WO2023092674A1 - 测试装置 - Google Patents

测试装置 Download PDF

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Publication number
WO2023092674A1
WO2023092674A1 PCT/CN2021/136784 CN2021136784W WO2023092674A1 WO 2023092674 A1 WO2023092674 A1 WO 2023092674A1 CN 2021136784 W CN2021136784 W CN 2021136784W WO 2023092674 A1 WO2023092674 A1 WO 2023092674A1
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WO
WIPO (PCT)
Prior art keywords
test
testing
probe
plate
detection
Prior art date
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PCT/CN2021/136784
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English (en)
French (fr)
Inventor
王新江
李丰国
李建坤
汤洪恩
尹春雷
Original Assignee
歌尔股份有限公司
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Application filed by 歌尔股份有限公司 filed Critical 歌尔股份有限公司
Publication of WO2023092674A1 publication Critical patent/WO2023092674A1/zh

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals

Definitions

  • the invention relates to the technical field of testing equipment, in particular to a testing device.
  • a circuit board is an important part of an electronic product, and multiple electronic components are integrated and connected on the circuit board to realize various functions of the electronic product.
  • the electronic circuit of each electronic component is usually tested, and this test needs to be completed on a test device.
  • the test device includes a test bench and a movable test piece.
  • the circuit board to be tested is fixed on the test bench, and the test piece moves toward the circuit board and abuts against the contact points of each electronic component on the test circuit board to realize electronic testing. Electronic circuits of components are tested.
  • the mainstream solution is that the manipulator drives the test piece to move towards the circuit board to be tested.
  • the accuracy of the stroke of the manipulator is difficult to control, and it is prone to problems such as poor contact of the test piece and poor test data consistency during the test; or the test
  • the overvoltage of the product under test causes a high defect rate and affects the quality of the test.
  • the main purpose of the present invention is to provide a testing device, aiming at improving the testing quality of the testing device.
  • the testing device proposed by the present invention includes:
  • test stand the test stand is used to fix the circuit board to be tested
  • test mechanism the test mechanism is arranged on one side of the test platform, the test mechanism includes at least one pair of detection components, and the detection components are electrically connected to the tester;
  • the moving mechanism is connected to the testing mechanism, and drives the testing mechanism to move toward or away from the test platform, so that the detection assembly elastically abuts against the circuit board to be tested;
  • a limit piece the limit piece is connected with the test mechanism, when the test mechanism moves toward the test platform, the limit piece abuts against the test platform, so as to limit the test mechanism relative to the The distance the test bench moves.
  • the testing mechanism includes:
  • the detection assembly includes a first detection piece and a second detection piece spaced apart from the surface of the fixed plate, and the first detection piece and the second detection piece are respectively electrically connected to the tester;
  • the first detection piece and/or the second detection piece are elastically connected to the fixing plate;
  • the limiting member is connected with the fixing plate.
  • the first detecting element is a conductive block
  • the conductive block includes a fixing part, a connecting part, and a pressing part that are connected in sequence and arranged at an angle to each other;
  • the fixing part is fixedly connected to the surface of the fixing plate, the connecting part is protruded on the side of the fixing part facing the test platform, and the pressing part is protruded so that the connecting part is away from the fixing part On one side, the crimping portion is used to abut against the elastic component of the circuit board to be tested.
  • the testing mechanism further includes an insulating block, the insulating block is fixed to the surface of the fixing plate by screws, and is arranged between the fixing plate and the conductive block.
  • the conductive block is provided with a first escape hole, and part of the screws of the insulating block are exposed through the first avoidance hole.
  • the limiting member is connected to the fixing plate through the insulating block, the limiting member is provided with a second escape hole, and part of the screws of the insulating block are exposed on the second avoidance hole
  • the testing mechanism further includes an elastic moving component, the elastic moving component is arranged on the fixed plate, and the second detecting member is elastically connected to the fixed plate through the elastic moving component.
  • the elastic moving component includes:
  • the slide rail is arranged on the surface of the fixed plate and extends along the arrangement direction of the test mechanism and the test bench;
  • the slider is slidably arranged on the slide rail, and the slider is used to fix the second detection piece;
  • the positioning piece is arranged on the end of the slide rail away from the test platform, and is connected with the slide block;
  • the second detection element includes:
  • the probe splint is fixed to the slider
  • the probe pressing plate is fixed on the surface of the probe clamping plate away from the slider;
  • the probe pin is clamped between the probe clamping plate and the probe pressing plate, and the end of the probe pin away from the probe clamping plate is used to abut against the circuit board to be tested.
  • the probe clamping plate, the probe pressing plate and the probe needle are all made of conductive material, and the slider is made of insulating material.
  • the probe clamp is provided with a third escape hole, and part of the screws of the slider are exposed through the third avoidance hole.
  • the testing device further includes a material retrieving mechanism, the material retrieving mechanism is connected to the moving mechanism and located at one side of the testing mechanism.
  • the test device further includes a cleaning mechanism, which is adjustably arranged at the bottom of the test platform, and the cleaning mechanism is used for the first detection piece and the second detection piece.
  • the cleaning mechanism includes:
  • the connecting seat is connected to the base and can be moved relative to the base;
  • the cleaning wheel brush is rotatably arranged on the connecting seat.
  • the testing device of the technical solution of the present invention includes a testing platform, a testing mechanism, a moving mechanism and a limiting member.
  • the test bench is used to fix the circuit board to be tested.
  • the test mechanism is set on one side of the test bench.
  • the test mechanism includes at least one pair of detection components, which are electrically connected to the tester; the moving mechanism is connected to the test mechanism and drives the test mechanism towards Or move away from the test platform, so that the detection component elastically abuts against the circuit board to be tested; the limit piece is connected with the test mechanism.
  • the limit piece abuts against the surface of the test platform.
  • the distance that the test mechanism moves relative to the test platform can be limited to ensure the movement of the test mechanism. Accuracy, to avoid the occurrence of undervoltage between the detection components and the components under test due to the insufficient moving distance of the test mechanism relative to the test platform, and ensure that the upper detection components set on the test mechanism can have a good relationship with the components to be tested on the circuit board to be tested good touch.
  • the elastic contact between the detection component and the circuit board to be tested it can also effectively avoid the overvoltage of the detection component and the components to be tested on the circuit board to be tested, effectively protect the circuit board to be tested, and improve the The quality of the test reduces the inaccurate test results due to undervoltage, reduces the defective products caused by overvoltage, and improves the test quality of the circuit board.
  • Fig. 1 is the structural representation of an embodiment of testing device of the present invention
  • Fig. 2 is a structural exploded view of the test device in Fig. 1;
  • Fig. 3 is the structural representation of testing mechanism of the present invention.
  • Fig. 4 is a partial enlarged view of place A in Fig. 3;
  • Fig. 5 is a schematic structural view of the first test piece of the testing device of the present invention.
  • Fig. 6 is a schematic structural diagram of a limiting member in the testing device of the present invention.
  • test device 100 test device 261 slide rail 10 Test Bench 262 slider 20 testing agency 263 Positioner twenty one Adjustment plate 265 Elastic 211 adjustment hole 30 mobile mechanism twenty two fixed plate 40 Limiting parts twenty three detection components 41 Second escape hole 231 first probe 50 Reclaiming mechanism 2311 fixed part 51 mounting plate 2311a first avoidance hole 53 Parallel opening and closing type air gripper 2313 Connection 55 Pick-up jaws 2315 Overlay 57 cylinder twenty four Second detector 59 Detector 241 Probe splint 60 cleaning agency 243 Probe platen 61 base 245 probe 63 Connecting seat 25 insulating block 65 cleaning wheel brush 26 Elastic Mobile Components 67 motor
  • connection and “fixation” should be understood in a broad sense, for example, “fixation” can be a fixed connection, a detachable connection, or an integral body; It can be a mechanical connection or an electrical connection; it can be a direct connection or an indirect connection through an intermediary, and it can be an internal communication between two elements or an interaction relationship between two elements, unless otherwise clearly defined.
  • fixation can be a fixed connection, a detachable connection, or an integral body; It can be a mechanical connection or an electrical connection; it can be a direct connection or an indirect connection through an intermediary, and it can be an internal communication between two elements or an interaction relationship between two elements, unless otherwise clearly defined.
  • the present invention proposes a test device 100 .
  • the testing device 100 of an embodiment of the testing device 100 of the present invention comprises:
  • Test bench 10 described test bench 10 is used for fixing circuit board to be tested;
  • test mechanism 20 the test mechanism 20 is arranged on one side of the test platform 10, the test mechanism 20 includes at least one pair of detection components 23, and the detection components 23 are electrically connected to the tester;
  • a moving mechanism 30, the moving mechanism 30 is connected to the testing mechanism 20, and drives the testing mechanism 20 to move toward or away from the test platform 10, so that the detection assembly 23 elastically contacts the circuit board to be tested; as well as
  • a limiter 40, the limiter 40 is connected with the test mechanism 20, when the test mechanism 20 moves toward the test platform 10, the limiter 40 abuts against the test platform 10 to limit The moving distance of the testing mechanism 20 relative to the testing platform 10 .
  • the testing device 100 of the technical solution of the present invention includes a testing platform 10 , a testing mechanism 20 , a moving mechanism 30 and a limiting member 40 .
  • the test bench 10 is used to fix the circuit board to be tested (not shown), and the test mechanism 20 is located on one side of the test bench 10.
  • the test mechanism 20 includes at least one pair of probe assemblies 23, and the probe assemblies 23 are electrically connected with the tester;
  • the mechanism 30 is connected with the test mechanism 20 and drives the test mechanism 20 to move toward or away from the test platform 10 so that the detection assembly 23 elastically abuts against the circuit board to be tested; the limiter 40 is connected with the test mechanism 20 .
  • the stopper 40 abuts against the surface of the testing platform 10, so that the testing mechanism 20 can be restricted from moving relative to the testing mechanism 20 relative to the testing platform 10. distance, to ensure the movement accuracy of the test mechanism 20, to avoid the undervoltage of the detection component 23 and the component to be tested due to the insufficient moving distance of the test mechanism 20 relative to the test platform 10, and to ensure that the upper detection component located on the test mechanism 20 23 can have good contact with the components to be tested on the circuit board to be tested.
  • the test bench 10 provides a fixed carrier for the circuit board to be tested, and the test bench 10 is provided with necessary test fixtures (not marked) for testing the circuit board, and the fixture is provided with corresponding test circuits, power supplies and Fixtures, etc.
  • a test position (not shown) may be provided on the test tool, and a test position can fix a circuit board to be tested, and a detection component 23 is used to abut against a circuit board to be tested.
  • the test tool can also be provided with a plurality of test positions arranged at intervals, so that a plurality of circuit boards to be tested can be fixed on the test tool, and the testing mechanism 20 is provided with detection components 23 corresponding to the number of circuit boards to be tested. , so that the test efficiency can be improved.
  • the testing mechanism 20 is provided with 4 sets of detection components 23 , which can test 4 circuit boards at the same time, so as to improve the testing efficiency.
  • the limit accuracy of the limit member 40 can also be debugged by using the debugging tool before the formal test. Understandably, the appearance of the debugging tool is the same as that of the testing tool, except that the circuit board to be tested is not fixed on the debugging tool. After the debugging is completed, replace the debugging tool with the test tool, and then start the formal test work.
  • the tester is electrically connected to the detection component 23 through wires, so that the test result is displayed on the display screen of the tester, which is convenient for the tester to quickly understand the test result.
  • the tester can give a timely prompt to isolate the unqualified products.
  • the on-off and resistance value of the electronic components on the circuit board can be tested, and timely isolation can be performed for defective products with circuit failure and resistance value exceeding the limit, so as to ensure the pass rate of the product after assembly.
  • the moving mechanism 30 can be a manipulator with a high degree of freedom, or a moving mechanism 30 such as a three-axis or two-axis, etc., as long as it can accurately drive the testing mechanism 20 to move toward or away from the testing platform 10, it is not correct here.
  • the moving mechanism 30 is defined.
  • the limiting member 40 may have a block structure, or other structures such as a rod shape, and the shape of the limiting member 40 is not limited here.
  • the limiter 40 is fixedly connected to the test mechanism 20, and is in contact with the surface of the test platform 10 during the movement of the test mechanism 20 towards the test platform 10, so as to limit the distance that the test mechanism 20 moves relative to the test platform 10, which can ensure The movement of the testing mechanism 20 is in place, avoiding the failure caused by the undervoltage of the detection assembly 23 and the electronic components to be tested.
  • the quantity of the limiting parts 40 can be multiple arranged at intervals, so as to further improve the precision of the movement of the testing mechanism 20 .
  • the number of limiting members 40 can be two, and the two limiting members 40 can be arranged at both ends of the fixed plate 22 in the length direction.
  • the two position limiting members 40 can be arranged opposite to each other on the detection assembly 23 located at both ends of the fixing plate 22 in the length direction, so as to improve the position limiting accuracy.
  • the testing mechanism 20 includes:
  • the fixed plate 22 is connected with the moving mechanism 30;
  • the detection assembly 23 includes a first detection piece 231 and a second detection piece 24 that are spaced apart from the surface of the fixed plate 22, and the first detection piece 231 and the second detection piece 24 are respectively connected to the electrical tester. sexual connection;
  • the first detecting element 231 and/or the second detecting element 24 are elastically connected to the fixing plate 22;
  • the limiting member 40 is connected to the fixing plate 22 .
  • the fixed plate 22 and the moving mechanism 30 may be connected directly or indirectly.
  • the testing mechanism 20 further includes an adjusting plate 21 , and the fixing plate 22 is fixed on the surface of the adjusting plate 21 .
  • the moving mechanism 30 is fixedly connected with the adjusting plate 21 .
  • the top of the adjustment plate 21 is also provided with an adjustment hole 211 extending along the length direction of the adjustment plate 21, and the adjustment plate 21 is connected with the moving mechanism 30 through the adjustment hole 211 through a connecting piece such as a bolt, so as to facilitate the adjustment of the manipulator.
  • the connection position with the adjustment plate 21 It can be understood that the accuracy requirement of the adjustment plate 21 is not high, and it can be made of plastic board, wood board and other materials. This kind of material also has insulation properties, and can test whether there is a circuit between the mechanism 20 and the manipulator.
  • the fixing plate 22 is roughly a square plate, and the material of the fixing plate 22 is not limited, and it can also be made of wood, plastic or metal, as long as the strength of the fixing plate 22 meets the requirements.
  • the fixed plate 22 is made of metal, which can improve the accuracy and strength of the fixed plate 22.
  • the fixed plate 22 is made of metal, the fixed plate 22 has conductivity. If the detection component 23 is directly connected to the fixed plate 22 , the fixing plate 22 needs to be insulated.
  • the first detection element 231 is a conductive block, and the conductive block includes a fixed part 2311 , a connecting part 2313 and Clamping part 2315;
  • the fixing part 2311 is fixedly connected to the surface of the fixing plate 22, the connecting part 2313 protrudes from the side of the fixing part 2311 facing the test bench 10, and the pressing part 2315 protrudes from the connecting part 2315.
  • the part 2313 is away from the side of the fixing part 2311, and the pressing part 2315 is used to abut against the elastic components of the circuit board to be tested.
  • the elastic components of the circuit board to be tested in the conductive block abut against each other. At this time, the elastic components are compressed and deformed, and the conductive block is arranged in a block shape. , the contact surface between the conductive block and the elastic component can be made larger, so as to ensure the reliability of the contact between the conductive block and the elastic component.
  • the angles between the fixing part 2311 of the conductive block, the connecting part 2313 and the pressing part 2315 are all 90 degrees, so that the fixing part 2311 of the conductive block and the fixing plate 22 can be realized, and the pressing part can also be realized.
  • the fixing part 2311 , the connecting part 2313 and the cladding part 2315 are integrally structured to enhance the structural strength of the conductive block, and at the same time reduce the number of parts and reduce the difficulty of assembly. It can be understood that when the fixed plate 22 is made of metal, at this time, the conductive block is directly fixedly connected with the fixed plate 22, which will make the test circuit communicate with the fixed plate 22 and affect the effect of the test. At this time, the conductive block and the fixed plate 22 An insulating block 25 needs to be arranged between them. The insulating block 25 can effectively isolate the fixing plate 22 from the test circuit, improving the accuracy of the test.
  • the insulating block 25 is fixed on the surface of the fixing plate 22 by screws, and is arranged between the fixing plate 22 and the conductive block.
  • the conductive block is also fixedly connected to the insulating block 25 by screws, so as to improve the fixing reliability of the conductive block.
  • the insulating block 25 can be made of plastic material, and after a long time of use, the screws and the plastic material are prone to loosening.
  • the conductive block is provided with a first escape hole 2311a, and part of the screws of the insulating block 25 are exposed through the first avoidance hole 2311a.
  • the screws of the insulating block 25 can be fastened through the first escape hole 2311 a without removing the conductive block, so as to improve the reliability of the connection between the insulating block 25 and the fixing plate 22 .
  • the insulating block 25 can be fastened without dismantling the conductive block, and errors caused by disassembling and assembling the conductive block can be reduced, ensuring the consistency of multiple tests.
  • the limiting member 40 is connected to the fixing plate 22 through the insulating block 25, the limiting member 40 is provided with a second escape hole 41, and the insulating block Part of the screws of 25 are exposed in the second avoidance hole 41 .
  • the stopper 40 can also be fixed on the surface of the insulating block 25, so that the stopper 40 and the conductive block are fixed on the same part to reduce errors caused by multiple component assemblies, further Improve the limit accuracy of the limit block.
  • a second avoidance hole 41 may be provided on the limiter 40, and the function of the second avoidance hole 41 is the same as that of the first avoidance hole 2311a.
  • the screws of the insulating member can be fastened. In this way, the accuracy of the position of the limiting member 40 can be ensured, and the consistency of the test data before and after can be improved.
  • the testing mechanism 20 further includes an elastic moving assembly 26, the elastic moving assembly 26 is arranged on the fixed plate 22, and the second detecting member 24 moves through the elastic movement
  • the assembly 26 is elastically connected to the fixing plate 22 .
  • the elastic moving assembly 26 includes a slide rail 261, a slide block 262, a positioning member 263 and an elastic member 265.
  • the slide rail 261 is fixed on the surface of the fixed plate 22 by screws, and the slide rail 261
  • the extension direction is the vertical direction, that is, changing the direction is also the arrangement direction of the test mechanism 20 and the test bench 10;
  • the slide block 262 is slidably arranged on the slide rail 261, and the slide block 262 is used to fix the second detection piece 24;
  • the positioning piece 263 is set
  • the end of the slide rail 261 away from the test bench 10 is connected with the slide block 262;
  • the positioning member 263 includes a positioning plate and a connecting rod, and the positioning plate is fixed on the fixing plate 22 and is located at the end of the slide rail 261.
  • the elastic member 265 can be a spring, elastic colloid, etc.
  • the elastic member 265 is sleeved on the surface of the connecting rod, so that the two ends of the elastic member 265 elastically abut against the positioning plate and the slider 262 respectively, so that the slider 262 drives the second detection member 24 sports.
  • the elastic member 265 can be compressed to avoid crushing the component to be tested and avoid defective products caused by overvoltage Appear.
  • the second detection member 24 includes:
  • Probe clamping plate 241, the probe clamping plate 241 is fixed to the slider 262;
  • a probe pressing plate 243, the probe pressing plate 243 is fixed on the surface of the probe clamping plate 241 away from the slider 262;
  • Probing pin 245, the probing pin 245 is clamped between the probe clamping plate 241 and the probe pressing plate 243, and the end of the probing pin 245 away from the probe clamping plate 241 is used to communicate with the circuit to be tested board abutment.
  • the probe clamping plate 241 and the slider 262 are fixedly connected by screws to improve the reliability of fixing the probe clamping plate 241 and the slider 262.
  • the probe clamping plate 243 and the probe clamping plate 241 It is also fixedly connected by screws to improve the firmness of fixing the probe pressing plate 243 and the probe clamping plate 241 .
  • the opposite surfaces of the probe clamping plate 241 and the probe pressing plate 243 are arranged in positioning grooves matching the shape of the probe pin 245 , so as to improve the reliability of fixing the probe pin 245 .
  • the probe clamping plate 241 , the probe pressing plate 243 and the probe needle 245 are all made of conductive material, and the slider 262 is made of insulating material. Due to the small size of the probe needle 245 , it is inconvenient to wire. Therefore, the probe splint 241 and the probe pressure plate 243 are both made of conductive materials to improve the convenience of wiring with the tester. Since the probe clamp 241 is made of conductive material, in order to improve the test accuracy, the slider 262 is made of insulating material to effectively isolate the test circuit. Likewise, a third escape hole may be provided on the probe clamp 241 , and part of the screws of the slider 262 are exposed through the third avoidance hole. In this way, the screws on the slider 262 can be fastened through the third escape hole without removing the probe clamp 241 , so as to improve the reliability of the connection of the slider 262 .
  • the cross-section of the probe clamping plate 241 is roughly Z-shaped, so that the probe clamping plate 241 can form an avoidance space to provide a space for the installation of the first detecting element 231 .
  • the testing device 100 also includes a retrieving mechanism 50, the retrieving mechanism 50 is connected to the moving mechanism 30 and is located in the testing mechanism 20 on one side.
  • the retrieving mechanism 50 includes a mounting plate 51 , a parallel opening and closing air claw 53 , a retrieving jaw 55 , an air cylinder 57 , and a detector 59 .
  • Cylinder 57 mounting plate 51 is connected with moving mechanism 30, and cylinder 57 is located on mounting plate 51, and cylinder 57 drives parallel opening and closing type air claw 53 to move, so that fetching jaw 55 tightens up or releases the unqualified circuit board of detection.
  • the detector 59 is arranged on the pick-up jaw 55 to detect whether the circuit board is clamped, so as to improve the reliability of the pick-up mechanism 50 .
  • the test device 100 further includes a cleaning mechanism 60, which is adjustably arranged at the bottom of the test bench 10, and the cleaning mechanism 60 is used for The first detecting element 231 and the second detecting element 24 .
  • the cleaning mechanism 60 includes a base 61, a connecting base 63, and a cleaning wheel brush 65
  • the connecting base 63 is connected to the base 61, and can be moved relative to the base 61
  • the The cleaning wheel brush 65 is rotatably disposed on the connecting seat 63 .
  • the base 61 provides a carrier for the installation of the cleaning mechanism 60.
  • the connecting base 63 is fixedly connected to the base 61.
  • the connecting base 63 is provided with an arc-shaped groove, and the adjusting member passes through the arc-shaped groove to adjust the relative position of the connecting base 63 and the base 61.
  • the cleaning wheel brush 65 is driven by a motor 67 .
  • the moving mechanism 30 drives the testing mechanism 20 to move, so that the first detection piece 231 or the second detection piece 24 is moved to contact with the cleaning wheel brush 65 respectively position, the motor 67 drives the cleaning wheel brush 65 to clean the first detecting element 231 or the second detecting element 24 , so as to improve the conduction performance of the first detecting element 231 or the second detecting element 24 .

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Tests Of Electronic Circuits (AREA)

Abstract

一种测试装置(100)，包括测试台(10)、测试机构(20)、移动机构(30)以及限位件(40)。测试台(10)用于固定待测线路板；测试机构(20)设于测试台(10)的一侧，包括至少一对探测组件(23)，探测组件(23)与测试仪电性连接；移动机构(30)与测试机构(20)连接，并驱动测试机构(20)朝向或远离测试台(10)运动，以使探测组件(23)与待测线路板弹性抵接；限位件(40)与测试机构(20)连接，测试机构(20)朝向测试台(10)运动时，限位件(40)与测试台(10)抵接，以限制测试机构(20)相对测试台(10)移动的距离。测试装置(100)能提高测试质量。

Description

测试装置 技术领域
本发明涉及测试设备技术领域，特别涉及一种测试装置。
背景技术
线路板是电子产品中的重要部件，线路板上集成、连接有多个电子元器件，以实现电子产品的各种功能。为了确保电子产品的良品率，在电子元器件与线路板组件连接后，通常会对各个电子元器件的电子电路进行测试，这种测试需要在测试装置上完成。
测试装置包括测试台和可移动的测试件，待测线路板固定于测试台上，测试件朝向线路板移动并与测线路板上的各个电子元器件的接电点抵接，以实现对电子元件的电子电路进行测试。目前，主流的方案为机械手带动测试件朝向待测线路板运动，但是，机械手的行程的精度难以控制，容易出现测试过程中测试件待测产品接触不良，测试数据一致性差的问题；或者是测试件过压待测产品造成不良率高的问题，影响测试质量。
发明内容
本发明的主要目的是提供一种测试装置，旨在提高测试装置的测试质量。
为实现上述目的，本发明提出的测试装置，包括：
测试台，所述测试台用于固定待测线路板；
测试机构，所述测试机构设于所述测试台的一侧，所述测试机构包括至少一对探测组件，所述探测组件与测试仪电性连接；
移动机构，所述移动机构与所述测试机构连接，并驱动所述测试机构朝向或远离所述测试台运动，以使所述探测组件与待测线路板弹性抵接；以及
限位件，所述限位件与所述测试机构连接，所述测试机构朝向所述测试台运动时，所述限位件与所述测试台抵接，以限制所述测试机构相对所述测试台移动的距离。
在发明的一实施例中，所述测试机构包括：
固定板，所述固定板与所述移动机构连接；
所述探测组件包括间隔设与所述固定板表面的第一探测件和第二探测件，所述第一探测件和所述第二探测件分别与所述测试仪电性连接；
所述第一探测件和/或所述第二探测件与所述固定板弹性连接；
所述限位件与所述固定板连接。
在发明的一实施例中，所述第一探测件为导电块，所述导电块包括依次连接且相互呈夹角设置的固定部、连接部以及压覆部；
所述固定部固定连接于所述固定板的表面，所述连接部凸设于所述固定部朝向所述测试台的一侧，所述压覆部凸设所述连接部远离所述固定部的一侧，所述压覆部用于与所述待测线路板的弹性元器件抵接。
在发明的一实施例中，所述测试机构还包括绝缘块，所述绝缘块通过螺钉固定于所述固定板的表面，并设于所述固定板和所述导电块之间。
在发明的一实施例中，导电块设有第一避让孔，所述绝缘块的部分螺钉显露于所述第一避让孔。
在发明的一实施例中，所述限位件通过所述绝缘块与所述固定板连接，所述限位件设有第二避让孔，所述绝缘块的部分螺钉显露于所述第二避让孔
在发明的一实施例中，所述测试机构还包括弹性移动组件，所述弹性移动组件设于所述固定板，所述第二探测件通过所述弹性移动组件与所述固定板弹性连接。
在发明的一实施例中，所述弹性移动组件包括：
滑轨，所述滑轨设于所述固定板表面，并沿所述测试机构和所述测试台的排布方向延伸设置；
滑块，所述滑块滑动设于所述滑轨，所述滑块用于固定所述第二探测件；
定位件，所述定位件设于所述滑轨远离所述测试台的一端，并所述滑块连接；以及
弹性件，所述弹性件的两端分别弹性抵接所述定位件和所述滑块，以使所述滑块驱动所述第二探测件运动。
在发明的一实施例中，所述第二探测件包括：
探针夹板，所述探针夹板与所述滑块固定；
探针压板，所述探针压板固定于所述探针夹板远离所述滑块的表面；以及
探测针，所述探测针夹持于所述探针夹板和所述探针压板之间，所述探测针远离所述探针夹板的一端用于与所述待测线路板抵接。
在发明的一实施例中，所述探针夹板、所述探针压板以及所述探测针均为导电材质，所述滑块为绝缘材质。
在发明的一实施例中，所述探针夹板设有第三避让孔，所述滑块的部分螺钉显露于所述第三避让孔。
在发明的一实施例中，所述测试装置还包括取料机构，所述取料机构设于所述移动机构连接，并位于所述测试机构的一侧。
在发明的一实施例中，测试装置还包括清洁机构，所述清洁机构可调节地设于所述测试台底部，所述清洁机构用于所述第一探测件和所述第二探测件。
在发明的一实施例中，所述清洁机构包括：
底座；
连接座，所述连接座与底座连接，并可相对所述底座活动设置；以及
清洁轮刷，所述清洁轮刷可转动地设于所述连接座。
本发明技术方案测试装置包括测试台、测试机构、移动机构以及限位件。测试台用于固定待测线路板，测试机构设于测试台的一侧，测试机构包括至少一对探测组件，探测组件与测试仪电性连接；移动机构与测试机构连接，并驱动测试机构朝向或远离测试台运动，以使探测组件与待测线路板弹性抵接；限位件与测试机构连接。测试时，移动机构带动测试机构朝向测试台运动的过程中，限位件与测试台的表面抵接，如此，可以限制测试机构相对以测试机构相对测试台移动的距离，以确保测试机构的移动精度，避免出现因测试机构相对测试台移动的距离不够而出现探测组件与待测元器件欠压的情况，保证设于测试机构的上探测组件能与待测线路板上的待测元器件有良好的接触。同时，由于探测组件与待测线路板弹性抵接，也能有效地避免探测组件与待测线路板上的待测元器件出现过过压的情况，有效地对待测线路板进行保护，提升了测试的质量，降低了因欠压出现测试不准确的结果，也降低了因过压导致的不良品，提升了线路板的测试质量。
附图说明
为了更清楚地说明本发明实施例或现有技术中的技术方案，下面将对实施例或现有技术描述中所需要使用的附图作简单地介绍，显而易见地，下面描述中的附图仅仅是本发明的一些实施例，对于本领域普通技术人员来讲，在不付出创造性劳动的前提下，还可以根据这些附图示出的结构获得其他的附图。
图1为本发明测试装置一实施例的结构示意图；
图2为图1中测试装置的结构分解图；
图3为本发明测试机构的结构示意图；
图4为图3中A处的局部放大图；
图5为本发明测试装置第一测试件结构示意图；
图6为本发明测试装置中限位件的结构示意图。
附图标号说明：
标号 名称 标号 名称
100 测试装置 261 滑轨
10 测试台 262 滑块
20 测试机构 263 定位件
21 调节板 265 弹性件
211 调节孔 30 移动机构
22 固定板 40 限位件
23 探测组件 41 第二避让孔
231 第一探测件 50 取料机构
2311 固定部 51 安装板
2311a 第一避让孔 53 平行开闭型气爪
2313 连接部 55 取料夹爪
2315 压覆部 57 气缸
24 第二探测件 59 检测器
241 探针夹板 60 清洁机构
243 探针压板 61 底座
245 探测针 63 连接座
25 绝缘块 65 清洁轮刷
26 弹性移动组件 67 电机
本发明目的的实现、功能特点及优点将结合实施例，参照附图做进一步说明。
具体实施方式
下面将结合本发明实施例中的附图，对本发明实施例中的技术方案进行清楚、完整地描述，显然，所描述的实施例仅仅是本发明的一部分实施例，而不是全部的实施例。基于本发明中的实施例，本领域普通技术人员在没有作出创造性劳动前提下所获得的所有其他实施例，都属于本发明保护的范围。
需要说明，本发明实施例中所有方向性指示(诸如上、下、左、右、前、后……)仅用于解释在某一特定姿态(如附图所示)下各部件之间的相对位置关系、运动情况等，如果该特定姿态发生改变时，则该方向性指示也相应 地随之改变。
在本发明中，除非另有明确的规定和限定，术语“连接”、“固定”等应做广义理解，例如，“固定”可以是固定连接，也可以是可拆卸连接，或成一体；可以是机械连接，也可以是电连接；可以是直接相连，也可以通过中间媒介间接相连，可以是两个元件内部的连通或两个元件的相互作用关系，除非另有明确的限定。对于本领域的普通技术人员而言，可以根据具体情况理解上述术语在本发明中的具体含义。
另外，在本发明中如涉及“第一”、“第二”等的描述仅用于描述目的，而不能理解为指示或暗示其相对重要性或者隐含指明所指示的技术特征的数量。由此，限定有“第一”、“第二”的特征可以明示或者隐含地包括至少一个该特征。另外，全文中出现的“和/或”的含义为，包括三个并列的方案，以“A和/或B为例”，包括A方案，或B方案，或A和B同时满足的方案。另外，各个实施例之间的技术方案可以相互结合，但是必须是以本领域普通技术人员能够实现为基础，当技术方案的结合出现相互矛盾或无法实现时应当认为这种技术方案的结合不存在，也不在本发明要求的保护范围之内。
本发明提出一种测试装置100。
参照图1至图6，本发明测试装置100一实施例的测试装置100包括：
测试台10，所述测试台10用于固定待测线路板；
测试机构20，所述测试机构20设于所述测试台10的一侧，所述测试机构20包括至少一对探测组件23，所述探测组件23与测试仪电性连接；
移动机构30，所述移动机构30与所述测试机构20连接，并驱动所述测试机构20朝向或远离所述测试台10运动，以使所述探测组件23与待测线路板弹性抵接；以及
限位件40，所述限位件40与所述测试机构20连接，所述测试机构20朝向所述测试台10运动时，所述限位件40与所述测试台10抵接，以限制所述测试机构20相对所述测试台10移动的距离。
本发明技术方案测试装置100包括测试台10、测试机构20、移动机构30以及限位件40。测试台10用于固定待测线路板(未图示)，测试机构20设于测试台10的一侧，测试机构20包括至少一对探测组件23，探测组件23与测试仪电性连接；移动机构30与测试机构20连接，并驱动测试机构20朝向或 远离测试台10运动，以使探测组件23与待测线路板弹性抵接；限位件40与测试机构20连接。测试时，移动机构30带动测试机构20朝向测试台10运动的过程中，限位件40与测试台10的表面抵接，如此，可以限制测试机构20相对以测试机构20相对测试台10移动的距离，以确保测试机构20的移动精度，避免出现因测试机构20相对测试台10移动的距离不够而出现探测组件23与待测元器件欠压的情况，保证设于测试机构20的上探测组件23能与待测线路板上的待测元器件有良好的接触。同时，由于探测组件23与待测线路板弹性抵接，也能有效地避免探测组件23与待测线路板上的待测元器件出现过过压的情况，有效地对待测线路板进行保护，提升了测试的质量，降低了因欠压出现测试不准确的结果，也降低了因过压导致的不良品，提升了线路板的测试质量。
本发明的一实施例中，测试台10为待测线路板提供固定的载体，测试台10上设有测试线路板所必要的测试工装(未标示)，工装设有对应的测试电路、电源以及固定治具等。测试工装上可以是设有一个测试位(未标示)，一个测试位可固定一待测线路板，一探测组件23用于与一待测线路板抵接。当然，测试工装上也可以是设置有多个间隔设置的测试位，这样，以测试工装上可以固定多个待测线路板，测试机构20则设有与待测线路板数量对应的探测组件23，如此，可以提升测试效率。如图1所示，测试机构20上设有4组探测组件23，可以同时对4块线路板进行测试，以提升测试的效率。
为了提升限位件40与测试工装之间限位的可靠性，还可以在正式的测试前，使用调试工装对限位件40的限位精度进行调试。可以理解地，调试工装与测试工装的外形一致，只是调试工装上未固定有待测的线路板。待调试完成后，将调试工装替换为测试工装，便可进入正式的测试工作。
测试仪通过导线与探测组件23电性连接，以将测试结果通过测试仪的显示屏进行显示，便于测试人员快速地了解测试结果。当测试的数值出现异常时，测试仪可做出及时提示，以隔离测试不合格的产品。本发明实施例中，可以测试线路板上的电子元器件的通断以及电阻值，针对电路不通、阻值超限的不良品，能做及时的隔离处理，确保产品组装后的合格率。
移动机构30可以是自由度较高的机械手，也可以是三轴或两轴等移动机构30等，只要能实现精确地驱动测试机构20朝向或远离测试台10移动的机 构均可，在此不对移动机构30进行限定。
限位件40可以呈块状结构，也可以是杆状等其他的结构，在此不对限位件40的形状进行限定。限位件40与测试机构20固定连接，并在测试机构20朝向测试台10运动的过程中与测试台10表面抵接限位，以限制测试机构20相对测试台10移动的距离，即可以确保测试机构20的移动到位，避免出现探测组件23与待测电子元器件欠压而导致不良的情况。限位件40的数量可以是有间隔设置的多个，以进一步提升测试机构20移动的精度。如1所示，大当测试机构20上设有4组探测组件23，限位件40的数量可以两个，两个限位件40可以设于固定板22的长度方向的两端。或者，两个限位件40可以分别对设于位于固定板22长度方向两端的探测组件23上，以提升限位的精度。
参照图3，在发明的一实施例中，所述测试机构20包括：
固定板22，所述固定板22与所述移动机构30连接；
所述探测组件23包括间隔设与所述固定板22表面的第一探测件231和第二探测件24，所述第一探测件231和所述第二探测件24分别与所述测试仪电性连接；
所述第一探测件231和/或所述第二探测件24与所述固定板22弹性连接；
所述限位件40与所述固定板22连接。
在本发明一实施例的技术方案中，固定板22与移动机构30可以是直接连接，也可是间接连接。例如，测试机构20还包括有调节板21，固定板22固定于调节板21的表面。移动机构30与调节板21固定连接。为了确保探测组件23固定的精度。在一实施例中，调节板21的顶部还设有沿调节板21的长度方向延伸的调节孔211，调节板21通过螺栓等连接件穿过调节孔211与移动机构30连接，以便于调节机械手与调节板21的连接位置。可以理解地，调节板21的精度要求不高，可以采用塑料板、木材板等材质制成，这类材质还具有绝缘性，可以测试机构20与机械手之间有电路导通。
固定板22大致为方形板，固定板22的材质不限定，也可以木材、塑料或金属材质等，只要固定板22的强度满足需求即可。
在一实施例中，固定板22采用为金属材质，可以提升固定板22的精度和强度，当固定板22为金属材质时，固定板22具有导电性，若探测组件23 直接与固定板22连接，则需要对固定板22进行绝缘处理。
进一步，参照图3至图5，在发明的一实施例中，所述第一探测件231为导电块，所述导电块包括依次连接且相互呈夹角设置的固定部2311、连接部2313以及压覆部2315；
所述固定部2311固定连接于所述固定板22的表面，所述连接部2313凸设于所述固定部2311朝向所述测试台10的一侧，所述压覆部2315凸设所述连接部2313远离所述固定部2311的一侧，所述压覆部2315用于与所述待测线路板的弹性元器件抵接。
在本发明的一实施例中，当测试机构20朝向测试台10运动时，导电块待测线路板的弹性元器件抵接，此时，弹性元器件受压发生形，导电块呈块状设置，可以使得到导电块与弹性元器件的接触面较大，以确保导电块与弹性元器件接触的可靠性。可以理解地，导电块的固定部2311、连接部2313以及压覆部2315之间的夹角均为90度，如此，既能实现导电块固定部2311与固定板22，又能实现压覆部2315能凸出在固定板22的外侧与待测元器件抵接。固定部2311、连接部2313以及压覆部2315为一体结构，以提升导电块的结构强度，同时也能减少零件的数量，降低装配的难度。可以理解地，当固定板22为金属材质时，此时，导电块直接与固定板22固定连接，会使得测试电路与固定板22连通，影响测试的效果，此时，导电块和固定板22之间需要设置一绝缘块25。绝缘块25可以有效地将固定板22和测试电路隔断，提升测试地准确性。
进一步，在一实施例中，所述绝缘块25通过螺钉固定于所述固定板22的表面，并设于所述固定板22和所述导电块之间。导电块也通过螺钉与绝缘块25固定连接，以提升导电块固定的可靠性。绝缘块25可以由塑料材质制成，长时间使用后，螺钉与塑料材质容易出现松动。导电块设有第一避让孔2311a，所述绝缘块25的部分螺钉显露于所述第一避让孔2311a。如此，可以在不拆除导电块的情况下，通过第一避让孔2311a实现对绝缘块25的螺钉进行紧固操作，以提升绝缘块25与固定板22之间连接的可靠性。这样既能实现对绝缘块25进行紧固，不拆除导电块，也减小了因拆装导电块而造成的误差，确保了多次测试的一致性。
参照图1，在发明的一实施例中，所述限位件40通过所述绝缘块25与所 述固定板22连接，所述限位件40设有第二避让孔41，所述绝缘块25的部分螺钉显露于所述第二避让孔41。
在本发明的一实施例中，限位件40也可以固定在绝缘块25表面，如此，限位件40和导电块固定于同一个部件上，以降低因多个部件组件产生的误差，进一步提升限位块的限位精度。此时，在本发明的一实施例中，可以在限位件40设有第二避让孔41，第二避让孔41的作用与第一避让孔2311a的作用一样，都是为了在不拆除限位件40的情况下实现对绝缘件的螺钉进行紧固，如此，可以确保限位件40位置的精度，提升前后测试数据的一致性。
参照图3，在发明的一实施例中，所述测试机构20还包括弹性移动组件26，所述弹性移动组件26设于所述固定板22，所述第二探测件24通过所述弹性移动组件26与所述固定板22弹性连接。
在本发明一实施例的技术方案中，弹性移动组件26包括滑轨261、滑块262、定位件263以及弹性件265，滑轨261通过螺钉固定安装在固定板22的表面，并且滑轨261的延伸方向为竖直方向，即改方向也是测试机构20和测试台10的排布方向；滑块262滑动设于滑轨261，滑块262用于固定第二探测件24；定位件263设于滑轨261远离测试台10的一端，并滑块262连接；定位件263包括有定位板和连接杆，定位板固定在固定板22上，并位于滑轨261的端部设置。连接杆的一端连接于定位板的表面，另一端与滑块262连接。弹性件265可以是弹簧、弹性胶体等，弹性件265套设于连接杆表面，使得弹性件265的两端分别弹性抵接定位板和滑块262，以使滑块262驱动第二探测件24运动。如此，第二探测件24与待测的元器件抵接时，由于弹性件265的设置，在弹性件265的作用下，能确保第二探测件24与待测的元器件进行可靠地抵接，或者，在第二探测件24与待测的元器件要出现过压情况下，还能使得弹性件265被压缩，以避免将待测元器件压坏，避免因过压而导致不良品的出现。
具体地，参照图3和图4，在发明的一实施例中，所述第二探测件24包括：
探针夹板241，所述探针夹板241与所述滑块262固定；
探针压板243，所述探针压板243固定于所述探针夹板241远离所述滑块262的表面；以及
探测针245，所述探测针245夹持于所述探针夹板241和所述探针压板243之间，所述探测针245远离所述探针夹板241的一端用于与所述待测线路板抵接。
在本发明一实施例的技术方案中，探针夹板241与滑块262通过螺钉固定连接，以提升探针夹板241与滑块262固定的可靠性，同样，探针压板243与探针夹板241也通过螺钉固定连接，以提升探针压板243与探针夹板241固定的牢固性。探针夹板241和探针压板243相对的表面均设于与探测针245的形状相适配的定位槽，以提升探测针245固定的可靠性。在发明的一实施例中，所述探针夹板241、所述探针压板243以及所述探测针245均为导电材质，所述滑块262为绝缘材质。由于探测针245的体积小，不方便接线，因此通过将探针夹板241和探针压板243均设置为导电材质，以提升与测试仪接线的方便性。由于探针夹板241为导电材质，为了提升测试精度，因此，将滑块262设置为绝缘材质，以有效地隔绝测试电路。同样，可以在探针夹板241设有第三避让孔，所述滑块262的部分螺钉显露于所述第三避让孔。这样，可以在不拆除探针夹板241的情况下通过第三避让孔实现对滑块262上的螺丝进行紧固处理，以提升滑块262连接的可靠性。
探针夹板241的横截面大致呈Z形结构，可以使得探针夹板241形成有避让空间，为第一探测件231的安装提供空间。
进一步，参照图1和图2，在发明的一实施例中，所述测试装置100还包括取料机构50，所述取料机构50设于所述移动机构30连接，并位于所述测试机构20的一侧。
在本发明一实施例的技术方案中，取料机构50包括有安装板51、平行开闭型气爪53、取料夹爪55、气缸57、检测器59组成。气缸57安装板51与移动机构30连接，气缸57设于安装板51上，气缸57驱动平行开闭型气爪53运动，以使得取料夹爪55加紧或释放检测不合格的线路板。检测器59设于取料夹爪55上，以检测是否夹紧线路板，提升取料机构50的可靠性。
进一步，参照图1和图2，在发明的一实施例中，测试装置100还包括清洁机构60，所述清洁机构60可调节地设于所述测试台10底部，所述清洁机构60用于所述第一探测件231和所述第二探测件24。
在本发明一实施例的技术方案中，清洁机构60包括底座61、连接座63， 以及清洁轮刷65，所述连接座63与底座61连接，并可相对所述底座61活动设置，所述清洁轮刷65可转动地设于所述连接座63。底座61为清洁机构60的安装提供载体，连接座63与底座61固定连接，连接座63上设有弧形槽，通过调节件穿过弧形槽，以调节连接座63与底座61的相对位置。清洁轮刷65通过电机67驱动。当需要对第一探测件231和第二探测件24进行清洁时，通过移动机构30带动测试机构20移动，以将第一探测件231或第二探测件24分别移动至与清洁轮刷65接触的位置，电机67驱动清洁轮刷65以实现对第一探测件231或第二探测件24进行清洁，以提升第一探测件231或第二探测件24的导通性能。
以上所述仅为本发明的优选实施例，并非因此限制本发明的专利范围，凡是在本发明的发明构思下，利用本发明说明书及附图内容所作的等效结构变换，或直接/间接运用在其他相关的技术领域均包括在本发明的专利保护范围内。

Claims (14)

  1. 一种测试装置，其特征在于，包括：
    测试台，所述测试台用于固定待测线路板；
    测试机构，所述测试机构设于所述测试台的一侧，所述测试机构包括至少一对探测组件，所述探测组件与测试仪电性连接；
    移动机构，所述移动机构与所述测试机构连接，并驱动所述测试机构朝向或远离所述测试台运动，以使所述探测组件与待测线路板弹性抵接；以及
    限位件，所述限位件与所述测试机构连接，所述测试机构朝向所述测试台运动时，所述限位件与所述测试台抵接，以限制所述测试机构相对所述测试台移动的距离。
  2. 如权利要求1所述的测试装置，其特征在于，所述测试机构包括：
    固定板，所述固定板与所述移动机构连接；
    所述探测组件包括间隔设与所述固定板表面的第一探测件和第二探测件，所述第一探测件和所述第二探测件分别与所述测试仪电性连接；
    所述第一探测件和/或所述第二探测件与所述固定板弹性连接；
    所述限位件与所述固定板连接。
  3. 如权利要求2所述的测试装置，其特征在于，所述第一探测件为导电块，所述导电块包括依次连接且相互呈夹角设置的固定部、连接部以及压覆部；
    所述固定部固定连接于所述固定板的表面，所述连接部凸设于所述固定部朝向所述测试台的一侧，所述压覆部凸设所述连接部远离所述固定部的一侧，所述压覆部用于与所述待测线路板的弹性元器件抵接。
  4. 如权利要求3所述的测试装置，其特征在于，所述测试机构还包括绝缘块，所述绝缘块通过螺钉固定于所述固定板的表面，并设于所述固定板和所述导电块之间。
  5. 如权利要求4所述的测试装置，其特征在于，导电块设有第一避让孔，所述绝缘块的部分螺钉显露于所述第一避让孔。
  6. 如权利要求4所述的测试装置，其特征在于，所述限位件通过所述绝缘块与所述固定板连接，所述限位件设有第二避让孔，所述绝缘块的部分螺钉显露于所述第二避让孔。
  7. 如权利要求2所述的测试装置，其特征在于，所述测试机构还包括弹性移动组件，所述弹性移动组件设于所述固定板，所述第二探测件通过所述弹性移动组件与所述固定板弹性连接。
  8. 如权利要求7所述的测试装置，其特征在于，所述弹性移动组件包括：
    滑轨，所述滑轨设于所述固定板表面，并沿所述测试机构和所述测试台的排布方向延伸设置；
    滑块，所述滑块滑动设于所述滑轨，所述滑块用于固定所述第二探测件；
    定位件，所述定位件设于所述滑轨远离所述测试台的一端，并所述滑块连接；以及
    弹性件，所述弹性件的两端分别弹性抵接所述定位件和所述滑块，以使所述滑块驱动所述第二探测件运动。
  9. 如权利要求8所述的测试装置，其特征在于，所述第二探测件包括：
    探针夹板，所述探针夹板与所述滑块固定；
    探针压板，所述探针压板固定于所述探针夹板远离所述滑块的表面；以及
    探测针，所述探测针夹持于所述探针夹板和所述探针压板之间，所述探测针远离所述探针夹板的一端用于与所述待测线路板抵接。
  10. 如权利要求9所述的测试装置，其特征在于，所述探针夹板、所述探针压板以及所述探测针均为导电材质，所述滑块为绝缘材质。
  11. 如权利要求9所述的测试装置，其特征在于，所述探针夹板设有第三避让孔，所述滑块的部分螺钉显露于所述第三避让孔。
  12. 如权利要求1至11中任意一项所述的测试装置，其特征在于，所述测试装置还包括取料机构，所述取料机构设于所述移动机构连接，并位于所述测试机构的一侧。
  13. 如权利要求2至11中任意一项所述的测试装置，其特征在于，测试装置还包括清洁机构，所述清洁机构可活动地设于所述测试台底部，所述清洁机构用于所述第一探测件和所述第二探测件。
  14. 如权利要求13所述的测试装置，其特征在于，所述清洁机构包括：
    底座；
    连接座，所述连接座与底座连接，并可相对所述底座活动设置；以及
    清洁轮刷，所述清洁轮刷可转动地设于所述连接座。
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CN116859891B (zh) * 2023-07-28 2023-12-29 华高科技（苏州）有限公司 一种机械臂控制模块功能测试系统
CN117289094A (zh) * 2023-09-27 2023-12-26 江苏卓玉智能科技有限公司 一种半导体元器件绝缘测试装置
CN117289094B (zh) * 2023-09-27 2024-04-19 江苏卓玉智能科技有限公司 一种半导体元器件绝缘测试装置
CN117890629A (zh) * 2023-11-02 2024-04-16 国网江苏省电力有限公司淮安供电分公司 一种电网设备测试用连接器
CN117686824A (zh) * 2023-12-14 2024-03-12 东晶电子金华有限公司 一种石英晶体谐振器测试装置
CN117686824B (zh) * 2023-12-14 2024-05-14 东晶电子金华有限公司 一种石英晶体谐振器测试装置

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