CN117347737A - 一种微波场的矢量测量与成像装置及方法 - Google Patents
一种微波场的矢量测量与成像装置及方法 Download PDFInfo
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- CN117347737A CN117347737A CN202311649012.2A CN202311649012A CN117347737A CN 117347737 A CN117347737 A CN 117347737A CN 202311649012 A CN202311649012 A CN 202311649012A CN 117347737 A CN117347737 A CN 117347737A
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- 238000003384 imaging method Methods 0.000 title claims abstract description 33
- 238000005259 measurement Methods 0.000 title claims abstract description 29
- 238000000034 method Methods 0.000 title claims abstract description 13
- 229910003460 diamond Inorganic materials 0.000 claims abstract description 92
- 239000010432 diamond Substances 0.000 claims abstract description 92
- 239000000523 sample Substances 0.000 claims abstract description 69
- 230000003068 static effect Effects 0.000 claims description 14
- 230000003287 optical effect Effects 0.000 claims description 5
- 230000035945 sensitivity Effects 0.000 abstract description 3
- 230000007547 defect Effects 0.000 abstract description 2
- 230000005855 radiation Effects 0.000 description 11
- 238000012512 characterization method Methods 0.000 description 5
- 230000007423 decrease Effects 0.000 description 5
- 239000007787 solid Substances 0.000 description 4
- 238000010586 diagram Methods 0.000 description 3
- 238000004891 communication Methods 0.000 description 2
- 238000003745 diagnosis Methods 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- 238000000691 measurement method Methods 0.000 description 2
- JBRZTFJDHDCESZ-UHFFFAOYSA-N AsGa Chemical class [As]#[Ga] JBRZTFJDHDCESZ-UHFFFAOYSA-N 0.000 description 1
- HIVGXUNKSAJJDN-UHFFFAOYSA-N [Si].[P] Chemical compound [Si].[P] HIVGXUNKSAJJDN-UHFFFAOYSA-N 0.000 description 1
- 238000004458 analytical method Methods 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 230000033228 biological regulation Effects 0.000 description 1
- 230000003247 decreasing effect Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- RPQDHPTXJYYUPQ-UHFFFAOYSA-N indium arsenide Chemical class [In]#[As] RPQDHPTXJYYUPQ-UHFFFAOYSA-N 0.000 description 1
- 238000001208 nuclear magnetic resonance pulse sequence Methods 0.000 description 1
- 230000008707 rearrangement Effects 0.000 description 1
- 238000006467 substitution reaction Methods 0.000 description 1
- 230000009897 systematic effect Effects 0.000 description 1
- 230000009466 transformation Effects 0.000 description 1
- 230000000007 visual effect Effects 0.000 description 1
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
- G01R29/08—Measuring electromagnetic field characteristics
- G01R29/0864—Measuring electromagnetic field characteristics characterised by constructional or functional features
- G01R29/0878—Sensors; antennas; probes; detectors
- G01R29/0885—Sensors; antennas; probes; detectors using optical probes, e.g. electro-optical, luminescent, glow discharge, or optical interferometers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
- G01R29/08—Measuring electromagnetic field characteristics
- G01R29/0864—Measuring electromagnetic field characteristics characterised by constructional or functional features
- G01R29/0871—Complete apparatus or systems; circuits, e.g. receivers or amplifiers
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- Physics & Mathematics (AREA)
- Electromagnetism (AREA)
- General Physics & Mathematics (AREA)
- Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
Abstract
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Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN117705831A (zh) * | 2024-02-05 | 2024-03-15 | 高速铁路建造技术国家工程研究中心 | 一种基于微波反射的量子传感器及无损检测方法 |
Citations (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20140191139A1 (en) * | 2011-08-01 | 2014-07-10 | The Trustees Of Columbia University In The City Of New York | Conjugates of nano-diamond and magnetic or metallic particles |
CN105823994A (zh) * | 2016-03-10 | 2016-08-03 | 中国科学技术大学 | 一种基于金刚石nv色心的微波磁场测量系统 |
CN107356820A (zh) * | 2017-06-07 | 2017-11-17 | 南京邮电大学 | 一种基于脉冲光探测磁共振的电磁场近场成像系统及方法 |
CN109143121A (zh) * | 2018-08-13 | 2019-01-04 | 南京邮电大学 | 一种基于脉冲调制的微波场定量测试系统及方法 |
CN111650543A (zh) * | 2020-06-16 | 2020-09-11 | 宿迁学院 | 一种基于金刚石nv色心的微波近场矢量测量方法 |
CN112083364A (zh) * | 2020-07-29 | 2020-12-15 | 奥为电子科技(南京)有限公司 | 一种微波场和温度场阵列式定量测试系统及方法 |
US20220050153A1 (en) * | 2018-10-16 | 2022-02-17 | Tokyo Institute Of Technology | Magnetic measuring device |
WO2022116521A1 (zh) * | 2020-12-04 | 2022-06-09 | 国仪量子(合肥)技术有限公司 | 基于单自旋的量子钻石精密磁学测量系统 |
CN114720919A (zh) * | 2022-06-09 | 2022-07-08 | 中国科学技术大学 | 微波磁场测量方法及微波磁场测量系统 |
CN115791740A (zh) * | 2023-02-08 | 2023-03-14 | 安徽省国盛量子科技有限公司 | 一种基于金刚石nv色心的微波反射成像检测装置、方法 |
CN115825033A (zh) * | 2023-02-08 | 2023-03-21 | 安徽省国盛量子科技有限公司 | 一种基于金刚石nv色心的微波反射检测装置及方法 |
CN116165182A (zh) * | 2022-12-02 | 2023-05-26 | 中国科学技术大学 | 量子宽场磁显微镜 |
CN116359807A (zh) * | 2023-03-28 | 2023-06-30 | 中国电子科技集团公司第十三研究所 | 金刚石nv色心磁力探测装置及系统 |
EP4224187A1 (en) * | 2022-02-04 | 2023-08-09 | Wainvam-E | Device and method for measuring a physical parameter |
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2023
- 2023-12-05 CN CN202311649012.2A patent/CN117347737B/zh active Active
Patent Citations (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20140191139A1 (en) * | 2011-08-01 | 2014-07-10 | The Trustees Of Columbia University In The City Of New York | Conjugates of nano-diamond and magnetic or metallic particles |
CN105823994A (zh) * | 2016-03-10 | 2016-08-03 | 中国科学技术大学 | 一种基于金刚石nv色心的微波磁场测量系统 |
CN107356820A (zh) * | 2017-06-07 | 2017-11-17 | 南京邮电大学 | 一种基于脉冲光探测磁共振的电磁场近场成像系统及方法 |
CN109143121A (zh) * | 2018-08-13 | 2019-01-04 | 南京邮电大学 | 一种基于脉冲调制的微波场定量测试系统及方法 |
US20220050153A1 (en) * | 2018-10-16 | 2022-02-17 | Tokyo Institute Of Technology | Magnetic measuring device |
CN111650543A (zh) * | 2020-06-16 | 2020-09-11 | 宿迁学院 | 一种基于金刚石nv色心的微波近场矢量测量方法 |
CN112083364A (zh) * | 2020-07-29 | 2020-12-15 | 奥为电子科技(南京)有限公司 | 一种微波场和温度场阵列式定量测试系统及方法 |
WO2022116521A1 (zh) * | 2020-12-04 | 2022-06-09 | 国仪量子(合肥)技术有限公司 | 基于单自旋的量子钻石精密磁学测量系统 |
EP4224187A1 (en) * | 2022-02-04 | 2023-08-09 | Wainvam-E | Device and method for measuring a physical parameter |
CN114720919A (zh) * | 2022-06-09 | 2022-07-08 | 中国科学技术大学 | 微波磁场测量方法及微波磁场测量系统 |
CN116165182A (zh) * | 2022-12-02 | 2023-05-26 | 中国科学技术大学 | 量子宽场磁显微镜 |
CN115791740A (zh) * | 2023-02-08 | 2023-03-14 | 安徽省国盛量子科技有限公司 | 一种基于金刚石nv色心的微波反射成像检测装置、方法 |
CN115825033A (zh) * | 2023-02-08 | 2023-03-21 | 安徽省国盛量子科技有限公司 | 一种基于金刚石nv色心的微波反射检测装置及方法 |
CN116359807A (zh) * | 2023-03-28 | 2023-06-30 | 中国电子科技集团公司第十三研究所 | 金刚石nv色心磁力探测装置及系统 |
Non-Patent Citations (2)
Title |
---|
ZHECHENG WANG 等: "Picotesla magnetometry of microwave fields with diamond sensors", SCIENCE ADVANCES, vol. 8, no. 32 * |
彭世杰 等: "基于金刚石氮-空位色心的精密磁测量", 物理学报, vol. 67, no. 16, pages 167601 - 1 * |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN117705831A (zh) * | 2024-02-05 | 2024-03-15 | 高速铁路建造技术国家工程研究中心 | 一种基于微波反射的量子传感器及无损检测方法 |
CN117705831B (zh) * | 2024-02-05 | 2024-04-26 | 高速铁路建造技术国家工程研究中心 | 一种基于微波反射的量子传感器及无损检测方法 |
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Inventor after: Wang Zhecheng Inventor after: Kong Fei Inventor after: Zhao Pengju Inventor after: Zhang Qi Inventor after: Shi Fazhan Inventor after: Du Jiangfeng Inventor before: Wang Zhecheng Inventor before: Kong Fei Inventor before: Zhao Pengju Inventor before: Shi Fazhan Inventor before: Du Jiangfeng |