WO2023145604A1 - ペリクル - Google Patents
ペリクル Download PDFInfo
- Publication number
- WO2023145604A1 WO2023145604A1 PCT/JP2023/001530 JP2023001530W WO2023145604A1 WO 2023145604 A1 WO2023145604 A1 WO 2023145604A1 JP 2023001530 W JP2023001530 W JP 2023001530W WO 2023145604 A1 WO2023145604 A1 WO 2023145604A1
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- WIPO (PCT)
- Prior art keywords
- pellicle
- displacement
- amount
- frame
- film
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F1/00—Originals for photomechanical production of textured or patterned surfaces, e.g., masks, photo-masks, reticles; Mask blanks or pellicles therefor; Containers specially adapted therefor; Preparation thereof
- G03F1/62—Pellicles, e.g. pellicle assemblies, e.g. having membrane on support frame; Preparation thereof
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B13/00—Measuring arrangements characterised by the use of fluids
- G01B13/02—Measuring arrangements characterised by the use of fluids for measuring length, width or thickness
- G01B13/06—Measuring arrangements characterised by the use of fluids for measuring length, width or thickness for measuring thickness
Definitions
- the present invention relates to a pellicle.
- the inside of the pellicle is extremely airtight, and the thin pellicle membrane may sag or swell due to changes in atmospheric pressure or temperature.
- the pellicle film loses its smoothness in this way, not only does the optical characteristics of the pellicle film change, but if the degree of unevenness is severe, the pellicle film may come into contact with the mask or hit the device. damage to the pellicle membrane.
- the present invention has been proposed in view of such conventional circumstances, and an object of the present invention is to provide a pellicle membrane in which the tension of the pellicle membrane is suitably adjusted, deformation due to wind pressure and the like is suppressed, and excellent structural stability is achieved. To provide a pellicle.
- the present invention is as follows. [1] Equipped with a rectangular frame, a pellicle film provided on one side of the frame, and a mask adhesive provided on the other side of the frame, the long side of the frame having a length of 600 mm or more, and the length of the short side is 500 mm or more, Steps below: (1) sticking the pellicle to a plane plate via the mask adhesive; (2) providing a distance of 5.5 mm, 8.0 mm, 10.0 mm or 12.0 mm between the pellicle and another planar plate; (3) Using an imaginary plane including one surface of the frame at rest as a reference, a fan is used to move the pellicle between the pellicle and the other plane plate along the long side direction at 1,000 mm/sec.
- the film tension of the pellicle film is preferably adjusted, deformation due to wind pressure or the like is suppressed, and a pellicle with excellent structural stability can be provided.
- FIG. 10 is a diagram schematically showing one configuration example of an experimental device used for an air-blast experiment.
- 4 is a graph schematically showing the displacement of a pellicle film measured by each of laser displacement meters P1 to P6.
- 4 is a graph showing the amount of displacement of the pellicle film measured by laser displacement gauges P1 to P6 at the first measurement points in the example.
- 4 is a graph showing displacement amounts of a pellicle film measured by laser displacement gauges P1 to P6 at second measurement points in an example.
- FIG. 1(a) is a top view showing the pellicle 1
- FIG. 1(b) is a vertical sectional view.
- the upper side in each drawing is referred to as “upper” and the lower side as “lower”.
- the right side in each figure is referred to as “right” and the left side as “left”.
- the numerical range indicated by using "-" in this specification shall include the upper and lower numerical values.
- the pellicle 1 is a structure that protects a photomask from dust in photolithography or the like.
- the pellicle 1 includes a rectangular frame 2, a pellicle film 3 provided on one side of the frame 2, an adhesive layer 4 provided on the other side of the frame 2, and a release film 5.
- the frame 2 may have any shape that allows the pellicle film 3 to be stretched over the frame 2.
- the frame may have an outer shape such as a rectangle when viewed from the front. can. Rectangles are squares, rectangles, etc., and can have both right-angled corners and nearly rectangular shapes with rounded corners (FIG. 1).
- the size of the frame 2 and its opening can be determined according to the size of the photomask.
- the long side length is 600 mm to 4000 mm, 600 mm to 3000 mm, or 600 mm to 2000 mm
- the short side length is 500 mm to 3000 mm, 500 mm to 2000 mm, or 500 mm to 1800 mm
- the width of the long side and the short side is 4.0 mm to 20.0 mm
- the height of the frame is 2.0 mm to 10.0 mm
- the pellicle 1 of the present embodiment is preferably a large-sized pellicle such that the length of the long side of the frame 2 is 600 mm or more and the length of the short side is 500 mm or more. It is more preferable that the length of the long side of 2 is 1700 mm or more and the length of the short side is 1600 mm or more.
- the frame 2 has edges.
- the rim can have a linearly extending rod-like rim member.
- a pair of edge members can be spaced apart and parallel to each other, and likewise the other pair of edge members can be spaced apart and parallel to each other.
- the two contacting edge members can be connected at their ends so as to be substantially perpendicular to each other.
- the frame 2 and its edge members are made of, for example, aluminum; aluminum alloys (eg, 5000 series, 6000 series, 7000 series, etc.); titanium; titanium alloys ; O 3 etc.); Composite materials of ceramics and metals (e.g. Al-SiC, Al-AlN, Al-Al 2 O 3 etc.); Engineering plastics such as PE, PA, PC, PEEK; Fibers such as GFRP, CFRP can be formed of known materials such as composite materials; or combinations thereof.
- aluminum alloys eg, 5000 series, 6000 series, 7000 series, etc.
- titanium titanium alloys ; O 3 etc.
- Composite materials of ceramics and metals e.g. Al-SiC, Al-AlN, Al-Al 2 O 3 etc.
- Engineering plastics such as PE, PA, PC, PEEK
- Fibers such as GFRP, CFRP can be formed of known materials such as composite materials; or combinations thereof.
- the lower limit of the thickness of the frame 2 is preferably 3.0 mm or more, more preferably 3.5 mm or more, and even more preferably 4.0 mm or more.
- the upper limit of the thickness of the frame 2 is preferably 10.0 mm or less, more preferably 8.0 mm or less, and even more preferably 7.0 mm or less.
- the width of the frame 2 is preferably between 3.5 mm and 30 mm. This range is preferable because it can withstand the tension of the pellicle film 3 while ensuring the effective exposure area.
- the lower limit of the width of the frame 2 is more preferably 4.0 mm or more, more preferably 6.0 mm or more, and still more preferably 12.0 mm or more. It is preferable to change In particular, when the frame 2 has a long side length of 1700 mm or more and a short side length of 1600 mm or more, the width of the frame 2 is preferably 15.0 mm or more.
- the upper limit of the width of the frame 2 is more preferably 25 mm or less, still more preferably 20 mm or less.
- the width of the frame 2 may be the same on both the long sides and the short sides, or may be independent widths.
- the inner peripheral surface or the entire surface of the frame 2 is coated with an adhesive (eg, acrylic, vinyl acetate, silicone, rubber adhesive, etc.) or grease (eg, silicone-based, fluorine-based grease, etc.) may be applied.
- an adhesive eg, acrylic, vinyl acetate, silicone, rubber adhesive, etc.
- grease eg, silicone-based, fluorine-based grease, etc.
- the pellicle film 3 is a transparent thin film.
- the pellicle film 3 has a thickness of 10 ⁇ m or less and is formed so as to sufficiently transmit light emitted from a light source in photolithography.
- the thickness is preferably 2.0 ⁇ m to 4.5 ⁇ m.
- the material forming the pellicle membrane 3 is not particularly limited, but examples thereof include nitrocellulose, cellulose derivatives, fluoropolymers, carbon materials, etc. Among them, carbon materials are preferred.
- the pellicle film 3 is adhered and fixed to one end of the frame 2 with an adhesive (not shown) to cover the frame 2. As shown in FIG. 1(b), the pellicle film 3 is adhered and fixed to one end of the frame 2 with an adhesive (not shown) to cover the frame 2. As shown in FIG. 1(b), the pellicle film 3 is adhered and fixed to one end of the frame 2 with an adhesive (not shown) to cover the frame 2. As shown in FIG.
- an adhesive layer 4 for attaching the pellicle 1 to a photomask is disposed on the other end side of the frame 2 (the side of the frame 2 opposite to the pellicle film 3).
- the adhesive layer 4 (mask adhesive layer) contains an adhesive such as an acrylic, rubber, vinyl, epoxy, or silicone adhesive. etc.
- the thickness of the adhesive layer 4 is preferably 0.8 mm to 3.0 mm, for example.
- a release film 5 (liner) is arranged so as to cover the adhesive layer 4 .
- This release film 5 protects the adhesive layer 4 when not in use, and is peeled off from the adhesive layer 4 when the pellicle 1 is used.
- a release treatment such as fluorine or fluorine may be performed.
- the release film 5 has a width larger than that of the adhesive layer 4 and is arranged so as to protrude from the adhesive layer 4 to the outer peripheral side of the frame 2 .
- the tension of the pellicle film 3 is appropriately adjusted so that the amount of displacement and the amount of clattering in the air blowing clattering experiment described below fall within a predetermined range.
- an appropriate film tension is applied to the central portion of the pellicle film 3, thereby suppressing the bending of the central portion of the pellicle film 3 and stress applied to the frame 2. is also appropriate, the occurrence of distortion is suppressed, and structural stability can be ensured even with a large pellicle.
- the blast flapping experiment has the following steps. (1) A step of attaching the pellicle 1 to the flat plate 12 (flat plate) via the adhesive layer 4; (2) providing a gap of 5.5 mm, 8.0 mm, 10.0 mm or 12.0 mm between the pellicle 1 and the surface plate 11 (another plane plate); (3) Using a virtual plane including one surface of the frame 2 at rest as a reference, blowing air at 1,000 mm/sec along the long side direction of the pellicle 1 using the blower 13, over a predetermined measurement time (4) Among the displacements, the maximum displacement (T1 max ) in the first direction approaching the flat plate 12 and the flat plate obtaining a maximum displacement (T2 max ) in a second direction away from Each step will be described below.
- FIGS. 1 and 2B are diagrams schematically showing an example of the configuration of an experimental apparatus for measuring the amount of splashing of the pellicle film 3 (blowing splashing experiment) in the present invention, where (a) is a top view and (b) is a side view. It is a diagram.
- the experimental apparatus 10 for the air-blasting experiment includes a granite surface plate 11, a flat plate 12 (flat plate) arranged above the granite surface plate 11 at a predetermined interval and substantially parallel to the granite surface plate 11, and a flat plate.
- a plurality of laser displacement gauges P1 to P6 arranged on the side of the plate 12 opposite to the side facing the granite plate 11 (another flat plate) and toward the space between the granite plate 11 and the flat plate 12 and a blower 13 for blowing air.
- the granite surface plate 11 preferably has a predetermined flatness from the viewpoint of air blowing stability, and preferably has a predetermined rigidity from the viewpoint of structural stability.
- the flat plate 12 measures the displacement of the pellicle film 3 by the laser displacement gauges P1 to P6, it is necessary to cut the flat plate into the shape of the laser displacement gauge so that the laser displacement gauges P1 to P6 can measure it.
- a material that is transparent and easy to process is preferable because the state of the film can be visualized.
- An acrylic plate or the like is particularly preferable.
- the pellicle 1 is adhered to the lower surface of the flat plate 12 by the adhesive layer 4 during the blow-blast experiment.
- the sizes of the granite platen 11 and the flat plate 12 are not particularly limited, and are determined by the size of the pellicle 1 to be measured, and are usually larger than the pellicle 1 .
- the size of the pellicle 1 is 1780 mm long side ⁇ 1620 mm short side
- the size of the flat plate 12 is 2000 mm ⁇ 2000 mm.
- the size of the granite platen 11 is preferably larger than that of the flat plate 12 .
- the problem of the pellicle film 2 splattering becomes significant. That is, as the pellicle film 1 becomes larger, the deflection of the pellicle film 3 and the splatter itself also become larger. The pellicle film 3 is more likely to be affected by bending and splashing, and the pellicle film 3 comes into contact with the mask and parts, resulting in damage to the pellicle film 3 . If the pellicle film is damaged, it will have adverse effects such as defocusing during exposure.
- the air-blown fluttering experiment in the present invention is intended for a large pellicle having a long side of at least the frame 2 of 1700 mm or more.
- the present invention optimizes the tension of the pellicle film 3 so as to reduce the influence of splattering, considering the influence of wind pressure caused by high-speed movement of the mask stage, at least in a large pellicle with a long side of 1700 mm or more in the frame 2.
- the effect of the present invention cannot be obtained simply by increasing the size of the conventional pellicle.
- a blower 13 is arranged outside the flat plate 12 and the granite platen 11 .
- the blower 13 is a device that blows air into the space between the pellicle 1 attached to the flat plate 12 and the granite platen 11 .
- the blower 13 sends wind W from the left side to the right side in the drawing at a predetermined wind speed.
- the laser displacement gauges P1 to P6 are devices for measuring the displacement (displacement direction, displacement amount) of the pellicle film 3 during air blowing, and are arranged on the side of the flat plate 12 opposite to the side to which the pellicle 1 is adhered. . It is preferable to provide a plurality of measurement points by the laser displacement gauges P1 to P6. In this embodiment, six laser displacement meters P1 to P6 are arranged at intervals of 300 mm along the blowing direction in the central portion of the pellicle film 3 .
- the peel film 5 is peeled off the pellicle 1 to be measured, and the exposed adhesive layer 4 is attached to the lower surface of the flat plate 12 so as to face it.
- a space of 5.5 mm, 8.0 mm, 10.0 mm or 12.0 mm is provided between the pellicle 1 and the granite surface plate 11 (another plane plate).
- the distance D between the pellicle 1 attached to the flat plate 12 and the granite platen 11 can be appropriately set in accordance with the distance between the pellicle 1 and equipment parts in the lithography apparatus in which the pellicle 1 is actually used. In this embodiment, the distance D is 5.5 mm to 12.0 mm.
- the blower 13 is used to blow air along the pellicle 1, and the amount of displacement of the pellicle film 3 in the thickness direction is measured.
- a blower 13 is used to blow air toward the space between the pellicle film 3 and the granite plate 11, and the amount of displacement of the pellicle film 3 due to the wind pressure is measured.
- the wind speed of the blower 13 is set to 1000 mm/sec at the central portion of the pellicle film 3 .
- One set of air blowing is air blowing for 2 seconds and an interval of 2 seconds, and this is repeated four times.
- the displacement (displacement direction, displacement amount) of the pellicle film 3 at each point is measured by six laser displacement gauges P1 to P6 arranged along the blowing direction.
- the displacement of the pellicle film 3 is based on a virtual plane including one surface of the frame 2 at rest. This virtual plane shows the pellicle membrane 3 at rest.
- the maximum displacement amount (T1 max ) in the first direction toward the plane and the maximum displacement amount (T2 max ) in the second direction away from the plane are obtained.
- the frame 2 a frame having a pair of side portions bulging outward is used, and when the pellicle film 3 is attached to the frame 2, the bulging sides are used as the frame 2.
- the restoring force of the frame body 2 and the stretching force of the pellicle film 3 can be easily balanced by sticking and stretching the pellicle film 3 in a state of being elastically deformed toward the inside of the frame.
- the direction and magnitude of the tension applied to the pellicle film 3 can be appropriately adjusted by adjusting the swelling amount of the side portion within a predetermined range.
- the frame 2 by configuring the frame 2 from a material having a Young's modulus within a predetermined range, when the pellicle film 3 is attached to the frame 2, the frame 2 is in a substantially rectangular shape. , and the film tension of the pellicle film 3 can be appropriately balanced. In this case, a material having a Young's modulus of 100 MPa or more is preferable.
- the pellicle film 3 when the pellicle film 3 is attached to the frame body 2, the pellicle film 3 can be obtained by performing it in an environment in which the humidity is approximately the same as or higher than the humidity in the exposure apparatus. can be kept small, and the tension applied to the pellicle film 3 can be appropriately adjusted.
- the amount of splashing is preferably more than 1.00 mm and less than 2.40 mm, more preferably 1.10 mm to 2.35 mm.
- the ⁇ displacement amount and the amount of clattering are obtained based on the measurement results at a plurality of measurement points along the pellicle film 3 in the air blowing clattering experiment.
- the behavior in the air-blowing experiment also differs between the end portion and the central portion of the pellicle film 3, and between the upstream side and the downstream side of the air blow.
- the maximum displacement in the first direction (T1 max ) at the measurement point on the upstream side of the blast is greater than the maximum displacement (T1 max ) in the first direction at the measurement point on the downstream side of the blast. It is preferable to provide two or more combinations of large measurement points. This makes it possible to improve the reliability of the air-blast experiment.
- the maximum displacement in the second direction (T2 max ) at the measurement point on the upstream side of the blast is greater than the maximum displacement (T2 max ) in the second direction at the measurement point on the downstream side of the blast. It is preferable to provide two or more combinations of small measurement points. This makes it possible to improve the reliability of the air-blast experiment.
- the same experiment was performed by changing the distance D between the granite surface plate 11 and the pellicle film 3, and the amount of displacement of the pellicle film 3 satisfies the above conditions even when each distance is set. is preferred.
- the same experiment was performed by changing the distance D between the granite surface plate 11 and the pellicle film 3 at the center of the pellicle film 3 to 5.5 mm, 8.0 mm, 10.0 mm, and 12.0 mm. I do.
- the structural stability of the pellicle film 3 can be ensured even when conditions such as the distance between the photomask and the device parts change in the photolithography apparatus.
- the length of the long side of the frame 2 is 600 mm or more and 4000 mm or less, and the length of the short side is 500 mm or more and 3000 mm or less.
- the effect of the present invention can be made more remarkable.
- the length of the long side of the frame 2 is 1700 mm or more and 4000 mm or less and the length of the short side is 1600 mm or more and 3000 mm or less, the effect of the present invention can be made more remarkable. .
- the displacement (direction of displacement, amount of displacement) of the pellicle film was measured using a laser displacement meter.
- the laser displacement gauge is placed on the flat plate side and the displacement of the pellicle film is measured from above, but the laser displacement gauge is placed on the granite surface plate side and the pellicle film is measured directly from below the pellicle film. It may be one that measures the displacement of the membrane.
- a main film was formed by applying a polymer solution of cellulose ester onto a low-alkali glass and subjecting it to closed-cup spin coating.
- a 4 ⁇ m-thick pellicle film formed by applying a fluoropolymer solution to the main film by spin coating to form an antireflection layer was transferred to a temporary frame of anodized aluminum alloy having an outer size of 2000 mm ⁇ 2000 mm. I prepared for you. While pressing inward using a jig so that each side of the adhesive-attached frame produced in (1) becomes substantially straight, the frame is attached to the frame through the film adhesive in (2). The prepared pellicle membrane was adhered.
- the external force by the jig was released from the short side, and then the external force by the jig on the long side was released to produce a pellicle.
- the obtained pellicle film was adhered to the upper end surface of the adhesive-attached frame via an adhesive while appropriately adjusting the direction and magnitude of the tension applied to the pellicle film to obtain the pellicle of the example.
- the obtained pellicle was subjected to an air-blowing experiment using the experimental apparatus shown in FIG. NR-500 manufactured by KEYENCE was used as a laser displacement meter.
- Six laser displacement meters (P1 to P6) were arranged at intervals of 300 mm along the blowing direction (long side direction of the pellicle) in the center of the pellicle film.
- a pellicle was adhered to a flat plate via a mask adhesive.
- a pellicle which is an object to be measured, was adhered to the lower surface of the flat plate via an adhesive layer.
- the flat plate was an acrylic plate with a thickness of 5.0 mm and a size of 2000 mm ⁇ 2000 mm.
- an aluminum alloy reinforcing member was installed in a grid pattern on the upper side of the flat plate to suppress the bending of the flat plate.
- the distance between the granite surface plate (another plane plate) and the pellicle film was set to 5.5 mm.
- the size of the stone platen was 2500 mm ⁇ 2500 mm.
- a blower was used to blow air along the long side direction of the pellicle, and the amount of displacement in the thickness direction of the pellicle film was measured.
- the wind speed of the blower was set to 1000 mm/sec at the central portion of the pellicle film.
- a 2-second air blow and a 2-second interval were set as one set, and this was repeated four times (16 seconds in total).
- the displacement (displacement direction, displacement amount) of the pellicle membrane at each point was measured by laser displacement gauges P1 to P6 arranged along the air blowing direction. Specifically, as the displacement of the pellicle film, the amount of displacement ( T1) and the amount of displacement in the second direction away from the flat plate (T2) were obtained.
- FIG. 3 is a graph schematically showing the displacement of the pellicle membrane measured by each of the laser displacement meters P1 to P6.
- 0 is a virtual plane, which indicates the pellicle membrane at rest. This virtual plane is used as a reference plane for displacement of the pellicle film. Relative to the reference plane (0), the upper side (+) of the graph represents displacement in a first direction toward the flat plate and the lower side (-) of the graph represents displacement in a second direction away from the flat plate. .
- FIG. 4 is a graph showing the amount of displacement of the pellicle film measured by the laser displacement gauges P1 to P6 at the first measurement point (when blowing on) in FIG. 10 is a graph showing displacement amounts of a pellicle film measured by laser displacement gauges P1 to P6 at second measurement points (during blow off).
- measurement position 0 indicates the center of the pellicle membrane along the blowing direction.
- the maximum value among the displacement amounts T1 in the first direction measured at P1 to P6 is T1 max .
- the maximum value of the displacement amount T2 in the second direction measured at P1 to P6 was defined as T2 max .
- the largest amount of displacement in the first direction at the first point shown in FIG. 4 was 0.96 [mm] measured at P2, and this value was taken as T1 max .
- the largest amount of displacement in the second direction was 1.70 [mm] measured at P5, and this value was taken as T2 max .
- the displacement in the second direction is indicated by minus (-), but the values of T1, T2, etc. defined in the present invention are absolute values of the amount of displacement, and are positive values. is represented by
- T1 max and T1 max are used as T1 and T2 when calculating the ⁇ displacement amount, but the present invention is not limited to this.
- the larger one of the maximum amount of displacement (T1 max ) in the first direction and the maximum amount of displacement (T2 max ) in the second direction (amount of clattering) is 1.70 [mm] of T2 max . rice field.
- T1 max with the largest amount of displacement in the first direction at the second point shown in FIG. 5 was 2.29 [mm] measured at P2.
- T2 max with the largest amount of displacement in the second direction was 0.15 [mm] measured at P6.
- the larger one of the maximum amount of displacement (T1 max ) in the first direction and the maximum amount of displacement (T2 max ) in the second direction (the amount of clattering) is 2.29 [mm] of T1 max . rice field.
- Example 2 As a comparative example, a frame with an adhesive having the same size as in Example 1 was prepared, and a pellicle was attached in the same manner as in Example except that each side was not pressed inward and was adhered to the pellicle film.
- the air-blown clattering experiment was conducted in the same manner with the distances between the granite plate and the pellicle film set to 5.5 mm, 8.0 mm, 10.0 mm and 12.0 mm.
- T1 max , T2 max the maximum value (T1 max , T2 max ), the sum of T1 max +T2 max (T1 max +T2 max ), and the larger one of T1 max and T2 max (T max : amount of splattering) are summarized in Table 1.
- the tension of the pellicle membrane is set to be appropriate, and distortion and deformation of the pellicle membrane are suppressed, resulting in structural stability. is ensured.
- the presence or absence of scratches on the pellicle film after the smearing test was confirmed as follows. That is, first, the pellicle film before the smearing test was visually confirmed to be free from scratches by illuminating a condensing lamp in a dark room. Next, after the smearing test, the pellicle was removed from the flat plate, and the presence or absence of scratches was visually confirmed by applying a condensing light in a dark room. As a result, the pellicle membrane of the example had no scratches, but the pellicle membrane of the comparative example had scratches near P2 or P5.
- the tension of the pellicle film and the stress of the frame body become appropriate, and distortion can be suppressed to ensure structural stability.
- deformation is small even if it is affected by wind pressure due to high-speed movement of the mask stage. is possible.
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Abstract
Description
大規模集積回路(LSI)、超LSI等の半導体デバイスや液晶表示板等の製造工程では、マスク(露光原板、レチクルともいう)を介して感光層等に光を照射することによってパターニングを行う。その際、マスクに異物が付着していると、光が異物に吸収されたり、異物表面で光が反射されて屈曲したりする。その結果、形成されるパターンが変形したり、エッジががさついたりして、パターニング後の寸法、品質、および外観等が損なわれてしまうといった問題が生じる。このような問題を解消すべく、マスクの表面に、光を透過するペリクル膜を備えるペリクルを装着し、異物の付着を抑制する方法が採用されている(例えば、特許文献1)。
[1]
矩形状の枠体と、前記枠体の一面側に設けられたペリクル膜と、前記枠体の他面側に設けられたマスク粘着剤とを備え、前記枠体の長辺の長さが600mm以上であり、及び短辺の長さが500mm以上であるペリクルであって、
以下のステップ:
(1)前記マスク粘着剤を介して前記ペリクルを平面板に張り付けるステップ;
(2)前記ペリクルと他の平面板との間に5.5mm、8.0mm、10.0mm又は12.0mmの間隔を設けるステップ;
(3)静止時における前記枠体の一面を含む仮想面を基準とし、送風機を用いて前記ペリクルの長辺方向に沿って前記ペリクルと前記他の平面板との間に1,000mm/秒で送風したときの、所定の測定時間に亘って前記仮想面に対する前記ペリクル膜の厚さ方向への変位量を測定するステップ;および
(4)前記変位量のうち、前記平面板に近づく第1方向への変位量と、前記平面板から離れる第2方向への変位量と、を得るステップ;
を有する送風ハタメキ実験を行ったときに、
前記第1方向への変位量(T1)と前記第2方向への変位量(T2)との和(Δ変位量=T1+T2)が1.50mm~2.80mmであり、かつ、
前記第1方向への最大変位量(T1max)と前記第2方向への最大変位量(T2max)とのうち大きい方(ハタメキ量)が、1.00mm~2.40mmであることを特徴とする、ペリクル。
[2]
前記第1方向への最大変位量(T1max)が、前記第2方向への最大変位量(T2max)よりも大きい、[1]に記載のペリクル。
[3]
前記Δ変位量及び前記ハタメキ量は、前記送風ハタメキ実験において前記ペリクル膜に沿った複数の測定点での測定結果に基づいて得られたものである、[1]または[2]に記載のペリクル。
[4]
前記送風ハタメキ実験において、送風の上流側の測定点における前記第1方向への最大変位量が、送風の下流側の測定点における前記第1方向への最大変位量より大きい該測定点の組み合わせを二か所以上設ける、[1]~[3]のいずれかに記載のペリクル。
[5]
前記送風ハタメキ実験において、送風の上流側の測定点における前記第2方向への最大変位量が、送風の下流側の測定点における前記第2方向への最大変位量より小さい該測定点の組み合わせを二か所以上設ける、[1]~[4]のいずれかに記載のペリクル。
[6]
前記枠体の長辺の長さが600mm以上4000mm以下であり、及び短辺の長さが500mm以上3000mm以下である、[1]~[5]のいずれかに記載のペリクル。
なお、以下の説明においては、各図における上側を「上」とし、下側を「下」として説明する。同様に、各図における右側を「右」とし、左側を「左」として説明する。
また、本明細書において「~」を用いて示される数値範囲は、上限および下限の数値を含むものとする。
ペリクル1は、フォトリソグラフィ等においてフォトマスクの防塵を行う構造体である。ペリクル1は、矩形状の枠体2と、枠体2の一面側に設けられたペリクル膜3と、枠体2の他面側に設けられた粘着層4と、剥離フィルム5とを備えている。
特に、本実施形態のペリクル1は、枠体2の長辺の長さが600mm以上であり、及び短辺の長さが500mm以上であるような、大型のペリクルであることが好ましく、枠体2の長辺の長さが1700mm以上であり、短辺の長さが1600mm以上であることがより好ましい。
なお、枠体2の幅は長辺、短辺何れの辺の幅とも同じであってもよく、各々独立の幅であっても構わない。
剥離フィルム5には、一般的にはポリエステルなどの厚さ30μm~200μm程度のフィルムが用いられる。また、粘着層4から剥離フィルム5を剥がす際の剥離力が大きいと、剥がす際に粘着層4が変形するおそれがあるため、適切な剥離力になるように、粘着剤と接するフィルム表面にシリコーンやフッ素などの離型処理を行ってもよい。
これにより、本実施形態のペリクル1では、ペリクル膜3の中央部分にまで適切な膜張力が及ぶものとなり、ペリクル膜3の中央部分での撓みの発生が抑えられるとともに、枠体2に掛かる応力も適切なものとなり歪みの発生が抑えられ、大型ペリクルであっても、構造安定性を確保することができる。
以下、本発明で定義される送風ハタメキ実験について説明する。
送風ハタメキ実験は、以下のステップを有する。
(1)粘着層4を介してペリクル1をフラットプレート12(平面板)に張り付けるステップ;
(2)ペリクル1と定盤11(他の平面板)との間に5.5mm、8.0mm、10.0mm又は12.0mmの間隔を設けるステップ;
(3)静止時における枠体2の一面を含む仮想面を基準とし、送風機13を用いてペリクル1の長辺方向に沿って1,000mm/秒で送風したときの、所定の測定時間に亘って仮想面に対するペリクル膜3の厚さ方向への変位量を測定するステップ;および
(4)変位量のうち、フラットプレート12に近づく第1方向への最大変位量(T1max)と、平面板から離れる第2方向への最大変位量(T2max)と、を得るステップ;
以下、各ステップについて説明する。
図2は、本発明において、ペリクル膜3のハタメキ量の測定(送風ハタメキ実験)を行う実験装置の一構成例を模式的に示す図であり、(a)は上面図、(b)は側面図である。
送風ハタメキ実験時に、ペリクル1は、フラットプレート12の下側の面に、粘着層4によって張り付けられる。
本実施形態では、ペリクル1の大きさは、長辺1780mm×短辺1620mmであり、フラットプレート12の大きさは2000mm×2000mmである。また、石定盤11の大きさはフラットプレート12よりも大きいことが好ましい。
すなわち、ペリクル膜1が大きくなると、ペリクル膜3の撓みやハタメキ自体も大きくなるが、露光装置においても、部品間隔が狭くなったり、また、マスクステージの移動が高速化、複雑化してくると、ペリクル膜3の撓みやハタメキの影響が大きくなり、ペリクル膜3がマスクや部品に接触し、ペリクル膜3が損傷する可能性が高くなる。ペリクル膜が損傷すると、露光時に焦点がズレるなど、悪影響を与えてしまう。
本発明は、少なくとも枠体2の長辺が1700mm以上の大型ペリクルにおいて、マスクステージの高速移動による風圧の影響を考慮して、ハタメキの影響が小さくなるようにペリクル膜3の張力等を最適化したものであり、従来のペリクルの大きさを単に大きくしただけでは、本発明の効果は得られない。
図2に示す例では、送風機13は、図中左側から右側に向けて、所定の風速で風Wを送る。
レーザー変位計P1~P6による測定点は、複数設けることが好ましい。本実施形態では、ペリクル膜3の中央部において送風方向に沿って、300mm間隔で6台のレーザー変位計P1~P6が配置されている。
フラットプレート12に貼り付けられたペリクル1と石定盤11との間隔Dは、ペリクル1が実際に用いられるリソグラフィ装置において、ペリクル1装置部品との間隔に合わせて適宜設定することができる。本実施形態では、間隔Dは5.5mm~12.0mmとしている。
ペリクル膜3と石定盤11との間の空間に向けて、送風機13を用いて送風し、風圧によるペリクル膜3の変位量を測定する。
送風方向に沿って配置された6台のレーザー変位計P1~P6によって、各地点におけるペリクル膜3の変位(変位の方向、変位量)を測定する。
前記(2)のステップで得られた、第1方向への変位量(T1)のうちの最大変位量(T1max)、および、第2方向への変位量(T2)のうちの最大変位量(T2max)、をそれぞれ得る。
(a)第1方向への変位量(T1)と第2方向への変位量(T2)との和(Δ変位量=T1+T2)が1.50mm~2.80mmであり、かつ
(b)第1方向への最大変位量(T1max)と第2方向の最大変位量(T2max)とのうち大きい方(ハタメキ量)が、1.00mm~2.40mmである。
また、枠体2を、所定範囲のヤング率を有する材料から構成することで、ペリクル膜3を枠体2に貼り付けた際に、枠体2が略矩形状になる状態において、枠体2の復元力とペリクル膜3の膜張力とを適切につり合わせることができる。この場合、ヤング率としては100MPa以上ある材料が好ましい。
の応力を小さく維持することが可能になり、ペリクル膜3に付与される張力を適宜調節することができる。
これにより、本実施形態のペリクル1では、ペリクル膜3の中央部分にまで適切な膜張力が及ぶものとなり、ペリクル膜3の中央部分での撓みの発生が抑えられるとともに、枠体2に掛かる応力も適切なものとなり歪みの発生が抑えられ、優れた構造安定性を有するものとなる。
これにより、ペリクル1の構造安定性をより優れたものとすることができる。
当然ではあるが、ペリクル膜3の端部と中央部、送風の上流側と下流側とでは、送風ハタメキ実験における挙動も異なる。測定点を1か所のみではなく、複数設け、ペリクル1の全体における各地点での動向をより詳細に知ることで、送風ハタメキ実験の信頼性が向上し、ペリクル全体としての変位量およびハタメキ量をより小さく抑えることができる。
これにより、送風ハタメキ実験の信頼性をより優れたものとすることができる。
これにより、送風ハタメキ実験の信頼性をより優れたものとすることができる。
これにより、フォトリソグラフィ装置に置いてフォトマスクと装置部品との間隔といった条件が変わった場合においても、ペリクル膜3の構造安定性を担保することができる。
例えば、本実施形態では、ペリクル膜の変位(変位の方向、変位量)について、レーザー変位計を用いて測定したが、ペリクル膜の変位を測定できるものであれば、レーザー変位計以外の変位計であってもよい。
また、上述した実施形態では、フラットプレート側にレーザー変位計を配し、上側よりペリクル膜の変位を測定したが、石定盤側にレーザー変位計を配し、ペリクル膜の下側より直接ペリクル膜の変位を測定するものであってもよい。
また、特に指定のない限り、ペリクルの作製および送風ハタメキ実験は、室温(23℃)で行った。
<実施例>
(1)粘着層付枠体の作製
外径1620mm×1780mm×高さ6.5mm、長辺幅16.5mm、短辺幅18.5mmで材質にアルミ合金を用い、枠体の断面形状は長方形の形状のものを用いた。当該枠体は、各辺部の中央付近が外側に凸となるように湾曲膨出した形状とし、初期形状の外側への凸量として、長辺部側が10.0mm、短辺部側が5.0mmとした。そして、用いた枠体は黒色アルマイト処理を施した。
その後、枠体の下端面にマスク粘着材として厚み1.5mmのスチレンエチレンブチレンスチレンのゴム系ホットメルト粘着剤をつけた。粘着剤を保護するために粘着剤に保護フィルム(PET)を付けて粘着剤付枠体とした。
ペリクル膜としては、セルロースエステルのポリマー溶液を低アルカリガラス上に塗布しクローズドカップ式のスピンコートで主膜を形成した。
次いで、その主膜上にフッ素ポリマー溶液をスピンコートで塗布して反射防止層を成膜した厚み4μmのペリクル膜を外寸が2000mm×2000mmのアルマイト処理されたアルミ合金の仮枠に写し取り一様に準備した。
(1)で作製した粘着剤付枠体の各辺部が略直線状になるように治具を用いて内側に向けて押さえ込みながら、前記枠体に、膜接着剤を介して(2)で作製したペリクル膜を接着させた。その後、短辺部側から治具による外力を解放し、その後、長辺部側の治具による外力を解放しペリクルを作製した。
得られたペリクル膜を、ペリクル膜に付与する張力の方向や大きさなどを適宜調節しつつ、粘着剤付枠体の上端面に接着剤を介して貼りつけることで実施例のペリクルとした。
得られたペリクルについて、図2に示した実験装置を用いて送風ハタメキ実験を行った。
レーザー変位計としてKEYENCE社製のNR-500を用いた。レーザー変位計は、ペリクル膜の中央部において送風方向(ペリクルの長辺方向)に沿って、300mm間隔で6台(P1~P6)配置した。
被測定物であるペリクルを、粘着層介してフラットプレートの下側の面に対向させて張り付けた。フラットプレートは厚さ5.0mmのアクリル板であり、その大きさは2000mm×2000mmであった。更に、フラットプレートの撓みを抑制するためにアルミ合金の補強体をフラットプレートの上側に格子状に設置した。
そして、石定盤(他の平面板)とペリクル膜との間隔を5.5mmとした。石定盤の大きさは2500mm×2500mmであった。
送風機の風速は、ペリクル膜の中央部で1000mm/秒となるようにした。送風は、2秒間の送風と、2秒間のインターバルとを1セットとし、これを4回(計16秒間)繰り返した。
図3中、0は仮想面であり、静止時におけるペリクル膜を示す。この仮想面を、ペリクル膜の変位の基準面とする。
基準面(0)に対し、グラフの上側(+)が、フラットプレートに近づく第1方向への変位を表し、グラフの下側(-)が、フラットプレートから離れる第2方向への変位を表す。
ハタメキの大まかな傾向としては、送風の上流側(P1~P2)では、基準面に対して第1の方向寄りにペリクル膜がはためく傾向がみられた。下流側(P5~P6)では、基準面に対して第2の方向寄りにペリクル膜がはためく傾向がみられた。中央部分(P3~P5)では、基準面に対して第1および第2の方向の双方にペリクル膜がはためく傾向がみられた。
また、送風の上流側では変位が比較的大きく、下流側では変位が比較的小さい。中央部分での変位が特に大きくなっている。
図4および図5において、計測位置0は、送風方向に沿った、ペリクル膜の中心を示す。
例えば、図4に示す第1ポイントにおいて第1方向への変位量が最も大きいのはP2で測定された0.96[mm]であり、この値をT1maxとした。また、第2方向への変位量が最も大きいのはP5で測定された1.70[mm]であり、この値をT2maxとした。
(a)第1方向への変位量(T1)と第2方向への変位量(T2)との和(Δ変位量=T1+T2)が1.50mm~2.80mmであり、かつ
(b)第1方向への最大変位量(T1max)と第2方向への最大変位量(T2max)とのうち大きい方(ハタメキ量)が、1.00mm~2.40mmであった。
(a)Δ変位量または(b)ハタメキ量について双方の条件を満たす実施例のペリクルでは、ペリクル膜の張力が適切なものとされており、ペリクル膜の歪みや変形が抑えられ、構造安定性が確保されたものとなる。
すなわち、まず、ハタメキ試験前のペリクル膜に暗室で集光灯を当て目視にてキズが無いことを確認した。次に、ハタメキ試験後にフラットプレートからペリクルを取り外し、暗室で集光灯を当てキズの有無を目視にて確認した。
その結果、実施例のペリクル膜にはキズがなかったが、比較例のペリクル膜にはP2またはP5付近でキズが発生していた。
これにより、大型ペリクルであっても、マスクステージの高速移動による風圧の影響を受けても変形が小さく、ペリクル膜の光学的特性の変化や、ペリクル膜のマスクや装置への接触を抑制することが可能なものとなる。
2:枠体
3:ペリクル膜
4:粘着層
5:剥離フィルム
10:実験装置
11:石定盤
12:フラットプレート
13:送風機
P1~P6:レーザー変位計
Claims (6)
- 矩形状の枠体と、前記枠体の一面側に設けられたペリクル膜と、前記枠体の他面側に設けられたマスク粘着剤とを備え、前記枠体の長辺の長さが600mm以上であり、及び短辺の長さが500mm以上であるペリクルであって、
以下のステップ:
(1)前記マスク粘着剤を介して前記ペリクルを平面板に張り付けるステップ;
(2)前記ペリクルと他の平面板との間に5.5mm、8.0mm、10.0mm又は12.0mmの間隔を設けるステップ;
(3)静止時における前記枠体の一面を含む仮想面を基準とし、送風機を用いて前記ペリクルの長辺方向に沿って前記ペリクルと前記他の平面板との間に1,000mm/秒で送風したときの、所定の測定時間に亘って前記仮想面に対する前記ペリクル膜の厚さ方向への変位量を測定するステップ;および
(4)前記変位量のうち、前記平面板に近づく第1方向への変位量と、前記平面板から離れる第2方向への変位量と、を得るステップ;
を有する送風ハタメキ実験を行ったときに、
前記第1方向への変位量(T1)と前記第2方向への変位量(T2)との和(Δ変位量=T1+T2)が1.50mm~2.80mmであり、かつ、
前記第1方向への最大変位量(T1max)と前記第2方向への最大変位量(T2max)とのうち大きい方(ハタメキ量)が、1.00mm~2.40mmであることを特徴とする、ペリクル。 - 前記第1方向への最大変位量(T1max)が、前記第2方向への最大変位量(T2max)よりも大きい、請求項1に記載のペリクル。
- 前記Δ変位量及び前記ハタメキ量は、前記送風ハタメキ実験において前記ペリクル膜に沿った複数の測定点での測定結果に基づいて得られたものである、請求項1に記載のペリクル。
- 前記送風ハタメキ実験において、送風の上流側の測定点における前記第1方向への最大変位量が、送風の下流側の測定点における前記第1方向への最大変位量より大きい該測定点の組み合わせを二か所以上設ける、請求項1に記載のペリクル。
- 前記送風ハタメキ実験において、送風の上流側の測定点における前記第2方向への最大変位量が、送風の下流側の測定点における前記第2方向への最大変位量より小さい該測定点の組み合わせを二か所以上設ける、請求項1に記載のペリクル。
- 前記枠体の長辺の長さが600mm以上4000mm以下であり、及び短辺の長さが500mm以上3000mm以下である、請求項1に記載のペリクル。
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| JPH10339944A (ja) * | 1997-06-09 | 1998-12-22 | Shin Etsu Chem Co Ltd | ペリクルの製造方法 |
| JPH11160855A (ja) * | 1997-12-01 | 1999-06-18 | Toshiba Corp | ペリクル及びペリクル付露光用マスク |
| JP2004296829A (ja) * | 2003-03-27 | 2004-10-21 | Semiconductor Leading Edge Technologies Inc | ペリクル構造体の姿勢制御機構及び露光方法 |
| JP2004343102A (ja) * | 2003-04-30 | 2004-12-02 | Asml Netherlands Bv | リソグラフ装置、デバイス製造方法、マスク、及びマスク及び/又はペリクルを特徴付ける方法 |
| JP2005134683A (ja) * | 2003-10-31 | 2005-05-26 | Asahi Glass Co Ltd | ペリクル |
| JP2005148287A (ja) * | 2003-11-13 | 2005-06-09 | Semiconductor Leading Edge Technologies Inc | フォトマスク用ペリクル |
| JP2019066848A (ja) * | 2017-09-29 | 2019-04-25 | 旭化成株式会社 | ペリクル |
| JP2020091314A (ja) * | 2018-12-03 | 2020-06-11 | 信越化学工業株式会社 | ペリクル及びその製造方法 |
Family Cites Families (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TW507267B (en) * | 1999-09-13 | 2002-10-21 | Asahi Glass Co Ltd | Pellicle and its manufacturing method |
| JP2011158585A (ja) * | 2010-01-29 | 2011-08-18 | Shin-Etsu Chemical Co Ltd | ペリクルおよびペリクルの製造方法 |
| TWI456341B (zh) * | 2010-03-10 | 2014-10-11 | 旭化成電子材料股份有限公司 | 大型護膜用框體及大型護膜 |
| JP7061288B2 (ja) * | 2018-08-28 | 2022-04-28 | 日本軽金属株式会社 | フラットパネルディスプレイ用ペリクル枠体及びその製造方法 |
| JP2020160466A (ja) | 2020-06-12 | 2020-10-01 | 旭化成株式会社 | ペリクル |
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2023
- 2023-01-19 JP JP2023576848A patent/JP7748484B2/ja active Active
- 2023-01-19 TW TW112102815A patent/TWI855515B/zh active
- 2023-01-19 WO PCT/JP2023/001530 patent/WO2023145604A1/ja not_active Ceased
- 2023-01-19 CN CN202380017368.6A patent/CN118556210A/zh active Pending
- 2023-01-19 KR KR1020247015975A patent/KR20240089744A/ko active Pending
Patent Citations (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH10339944A (ja) * | 1997-06-09 | 1998-12-22 | Shin Etsu Chem Co Ltd | ペリクルの製造方法 |
| JPH11160855A (ja) * | 1997-12-01 | 1999-06-18 | Toshiba Corp | ペリクル及びペリクル付露光用マスク |
| JP2004296829A (ja) * | 2003-03-27 | 2004-10-21 | Semiconductor Leading Edge Technologies Inc | ペリクル構造体の姿勢制御機構及び露光方法 |
| JP2004343102A (ja) * | 2003-04-30 | 2004-12-02 | Asml Netherlands Bv | リソグラフ装置、デバイス製造方法、マスク、及びマスク及び/又はペリクルを特徴付ける方法 |
| JP2005134683A (ja) * | 2003-10-31 | 2005-05-26 | Asahi Glass Co Ltd | ペリクル |
| JP2005148287A (ja) * | 2003-11-13 | 2005-06-09 | Semiconductor Leading Edge Technologies Inc | フォトマスク用ペリクル |
| JP2019066848A (ja) * | 2017-09-29 | 2019-04-25 | 旭化成株式会社 | ペリクル |
| JP2020091314A (ja) * | 2018-12-03 | 2020-06-11 | 信越化学工業株式会社 | ペリクル及びその製造方法 |
Also Published As
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|---|---|
| KR20240089744A (ko) | 2024-06-20 |
| CN118556210A (zh) | 2024-08-27 |
| TWI855515B (zh) | 2024-09-11 |
| TW202340852A (zh) | 2023-10-16 |
| JPWO2023145604A1 (ja) | 2023-08-03 |
| JP7748484B2 (ja) | 2025-10-02 |
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