EP4240119A4 - FLEXIBLE SUBSTRATE AND INSPECTION TOOL - Google Patents

FLEXIBLE SUBSTRATE AND INSPECTION TOOL Download PDF

Info

Publication number
EP4240119A4
EP4240119A4 EP21886049.2A EP21886049A EP4240119A4 EP 4240119 A4 EP4240119 A4 EP 4240119A4 EP 21886049 A EP21886049 A EP 21886049A EP 4240119 A4 EP4240119 A4 EP 4240119A4
Authority
EP
European Patent Office
Prior art keywords
flexible substrate
inspection tool
inspection
tool
flexible
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
EP21886049.2A
Other languages
German (de)
English (en)
French (fr)
Other versions
EP4240119A1 (en
Inventor
Hisashi Suzuki
Chikara Miura
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Yokowo Co Ltd
Original Assignee
Yokowo Co Ltd
Yokowo Mfg Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Yokowo Co Ltd, Yokowo Mfg Co Ltd filed Critical Yokowo Co Ltd
Publication of EP4240119A1 publication Critical patent/EP4240119A1/en
Publication of EP4240119A4 publication Critical patent/EP4240119A4/en
Pending legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00—Printed circuits
    • H05K1/02—Details
    • H05K1/0277—Bendability or stretchability details
    • H05K1/0283—Stretchable printed circuits
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0416—Connectors, terminals
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • G01R31/66—Testing of connections, e.g. of plugs or non-disconnectable joints
    • G01R31/68—Testing of releasable connections, e.g. of terminals mounted on a printed circuit board
    • G01R31/69—Testing of releasable connections, e.g. of terminals mounted on a printed circuit board of terminals at the end of a cable or a wire harness; of plugs; of sockets, e.g. wall sockets or power sockets in appliances
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00—Printed circuits
    • H05K1/02—Details
    • H05K1/11—Printed elements for providing electric connections to or between printed circuits
    • H05K1/118—Printed elements for providing electric connections to or between printed circuits specially for flexible printed circuits, e.g. using folded portions
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
    • H05K2201/05—Flexible printed circuits [FPCs]
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
    • H05K2201/05—Flexible printed circuits [FPCs]
    • H05K2201/056—Folded around rigid support or component
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
    • H05K2201/09—Shape and layout
    • H05K2201/09009—Substrate related
    • H05K2201/09081—Tongue or tail integrated in planar structure, e.g. obtained by cutting from the planar structure

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Leads Or Probes (AREA)
  • Printing Elements For Providing Electric Connections Between Printed Circuits (AREA)
  • Details Of Connecting Devices For Male And Female Coupling (AREA)
  • Coupling Device And Connection With Printed Circuit (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
EP21886049.2A 2020-10-27 2021-10-21 FLEXIBLE SUBSTRATE AND INSPECTION TOOL Pending EP4240119A4 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2020179352 2020-10-27
PCT/JP2021/038915 WO2022091930A1 (ja) 2020-10-27 2021-10-21 可撓性基板、検査治具

Publications (2)

Publication Number Publication Date
EP4240119A1 EP4240119A1 (en) 2023-09-06
EP4240119A4 true EP4240119A4 (en) 2024-10-09

Family

ID=81382336

Family Applications (1)

Application Number Title Priority Date Filing Date
EP21886049.2A Pending EP4240119A4 (en) 2020-10-27 2021-10-21 FLEXIBLE SUBSTRATE AND INSPECTION TOOL

Country Status (7)

Country Link
US (1) US20230397329A1 (https=)
EP (1) EP4240119A4 (https=)
JP (1) JP7528246B2 (https=)
KR (1) KR20230093435A (https=)
CN (1) CN116458270A (https=)
TW (1) TW202218491A (https=)
WO (1) WO2022091930A1 (https=)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2025521709A (ja) 2022-07-27 2025-07-10 エルジー エナジー ソリューション リミテッド 二次電池の製造方法、製造装置及びそれにより製造された二次電池

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0360141A (ja) * 1989-07-28 1991-03-15 Tokyo Electron Ltd プローブ測定方法
JP2000131342A (ja) * 1998-10-20 2000-05-12 Fujitsu Ltd 電子部品用コンタクタ
JP2000214184A (ja) * 1999-01-26 2000-08-04 Micronics Japan Co Ltd プロ―ブ装置
US20150192609A1 (en) * 2014-01-09 2015-07-09 Taiwan Semiconductor Manufacturing Co., Ltd. Membrane Probe Card

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH06230032A (ja) * 1993-02-04 1994-08-19 Toho Denshi Kk プローブ基板
JPH10104271A (ja) * 1996-09-30 1998-04-24 Fujikura Ltd コンタクトプローブ及びその製造方法
KR100379817B1 (ko) * 1997-07-16 2003-08-06 데이꼬꾸 쓰신 고교 가부시키가이샤 가요성기판상에전자부품을장착하기위한구조
JP2001208774A (ja) * 2000-01-26 2001-08-03 Toko Inc 電子部品の特性測定用治具の接触子
KR101077277B1 (ko) * 2009-11-04 2011-10-27 (주)이노웍스 디스플레이 패널의 점등 검사용으로 사용되는 프로브 장치
US10764999B2 (en) * 2014-06-30 2020-09-01 Panasonic Intellectual Property Management Co., Ltd. Flexible substrate
JP2020191170A (ja) * 2019-05-20 2020-11-26 日本航空電子工業株式会社 コネクタ検査装置、コネクタモジュール

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0360141A (ja) * 1989-07-28 1991-03-15 Tokyo Electron Ltd プローブ測定方法
JP2000131342A (ja) * 1998-10-20 2000-05-12 Fujitsu Ltd 電子部品用コンタクタ
JP2000214184A (ja) * 1999-01-26 2000-08-04 Micronics Japan Co Ltd プロ―ブ装置
US20150192609A1 (en) * 2014-01-09 2015-07-09 Taiwan Semiconductor Manufacturing Co., Ltd. Membrane Probe Card

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
See also references of WO2022091930A1 *

Also Published As

Publication number Publication date
CN116458270A (zh) 2023-07-18
TW202218491A (zh) 2022-05-01
JPWO2022091930A1 (https=) 2022-05-05
US20230397329A1 (en) 2023-12-07
KR20230093435A (ko) 2023-06-27
EP4240119A1 (en) 2023-09-06
JP7528246B2 (ja) 2024-08-05
WO2022091930A1 (ja) 2022-05-05

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