WO2021261486A1 - はんだ合金、ソルダペースト、はんだボール、ソルダプリフォーム、はんだ継手、車載電子回路、ecu電子回路、車載電子回路装置、及びecu電子回路装置 - Google Patents
はんだ合金、ソルダペースト、はんだボール、ソルダプリフォーム、はんだ継手、車載電子回路、ecu電子回路、車載電子回路装置、及びecu電子回路装置 Download PDFInfo
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- WO2021261486A1 WO2021261486A1 PCT/JP2021/023598 JP2021023598W WO2021261486A1 WO 2021261486 A1 WO2021261486 A1 WO 2021261486A1 JP 2021023598 W JP2021023598 W JP 2021023598W WO 2021261486 A1 WO2021261486 A1 WO 2021261486A1
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K35/00—Rods, electrodes, materials, or media, for use in soldering, welding, or cutting
- B23K35/22—Rods, electrodes, materials, or media, for use in soldering, welding, or cutting characterised by the composition or nature of the material
- B23K35/24—Selection of soldering or welding materials proper
- B23K35/26—Selection of soldering or welding materials proper with the principal constituent melting at less than 400 degrees C
- B23K35/262—Sn as the principal constituent
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K1/00—Soldering, e.g. brazing, or unsoldering
- B23K1/0008—Soldering, e.g. brazing, or unsoldering specially adapted for particular articles or work
- B23K1/0016—Brazing of electronic components
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K35/00—Rods, electrodes, materials, or media, for use in soldering, welding, or cutting
- B23K35/02—Rods, electrodes, materials, or media, for use in soldering, welding, or cutting characterised by mechanical features, e.g. shape
- B23K35/0222—Rods, electrodes, materials, or media, for use in soldering, welding, or cutting characterised by mechanical features, e.g. shape for use in soldering, brazing
- B23K35/0244—Powders, particles or spheres; Preforms made therefrom
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K35/00—Rods, electrodes, materials, or media, for use in soldering, welding, or cutting
- B23K35/02—Rods, electrodes, materials, or media, for use in soldering, welding, or cutting characterised by mechanical features, e.g. shape
- B23K35/0222—Rods, electrodes, materials, or media, for use in soldering, welding, or cutting characterised by mechanical features, e.g. shape for use in soldering, brazing
- B23K35/0244—Powders, particles or spheres; Preforms made therefrom
- B23K35/025—Pastes, creams, slurries
-
- C—CHEMISTRY; METALLURGY
- C22—METALLURGY; FERROUS OR NON-FERROUS ALLOYS; TREATMENT OF ALLOYS OR NON-FERROUS METALS
- C22C—ALLOYS
- C22C13/00—Alloys based on tin
-
- C—CHEMISTRY; METALLURGY
- C22—METALLURGY; FERROUS OR NON-FERROUS ALLOYS; TREATMENT OF ALLOYS OR NON-FERROUS METALS
- C22C—ALLOYS
- C22C13/00—Alloys based on tin
- C22C13/02—Alloys based on tin with antimony or bismuth as the next major constituent
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K2101/00—Articles made by soldering, welding or cutting
- B23K2101/36—Electric or electronic devices
Definitions
- the present invention relates to solder alloys, solder pastes, solder balls, solder preforms, solder joints, in-vehicle electronic circuits, ECU electronic circuits, in-vehicle electronic circuit devices, and ECU electronic circuit devices.
- the automobile is equipped with an electronic circuit (hereinafter referred to as an in-vehicle electronic circuit) in which electronic components are soldered to a printed circuit board.
- In-vehicle electronic circuits are used in devices that electrically control engines, power steering, brakes, etc., and are extremely important safety components for driving automobiles.
- an in-vehicle electronic circuit called an ECU (Engine Control Unit) which is an electronic circuit that controls a vehicle with a computer in order to improve fuel efficiency, must be able to operate in a stable state without failure for a long period of time.
- ECU Engine Control Unit
- the vicinity of the engine where such an in-vehicle electronic circuit is installed becomes extremely hot when the engine rotates.
- the engine stops rotating it is exposed to the outside air temperature, for example, in cold regions such as North America and Siberia, in the winter below freezing. Therefore, since the in-vehicle electronic circuit is expected to repeatedly run and stop the engine, it must cope with severe temperature changes.
- solder joint When an in-vehicle electronic circuit is placed in such an environment where the temperature changes significantly for a long period of time, the electronic component and the printed circuit board cause thermal expansion and contraction, respectively.
- the difference between the linear thermal expansion coefficient of the electronic component and the linear thermal expansion coefficient of the printed circuit board is large, a certain thermal displacement during use in the above environment causes the soldered portion that joins the electronic component and the printed circuit board. (Hereinafter referred to as "solder joint"), stress is repeatedly applied due to temperature changes. Then, stress is applied to the solder joint, and finally the joint interface of the solder joint is broken.
- Patent Document 1 describes Ag: 1 to 4% by mass, Cu: 0.6 to 0.8% by mass, Sb: 1 to 5% by mass, Ni: 0. A lead-free solder alloy or the like consisting of 0.01 to 0.2% by mass and the balance Sn is disclosed.
- the present invention can prevent adverse effects on acoustic quality by suppressing the release of compounds into the alloy when the joint is remelted or when a high temperature load is applied, while achieving higher heat cycle characteristics than before. Provide alloys and the like.
- the solder alloy of the present invention is Ag: 3.1 to 4.0% by mass, Cu: 0.6 to 0.8% by mass, Bi: 1.5 to 5.5% by mass, Sb: 1.0 to 6.0% by mass, Co: It may consist of 0.001 to 0.030% by mass, Fe: 0.02 to 0.05% by mass, and the balance Sn.
- solder alloy of the present invention is Further, As may be contained in an amount of 0.002 to 0.250% by mass.
- the sum of the mass% value of Fe and the value three times the mass% of Co may be 0.03 to 0.10.
- the solder alloy of the present invention is Further, Zr may be contained in an amount of 0.004 to 0.250% by mass.
- solder paste having a solder powder made of any of the above solder alloys and a flux.
- solder ball and a solder preform made of any of the above solder alloys are provided.
- solder joint having any of the above solder alloys, an in-vehicle electronic circuit, and an ECU electronic circuit are provided.
- an in-vehicle electronic circuit device including the above-mentioned in-vehicle electronic circuit is provided.
- an ECU electronic circuit device including the above ECU electronic circuit is provided.
- solder alloy containing As in an amount of 0.004 to 0.250% by mass, it is possible to obtain a solder alloy or the like in which the generation of voids is suppressed and the acoustic quality is improved.
- FIG. 1 is an image showing the result of cross-sectional observation in Example 1.
- FIG. 2 is an image showing the result of cross-sectional observation in Comparative Example 12.
- FIG. 3 is an image showing the observation results of the heated X-ray apparatus in Example 14.
- FIG. 4 is an image showing the observation results of the heated X-ray apparatus in Example 1.
- FIG. 5 is a schematic diagram showing a method of calculating the crack rate.
- FIG. 6 is a conceptual diagram for explaining “spalling” that may occur in a solder alloy containing Ni.
- solder alloy of this embodiment is typically a lead-free solder alloy.
- solder alloy of the present embodiment will be described.
- Ag 3.1 to 4.0% by mass Ag can improve the wettability of the solder alloy and the heat cycle characteristics by precipitating a network-like compound of Ag 3 Sn intermetallic compounds in the solder matrix.
- the "heat cycle characteristic" in the present embodiment means the characteristic in TCT (Thermal Cycling Test).
- the Ag content exceeds 4% by mass, there may be a problem that the liquidus temperature of the solder alloy becomes high. When the liquidus temperature rises in this way, resolidification of Sb does not occur, which may cause a problem of impairing the effect of miniaturization of SnSb.
- the Ag content is 3% by mass or less, the dispersion phenomenon of the Ag 3 Sn compound in the alloy does not occur, and there may be a problem that the network inhibits the movement of molecules (sound conduction).
- the crystal is slightly hypereutectic, and the amount is such that Ag 3 Sn is generated but no network is formed.
- the lower limit of the Ag content is preferably 3.3% by mass.
- the upper limit of the Ag content is preferably 3.5% by mass.
- Cu 0.6 to 0.8% by mass Cu can prevent Cu from being eaten by Cu lands and can lower the melting point of the solder alloy.
- the Cu content exceeds 0.8% by mass, there may be a problem that the liquidus temperature of the solder alloy becomes high.
- the Cu content is less than 0.6% by mass, the formation of the alloy layer proceeds (the inclusion of Cu in the solder suppresses the diffusion of Cu and Ni in the electrode), resulting in deterioration of the structure. The problem of doing so can occur.
- the lower limit of the Cu content is preferably 0.65% by mass.
- the upper limit of the Cu content is preferably 0.75% by mass.
- Bi can further improve the heat cycle characteristics.
- Sb not only precipitates the intermetallic compound of SnSb to form a precipitation-dispersion-enhanced alloy, but also enters the Sn crystal lattice and distorts the Sn crystal lattice by substituting with Sn to improve the heat cycle characteristics. It also has the effect of improving.
- the solder alloy contains Bi
- Bi which has a larger atomic weight than Sb and has a large effect of distorting the crystal lattice, is replaced with Sb, so that the heat cycle characteristics can be further improved.
- Bi does not interfere with the formation of fine SnSb compounds, and a precipitation-dispersion-reinforced solder alloy is maintained.
- the lower limit of the Bi content is preferably 2.0% by mass, more preferably 2.8% by mass.
- the upper limit of the Bi content is preferably 5.2% by mass.
- the lower limit of the Sb content is preferably 2.0% by mass, more preferably 2.8%.
- the upper limit of the Sb content is preferably 5.2% by mass. When the Sb content exceeds 4.0% by mass, it is even more preferable in that high heat cycle resistance can be realized.
- Co 0.001 to 0.030% by mass
- Sn crystal grains are refined and heat cycle characteristics are improved.
- Co is contained in an amount of more than 0.030% by mass, the amount of the compound becomes too large, a coarser compound is produced, and there may be a problem that the structure is deteriorated.
- Co is contained in an amount of less than 0.001% by mass, there may be a problem that a sufficient effect of improving the heat cycle characteristics is not exhibited.
- the lower limit of the Co content is preferably 0.004% by mass, more preferably 0.006% by mass.
- the upper limit of the Co content is preferably 0.020% by mass, more preferably 0.010% by mass.
- Fe 0.02 to 0.05% by mass
- the lower limit of the Fe content is preferably 0.023% by mass.
- the upper limit of the Fe content is preferably 0.040% by mass, more preferably 0.030% by mass.
- FIG. 6 is a diagram showing a mode in which "freedom" occurs when Ni is contained, and shows a mode in which the alloy layer is liberated as it is and a mode in which the alloy layer is dispersed and liberated.
- the Cu land 20 is provided on the substrate 30, and the solder alloy 10 is provided on the Cu land 20.
- the thickening suppressing effect can be obtained. It is beneficial that the lower limit of the As content contained is 0.002% by mass so that the effect of containing As can be sufficiently exerted. On the other hand, if As exceeds 0.250% by mass, the wettability may be inferior. Therefore, it is beneficial to set the upper limit of the As content to 0.250% by mass. Further, by containing 0.002 to 0.250% by mass of As, the generation of voids can be suppressed and the heat cycle characteristics can be prevented from deteriorating. By suppressing the generation of voids in this way, it is possible to suppress factors that hinder the flow of electrons and prevent deterioration of acoustic quality.
- Sn The rest of the solder alloy according to the present invention is Sn.
- unavoidable impurities may be contained in addition to the elements listed in ".". Moreover, even if it contains unavoidable impurities, it does not affect the above-mentioned effects.
- solder paste contains flux and solder powder.
- Flux components The fluxes used in solder pastes are organic acids, amines, amine halide hydrohydrates, organic halogen compounds, thiox agents, rosins, solvents, surfactants, polymer compounds, and silane coupling agents. , Any of the colorants, or a combination of two or more.
- Organic acids include succinic acid, glutaric acid, adipic acid, pimelli acid, suberic acid, azelaic acid, sebasic acid, dimer acid, propionic acid, 2,2-bishydroxymethylpropionic acid, tartrate acid, malic acid, glycolic acid, Examples thereof include diglycolic acid, thioglycolic acid, dithioglycolic acid, stearic acid, 12-hydroxystearic acid, palmitic acid, oleic acid and the like.
- amines examples include ethylamine, triethylamine, ethylenediamine, triethylenetetramine, 2-methylimidazole, 2-undecylimidazole, 2-heptadecylimidazole, 1,2-dimethylimidazole, 2-ethyl-4-methylimidazole and 2-phenyl.
- Amine halides are compounds obtained by reacting amines with hydrogen halides, and examples of amines include ethylamine, ethylenediamine, triethylamine, diphenylguanidine, ditrilguanidine, methylimidazole, 2-ethyl-4-methylimidazole and the like.
- Examples of the hydrogen halide include hydrides of chlorine, bromine, and iodine.
- the amine hydrohalide include an amine boron trifluoride complex salt and an amine tetrafluoroborate.
- amine trichloride boron complex salt examples include, for example, piperidine trifluorinated boron complex salt
- specific examples of the amine tetrafluoroborate include cyclohexylamine tetrafluoroborate and dicyclohexylamine tetrafluoroborate. ..
- organic halogen compound examples include trans-2,3-dibromo-2-butene-1,4-diol, triallyl isocyanurate 6 bromide, 1-bromo-2-butanol, 1-bromo-2-propanol and 3-bromo.
- thixotropic agent examples include wax-based thixotropic agents, amide-based thixotropic agents, sorbitol-based thixotropic agents, and the like.
- wax-based thixotropic agent examples include castor oil and the like.
- amide-based thixo agent examples include monoamide-based thixo agent, bisamide-based thixo agent, and polyamide-based thixo agent.
- Examples of the sorbitol-based thixotropy include dibenzylidene-D-sorbitol and bis (4-methylbenzylidene) -D-sorbitol.
- surfactant examples include nonionic surfactants and weak cationic surfactants.
- Nonionic surfactants include polyoxyalkylene glycols, polyoxyalkylene alkyl ethers, polyoxyalkylene esters, polyoxyalkylene acetylene glycols, polyoxyalkylene alkyl amides, such as polyethylene glycol and polyethylene glycol-polypropylene glycol. Examples thereof include copolymers, aliphatic alcohol polyoxyethylene adducts, aromatic alcohol polyoxyethylene adducts, polyhydric alcohol polyoxyethylene adducts, and polyoxyalkylene glyceryl ethers.
- Examples of the weak cationic surfactant include aliphatic amine polyoxyalkylene adducts, aromatic amine polyoxyalkylene adducts, terminal diamine polyalkylene glycols, for example, aliphatic amine polyoxyethylene adducts and aromatic amine polys. Examples thereof include oxyethylene adducts, polyvalent amine polyoxyethylene adducts, terminal diamine polyethylene glycols, terminal diamine polyethylene glycols and polypropylene glycol copolymers.
- the rosin examples include raw material rosins such as gum rosin, wood rosin and tall oil rosin, and derivatives obtained from the raw material rosin.
- the derivative examples include purified rosin, hydrogenated rosin, disproportionated rosin, polymerized rosin and ⁇ , ⁇ -unsaturated carboxylic acid modified products (acrylicated rosin, maleated rosin, fumarated rosin, etc.), and the polymerized rosin.
- Examples thereof include purified products, hydrogenated products and non-uniformized products of the above, and purified products of the ⁇ and ⁇ unsaturated carboxylic acid modified products, hydrogenated products and non-uniformized products, and two or more of them can be used.
- At least one resin selected from terpene resin, modified terpene resin, terpene phenol resin, modified terpene phenol resin, styrene resin, modified styrene resin, xylene resin, and modified xylene resin is further added.
- As the modified terpene resin an aromatic modified terpene resin, a hydrogenated terpene resin, a hydrogenated aromatic modified terpene resin and the like can be used.
- As the modified terpene phenol resin, hydrogenated terpene phenol resin or the like can be used.
- modified styrene resin styrene acrylic resin, styrene maleic acid resin and the like can be used.
- modified xylene resin examples include a phenol-modified xylene resin, an alkylphenol-modified xylene resin, a phenol-modified resol-type xylene resin, a polyol-modified xylene resin, and a polyoxyethylene-added xylene resin.
- the solvent examples include water, alcohol-based solvent, glycol ether-based solvent, terpineols and the like.
- alcohol solvents isopropyl alcohol, 1,2-butanediol, isobornylcyclohexanol, 2,4-diethyl-1,5-pentanediol, 2,2-dimethyl-1,3-propanediol, 2,5 -Dimethyl-2,5-hexanediol, 2,5-dimethyl-3-hexin-2,5-diol, 2,3-dimethyl-2,3-butanediol, 1,1,1-tris (hydroxymethyl) Ether, 2-ethyl-2-hydroxymethyl-1,3-propanediol, 2,2'-oxybis (methylene) bis (2-ethyl-1,3-propanediol), 2,2-bis (hydroxymethyl) -1,3-Propanediol, 1,2,6-trihydroxyhexane,
- glycol ether-based solvent examples include diethylene glycol mono-2-ethylhexyl ether, ethylene glycol monophenyl ether, 2-methylpentane-2,4-diol, diethylene glycol monohexyl ether, diethylene glycol dibutyl ether, and triethylene glycol monobutyl ether. ..
- the flux content is preferably 5 to 95% by mass, more preferably 5 to 15% by mass, based on the total mass of the solder paste. Within this range, the effect of suppressing thickening due to the solder powder is sufficiently exhibited.
- solder powder used in the solder paste according to the present invention is preferably a spherical powder.
- the spherical powder improves the fluidity of the solder alloy.
- the solder alloy is a spherical powder
- it has a size (particle size distribution) corresponding to symbols 1 to 8 in the powder size classification (Table 2) in JIS Z 2884-1: 2014, it is a fine component.
- the size of the particulate solder material is more preferably the size corresponding to the symbols 4 to 8, and more preferably the size corresponding to the symbols 5 to 8.
- solder paste according to the present invention is manufactured by a method common in the art.
- known methods such as a dropping method in which molten solder material is dropped to obtain particles, a spraying method in which centrifugal spraying is performed, and a method in which bulk solder material is crushed can be adopted.
- the dropping method and the spraying method the dropping and spraying are preferably carried out in an inert atmosphere or a solvent in order to form particles.
- each of the above components can be heated and mixed to prepare a flux, and the solder powder can be introduced into the flux, stirred and mixed for production.
- solder alloy according to the present invention can be used as a solder ball.
- the solder alloy according to the present invention can be used to produce a solder ball by using a dropping method which is a general method in the art.
- a solder joint can be manufactured by processing a solder ball by a method common in the art, such as mounting one solder ball on one electrode coated with flux and joining the solder balls.
- the particle size of the solder balls is preferably 1 ⁇ m or more, more preferably 10 ⁇ m or more, still more preferably 20 ⁇ m or more, and particularly preferably 30 ⁇ m or more.
- the upper limit of the particle size of the solder ball is preferably 3000 ⁇ m or less, more preferably 1000 ⁇ m or less, still more preferably 800 ⁇ m or less, and particularly preferably 600 ⁇ m or less.
- solder preform The solder alloy according to the present invention can be used as a preform.
- the shape of the preform include washers, rings, pellets, discs, ribbons, wires and the like.
- solder joint The solder alloy according to the present invention can form a solder joint by joining an electrode of a PKG (Package) such as an IC chip and an electrode of a substrate such as a PCB (printed circuit board).
- the solder joint according to the present invention is composed of an electrode and a solder joint.
- the solder joint portion refers to a portion mainly formed of a solder alloy.
- the solder alloy according to the present invention has excellent heat cycle properties and cracks in the solder alloy. Occurrence and propagation are suppressed. For this reason, crack growth and growth are not promoted even when used for automobiles, that is, for automobiles, which are constantly subjected to vibration. Therefore, it can be seen that the solder alloy according to the present invention is particularly suitable for soldering electronic circuits mounted on automobiles because it has such particularly remarkable characteristics.
- the crack generation rate after 3000 cycles is 90. It is less than%, and also means that the residual share strength after 3000 cycles is 60% or more.
- the solder alloy according to the present invention has an excellent residual share strength after the heat cycle has elapsed. That is, even if it is used for a long period of time, the resistance to external force such as shear strength does not decrease against external force applied from the outside such as collision and vibration.
- the solder alloy according to the present invention is more specifically used for soldering an in-vehicle electronic circuit or for soldering an ECU electronic circuit, and exhibits excellent heat cycle properties.
- An "electronic circuit” is a system that exerts the desired function as a whole by combining electronic engineering of multiple electronic components, each of which has a function.
- Examples of electronic components constituting such an electronic circuit include chip resistance components, multiple resistance components, QFPs, QFNs, power transistors, diodes, capacitors, and the like.
- An electronic circuit incorporating these electronic components is provided on a substrate and constitutes an electronic circuit device.
- the substrate constituting such an electronic circuit device for example, a printed wiring board is not particularly limited. Further, the material thereof is not particularly limited, and a heat-resistant plastic substrate (eg, FR-4 having a high Tg and a low CTE) is exemplified.
- the printed wiring board is preferably a printed circuit board in which the surface of Cu land is treated with an organic substance (OSP: Organic Surface Protection) such as amine or imidazole.
- OSP Organic Surface Protection
- solder alloy can be produced by melting and mixing the raw metal.
- the solder alloy according to the present invention can be produced as a low ⁇ -ray alloy by using a low ⁇ -ray wire as a raw material thereof.
- a low ⁇ -ray alloy is used for forming solder bumps around a memory, it is possible to suppress soft errors.
- the powders of each solder alloy shown in Tables 1 and 2 described later were prepared by the atomizing method.
- the powder of the alloy was mixed with a flux containing pine fat, a solvent, a rosin agent, an organic acid and the like (“GLV” manufactured by Senju Metal Industry Co., Ltd.) to form a paste, and a solder paste was prepared.
- the solder paste is pasted and printed on a Cu land (a Ni layer and an Au layer are laminated in this order on the Cu surface) of a 6-layer printed circuit board (FR-4, Cu-OSP) with a 150 ⁇ m metal mask.
- a 3216 chip resistor was mounted on the mounter. After that, a step (reflow) of melting and solidifying at a maximum temperature of 245 ° C. and a holding time of 40 seconds was repeated 5 times to prepare a test substrate.
- the substrate was cut out, polished, and the cross section was observed. At this time, the bonding interface of the fillet portion was magnified 3000 times and observed.
- FIGS. 1 and 2 are images of Comparative Example 12, and the CuSnNi-based compound ratio was 8.7% in the corresponding region.
- the solder paste was prepared by the same method as described in "1 Acoustic quality" above.
- the solder paste was paste-printed on a 6-layer printed circuit board (FR-4, Cu-OSP) with a metal mask of 150 ⁇ m, and then a chip resistor of 3216 was mounted by a mounter. After that, reflow was performed at a maximum temperature of 245 ° C. and a holding time of 40 seconds, and soldering was performed to prepare a test substrate.
- test substrate soldered with each solder alloy is placed in a heat cycle tester set under the conditions of low temperature -55 ° C, high temperature + 150 ° C, and holding time of 15 minutes, and after 3000 cycles, it is taken out from the heat cycle tester under each condition and 3000 times.
- the crack rate was measured by observing the state of the cracks and assuming the total length of the cracks.
- Crack rate (%) (total crack length) x 100 / (estimated line crack overall length)
- the "expected line crack total length” means the crack length of complete breakage.
- the crack ratio is a ratio obtained by dividing the total length of the plurality of cracks L2 shown in FIG. 5 by the length of the expected crack growth path L1. Five samples were prepared for each of the examples and comparative examples, and the average value of the crack rate was calculated. When the average value of the crack rate is less than 90%, the crack reliability is judged to be "good", and when the average value of the crack rate is 90% or more, the crack reliability is not determined and it is judged to be "bad”. ..
- FIG. 5 shows an embodiment in which a Cu land 20 is provided on a substrate 30 and an electronic component 40 is provided on the Cu land 20 via a solder alloy 10. Further, reference numeral 15 in FIG. 5 indicates an intermetallic compound layer.
- the average value of the crack rate is 90% or more and the residual share strength is less than 60%, it is indicated as “x” in Tables 1 and 2 below, and the average value of the crack rate is less than 90%.
- the share strength residual ratio is 60% or more, it is indicated as “ ⁇ ” in Tables 1 and 2 below.
- the average value of the crack rate is less than 90% but the share strength residual rate is less than 60%, it is indicated as “ ⁇ ” in Tables 1 and 2 below.
- the share strength residual ratio is 60% or more. I was able to confirm.
- Voids not only reduce heat cycle characteristics, but also physically impede the flow of electrons, which adversely affects acoustic quality. By adding a small amount of As, the change over time of the solder material can be suppressed, and thickening after continuous squeezing can be prevented. It was confirmed that preventing thickening in this way leads to suppression of voids.
- the solder paste was prepared by the same method as described in "1 Acoustic quality" above. After the solder paste is paste-printed on a single-sided printed circuit board (FR-4, Cu-OSP) having a thickness of 1.6 mm with a metal mask of 150 ⁇ m, the electrode part plated with Sn consists of 5 mm ⁇ 5 mm, and the whole is formed. Mounted a QFN consisting of 8 mm ⁇ 8 mm in a plan view with a mounter. After that, reflow was performed at a maximum temperature of 245 ° C. and a holding time of 40 seconds, and soldering was performed to prepare a test substrate.
- the void ratio was measured using a heated X-ray device (TUX-3200).
- Void rate (%) (void area) x 100 / (total area) (5 mm x 5 mm in this embodiment)
- Five samples were prepared for each of Examples 1 and 14, and the average value of the void rate was calculated.
- the average value of the void rate is 5% or less, it is judged that the void rate is low, and it is indicated by " ⁇ " in Table 1.
- the average value of the void rate exceeds 5%, it is judged that the void rate is not low, and it is indicated by " ⁇ ” in Table 1.
- FIG. 3 is an image of Example 14, but the void ratio is low.
- FIG. 4 is an image of Example 1, but the void ratio is higher than that of Example 14.
- the dotted lines in FIGS. 3 and 4 show the outer shape of the QFN made of 8 mm ⁇ 8 mm, and the image shown in black corresponds to the electrode portion made of 5 mm ⁇ 5 mm.
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Abstract
Description
Ag:3.1~4.0質量%、Cu:0.6~0.8質量%、Bi:1.5~5.5質量%、Sb:1.0~6.0質量%、Co:0.001~0.030質量%、Fe:0.02~0.05質量%、残部Snからなってもよい。
さらにAsを0.002~0.250質量%含有してもよい。
Feの質量%の値とCoの質量%の3倍の値との和が0.03~0.10となってもよい。
さらにZrを0.004~0.250質量%含有してもよい。
本実施の形態のはんだ合金は典型的には鉛フリーはんだ合金である。以下、本実施の形態のはんだ合金に含まれる元素について説明する。
Agは、はんだ合金のぬれ性向上効果とはんだマトリックス中にAg3Snの金属間化合物のネットワーク状の化合物を析出させて、ヒートサイクル特性の向上を図ることができる。なお、本実施の形態における「ヒートサイクル特性」とはTCT(Thermal Cycling Test;ヒートサイクル試験)での特性を意味している。
Cuは、Cuランドに対するCu食われ防止するとともに、はんだ合金の融点を下げることができる。
Sbは、ヒートサイクル試験において、150℃ではSnに固溶した状態を呈し、温度低下に伴ってSnマトリックス中のSbが徐々に過飽和状態で固溶するようになり、-55℃ではSnSb金属間化合物として析出する組織を形成する。これにより、はんだ合金は優れたヒートサイクル特性を示すことができる。
Coを含有することで、Sn結晶粒が微細化し、ヒートサイクル特性が向上する。ただし、Coが0.030質量%より多く含まれると、化合物量が多くなりすぎてしまい、更に粗大な化合物が生成され、組織が悪化してしまうという問題が生じ得る。他方、Coが0.001質量%未満しか含まれないと、ヒートサイクル特性について十分な向上効果が発現しないという問題が生じ得る。Co含有量の下限値は好ましくは0.004質量%であり、より好ましくは0.006質量%である。Co含有量の上限値は好ましくは0.020質量%であり、より好ましくは0.010質量%である。
Feを含有することで、Sn結晶粒が微細化し、ヒートサイクル特性が向上する。Feが0.05質量%より多く含まれると、化合物量が多くなりすぎてしまい、更に粗大な化合物が生成され、組織が悪化してしまうという問題が生じ得る。他方、Feが0.02質量%未満しか含まれないと、ヒートサイクル特性の十分な向上効果が発現しないという問題が生じ得る。Fe含有量の下限値は好ましくは0.023質量%である。Fe含有量の上限値は好ましくは0.040質量%であり、より好ましくは0.030質量%である。なお、発明者らが確認したところ、Niの代わりにFeを入れることで、ヒートサイクル特性を向上させることができ、機械的信頼性を確保することができた。Niを用いた場合では「遊離」が生じやすいが、Niを用いずFeを用いた場合には「遊離」が生じ難くなる。このことは、後述するとおり実施例1における対応領域でのCuSn系化合物率が0.0%となったのに対して、比較例12における対応領域でのCuSnNi系化合物率が8.7%となったことによっても確認されている。そして、このように「遊離」自体を抑制することで音響品質の経時劣化を防止でき、電気回路としての品質を確保することができる。なお、図6はNiを含有する場合に「遊離」が発生する態様を示した図であり、合金層がそのまま遊離する態様と合金層が分散して遊離する態様を示している。図6では、一例として、基板30上にCuランド20が設けられ、当該Cuランド20にはんだ合金10が設けられている態様となっている。
Asをはんだ合金が含有する態様を採用した場合には増粘抑制効果を得ることができる。含有されるAs含有量の下限は、Asを含有する効果が十分に発揮するようにするため、0.002質量%にすることが有益である。一方、Asが0.250質量%を超えると濡れ性が劣ることがあるので、As含有量の上限値は0.250質量%にすることが有益である。また、0.002~0.250質量%のAsを含有させることでボイドの発生を抑制でき、ヒートサイクル特性が低下することを防止できる。そして、このようにボイドの発生を抑制することで、電子の流れが阻害される要因を抑制し、音響品質が悪化することも防止できる。
Zrをはんだ合金が含有する態様を採用した場合には増粘抑制効果を得ることができる。含有されるZr含有量の下限は、Zrを含有する効果が十分に発揮するようにするため、0.004質量%にすることが有益である。一方、Zrが0.250質量%を超えると濡れ性が劣ることがあるので、Zr含有量の上限値は0.250質量%にすることが有益である。また、0.004~0.250質量%のZrを含有させることでボイドの発生を抑制でき、ヒートサイクル特性が低下することを防止できる。そして、このようにボイドの発生を抑制することで、電子の流れが阻害される要因を抑制し、音響品質が悪化することも防止できる。
本発明に係るはんだ合金の残部はSnである。本願における「・・・残部Snからなる、はんだ合金」という用語では、「・・・」で列記されている元素の他に不可避的不純物を含有してもよい。また、不可避的不純物を含有する場合であっても、前述の効果に影響することはない。
本発明に係るソルダペーストはフラックスとはんだ粉末を含む。
(1)フラックスの成分
はんだペーストに使用されるフラックスは、有機酸、アミン、アミンハロゲン化水素酸塩、有機ハロゲン化合物、チキソ剤、ロジン、溶剤、界面活性剤、高分子化合物、シランカップリング剤、着色剤の何れか、または2つ以上の組み合わせで構成される。
フラックスの含有量は、はんだペーストの全質量に対して5~95質量%であることが好ましく、5~15質量%であることがより好ましい。この範囲であると、はんだ粉末に起因する増粘抑制効果が十分に発揮される。
本発明に係るソルダペーストで用いるはんだ粉末は、球状粉末であることが好ましい。球状粉末であることによりはんだ合金の流動性が向上する。
本発明に係るはんだペーストは、当業界で一般的な方法により製造される。まず、はんだ粉末の製造は、溶融させたはんだ材料を滴下して粒子を得る滴下法や遠心噴霧する噴霧法、バルクのはんだ材料を粉砕する方法等、公知の方法を採用することができる。滴下法や噴霧法において、滴下や噴霧は、粒子状とするために不活性雰囲気や溶媒中で行うことが好ましい。そして、上記各成分を加熱混合してフラックスを調製し、フラックス中に上記はんだ粉末を導入し、攪拌、混合して製造することができる。
本発明に係るはんだ合金は、はんだボールとして使用することができる。はんだボールとして使用する場合は、本発明に係るはんだ合金を、当業界で一般的な方法である滴下法を用いてはんだボールを製造することができる。また、はんだボールを、フラックスを塗布した1つの電極上にはんだボールを1つ搭載して接合する等、当業界で一般的な方法で加工することによりはんだ継手を製造することができる。はんだボールの粒径は、好ましくは1μm以上であり、より好ましくは10μm以上であり、さらに好ましくは20μm以上であり、特に好ましくは30μm以上である。はんだボールの粒径の上限は好ましくは3000μm以下であり、より好ましくは1000μm以下であり、さらに好ましくは800μm以下であり、特に好ましくは600μm以下である。
本発明に係るはんだ合金は、プリフォームとして使用することができる。プリフォームの形状としては、ワッシャ、リング、ペレット、ディスク、リボン、ワイヤー等が挙げられる。
本発明に係るはんだ合金は、ICチップ等のPKG(Package)の電極とPCB(printed circuit board)等の基板の電極とを接合してはんだ継手を形成することができる。本発明に係るはんだ継手は、電極及びはんだ接合部で構成される。はんだ接合部とは、主にはんだ合金で形成されている部分を示す。
本発明に係るはんだ合金は、これまでの説明からも明らかなように、ヒートサイクル性に優れており、はんだ合金中のクラックの発生や伝播が抑制される。このため、絶えず振動を受けている状態で使用される自動車用、つまり車載用として使用されても、クラックの成長や進展が促進されることはない。したがって、そのような特に顕著な特性を備えていることから、本発明に係るはんだ合金は、自動車に搭載する電子回路のはんだ付けに特に適していることがわかる。
本発明に係るはんだ合金の製造方法に限定はなく、原料金属を溶融混合することにより製造することができる。
バルク中への金属間化合物の遊離(Spalling)は局所的に電子の流れ(電流密度)の不均一化を引き起こし、音響品質に対して悪影響がある。金属間化合物は複数回による実装(複数回、はんだを溶融し凝固する工程)や、時効により生成量が増加する。従来から用いられているNiは接合界面を微細化させる効果が知られているが、当該効果は遊離を促すため、音響品質を低下させる。
(1-1)クラック信頼性(クラック率)
従来技術のようにNiとCoを同時添加することでSn結晶粒が微細化し、ヒートサイクル特性が向上する。本実施の形態でははんだ合金がNiを含有しないことからこの効果が薄れてしまうが、発明者らが鋭意研究したところ、Feを加えることにより接合界面に寄与することなく(すなわち音響品質を低下させることなく)、Sn結晶粒微細化効果が得られることを見出した。
ここに、「想定線クラック全長」とは、完全破断のクラック長さをいう。クラック率は、図5に示した複数のクラックL2の長さの合計を、クラック予想進展経路L1の長さで割った率である。実施例及び比較例の各々に関して5つのサンプルを準備し、クラック率の平均値を算出した。クラック率の平均値が90%未満である場合にはクラック信頼性があり「良好」と判断し、クラック率の平均値が90%以上の場合にはクラック信頼性がなく「不良」と判断した。図5では、基板30上にCuランド20が設けられ、当該Cuランド20にはんだ合金10を介して電子部品40が設けられている態様を示している。また、図5の符号15は金属間化合物層を示している。
シェア強度信頼性は、ヒートサイクル試験前である初期状態のはんだ継手のシェア強度に対してヒートサイクル試験にどの程度の強度が維持されているかの指標となる。
ボイドによる空隙部はヒートサイクル特性の低下のみならず、電子の流れが物理的に不可能となるため、音響品質に悪影響を及ぼす。Asを微量添加することではんだ材の経時変化が抑制され、連続スキージ後の増粘を防止できる。このように増粘を防ぐことでボイド抑制に繋がることを確認できた。
実施例1及び14の各々に関して5つのサンプルを準備し、ボイド率の平均値を算出した。ボイド率の平均値が5%以下の場合には、ボイド率が低いと判断し、表1では「◎」で示している。ボイド率の平均値が5%超過の場合には、ボイド率が低くはないと判断し、表1では「〇」で示している。図3は実施例14における画像であるが、ボイド率が低くなっている。図4は実施例1における画像であるが、実施例14と比較してボイド率が高くなっている。なお、図3及び図4の点線は8mm×8mmからなるQFNの外形を示しており、黒色で示されている画像は5mm×5mmからなる電極部に対応する箇所になっている。
15 金属間化合物層
20 Cuランド
30 基板
40 電子部品
L1 クラック予想進展経路
L2 クラック進展経路
Claims (11)
- Ag:3.1~4.0質量%、Cu:0.6~0.8質量%、Bi:1.5~5.5質量%、Sb:1.0~6.0質量%、Co:0.001~0.030質量%、Fe:0.02~0.05質量%、残部Snからなる、はんだ合金。
- Asを0.002~0.250質量%含有する、請求項1に記載のはんだ合金。
- Feの質量%の値とCoの質量%の3倍の値との和が0.03~0.10となる、請求項1又は2のいずれかに記載のはんだ合金。
- 請求項1~3のいずれか1項に記載のはんだ合金からなるはんだ粉末とフラックスとを有するソルダペースト。
- 請求項1~3のいずれか1項に記載のはんだ合金からなるはんだボール。
- 請求項1~3のいずれか1項に記載のはんだ合金からなるソルダプリフォーム。
- 請求項1~3のいずれか1項に記載のはんだ合金を有することを特徴とするはんだ継手。
- 請求項1~3のいずれか1項に記載のはんだ合金を有することを特徴とする車載電子回路。
- 請求項1~3のいずれかに記載のはんだ合金を有することを特徴とするECU電子回路。
- 請求項8に記載の車載電子回路を備えたことを特徴とする車載電子回路装置。
- 請求項9に記載のECU電子回路を備えたことを特徴とするECU電子回路装置。
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CN202180006864.2A CN114746209B (zh) | 2020-06-23 | 2021-06-22 | 焊料合金、焊膏、焊球、预成型焊料、焊接接头、车载电子电路、ecu电子电路、车载电子电路装置和ecu电子电路装置 |
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US17/770,142 US20220355420A1 (en) | 2020-06-23 | 2021-06-22 | Solder alloy, solder paste, solder ball, solder preform, solder joint, in-vehicle electronic circuit, ecu electronic circuit, in-vehicle electronic circuit device and ecu electronic circuit device |
ES21829696T ES2960421T3 (es) | 2020-06-23 | 2021-06-22 | Aleación para soldadura, pasta de soldadura, bola de soldadura, preforma de soldadura, junta de soldadura, circuito electrónico en el vehículo, circuito electrónico de ECU, dispositivo de circuito electrónico en el vehículo y dispositivo de circuito electrónico de ECU |
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JP7323855B1 (ja) | 2023-01-12 | 2023-08-09 | 千住金属工業株式会社 | はんだ合金、はんだペースト、はんだボール、はんだプリフォーム、はんだ継手、車載電子回路、ecu電子回路、車載電子回路装置、およびecu電子回路装置 |
JP7323853B1 (ja) | 2023-01-12 | 2023-08-09 | 千住金属工業株式会社 | はんだ合金、はんだペースト、はんだボール、はんだプリフォーム、はんだ継手、車載電子回路、ecu電子回路、車載電子回路装置、およびecu電子回路装置 |
JP7323854B1 (ja) | 2023-01-12 | 2023-08-09 | 千住金属工業株式会社 | はんだ合金、はんだペースト、はんだボール、はんだプリフォーム、はんだ継手、車載電子回路、ecu電子回路、車載電子回路装置、およびecu電子回路装置 |
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2021
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- 2021-06-22 BR BR112022004264-7A patent/BR112022004264B1/pt active IP Right Grant
- 2021-06-22 CA CA3156067A patent/CA3156067C/en active Active
- 2021-06-22 EP EP21829696.0A patent/EP4019652B1/en active Active
- 2021-06-22 ES ES21829696T patent/ES2960421T3/es active Active
- 2021-06-22 CN CN202180006864.2A patent/CN114746209B/zh active Active
- 2021-06-22 MY MYPI2022001730A patent/MY195124A/en unknown
- 2021-06-22 WO PCT/JP2021/023598 patent/WO2021261486A1/ja unknown
- 2021-06-22 KR KR1020227015629A patent/KR102491517B1/ko active IP Right Grant
- 2021-06-22 MX MX2022004241A patent/MX2022004241A/es unknown
- 2021-06-22 PT PT218296960T patent/PT4019652T/pt unknown
- 2021-06-23 TW TW110123002A patent/TWI825437B/zh active
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Cited By (4)
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WO2023248302A1 (ja) * | 2022-06-20 | 2023-12-28 | 三菱電機株式会社 | はんだ接合部材、半導体装置、はんだ接合方法、および、半導体装置の製造方法 |
JP7323855B1 (ja) | 2023-01-12 | 2023-08-09 | 千住金属工業株式会社 | はんだ合金、はんだペースト、はんだボール、はんだプリフォーム、はんだ継手、車載電子回路、ecu電子回路、車載電子回路装置、およびecu電子回路装置 |
JP7323853B1 (ja) | 2023-01-12 | 2023-08-09 | 千住金属工業株式会社 | はんだ合金、はんだペースト、はんだボール、はんだプリフォーム、はんだ継手、車載電子回路、ecu電子回路、車載電子回路装置、およびecu電子回路装置 |
JP7323854B1 (ja) | 2023-01-12 | 2023-08-09 | 千住金属工業株式会社 | はんだ合金、はんだペースト、はんだボール、はんだプリフォーム、はんだ継手、車載電子回路、ecu電子回路、車載電子回路装置、およびecu電子回路装置 |
Also Published As
Publication number | Publication date |
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JP6889387B1 (ja) | 2021-06-18 |
KR102491517B1 (ko) | 2023-01-26 |
JP2022002855A (ja) | 2022-01-11 |
EP4019652A1 (en) | 2022-06-29 |
BR112022004264A2 (pt) | 2022-05-31 |
KR20220065093A (ko) | 2022-05-19 |
CA3156067C (en) | 2023-03-14 |
MX2022004241A (es) | 2023-05-18 |
CN114746209A (zh) | 2022-07-12 |
TWI825437B (zh) | 2023-12-11 |
CA3156067A1 (en) | 2021-12-30 |
CN114746209B (zh) | 2023-06-09 |
ES2960421T3 (es) | 2024-03-04 |
MY195124A (en) | 2023-01-11 |
US20220355420A1 (en) | 2022-11-10 |
EP4019652B1 (en) | 2023-09-06 |
BR112022004264B1 (pt) | 2022-10-18 |
EP4019652A4 (en) | 2022-11-23 |
PT4019652T (pt) | 2023-09-25 |
TW202204079A (zh) | 2022-02-01 |
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