WO2023197362A1 - 显示面板及显示面板的老化测试方法 - Google Patents

显示面板及显示面板的老化测试方法 Download PDF

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Publication number
WO2023197362A1
WO2023197362A1 PCT/CN2022/088529 CN2022088529W WO2023197362A1 WO 2023197362 A1 WO2023197362 A1 WO 2023197362A1 CN 2022088529 W CN2022088529 W CN 2022088529W WO 2023197362 A1 WO2023197362 A1 WO 2023197362A1
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module
electrically connected
thin film
film transistor
display panel
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PCT/CN2022/088529
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English (en)
French (fr)
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侯继达
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深圳市华星光电半导体显示技术有限公司
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Priority to US17/771,689 priority Critical patent/US20240168081A1/en
Publication of WO2023197362A1 publication Critical patent/WO2023197362A1/zh

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/2642—Testing semiconductor operation lifetime or reliability, e.g. by accelerated life tests
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/27—Testing of devices without physical removal from the circuit of which they form part, e.g. compensating for effects surrounding elements
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/20—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters
    • G09G3/22—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources
    • G09G3/30—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources using electroluminescent panels
    • G09G3/32—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources using electroluminescent panels semiconductive, e.g. using light-emitting diodes [LED]
    • G09G3/3208—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources using electroluminescent panels semiconductive, e.g. using light-emitting diodes [LED] organic, e.g. using organic light-emitting diodes [OLED]
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/20—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters
    • G09G3/22—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources
    • G09G3/30—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources using electroluminescent panels
    • G09G3/32—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources using electroluminescent panels semiconductive, e.g. using light-emitting diodes [LED]
    • G09G3/3208—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources using electroluminescent panels semiconductive, e.g. using light-emitting diodes [LED] organic, e.g. using organic light-emitting diodes [OLED]
    • G09G3/3225—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources using electroluminescent panels semiconductive, e.g. using light-emitting diodes [LED] organic, e.g. using organic light-emitting diodes [OLED] using an active matrix
    • G09G3/3233—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources using electroluminescent panels semiconductive, e.g. using light-emitting diodes [LED] organic, e.g. using organic light-emitting diodes [OLED] using an active matrix with pixel circuitry controlling the current through the light-emitting element

Definitions

  • the present invention relates to the field of display technology of display panels, and in particular to a display panel and an aging test method of the display panel.
  • OLED organic light-emitting diode
  • OLED organic light-emitting diode
  • the life of the OLED device is an important indicator. Therefore, in the existing technology, during the OLED preparation process, it is usually necessary to perform a Lifetime-Aging (L-Aging) process on the OLED device after the preparation is completed.
  • L-Aging Lifetime-Aging
  • the circuit design of the circuit architecture, the test environment and the test current density are the main test influencing factors.
  • the brightness of the organic light-emitting devices when performing aging tests on light-emitting devices, the brightness of the organic light-emitting devices often fluctuates in the early stages of lighting the device, or the brightness of the organic light-emitting device may fluctuate in the early stages of testing. There will be a rapid decline. This in turn leads to display color shift in the display device, and reduces the service life and quality of the device, which is not conducive to the improvement of device performance.
  • the light-emitting device when the existing technology performs an aging test on a display device, the light-emitting device will have large brightness fluctuations in the early stages of the aging test, which will lead to color shift in the display device and a decrease in the life and quality of the device. question. It is not conducive to the improvement of the comprehensive performance of the display device.
  • embodiments of the present invention provide a display panel and an aging test method of the display panel.
  • the light-emitting devices are prone to large fluctuations, which in turn causes problems such as color shift and quality degradation of the display devices.
  • a first aspect of an embodiment of the present invention provides a display panel.
  • the display panel includes an aging test circuit.
  • the aging test circuit includes a plurality of pixel driving circuits.
  • the pixel driving circuit includes:
  • a data writing module the data writing module is electrically connected to the data signal line of the display panel, and writes data signals through the data signal line;
  • a driving module the driving module is electrically connected to the data writing module, the driving module is used to receive the data signal of the data writing module, and form a driving current according to the data signal;
  • a sensing module the sensing module is electrically connected to the driving module, the sensing module is used to sense the driving voltage and form a feedback current according to the driving voltage;
  • control module is electrically connected to the driving module and the sensing module;
  • a light-emitting module is electrically connected to the driving module, the sensing module and the control module;
  • control module is used to receive a high-level signal, and perform an aging test on the light-emitting module according to the driving voltage and the feedback current, and at least one thin film transistor and a capacitor are provided in the driving module, so The thin film transistor is electrically connected to the capacitor.
  • the driving module includes a first thin film transistor, a drain of the first thin film transistor is electrically connected to a voltage terminal, and a gate of the first thin film transistor is electrically connected to the data writing module. , and the source of the first thin film transistor is electrically connected to the light emitting module, the sensing module and the control module.
  • the driving module further includes a capacitor, one end of the capacitor is electrically connected to the gate, and the other end of the capacitor is electrically connected to the source.
  • the data writing module includes a second thin film transistor, a drain of the second thin film transistor is electrically connected to the data signal line, and a source of the second thin film transistor is electrically connected to the driver. Module electrical connections.
  • the pixel driving circuit further includes a first control signal line, and the first control signal line is electrically connected to the gate of the second thin film transistor.
  • the sensing module includes a third thin film transistor, and the source of the third thin film transistor is electrically connected to the driving module, the light emitting module and the control module.
  • the pixel driving circuit further includes a second control signal line, and the second control signal line is electrically connected to the gate of the third thin film transistor.
  • a second aspect of the embodiments of the present invention provides a display panel.
  • the display panel includes an aging test circuit.
  • the aging test circuit includes a plurality of pixel driving circuits.
  • the pixel driving circuit includes:
  • a data writing module the data writing module is electrically connected to the data signal line of the display panel, and writes data signals through the data signal line;
  • a driving module the driving module is electrically connected to the data writing module, the driving module is used to receive the data signal of the data writing module, and form a driving current according to the data signal;
  • a sensing module the sensing module is electrically connected to the driving module, the sensing module is used to sense the driving voltage and form a feedback current according to the driving voltage;
  • control module is electrically connected to the driving module and the sensing module;
  • a light-emitting module is electrically connected to the driving module, the sensing module and the control module;
  • control module is used to receive a high-level signal, and perform an aging test on the light-emitting module according to the driving voltage and the feedback current.
  • the driving module includes a first thin film transistor, a drain of the first thin film transistor is electrically connected to a voltage terminal, and a gate of the first thin film transistor is electrically connected to the data writing module. , and the source of the first thin film transistor is electrically connected to the light emitting module, the sensing module and the control module.
  • the driving module further includes a capacitor, one end of the capacitor is electrically connected to the gate, and the other end of the capacitor is electrically connected to the source.
  • the data writing module includes a second thin film transistor, a drain of the second thin film transistor is electrically connected to the data signal line, and a source of the second thin film transistor is connected to the driver Module electrical connections.
  • the pixel driving circuit further includes a first control signal line, and the first control signal line is electrically connected to the gate of the second thin film transistor.
  • the sensing module includes a third thin film transistor, and the source of the third thin film transistor is electrically connected to the driving module, the light emitting module and the control module.
  • the pixel driving circuit further includes a second control signal line, and the second control signal line is electrically connected to the gate of the third thin film transistor.
  • the control module includes a fourth thin film transistor, a drain of the fourth thin film transistor is electrically connected to the data signal line, and a source of the fourth thin film transistor is connected to the light emitting module,
  • the driving module and the sensing module are electrically connected.
  • the pixel driving circuit further includes a third control signal line, and the gate of the fourth thin film transistor is electrically connected to the third control signal line.
  • the third control signal line is used to provide a high-level signal to the gate of the fourth thin film transistor.
  • the pixel driving circuit includes a first pixel driving circuit, a second pixel driving circuit and a third pixel driving circuit.
  • the first pixel driving circuit, the second pixel driving circuit and the third pixel driving circuit The three pixel driving circuits are respectively arranged in the light-emitting pixel areas of different colors, and the sensing module in the first pixel driving circuit, the sensing module in the second pixel driving circuit and the third pixel driving circuit The sensing module is electrically connected.
  • drains of corresponding third thin film transistors in each pixel driving circuit are electrically connected to each other.
  • an aging test method for a display panel including the following steps:
  • the aging test circuit includes a plurality of pixel drive circuits, and the aging test circuit is the pixel drive circuit provided in the embodiment of the present invention
  • Embodiments of the present invention provide a display panel and an aging test method for the display panel.
  • the aging test circuit includes a plurality of pixel driving circuits, where the pixel driving circuit includes a data writing module, a driving module, a sensing module, a control module and a light-emitting module. Each module is connected correspondingly, and at the same time, thin film transistors with different functions are set in the corresponding modules.
  • a high-level signal is provided to the control module to control the test current flow to the light-emitting module. module. This further reduces the impact of factors such as current in the circuit on the aging test effect of the device, thereby effectively improving the aging test effect of the display panel and improving the overall performance of the display panel.
  • Figure 1 takes the circuit corresponding to the red light-emitting pixel area as an example for illustration
  • Figure 2 is a schematic structural diagram of the aging test circuit in the display panel provided by the embodiment of the present invention.
  • Figure 3 is a schematic diagram of the circuit structure corresponding to another aging test circuit provided in an embodiment of the present invention.
  • Figure 4 is a schematic diagram of the corresponding curves during aging treatment of light-emitting diodes in different pixel driving circuits
  • Figure 5 is a schematic flow chart of the testing method provided in the embodiment of the present invention.
  • Figure 6 shows the structure of the aging test circuit in the light-emitting pixel areas of different colors provided by the embodiment of the present invention.
  • FIG. 1 is a schematic structural diagram of a corresponding pixel driving circuit in a display panel provided in the prior art. After the display panel is prepared, the light-emitting device needs to be subjected to aging testing to improve the service life and display quality of the light-emitting device.
  • the existing 3T1C pixel driving circuit includes: a first thin film transistor T1, a second thin film transistor T2, a third thin film transistor T3 and a capacitor Cst.
  • the WR signal line controls the conduction of the second thin film transistor T2.
  • the data signal line R_Data passes through T2 and enters the gate of T1 and the capacitor Cst. Then T2 is turned off.
  • the gate voltage of T1 Due to the storage function of the capacitor Cst, the gate voltage of T1 The data signal voltage can still be maintained, so that T1 is in a conductive state, and the driving current enters the organic light-emitting diode OLED through T1. At the same time, the threshold voltage Vth of T1 in the driving circuit is sensed through T3 to compensate for the threshold voltage Vth.
  • Embodiments of the present invention provide a display panel and an aging test method of the display panel to effectively improve the tendency of the thin film transistor inside the pixel driving circuit to easily When electrical drift occurs, the light-emitting device is prone to large brightness fluctuations and improves the overall performance of the display panel.
  • FIG. 2 is a schematic structural diagram of an aging test circuit in a display panel according to an embodiment of the present invention.
  • the display panel includes an aging test circuit.
  • the aging test circuit includes multiple pixel driving circuits. Multiple pixel driving circuits can correspond to different light-emitting pixels, such as red light-emitting pixels, blue light-emitting pixels and green light-emitting pixels respectively.
  • a pixel driving circuit corresponding to a red emitting pixel is taken as an example for description.
  • the pixel driving circuit 20 includes a data writing module 220, a driving module 221, a sensing module 222, a control module 223 and a light emitting module 224.
  • the data signal lines and the scanning signal lines are staggered to form corresponding light-emitting units.
  • the data writing module 220 is electrically connected to the data signal line and the scanning signal line, and writes data signals through the data signal lines of the display panel.
  • the data writing module 220 is electrically connected to the driving module 221.
  • the driving module 221 is used to receive the data signal from the data writing module 220 and form a driving current according to the data signal.
  • one end of the driving module 221 is also connected to the driving voltage VDD, and the operating voltage is provided through the driving voltage VDD.
  • the sensing module 222 is electrically connected to the driving module 221.
  • the sensing module 222 is used to sense the driving current or voltage in the driving module 221, and form a feedback current to the driving module according to the sensed data, so as to Make compensation.
  • the threshold voltage or current of the driving module 221 is sensed and the threshold voltage or current is compensated to ensure normal lighting of the display panel.
  • control module 223 is electrically connected to the driving module 221 and the sensing module 222.
  • the control module 223 performs an aging test on the light-emitting device according to the driving voltage in the driving module and the feedback current in the sensing module 222.
  • the pixel driving circuit also includes a light-emitting module 224.
  • One end of the light-emitting module is electrically connected to the driving module 221, the sensing module 222 and the control module 223. Under the action of the above-mentioned modules, it normally emits light and performs aging tests.
  • the pixel driving circuit also includes a first control signal line 211, a second control signal line 212, a third control signal line 213 and a data signal line 214.
  • the first control signal line 211 may be a read data signal line
  • the first control signal line 211 is electrically connected to one end of the sensing module 222 to transmit a control signal to the sensing module 222 .
  • the second control signal line 212 may be a scanning signal line.
  • the second control signal line 212 is electrically connected to one end of the data writing module 220 and provides scanning signals to the data writing module 220 through the second control signal line 212 .
  • the third control signal line 213 is electrically connected to one end of the control module 223 .
  • the third control signal line 213 is used to provide a control signal to the control module 223 and ensure the aging test of the light-emitting module 224.
  • the data signal line 214 is electrically connected to the data writing module 220 and the control module 223 at the same time.
  • a high-level signal is provided to the third control signal line 213.
  • the high-level signal drives the control module 223 to work and forms an aging current.
  • the control module operates according to the The driving voltage and the feedback current in the sensing module are used to perform an aging test on the light-emitting module.
  • FIG. 3 is a schematic diagram of the circuit structure corresponding to another aging test circuit provided in an embodiment of the present invention.
  • each of the above modules may include at least one thin film transistor.
  • the driving module 221 includes a first thin film transistor T1 and a capacitor Cst.
  • the data writing module 220 includes a second thin film transistor T2
  • the sensing module 222 includes a third thin film transistor T3
  • the control module 223 includes a fourth thin film transistor T4.
  • the gate of the second thin film transistor T2 is electrically connected to the second control signal line 212
  • the drain of the second thin film transistor T2 is electrically connected to the data signal line 214
  • the second thin film transistor T2 is electrically connected to the data signal line 214.
  • the source of T2 is electrically connected to one end of the capacitor Cst and the gate of the first thin film transistor T1.
  • the drain of the first thin film transistor T1 is electrically connected to the VDD voltage terminal
  • the gate of the first thin film transistor T1 is electrically connected to one end of the capacitor Cst, and at the same time, the other end of the capacitor Cst is connected to the source of the first thin film transistor T1.
  • the source electrode of the first thin film transistor T1 is electrically connected to the source electrode of the third thin film transistor T3.
  • the gate of the third thin film transistor T3 is electrically connected to the first control signal line 211, and the source of the third thin film transistor T3 is simultaneously connected to the source of the first thin film transistor T1, the other end of the capacitor Cst, and the fourth thin film transistor.
  • the source electrode of T4 is electrically connected to one end of the light-emitting diode 301, and the drain electrode of the third thin film transistor T3 is electrically connected to the corresponding thin film transistor in another pixel driving circuit.
  • the gate of the fourth thin film transistor T4 is electrically connected to the third control signal line 213, the drain of the fourth thin film transistor T4 is electrically connected to the data signal line 214, and the source of the fourth thin film transistor T4 is simultaneously connected to the capacitor Cst.
  • the other end of the first thin film transistor T1 , the source electrode of the third thin film transistor T3 and one end of the light emitting diode 301 are electrically connected.
  • the third control signal line 213 provides a high potential
  • the fourth thin film transistor T4 is fully turned on. At this time, the corresponding operating current and voltage of the fourth thin film transistor T4 are in the linear region, and the fourth thin film transistor T4 is equivalent to a resistor.
  • the current in the pixel driving circuit can flow in the direction marked by the dotted line in Figure 3, thereby driving the light-emitting diode 301 in the red light-emitting pixel area to emit light and complete the L-Aging process.
  • FIG. 4 is a schematic diagram of the corresponding aging curves of light-emitting diodes in different pixel driving circuits during the aging process. It can be seen from the curve diagram that when performing an aging test on a light-emitting diode, its brightness will fluctuate to a certain extent in the early stages of lighting, and will drop rapidly when it reaches a certain brightness. This leads to color casts and reduced lifespan of the display panel.
  • Figure a is a schematic diagram of the aging curve corresponding to the pixel driving circuit structure in the prior art
  • Figure B is a schematic diagram of the aging curve corresponding to the pixel driving circuit structure provided in the embodiment of the present invention.
  • the third control signal line is given a high potential so that the fourth thin film transistor T4 corresponding to the red sub-pixel is fully turned on.
  • the fourth thin film transistor T4 can linearly At this time, it can be equivalent to a resistor, and the data signal line then inputs the corresponding electrical signal, thereby driving the red light-emitting diode to emit light and completing the aging test.
  • I ds ⁇ C ox ⁇ W ⁇ (V gs -V th ) ⁇ V ds /L
  • V ds ⁇ (V gs -V th ) ⁇ V ds /L
  • the third control signal line provides a high-level signal, preferably the high-level signal is 15V.
  • the Vg voltage corresponding to the fourth thin film transistor T4 It is very large, that is, Vgs-Vth>>Vds, which meets the conditions for the thin film transistor to operate in the linear region.
  • the fourth thin film transistor T4 is fully turned on.
  • One end of the fourth thin film transistor T4 connected to the data signal line is the drain terminal (d), and the other end is the source electrode (s) and is electrically connected to one end of the light emitting diode.
  • the conductive channel of the thin film transistor is not significantly narrowed, I ds is proportional to V ds , and the channel functions as a resistor.
  • the current formula of a thin film transistor in the saturation region is: Among them, Vds>Vgs-Vth.
  • an embodiment of the present invention also provides an aging test method for a display panel.
  • Figure 5 is a schematic flow chart of the testing method provided in the embodiment of the present invention. When performing aging testing on light-emitting diodes, the following steps are included:
  • the aging test circuit includes multiple pixel driving circuits.
  • the pixel driving circuit is the circuit structure provided in the embodiment of the present invention.
  • S101 Perform an aging test on corresponding light-emitting modules in different pixel driving circuits, wherein a high-level signal is provided to the third control signal line in the pixel driving circuit, and the corresponding light-emitting modules in different pixel driving circuits are tested. Aging is performed, and when a high-level signal is provided to the third control signal line, a low-level signal is provided to the corresponding data signal line in the pixel driving circuit in the circuit that has not been subjected to aging testing.
  • FIG. 6 is an aging test circuit structure in the light-emitting pixel area of different colors provided by an embodiment of the present invention.
  • the aging test circuit includes a first pixel driving circuit 21 corresponding to the red emitting pixel area, a second pixel driving circuit 22 corresponding to the green emitting pixel area, and a third pixel driving circuit 23 corresponding to the blue emitting pixel area.
  • Each driving circuit is provided with a data signal line 214, a data signal line 2141 and a data signal line 2142 correspondingly, and different data signal lines provide different data signals.
  • the sensing module in the first pixel driving circuit 21 is electrically connected to the sensing module in the third pixel driving circuit 23 .
  • the drain electrode of the third thin film transistor T3 in the first pixel driving circuit 21 and the drain electrode of the third thin film transistor T3 in the second pixel driving circuit 22 and the third thin film transistor T3 in the third pixel driving circuit 23 are The drain is electrically connected.
  • the data signal line 214 and the data signal line 2142 are set to a low potential, and the third control signal line 213 is set to a high potential. At this time, only the light-emitting diodes in the green emitting pixel area are emit light, while the light-emitting diodes in the red and blue emitting pixel areas do not emit light.
  • the third control signal line 213 gives a low-level signal, and the fourth thin film transistor T4 is turned off, thereby ensuring that the light-emitting diodes in the pixel driving circuit can light up normally and can be aged normally under high current conditions.
  • the line width of the third control signal line 213 can be designed to be wider than the first control signal line 211 and the third control signal line 213 .
  • the line width of the second control signal line 212 should be small, so that the area occupied by the opening area of the display panel can be further reduced, which is beneficial to completing aging without greatly damaging the aperture ratio.
  • the aging test circuit in the embodiment of the present invention can effectively reduce the electrical changes of the thin film transistor in different parts of the panel, and effectively reduce and improve the aging process. During the process, the thin film transistor experiences electrical drift.
  • embodiments of the present invention also provide a display device.
  • the display device includes a display panel, and the display panel is internally provided with the pixel driving circuit provided in the embodiment of the present invention.
  • the display panel and display device can be: OLED panels, mobile phones, computers, electronic paper, monitors, notebook computers, digital photo frames and other products or components with display functions, and their specific types are not specifically limited.

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Theoretical Computer Science (AREA)
  • Control Of Indicators Other Than Cathode Ray Tubes (AREA)
  • Electroluminescent Light Sources (AREA)

Abstract

一种显示面板及显示面板的老化测试方法。其中包括数据写入模块（220）、驱动模块（221）、感测模块（222）、控制模块（223）及发光模块（224）。在各模块内设置不同器件，当对显示面板进行老化测试时，向控制模块（223）提供高电平信号，从而控制测试电流流向发光模块（224）。进而改善大电流对测试效果的影响，并提高显示面板的综合性能。

Description

显示面板及显示面板的老化测试方法 技术领域
本发明涉及显示面板的显示技术领域，具体涉及一种显示面板及显示面板的老化测试方法。
背景技术
随着显示面板制备工艺等显示技术的发展，人们对显示面板及装置的性能及质量均提出了更高的要求。
显示面板制备完成后，需要对显示面板的各项性能及参数进行检测并优化。在有机发光二极管(Organic light-emitting diode,OLED)显示器件中，OLED具有自发光、轻薄、低功耗以及响应速度快等特性，而被广泛应用于多种显示领域中。其中，在对OLED器件的进行评价时，OLED器件的寿命是其中的一个重要指标。因此，现有技术中，OLED制备过程中，通常需要对制备完成后的OLED器件进行寿命老化(Lifetime-Aging，L-Aging)工艺。在进行L-Aging工艺时，电路架构的电路设计，测试环境以及测试的电流密度为主要的测试影响因素。具体的，在现有的像素驱动电路中，对发光器件进行老化测试时，往往在对器件进行点亮的初期，有机发光器件会存在亮度的波动，或者在对其进行测试的初期，其亮度会出现快速下降。进而导致显示器件出现显示色偏，并导致器件的使用寿命和品质下降，不利于器件性能的提高。
因此需要对现有技术中的问题提出解决方法。
技术问题
综上所述，现有技术在对显示器件进行老化测试时，在老化测试的初期，发光器件会存在较大的亮度波动，进而导致显示器件出现色偏，并导致器件的寿命和品质下降等问题。不利于显示器件综合性能的提高。
技术解决方案
为解决上述问题，本发明实施例提供一种显示面板及显示面板的 老化测试方法。以有效的改善显示面板在进行老化测试的初期，发光器件容易出现较大的波动，进而使得显示器件出现色偏以及品质下降等问题。
为解决上述技术问题，本发明实施例所提供的技术方法如下：
本发明实施例的第一方面，提供了一种显示面板，所述显示面板包括老化测试电路，所述老化测试电路包括多个像素驱动电路，所述像素驱动电路包括：
数据写入模块，所述数据写入模块与所述显示面板的数据信号线电连接，并通过所述数据信号线写入数据信号；
驱动模块，所述驱动模块与所述数据写入模块电连接，所述驱动模块用以接收所述数据写入模块的数据信号，并根据所述数据信号形成驱动电流；
感测模块，所述感测模块与所述驱动模块电连接，所述感测模块用以感测所述驱动电压，并根据所述驱动电压形成反馈电流；
控制模块，所述控制模块与所述驱动模块以及所述感测模块电连接；以及，
发光模块，所述发光模块与所述驱动模块、所述感测模块以及所述控制模块电连接；
其中，所述控制模块用以接收高电平信号，并根据所述驱动电压以及所述反馈电流对所述发光模块进行老化测试，且所述驱动模块内设置有至少一薄膜晶体管以及电容，所述薄膜晶体管与所述电容对应电连接。
根据本发明一实施例，所述驱动模块包括第一薄膜晶体管，所述第一薄膜晶体管的漏极与电压端电连接，所述第一薄膜晶体管的栅极与所述数据写入模块电连接，且所述第一薄膜晶体管的源极与所述发光模块、所述感测模块以及所述控制模块电连接。
根据本发明一实施例，所述驱动模块还包括电容，所述电容的一端与所述栅极电连接，所述电容的另一端与所述源极电连接。
根据本发明一实施例，所述数据写入模块包括第二薄膜晶体管， 所述第二薄膜晶体管的漏极与所述数据信号线电连接，所述第二薄膜晶体管的源极与所述驱动模块电连接。
根据本发明一实施例，所述像素驱动电路还包括第一控制信号线，所述第一控制信号线与所述第二薄膜晶体管的栅极电连接。
根据本发明一实施例，所述感测模块包括第三薄膜晶体管，所述第三薄膜晶体管的源极与所述驱动模块、所述发光模块以及所述控制模块电连接。
根据本发明一实施例，所述像素驱动电路还包括第二控制信号线，所述第二控制信号线与所述第三薄膜晶体管的栅极电连接。
本发明实施例的第二方面，提供了一种显示面板，所述显示面板包括老化测试电路，所述老化测试电路包括多个像素驱动电路，所述像素驱动电路包括：
数据写入模块，所述数据写入模块与所述显示面板的数据信号线电连接，并通过所述数据信号线写入数据信号；
驱动模块，所述驱动模块与所述数据写入模块电连接，所述驱动模块用以接收所述数据写入模块的数据信号，并根据所述数据信号形成驱动电流；
感测模块，所述感测模块与所述驱动模块电连接，所述感测模块用以感测所述驱动电压，并根据所述驱动电压形成反馈电流；
控制模块，所述控制模块与所述驱动模块以及所述感测模块电连接；以及，
发光模块，所述发光模块与所述驱动模块、所述感测模块以及所述控制模块电连接；
其中，所述控制模块用以接收高电平信号，并根据所述驱动电压以及所述反馈电流对所述发光模块进行老化测试。
根据本发明一实施例，所述驱动模块包括第一薄膜晶体管，所述第一薄膜晶体管的漏极与电压端电连接，所述第一薄膜晶体管的栅极与所述数据写入模块电连接，且所述第一薄膜晶体管的源极与所述发 光模块、所述感测模块以及所述控制模块电连接。
根据本发明一实施例，所述驱动模块还包括电容，所述电容的一端与所述栅极电连接，所述电容的另一端与所述源极电连接。
根据本发明一实施例，所述数据写入模块包括第二薄膜晶体管，所述第二薄膜晶体管的漏极与所述数据信号线电连接，所述第二薄膜晶体管的源极与所述驱动模块电连接。
根据本发明一实施例，所述像素驱动电路还包括第一控制信号线，所述第一控制信号线与所述第二薄膜晶体管的栅极电连接。
根据本发明一实施例，所述感测模块包括第三薄膜晶体管，所述第三薄膜晶体管的源极与所述驱动模块、所述发光模块以及所述控制模块电连接。
根据本发明一实施例，所述像素驱动电路还包括第二控制信号线，所述第二控制信号线与所述第三薄膜晶体管的栅极电连接。
根据本发明一实施例，所述控制模块包括第四薄膜晶体管，所述第四薄膜晶体管的漏极与所述数据信号线电连接，所述第四薄膜晶体管的源极与所述发光模块、所述驱动模块以及所述感测模块电连接。
根据本发明一实施例，所述像素驱动电路还包括第三控制信号线，所述第四薄膜晶体管的栅极与所述第三控制信号线电连接。
根据本发明一实施例，所述第三控制信号线用以向所述第四薄膜晶体管的栅极提供高电平信号。
根据本发明一实施例，所述像素驱动电路包括第一像素驱动电路，第二像素驱动电路以及第三像素驱动电路，所述第一像素驱动电路、所述第二像素驱动电路以及所述第三像素驱动电路对应设置在不同颜色的发光像素区域内，且所述第一像素驱动电路中的感测模块与所述第二像素驱动电路中的感测模块以及所述第三像素驱动电路中的感测模块电连接。
根据本发明一实施例，各像素驱动电路中对应的第三薄膜晶体管的漏极相互电连接。
根据本发明的第三方面，还提供一种显示面板的老化测试方法， 包括如下步骤：
提供一老化测试电路，所述老化测试电路包括多个像素驱动电路，且所述老化测试电路为本发明实施例中提供的像素驱动电路；
对不同所述像素驱动电路中对应的发光模块进行老化测试，其中，向所述像素驱动电路中的第三控制信号线提供高电平信号，并对不同像素驱动电路中对应的发光模块进行老化，且在向所述第三控制信号线提供高电平信号时，向未进行老化测试电路中对应的所述像素驱动电路中的数据信号线提供低电平信号。
有益效果
综上所述，本发明实施例的有益效果为：
本发明实施例提供一种显示面板及显示面板的老化测试方法。老化测试电路包括中包括多个像素驱动电路，其中，像素驱动电路包括数据写入模块、驱动模块、感测模块、控制模块以及发光模块。各模块之间对应连接，同时，在对应的模块内设置不同功能的薄膜晶体管，当对显示面板内的发光模块进行老化测试时，向控制模块提供高电平信号，从而控制测试电流流向该发光模块。进而减小电路中的电流等因素对该器件老化测试效果的影响，从而有效的提高显示面板的老化测试效果，并提高显示面板的综合性能。
附图说明
图1中以红色发光像素区域对应的电路为例进行说明；
图2为本发明实施例提供的显示面板内的老化测试电路结构示意图；
图3为本发明实施例中提供的另一老化测试电路对应的电路结构示意图；
图4为不同的像素驱动电路中的发光二极管在老化处理时对应的曲线示意图；
图5为本发明实施例中提供的测试方法流程示意图；
图6为本发明实施例提供的不同颜色的发光像素区域内的老化 测试电路结构。
本发明的最佳实施方式
以下各实施例的说明是参考附加的图式，用以例示本揭示可用以实施的特定实施例。
随着显示面板制备技术的不断发展，人们对显示面板的质量以及显示效果均提出了更高的要求。
如图1所示，图1为现有技术中提供的显示面板内对应的像素驱动电路结构示意图。显示面板制备完成后，需要对发光器件进行老化测试，以提升发光器件的使用寿命和显示品质。
像素驱动电路在进行工作时，如图1中以红色发光像素区域对应的电路为例进行说明。现有的3T1C像素驱动电路包括：第一薄膜晶体管T1，第二薄膜晶体管T2、第三薄膜晶体管T3以及电容Cst。OLED显示时，WR信号线控制第二薄膜晶体管T2的导通，数据信号线R_Data经过T2进入到T1的栅极及电容Cst，然后T2关断，由于电容Cst的存储作用，T1的栅极电压仍可继续保持数据信号电压，从而使T1处于导通状态，驱动电流通过T1进入到有机发光二极管OLED。同时，通过T3感测驱动电路中T1的阈值电压Vth，以对该阈值电压Vth进行补偿。
但是，现有技术中，在对上述OLED进行老化测试并补偿时，其只能补偿驱动薄膜晶体管的阈值电压Vth，而无法补偿OLED老化对亮度的影响，当OLED老化时，测试温度较高，测试电流较大，其K值会漂移，进而导致显示面板的亮度以及发光效率降低。
本发明实施例提供一种显示面板及显示面板的老化测试方法，以有效的改善显示面板在进行老化测试时，在较高的测试温度以及大电流的作用下，像素驱动电路内部的薄膜晶体管容易发生电性漂移，发光器件容易出现较大亮度波动的问题，并提高显示面板的综合性能。
如图2所示，图2为本发明实施例提供的显示面板内的老化测试电路结构示意图。本发明实施例中，该显示面板内包括老化测试电路。 且该老化测试电路包括多个像素驱动电路。多个像素驱动电路可对应不同的发光像素，如分别对应红色发光像素、蓝色发光像素以及绿色发光像素。本发明实施例中，以红色发光像素对应的像素驱动电路为例进行说明。
本发明实施例中，该像素驱动电路20包括数据写入模块220、驱动模块221、感测模块222、控制模块223以及发光模块224。同时，在该像素驱动电路20中，数据信号线与扫描信号线交错分布，以形成对应的发光单元。具体的，该数据写入模块220与该数据信号线以及扫描信号线电连接，通过显示面板的数据信号线写入数据信号。
其中，该数据写入模块220与驱动模块221电连接，驱动模块221用以接收该数据写入模块220的数据信号，并根据该数据信号形成驱动电流。同时，驱动模块221的一端还与驱动电压VDD连接，通过驱动电压VDD为其提供工作电压。
进一步的，感测模块222与该驱动模块221电连接，感测模块222用以感测驱动模块221中的驱动电流或者电压，并根据所感测到的数据对驱动模块形成反馈电流，以对其进行补偿。如感测驱动模块221的阈值电压或电流，并对该阈值电压或电流进行补偿，以保证显示面板的正常发光。
同时，该控制模块223与驱动模块221以及感测模块222电连接，该控制模块223根据驱动模块中的驱动电压以及感测模块222中的反馈电流对发光器件进行老化测试。
进一步的，该像素驱动电路还包括发光模块224，该发光模块的一端与驱动模块221、感测模块222以及控制模块223电连接，在上述各模块的作用下正常发光并进行老化测试。
本发明实施例中，该像素驱动电路中还包括第一控制信号线211、第二控制信号线212、第三控制信号线213以及数据信号线214。具体的，该第一控制信号线211可为读取数据信号线，该第一控制信号线211与感测模块222的一端电连接，以向该感测模块222传输控制信号。
第二控制信号线212可为扫描信号线，该第二控制信号线212与数据写入模块220的一端电连接，通过该第二控制信号线212向数据写入模块220提供扫描信号。
同时，该第三控制信号线213与控制模块223的一端电连接。通过该第三控制信号线213以向该控制模块223提供控制信号，并保证对发光模块224的老化测试。
本发明实施例中，该数据信号线214同时与数据写入模块220以及控制模块223电连接。在对该发光模块224进行老化测试时，向该第三控制信号线213提供高电平信号，该高电平信号驱动控制模块223工作，并形成老化电流，同时该控制模块根据驱动模块中的驱动电压以及感测模块中的反馈电流以对该发光模块进行老化测试。
如图3所示，图3为本发明实施例中提供的另一老化测试电路对应的电路结构示意图。结合图2中的电路结构，本发明实施例中，在上述各个模块内可至少包括一个薄膜晶体管。具体的，该驱动模块221内包括第一薄膜晶体管T1以及电容Cst。该数据写入模块220中包括第二薄膜晶体管T2，该感测模块222中包括第三薄膜晶体管T3，同时该控制模块223内包括第四薄膜晶体管T4。
具体的，在本发明实施例中，第二薄膜晶体管T2的栅极与第二控制信号线212电连接，第二薄膜晶体管T2的漏极与数据信号线214电连接，且该第二薄膜晶体管T2的源极同时与电容Cst的一端，以及第一薄膜晶体管T1的栅极电连接。
进一步的，第一薄膜晶体管T1的漏极与VDD电压端电连接，第一薄膜晶体管T1的栅极与电容Cst的一端电连接，同时，该电容Cst的另一端与第一薄膜晶体管T1的源极电连接，且该第一薄膜晶体管T1的源极与第三薄膜晶体管T3的源极电连接。
同时，该第三薄膜晶体管T3的栅极与第一控制信号线211电连接，第三薄膜晶体管T3的源极同时与第一薄膜晶体管T1的源极、电容Cst的另一端、第四薄膜晶体管T4的源极以及发光二极管301的一端电连接，且第三薄膜晶体管T3的漏极与另一像素驱动电路中 对应的薄膜晶体管电连接。
进一步的，第四薄膜晶体管T4的栅极与第三控制信号线213电连接，且第四薄膜晶体管T4的漏极与数据信号线214电连接，第四薄膜晶体管T4的源极同时与电容Cst的另一端、第一薄膜晶体管T1的源极、第三薄膜晶体管T3的源极以及发光二极管301的一端电连接。
本发明实施例中，当对该发光二极管进行老化测试时，在其L-Aging阶段，当需要对该发光二极管对应的红色像素驱动电路进行老化工艺时，第三控制信号线213提供高电位，第四薄膜晶体管T4完全打开，此时第四薄膜晶体管T4对应的工作电流以及电压在线性区内，且该第四薄膜晶体管T4等效于一个电阻，当数据信号线214再向第四薄膜晶体管提供数据信号时，该像素驱动电路中的电流就可以按照图3中的虚线的标注方向进行流动，从而驱动该红色发光像素区域内的发光二极管301发光并完成L-Aging处理。
如图4所示，图4为不同的像素驱动电路中的发光二极管在老化处理时对应的老化曲线示意图。有曲线示意图可知，在对发光二极管进行老化测试时，在点亮的初期，其亮度都会出现一定程度的亮度波动，如到达一定亮度时会快速下降。从而导致显示面板出现色偏以及寿命下降的问题。
在图4中，a图为现有技术中的像素驱动电路结构下对应的老化曲线示意图，b图对应的为本发明实施例中提供的像素驱动电路结构下对应的老化曲线示意图。当采用本发明实施例中提供的老化测试电路时，在T＝0时刻，在有机发光器件被点亮的初期，该老化曲线会左移，进而将初期的不稳定性随之消除，以减小初期不稳定出现的色偏问题。并且可知当该曲线的亮度均降到50％时，本发明实施例中的老化曲线均能位于该线性区域内，从而有效的降低了在老化过程中，像素驱动电路在大电流作用下，电路内部的薄膜晶体管容易出现电性漂移，以及显示面板容易出现色偏的问题。
进一步的，结合图2-图4，在本发明实施例中，当对该显示面板 内的发光器件进行老化测试时，在L-Aging阶段，例如当对该发光二极管的红色子像素进行整面的L-Aging处理时，第三控制信号线给高电位，以使红色子像素对应的第四薄膜晶体管T4完全打开，此时，在该老化电路的作用下，第四薄膜晶体管T4能在线性区工作，此时，其可等效于一个电阻，数据信号线随之给入相应的电信号，进而驱动红色发光二极管发光并完成老化测试。
具体的，当第四薄膜晶体管T4在线性工作区内工作时，根据其输出特性I ds曲线可知，I ds＝μ·C ox·W·(V gs-V th)·V ds/L，其中V ds<<(V gs-V th)，μ为电子的迁移速度，C ox为单位面积栅氧化层电容，W/L为氧化层宽长比，V gs-V th为过驱动电压。
在进行老化处理时，第三控制信号线提供高电平信号，优选的该高电平信号为15V，当该高电平信号的电压值为15V时，该第四薄膜晶体管T4对应的Vg电压很大，即Vgs-Vth>>Vds，满足薄膜晶体管线性区工作的条件。此时，第四薄膜晶体管T4充分打开，第四薄膜晶体管T4连接数据信号线的一端为漏极端(d)，另一端为源极(s)与发光二极管的一端电连接。此时，在Vds较小的电压范围内，薄膜晶体管导电沟道变窄不明显，I ds与V ds成正比关系，沟道的作用相当于一个电阻。
与此对应的，薄膜晶体管在饱和区的电流公式为：
Figure PCTCN2022088529-appb-000001
其中，Vds>Vgs-Vth。
在L-Aging时，希望整面能以均匀的电流进行老化，从而对面内OLED进行无差别的老化，这要求面内薄膜晶体管对应的I ds电流差异越小越好。根据上述电流公式可知，在饱和区I ds与V th成平方关系，而在线性区I ds与V th成一次关系，因此采用线性区对发光二极管进行老化，其对应的Ids的差异较小，从而能比较均匀地对发光二极管进行老化。
优选的，本发明实施例还提供一种显示面板的老化测试方法。如 图5所示，图5为本发明实施例中提供的测试方法流程示意图。在对发光二极管进行老化测试时，包括如下步骤：
S100：提供一老化测试电路，老化测试电路包括多个像素驱动电路，该像素驱动电路为本发明实施例中提供的电路结构；
S101：对不同所述像素驱动电路中对应的发光模块进行老化测试，其中，向所述像素驱动电路中的第三控制信号线提供高电平信号，并对不同像素驱动电路中对应的发光模块进行老化，且在向所述第三控制信号线提供高电平信号时，向未进行老化测试电路中对应的所述像素驱动电路中的数据信号线提供低电平信号。
进一步的，如图6所示，图6为本发明实施例提供的不同颜色的发光像素区域内的老化测试电路结构。本发明实施例中，该老化测试电路以红色发光像素区域对应的第一像素驱动电路21、绿色发光像素区域对应的第二像素驱动电路22以及蓝色发光像素区域对应的第三像素驱动电路23为例进行说明。各驱动电路中对应设置有数据信号线214、数据信号线2141以及数据信号线2142，不同的数据信号线提供不同的数据信号。
进一步的，第一像素驱动电路21中的感测模块与第三像素驱动电路23中的感测模块电连接。具体的，第一像素驱动电路21内的第三薄膜晶体管T3的漏极与第二像素驱动电路22内的第三薄膜晶体管T3的漏极以及第三像素驱动电路23内的第三薄膜晶体管T3的漏极电连接。
结合图2-图4，以及图5中的老化测试方法。当对上述不同像素驱动电路内的发光二极管进行老化时，第三控制信号线213提供高电平信号，数据信号线2141和数据信号线2142提供低电平信号。此时第三控制信号线213的高电位虽然也把绿色、蓝色发光像素区域内的第四薄膜晶体管T4的栅极打开，但由于数据信号线2141和数据信号线2142提供低电平信号，此时并没有电流流过绿色和蓝色发光像素区域内的发光二极管，从而实现仅对红色发光像素区域内的发光二极管进行老化处理。
同样地，当需要对绿色子像素进行L-Aging时，将数据信号线214和数据信号线2142给低电位，第三控制信号线213给高电位，此时只有绿色发光像素区域内的发光二极管发光，而红色、蓝色发光像素区域内的发光二极管不发光。
而在正常发光阶段，第三控制信号线213给低电平信号，第四薄膜晶体管T4关闭，从而保证像素驱动电路内的发光二极管能正常点亮，并能在大电流情况下正常老化处理。
特别的，在进行老化时，采用的是直流的信号，直流信号对信号延迟没有太高的要求，因此第三控制信号线213走线的线宽可以设计成比第一控制信号线211和第二控制信号线212的线宽要小，这样挤占显示面板的开口区的面积可以进一步缩小，有利于在不较大损害开口率的前提下完成老化。
因此，当对显示面板在较高温度并采用大电流作用进行老化时，本发明实施例中的老化测试电路，能有效的降低面板不同处的薄膜晶体管电性变化，并有效的降低改善在老化过程中薄膜晶体管出现电性漂移。
同时，本发明实施例还提供一种显示装置，该显示装置包括显示面板，且该显示面板内部设置有本发明实施例中所提供的像素驱动电路。该显示面板以及显示装置可为：OLED面板、手机、电脑、电子纸、显示器、笔记本电脑、数码相框等任何具有显示功能的产品或部件，其具体类型不做具体限制。
以上对本发明实施例所提供的一种显示面板及显示面板的老化测试方法进行了详细介绍，本文中应用了具体个例对本发明的原理及实施方式进行了阐述，以上实施例的说明只是用于帮助理解本发明的技术方案及其核心思想；本领域的普通技术人员应当理解：其依然可以对前述各实施例所记载的技术方案进行修改，或者对其中部分技术特征进行等同替换；而这些修改或者替换，并不使相应技术方案的本质脱离本发明各实施例的技术方案的范围。

Claims (20)

  1. 一种显示面板，包括一老化测试电路，所述老化测试电路包括多个像素驱动电路，所述像素驱动电路包括：
    数据写入模块，所述数据写入模块与所述显示面板的数据信号线电连接，并通过所述数据信号线写入数据信号；
    驱动模块，所述驱动模块与所述数据写入模块电连接，所述驱动模块用以接收所述数据写入模块的数据信号，并根据所述数据信号形成驱动电压；
    感测模块，所述感测模块与所述驱动模块电连接，所述感测模块用以感测所述驱动电压，并根据所述驱动电压形成反馈电流；
    控制模块，所述控制模块与所述驱动模块以及所述感测模块电连接；以及，
    发光模块，所述发光模块与所述驱动模块、所述感测模块以及所述控制模块电连接；
    其中，所述控制模块用以接收高电平信号，并根据所述驱动电压以及所述反馈电流对所述发光模块进行老化测试，且所述驱动模块内设置有至少一薄膜晶体管以及电容，所述薄膜晶体管与所述电容对应电连接。
  2. 根据权利要求1所述的显示面板，其中所述驱动模块包括第一薄膜晶体管，所述第一薄膜晶体管的漏极与电压端电连接，所述第一薄膜晶体管的栅极与所述数据写入模块电连接，且所述第一薄膜晶体管的源极与所述发光模块、所述感测模块以及所述控制模块电连接。
  3. 根据权利要求2所述的显示面板，其中所述驱动模块还包括电容，所述电容的一端与所述栅极电连接，所述电容的另一端与所述源极电连接。
  4. 根据权利要求1所述的显示面板，其中所述数据写入模块包括第二薄膜晶体管，所述第二薄膜晶体管的漏极与所述数据信号线电连接，所述第二薄膜晶体管的源极与所述驱动模块电连接。
  5. 根据权利要求4所述的显示面板，其中所述像素驱动电路还包括第一控制信号线，所述第一控制信号线与所述第二薄膜晶体管的栅极电连接。
  6. 根据权利要求1所述的显示面板，其中所述感测模块包括第三薄膜晶体管，所述第三薄膜晶体管的源极与所述驱动模块、所述发光模块以及所述控制模块电连接。
  7. 根据权利要求6所述的显示面板，其中所述像素驱动电路还包括第二控制信号线，所述第二控制信号线与所述第三薄膜晶体管的栅极电连接。
  8. 一种显示面板，包括一老化测试电路，所述老化测试电路包括多个像素驱动电路，所述像素驱动电路包括：
    数据写入模块，所述数据写入模块与所述显示面板的数据信号线电连接，并通过所述数据信号线写入数据信号；
    驱动模块，所述驱动模块与所述数据写入模块电连接，所述驱动模块用以接收所述数据写入模块的数据信号，并根据所述数据信号形成驱动电压；
    感测模块，所述感测模块与所述驱动模块电连接，所述感测模块用以感测所述驱动电压，并根据所述驱动电压形成反馈电流；
    控制模块，所述控制模块与所述驱动模块以及所述感测模块电连接；以及，
    发光模块，所述发光模块与所述驱动模块、所述感测模块以及所述控制模块电连接；
    其中，所述控制模块用以接收高电平信号，并根据所述驱动电压以及所述反馈电流对所述发光模块进行老化测试。
  9. 根据权利要求8所述的显示面板，其中所述驱动模块包括第一薄膜晶体管，所述第一薄膜晶体管的漏极与电压端电连接，所述第一薄膜晶体管的栅极与所述数据写入模块电连接，且所述第一薄膜晶体管的源极与所述发光模块、所述感测模块以及所述控制模块电连接。
  10. 根据权利要求9所述的显示面板，其中所述驱动模块还包括 电容，所述电容的一端与所述栅极电连接，所述电容的另一端与所述源极电连接。
  11. 根据权利要求8所述的显示面板，其中所述数据写入模块包括第二薄膜晶体管，所述第二薄膜晶体管的漏极与所述数据信号线电连接，所述第二薄膜晶体管的源极与所述驱动模块电连接。
  12. 根据权利要求11所述的显示面板，其中所述像素驱动电路还包括第一控制信号线，所述第一控制信号线与所述第二薄膜晶体管的栅极电连接。
  13. 根据权利要求8所述的显示面板，其中所述感测模块包括第三薄膜晶体管，所述第三薄膜晶体管的源极与所述驱动模块、所述发光模块以及所述控制模块电连接。
  14. 根据权利要求13所述的显示面板，其中所述像素驱动电路还包括第二控制信号线，所述第二控制信号线与所述第三薄膜晶体管的栅极电连接。
  15. 根据权利要求8所述的显示面板，其中所述控制模块包括第四薄膜晶体管，所述第四薄膜晶体管的漏极与所述数据信号线电连接，所述第四薄膜晶体管的源极与所述发光模块、所述驱动模块以及所述感测模块电连接。
  16. 根据权利要求15所述的显示面板，其中所述像素驱动电路还包括第三控制信号线，所述第四薄膜晶体管的栅极与所述第三控制信号线电连接。
  17. 根据权利要求16所述的显示面板，其中所述第三控制信号线用以向所述第四薄膜晶体管的栅极提供高电平信号。
  18. 根据权利要求8中所述的显示面板，其中所述像素驱动电路包括第一像素驱动电路，第二像素驱动电路以及第三像素驱动电路，所述第一像素驱动电路、所述第二像素驱动电路以及所述第三像素驱动电路对应设置在不同颜色的发光像素区域内，且所述第一像素驱动电路中的感测模块与所述第二像素驱动电路中的感测模块以及所述第三像素驱动电路中的感测模块电连接。
  19. 根据权利要求18所述的显示面板，其中各像素驱动电路中对应的第三薄膜晶体管的漏极相互电连接。
  20. 一种显示面板的老化测试方法，包括如下步骤：
    提供一老化测试电路，所述老化测试电路包括多个像素驱动电路，且所述老化测试电路包括多个像素驱动电路，其中，所述像素驱动电路包括：数据写入模块，所述数据写入模块与所述显示面板的数据信号线电连接，并通过所述数据信号线写入数据信号；驱动模块，所述驱动模块与所述数据写入模块电连接，所述驱动模块用以接收所述数据写入模块的数据信号，并根据所述数据信号形成驱动电压；感测模块，所述感测模块与所述驱动模块电连接，所述感测模块用以感测所述驱动电压，并根据所述驱动电压形成反馈电流；控制模块，所述控制模块与所述驱动模块以及所述感测模块电连接；以及，发光模块，所述发光模块与所述驱动模块、所述感测模块以及所述控制模块电连接；其中，所述控制模块用以接收高电平信号，并根据所述驱动电压以及所述反馈电流对所述发光模块进行老化测试；
    对不同所述像素驱动电路中对应的发光模块进行老化测试，其中，向所述像素驱动电路中的第三控制信号线提供高电平信号，并对不同像素驱动电路中对应的发光模块进行老化，且在向所述第三控制信号线提供高电平信号时，向未进行老化测试电路中对应的所述像素驱动电路中的数据信号线提供低电平信号。
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