 (de)
JP (1) JP3631025B2 (de)
DE (1) DE69940767D1 (de)

Families Citing this family (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7088925B1 (en) * 1999-06-28 2006-08-08 Siemens Aktiengesellschaft Device for detecting polarization mode dispersion
US6905623B2 (en) * 2000-12-15 2005-06-14 Credence Systems Corporation Precise, in-situ endpoint detection for charged particle beam processing
FR2820200B1 (fr) * 2001-01-30 2003-08-15 Sagem Procede de caracterisation de fibres optiques et dispositif pour sa mise en oeuvre
KR100386421B1 (ko) * 2001-07-27 2003-06-02 반재경 색분산 측정 시스템 및 방법
EP1202038A1 (de) 2001-07-27 2002-05-02 Agilent Technologies, Inc. (a Delaware corporation) Bestimmung optischer Eigenschaften eines zu testenden Geräts bezüglich Transmission und Reflexion
US20050117159A1 (en) * 2002-06-29 2005-06-02 Harald Rosenfeldt Polarization diversity detection using a polarization multiplexed local oscillator
US6909497B2 (en) * 2002-11-12 2005-06-21 David Scott Holbrook Optical characteristic measurement and compensation apparatus and method
JP4583986B2 (ja) * 2005-03-22 2010-11-17 株式会社フジクラ 波長分散測定装置
CN101031788B (zh) * 2005-09-22 2011-06-15 日本电信电话株式会社 光波导的色散测定方法、测定装置
JP4741329B2 (ja) * 2005-09-26 2011-08-03 株式会社フジクラ 波長分散測定方法、波長分散測定装置及び波長分散補正システム
JP2007219323A (ja) * 2006-02-17 2007-08-30 Fujitsu Ltd 光パルス列発生装置
SE534634C2 (sv) * 2009-11-12 2011-11-01 Sp Sveriges Tekniska Forskningsinstitut Ab En anordning och ett förfarande för noggrann enkelriktad överföring av tid över optisk fiber
WO2012053499A1 (ja) * 2010-10-18 2012-04-26 株式会社フジクラ 波長分散測定装置及びそれを用いた波長分散測定方法
JP5799008B2 (ja) * 2012-12-07 2015-10-21 日本電信電話株式会社 二重化光線路の光路遅延測定方法とその測定装置
JP5799038B2 (ja) * 2013-02-22 2015-10-21 日本電信電話株式会社 二重化光線路の光路遅延測定方法とその測定装置
US9110088B1 (en) * 2014-02-10 2015-08-18 Selwyn E. Wright Propagation medium velocity measurement system
US10367724B1 (en) * 2017-12-07 2019-07-30 Juniper Networks, Inc. Optical channel data unit (ODU) fault propagation and link recovery using ODU-delay measurement
JP7184700B2 (ja) 2019-04-05 2022-12-06 浜松ホトニクス株式会社 分散測定装置、パルス光源、分散測定方法、および分散補償方法
JP7449214B2 (ja) 2020-10-02 2024-03-13 浜松ホトニクス株式会社 分散測定装置および分散測定方法
CN116391105A (zh) * 2020-10-02 2023-07-04 浜松光子学株式会社 分散测定装置及分散测定方法

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3108177C2 (de) * 1981-03-04 1983-07-21 Max Planck Gesellschaft zur Förderung der Wissenschaften e.V., 3400 Göttingen Verfahren und Einrichtung zum Messen der Dauer von einzelnen kohärenten Strahlungsimpulsen
JPS5975108A (ja) * 1982-10-22 1984-04-27 Hitachi Ltd 微小隙間の光学的測定方法及び測定装置
US4902888A (en) * 1987-12-15 1990-02-20 Brother Kogyo Kabushiki Kaisha Optical fiber sensor
JP3001943B2 (ja) * 1990-08-30 2000-01-24 株式会社東芝 偏波スイッチング光源、光受信装置及びコヒーレント光伝送システム
JPH04177141A (ja) 1990-11-09 1992-06-24 Nippon Telegr & Teleph Corp <Ntt> 光ファイバの波長分散測定方法
US5513164A (en) * 1992-09-11 1996-04-30 Kabushiki Kaisha Toshiba Optical recording and reproducing apparatus
US5589936A (en) * 1992-09-14 1996-12-31 Nikon Corporation Optical measuring apparatus for measuring physichemical properties
JP3346595B2 (ja) 1992-12-08 2002-11-18 日本電信電話株式会社 光ファイバの波長分散測定方法
JPH0755571A (ja) * 1993-06-08 1995-03-03 Fujikura Ltd 偏波分散測定器
JP3657362B2 (ja) * 1996-07-16 2005-06-08 独立行政法人科学技術振興機構 光パルス特性測定装置およびその測定方法
JP3394902B2 (ja) * 1998-02-20 2003-04-07 アンリツ株式会社 波長分散測定装置及び偏波分散測定装置

Also Published As

Publication number Publication date
EP1014033B1 (de) 2009-04-22
JP2000193557A (ja) 2000-07-14
US6788410B1 (en) 2004-09-07
EP1014033A3 (de) 2001-11-21
EP1014033A2 (de) 2000-06-28
JP3631025B2 (ja) 2005-03-23

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