WO2022116521A1 - 基于单自旋的量子钻石精密磁学测量系统 - Google Patents

基于单自旋的量子钻石精密磁学测量系统 Download PDF

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WO2022116521A1
WO2022116521A1 PCT/CN2021/102820 CN2021102820W WO2022116521A1 WO 2022116521 A1 WO2022116521 A1 WO 2022116521A1 CN 2021102820 W CN2021102820 W CN 2021102820W WO 2022116521 A1 WO2022116521 A1 WO 2022116521A1
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probe
microwave
module
spin
sample
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PCT/CN2021/102820
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English (en)
French (fr)
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许克标
张伟杰
贺羽
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国仪量子(合肥)技术有限公司
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G01N21/6428—Measuring fluorescence of fluorescent products of reactions or of fluorochrome labelled reactive substances, e.g. measuring quenching effects, using measuring "optrodes"
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/01—Arrangements or apparatus for facilitating the optical investigation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G01N21/6428—Measuring fluorescence of fluorescent products of reactions or of fluorochrome labelled reactive substances, e.g. measuring quenching effects, using measuring "optrodes"
    • G01N21/643—Measuring fluorescence of fluorescent products of reactions or of fluorochrome labelled reactive substances, e.g. measuring quenching effects, using measuring "optrodes" non-biological material
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/87—Investigating jewels
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N24/00—Investigating or analyzing materials by the use of nuclear magnetic resonance, electron paramagnetic resonance or other spin effects
    • G01N24/08—Investigating or analyzing materials by the use of nuclear magnetic resonance, electron paramagnetic resonance or other spin effects by using nuclear magnetic resonance
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q60/00—Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
    • G01Q60/24—AFM [Atomic Force Microscopy] or apparatus therefor, e.g. AFM probes
    • G01Q60/38—Probes, their manufacture, or their related instrumentation, e.g. holders
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q70/00—General aspects of SPM probes, their manufacture or their related instrumentation, insofar as they are not specially adapted to a single SPM technique covered by group G01Q60/00
    • G01Q70/08—Probe characteristics
    • G01Q70/14—Particular materials

Definitions

  • the present disclosure relates to the field of measurement technology, in particular to a single-spin-based quantum diamond precision magnetic measurement system.
  • micro- and nano-scale magnetic properties has broad application prospects in important fields such as physical science, material science, and life science. and other methods.
  • the sample is usually immersed in the high magnetic field of the objective lens (typically 0.6-1.2 T), which is sufficient to completely eliminate or severely distort most magnetic domain structures of interest.
  • the distance between the needle tip and the sample is generally maintained at tens of nanometers in the working state, and the strong magnetic interaction will cause certain damage to the sample at this time;
  • the existing magnetic imaging technology has strict requirements on the imaging environment of the sample.
  • the electron beam needs to be accelerated in a vacuum environment to maintain collimation, so it basically works in a low temperature and high vacuum environment. , which makes it difficult to detect the true properties of biological materials or other special materials;
  • the sample preparation is complicated. Specifically, the difficulty of sample preparation directly affects the user experience.
  • the thickness of thin film samples must be controlled within 100 nanometers. For materials with high atomic number, the thickness limit is more stringent. The thickness of the thin film sample must be controlled within 100 nanometers, and for materials with high atomic number, the thickness limit is more stringent. For bulk materials, the thickness of the sample must be thinned by special techniques, and the magnetic microstructure of the processed sample must be consistent with the raw material. How the processed sample is removed from the substrate also requires complex processes;
  • the present disclosure aims to solve one of the technical problems in the related art at least to a certain extent. Therefore, the purpose of the present disclosure is to propose a single-spin-based quantum diamond precision magnetic measurement system, which realizes room temperature atmosphere, multi-mode, microscopic magnetic properties quantification, non-destructive imaging, and greatly satisfies the topological magnetic structure, Experimental requirements in many important fields such as superconducting magnetic imaging and life science in situ imaging.
  • an embodiment of the present disclosure proposes a single-spin-based quantum diamond precision magnetic measurement system, including: an optical confocal module, the optical confocal module is used to generate laser light of a preset wavelength, and irradiate it to On the NV color center in the probe, and collect and filter the red fluorescence emitted from the above-mentioned NV color center; the temperature control module is used to maintain the temperature environment of the system; the microwave module is used to generate microwaves and accurately Irradiate to the sample while reducing the microwave radiation to the microwave amplifier, so as to reduce the damage to the microwave amplifier;
  • a scanning probe module the scanning probe module is used to realize the alignment of the probe and the objective lens, and realize the raster scanning imaging of the sample.
  • the single-spin-based quantum diamond precision magnetic measurement system may also have the following additional technical features:
  • the optical confocal module includes: an excitation optical circuit for the laser driving board to excite the fiber laser diode to emit laser light of a preset wavelength through an output voltage signal, and guide the laser light through a single-mode fiber. to the confocal light path, and reflected by the dichromatic mirror to the high numerical aperture objective lens; in the collection light path, the red fluorescence emitted by the single electron spin in the probe is collected by the objective lens, passed through the confocal light path, and filtered by filters to filter out impurities of other wavelengths. Astigmatism transmits red fluorescence into a single photon counter.
  • the microwave module includes: a wave source, which emits microwaves of preset power and frequency through a microwave transmitter; and a microwave switch, which is used to control the on and off of the microwaves ; Power amplifier for amplifying microwave power; Radiation structure for conducting microwave fields.
  • the temperature control module includes: an outer temperature control system and an inner temperature control system.
  • the scanning probe module includes: an objective lens system for focusing the excitation light of a preset wavelength reflected by the dichroic mirror, so as to initialize the NV color center, and collect the NV color center from the NV color center. Red fluorescence emitted; a probe system, the probe system includes a probe, a diamond tip, a probe holder, an inclination stage and a micrometer stage, the diamond tip is fixed on the free end of the probe, the The probe is installed on the probe holder, connected to the inclination stage through the probe base, and then fixed on the micron stage; the sample to be tested, the sample to be tested is fixed on the sample base through the sample base.
  • a nano-displacement stage, the nano-displacement stage is fixed on an inclination displacement stage for adjusting the inclination angle of the sample, and finally fixed on a set of three-dimensional micro-displacement stage for coarse adjustment of the sample position.
  • the probe is a quantum probe.
  • the probe holder is an AFM holder.
  • the micrometer stage is a three-dimensional micrometer stage
  • the diamond tip contains a single NV color center inside.
  • a power supply module for supplying power to the system.
  • the quantum sensor is integrated into the atomic force microscope probe, and the quantum sensor and the sample under test can be connected between the quantum sensor and the measured sample.
  • the distance is precisely controlled within the nanometer range, achieving ultra-high resolution, high sensitivity, and non-destructive scanning imaging of magnetic properties, which not only realizes room temperature atmospheric, multi-mode imaging, but also greatly satisfies topological magnetic structure, superconducting magnetic imaging, Experimental requirements in many important fields such as life science in situ imaging.
  • FIG. 1 is a schematic block diagram of a single-spin-based quantum diamond precision magnetic measurement system according to an embodiment of the present disclosure
  • FIG. 2 is a schematic diagram of the principle of an excitation light path according to an embodiment of the present disclosure
  • FIG. 3 is a schematic block diagram of a confocal optical module according to an embodiment of the present disclosure
  • FIG. 4 is a schematic block diagram of a microwave module according to an embodiment of the present disclosure.
  • FIG. 5 is a schematic block diagram of a temperature control module according to an embodiment of the present disclosure.
  • FIG. 6 is a flow chart of a process for preparing a quantum diamond probe according to an embodiment of the present disclosure
  • FIG. 7 is a schematic block diagram of a probe module according to an embodiment of the present disclosure.
  • FIG. 8 is a schematic block diagram of a single-spin-based quantum diamond precision magnetic measurement system according to an embodiment of the present disclosure
  • FIG. 9 is a schematic diagram of raster scanning imaging according to an embodiment of the present disclosure.
  • FIG. 10 is a schematic diagram of the principle of a PID control temperature control system according to an embodiment of the present disclosure.
  • FIG. 1 is a schematic block diagram of a single-spin-based quantum diamond precision magnetic measurement system according to an embodiment of the present disclosure.
  • the single-spin-based quantum diamond precision magnetic measurement system includes: an optical confocal module 100, a temperature control module 200, a microwave module 300 and a scanning probe module 400.
  • the optical confocal module 100 is used to generate laser light of a preset wavelength, and irradiate it on the probe.
  • the probe is integrated with a nitrogen-vacancy center (NV color center, a single-spin quantum sensor), and collects filtered from The red fluorescence emitted by the above probes.
  • the optical confocal module 100 is the optical path system of the whole device, which is used to generate a specific 532nm laser, irradiate it on the probe, and collect and filter the red fluorescence emitted from the probe (filter the 532nm laser and other stray light, retain the red Fluorescence), and finally a single photon detector detects the red fluorescence from which data can be read.
  • Temperature control module 200 The temperature control module is used to maintain the temperature environment of the system.
  • the microwave module 300 is used to generate microwaves and radiate them to the sample accurately along the waveguide, and at the same time reduce the radiation of the microwaves to the microwave amplifier, so as to reduce the damage to the microwave amplifier. That is to say, the microwave module is used to accurately radiate the generated microwaves on the sample, and the combination of the specially designed radiation structure and the specially designed arbitrary sequence generating device in the microwave module can reduce the microwave radiation to the microwave amplifier and reduce the damage.
  • the scanning probe module 400 is used to realize the alignment of the probe and the objective lens, and realize the raster scanning imaging of the sample.
  • the single-spin-based quantum diamond precision magnetic measurement system may include four parts: an optical confocal module 100 , a temperature control module 200 and a scanning probe module 400 .
  • the microwave range can be 0-4GHz
  • the timing control accuracy is up to 50ps
  • the magnetic detection sensitivity is up to 1 ⁇ T/
  • the imaging spatial resolution is over 50nm
  • the temperature control accuracy is higher than 2mk/h
  • the scanning positioning accuracy is sub-nanometer level
  • room temperature can be achieved.
  • Atmospheric multimodal imaging.
  • the optical confocal module 100 includes: an excitation optical path for the laser driving board to excite a fiber laser diode to emit laser light of a preset wavelength through an output voltage signal, and guide the laser light to the confocal optical path through a single-mode fiber , and reflected by the dichroic mirror to the high numerical aperture objective lens; in the collection optical path, the red fluorescence emitted by the single electron spin in the probe is collected by the objective lens, passed through the confocal optical path, and the stray light of other wavelengths is filtered out by the filter. Fluorescence is conducted into a single photon counter.
  • the schematic diagram of the excitation light path is shown in FIG. 2 .
  • the optical confocal module 100 may be composed of an excitation light path and a collection light path.
  • the laser driver board excites the fiber laser diode to emit 532nm laser light through the output voltage signal, and guides the laser light to the confocal light path through the single-mode fiber.
  • the entire excitation light path is made into an integrated system.
  • Single-mode fiber instead of free light connection can be more convenient and stable; in the collection light path, the 532nm laser is emitted through the fiber coupler, and after the beam expander is expanded, it becomes a high-quality Gaussian beam with a small diffusion angle.
  • the Gaussian beam is reflected by a dichroic mirror to a high numerical aperture objective.
  • the 532 nm excitation light and other light are filtered out through a dichroic mirror composed of a set of 650 nm long wavelength pass and 775 nm short wavelength pass.
  • the stray light finally reaches the single-photon detector.
  • the entire front-end optical path is made into an integrated system, and the optical fiber connection is used to increase the stability, and the collection optical path is integrated into the cage system, which greatly enhances the ability to resist vibration and temperature drift.
  • the front-end optical path is used to transmit the excitation light to the quantum probe, and the back-end optical path collects the red fluorescence emitted by the quantum sensor.
  • the microwave module 300 includes: a wave source, which emits microwaves with a preset power and a preset frequency through a microwave transmitter; a microwave switch, which is used to control the on and off of the microwaves; Power amplifiers, used to amplify microwave power; radiation structures, used to conduct microwave fields.
  • the microwave module 300 is composed of a wave source, a microwave switch, a power amplifier, and a radiation structure, as shown in FIG. 4 .
  • the microwave transmitter is used to generate pulsed microwaves required for electron spin control
  • the radiation structure is used to provide an effective microwave field.
  • the arbitrary sequence generator based on FPGA and "time folding chain technology" can realize multi-channel, high-precision, high-stability pulse timing output. According to the theoretical and experimental comparison of the performance of radiation structures with different structural forms, the design of the radiation structure can be completed, so that the microwave can be effectively radiated to the sample to reduce the damage caused by reflection to the microwave amplifier, and the spin quantum manipulation of high speed and high fidelity can be realized. .
  • the temperature control module 200 includes: an outer temperature control system and an inner temperature control system.
  • the temperature control module 400 can be divided into external temperature control and internal temperature control systems.
  • the external chassis of the instrument uses a temperature controller with PID control to provide a relatively stable temperature environment, and the temperature control accuracy reaches 0.1k/h, used to shield the scanning probe from the external temperature.
  • the probe module inside the instrument uses a higher-precision temperature controller to reduce the temperature drift of the structural parts.
  • This nested double-layer temperature control system can achieve temperature stabilization more quickly, and it is easy to achieve precise temperature control. In the experimental test, the temperature control accuracy can be stabilized within ⁇ 2mk/h for a long time.
  • the temperature drift of the stage is reduced through high-precision temperature control.
  • the dual PID control temperature control scheme heating and cooling can be performed.
  • the measured temperature control accuracy is within ⁇ 2mk/h, which can greatly reduce the drift of structural parts caused by temperature changes, and greatly improve the position accuracy of scanning imaging.
  • the scanning probe module 400 includes: an objective lens system for focusing the excitation light of a preset wavelength reflected by the dichroic mirror, so as to initialize the NV color center, and collect the red fluorescence emitted by the NV color center ;
  • the probe system includes a probe, a diamond tip, a probe holder, an inclination stage and a micrometer stage, the diamond tip is fixed on the free end of the probe, and the probe is installed on the probe holder, through the After the probe base is connected to the inclination stage, it is fixed on the sample to be measured on the micrometer stage, the sample to be tested is fixed on the nano stage through the sample base, and the nano stage is fixed on the inclination stage for adjusting the inclination of the sample. Fixed to a set of 3D micrometer stages for coarse adjustment of sample position.
  • the probe is a quantum probe, wherein the preparation process of the quantum probe may be as shown in FIG. 6 .
  • the preparation of quantum probes with ultra-long coherence time and high stability needs to undergo ultra-pure diamond growth, ion implantation, electron beam exposure, focused ion beam etching, reactive plasma etching, etc. More than 20 micro-nano processing technologies are used to integrate NV color centers with magnetic sensitivity into scanning probes of atomic force microscopes.
  • the probe holder is an AFM holder.
  • the micrometer stage is a three-dimensional micrometer stage
  • the diamond tip contains a single NV color center inside.
  • the scanning probe module 400 mainly includes an objective lens system, a tuning fork probe system including NV color centers, a sample system under test, a microwave radiation part, etc.
  • the scanning probe module 400 is the core of the entire instrument
  • the quantum probe is integrated into the probe of the atomic force microscope, which can realize the perfect combination of the two functions, achieve ultra-high magnetic measurement sensitivity, high spatial resolution, large-scale quantitative, and non-destructive scanning imaging of magnetic properties.
  • the probe system is mainly composed of a tuning fork probe, a diamond tip containing a single NV color center, a probe holder, an inclination stage and a micrometer stage.
  • the probe is mounted on the AFM holder, and is connected to the tilt stage through the probe base, and finally fixed to the 3D micrometer stage.
  • the objective lens system is used to focus the excitation light of 532 nm reflected by the dichroic mirror, to initialize the NV color center and collect the red fluorescence emitted by the NV color center.
  • the objective lens is fixed on a three-dimensional nano-stage, and is supported above the probe by the nano-stage support frame.
  • the sample to be tested is fixed on the nano-stage through the sample base, the nano-stage is fixed on the inclination stage for adjusting the inclination angle of the sample, and finally it is fixed on a set of three-dimensional micro-stage for coarse adjustment of the sample position.
  • the movement of the nano-stage, the micro-stage and the angular stage is controlled by their respective controllers, and the power module supplies power to the stage controller.
  • FIG. 8 it further includes: a power supply module for supplying power to the system.
  • the embodiment of the present disclosure maintains temperature stability through a double-layer PID temperature control system to reduce the drift of the structure; through precise feedback control, the distance between the needle tip and the sample is kept stable at the nanometer level, and ultra-high resolution, non-destructive Scanning imaging; high-sensitivity quantitative characterization of the microscopic magnetic properties of materials through manipulation and readout of NV color center quantum states.
  • Beneficial effects of the present disclosure The present disclosure is a micro-nano magnetic characteristic imaging system with excellent performance, which can realize 50ps high-precision time sequence control, magnetic detection sensitivity up to 1 ⁇ T/, magnetic imaging spatial resolution up to 50 nm, and positioning accuracy as high as 50 nm.
  • Nano-scale, temperature control accuracy up to ⁇ 2mk/h, can achieve room temperature atmosphere, multi-mode quantitative, non-destructive imaging, these properties greatly meet the needs of many important fields such as topological magnetic structure, superconducting magnetic imaging, life science in situ imaging and so on. experimental requirements.
  • the method for realizing quantitative magnetic imaging based on the design of a single-spin quantum diamond precision magnetic measurement system includes the following steps:
  • Step 1 Laser Alignment.
  • the diamond probe is moved to a suitable position under the objective lens under the drive of the micrometer displacement stage to realize the rough alignment of the objective lens and the NV color center. Observe the change in the distance between the diamond tip and the objective to prevent collision and ensure the diamond is under the objective. Turn on the laser and adjust the distance between the diamond probe and the objective lens so that the fluorescence counts read at the APD reach a high value, and the focus of the objective lens is already within the diamond.
  • the microwaves are turned on so that a certain intensity of the microwave field is distributed around the color center. Move the focal point of the objective lens to a position where the fluorescence count is higher, and perform continuous wave, Rabi and other experiments to confirm whether there is a single NV color center here. If it is not a single NV color center, move the focus of the objective lens to the next point with a higher fluorescence count and perform corresponding experiments until a single NV color center with better quality is found.
  • the tuning fork probe is swept in a certain frequency range to determine its resonance frequency f0.
  • the position of the sample is moved by the micrometer stage, so that the area to be measured on the sample to be measured can be observed more clearly under the CCD field of view, and it is moved to just below the probe tip.
  • Step 2 Phase-lock control to realize amplitude modulation.
  • the probe is made to vibrate with a specific amplitude at its resonant frequency f0.
  • Control the micrometer stage to gradually move the sample closer to the needle tip, observe the amplitude of the probe and observe the change in the distance between the tip and the sample surface through CCD. Adjust until the probe amplitude change meets the target, that is, the distance between the tip samples reaches the target value.
  • Step 3 Microwave modulation.
  • a microwave transmitter is used to generate pulsed microwaves required for electron spin regulation, and a radiation structure is used to provide an effective microwave field near the quantum diamond probe.
  • the 50 picosecond time precision broadband high power arbitrary sequence generator can realize multi-channel, high precision, high stability pulse timing output, and make microwave radiation to the sample effectively to reduce reflection
  • the damage caused by the microwave amplifier can realize the low-noise, high-efficiency and fast quantum coherent manipulation of spin.
  • Step 4 Information Gathering.
  • the red fluorescence emitted by the NV-color center After the red fluorescence emitted by the NV-color center is collected by the objective lens, it passes through a dichroic mirror composed of a set of 650nm long wavelength pass and 775nm short wavelength pass, and then the excitation light and other stray light at 532nm are filtered out by a filter. to the single-photon detector.
  • Single-photon detectors can convert fluorescent signals into corresponding electrical signals for easy analysis.
  • Step 5 Scan imaging in raster format.
  • Scanning in raster format includes serpentine trajectory and reciprocating scanning trajectory, which can be freely switched by the user, as shown in Figure 9.
  • the temperature of the probe module is kept stable by the precision temperature control module, which minimizes the scanning error caused by temperature drift.
  • Step 6 Temperature Control.
  • the entire temperature control module is divided into an external temperature control system and an internal temperature control system. As shown in Figure 5 and Figure 10, both temperature control systems are implemented by using a temperature controller with PID control function, and the temperature control system is read through a temperature sensor. The real-time temperature in the box is compared with the target value. Through the PID feedback control, the power output by the temperature controller to the heating element is determined, and finally the fast and precise temperature control is realized.
  • the quantum sensor is integrated into the atomic force microscope probe, and the quantum sensor can be connected to the sample to be measured.
  • the distance between them is precisely controlled in the nanometer range, realizing ultra-high-resolution and high-sensitivity quantitative nondestructive scanning imaging of magnetic properties.
  • Experimental requirements in many important fields such as life science in situ imaging.
  • first and second are only used for descriptive purposes, and should not be construed as indicating or implying relative importance or implying the number of indicated technical features. Thus, a feature delimited with “first”, “second” may expressly or implicitly include at least one of that feature.
  • plurality means at least two, such as two, three, etc., unless expressly and specifically defined otherwise.
  • the terms “installed”, “connected”, “connected”, “fixed” and other terms should be understood in a broad sense, for example, it may be a fixed connection or a detachable connection , or integrated; it can be a mechanical connection or an electrical connection; it can be directly connected or indirectly connected through an intermediate medium, it can be the internal connection of two elements or the interaction relationship between the two elements, unless otherwise specified limit.
  • installed may be a fixed connection or a detachable connection , or integrated; it can be a mechanical connection or an electrical connection; it can be directly connected or indirectly connected through an intermediate medium, it can be the internal connection of two elements or the interaction relationship between the two elements, unless otherwise specified limit.
  • a first feature "on” or “under” a second feature may be in direct contact with the first and second features, or indirectly through an intermediary between the first and second features touch.
  • the first feature being “above”, “over” and “above” the second feature may mean that the first feature is directly above or obliquely above the second feature, or simply means that the first feature is level higher than the second feature.
  • the first feature being “below”, “below” and “below” the second feature may mean that the first feature is directly or obliquely below the second feature, or simply means that the first feature has a lower level than the second feature.

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Abstract

基于单自旋的量子钻石精密磁学测量系统包括：光学共聚焦模块（100），用于产生预设波长的激光，并照射到探针上，探针中集成有氮-空位中心，并收集过滤从探针中NV色心因能级跃迁发出的荧光；温控模块（200），用于维持系统的温度环境；微波模块（300），用于产生微波，并准确辐射至样品，同时减少微波辐射至微波放大器上，以减少对微波放大器带来的损伤；以及扫描探头模块（400），用于实现探针与物镜的对准，以及实现对样品的隔栅式扫描成像。系统实现了室温大气、多模式、微观磁学特性定量、无损成像，并且极大地满足了拓扑磁结构、超导磁成像等多重要领域的实验要求。

Description

基于单自旋的量子钻石精密磁学测量系统
相关申请的交叉引用
本公开要求于2020年12月04日提交的申请号为202011414549.7、名称为“基于单自旋的量子钻石精密磁学测量系统”的中国专利申请的优先权，其全部内容通过引用结合在本公开中。
技术领域
本公开涉及测量技术领域，特别涉及一种基于单自旋的量子钻石精密磁学测量系统。
背景技术
微纳米尺度磁学性质的研究在物理科学，材料科学，生命科学等重要领域有着广阔的应用前景，微纳米磁学表征的重要手段主要有透射电子显微镜(TEM)、磁力显微镜、扫描霍尔显微镜等方法。
然而，相关技术中的磁检测手段往往存在以下问题：
(1)难以实现无损检测。具体地，利用TEM研究磁性材料的主要困难是样品通常浸没在物镜的高磁场中(一般为0.6-1.2T)，这足以完全消除或严重扭曲大多数感兴趣的磁畴结构。磁力显微镜中，工作状态下针尖与样品间距一般维持在数十纳米，此时较强的磁相互作用会对样品造成一定的损伤；
(2)环境要求严苛。具体地，现有磁成像技术对样品的成像环境有着严苛的要求，如透射电子显微镜中电子束需要在真空环境中加速从而保持准直性，所以基本都是在低温高真空的环境下工作，这难以检测生物材料或其它特殊材料的真实特性；
(3)样品制备复杂。具体地，样品制备的难易直接影响着用户体验。使用透射电子显微镜进行磁学成像时，对样品的制备有着严苛的要求，薄膜样品的厚度必须控制在百纳米以内，对于高原子数的材料，对厚度的限制更加严格。薄膜样品的厚度必须控制在百纳米以内，对于高原子数的材料，对厚度的限制更加严格。对于大体积的材料，样品厚度必须要经过特殊的技术进行削薄，同时加工后样品的磁微结构必须与原材料保持一致。加工后的样品如何从基底上移除也需要复杂的流程；
(4)难以实现定量磁学信息检测。具体地，定量无损的磁学检测是样品表征的终极目标。在磁力显微镜中，由于真尖和样品的距离很小(<10nm)，此时针尖—样品间除了磁力外，还有范德华力和静电力的作用，很难将磁力解耦出来实现定量磁学信息表征。
公开内容
本公开旨在至少在一定程度上解决相关技术中的技术问题之一。为此，本公开的目的在于提出一种基于单自旋的量子钻石精密磁学测量系统，实现了室温大气、多模式、微观磁学特性定量、无损成像，并且极大地满足了拓扑磁结构、超导磁成像、生命科学原位成像等多重要领域的实验要求。
为达到上述目的，本公开实施例提出了一种基于单自旋的量子钻石精密磁学测量系统，包括：光学共聚焦模块，所述光学共聚焦模块用于产生预设波长的激光，照射到探针中的NV色心上，并收集、过滤从上述NV色心发出的红色荧光；温控模块，所述温控模块用于维持系统的温度环境；微波模块，用于产生微波，并准确辐射至样品，同时减少微波辐射至微波放大器上，以减少对微波放大器带来的损伤；
扫描探头模块，所述扫描探头模块用于实现探针与物镜的对准，以及实现对样品的隔栅式扫描成像。
另外，根据本公开上述实施例的基于单自旋的量子钻石精密磁学测量系统还可以具有如下附加的技术特征：
根据本公开的一个实施例，所述光学共聚焦模块，包括：激发光路，用于激光驱动板通过输出电压信号激发光纤激光二极管发出预设波长的激光，并经单模光纤将所述激光导至共聚焦光路，并经双色镜反射至高数值孔径物镜；收集光路，将探针中单电子自旋发出的红色荧光由物镜收集，经共聚焦光路，并由滤光片过滤掉其他波长的杂散光，将红色荧光传导至单光子计数器中。
根据本公开的一个实施例，所述微波模块包括：波源，所述波源通过微波发射机发出预设功率和频率的微波；微波开关，所述微波开关用于控制所述微波的开通与关断；功率放大器，用于放大微波功率；辐射结构，用于传导微波场。
根据本公开的一个实施例，所述温控模块，包括：外温控系统和内温控系统。
根据本公开的一个实施例，所述扫描探头模块，包括：物镜系统，用于将双色镜反射来的预设波长的激发光进行聚焦，使得NV色心初始化，并收集由所述NV色心发出的红色荧光；探针系统，所述探针系统包括探针、金刚石针尖、探针固定架、倾角位移台和微米位移台，所述金刚石针尖固定于所述探针的自由端，所述探针被安装到所述探针固定架上，通过探针基座与所述倾角位移台相连后，固定于所述微米位移台；被测样品，所述被测样品通过样品基座固定于纳米位移台，所述纳米位移台固定于用于样品倾角调节的倾角位移台上，最后固定于用于样品位置粗调的一套三维微米位移台。
根据本公开的一个实施例，所述探针为量子探针。
根据本公开的一个实施例，所述探针固定架为AFM固定架。
根据本公开的一个实施例，所述微米位移台为三维微米位移台
根据本公开的一个实施例，所述金刚石针尖内部包含单个NV色心。
根据本公开的一个实施例，还包括：电源模块，用于为所述系统供电。
根据本公开实施例的基于单自旋的量子钻石精密磁学测量系统，通过将AFM与微观磁共振技术完美结合，将量子传感器集成于原子力显微镜探针中，可以将量子传感器与被测样品间的距离精确地控制在纳米级范围内，实现超高分辨率和高灵敏度、无损磁学性质扫描成像，不仅实现室温大气、多模式成像，并且极大地满足了拓扑磁结构、超导磁成像、生命科学原位成像等多重要领域的实验要求。
本公开附加的方面和优点将在下面的描述中部分给出，部分将从下面的描述中变得明显，或通过本公开的实践了解到。
附图说明
图1是根据本公开实施例的基于单自旋的量子钻石精密磁学测量系统的方框示意图；
图2是根据本公开一个实施例的激发光路原理示意图；
图3是根据本公开一个实施例的共聚焦光学模块的方框示意图；
图4是根据本公开一个实施例的微波模块的方框示意图；
图5是根据本公开一个实施例的温控模块的方框示意图；
图6是根据本公开一个实施例的量子钻石探针制备工艺的流程图；
图7是根据本公开一个实施例的探头模块的方框示意图；
图8是根据本公开一个实施例的基于单自旋的量子钻石精密磁学测量系统的方框示意图；
图9是根据本公开一个实施例的栅格式扫描成像示意图；
图10是根据本公开一个实施例的PID控制温控系统原理示意图。
具体实施方式
下面详细描述本公开的实施例，所述实施例的示例在附图中示出，其中自始至终相同或类似的标号表示相同或类似的元件或具有相同或类似功能的元件。下面通过参考附图描述的实施例是示例性的，旨在用于解释本公开，而不能理解为对本公开的限制。
下面参照附图描述根据本公开实施例提出的基于单自旋的量子钻石精密磁学测量系统。
图1是本公开实施例的基于单自旋的量子钻石精密磁学测量系统的方框示意图。如图1所示，该基于单自旋的量子钻石精密磁学测量系统包括：光学共聚焦模块100、温控模块 200、微波模块300和扫描探头模块400。
其中，光学共聚焦模块100用于产生预设波长的激光，并照射到探针上，探针中集成有氮-空位中心(NV色心，一种单自旋量子传感器)，并收集过滤从上述探针发出的红色荧光。其中，光学共聚焦模块100是整个设备的光路系统，用于产生特定的532nm的激光，照射到探针上以及收集过滤从探针发出的红色荧光(过滤532nm的激光及其他杂散光，保留红色荧光)，最后单光子探测器探测红色荧光，进而可以从中读取数据。
温控模块200温控模块用于维持系统的温度环境。
微波模块300用于产生微波，并沿着波导准确辐射至样品，同时减少微波辐射至微波放大器上，以减少对微波放大器带来的损伤。也就是说，微波模块用于将产生的微波准确地辐射在样品上，微波模块中的特定设计的辐射结构和特定设计的任意序列发生装置组合可减少微波辐射至微波放大器上，减少损伤。
扫描探头模块400扫描探头模块用于实现探针与物镜的对准，以及实现对样品的隔栅式扫描成像。
可以理解的是，本公开实施例的基于单自旋的量子钻石精密磁学测量系统可以包括光学共聚焦模块100、温控模块200和扫描探头模块400四部分。其中，微波范围可以为0-4GHz，时序控制精度高达50ps，磁探测灵敏度达1μT/，成像空间分辨率超过50nm，温控精度高于2mk/h，扫描定位精度达亚纳米级，可实现室温大气、多模式成像。
根据本公开的一个实施例，光学共聚焦模块100包括：激发光路，用于激光驱动板通过输出电压信号激发光纤激光二极管发出预设波长的激光，并经单模光纤将激光导至共聚焦光路，并经双色镜反射至高数值孔径物镜；收集光路，将探针中单电子自旋发出的红色荧光由物镜收集，经共聚焦光路，并由滤光片过滤掉其他波长的杂散光，将红色荧光传导至单光子计数器中。其中，激发光路的原理图如图2所示。
具体而言，光学共聚焦模块100可以由激发光路和收集光路构成。在激发光路中，如图3所示，激光驱动板通过输出电压信号激发光纤激光二极管发出532nm的激光，经单模光纤将激光导至共聚焦光路，整个激发光路做成一个集成化系统，利用单模光纤而非自由光的方式连接，可以更加便捷稳定；收集光路中，532nm激光经光纤耦合器射出，经扩束器扩束后，成为高质量、小扩散角的高斯光束。高斯光束经双色镜反射至高数值孔径物镜。NV色心(金刚石针尖，内含有NV色心)发出的红色荧光被物镜收集后，透过由一组650nm长波长通和775nm短波长通组合成的双色镜，滤掉532nm的激发光和其他杂散光，最后到达单光子探测器。整个前端光路做成一个集成化系统，利用光纤方式连接增加稳定性，收集光路整合到笼式系统中，使其抗震动、温漂的能力大大增强。
由此，通过光学共聚焦模块大大节省了空间。前端光路用于将激发光传递至量子探针， 后端光路收集量子传感器发出的红色荧光，前后端共用一段光路，对系统的小型化至关重要。
根据本公开的一个实施例，微波模块300包括：波源，波源通过微波发射机发出预设功率和预设频率的微波；微波开关，所述微波开关用于控制所述微波的开通与关断；功率放大器，用于放大微波功率；辐射结构，用于传导微波场。
具体而言，微波模块300由波源，微波开关，功率放大器，辐射结构构成，如图4所示。微波发射机用来产生电子自旋调控需要的脉冲微波，辐射结构用于提供有效的微波场。基于FPGA和“时间折叠链技术”的任意序列发生装置可以实现多通道、高精度、高稳定度的脉冲时序输出。根据理论和实验对比不同结构形态的辐射结构的性能，可以完成辐射结构的设计，使微波有效地辐射至样品减小反射对微波放大器带来的损伤，实现高速、高保真度的自旋量子操纵。
根据本公开的一个实施例，温控模块200包括：外温控系统和内温控系统。
具体而言，如图5所示，温控模块400可以分为外温控和内温控系统，仪器外部机箱使用一台具有PID控制的温控仪提供相对稳定的温度环境，温控精度达0.1k/h，用于实现扫描探头与外部温度屏蔽，仪器内部的探头模块使用更高精度的温控仪来降低结构件的温度漂移。这种嵌套式的双层温度控制系统能够更快速地实现温度稳定，易实现精确的温度控制。实验测试中，温控精度可长时间稳定在±2mk/h以内。
由此，通过高精度温度控制降低位移台温漂。通过双重PID控制温控的方案，可以进行加热和制冷，实测温度控制精度在±2mk/h以内，可以极大地降低结构件因温度变化而引起的漂移，使扫描成像的位置精度大大提高。
根据本公开的一个实施例，扫描探头模块400包括：物镜系统，用于将双色镜反射来的预设波长的激发光进行聚焦，使得NV色心初始化，并收集由NV色心发出的红色荧光；探针系统，探针系统包括探针、金刚石针尖、探针固定架、倾角位移台和微米位移台，金刚石针尖固定于探针的自由端，探针被安装到探针固定架上，通过探针基座与倾角位移台相连后，固定于微米位移台被测样品，被测样品通过样品基座固定于纳米位移台，纳米位移台固定于用于样品倾角调节的倾角位移台上，最后固定于用于样品位置粗调的一套三维微米位移台。
可选地，根据本公开的一个实施例，探针为量子探针，其中，量子探针的制备工艺可以如图6所示。需要说明的是，满足要求的，具有超长相干时间、高稳定度的量子探针制备需要经过包括超纯金刚石生长、离子注入、电子束曝光、聚焦离子束刻蚀、反应等离子体刻蚀等二十多项微纳加工工艺，以实现将具有磁灵敏度的NV色心集成于原子力显微镜的扫描探针之中。
可选地，根据本公开的一个实施例，探针固定架为AFM固定架。
可选地，根据本公开的一个实施例，微米位移台为三维微米位移台
可选地，根据本公开的一个实施例，金刚石针尖内部包含单个NV色心。
具体而言，如图7所示，扫描探头模块400主要包括物镜系统、包含NV色心的音叉式探针系统、被测样品系统、微波辐射部分等，扫描探头模块400是整个仪器最为核心的部分，将量子探针集成于原子力显微镜的探针中，可实现两者功能的完美结合，实现超高测磁灵敏度，高空间分辨率，较大范围定量、无损磁学特性扫描成像。
探针系统主要由音叉式探针、内部包含单个NV色心的金刚石针尖、探针固定架、倾角位移台和微米位移台构成。探针被安装到AFM固定架上，并通过探针基座与倾角位移台相连，最后固定于三维微米位移台。物镜系统用于将双色镜反射来的532nm的激发光进行聚焦，用于NV色心的初始化并收集由NV色心发出的红色荧光。物镜固定于一个三维纳米位移台，并由纳米位移台支撑架支撑于探针上方。被测样品通过样品基座固定于纳米位移台，纳米位移台固定于用于样品倾角调节的倾角位移台上，最后固定于用于样品位置粗调的一套三维微米位移台。纳米位移台，微米位移台和角位移台的移动分别通过各自的控制器控制，并由电源模块给位移台控制器供电。
根据本公开的一个实施例，如图8所示，还包括：电源模块，用于为系统供电。
综上，本公开实施例通过双层PID温控系统维持温度稳定来降低结构的漂移；通过精密反馈控制，保持针尖和样品之间的距离稳定在纳米量级，可实现超高分辨率、无损扫描成像；通过NV色心量子态的操控和读出，实现材料微观磁特性的高灵敏度定量表征。本公开的有益效果：本公开是一种性能优良的微纳磁特性成像系统，可实现50ps高精度时序控制，磁探测灵敏度可达1μT/，磁成像空间分辨率可达50nm，定位精度达亚纳米级，温控精度可达±2mk/h，可实现室温大气、多模式定量、无损成像，这些性能极大地满足了拓扑磁结构、超导磁成像、生命科学原位成像等多重要领域的实验要求。
为使得本领域技术人员进一步了解本公开实施例的基于单自旋的量子钻石精密磁学测量系统，下面以一个具体实施例进行详细阐述。
具体而言，本公开实施例的基于单自旋的量子钻石精密磁学测量系统设计的定量磁学成像实现方法，包括以下步骤：
步骤1：激光对准。
具体地，在已知物镜的工作距离的情况下，金刚石探针在微米位移台的带动下移动到物镜下方合适的位置，实现物镜和NV色心的粗对准，在这个过程中通过CCD实时观测金刚石探针与物镜的距离变化，以防两者相撞并确保金刚石处于物镜下方。打开激光器，调整金刚石探针与物镜之间的距离，使得在APD读取的荧光计数达到较高值，此时物镜的焦点 已处于金刚石内。
改变金刚石与物镜的距离，并在保持金刚石探针z向位置不变时，对其内部xy平面内一定区域范围的红色荧光计数进行扫描成像，直到找到单个“NV色心”。
打开微波，使得在色心周围分布一定强度的微波场。将物镜焦点移动至荧光计数较高位置处，进行连续波、拉比等实验，用以确认此处是否为单个NV色心。若非单个NV色心，移动物镜焦点至下一个荧光计数较高的点进行相应实验，直至找到质量较好的单个NV色心。
确定NV色心位置后，在一定激励电压下，对音叉探针在一定频率范围内进行扫频以确定其共振频率f0。通过微米位移台移动样品的位置，使得在CCD视场下可以较清晰地观察到被测样品上的待测区域，并将其移动至探针针尖的正下方。
步骤2：锁相控制实现振幅调制。
具体地，在激励电压，使探针以其共振频率f0作特定振幅振动。控制微米位移台将样品逐渐靠近针尖，同时观测探针的振幅并通过CCD观察针尖与样品表面间的距离变化，当距离较近时降低样品靠近针尖的速度并改用纳米位移台对其距离进行调控，直至探针振幅变化满足目标，即针尖样品间的距离达到目标值。
步骤3：微波调制。
微波发射机用来产生电子自旋调控需要的脉冲微波，辐射结构用于在量子钻石探针附近提供有效的微波场。基于FPGA和“时间折叠链技术”的50皮秒时间精度宽带高功率的任意序列发生装置可以实现多通道、高精度、高稳定度的脉冲时序输出，并使微波有效地辐射至样品减小反射对微波放大器带来的损伤，实现对自旋低噪声、高效、快速的量子相干操控。
步骤4：信息收集。
NV-色心发出的红色荧光被物镜收集后，透过由一组650nm长波长通和775nm短波长通组合成的双色镜，再通过滤光片滤掉532nm的激发光和其他杂散光，最后到达单光子探测器。单光子探测器可以将荧光信号转换为对应的电信号，以方便进行分析。
步骤5：栅格式地扫描成像。
对被测样品的扫描成像完全借鉴了原子力显微镜栅格式的扫描方式。在起始点完成所要求的功能后，纳米位移台随即带着被测样品移动至下一个实验点。栅格式的扫描包括蛇形轨迹和往复扫描轨迹，可由用户自由切换，如图9所示。扫描过程中，由精密温控模块维持探头模块的温度保持稳定，最大限度地降低由温度漂移带来的扫描误差。
步骤6：温度控制。
在扫描磁成像的过程中，为了降低由于温度变化导致的结构位置漂移，需要对探头模 块的环境进行精密温度控制。将整个温控模块分为外温控和内温控系统，结合图5和图10所示，两个温控系统都采用具有PID控制功能的温控仪来实现，通过温度传感器读取温控箱内的实时温度，并与目标值进行对比，通过PID反馈控制，确定温控仪输出给加热片的功率，最终实现快速精密温度控制。
根据本公开实施例提出的基于单自旋的量子钻石精密磁学测量系统，通过将AFM与微观磁共振技术完美结合，将量子传感器集成于原子力显微镜探针中，可以将量子传感器与被测样品间的距离精确地控制在纳米级范围内，实现超高分辨率和高灵敏度定量无损磁学性质扫描成像，不仅实现室温大气多模式成像，并且极大地满足了拓扑磁结构、超导磁成像、生命科学原位成像等多重要领域的实验要求。
在本公开的描述中，需要理解的是，术语“中心”、“纵向”、“横向”、“长度”、“宽度”、“厚度”、“上”、“下”、“前”、“后”、“左”、“右”、“竖直”、“水平”、“顶”、“底”“内”、“外”、“顺时针”、“逆时针”、“轴向”、“径向”、“周向”等指示的方位或位置关系为基于附图所示的方位或位置关系，仅是为了便于描述本公开和简化描述，而不是指示或暗示所指的装置或元件必须具有特定的方位、以特定的方位构造和操作，因此不能理解为对本公开的限制。
此外，术语“第一”、“第二”仅用于描述目的，而不能理解为指示或暗示相对重要性或者隐含指明所指示的技术特征的数量。由此，限定有“第一”、“第二”的特征可以明示或者隐含地包括至少一个该特征。在本公开的描述中，“多个”的含义是至少两个，例如两个，三个等，除非另有明确具体的限定。
在本公开中，除非另有明确的规定和限定，术语“安装”、“相连”、“连接”、“固定”等术语应做广义理解，例如，可以是固定连接，也可以是可拆卸连接，或成一体；可以是机械连接，也可以是电连接；可以是直接相连，也可以通过中间媒介间接相连，可以是两个元件内部的连通或两个元件的相互作用关系，除非另有明确的限定。对于本领域的普通技术人员而言，可以根据具体情况理解上述术语在本公开中的具体含义。
在本公开中，除非另有明确的规定和限定，第一特征在第二特征“上”或“下”可以是第一和第二特征直接接触，或第一和第二特征通过中间媒介间接接触。而且，第一特征在第二特征“之上”、“上方”和“上面”可是第一特征在第二特征正上方或斜上方，或仅仅表示第一特征水平高度高于第二特征。第一特征在第二特征“之下”、“下方”和“下面”可以是第一特征在第二特征正下方或斜下方，或仅仅表示第一特征水平高度小于第二特征。
在本说明书的描述中，参考术语“一个实施例”、“一些实施例”、“示例”、“具体示例”、或“一些示例”等的描述意指结合该实施例或示例描述的具体特征、结构、材料或者特点包含于本公开的至少一个实施例或示例中。在本说明书中，对上述术语的示意性表述 不必须针对的是相同的实施例或示例。而且，描述的具体特征、结构、材料或者特点可以在任一个或多个实施例或示例中以合适的方式结合。此外，在不相互矛盾的情况下，本领域的技术人员可以将本说明书中描述的不同实施例或示例以及不同实施例或示例的特征进行结合和组合。
尽管上面已经示出和描述了本公开的实施例，可以理解的是，上述实施例是示例性的，不能理解为对本公开的限制，本领域的普通技术人员在本公开的范围内可以对上述实施例进行变化、修改、替换和变型。

Claims (10)

  1. 一种基于单自旋的量子钻石精密磁学测量系统，包括：
    光学共聚焦模块，所述光学共聚焦模块用于产生预设波长的激光，并照射到探针上，并收集过滤从上述探针反射的荧光；
    温控模块，所述温控模块用于维持系统的温度环境；
    微波模块，用于产生微波，并沿着波导准确辐射至样品，同时减少微波辐射至微波放大器上，以减少对微波放大器带来的损伤；以及
    扫描探头模块，所述扫描探头模块用于实现探针与物镜的对准，以及实现对样品的隔栅式扫描成像。
  2. 根据权利要求1所述的基于单自旋的量子钻石精密磁学测量系统，其中，所述光学共聚焦模块，包括：
    激发光路，用于激光驱动板通过输出电压信号激发光纤激光二极管发出预设波长的激光，经单模光纤将所述激光导至共聚焦光路，并经双色镜反射至高数值孔径物镜；
    收集光路，将探针中单电子自旋发出的红色荧光由所述物镜收集，经共聚焦光路，并由滤光片过滤掉其他波长的杂散光，将所述红色荧光传导至单光子计数器中。
  3. 根据权利要求1所述的基于单自旋的量子钻石精密磁学测量系统，其中，所述微波模块包括：
    波源，所述波源通过微波发射机发出预设功率和频率的微波；
    微波开关，所述微波开关用于控制所述微波的开通与关断；
    功率放大器，用于放大波源产生的微波的功率；
    辐射结构，用于传导微波场。
  4. 根据权利要求1所述的基于单自旋的量子钻石精密磁学测量系统，其中，所述温控模块包括：外温控系统和内温控系统。
  5. 根据权利要求1所述的基于单自旋的量子钻石精密磁学测量系统，其中，所述扫描探头模块，包括：
    物镜系统，用于将双色镜反射来的预设波长的激发光进行聚焦，将NV色心初始化，并收集由所述NV色心发出的红色荧光；
    探针系统，所述探针系统包括探针、金刚石针尖、探针固定架、倾角位移台和微米位 移台，所述金刚石针尖固定于所述探针的自由端，所述探针被安装到所述探针固定架上，通过探针基座与所述倾角位移台相连后，固定于所述微米位移台；
    被测样品，所述被测样品通过样品基座固定于纳米位移台，所述纳米位移台固定于用于样品倾角调节的倾角位移台上，最后固定于用于样品位置粗调的一套三维微米位移台。
  6. 根据权利要求5所述的基于单自旋的量子钻石精密磁学测量系统，其中，所述探针为单电子自旋量子探针。
  7. 根据权利要求5所述的基于单自旋的量子钻石精密磁学测量系统，其中，所述探针固定架为AFM固定架。
  8. 根据权利要求5所述的基于单自旋的量子钻石精密磁学测量系统，其中，所述微米位移台为三维微米位移台。
  9. 根据权利要求5所述的基于单自旋的量子钻石精密磁学测量系统，其中，所述金刚石针尖内部包含单个NV色心。
  10. 根据权利要求1所述的基于单自旋的量子钻石精密磁学测量系统，还包括：
    电源模块，用于为所述系统供电。
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