WO2023037728A1 - 蛍光体粉末、及び発光装置 - Google Patents
蛍光体粉末、及び発光装置 Download PDFInfo
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- WO2023037728A1 WO2023037728A1 PCT/JP2022/026112 JP2022026112W WO2023037728A1 WO 2023037728 A1 WO2023037728 A1 WO 2023037728A1 JP 2022026112 W JP2022026112 W JP 2022026112W WO 2023037728 A1 WO2023037728 A1 WO 2023037728A1
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- Prior art keywords
- phosphor
- light
- particles
- casn
- phosphor particles
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- 239000000843 powder Substances 0.000 title claims abstract description 104
- 239000002245 particle Substances 0.000 claims abstract description 147
- OAICVXFJPJFONN-UHFFFAOYSA-N Phosphorus Chemical compound [P] OAICVXFJPJFONN-UHFFFAOYSA-N 0.000 claims description 199
- 239000013078 crystal Substances 0.000 claims description 18
- 238000010304 firing Methods 0.000 description 44
- 238000000034 method Methods 0.000 description 43
- 229920005989 resin Polymers 0.000 description 37
- 239000011347 resin Substances 0.000 description 37
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 26
- 238000010438 heat treatment Methods 0.000 description 26
- 238000010298 pulverizing process Methods 0.000 description 25
- 238000000137 annealing Methods 0.000 description 22
- 239000006185 dispersion Substances 0.000 description 20
- 239000000047 product Substances 0.000 description 19
- 230000005284 excitation Effects 0.000 description 18
- 239000010419 fine particle Substances 0.000 description 18
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 description 16
- 239000011575 calcium Substances 0.000 description 16
- 239000000203 mixture Substances 0.000 description 16
- 239000012298 atmosphere Substances 0.000 description 15
- 238000010306 acid treatment Methods 0.000 description 14
- 239000007864 aqueous solution Substances 0.000 description 14
- -1 calcium nitride Chemical class 0.000 description 14
- 238000005259 measurement Methods 0.000 description 14
- 239000007788 liquid Substances 0.000 description 13
- 239000000463 material Substances 0.000 description 13
- 229910052693 Europium Inorganic materials 0.000 description 12
- 239000002612 dispersion medium Substances 0.000 description 12
- 238000002156 mixing Methods 0.000 description 12
- 239000011812 mixed powder Substances 0.000 description 11
- 229910052757 nitrogen Inorganic materials 0.000 description 11
- 229910052791 calcium Inorganic materials 0.000 description 10
- 150000001875 compounds Chemical class 0.000 description 10
- OGPBJKLSAFTDLK-UHFFFAOYSA-N europium atom Chemical compound [Eu] OGPBJKLSAFTDLK-UHFFFAOYSA-N 0.000 description 10
- 229910052712 strontium Inorganic materials 0.000 description 10
- 239000006228 supernatant Substances 0.000 description 10
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Chemical compound O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 10
- 229910052581 Si3N4 Inorganic materials 0.000 description 9
- 239000002253 acid Substances 0.000 description 9
- 239000007789 gas Substances 0.000 description 9
- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 description 9
- VEXZGXHMUGYJMC-UHFFFAOYSA-N Hydrochloric acid Chemical compound Cl VEXZGXHMUGYJMC-UHFFFAOYSA-N 0.000 description 8
- 229910052786 argon Inorganic materials 0.000 description 8
- 230000000052 comparative effect Effects 0.000 description 8
- 229910001940 europium oxide Inorganic materials 0.000 description 8
- AEBZCFFCDTZXHP-UHFFFAOYSA-N europium(3+);oxygen(2-) Chemical compound [O-2].[O-2].[O-2].[Eu+3].[Eu+3] AEBZCFFCDTZXHP-UHFFFAOYSA-N 0.000 description 8
- 238000004062 sedimentation Methods 0.000 description 7
- 229910052782 aluminium Inorganic materials 0.000 description 6
- 239000000470 constituent Substances 0.000 description 6
- PMHQVHHXPFUNSP-UHFFFAOYSA-M copper(1+);methylsulfanylmethane;bromide Chemical compound Br[Cu].CSC PMHQVHHXPFUNSP-UHFFFAOYSA-M 0.000 description 6
- 238000011049 filling Methods 0.000 description 6
- 239000011261 inert gas Substances 0.000 description 6
- 238000003756 stirring Methods 0.000 description 6
- OYPRJOBELJOOCE-UHFFFAOYSA-N Calcium Chemical compound [Ca] OYPRJOBELJOOCE-UHFFFAOYSA-N 0.000 description 5
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 5
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 5
- PSBUJOCDKOWAGJ-UHFFFAOYSA-N azanylidyneeuropium Chemical compound [Eu]#N PSBUJOCDKOWAGJ-UHFFFAOYSA-N 0.000 description 5
- 150000002178 europium compounds Chemical class 0.000 description 5
- 230000031700 light absorption Effects 0.000 description 5
- 239000002994 raw material Substances 0.000 description 5
- 229910052710 silicon Inorganic materials 0.000 description 5
- 239000010703 silicon Substances 0.000 description 5
- CIOAGBVUUVVLOB-UHFFFAOYSA-N strontium atom Chemical compound [Sr] CIOAGBVUUVVLOB-UHFFFAOYSA-N 0.000 description 5
- 239000001577 tetrasodium phosphonato phosphate Substances 0.000 description 5
- CSCPPACGZOOCGX-UHFFFAOYSA-N Acetone Chemical compound CC(C)=O CSCPPACGZOOCGX-UHFFFAOYSA-N 0.000 description 4
- KRHYYFGTRYWZRS-UHFFFAOYSA-N Fluorane Chemical compound F KRHYYFGTRYWZRS-UHFFFAOYSA-N 0.000 description 4
- NBIIXXVUZAFLBC-UHFFFAOYSA-N Phosphoric acid Chemical compound OP(O)(O)=O NBIIXXVUZAFLBC-UHFFFAOYSA-N 0.000 description 4
- QAOWNCQODCNURD-UHFFFAOYSA-N Sulfuric acid Chemical compound OS(O)(=O)=O QAOWNCQODCNURD-UHFFFAOYSA-N 0.000 description 4
- MCMNRKCIXSYSNV-UHFFFAOYSA-N Zirconium dioxide Chemical compound O=[Zr]=O MCMNRKCIXSYSNV-UHFFFAOYSA-N 0.000 description 4
- 230000001133 acceleration Effects 0.000 description 4
- 238000010908 decantation Methods 0.000 description 4
- 230000007547 defect Effects 0.000 description 4
- 229910001873 dinitrogen Inorganic materials 0.000 description 4
- 230000001747 exhibiting effect Effects 0.000 description 4
- 238000002360 preparation method Methods 0.000 description 4
- 239000011164 primary particle Substances 0.000 description 4
- 239000001488 sodium phosphate Substances 0.000 description 4
- 239000004094 surface-active agent Substances 0.000 description 4
- 238000002834 transmittance Methods 0.000 description 4
- RYFMWSXOAZQYPI-UHFFFAOYSA-K trisodium phosphate Chemical compound [Na+].[Na+].[Na+].[O-]P([O-])([O-])=O RYFMWSXOAZQYPI-UHFFFAOYSA-K 0.000 description 4
- 229910000406 trisodium phosphate Inorganic materials 0.000 description 4
- 235000019801 trisodium phosphate Nutrition 0.000 description 4
- 238000002441 X-ray diffraction Methods 0.000 description 3
- 238000004364 calculation method Methods 0.000 description 3
- 238000013329 compounding Methods 0.000 description 3
- 238000010191 image analysis Methods 0.000 description 3
- 239000002244 precipitate Substances 0.000 description 3
- GCLGEJMYGQKIIW-UHFFFAOYSA-H sodium hexametaphosphate Chemical compound [Na]OP1(=O)OP(=O)(O[Na])OP(=O)(O[Na])OP(=O)(O[Na])OP(=O)(O[Na])OP(=O)(O[Na])O1 GCLGEJMYGQKIIW-UHFFFAOYSA-H 0.000 description 3
- 235000019982 sodium hexametaphosphate Nutrition 0.000 description 3
- 238000001228 spectrum Methods 0.000 description 3
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 description 3
- 229910052721 tungsten Inorganic materials 0.000 description 3
- 239000010937 tungsten Substances 0.000 description 3
- 102100032047 Alsin Human genes 0.000 description 2
- 101710187109 Alsin Proteins 0.000 description 2
- QGZKDVFQNNGYKY-UHFFFAOYSA-N Ammonia Chemical compound N QGZKDVFQNNGYKY-UHFFFAOYSA-N 0.000 description 2
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 description 2
- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 description 2
- GRYLNZFGIOXLOG-UHFFFAOYSA-N Nitric acid Chemical compound O[N+]([O-])=O GRYLNZFGIOXLOG-UHFFFAOYSA-N 0.000 description 2
- 150000001298 alcohols Chemical class 0.000 description 2
- 229910000147 aluminium phosphate Inorganic materials 0.000 description 2
- 229940043430 calcium compound Drugs 0.000 description 2
- 150000001674 calcium compounds Chemical class 0.000 description 2
- 229910052799 carbon Inorganic materials 0.000 description 2
- 238000001816 cooling Methods 0.000 description 2
- 238000000354 decomposition reaction Methods 0.000 description 2
- 230000006866 deterioration Effects 0.000 description 2
- 239000002270 dispersing agent Substances 0.000 description 2
- 238000007580 dry-mixing Methods 0.000 description 2
- 238000001035 drying Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 238000000295 emission spectrum Methods 0.000 description 2
- 238000001914 filtration Methods 0.000 description 2
- 239000012530 fluid Substances 0.000 description 2
- 238000002189 fluorescence spectrum Methods 0.000 description 2
- 230000014509 gene expression Effects 0.000 description 2
- 239000001307 helium Substances 0.000 description 2
- 229910052734 helium Inorganic materials 0.000 description 2
- SWQJXJOGLNCZEY-UHFFFAOYSA-N helium atom Chemical compound [He] SWQJXJOGLNCZEY-UHFFFAOYSA-N 0.000 description 2
- 239000001257 hydrogen Substances 0.000 description 2
- 229910052739 hydrogen Inorganic materials 0.000 description 2
- 239000012535 impurity Substances 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 229910017604 nitric acid Inorganic materials 0.000 description 2
- 150000004767 nitrides Chemical class 0.000 description 2
- 239000012299 nitrogen atmosphere Substances 0.000 description 2
- 230000003287 optical effect Effects 0.000 description 2
- 239000003960 organic solvent Substances 0.000 description 2
- 238000007254 oxidation reaction Methods 0.000 description 2
- 238000000634 powder X-ray diffraction Methods 0.000 description 2
- 239000008213 purified water Substances 0.000 description 2
- 238000007789 sealing Methods 0.000 description 2
- 150000003377 silicon compounds Chemical class 0.000 description 2
- 238000005245 sintering Methods 0.000 description 2
- FQENQNTWSFEDLI-UHFFFAOYSA-J sodium diphosphate Chemical compound [Na+].[Na+].[Na+].[Na+].[O-]P([O-])(=O)OP([O-])([O-])=O FQENQNTWSFEDLI-UHFFFAOYSA-J 0.000 description 2
- 229940048086 sodium pyrophosphate Drugs 0.000 description 2
- 239000000243 solution Substances 0.000 description 2
- 239000002904 solvent Substances 0.000 description 2
- 150000003438 strontium compounds Chemical class 0.000 description 2
- 239000000126 substance Substances 0.000 description 2
- 235000019818 tetrasodium diphosphate Nutrition 0.000 description 2
- 238000009210 therapy by ultrasound Methods 0.000 description 2
- 229910018072 Al 2 O 3 Inorganic materials 0.000 description 1
- PIGFYZPCRLYGLF-UHFFFAOYSA-N Aluminum nitride Chemical compound [Al]#N PIGFYZPCRLYGLF-UHFFFAOYSA-N 0.000 description 1
- UGFAIRIUMAVXCW-UHFFFAOYSA-N Carbon monoxide Chemical compound [O+]#[C-] UGFAIRIUMAVXCW-UHFFFAOYSA-N 0.000 description 1
- MXRIRQGCELJRSN-UHFFFAOYSA-N O.O.O.[Al] Chemical compound O.O.O.[Al] MXRIRQGCELJRSN-UHFFFAOYSA-N 0.000 description 1
- 229910004298 SiO 2 Inorganic materials 0.000 description 1
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 1
- 229920000995 Spectralon Polymers 0.000 description 1
- 238000010521 absorption reaction Methods 0.000 description 1
- 150000007513 acids Chemical class 0.000 description 1
- 238000004220 aggregation Methods 0.000 description 1
- 230000002776 aggregation Effects 0.000 description 1
- AZDRQVAHHNSJOQ-UHFFFAOYSA-N alumane Chemical class [AlH3] AZDRQVAHHNSJOQ-UHFFFAOYSA-N 0.000 description 1
- 229910021529 ammonia Inorganic materials 0.000 description 1
- 239000012300 argon atmosphere Substances 0.000 description 1
- 238000000498 ball milling Methods 0.000 description 1
- XCNGEWCFFFJZJT-UHFFFAOYSA-N calcium;azanidylidenecalcium Chemical compound [Ca+2].[Ca]=[N-].[Ca]=[N-] XCNGEWCFFFJZJT-UHFFFAOYSA-N 0.000 description 1
- 229910002091 carbon monoxide Inorganic materials 0.000 description 1
- 238000005119 centrifugation Methods 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 238000012790 confirmation Methods 0.000 description 1
- 238000011109 contamination Methods 0.000 description 1
- 239000012153 distilled water Substances 0.000 description 1
- DPYXWFUVSMSNNV-UHFFFAOYSA-L europium(2+);diiodide Chemical compound [I-].[I-].[Eu+2] DPYXWFUVSMSNNV-UHFFFAOYSA-L 0.000 description 1
- QEDFUJZRPHEBFG-UHFFFAOYSA-K europium(3+);tribromide Chemical compound Br[Eu](Br)Br QEDFUJZRPHEBFG-UHFFFAOYSA-K 0.000 description 1
- NNMXSTWQJRPBJZ-UHFFFAOYSA-K europium(iii) chloride Chemical compound Cl[Eu](Cl)Cl NNMXSTWQJRPBJZ-UHFFFAOYSA-K 0.000 description 1
- 238000000227 grinding Methods 0.000 description 1
- 239000008240 homogeneous mixture Substances 0.000 description 1
- 229930195733 hydrocarbon Natural products 0.000 description 1
- 150000002430 hydrocarbons Chemical class 0.000 description 1
- 150000002431 hydrogen Chemical class 0.000 description 1
- 150000004679 hydroxides Chemical class 0.000 description 1
- 150000002484 inorganic compounds Chemical class 0.000 description 1
- 229910010272 inorganic material Inorganic materials 0.000 description 1
- 239000004973 liquid crystal related substance Substances 0.000 description 1
- 239000002609 medium Substances 0.000 description 1
- 238000003801 milling Methods 0.000 description 1
- 239000004570 mortar (masonry) Substances 0.000 description 1
- 239000013307 optical fiber Substances 0.000 description 1
- 230000003647 oxidation Effects 0.000 description 1
- 230000001590 oxidative effect Effects 0.000 description 1
- TWNQGVIAIRXVLR-UHFFFAOYSA-N oxo(oxoalumanyloxy)alumane Chemical compound O=[Al]O[Al]=O TWNQGVIAIRXVLR-UHFFFAOYSA-N 0.000 description 1
- 230000000704 physical effect Effects 0.000 description 1
- 238000001556 precipitation Methods 0.000 description 1
- 238000004445 quantitative analysis Methods 0.000 description 1
- 230000008707 rearrangement Effects 0.000 description 1
- 229910052814 silicon oxide Inorganic materials 0.000 description 1
- 229920002050 silicone resin Polymers 0.000 description 1
- 239000002002 slurry Substances 0.000 description 1
- 230000003595 spectral effect Effects 0.000 description 1
- HPNURIVGONRLQI-UHFFFAOYSA-K trifluoroeuropium Chemical compound F[Eu](F)F HPNURIVGONRLQI-UHFFFAOYSA-K 0.000 description 1
- 238000005303 weighing Methods 0.000 description 1
Classifications
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09K—MATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FOR ELSEWHERE
- C09K11/00—Luminescent, e.g. electroluminescent, chemiluminescent materials
- C09K11/08—Luminescent, e.g. electroluminescent, chemiluminescent materials containing inorganic luminescent materials
- C09K11/77—Luminescent, e.g. electroluminescent, chemiluminescent materials containing inorganic luminescent materials containing rare earth metals
- C09K11/7728—Luminescent, e.g. electroluminescent, chemiluminescent materials containing inorganic luminescent materials containing rare earth metals containing europium
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09K—MATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FOR ELSEWHERE
- C09K11/00—Luminescent, e.g. electroluminescent, chemiluminescent materials
- C09K11/08—Luminescent, e.g. electroluminescent, chemiluminescent materials containing inorganic luminescent materials
- C09K11/64—Luminescent, e.g. electroluminescent, chemiluminescent materials containing inorganic luminescent materials containing aluminium
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/48—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor body packages
- H01L33/50—Wavelength conversion elements
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/48—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor body packages
- H01L33/50—Wavelength conversion elements
- H01L33/501—Wavelength conversion elements characterised by the materials, e.g. binder
- H01L33/502—Wavelength conversion materials
Definitions
- the present disclosure relates to phosphor powders and light emitting devices.
- Light-emitting devices having light-emitting elements are used for general lighting, backlights for liquid crystal displays, and LED displays.
- An LED display uses, for example, a light-emitting element that has a light-emitting element that emits blue light and a wavelength converter that absorbs primary light from the light-emitting element and emits light of a different wavelength.
- Various phosphors such as a red phosphor and a green phosphor are used as the wavelength converter.
- CASN-based phosphors such as cousin (CASN) phosphors and escasun (SCASN) phosphors are known (for example, Patent Document 1, etc.). These CASN-based phosphors are generally synthesized by heating raw material powders containing europium oxide or europium nitride, calcium nitride, silicon nitride, and aluminum nitride.
- An object of the present disclosure is to provide a phosphor powder containing a red phosphor capable of exhibiting a large chromaticity X of the cured resin layer when dispersed in a resin to form a cured resin layer.
- Another object of the present disclosure is to provide a light-emitting device that includes the phosphor powder described above and is capable of exhibiting excellent color reproducibility.
- the present disclosure provides the following [1] to [7].
- [1] including a plurality of CASN-based phosphor particles, A phosphor powder, wherein, among the CASN-based phosphor particles, phosphor particles having a particle diameter of 1 ⁇ m or more have an average unevenness of 0.981 or more.
- [2] The phosphor powder according to [1], wherein, among the CASN-based phosphor particles, the standard deviation of the unevenness of the phosphor particles having a particle diameter of 1 ⁇ m or more is less than 0.025.
- a light-emitting device comprising: a light-emitting element that emits primary light; and a wavelength converter that absorbs part of the primary light and emits secondary light having a longer wavelength than the primary light, A light-emitting device, wherein the wavelength converter contains the phosphor powder according to any one of [1] to [6].
- One aspect of the present disclosure is a phosphor powder comprising a plurality of CASN-based phosphor particles, wherein among the CASN-based phosphor particles, the phosphor particles having a particle diameter of 1 ⁇ m or more have an average unevenness of 0.981 or more. I will provide a.
- the phosphor powder contains a CASN phosphor useful as a red phosphor, and among the CASN phosphor particles, particles having a particle diameter of 1 ⁇ m or more have a relatively large average irregularity.
- the cured resin layer can exhibit a large chromaticity X.
- the reason for such an effect is not clear, but by having the above-mentioned average unevenness, the filling property of the phosphor particles in the cured resin layer is increased, the excitation light transmittance from the blue LED is reduced, and the color We presume that the degree X can be made larger. Further, by setting the chromaticity X to a large value, it is possible to improve the color reproducibility of a display element manufactured using the CASN phosphor.
- the standard deviation of the unevenness of particles having a particle diameter of 1 ⁇ m or more may be less than 0.025.
- the dispersion of the phosphor particles in the phosphor powder is suppressed, so that the fillability into the cured resin layer or the like can be further improved.
- variation in properties among phosphor particles filled in the cured resin layer can be further suppressed.
- the average aspect ratio of particles having a particle diameter of 1 ⁇ m or more may be 1.275 or less.
- the main crystal phase constituting the CASN-based phosphor may have the same structure as the CaAlSiN3 crystal phase.
- the phosphor powder is represented by the general formula: ( CaxSryEuz ) AlSiN3 , where 0 ⁇ x ⁇ 1 , 0 ⁇ y ⁇ 1, and 0 ⁇ z ⁇ 1 may be satisfied. .
- the phosphor powder may have an emission peak wavelength of 605 to 670 nm.
- One aspect of the present disclosure is a light-emitting device that includes a light-emitting element that emits primary light, and a wavelength converter that absorbs part of the primary light and emits secondary light having a longer wavelength than the primary light.
- a light-emitting device is provided, wherein the wavelength converter contains the phosphor powder described above.
- the above light emitting device contains the above phosphor powder as a wavelength converter, it can exhibit excellent color reproducibility.
- a phosphor powder containing a red phosphor capable of exhibiting a large chromaticity X of the cured resin layer when dispersed in a resin to form a cured resin layer.
- a light-emitting device that includes the phosphor powder described above and can exhibit excellent color reproducibility.
- each component in the composition means the total amount of the multiple substances present in the composition unless otherwise specified when there are multiple substances corresponding to each component in the composition. .
- the “steps” in the present specification may be steps independent of each other or steps performed simultaneously.
- the phosphor powder is a powder containing a plurality of CASN-based phosphor particles.
- a phosphor powder is an aggregate of phosphor particles.
- the phosphor powder may be an aggregate of CASN-based phosphor particles.
- the CASN-based phosphor means a CASN phosphor, an SCASN phosphor, or a phosphor having the same crystal structure as these.
- the phosphor powder is represented by the general formula: ( CaxSryEuz ) AlSiN3 , where 0 ⁇ x ⁇ 1 , 0 ⁇ y ⁇ 1, and 0 ⁇ z ⁇ 1 may be satisfied. .
- the main crystal phase has the same crystal structure as the CaAlSiN3 crystal phase, and is represented by the general formula: ( CaxSryEuz ) AlSiN3 .
- the CASN-based phosphor may contain a different phase within the scope of the present disclosure.
- the crystal structure of phosphor particles can be confirmed by powder X-ray diffraction.
- the contents of Ca (calcium), Sr (strontium), Eu (europium), Al (aluminum), Si (silicon), and N (nitrogen) in the composition of the phosphor particles are obtained by pressure acid decomposition of the measurement object. can be determined by quantitative analysis using an ICP emission spectrometer. Since the elemental composition of the phosphor particles corresponds to the ratio of each element charged when producing the phosphor particles, the elemental composition of the phosphor particles can also be estimated from the raw material composition.
- the average unevenness (average value of unevenness) of the phosphor particles having a particle diameter of 1 ⁇ m or more among the aggregate of phosphor particles has a large value.
- the average unevenness of the phosphor particles having a particle diameter of 1 ⁇ m or more is 0.981 or more. It's okay.
- the lower limit value of the average degree of unevenness is within the above range, when a cured resin layer is formed by dispersing it in a resin, the filling property of the phosphor particles in the cured resin layer is increased, and light from a light source such as a blue LED is increased.
- the excitation light transmittance can be reduced and the value of chromaticity X can be made larger.
- the upper limit of the average unevenness of phosphor particles having a particle diameter of 1 ⁇ m or more may be, for example, less than 1.000, 0.999 or less, or 0.998 or less.
- the average unevenness of phosphor particles having a particle diameter of 1 ⁇ m or more may be adjusted within the above range. .999.
- the upper limit of the standard deviation of the unevenness of the phosphor particles having a particle diameter of 1 ⁇ m or more is, for example, less than 0.025, 0.023 or less, 0.020 or less, or 0.019.
- the upper limit of the standard deviation is within the above range, the surface variation of the particles in the phosphor powder is further suppressed, and when forming a cured resin layer dispersed in a resin, the phosphor for the cured resin layer It is possible to increase the filling properties of the particles, reduce the excitation light transmittance from a light source such as a blue LED, and increase the value of the chromaticity X.
- the lower limit of the standard deviation of the unevenness of the CASN phosphor particles is not particularly limited, but it may generally be 0.005 or more, 0.006 or more, or 0.008 or more.
- the standard deviation of the unevenness of CASN phosphor particles may be adjusted within the above range, and may be, for example, 0.005 or more and less than 0.025, or 0.006 to 0.019.
- the unevenness in the present specification is a value calculated by the following formula, where PE is the enveloping perimeter of the phosphor particles and P is the perimeter of the phosphor particles.
- the enveloping perimeter is the length of the perimeter of the figure connecting the convex portions of the phosphor particles at the shortest distance, and the perimeter is the length of the outline in the projected image of the phosphor particles.
- a particle shape image analyzer can be used to measure the unevenness.
- the particle shape image analyzer for example, "PITA-04" (trade name) manufactured by Seishin Enterprise Co., Ltd. can be used.
- the upper limit of the average aspect ratio (average aspect ratio) of phosphor particles having a particle diameter of 1 ⁇ m or more is, for example, 1.275 or less, 1.250 or less, or 1.230 or less. , 1.210 or less, 1.200 or less, or 1.150 or less.
- the upper limit of the average aspect ratio is within the above range, so that when a cured resin layer is formed by dispersing it in a resin, the filling property of the phosphor particles in the cured resin layer is increased, and light from a light source such as a blue LED is increased.
- the excitation light transmittance can be reduced and the value of chromaticity X can be made larger.
- the lower limit of the average aspect ratio of the phosphor particles having a particle diameter of 1 ⁇ m or more is, for example, 1.000 or more, 1.010 or more, 1.020 or more, 1.030 or more, or It may be 1.040 or more.
- the average aspect ratio of phosphor particles having a particle diameter of 1 ⁇ m or more may be adjusted within the above range, for example, 1.000 to 1.275, 1.040 to 1.210. , or from 1.040 to 1.150.
- the upper limit of the average circle equivalent diameter of phosphor particles having a particle size of 1 ⁇ m or more is, for example, 15.0 ⁇ m or less, 10.0 ⁇ m or less, 7.0 ⁇ m or less, or 5.0 ⁇ m or less.
- the phosphor powder can be made more useful when used for micro LED displays.
- the lower limit of the average equivalent circle diameter of phosphor particles having a particle size of 1 ⁇ m or more is, for example, 0.1 ⁇ m or more, 0.2 ⁇ m or more, 0.3 ⁇ m or more, 0.4 ⁇ m or more, It may be 0.6 ⁇ m or greater, 0.8 ⁇ m or greater, 1.0 ⁇ m or greater, 1.5 ⁇ m or greater, or 1.8 ⁇ m or greater.
- the lower limit of the average equivalent circle diameter is within the above range, it is possible to further improve the absorptance with respect to excitation light even when the phosphor powder is dispersed in the cured resin.
- the average circle equivalent diameter of the phosphor particles having a particle size of 1 ⁇ m or more may be adjusted within the above-described range, for example, 0.1 to 15.0 ⁇ m, 0.4 to 5.0 ⁇ m. It may be 0 ⁇ m, 1.0-5.0 ⁇ m, or 1.5-5.0 ⁇ m.
- the average unevenness, the standard deviation of the unevenness, the average aspect ratio, and the average circle equivalent diameter in the present specification are values determined by image analysis of phosphor particles having a particle diameter of 1 ⁇ m or more, and are as follows. It is the value measured by the method. First, a phosphor powder to be measured is put into purified water containing a surfactant, and subjected to ultrasonic treatment for 1 minute to prepare a dispersion liquid, which is used as a measurement sample. For the dispersion liquid, an observed image of the phosphor particles is obtained by using a particle shape image analysis device at a suction pump speed of 3000 Hz and a lens magnification of 10 times during measurement.
- the unevenness, aspect ratio, and circle equivalent diameter are determined from the data of the obtained particle image.
- the number of phosphor particles to be observed is 5,000, and each average value is the arithmetic mean value of the data obtained for 5,000 particles.
- the particle shape image analysis device for example, "PITA-04" (trade name) manufactured by Seishin Enterprise Co., Ltd. can be used.
- the phosphor powder described above is useful, for example, as a red phosphor.
- the emission peak wavelength of the phosphor powder described above may be, for example, 605-670 nm, 620-650 nm, or 630-650 nm.
- the lower limit of the chromaticity X of the phosphor powder described above is, for example, 0.620 or more, 0.630 or more, 0.650 or more, 0.660 or more, 0.663 or more, or 0.665 or more. can.
- the upper limit of the chromaticity X of the phosphor powder can be 0.72 or less, 0.700 or less, or 0.690 or less.
- the phosphor powder described above may be used alone or in combination with other phosphors. Since the phosphor powder according to the present disclosure exhibits excellent chromaticity X, it can be suitably used for light-emitting devices such as LEDs, display devices, and the like.
- the phosphor powder may be dispersed in the cured resin and used.
- the curable resin is not particularly limited, and for example, a resin used as a sealing resin for light emitting devices or the like can be used.
- An embodiment of a light-emitting device includes a light-emitting element that emits primary light, and a wavelength converter that absorbs part of the primary light and emits secondary light having a longer wavelength than the primary light. It is a device.
- the wavelength converter contains the phosphor powder described above.
- a light-emitting element that emits primary light may be, for example, an InGaN blue LED or the like.
- the light emitting element and the wavelength converter may be dispersed in a sealing resin or the like.
- the phosphor powder as described above can be directly produced, for example, by the following method, or can be prepared by mixing phosphor particles with different particle sizes.
- An example of a method for producing a phosphor powder includes a step of obtaining a fired product by heat-treating a mixed powder containing a calcium source, an aluminum source, a silicon source, a nitrogen source, and a europium source (a firing step); A step of obtaining an annealed product by heat treatment at a temperature lower than the temperature of the heat treatment in the firing step (annealing step), a step of pulverizing the annealing step to obtain a pulverized product (pulverization step), It has a step of reducing the content of fine particles in the pulverized material (classifying step) and a step of acid-treating the pulverized material to obtain a phosphor powder (acid treatment step).
- the mixed powder in the firing step contains a calcium source, an aluminum source, a silicon source, a nitrogen source, and a europium source, and may contain other components.
- Other components include, for example, a strontium source.
- the calcium source, aluminum source, silicon source, nitrogen source, europium source, and strontium source are respectively Ca (calcium), Al (aluminum), Si (silicon), N (nitrogen), Eu (europium) and Sr (strontium) means a compound or element that serves as a source of Sr (strontium).
- the compound refers to a compound having the supplied element as a constituent element.
- europium nitride when europium nitride is added to the mixed powder, the europium nitride serves as both a nitrogen source and a europium source.
- a compound having Ca as a constituent element may be any of nitrides, oxides, oxynitrides and hydroxides, preferably nitrides.
- Calcium compounds include, for example, calcium nitride (Ca 3 N 2 ).
- aluminum compounds examples include aluminum nitride (AlN), aluminum oxide (Al 2 O 3 ), and aluminum hydroxide (Al(OH) 3 ).
- silicon compounds include silicon nitride (Si 3 N 4 ) and silicon oxide (SiO 2 ). Silicon nitride having a high ⁇ fraction is preferably used. The ⁇ fraction of silicon nitride may be, for example, 80% by mass or more, 90% by mass or more, or 95% by mass or more. When the ⁇ fraction of silicon nitride is within the above range, the growth of primary particles of the inorganic compound can be promoted.
- Europium compounds include, for example, europium oxide (europium oxide), europium nitride (europium nitride), and europium halide.
- europium halides include europium fluoride, europium chloride, europium bromide, and europium iodide.
- the europium compound preferably comprises europium oxide.
- the valence of europium in the europium compound may be divalent or trivalent, preferably divalent.
- Europium which constitutes the europium compound, can be solid-dissolved in the CASN-based phosphor, volatilized and removed during the heat treatment, or left as a heterogeneous component through the firing process.
- the hetero-phase component containing europium can be a factor in lowering the luminance of the phosphor powder, but the component can be reduced or removed by acid treatment or the like, which will be described later.
- the different phase has a low absorptance with respect to excitation light, it may remain in the phosphor powder, and europium may be contained in such a different phase.
- Strontium compounds include, for example, strontium nitride (Sr 3 N 2 ).
- the mixed powder can be prepared by weighing and mixing each compound. Dry mixing or wet mixing may be used for mixing.
- the dry mixing method may be, for example, a method of mixing each component using a small mill mixer, a V-type mixer, a rocking mixer, a ball mill, a vibrating mill, and the like.
- the wet mixing method may be, for example, a method of adding a solvent such as water or a dispersion medium to prepare a solution or slurry, mixing the components, and then removing the solvent or dispersion medium.
- agglomerates can be removed using a sieve or the like, if necessary.
- the mixing step is preferably performed in an inert gas atmosphere.
- the inert gas atmosphere includes, for example, a rare gas atmosphere and a nitrogen gas atmosphere, preferably a nitrogen gas atmosphere.
- Preparation of the mixed powder is preferably carried out under a nitrogen atmosphere under a low relative humidity environment.
- the heat treatment in the firing process and the annealing process may be performed, for example, by filling the mixed powder or the like to be subjected to heat treatment into a heat-resistant container with a lid and heating the whole container.
- a heat-resistant container for example, a container made of tungsten can be used.
- An electric furnace or the like can be used for heating.
- the above mixed powder is heat-treated to obtain a fired product.
- the firing temperature in the firing process may be constant throughout the process.
- the firing temperature in the firing step may be, for example, 1450° C. or higher, 1500° C. or higher, 1600° C. or higher, 1800° C. or higher, or 1900° C. or higher.
- the lower limit of the firing temperature is within the above range, the growth of the primary particles of the CASN phosphor can be promoted, and the light absorption rate and quantum efficiency of the CASN phosphor particles can be further improved. can. This makes it possible to further reduce the half width of the fluorescence peak of the obtained phosphor powder.
- the firing temperature in the firing step may be, for example, 2100° C. or lower, 2050° C. or lower, or 2000° C. or lower.
- the sintering temperature in the sintering step can be adjusted within the range described above, and may be, for example, 1450-2100°C, 1500-2100°C, or 1500-2000°C.
- the rate of temperature increase, firing time, pressure during firing, etc. can be appropriately adjusted according to the components, composition ratio, amount, etc. of the mixed powder.
- the lower limit of the firing time in the firing step may be, for example, 0.5 hours or longer, 1.0 hours or longer, 1.5 hours or longer, 3.0 hours or longer, or 4.0 hours or longer.
- the upper limit of the firing time in the firing step is, for example, 30.0 hours or less, 20.0 hours or less, 15.0 hours or less, 12.0 hours or less, 10.0 hours or less, 8.0 hours or less, or 5 0 hours or less.
- the firing time in the firing step can be adjusted within the above range, for example, 0.5 to 30.0 hours, 3.0 to 30.0 hours, 4.0 to 12.0 hours, or 4.0 to 8.0 hours. It can be 0 hours.
- the firing process is desirably performed in an atmosphere containing at least one selected from the group consisting of rare gases and inert gases.
- the rare gas may contain, for example, argon, helium, etc., may contain argon, or may consist of argon.
- the inert gas may contain, for example, nitrogen or may consist of nitrogen.
- the firing process may be performed under atmospheric pressure or under pressure.
- the lower limit of the firing pressure in the firing process is, for example, 0.025 MPaG or more, 0.03 MPaG or more, 0.050 MPaG or more, 0.100 MPaG or more, 0.150 MPaG or more, 0 .300 MPaG or greater, 0.500 MPaG or greater, 0.600 MPaG or greater, 0.800 MPaG or greater, or 0.830 MPaG or greater.
- the upper limit of the firing pressure in the firing step may be, for example, 10.0 MPaG or less, 8.00 MPaG or less, 5.00 MPaG or less, 3.00 MPaG or less, or 1.00 MPaG or less.
- the pressure of the firing process can be adjusted within the above range, for example, 0.025 to 10.00 MPaG, 0.030 to 8.00 MPaG, 0.030 to 5.00 MPaG, or 0.030 to 1.00 MPaG. good. Pressure herein means gauge pressure.
- the annealing step is a step of obtaining an annealed product by heat-treating the fired product at a temperature lower than the heat treatment temperature in the firing step. From the viewpoint of improving the effect of the heat treatment in the annealing step, when the fired product is obtained as a lump, it may be subjected to the annealing step after being crushed and classified.
- the conditions for pulverization and classification may be, for example, the conditions described in the later-described pulverization step and classification step.
- the temperature of the heat treatment in the annealing process be constant throughout the process.
- the upper limit of the heat treatment temperature in the annealing step is adjusted to be equal to or lower than the heat treatment temperature in the firing step. °C or lower, or 1400 °C or lower.
- the lower limit of the heat treatment temperature in the annealing step may be, for example, 1200° C. or higher, 1250° C. or higher, or 1300° C. or higher.
- the lower limit of the temperature By setting the lower limit of the temperature within the above range, distortion and defects in the crystal phase are reduced by rearrangement of the elements constituting the crystal phase contained in the fired product, and the luminous efficiency of the obtained phosphor powder. can be further improved. Further, by setting the lower limit of the temperature within the above range, it is possible to improve the transparency of the CASN-based phosphor particles by reducing crystal distortion and defects. A different phase may be formed by this step, but it can be sufficiently removed by a classification step, an acid treatment step, etc., which will be described later.
- the temperature of the heat treatment in the annealing step can be adjusted within the range described above, and may be, for example, 1200-1700°C, 1300-1600°C, or 1300-1400°C.
- the lower limit of the heat treatment time in the annealing step may be, for example, 1.5 hours or longer, 3.0 hours or longer, 4.0 hours or longer, or 5.0 hours or longer.
- the upper limit of the heat treatment time in the annealing step may be, for example, 12.0 hours or less, 11.0 hours or less, or 10.0 hours or less.
- the heat treatment time in the annealing step can be adjusted within the above range, and may be, for example, 3.0 to 12.0 hours, or 5.0 to 10.0 hours.
- the annealing step may be performed in an atmosphere containing at least one selected from the group consisting of rare gases, reducing gases, and inert gases, or may be performed in a non-oxidizing atmosphere other than pure nitrogen, such as vacuum. good.
- the rare gas may contain, for example, argon, helium, etc., may contain argon, or may consist of argon.
- the reducing gas may contain, for example, ammonia, hydrocarbons, carbon monoxide, hydrogen, or the like, and may contain or consist of hydrogen.
- the inert gas may contain, for example, nitrogen, or may consist of nitrogen.
- the annealing step is preferably performed under a hydrogen gas atmosphere or an argon atmosphere.
- the annealing process may be performed under atmospheric pressure or under pressure.
- the lower limit of the pressure of the atmosphere in which the annealing process is performed may be, for example, 0.01 MPaG or more, or 0.02 MPaG or more.
- the upper limit of the pressure of the atmosphere in which the annealing process is performed may be, for example, 10.00 MPaG or less, 8.00 MPaG or less, or 5.00 MPaG or less.
- the pressure of the firing process can be adjusted within the above range, and can be, for example, 0.02-10.00 MPaG.
- the pulverization step is, for example, a step of pulverizing or pulverizing the annealed material in the annealing step to adjust the particle size and improve the unevenness of the CASN phosphor particles.
- crushing or pulverizing the annealed product it is desirable to perform under moderate conditions from the viewpoint of suppressing the occurrence of scratches and cracks on the surface of the phosphor particles and the occurrence of defects inside the phosphor particles. .
- a ball mill is preferably used as a grinder in the grinding process.
- the pulverization step is preferably performed by wet ball mill pulverization in which an aqueous solution such as ion-exchanged water is allowed to coexist.
- the aqueous solution may contain other components of ion-exchanged water.
- Other components contained in the aqueous solution include lower alcohols, organic solvents such as acetone, and dispersants such as sodium hexametaphosphate, sodium pyrophosphate (Napp), trisodium phosphate (TSP), and surfactants. is mentioned.
- the lower limit of the amount of the aqueous solution is, for example, 0.1% by volume or more, 0.3% by volume or more, 0.5% by volume or more, or 1.0% by volume or more, based on the total volume of the annealed product. It's okay.
- the upper limit of the content of the aqueous solution may be, for example, 60% by volume or less, 50% by volume or less, 45% by volume or less, or 40% by volume or less based on the total volume of the annealed product.
- the blending amount of the aqueous solution may be adjusted within the above range, and may be, for example, 1.0 to 45% by volume based on the total volume of the annealed product.
- the balls used in the ball mill can be zirconia balls.
- the ball diameter may be, for example, 0.2-20.0 mm, 0.5-10.0 mm, or 1.0-5.0 mm. If the conditions are not met, it is difficult to keep the average degree of unevenness and the standard deviation of the degree of unevenness within the predetermined ranges, and it is difficult for the resulting phosphor powder to exhibit desired color reproducibility.
- the filling rate of the balls into the container during ball milling can be adjusted according to the particle size such as unevenness and circle equivalent diameter required for the phosphor powder.
- the lower limit of the pulverization time (pulverization time) in the pulverization step is, for example, 1 hour or more, 2 hours or more, 3 hours or more, 4 hours or more, 5 hours or more, 6 hours or more, 7 hours or more, 8 hours or more, It may be 9 hours or more, 10 hours or more, or 12 hours or more.
- the upper limit of the pulverization time may be, for example, 80 hours or less, 70 hours or less, 60 hours or less, 40 hours or less, 30 hours or less, or 24 hours or less.
- the milling time may be adjusted within the ranges described above, and may be, for example, 1-60 hours, 4-40 hours, or 10-24 hours.
- the classification process is a process for removing the fine particles in the pulverized material generated by the pulverization process.
- the decantation method may be used.
- the classification step is carried out by putting the pulverized material into a dispersion medium, preparing a dispersion liquid, stirring the mixture, allowing the phosphor powder in the dispersion liquid to precipitate, and removing the supernatant. After removing the supernatant, the precipitate is collected by filtration and dried to obtain a phosphor powder from which fine particles have been removed.
- the dispersion medium may be, for example, an aqueous solution containing ion-exchanged water or the like.
- the dispersion liquid contains, for example, organic solvents such as lower alcohols and acetone, and dispersing agents such as sodium hexametaphosphate, sodium pyrophosphate (Napp), and trisodium phosphate (TSP) and surfactants. etc. may further be included.
- organic solvents such as lower alcohols and acetone
- dispersing agents such as sodium hexametaphosphate, sodium pyrophosphate (Napp), and trisodium phosphate (TSP) and surfactants. etc. may further be included.
- the dispersion liquid For the preparation of the dispersion liquid, it is preferable to use, for example, dispersion treatment using ultrasonic waves.
- ultrasonic waves By using ultrasonic waves, the fine particles in the pulverized material can be removed more accurately and efficiently. This can further suppress aggregation of fine particles in the obtained phosphor powder.
- the phosphor particles are precipitated and recovered by allowing the dispersion to stand or by centrifuging.
- the particles of the fine particles to be removed can be arbitrarily determined, and the precipitation conditions for removing the fine particles can be determined using the Stokes formula shown by the following formula (1).
- the fine particles may be, for example, a group of particles having an average particle size of less than 0.4 ⁇ m.
- v s [D p 2 ( ⁇ p ⁇ f )g]/18 ⁇ Equation (1)
- v s indicates the terminal velocity [unit: cm / s]
- D p indicates the particle diameter of the phosphor particles [unit: cm]
- ⁇ p indicates the density of the phosphor particles [unit: g/cm 3 ]
- ⁇ f is the density of the dispersion medium (fluid) [unit: g/cm 3 ]
- g is the gravitational acceleration [unit: cm/s 2 ]
- ⁇ is the dispersion medium (fluid ) shows the viscosity [unit: g/(cm ⁇ s)].
- the sedimentation distance is arbitrarily determined, and the particle size of the fine particles to be removed is determined.
- the target particle diameter D p to be removed, the gravitational acceleration g of 1 G, and various values specific to the phosphor particles and the dispersion medium (the density ⁇ p of the phosphor particles, the density ⁇ f of the dispersion medium, and the dispersion
- the viscosity ⁇ ) of the medium is substituted into the Stokes equation shown in the above equation (1) to calculate the terminal velocity vs as the sedimentation velocity.
- the standing time is calculated from the calculated settling velocity and settling distance. After the dispersion liquid is prepared and the standing time calculated as described above has elapsed, the supernatant is removed, thereby removing the target fine particles to be removed and fine particles having a smaller particle diameter than that. .
- the sedimentation distance and sedimentation time are set, and the particle size of the fine particles to be removed is determined.
- the target particle diameter D p to be removed, the terminal velocity v s , and various values unique to the phosphor particles and the dispersion medium (the density of the phosphor particles ⁇ p , the density of the dispersion medium ⁇ f , and the dispersion medium is substituted into the Stokes formula shown in the above formula (1) to calculate the gravitational acceleration g.
- the number of rotations to be performed in the centrifuge is determined from the relationship between the number of rotations inherent in the centrifuge and the gravitational acceleration calculated as described above.
- centrifugation is performed for the initially set sedimentation time based on the rotation speed calculated as described above, and then the supernatant is removed to obtain the target fine particles to be removed and more. Fine particles with a small particle diameter can be removed.
- the classification process may be performed by repeating the decantation method described above multiple times.
- the acid treatment process is a process for reducing the content of impurities that do not contribute to light emission by acid-treating the phosphor powder.
- acids include hydrochloric acid, hydrofluoric acid, sulfuric acid, phosphoric acid, and nitric acid.
- the acid may contain at least one selected from the group consisting of hydrochloric acid, hydrofluoric acid, sulfuric acid, phosphoric acid, and nitric acid, and may be a mixed acid.
- Hydrochloric acid is preferred as the acid.
- the acid concentration may be, for example, 0.5-1M.
- the acid treatment step is performed by bringing the pulverized material into contact with the acid described above. Specifically, the above pulverized material is put into an aqueous solution containing the above acid to prepare a dispersion liquid, which is then treated for a predetermined time while being stirred.
- the lower limit of the stirring time may be, for example, 0.15 hours or longer, 0.50 hours or longer, or 1.00 hours or longer.
- the upper limit of the stirring time may be, for example, 6.00 hours or less, 3.00 hours or less, or 1.50 hours or less.
- the acid treatment may be performed while the aqueous solution is cooled or heated.
- the temperature of the aqueous solution at this time may be, for example, 20 to 90°C, 40 to 90°C, or 50 to 70°C.
- the phosphor powder may be washed with water to remove the acid and dried.
- the temperature during drying may be, for example, 100-120°C.
- the drying time may be, for example, about 12 hours.
- Example 1 ⁇ Method for producing phosphor powder>
- ⁇ -type silicon nitride Si 3 N 4 , manufactured by Ube Industries, Ltd., SN-E10 grade
- AlN aluminum nitride
- Ca 3 N 2 calcium nitride
- Sr 3 N 2 strontium nitride
- the above raw material powder was filled in a tungsten container with a lid.
- the lidded container was taken out from the glove box, placed in an electric furnace equipped with a carbon heater, and then sufficiently evacuated until the pressure in the electric furnace became 0.1 PaG or less.
- the temperature inside the electric furnace was raised to 850° C. while the evacuation was continued.
- nitrogen gas was introduced into the electric furnace, and the pressure inside the electric furnace was adjusted to 0.85 MPaG.
- the temperature in the electric furnace was raised to 1930° C. in a nitrogen gas atmosphere, and after reaching that temperature, heat treatment was performed for 4 hours (firing step). After that, heating was terminated and the mixture was allowed to cool to room temperature. After cooling to room temperature, the lump was collected from the container. The collected lumps were pulverized and pulverized by a jet mill to obtain fired powder.
- the sintered powder was filled in a container made of tungsten with a lid. After the lidded container was placed in an electric furnace equipped with a carbon heater, the electric furnace was sufficiently evacuated to a pressure of 0.1 PaG or less. The temperature inside the electric furnace was raised to 850° C. while the evacuation was continued. After reaching 850° C., argon gas was introduced into the electric furnace, and the pressure inside the electric furnace was adjusted to 0.03 MPaG. After that, in an atmosphere of argon gas, heat treatment was performed for 4 hours while the temperature in the electric furnace was maintained at 1350° C. (annealing step). After that, heating was terminated and the mixture was allowed to cool to room temperature. After cooling to room temperature, the lump was collected from the vessel. The collected lumps were pulverized with a mortar to obtain an annealed powder.
- the obtained annealed powder was placed in a ball mill and wet-pulverized for 15 hours to prepare a pulverized material (pulverization step). At this time, zirconia balls with a diameter of 5 mm were used as the balls, and the amount of ion-exchanged water was adjusted to 3.13% by volume based on the total volume of the annealed powder. A red powder was obtained as a pulverized product.
- the red powder was immersed in 0.5 M hydrochloric acid so that the powder concentration was 26.7% by mass, and then subjected to acid treatment by stirring while heating for 1 hour (acid treatment step). After the acid treatment, the stirring was terminated and the powder was allowed to settle, and the supernatant and fine powder generated by the acid treatment were removed. After that, distilled water was further added and stirred again. Stirring was terminated, the powder was precipitated, and the supernatant and fine powder were removed. This operation was repeated until the pH of the aqueous solution was 8 or less and the supernatant liquid became transparent, and the resulting precipitate was filtered and dried in the atmosphere to obtain a phosphor powder.
- Example 2 Phosphor powder was obtained in the same manner as in Example 1, except that the pulverized material obtained by the pulverizing step was subjected to a classification treatment described below to reduce the fine particle content and obtain a red powder.
- the pulverized product is dispersed in an aqueous solution containing 0.05% by mass of sodium hexametaphosphate to prepare a dispersion solution, which is filled in a cylindrical container having an inlet at a predetermined height from the bottom, and decantation is performed. By removing the supernatant, fine particles were removed from the pulverized product (classification step).
- Example 3 Phosphor powder was obtained in the same manner as in Example 2, except that the pulverization time in the pulverization step was changed to 20 hours.
- Example 4 A phosphor powder was obtained in the same manner as in Example 2, except that the classification process was changed to remove particles having a particle size of 2.0 ⁇ m or less.
- Example 5 The compounding ratio of silicon nitride, aluminum nitride, calcium nitride, strontium nitride, and europium oxide was changed as shown in Table 1, the firing temperature in the firing process was 1550 ° C., the firing time was 12 hours, and the atmosphere during firing was changed. The pressure was changed to 0.03 MPaG, the heat treatment temperature in the annealing step was changed to 1350 ° C., the heat treatment time was changed to 4 hours, and the diameter of the balls was changed to 1 mm in the crushing step. Phosphor powder was obtained in the same manner as in Example 2, except that the amount of exchanged water was changed to 4.17% by volume.
- Example 2 The compounding ratio of silicon nitride, aluminum nitride, calcium nitride, strontium nitride, and europium oxide was changed as shown in Table 1, the firing temperature in the firing process was changed to 1650 ° C., and the pulverization process and the classification process were performed. A phosphor powder was obtained in the same manner as in Example 1, except that it was changed so as not to be performed.
- composition formula of phosphor powder The phosphor powders obtained in Examples 1 to 5 and Comparative Examples 1 to 3 have the general formula: (Ca x Sr y Eu z )AlSiN 3 from the composition ratio of the raw material composition. It was confirmed that the composition satisfies the conditions of 0 ⁇ x ⁇ 1, 0 ⁇ y ⁇ 1, and 0 ⁇ z ⁇ 1.
- a particle shape image analyzer (manufactured by Seishin Enterprise Co., Ltd., trade name: PITA-04) is used to observe the phosphor particles at a suction pump speed of 3000 Hz and a lens magnification of 10 times during measurement. gone. The number of phosphor particles to be observed was 5,000. From the obtained particle image data, the unevenness, the average unevenness, the average aspect ratio, and the average circle equivalent diameter of the phosphor particles having a particle diameter of 1 ⁇ m or more were determined.
- the phosphor powder to be measured was filled into the concave cell so that the surface was smooth, and attached to the opening of the integrating sphere.
- a monochromatic light having a wavelength of 455 nm from a Xe lamp as a light emission source was introduced into the integrating sphere as excitation light for the phosphor using an optical fiber.
- the phosphor powder to be measured was irradiated with the monochromatic light, which is the excitation light, and the fluorescence spectrum was measured.
- a spectrophotometer manufactured by Otsuka Electronics Co., Ltd., trade name: MCPD-7000 was used for the measurement.
- the number of excitation reflected light photons (Qref) and the number of fluorescence photons (Qem) were calculated.
- the number of reflected excitation light photons was calculated in the same wavelength range as the number of excitation light photons, and the number of fluorescence photons was calculated in the range of 465 to 800 nm.
- a standard reflector plate with a reflectance of 99% (Spectralon (registered trademark) manufactured by Labsphere) was attached to the aperture of the integrating sphere, and the spectrum of excitation light with a wavelength of 455 nm was measured. At that time, the number of excitation light photons (Qex) was calculated from the spectrum in the wavelength range of 450 to 465 nm.
- the absorptivity of excitation light at 455 nm and the internal quantum efficiency of the phosphor powder to be measured were obtained based on the following calculation formulas.
- Absorption rate of excitation light at 455 nm ((Qex-Qref)/Qex) x 100
- Internal quantum efficiency (Qem/(Qex-Qref)) x
- External quantum efficiency (Qem/Qex) x 100
- the relational expressions among the external quantum efficiency, the absorptance of excitation light at 455 nm, and the internal quantum efficiency can be expressed as follows.
- External quantum efficiency 455 nm light absorption rate x internal quantum efficiency
- the wavelength of the emission peak of the phosphor powder was the wavelength that showed the highest intensity in the wavelength range of 465 to 800 nm in the spectrum data obtained by attaching the phosphor powder to the opening of the integrating sphere.
- the sheet-like laminate is adjusted by using a roller having a gap of 50 ⁇ m added to the total thickness of the first fluororesin film and the second fluororesin film, and the thickness of the layer of the droplets is adjusted. Molded into a cured sheet.
- the uncured sheet was heat-treated at 150°C for 60 minutes. After the heat treatment, the first fluororesin film and the second fluororesin film were separated to obtain a cured resin sheet having a film thickness of 50 ⁇ 5 ⁇ m and having phosphor dispersed therein.
- the blue light emitting diode used for the measurement has a peak wavelength of 450 to 460 nm, a chromaticity X of 0.145 to 0.165, and a chromaticity Y of 0.023 to 0.037.
- a phosphor powder containing a red phosphor capable of exhibiting a large chromaticity X of the cured resin layer when dispersed in a resin to form a cured resin layer.
- a light-emitting device that includes the phosphor powder described above and can exhibit excellent color reproducibility.
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Abstract
Description
[1]
CASN系蛍光体粒子を複数含み、
前記CASN系蛍光体粒子のうち、粒子径が1μm以上である蛍光体粒子の平均凹凸度が0.981以上である、蛍光体粉末。
[2]
前記CASN系蛍光体粒子のうち、粒子径が1μm以上である蛍光体粒子の凹凸度の標準偏差が0.025未満である、[1]に記載の蛍光体粉末。
[3]
前記CASN系蛍光体粒子のうち、粒子径が1μm以上である蛍光体粒子の平均アスペクト比が1.275以下である、[1]又は[2]に記載の蛍光体粉末。
[4]
前記CASN系蛍光体を構成する主結晶相が、CaAlSiN3結晶相と同一の構造を有する、[1]~[3]のいずれかに記載の蛍光体粉末。
[5]
一般式:(CaxSryEuz)AlSiN3で示され、前記一般式中、0≦x<1、0<y<1、及び0<z<1である、[1]~[4]のいずれかに記載の蛍光体粉末。
[6]
発光ピークの波長が605~670nmである、[1]~[5]のいずれかに記載の蛍光体粉末。
[7]
一次光を発する発光素子と、前記一次光の一部を吸収して、一次光の波長よりも長い波長を有する二次光を発する波長変換体と、を備える発光装置であって、
前記波長変換体が、[1]~[6]のいずれかに記載の蛍光体粉末を含む、発光装置。
凹凸度=PE/P
上記式(1)中、vsは終端速度[単位:cm/s]を示し、Dpは蛍光体粒子の粒子径[単位:cm]を示し、ρpは蛍光体粒子の密度[単位:g/cm3]を示し、ρfは分散媒(流体)の密度[単位:g/cm3]を示し、gは重力加速度[単位:cm/s2]を示し、ηは分散媒(流体)の粘度[単位:g/(cm・s)]を示す。
<蛍光体粉末の製造方法>
窒素雰囲気に保持したグローブボックス中で容器に、25.7質量部のα型窒化ケイ素(Si3N4、宇部興産株式会社製、SN-E10グレード)、22.5質量部の窒化アルミニウム(AlN、株式会社トクヤマ製、Eグレード)、3.0質量部の窒化カルシウム(Ca3N2、Materion社製)、43.1質量部の窒化ストロンチウム(Sr3N2、純度2N、株式会社高純度化学研究所製)、及び5.8質量部の酸化ユウロピウム(Eu2O3、信越化学工業株式会社製、RUグレード)を測り取り、乾式混合することで原料粉末(混合粉末)を得た。
粉砕工程によって得られた粉砕物を、後述する分級処理することによって、微粒子分が低減し、赤色粉末を得たこと以外は、実施例1と同様にして、蛍光体粉末を得た。上記粉砕物を、ヘキサメタリン酸Naを0.05質量%含む水溶液に対して分散させ分散溶液を調製し、これを、底部から所定高さに吸入口を備える円筒状容器に充填し、デカンテーション法によって、上澄みを除去することで上記粉砕物から微粒子分を除去した(分級工程)。なお、上記分級工程は、粒子径が1.5μm以下である粒子を除去する設定で、ストークス式を用い、蛍光体粒子の沈降時間を計算し、沈降開始から所定時間に達したと同時に、所定高さ以上の上澄み液を除去する方法で行った。上述のデカンテーション法による処理を複数回行ない、上記沈殿物をろ集し、乾燥させることによって微粒子分を除去した赤色粉末(微粒子分が低減された粉砕物)を得た。
粉砕工程における粉砕時間を20時間に変更したこと以外は、実施例2と同様にして、蛍光体粉末を得た。
分級工程を、粒子径が2.0μm以下である粒子を除去する設定に変更したこと以外は、実施例2と同様にして、蛍光体粉末を得た。
窒化ケイ素、窒化アルミニウム、窒化カルシウム、窒化ストロンチウム、及び酸化ユウロピウムの配合比を表1に記載のように変更し、焼成工程における焼成温度を1550℃とし、焼成時間を12時間とし、焼成時の雰囲気の圧力を0.03MPaGとなるように変更し、アニール工程における加熱処理温度を1350℃とし、加熱処理時間を4時間となるように変更し、さらに粉砕工程における、ボールの直径を1mmとし、イオン交換水の配合量を4.17体積%となるように変更した以外は、実施例2と同様にして、蛍光体粉末を得た。
粉砕工程及び分級工程を行わないように変更したこと以外は、実施例1と同様にして、蛍光体粉末を得た。
窒化ケイ素、窒化アルミニウム、窒化カルシウム、窒化ストロンチウム、及び酸化ユウロピウムの配合比を表1に記載のように変更し、焼成工程における焼成温度を1650℃となるように変更し、粉砕工程及び分級工程を行わないように変更したこと以外は、実施例1と同様にして、蛍光体粉末を得た。
窒化ケイ素、窒化アルミニウム、窒化カルシウム、窒化ストロンチウム、及び酸化ユウロピウムの配合比を表1に記載のように変更し、焼成工程における焼成温度を1950℃とし、焼成時間を8時間となるように変更し、粉砕工程及び分級工程を行わないように変更したこと以外は、実施例1と同様にして、蛍光体粉末を得た。
実施例1~5、及び比較例1~3で得られた蛍光体粉末は、原料組成の組成比から、いずれの蛍光体粉末についても、一般式:(CaxSryEuz)AlSiN3で示され、0≦x<1、0<y<1、及び0<z<1の条件を満たす組成であることを確認した。
実施例1~5、及び比較例1~3で得られた蛍光体粉末について、X線回折装置(株式会社リガク製、商品名:UltimaIV)を用いた粉末X線回折法によってX線回折パターンを取得した。得られたX線回折パターンから結晶構造を確認した。得られたX線回折パターンのいずれについてもCaAlSiN3結晶と同一の回折パターンが認められた。なお、測定には、CuKα線(特性X線)を用いた。
実施例1~5、及び比較例1~3で得られた蛍光体粉末について、それぞれ、粒子径が1μm以上である蛍光体粒子の凹凸度、アスペクト比、及び円相当径の測定を行った。蛍光体粉末を、界面活性剤を含む精製水中に投入し、1分間超音波処理を行うことで分散液を調製し、測定サンプルとした。当該分散液について、粒子形状画像解析装置(株式会社セイシン企業製、商品名:PITA-04)を用いて、測定時の吸引ポンプ速度を3000Hz、レンズ倍率を10倍として、蛍光体粒子の観測を行った。観測する蛍光体粒子数は5000個とした。得られた粒子画像のデータから、粒子径が1μm以上である蛍光体粒子の凹凸度、平均凹凸度、平均アスペクト比、及び平均円相当径を決定した。
実施例1~5及び比較例1~3で得られた蛍光体粉末について、それぞれ、波長455nmの励起光を照射した場合の光の吸収率(光吸収率)、内部量子効率及び外部量子効率を、以下の手順で算出した。結果を表1に示す。
455nmの励起光の吸収率=((Qex-Qref)/Qex)×100
内部量子効率=(Qem/(Qex-Qref))×100
外部量子効率=(Qem/Qex)×100
なお、上記式から外部量子効率と、455nmの励起光の吸収率、及び内部量子効率との関係式は以下のように表すことができる。
外部量子効率=455nm光吸収率×内部量子効率
[硬化樹脂シート(測定サンプル)の調製]
まず、測定対象である蛍光体粉末40質量部と、シリコーン樹脂(東レ・ダウコーニング社製、商品名:OE-6630)60質量部と、を自転・公転ミキサーを用いて撹拌処理及び脱泡処理することによって均一な混合物(液体)を得た。次に、上記混合物を、透明な第一のフッ素樹脂フィルム上に滴下し、その滴下物の上からさらに透明な第二のフッ素樹脂フィルムを重ねることによって、シート状の積層物を得た。さらにシート状の積層物を、第一のフッ素樹脂フィルム及び第二のフッ素樹脂フィルムの合計厚みに50μmを加えたギャップを持つローラーを用いて、上記滴下物の層の厚みを調整して、未硬化シートに成形した。
450~460nmの範囲内にピーク波長を持つ青色発光ダイオード(青色LED)を用意した。当該青色LEDから発せられる青色光を樹脂硬化シートの一方の主面に対して照射し、樹脂硬化シートの他方の主面側から発せられる光の発光スペクトルを測定した。当該発光スペクトルの400~800nmの範囲の波長域におけるスペクトルデータから、JIS Z 8781-3:2016で規定されるXYZ表色系におけるCIE色度座標x値(色度X)をJIS Z 8724:2015「色の測定方法-光源色」の記載に準じて、算出することで求めた。Xの値が大きいほど、赤色蛍光体の赤色の表現領域が広がり、LEDディスプレイの高色域化につながることを意味する。
Claims (7)
- CASN系蛍光体粒子を複数含み、
前記CASN系蛍光体粒子のうち、粒子径が1μm以上である蛍光体粒子の平均凹凸度が0.981以上である、蛍光体粉末。 - 前記CASN系蛍光体粒子のうち、粒子径が1μm以上である蛍光体粒子の凹凸度の標準偏差が0.025未満である、請求項1に記載の蛍光体粉末。
- 前記CASN系蛍光体粒子のうち、粒子径が1μm以上である蛍光体粒子の平均アスペクト比が1.275以下である、請求項1又は2に記載の蛍光体粉末。
- 前記CASN系蛍光体を構成する主結晶相が、CaAlSiN3結晶相と同一の構造を有する、請求項1又は2に記載の蛍光体粉末。
- 一般式:(CaxSryEuz)AlSiN3で示され、前記一般式中、0≦x<1、0<y<1、及び0<z<1である、請求項1又は2に記載の蛍光体粉末。
- 発光ピークの波長が605~670nmである、請求項1又は2に記載の蛍光体粉末。
- 一次光を発する発光素子と、前記一次光の一部を吸収して、一次光の波長よりも長い波長を有する二次光を発する波長変換体と、を備える発光装置であって、
前記波長変換体が、請求項1又は2に記載の蛍光体粉末を含む、発光装置。
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