WO2022202059A1 - Procédé de fabrication de tampon à polir - Google Patents
Procédé de fabrication de tampon à polir Download PDFInfo
- Publication number
- WO2022202059A1 WO2022202059A1 PCT/JP2022/007227 JP2022007227W WO2022202059A1 WO 2022202059 A1 WO2022202059 A1 WO 2022202059A1 JP 2022007227 W JP2022007227 W JP 2022007227W WO 2022202059 A1 WO2022202059 A1 WO 2022202059A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- detection window
- polishing pad
- manufacturing
- end point
- window member
- Prior art date
Links
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Images
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
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- B24B37/013—Devices or means for detecting lapping completion
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
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- B24B37/11—Lapping tools
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- B24B37/24—Lapping pads for working plane surfaces characterised by the composition or properties of the pad materials
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
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- B24D3/22—Rubbers synthetic or natural
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- H—ELECTRICITY
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- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic System or AIIIBV compounds with or without impurities, e.g. doping materials
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- H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
- H01L21/304—Mechanical treatment, e.g. grinding, polishing, cutting
Abstract
L'invention concerne un procédé de fabrication d'un tampon à polir qui comprend une couche de polissage présentant une fenêtre de détection de point d'extrémité, le procédé comportant : une étape de durcissement destinée à fixer un élément de fenêtre de détection de point d'extrémité à l'intérieur d'une matrice, et le durcissement d'une résine durcissable qui est en contact avec l'élément de fenêtre de détection de point d'extrémité de manière à former une feuille de résine dans laquelle l'élément de fenêtre de détection de point d'extrémité est incorporée ; et une étape de tranchage destinée à trancher la feuille de résine de manière à former la couche de polissage. Dans l'étape de durcissement, l'élément fenêtre de détection de point d'extrémité est fixé de manière à être suspendu à partir d'un gabarit de fixation de position qui est installé au sommet de la matrice.
Applications Claiming Priority (12)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2021050341A JP2022148596A (ja) | 2021-03-24 | 2021-03-24 | 研磨パッドの製造方法 |
JP2021-050341 | 2021-03-24 | ||
JP2021051702A JP2022149504A (ja) | 2021-03-25 | 2021-03-25 | 研磨パッドの製造方法 |
JP2021-051702 | 2021-03-25 | ||
JP2021-156530 | 2021-09-27 | ||
JP2021156483A JP2023047519A (ja) | 2021-09-27 | 2021-09-27 | 研磨パッド及び研磨加工物の製造方法 |
JP2021156497A JP2023047530A (ja) | 2021-09-27 | 2021-09-27 | 研磨パッドの製造方法 |
JP2021-156483 | 2021-09-27 | ||
JP2021156530A JP2023047558A (ja) | 2021-09-27 | 2021-09-27 | 研磨パッドの製造方法 |
JP2021-156497 | 2021-09-27 | ||
JP2021-160631 | 2021-09-30 | ||
JP2021160631A JP2023050503A (ja) | 2021-09-30 | 2021-09-30 | 終点検出用窓材の製造方法 |
Publications (1)
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WO2022202059A1 true WO2022202059A1 (fr) | 2022-09-29 |
Family
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Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
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PCT/JP2022/007227 WO2022202059A1 (fr) | 2021-03-24 | 2022-02-22 | Procédé de fabrication de tampon à polir |
Country Status (2)
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TW (1) | TW202245980A (fr) |
WO (1) | WO2022202059A1 (fr) |
Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS4530584B1 (fr) * | 1965-12-02 | 1970-10-03 | ||
JP2005210143A (ja) * | 1995-08-21 | 2005-08-04 | Rohm & Haas Electronic Materials Cmp Holdings Inc | 研磨パッドの製造方法及び研磨パッド |
JP2006069158A (ja) * | 2004-09-06 | 2006-03-16 | Bridgestone Corp | 成形用の金型及び成形方法 |
JP2006110686A (ja) * | 2004-10-15 | 2006-04-27 | Toyo Tire & Rubber Co Ltd | 研磨パッド |
JP2012071416A (ja) * | 2010-09-29 | 2012-04-12 | Rohm & Haas Electronic Materials Cmp Holdings Inc | 光安定性ポリマー終点検出窓を有するケミカルメカニカルポリッシングパッドおよびそれを用いた研磨方法 |
JP2012524672A (ja) * | 2009-04-23 | 2012-10-18 | アプライド マテリアルズ インコーポレイテッド | 研磨パッド窓の処理 |
JP2013539233A (ja) * | 2010-09-30 | 2013-10-17 | ネクスプラナー コーポレイション | 渦電流終点検出のための研磨パッド |
-
2022
- 2022-02-22 WO PCT/JP2022/007227 patent/WO2022202059A1/fr active Application Filing
- 2022-02-25 TW TW111107133A patent/TW202245980A/zh unknown
Patent Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS4530584B1 (fr) * | 1965-12-02 | 1970-10-03 | ||
JP2005210143A (ja) * | 1995-08-21 | 2005-08-04 | Rohm & Haas Electronic Materials Cmp Holdings Inc | 研磨パッドの製造方法及び研磨パッド |
JP2006069158A (ja) * | 2004-09-06 | 2006-03-16 | Bridgestone Corp | 成形用の金型及び成形方法 |
JP2006110686A (ja) * | 2004-10-15 | 2006-04-27 | Toyo Tire & Rubber Co Ltd | 研磨パッド |
JP2012524672A (ja) * | 2009-04-23 | 2012-10-18 | アプライド マテリアルズ インコーポレイテッド | 研磨パッド窓の処理 |
JP2012071416A (ja) * | 2010-09-29 | 2012-04-12 | Rohm & Haas Electronic Materials Cmp Holdings Inc | 光安定性ポリマー終点検出窓を有するケミカルメカニカルポリッシングパッドおよびそれを用いた研磨方法 |
JP2013539233A (ja) * | 2010-09-30 | 2013-10-17 | ネクスプラナー コーポレイション | 渦電流終点検出のための研磨パッド |
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