WO2022091930A1 - 可撓性基板、検査治具 - Google Patents

可撓性基板、検査治具 Download PDF

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Publication number
WO2022091930A1
WO2022091930A1 PCT/JP2021/038915 JP2021038915W WO2022091930A1 WO 2022091930 A1 WO2022091930 A1 WO 2022091930A1 JP 2021038915 W JP2021038915 W JP 2021038915W WO 2022091930 A1 WO2022091930 A1 WO 2022091930A1
Authority
WO
WIPO (PCT)
Prior art keywords
flexible substrate
connector
spring
holding portion
tongue piece
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
PCT/JP2021/038915
Other languages
English (en)
French (fr)
Japanese (ja)
Inventor
久史 鈴木
力 三浦
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Yokowo Co Ltd
Original Assignee
Yokowo Co Ltd
Yokowo Mfg Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Yokowo Co Ltd, Yokowo Mfg Co Ltd filed Critical Yokowo Co Ltd
Priority to CN202180072984.2A priority Critical patent/CN116458270A/zh
Priority to US18/034,082 priority patent/US20230397329A1/en
Priority to EP21886049.2A priority patent/EP4240119A4/en
Priority to JP2022559070A priority patent/JP7528246B2/ja
Priority to KR1020237014007A priority patent/KR20230093435A/ko
Publication of WO2022091930A1 publication Critical patent/WO2022091930A1/ja
Anticipated expiration legal-status Critical
Ceased legal-status Critical Current

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Classifications

    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00—Printed circuits
    • H05K1/02—Details
    • H05K1/0277—Bendability or stretchability details
    • H05K1/0283—Stretchable printed circuits
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00—Printed circuits
    • H05K1/02—Details
    • H05K1/11—Printed elements for providing electric connections to or between printed circuits
    • H05K1/118—Printed elements for providing electric connections to or between printed circuits specially for flexible printed circuits, e.g. using folded portions
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0416—Connectors, terminals
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • G01R31/66—Testing of connections, e.g. of plugs or non-disconnectable joints
    • G01R31/68—Testing of releasable connections, e.g. of terminals mounted on a printed circuit board
    • G01R31/69—Testing of releasable connections, e.g. of terminals mounted on a printed circuit board of terminals at the end of a cable or a wire harness; of plugs; of sockets, e.g. wall sockets or power sockets in appliances
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
    • H05K2201/05—Flexible printed circuits [FPCs]
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
    • H05K2201/05—Flexible printed circuits [FPCs]
    • H05K2201/056—Folded around rigid support or component
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
    • H05K2201/09—Shape and layout
    • H05K2201/09009—Substrate related
    • H05K2201/09081—Tongue or tail integrated in planar structure, e.g. obtained by cutting from the planar structure

Definitions

  • the present invention relates to a flexible substrate or the like.
  • Patent Document 1 a flexible substrate that can be expanded and contracted has been proposed.
  • an object of the present invention is to provide a flexible substrate or the like that is not easily damaged even if a partial force is applied.
  • the flexible substrate according to the present invention includes one end, the other end, and at least a pattern portion formed between one end and the other end.
  • the pattern portion has a tongue piece formed by a notch.
  • the tongue piece is electrically connected to other members.
  • the inspection jig 1 in the present embodiment includes a connector contact portion 10, a substrate holding portion 20, a substrate portion 30, and a horizontal position adjusting portion 40.
  • the inspection jig 1 comes into contact with the inspection target connector (BtoB connector, Board to Board connector) 100 to be inspected via the connector contact portion 10, and electrically with the internal front flexible substrate 31a and the rear flexible substrate 32a. Connecting. Note that FIG. 1 omits the illustration of the connector 100 to be inspected.
  • the horizontal direction (front-back direction) in which the two board assemblies (front board assembly 31, rear board assembly 32) are arranged is defined as the x direction, and the two supports are perpendicular to the x direction.
  • the direction in which the 43s are arranged will be described as the y direction
  • the direction perpendicular to the x direction and the y direction will be described as the z direction.
  • the directions pointed to by the arrows on the xyz axis are defined as the forward direction, the right direction, and the upward direction, respectively.
  • the direction from the rear board assembly 32 toward the front board assembly 31 is defined as the front direction.
  • the direction from the one located at the lower right of FIG. 1 to the one located at the upper left of FIG. 1 is defined as the right direction.
  • the direction from the connector contact portion 10 toward the horizontal position adjusting portion 40 is defined as an upward direction.
  • the connector contact portion 10 has a floating guide (first movable member) 11 and a first spring (first elastic member) 13.
  • the floating guide 11 has a hole penetrating in the z direction.
  • the lower end of the lower holding portion 21 and the lower end of the substrate portion 30 are inserted into the holes of the floating guide 11 from the upper side in the z direction.
  • the upper end of the connector 100 to be inspected is inserted into the hole of the floating guide 11 from the lower side in the z direction. That is, the inspection target connector 100 is attached to the floating guide 11 in a detachable state.
  • the upper side of the floating guide 11 in the z direction is attached to the lower holding portion 21 by screwing.
  • a first spring 13 is provided between the floating guide 11 and the lower holding portion 21.
  • the first spring 13 urges the floating guide 11 so as to be separated from the front flexible substrate 31a and the rear flexible substrate 32a in the z direction. Therefore, the floating guide 11 and the lower holding portion 21 are separated by the first spring 13 unless a force is applied in the direction of contraction in the z direction, such as pushing the inspection jig 1 into the connector 100 to be inspected from the upper side in the z direction. The state is maintained.
  • the substrate holding portion 20 has a lower holding portion (pin block frame) 21 and an upper holding portion (connecting plate) 23.
  • the lower holding portion 21 is provided on the lower side of the substrate portion 30 in the z direction.
  • the upper holding portion 23 is provided on the upper side of the substrate portion 30 in the z direction.
  • the lower holding portion 21 and the upper holding portion 23 sandwich the substrate portion 30 in the z direction.
  • the lower holding portion 21 has a hole penetrating in the z direction.
  • the lower end of the substrate portion 30 is inserted into the hole of the lower holding portion 21 from the upper side in the z direction.
  • a convex portion is formed on the lower side of the lower holding portion 21 in the z direction. The convex portion is fitted into the hole of the floating guide 11 from the upper side in the z direction.
  • the front holding portion 31c of the front board assembly 31 and the rear holding portion 32c of the rear board assembly 32 are attached to the upper side of the lower holding portion 21 in the z direction.
  • the attachment of the front holding portion 31c to the lower holding portion 21 is performed by fitting and bonding using a boss hole.
  • the attachment of the rear holding portion 32c to the lower holding portion 21 is performed by adhesion.
  • the front push block 31i of the front board assembly 31 and the rear push block 32i of the rear board assembly 32 are attached to the lower side of the upper holding portion 23 in the z direction.
  • the front push block 31i is attached to the upper holding portion 23 from the upper side in the z direction and by screwing using a round hole.
  • the rear push block 32i is attached to the upper holding portion 23 by screwing from the upper side in the z direction and using an elongated hole extending in the x direction.
  • the elongated hole extending in the x direction of the upper holding portion 23 is used for adjusting the distance between the front holding portion 31c for holding the front push block 31i and the rear holding portion 32c for holding the rear push block 32i in the x direction.
  • the distance between the front holding portion 31c and the rear holding portion 32c in the x direction is determined according to the distance between the electrode positions of the connector 100 to be inspected in the x direction.
  • the front holding portion 31c and the rear holding portion 32c are held under the front holding portion 31c and the rear holding portion 32c while the distance between the front holding portion 31c and the rear holding portion 32c in the x direction is narrow.
  • the attachment to the portion 21 and the attachment of the front push block 31i and the rear push block 32i to the upper holding portion 23 are performed.
  • the front holding portion 31c and the rear holding portion 32c are held under the front holding portion 31c and the rear holding portion 32c while the distance between the front holding portion 31c and the rear holding portion 32c in the x direction is wide.
  • the attachment to the portion 21 and the attachment of the front push block 31i and the rear push block 32i to the upper holding portion 23 are performed.
  • the substrate holding portion 20 holds a plurality of flexible substrates (front flexible substrate 31a, rear flexible substrate 32a) in a state where the distance in the x direction can be adjusted.
  • the board portion 30 has a front board assembly 31 and a rear board assembly 32.
  • the front board assembly 31 is arranged on the front side in the x direction
  • the rear board assembly 32 is arranged on the rear side in the x direction.
  • the front board assembly 31 includes a front flexible board (flexible board) 31a, a front connector 31b, a front holding portion 31c, a front connector base 31d, a front connector holding rubber 31e, and a front connector cover 31f. It has a front probe group 31g, a front second spring 31h, and a front push block (second movable member) 31i.
  • the front flexible substrate 31a has a connector connection end (one end) 31a1, a holding portion connection end (the other end) 31a2, and a pattern portion 31a3.
  • the connector connection end 31a1 is an end portion on the front side in the x direction and the upper side in the z direction of the front side flexible board 31a, and the front side connector 31b is attached to the connector connection end 31a1 by soldering or the like.
  • the holding portion connecting end 31a2 is an end portion on the rear side in the x direction and the upper side in the z direction of the front flexible substrate 31a, and is hooked to the front holding portion 31c.
  • the hole 31a21 provided in the holding portion connecting end 31a2 is fitted into the boss 31c3 provided on the upper side of the probe receiving portion 31c1 of the front holding portion 31c in the z direction.
  • the hooking of the holding portion connecting end 31a2 and the front holding portion 31c is not limited to the fitting of the hole 31a21 and the boss 31c3.
  • the pattern portion 31a3 is an area between the connector connection end 31a1 and the holding portion connection end 31a2.
  • a pattern of a signal line and a ground line extending from the connector connection end 31a1 is formed on the lower surface (front side) of the pattern portion 31a3 in the z direction.
  • the pattern portion 31a3 is bent so as to have a substantially V shape when viewed from the y direction.
  • the end portions of the signal line and the ground wire are provided at the lower end portion in a state of being bent so as to have a substantially V shape.
  • the ends of the signal line and the ground line are used as substrate-side electrodes that are electrically connected to the electrodes of the connector 100 to be inspected.
  • a slit S is provided around the ends of the signal line and the ground line (a region including a portion of the pattern portion 31a3 that is electrically connected to the inspection target connector 100).
  • the slit S forms a substantially U-shaped tongue piece 31a4. Both ends of the slit S are notches (cuts) at the closed ends, but one end may be an open end and the other end may be a closed end.
  • the pattern provided on the lower surface (front side) of the pattern portion 31a3 in the z direction is not limited to the signal line and the ground line.
  • a plurality of through holes 31a5 and a grounding wire may be provided. In this case, since the area where the ground wire is provided is reduced, the cost is lower than the case where the pattern of the ground wire is provided on the entire surface of the pattern portion 31a3 on the lower side (front side) in the z direction.
  • the length of the slit S forming the tongue piece 31a4 in the longitudinal direction is determined in consideration of the amount of displacement of the tongue piece 31a4 downward in the z direction and the characteristics of the signal line in the high frequency region. Only one signal line, a ground line, or a power line may be provided in one tongue piece 31a4, or at least one of a signal line, a ground line, and a power line may be provided in a plurality.
  • the tongue piece 31a4 formed by the slit S is not limited to a substantially U-shape. As long as the pattern portion 31a3 cannot be extended and can be displaced downward in the z direction by the probe P of the front probe group 31g from the upper side in the z direction, a substantially V shape, a substantially C shape, a substantially L shape, a substantially groove shape, etc. It may have other shapes.
  • the surface of the pattern portion 31a3 on the upper side (back side) in the z direction is grounded separately from the ground wire on the lower surface (front side) in the z direction.
  • a wire or ground plane is provided.
  • the pattern portion 31a3 is provided with a plurality of through holes 31a5 for electrically connecting the upper surface in the z direction and the lower surface in the z direction.
  • 4 to 6 show an example in which a plurality of through holes 31a5 are provided. However, the arrow line of the member number "31a5" is pointed to only one of the plurality of through holes 31a5.
  • the ground line or the ground surface of the upper surface of the pattern portion 31a3 in the z direction and the plurality of through holes 31a5 may be omitted.
  • the signal line and the ground line of the pattern portion 31a3, the slit S, the tongue piece 31a4, and the through hole 31a5 are not shown.
  • a grounding area (grounding wire or grounding surface) may be provided.
  • Front connector 31b As shown in FIG. 7, the front connector 31b is attached to the connector connection end 31a1 of the front flexible board 31a.
  • the front connector 31b is used for the front flexible substrate 31a to electrically connect to an inspection device (not shown).
  • the front holding portion 31c holds the front connector base 31d on the front side in the x direction.
  • the front holding portion 31c holds the holding portion connecting end 31a2 of the front flexible substrate 31a on the rear side in the x direction.
  • a probe receiving portion 31c1 for holding the front probe group 31g is provided on the rear side in the x direction and the lower side in the z direction of the front holding portion 31c.
  • the probe receiving portion 31c1 is made of a resin material.
  • the probe receiving portion 31c1 is made of a resin material, it is lighter, easier to process, and cheaper than the case where the probe receiving portion 31c1 is made of a metal material.
  • the probe receiving portion 31c1 may be made of a metal material.
  • the probe receiving portion 31c1 is composed of a groove extending in the z direction (upper groove portion 31c11, lower groove portion 31c12) and a hole extending in the z direction (upper hole portion 31c13, lower hole portion 31c14).
  • the widths of the upper groove portion 31c11 and the lower groove portion 31c12 in the x-direction and the y-direction are larger than the outer diameter of the spring accommodating portion (barrel) P2 of the probe P constituting the front probe group 31g.
  • the upper end of the upper hole portion 31c13 communicates with the lower end of the upper groove portion 31c11, and the lower end of the upper hole portion 31c13 communicates with the upper end of the lower groove portion 31c12.
  • the inner diameter of the upper hole portion 31c13 is larger than the outer diameter of the spring accommodating portion P2 of the probe P constituting the front probe group 31g.
  • the upper end of the prepared hole portion 31c14 communicates with the lower end of the lower groove portion 31c12, and the lower end of the prepared hole portion 31c14 opens.
  • the inner diameter of the prepared hole portion 31c14 is larger than the outer diameter of the tip portion P1 of the probe P constituting the front probe group 31g and smaller than the outer diameter of the spring accommodating portion P2.
  • the upper groove portion 31c11 and the lower groove portion 31c12 are formed by a mold.
  • the holes of the upper hole portion 31c13 and the lower hole portion 31c14 are formed by making holes in the rectangular parallelepiped region using a pin or the like.
  • the method for forming the probe receiving portion 31c1 is not limited to the above.
  • the front flexible substrate 31a is attached to the front holding portion 31c so as to satisfy the following two conditions.
  • First condition The lower side of the front holding portion 31c in the z direction faces the upper surface of the pattern portion 31a3 of the front flexible substrate 31a in the z direction.
  • Second condition The end of the signal line and the ground wire of the pattern portion 31a3 of the front flexible substrate 31a is located below the pilot hole portion 31c14 of the probe receiving portion 31c1 of the front holding portion 31c in the z direction.
  • a groove (push block groove portion 31c2) opened on the upper side in the z direction is provided on the upper side of the probe receiving portion 31c1 of the front holding portion 31c in the z direction.
  • the front side push block 31i is inserted into the push block groove portion 31c2 from the upper side in the z direction (see FIG. 3).
  • Boss 31c3 A boss 31c3 extending upward in the z direction is provided on the upper side of the probe receiving portion 31c1 of the front holding portion 31c in the z direction. The boss 31c3 is used to hook the holding portion connection end 31a2 of the front flexible substrate 31a.
  • the front connector base 31d holds the front connector 31b on the front side in the x direction.
  • the front connector base 31d is located on the front side in the x direction with respect to the front holding portion 31c, and is attached to the front holding portion 31c.
  • the assembly of the front flexible substrate 31a and the front connector 31b sandwiches the front holding portion 31c and the front connector base 31d in the x direction, and wraps the lower end of the front holding portion 31c, so that the front holding portion 31c and the front connector base 31d are assembled. It can be attached to a solid.
  • the front holding portion 31c is attached to the front connector base 31d by screwing from the rear side in the x direction.
  • the front connector holding rubber 31e is provided between the front connector 31b and the front connector cover 31f.
  • the front connector holding rubber 31e is used to minimize the adverse effect on the electrical connection with the inspection device due to the height variation of the front connector 31b. Further, the front connector holding rubber 31e is used to make the front connector 31b difficult to move when the cable extending from the inspection device is attached to and detached from the front connector 31b.
  • the front connector cover 31f covers the pattern portion 31a3 of the front flexible substrate 31a and the front side of the front connector 31b in the x direction.
  • the front connector cover 31f is attached to the front connector base 31d by screwing from the front side in the x direction.
  • the front connector cover 31f and the front connector base 31d sandwich the front connector 31b and the front connector holding rubber 31e in the x direction.
  • the front probe group 31 g has a plurality of probes (expandable members) P that expand and contract in the z direction.
  • the plurality of probes P are arranged in the y direction.
  • Each of the probes P constituting the front probe group 31g has a tip portion P1 on the lower side in the z direction and a spring accommodating portion P2 on the upper side in the z direction with respect to the tip portion P1.
  • a spring (not shown) is accommodated in the spring accommodating portion P2.
  • the tip portion P1 is urged by the spring of the spring accommodating portion P2 in a direction in which the entire length is extended.
  • the tip portion of the probe P P1 touches the back side of the region where the tongue piece 31a4 of the front flexible substrate 31a is located.
  • the first probe P is in a positional relationship in contact with one of the regions electrically connected to the inspection target connector 100 of the front flexible substrate 31a (one of the tongue pieces 31a4). ..
  • the second probe P which is different from the first probe P, is one of the regions electrically connected to the inspection target connector 100 of the front flexible substrate 31a (tongue piece 31a4). 1), which is in a positional relationship between the tongue piece 31a4 corresponding to the first probe P and another tongue piece 31a4.
  • the probe P since the probe P is light, it only touches the probe P and hardly displaces the tongue piece 31a4 downward in the z direction.
  • each of the probes P constituting the front probe group 31g is mounted on the probe receiving portion 31c1. It is done in a state of being.
  • the front push block 31i is inserted into the groove of the front holding portion 31c (push block groove portion 31c2) from the upper side in the z direction in a state of being movable in the z direction.
  • the front push block 31i is used to push down each of the probes P constituting the front probe group 31g downward in the z direction. That is, the plurality of probes P constituting the front probe group 31g are provided between the front flexible substrate 31a and the front push block 31i.
  • a front second spring 31h is provided between the front holding portion 31c and the front push block 31i. The front second spring 31h urges the front push block 31i so as to be separated from the front holding portion 31c in the z direction.
  • the z-direction compression of the front second spring 31h and the rear second spring 32h which will be described later, is completed after the z-direction compression of the first spring 13 is completed.
  • the spring characteristics (spring pressure, spring constant, etc.) of the first spring 13, the front second spring 31h, and the rear second spring 32h are set. That is, after the first spring 13 contracts, the front second spring 31h and the rear second spring 32h contract.
  • the floating guide 11 when connecting the front flexible board 31a and the rear flexible board 32a to the inspection target connector 100, the floating guide 11 is as follows by the first spring 13, the front second spring 31h, and the rear second spring 32h.
  • the operation of the front flexible substrate 31a and the rear flexible substrate 32a is controlled. After the first distance d1 between the floating guide 11 and the front flexible substrate 31a and the rear flexible substrate 32a is shortened, the second distance d2 between the front push block 31i and the front flexible substrate 31a is shortened, and at substantially the same timing.
  • the second distance d2 between the rear push block 32i and the rear flexible substrate 32a is shortened.
  • the first distance d1 is electrically connected to the lower end portion of the floating guide 11 (the opening area into which the inspection target connector 100 is inserted) and the lower end portion of the front flexible substrate 31a (the inspection target connector 100 of the pattern portion 31a3). Area) and the distance in the z direction.
  • the second distance d2 is a region electrically connected to the lower end portion of the front push block 31i (the region in contact with the front probe group 31g) and the lower end portion of the front flexible substrate 31a (the region to be electrically connected to the inspection target connector 100 of the pattern portion 31a3).
  • In the z direction see FIG. 9).
  • the front side push is performed by the front side second spring 31h unless the first spring 13 contracts.
  • the block 31i and the front holding portion 31c are maintained in a separated state, and the rear push block 32i and the rear holding portion 32c are maintained in a separated state by the rear second spring 32h.
  • the rear board assembly 32 includes a rear flexible board (flexible board) 32a, a rear connector 32b, a rear holding portion 32c, a rear connector base 32d, a rear connector holding rubber 32e, and a rear connector cover 32f. It has a rear probe group 32g, a rear second spring 32h, and a rear push block (second movable member) 32i.
  • the configuration of the rear board assembly 32 is the same as that of the front board assembly 31 except that the orientation in the x direction is reversed.
  • the rear flexible substrate 32a of the rear substrate assembly 32 corresponds to the front flexible substrate 31a of the front substrate assembly 31.
  • the rear connector 32b of the rear board assembly 32 corresponds to the front connector 31b of the front board assembly 31.
  • the rear holding portion 32c of the rear board assembly 32 corresponds to the front holding portion 31c of the front board assembly 31.
  • the rear connector base 32d of the rear board assembly 32 corresponds to the front connector base 31d of the front board assembly 31.
  • the rear connector holding rubber 32e of the rear board assembly 32 corresponds to the front connector holding rubber 31e of the front board assembly 31.
  • the rear connector cover 32f of the rear board assembly 32 corresponds to the front connector cover 31f of the front board assembly 31.
  • the rear probe group 32g of the rear substrate assembly 32 corresponds to the front probe group 31g of the front substrate assembly 31.
  • the rear second spring 32h of the rear board assembly 32 corresponds to the front second spring 31h of the front board assembly 31.
  • the rear push block 32i of the rear board assembly 32 corresponds to the front push block 31i of the front board assembly 31.
  • the horizontal position adjusting portion 40 has a third spring (third elastic member) 41, a support portion (third movable member) 43, and a bracket 45 (see FIG. 1).
  • the support portion 43 is an electrode of the connector 100 to be inspected with respect to a region where the tongue piece 31a4 of the front flexible substrate 31a of the front substrate assembly 31 is located and a region where the tongue piece of the rear flexible substrate 32a of the rear substrate assembly 32 is located. It is used to absorb the deviation from the positions facing each other in the z direction.
  • the region of the front flexible substrate 31a of the front substrate assembly 31 with the tongue piece 31a4 and the region of the rear flexible substrate 32a of the rear substrate assembly 32 with the tongue piece 31a are in the z direction with the electrode of the connector 100 to be inspected. It is assumed that the position deviates from the opposite position on the xy plane. In this case, when the inspection jig 1 is attached to the connector 100 to be inspected, the connector contact portion 10, the substrate holding portion 20, and the substrate portion 30 move on the xy plane without moving the horizontal position adjusting portion 40. Can be done.
  • the support portion 43 is attached to the upper holding portion 23 by screwing from the lower side in the z direction.
  • a third spring 41 is provided between the support portion 43 and the upper holding portion 23. The third spring 41 urges the support portion 43 so as to be separated from the upper holding portion 23 in the z direction.
  • the compression of the first spring 13, the front second spring 31h, and the rear second spring 32h in the z direction is completed after the compression in the z direction is completed.
  • the spring characteristics (spring pressure, spring constant, etc.) of the first spring 13, the front second spring 31h, the rear second spring 32h, and the third spring 41 are set so as to complete. That is, the third spring 41 contracts after the first spring 13, the front second spring 31h, and the rear second spring 32h contract.
  • the first spring 13, the front second spring 31h, the rear second spring 32h, and the third spring 41 are used as follows.
  • the operation of the floating guide 11, the front push block 31i, the rear push block 32i, and the support portion 43 is controlled.
  • the second distance d2 of the front push block 31i and the front flexible board 31a is shortened, and the rear side is substantially the same timing.
  • the second distance d2 between the push block 32i and the rear flexible substrate 32a is shortened.
  • the support portion 43, the front flexible board 31a and the rear are shortened.
  • the third distance d3 of the side flexible substrate 32a becomes shorter.
  • the third distance d3 is electrically connected to the lower end portion of the support portion 43 (the region facing the upper holding portion 23 in the z direction) and the lower end portion of the front flexible substrate 31a (the inspection target connector 100 of the pattern portion 31a3). It is the distance in the z direction from the region to be formed).
  • the first spring 13, the front second spring 31h, and the rear second spring 32h remain. As long as it does not shrink, the support portion 43 and the upper holding portion 23 are maintained in a separated state by the third spring 41.
  • the spring pressure of the third spring 41 is higher than the spring pressure of the front side second spring 31h and the rear side second spring 32h, and the spring pressure of the front side second spring 31h and the rear side second spring 32h.
  • the spring characteristics of each spring are set so as to be higher than the spring pressure of the first spring 13.
  • the combined spring constant (elasticity coefficient) of the two third springs 41 is based on the combined spring constant (elasticity coefficient) of the two front side second springs 31h and the two rear side second springs 32h. Also large, the combined spring constant (elasticity coefficient) of the two front second springs 31h and the two rear side second springs 32h is larger than the combined spring constant (elasticity coefficient) of the two first springs 13. It is conceivable that the spring characteristics of each spring are set.
  • Bracket 45 The bracket 45 is attached to a device (not shown) that holds and moves the inspection jig 1 such as an inspection device and a machine tool.
  • the bracket 45 is attached to the upper side of the two support portions 43 in the z direction.
  • the bracket 45 is attached to the support portion 43 by screwing from the upper side in the z direction.
  • the first spring 13 As shown in FIGS. 9 to 10, a part of the first spring 13 is visible from the outside, and the front second spring 31h and the rear second spring 32h are almost invisible from the outside (front side in the x direction and the rear side).
  • the first spring 13, the front second spring 31h, and the rear second spring 32h are arranged so as not to be seen from the rear side in the x direction.
  • the third spring 41 is arranged so that at least a part of the third spring 41 can be seen from the outside in the extended state.
  • the conductive region such as the front flexible substrate 31a, the front probe group 31 g, the rear probe group 32 g, and the screw are made of metal.
  • the other members constituting the inspection jig 1 are made of non-conductive members such as resin.
  • the rear second spring 32h is not shown in the yz cross-sectional configuration views of FIGS. 11, 13 to 15, and 17. However, the rear second spring 32h is located on the rear side of the front second spring 31h in the x direction, and expands and contracts in the same manner as the front second spring 31h. Further, the rear push block 32i is not shown in the yz cross-sectional configuration views of FIGS. 11, 13 to 15, and 17. However, the rear push block 32i is located on the rear side of the front push block 31i in the x direction and moves in the same manner as the front push block 31i. Further, the rear probe group 32g is not shown in the yz cross-sectional configuration views of FIGS. 11, 13 to 15, and 17.
  • the posterior probe group 32g is located on the x-direction posterior side of the anterior probe group 31g and operates in the same manner as the anterior probe group 31g.
  • the tongue piece of the rear flexible substrate 32a is not shown.
  • the tongue piece of the rear flexible substrate 32a is located on the rear side of the tongue piece 31a4 of the front flexible substrate 31a in the x direction, and is displaced in the same manner as the tongue piece 31a4 of the front flexible substrate 31a.
  • the first spring 13, the front second spring 31h, the rear second spring 32h, and the third spring 41 are in an extended state. Yes, the first distance d1, the second distance d2, and the third distance d3 are not shortened (first state).
  • the tip portion P1 on the lower side in the z direction of the probe P constituting the front probe group 31g is in contact with the tongue piece 31a4 of the front flexible substrate 31a (see FIG. 12).
  • the probe P is light, the tongue piece 31a4 of the front flexible substrate 31a is hardly pushed down in the z direction.
  • the tip portion P1 on the lower side in the z direction of the probe P constituting the rear probe group 32g is in contact with the tongue piece of the rear flexible substrate 32a.
  • the probe P is light, the tongue piece of the rear flexible substrate 32a is hardly pushed downward in the z direction.
  • the first spring 13 As shown in FIG. 13, immediately after the inspection target connector 100 is fitted into the hole of the floating guide 11 of the inspection jig 1, the first spring 13, the front second spring 31h, the rear second spring 32h, and the third spring
  • the spring 41 is in an extended state, and the first distance d1, the second distance d2, and the third distance d3 are not shortened (second state).
  • the front flexible substrate 31a and the rear flexible substrate 32a are not in contact with the connector 100 to be inspected.
  • the front flexible substrate 31a and the rear flexible substrate 32a are in close proximity to the connector 100 to be inspected. Therefore, the first distance d1 in the third state is shorter than the first distance d1 in the second state.
  • the front second spring 31h, the rear second spring 32h, and the third spring 41 are hardly contracted. Therefore, the second distance d2 in the third state is hardly shorter than the second distance d2 in the second state.
  • the third distance d3 in the third state is hardly shorter than the third distance d3 in the second state.
  • the probe P of the front probe group 31g moves downward in the z direction, and the tip P1 of the probe P moves to the back side (upper side in the z direction) of the front flexible substrate 31a.
  • the tongue piece 31a4 of the front flexible substrate 31a is pushed down in the z direction (see FIG. 16). That is, the probe P of the front probe group 31 g brings the tongue piece 31a4 of the front flexible substrate 31a closer to the electrode of the connector 100 to be inspected.
  • the front flexible substrate 31a and the rear flexible substrate 32a are in a state of being electrically connected to the connector 100 to be inspected.
  • the first distance d1 in the fourth state is further shorter than the first distance d1 in the third state.
  • the front push block 31i and the rear push block 32i are pushed down to the lowermost end of the movable range in the z direction. Therefore, the second distance d2 in the fourth state is shorter than the second distance d2 in the third state.
  • the third spring 41 is hardly shrunk. Therefore, the third distance d3 in the fourth state is hardly shorter than the third distance d3 in the third state.
  • the third spring 41 contracts in the z direction, and the support portion 43 and the bracket 45 are brought closer to the upper holding portion 23. (Fifth state). At this time, the support portion 43 is in a state of being close to the upper holding portion 23. Therefore, the third distance d3 in the fifth state is shorter than the third distance d3 in the fourth state.
  • the connector 100 to be inspected is brought close to the front flexible substrate 31a and the rear flexible substrate 32a via the floating guide 11, and then the front side is used by using the front push block 31i, the rear push block 32i, the probe P, and the like.
  • the flexible substrate 31a and the rear flexible substrate 32a are connected to the connector 100 to be inspected. Therefore, the front flexible substrate 31a and the rear flexible substrate 32a included in the inspection jig 1 are electrically connected to the connector 100 to be inspected without significantly deforming or displaceting the front flexible substrate 31a and the rear flexible substrate 32a. Will be possible.
  • the inspection jig 1 can be attached to a machine tool or the like via the support portion 43, the bracket 45, or the like.
  • the connector 100 to be inspected in which the electrodes are arranged in a plurality of rows can be electrically connected to a plurality of flexible substrates (front flexible substrate 31a, rear flexible substrate 32a). Further, the inspection jig 1 can be configured in a state where the spacing between the plurality of flexible substrates (front flexible substrate 31a, rear flexible substrate 32a) is adjusted according to the spacing between the plurality of rows.
  • the tongue piece of the rear flexible substrate 32a formed in the region including the portion to which the force is applied is separated from the other region adjacent to the tongue piece of the rear flexible substrate 32a via the slit S, and the push is performed. It is displaced in the direction (lower side in the z direction). Therefore, the flexible substrate (front flexible substrate 31a, rear flexible substrate 32a) is less likely to be damaged even if it is displaced, as compared with the case where the tongue piece is not provided.
  • the flexible substrate front flexible substrate 31a, rear flexible substrate 32a
  • the flexible substrate may be composed of a plurality of flexible substrates (see FIGS. 18 to 21).
  • the front flexible substrate 31a includes a first flexible substrate 311a including a signal line for an RF line, a second flexible substrate 312a including a ground wire for a ground line, and a third flexible substrate 313a including a power line for a power supply line.
  • the first flexible substrate 311a, the second flexible substrate 312a, and the third flexible substrate 313a are configured as separate bodies.
  • Each of the first flexible substrate 311a, the second flexible substrate 312a, and the third flexible substrate 313a has a connector connection end (one end) 31a1, a holding portion connection end (the other end) 31a2, and a pattern portion 31a3.
  • a tongue piece 31a4 is formed on each of the pattern portions 31a3 of the first flexible substrate 311a, the second flexible substrate 312a, and the third flexible substrate 313a. Further, a through hole 31a5 is provided at the connector connection end 31a1 of the first flexible substrate 311a. Further, a through hole 31a5 is provided in the pattern portion 31a3 of the second flexible substrate 312a.
  • the holding portion connection end 31a2 and the front holding portion 31c are hooked as follows. As shown in FIG. 20, a plurality of upper protrusions 31c4 and a plurality of lower protrusions 31c5 are provided on the rear side of the front side holding portion 31c in the x direction. A constricted portion provided at the holding portion connecting end 31a2 is fitted into the lower protrusion 31c5. A hole provided at the tip end side of the constricted portion of the holding portion connecting end 31a2 is fitted into the upper protrusion 31c4.
  • the upper protrusion 31c4 is used for fixing the holding portion connection end 31a2 (positioning in the longitudinal direction) and positioning in the x direction at the time of the fixing.
  • the lower protrusion 31c5 is located on the lower side in the z direction with respect to the upper protrusion 31c4, and is used for positioning in the y direction at the time of the fixing. Since the lower protrusion 31c5, which is closer to the tongue piece 31a4 than the upper protrusion 31c4, is positioned in the y direction, the front flexible substrate 31a is more accurate than the form in which the position is located away from the tongue piece 31a4 in the y direction. Positioning is possible.
  • the flexible substrate is composed of a plurality of flexible substrates
  • the number of cases where a flexible substrate having a special shape is individually prepared is reduced, which can contribute to cost reduction such as manufacturing cost.
  • the flexible substrate is configured as a separate body, even if there is a wide portion in a part of one flexible substrate and physical interference occurs with another flexible substrate on the same plane, the part portion is physically. It becomes possible to shift so as not to interfere with.
  • the pattern portion 31a3 of the third flexible substrate 313a can be bent.
  • the connector connection end 31a1 of the first flexible board 311a can be configured on a different plane while avoiding physical interference with the connector connection ends 31a1 of the second flexible board 312a and the third flexible board 313a. ..
  • a flexible substrate front flexible substrate 31a, rear flexible substrate 32a
  • the flexible substrate is bent to form the two wires.
  • the angle at which the two wires intersect can be freely set in the area where the wires are connected.
  • electrical connection is made in a region where the two wires are connected and the two wires are located on substantially the same straight line. In this case, in the region where the two lines are connected, the two lines are orthogonal to each other, and the deterioration of high frequency characteristics such as the reflection action can be less likely to occur as compared with the form in which the two lines are electrically connected.
  • a line extending from the pattern portion 31a3 (a line extending from a region electrically connected to the inspection target connector 100 on the front flexible board 31a) and a connector connection end 31a1.
  • the wire of the front connector 31b to be attached (the wire of the member attached to one end of the front flexible substrate 31a) is electrically connected in a state of being located on the same straight line.
  • a line extending from the pattern portion (a line extending from the area electrically connected to the connector 100 to be inspected in the rear flexible board 32a) and after being attached to the connector connection end.
  • the wire of the side connector 32b (the wire of the member attached to one end of the rear flexible substrate 32a) is electrically connected in a state of being located on the same straight line.
  • FIG. 21 shows a connection at the connector connection end 31a1 of the front flexible board 31a for connecting the wire (signal line 311a1) of the first flexible board 311a of the front flexible board 31a to the first flexible board 31a of the front connector 31b.
  • An example is shown in which an electrical connection is made in a state where the terminals 31b1 are located substantially parallel to each other, that is, substantially on the same straight line.
  • the area of the line extending from the pattern portion 31a3 connecting to the line of the front connector 31b and the area of the line extending from the front connector 31b connecting to the line extending from the pattern portion 31a3 extend along the same direction.
  • the line extending from the pattern portion 31a3 of the first flexible substrate 311a (signal line 311a1) and the line of the front connector 31b (connection terminal 31b1) extend along a predetermined direction dr in a region where the two lines are connected. ..
  • the predetermined direction dr is parallel to the line connecting the region on the rear side in the x direction and the lower side in the z direction and the region on the front side in the x direction and the upper side in the z direction, and forms a predetermined angle with the yz plane and the xy plane.
  • the elastic member that pushes the front flexible substrate 31a from the back side (upper side in the z direction) to the lower side in the z direction and the elastic member that pushes the rear flexible substrate 32a from the back side (upper side in the z direction) to the lower side in the z direction.
  • the form using the probe P has been described. However, as long as it is a member that can expand and contract in the z direction, not only the probe P but also other elastic members may be used.
  • the probe is not limited to two rows
  • the front probe group 31 g and the rear probe group 32 g are arranged in the x direction, that is, the probe groups arranged in the y direction are arranged in two rows in the x direction.
  • the number of rows of the probe group may be one row or three or more rows depending on the arrangement of the electrodes of the connector 100 to be inspected.
  • the first spring 13 is provided between the floating guide 11 and the lower holding portion 21, and the front second spring 31h is provided between the front holding portion 31c and the front push block 31i, and the rear holding portion is provided.
  • the embodiment in which the rear second spring 32h is provided between the 32c and the rear push block 32i and the third spring 41 is provided between the upper holding portion 23 and the support portion 43 has been described. However, as long as it is a member that can expand and contract in the z direction, not only a spring but also another elastic member may be used.
  • the flexible substrate comprises one end, the other end, and at least a pattern formed between one end and the other end.
  • the pattern portion has a tongue piece formed by a notch.
  • the tongue piece is electrically connected to other members.
  • the tongue piece of the flexible substrate formed in the region including the portion where the force is applied is formed through the notch in the flexible substrate. Displace in the pressed direction away from other areas adjacent to the tongue piece. Therefore, the flexible substrate is less likely to be damaged even if a partial force is applied, as compared with the case where the tongue piece is not provided.
  • the tongue piece is provided with a plurality of portions that are electrically connected to other members.
  • the number of cuts can be reduced, so that the tongue piece can be easily formed in a narrow area or the like.
  • the tongue piece is formed at the end of the signal line.
  • the pattern portion is provided with a plurality of through holes for electrically connecting the side electrically connected to the other member and the opposite side to the side electrically connected to the other member. ..
  • Flexible substrates often have a structure in which a signal line is provided on one side and a ground line is provided on the other side.
  • a plurality of through holes are provided in the pattern portion, even if another member is electrically connected only to one surface side (the side electrically connected to the other member) of the pattern portion, the other surface of the pattern portion is provided.
  • the side (the side opposite to the side electrically connected to the other member) and the other member can be electrically connected.
  • the wire extending from the pattern portion and the wire of the member attached to the one end are electrically connected in a state of being located on the same straight line.
  • (Aspect 6) More preferably, it includes the flexible substrate according to any one of aspects 1 to 4, and an elastic member.
  • the tongue piece is electrically connected to the other member by pushing the back side of the area where the telescopic member includes a portion that is electrically connected to the other member.
  • the inspection jig includes a first movable member. Other members are brought closer to the flexible substrate via the first movable member. The tongue piece is brought closer to the other member by the telescopic member.
  • the other member is brought close to the flexible substrate via the first movable member, and the tongue piece of the flexible substrate is connected to the other member by using an elastic member such as a probe. Therefore, it is possible to electrically connect the flexible substrate included in the inspection jig to other members without moving the flexible substrate significantly, that is, in a state where the flexible substrate is not easily damaged. ..

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Leads Or Probes (AREA)
  • Printing Elements For Providing Electric Connections Between Printed Circuits (AREA)
  • Details Of Connecting Devices For Male And Female Coupling (AREA)
  • Coupling Device And Connection With Printed Circuit (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
PCT/JP2021/038915 2020-10-27 2021-10-21 可撓性基板、検査治具 Ceased WO2022091930A1 (ja)

Priority Applications (5)

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CN202180072984.2A CN116458270A (zh) 2020-10-27 2021-10-21 挠性基板、检查治具
US18/034,082 US20230397329A1 (en) 2020-10-27 2021-10-21 Flexible substrate and inspection jig
EP21886049.2A EP4240119A4 (en) 2020-10-27 2021-10-21 FLEXIBLE SUBSTRATE AND INSPECTION TOOL
JP2022559070A JP7528246B2 (ja) 2020-10-27 2021-10-21 可撓性基板、検査治具
KR1020237014007A KR20230093435A (ko) 2020-10-27 2021-10-21 가요성 기판, 검사 지그

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JP2025521709A (ja) 2022-07-27 2025-07-10 エルジー エナジー ソリューション リミテッド 二次電池の製造方法、製造装置及びそれにより製造された二次電池

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JP2000214184A (ja) * 1999-01-26 2000-08-04 Micronics Japan Co Ltd プロ―ブ装置
JP2020092277A (ja) 2014-06-30 2020-06-11 パナソニックＩｐマネジメント株式会社 フレキシブル基板

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JPH10104271A (ja) * 1996-09-30 1998-04-24 Fujikura Ltd コンタクトプローブ及びその製造方法
KR100379817B1 (ko) * 1997-07-16 2003-08-06 데이꼬꾸 쓰신 고교 가부시키가이샤 가요성기판상에전자부품을장착하기위한구조
JP2000131342A (ja) * 1998-10-20 2000-05-12 Fujitsu Ltd 電子部品用コンタクタ
JP2001208774A (ja) * 2000-01-26 2001-08-03 Toko Inc 電子部品の特性測定用治具の接触子
KR101077277B1 (ko) * 2009-11-04 2011-10-27 (주)이노웍스 디스플레이 패널의 점등 검사용으로 사용되는 프로브 장치
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JP2020191170A (ja) * 2019-05-20 2020-11-26 日本航空電子工業株式会社 コネクタ検査装置、コネクタモジュール

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JP2000214184A (ja) * 1999-01-26 2000-08-04 Micronics Japan Co Ltd プロ―ブ装置
JP2020092277A (ja) 2014-06-30 2020-06-11 パナソニックＩｐマネジメント株式会社 フレキシブル基板

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TW202218491A (zh) 2022-05-01
JPWO2022091930A1 (https=) 2022-05-05
US20230397329A1 (en) 2023-12-07
EP4240119A4 (en) 2024-10-09
KR20230093435A (ko) 2023-06-27
EP4240119A1 (en) 2023-09-06
JP7528246B2 (ja) 2024-08-05

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