WO2021097991A1 - 一种基板及监控基板上膜层边界位置的方法 - Google Patents
一种基板及监控基板上膜层边界位置的方法 Download PDFInfo
- Publication number
- WO2021097991A1 WO2021097991A1 PCT/CN2019/126541 CN2019126541W WO2021097991A1 WO 2021097991 A1 WO2021097991 A1 WO 2021097991A1 CN 2019126541 W CN2019126541 W CN 2019126541W WO 2021097991 A1 WO2021097991 A1 WO 2021097991A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- positioning
- level
- boundary
- substrate
- edge
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/1306—Details
- G02F1/1309—Repairing; Testing
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
- G02F1/1333—Constructional arrangements; Manufacturing methods
- G02F1/1337—Surface-induced orientation of the liquid crystal molecules, e.g. by alignment layers
- G02F1/133711—Surface-induced orientation of the liquid crystal molecules, e.g. by alignment layers by organic films, e.g. polymeric films
- G02F1/133723—Polyimide, polyamide-imide
Definitions
- This application relates to the field of liquid crystal display production and manufacturing, and in particular to a substrate and a method for monitoring the boundary position of the film layer on the substrate.
- the alignment film of the TFT LCD is a polyimide film (that is, a PI alignment film), which allows the liquid crystals to be neatly arranged in the liquid crystal cell through physical or chemical action, forming an orderly pretilt angle, so that the LCD can display normally.
- the uniformity of the film thickness of the PI alignment film is directly related to the alignment ability of the PI alignment film.
- the PI alignment film at the edge of the display area film thickness uniformity control has always been TFT
- the precision of the PI alignment film is one of the key factors affecting the film thickness uniformity of the PI alignment film at the edge of the display area.
- the monitoring of PI alignment film accuracy has always been a labor-consuming task in the LCD manufacturing process. Generally, offline manual measurement is used, which wastes a lot of debugging time and reduces production efficiency. Optimizing PI alignment film accuracy monitoring can effectively improve the accuracy of monitoring, while increasing productivity and reducing labor costs.
- the present application provides a substrate and a method for monitoring the boundary position of the film layer on the substrate, which can solve the problems of low monitoring accuracy caused by manual measurement, a lot of debugging time, and low production efficiency.
- the present application provides a method for monitoring the position of a film boundary on a substrate.
- the method includes the following steps:
- a substrate is provided.
- the substrate is provided with multiple sets of positioning units in the non-display area at the periphery of the display area, and each set of positioning units includes those arranged in a line at equal intervals from the edge of the display area to the edge of the substrate.
- Step S20 collecting position information of the multiple sets of positioning units corresponding to the boundary of the film layer from inside to outside from the edge of the display area;
- Step S30 Determine, according to the position information, the first-level positioning marks of the multiple sets of positioning units corresponding to the film boundary, and read the readings of the first-level positioning ruler corresponding to the first-level positioning marks. To determine the specific location of the film boundary.
- the readings of the first-level positioning ruler are sequentially increased from the edge of the display area to the edge of the substrate, and the reading of the first-level positioning ruler is that the corresponding first-level positioning mark moves from the The number of counts in the direction from the edge of the display area to the edge of the substrate.
- At least two second-level positioning marks arranged in a line and equal intervals are arranged between two adjacent first-level positioning marks, and a second-level positioning scale corresponding to the second-level positioning marks ,
- the readings of the secondary positioning ruler between two adjacent primary positioning marks gradually increase from the edge of the display area to the edge of the substrate, and the reading of the secondary positioning ruler corresponds to it
- the number of the second-level positioning marks in the direction in which the reading of the first-level positioning scale increases between two adjacent first-level positioning marks.
- the distance between two adjacent primary positioning marks is equal to the number of secondary positioning marks between two adjacent primary positioning marks and the number of two adjacent secondary positioning marks. The product of the second-level unit spacing between positioning marks.
- the step of reading the reading of the first-level positioning ruler corresponding to the first-level positioning mark to determine the specific position of the film layer boundary includes:
- the product of the unit pitch is the distance from the boundary of the film layer to the edge of the display area
- the film boundary corresponding to the positioning unit is located between two adjacent first-level positioning marks, read that the film boundary is close to one side of the display area and adjacent to the film boundary The reading of the primary positioning ruler, then determine the secondary positioning mark corresponding to the film boundary, and read the reading of the secondary positioning rule corresponding to the secondary positioning mark to determine the Describe the specific location of the film boundary.
- the step of reading the reading of the secondary positioning ruler corresponding to the secondary positioning mark to determine the specific position of the film boundary includes:
- the film boundary corresponding to the positioning unit is located between two adjacent secondary positioning marks, read that the film boundary is close to one side of the display area and adjacent to the film boundary
- the reading of the secondary positioning ruler, the distance between the film boundary and the edge of the display area the product of the reading of the primary positioning ruler and the primary unit spacing + the reading of the The product of the reading of the secondary positioning ruler and the distance of the secondary unit + one-half of the distance of the secondary unit.
- the present application also provides a substrate, including a substrate and a film layer on the substrate.
- the substrate is provided with multiple sets of positioning units in a non-display area at the periphery of the corresponding display area, each set of positioning units
- the unit includes at least two first-level positioning marks and at least two first-level positioning rulers that are arranged in a line at equal intervals from the edge of the display area to the edge of the substrate, and the first-level positioning mark is the same as the first-level positioning ruler.
- At least two second-level positioning marks arranged in a line at equal intervals are arranged between two adjacent first-level positioning marks, and a second-level positioning ruler arranged in one-to-one correspondence with the second-level positioning marks;
- two adjacent first-level positioning marks have a first-level unit pitch
- two adjacent second-level positioning marks have a second-level unit pitch, according to the plurality of groups corresponding to the boundary of the film layer
- the readings of the first-level positioning ruler and the second-level positioning ruler of the positioning unit, and the combination of the first-level unit distance and the second-level unit distance are used to determine the specific position of the boundary of the film layer.
- the readings of the first-level positioning ruler increase from the edge of the display area to the edge of the substrate, and the reading of the first-level positioning ruler is that the corresponding first-level positioning mark starts from The number of counts in the direction from the edge of the display area to the edge of the substrate.
- the readings of the secondary positioning scale between two adjacent primary positioning marks gradually increase from the edge of the display area to the edge of the substrate, and the secondary positioning scale The reading of is the counted number of the corresponding secondary positioning mark in the direction in which the reading of the primary positioning ruler increases between two adjacent primary positioning marks.
- the application also provides a substrate, which includes a substrate and a film layer on the substrate.
- the substrate is provided with multiple sets of positioning units in a non-display area at the periphery of the corresponding display area, and each set of positioning units includes the At least two first-level positioning marks and at least two first-level positioning scales arranged in a line at equal intervals from the edge of the display area toward the edge of the substrate, the first-level positioning marks and the first-level positioning scales are arranged in one-to-one correspondence;
- At least two second-level positioning marks arranged in a line at equal intervals are arranged between two adjacent first-level positioning marks, and a second-level positioning ruler arranged in one-to-one correspondence with the second-level positioning marks;
- first-level unit spacing between two adjacent first-level positioning marks there is a second-level unit spacing between two adjacent second-level positioning marks, and the spacing between two adjacent first-level positioning marks is equal to The product of the number of the second-level positioning marks between two adjacent first-level positioning marks and the second-level unit distance between two adjacent second-level positioning marks;
- the primary positioning ruler and the secondary positioning ruler of the multiple sets of positioning units corresponding to the boundary of the film layer According to the readings of the primary positioning ruler and the secondary positioning ruler of the multiple sets of positioning units corresponding to the boundary of the film layer, and combining the primary unit spacing and the secondary unit spacing to The specific position of the boundary of the film layer is determined.
- the readings of the first-level positioning ruler increase from the edge of the display area to the edge of the substrate, and the reading of the first-level positioning ruler is that the corresponding first-level positioning mark starts from The number of counts in the direction from the edge of the display area to the edge of the substrate.
- the readings of the secondary positioning scale between two adjacent primary positioning marks gradually increase from the edge of the display area to the edge of the substrate, and the secondary positioning scale The reading of is the counted number of the corresponding secondary positioning mark in the direction in which the reading of the primary positioning ruler increases between two adjacent primary positioning marks.
- the beneficial effect of the present application is that compared with the existing method for monitoring the position of the film boundary on the substrate, the present application provides multiple sets of positioning units at positions corresponding to the non-display area around the substrate, and each set of positioning units has a one-to-one correspondence.
- the first-level positioning mark and the first-level positioning ruler, and the second-level positioning mark and the second-level positioning ruler nested under the first-level positioning mark are formed.
- FIG. 1 is a schematic structural diagram of a substrate provided by an embodiment of the application.
- FIG. 2 is a schematic diagram of the structure of three different positioning units provided by an embodiment of the application.
- FIG. 3 is a schematic structural diagram of another substrate provided by an embodiment of the application.
- FIG. 4 is a flow chart of the method for monitoring the position of the film boundary on the substrate in FIG. 1 provided by this application;
- FIG. 5 is a flowchart of the method for monitoring the position of the film boundary on the substrate in FIG. 3 provided by this application.
- first and second are only used for descriptive purposes, and cannot be understood as indicating or implying relative importance or implicitly indicating the number of indicated technical features.
- features defined with “first” and “second” may explicitly or implicitly include one or more of the features.
- the present application is directed to the existing method for monitoring the boundary position of the film layer on the substrate, which has the technical problems that the monitoring accuracy is not high, a lot of debugging time is consumed, and the production efficiency is low. This embodiment can solve this defect.
- the substrate 1 includes a substrate 10 and a film layer 11 on the substrate 10.
- the substrate 1 is provided with a plurality of groups of positioning units 20 in a non-display area B on the periphery of the corresponding display area A, and each group of positioning units 20 includes At least two first-level positioning marks 210 and at least two first-level positioning scales 211 are arranged in a line at equal intervals from the edge of the display area A to the edge of the substrate 1.
- the first-level positioning mark 210 and the one The level positioning scale 211 is set in one-to-one correspondence.
- multiple groups of the positioning units 20 can be arranged along a direction perpendicular to the peripheral edge of the display area A, and can accurately position the peripheral boundary of the film layer 11, or along the display area.
- the diagonal setting of A can accurately position the boundaries of the four corners of the film layer 11.
- the substrate 1 may be an array substrate, a color filter substrate, a flexible substrate, etc.
- the form of the substrate is not limited in this embodiment, and all substrates that need to measure/position the position of the film boundary
- the structure of the substrate in the embodiment of the present application can be adopted.
- the film layer 11 is a PI alignment film, but it is not limited to this, and any other film layer on the substrate 1 that needs to determine the boundary position can be used.
- the alignment film In order not to affect the pretilt angle of the liquid crystal molecules in the design of the alignment film, the alignment film must completely cover the display area A, and the boundary of the alignment film beyond the size of the display area A needs to be within a set range Therefore, in this embodiment, the boundary (edge) of the display area A is used as the starting point of the reading of the first-level positioning ruler 211 (the starting point is 0), and between two adjacent first-level positioning marks 210 It has a first-level unit pitch, and the distance between the first-level positioning mark 210 and the boundary of the display area A is a distance of a first-level unit pitch.
- the number of the first-level positioning marks 210 included in each group of the positioning unit 20 is not limited, and multiple ones can be produced according to actual manufacturing process requirements, but each of the first-level positioning marks 210 Each of the positioning marks 210 corresponds to one of the first-level positioning scales 211.
- the reading of the first-level positioning ruler 211 gradually increases from the edge of the display area A to the edge of the substrate 1, and the reading of the first-level positioning ruler 211 is the corresponding first-level positioning mark 210 The counted number from the edge of the display area A to the edge of the substrate 1.
- the first-level positioning mark 210 and the first-level positioning ruler 211 can be made on any film layer before the film layer 11 is formed through a photomask. For the convenience of confirmation, it is recommended to use an opaque material or a thicker color film. For the production of barrier layers, spacers, black matrix, etc., it is not recommended to use thin and transparent films such as ITO and PV.
- the primary positioning mark 210 can be set in a variety of shapes that are easy to process and recognize, and can be square, rectangle, circle, diamond, triangle, and the like.
- the specific shape of the primary positioning mark 210 is not limited, and the solution of this embodiment will be described in detail below by taking a triangular positioning mark as an example.
- the first-level positioning marks 210 are distributed at equal intervals along the direction perpendicular to the boundary of the display area A, and the distance between two adjacent first-level positioning marks 210 in the same group of the positioning units 20 is one by one.
- the first-level unit spacing d1 is designed according to needs, such as 200 ⁇ m/300 ⁇ m/500 ⁇ m/600 ⁇ m, etc., which is not limited here.
- the readings of the primary positioning ruler 211 are counting symbols that are easy to identify, including but not limited to the three counting symbols in the figure. Generally, in order to facilitate implementation, the same manufacturer recommends uniformly adopting a positioning mark and a counting symbol.
- a nested design positioning mark and positioning scale may be adopted on the basis of FIG.
- nested between two adjacent primary positioning marks 210 are at least two secondary positioning marks 220 arranged in a font at equal intervals, and are arranged in one-to-one correspondence with the secondary positioning marks 220
- the readings of the secondary positioning ruler 221 between two adjacent primary positioning marks 210 increase from the edge of the display area A to the edge of the substrate 1, and the secondary positioning ruler 221
- the reading of is the number of counts of the corresponding secondary positioning mark 220 between two adjacent primary positioning marks 210 from the reading of the primary positioning ruler 211.
- At least two of the second-level positioning marks 210 can also be set in the same manner from the boundary of the display area A to the first one of the first-level positioning marks 210 of the positioning units 20.
- the second-level positioning mark 220 and the corresponding second-level positioning scale 221 may be arranged between two partially adjacent first-level positioning marks 210 according to actual needs.
- the number of the secondary positioning marks 220 included in each group of the positioning units 20 is not limited, and more than one may be produced according to actual manufacturing process requirements.
- the spacing between the marks 210 (that is, the primary unit spacing d1) is equal to the product of the number of the secondary positioning marks 220 between two adjacent primary positioning marks 210 and the secondary unit spacing d2 .
- the first-level unit pitch d1 is 600 ⁇ m
- the second-level unit pitch d2 is 150 ⁇ m, but it is not limited thereto.
- first-level positioning mark 210 and the first-level positioning ruler 211 for the manufacturing method of the second-level positioning mark 220 and the second-level positioning ruler 221, the materials used, and the mark shape. I won't repeat it here.
- the area of the secondary positioning mark 220 is smaller than the area of the primary positioning mark 210, the reading count symbol of the secondary positioning ruler 221 and the reading count symbol of the primary positioning ruler 211 It can be set differently, or set differently in terms of position relationship, as shown in Figure 3, but it is not limited to this, as long as it can be clearly distinguished.
- the unit pitch is used to determine the specific position of the boundary of the film layer 11.
- the specific method please refer to the description in the following method for monitoring the boundary position of the film layer on the substrate, which will not be repeated here.
- the present application also provides a method for monitoring the boundary position of the film layer 11 on the above-mentioned first substrate 1.
- the method includes the following steps:
- a substrate 1 is provided.
- the substrate 1 is provided with a plurality of sets of positioning units 20 corresponding to the non-display area B on the periphery of the display area A, and each set of positioning units 20 includes an edge from the edge of the display area A to the edge of the substrate 1.
- At least two first-level positioning marks 210 and at least two first-level positioning scales 211 arranged in a line and equal intervals, the first-level positioning marks 210 and the first-level positioning scales 211 are arranged in one-to-one correspondence;
- Step S20 starting from the edge of the display area A, collecting position information of the multiple sets of positioning units 20 corresponding to the boundary of the film layer 11 from the inside to the outside;
- Step S30 Determine, according to the position information, the first-level positioning marks 210 of the multiple sets of positioning units 20 corresponding to the boundary of the film layer 11, and determine whether the boundary of the film layer 11 is facing the first-level positioning mark 210 Read the readings of the first-level positioning ruler 211 corresponding to the first-level positioning mark 210 to determine the specific position of the boundary of the film layer 11.
- reading the reading of the first-level positioning ruler 211 corresponding to the first-level positioning mark 210 to determine the specific position of the boundary of the film layer 11 includes the following steps:
- Step S301 If the boundary of the film layer 11 is facing the first-level positioning mark 210, read the first-level positioning ruler 211 corresponding to the first-level positioning mark 210 directly opposite the boundary of the film layer 11 Reading, the distance between the boundary of the film layer 11 and the edge of the display area A is equal to the product of the reading of the primary positioning ruler 211 and the primary unit spacing d1 between two adjacent primary positioning marks 210, thereby determining The specific position of the boundary of the film layer 11;
- the point M is a point on the boundary of the film layer 11.
- the above method is used to determine that the point M is facing the primary positioning mark 210 of the positioning unit 20, and the corresponding
- Step S302 if the boundary of the film layer 11 is located between two adjacent first-level positioning marks 210, read that the boundary of the film layer 11 is close to the side of the display area A and is opposite to the boundary of the film layer 11.
- the reading of the adjacent first-level positioning ruler 211, the distance between the boundary of the film layer 11 and the edge of the display area A the product of the read reading of the first-level positioning ruler 211 and the first-level unit distance d1 + One-half of the first-level unit spacing d1, so that the specific position of the boundary of the film layer 11 can be determined.
- the present application also provides a method for monitoring the boundary position of the film layer 11 on the above-mentioned second substrate 1.
- the method includes the following steps:
- a substrate 1 is provided.
- the substrate 1 is provided with a plurality of sets of positioning units 20 corresponding to the non-display area B on the periphery of the display area A, and each set of positioning units 20 includes an edge from the edge of the display area A to the edge of the substrate 1.
- At least two first-level positioning marks 210 and at least two first-level positioning rulers 211 are arranged in a font at equal intervals.
- the first-level positioning marks 210 and the first-level positioning rulers 211 are arranged in one-to-one correspondence, and are arranged in two adjacent offices.
- At least two second-level positioning marks 220 are nested between the first-level positioning marks 210 and arranged in a line at equal intervals, and a second-level positioning ruler 221 is provided in one-to-one correspondence with the second-level positioning marks 220.
- Step S20 starting from the edge of the display area A, collecting position information of the multiple sets of positioning units 20 corresponding to the boundary of the film layer 11 from the inside to the outside.
- Step S30 Determine, according to the position information, the first-level positioning marks 210 of the multiple sets of positioning units 20 corresponding to the boundary of the film layer 11, and determine whether the boundary of the film layer 11 is facing the first-level positioning mark 210 .
- step S30 further includes the following steps:
- Step S301 If the boundary of the film layer 11 is facing the first-level positioning mark 210, read the first-level positioning ruler 211 corresponding to the first-level positioning mark 210 directly opposite the boundary of the film layer 11 Reading, the distance between the boundary of the film layer 11 and the edge of the display area A is equal to the product of the reading of the first-level positioning ruler 211 and the first-level unit distance d1 between two adjacent first-level positioning marks 210.
- Step S302 if the boundary of the film layer 11 corresponding to the positioning unit 20 is located between two adjacent first-level positioning marks 210, read that the boundary of the film layer 11 is close to the side of the display area A and The reading of the primary positioning ruler 211 adjacent to the boundary of the film layer 11.
- Step S303 Determine the secondary positioning mark 220 corresponding to the boundary of the film layer 11, determine whether the boundary of the film layer 11 is facing the secondary positioning mark 220, and read corresponding to the secondary positioning mark 220 The reading of the secondary positioning ruler 221 is used to determine the specific position of the boundary of the film layer 11.
- the method of reading the reading of the secondary positioning ruler 221 corresponding to the secondary positioning mark 220 to determine the specific position of the boundary of the film layer 11 includes the following steps:
- Step S304 if the boundary of the film layer 11 corresponding to the positioning unit 20 is facing the secondary positioning mark 220, read the reading of the corresponding secondary positioning ruler 221, and the film layer 11
- the distance between the boundary and the edge of the display area A the product of the reading of the secondary positioning scale 221 and the secondary unit distance d2 between two adjacent secondary positioning marks 220 + the read primary positioning scale
- the M'point is a point on the boundary line of the film layer 11 corresponding to the positioning unit 20, and the M'point is facing the secondary positioning mark 220.
- each set of positioning units has a one-to-one corresponding first-level positioning mark and first-level positioning ruler, and nested in the first-level positioning unit.
- the two-level positioning mark and the two-level positioning ruler are formed under the mark.
Landscapes
- Physics & Mathematics (AREA)
- Nonlinear Science (AREA)
- Chemical & Material Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- General Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Mathematical Physics (AREA)
- Liquid Crystal (AREA)
- Shaping Of Tube Ends By Bending Or Straightening (AREA)
Abstract
一种基板（1）及监控基板（1）上膜层（11）边界位置的方法，基板（1）的非显示区域（B）设有多组定位单元（20），每组定位单元（20）包括至少两一级定位标记（210）和与之对应的一级定位标尺（211）。相邻两一级定位标记（210）之间设有至少两二级定位标记（220）及与之对应的二级定位标尺（221）。根据膜层（11）的边界所对应的多组定位单元（20）的定位标尺（211/221）的读数以确定膜层（11）边界的具体位置。
Description
本申请要求于2019年11月19日提交中国专利局、申请号为201911131299.3、发明名称为“一种基板及监控基板上膜层边界位置的方法”的中国专利申请的优先权，其全部内容通过引用结合在本申请中。
本申请涉及液晶显示器生产制造领域，尤其涉及一种基板及监控基板上膜层边界位置的方法。
一般TFT LCD的配向膜为聚酰亚胺膜(即PI配向膜)，其通过物理或化学作用，让液晶在液晶盒内整齐排列，形成有序的预倾角，使LCD能正常显示。PI配向膜的膜厚的均一性与PI配向膜的配向能力直接相关。而PI配向膜在显示区边缘膜厚均一性控制一直是TFT
LCD制程中的难题，其中PI配向膜精度是影响显示区区边缘PI配向膜膜厚均一性的关键因子之一。PI配向膜精度的监控也一直是LCD制程中比较耗费产能和人力的工作，一般采用离线的手工测量的方式，进而浪费了大量的调试时间，降低了生产的效率。优化PI配向膜精度监控可以有效提高监控的准确度，同时提升产能和缩减人力成本。
因此，现有技术存在缺陷，急需改进。
本申请提供一种基板及监控基板上膜层边界位置的方法，能够解决采用手工测量的方式造成的监控精度不高，以及耗费大量的调试时间，生产效率较低等问题。
为解决上述问题，本申请提供的技术方案如下：
本申请提供一种监控基板上膜层边界位置的方法，所述方法包括以下步骤：
步骤S10，提供一基板，所述基板对应显示区域外围的非显示区域设置有多组定位单元，每组定位单元包括由所述显示区域边缘向所述基板边缘分别呈一字型等间距排列的至少两一级定位标记和至少两一级定位标尺，所述一级定位标记与所述一级定位标尺一一对应设置；
步骤S20，从所述显示区域的边缘处开始由内向外分别采集所述膜层的边界所对应所述多组定位单元的位置信息；
步骤S30，根据所述位置信息确定所述膜层边界所对应所述多组定位单元的所述一级定位标记，读取所述一级定位标记所对应的所述一级定位标尺的读数，以确定所述膜层边界的具体位置。
在本申请的方法中，所述一级定位标尺的读数由所述显示区域边缘向所述基板边缘依次递增，所述一级定位标尺的读数为与之对应的所述一级定位标记从所述显示区域边缘向所述基板边缘方向上的计数个数。
在本申请的方法中，相邻两所述一级定位标记之间设置有呈一字型等间距排列的至少两二级定位标记，以及与所述二级定位标记相对应的二级定位标尺，相邻两所述一级定位标记之间的所述二级定位标尺的读数由所述显示区域边缘向所述基板边缘一侧依次递增，且所述二级定位标尺的读数为与之对应的所述二级定位标记在相邻两所述一级定位标记之间从所述一级定位标尺的读数增大的方向上的计数个数。
在本申请的方法中，相邻两所述一级定位标记之间的间距等于相邻两所述一级定位标记之间的所述二级定位标记的个数与相邻两所述二级定位标记间的二级单位间距的乘积。
在本申请的方法中，读取所述一级定位标记所对应的所述一级定位标尺的读数，以确定所述膜层边界的具体位置的步骤包括：
若对应所述定位单元处的所述膜层边界正对于所述一级定位标记，则根据与之对应的所述一级定位标尺的读数与相邻两所述一级定位标记间的一级单位间距的乘积便为所述膜层边界距所述显示区域边缘的距离；
若对应所述定位单元处的所述膜层边界位于相邻两所述一级定位标记之间，则读取所述膜层边界靠近所述显示区域一侧且与所述膜层边界相邻的所述一级定位标尺的读数，然后确定所述膜层边界所对应的所述二级定位标记，读取与所述二级定位标记对应的所述二级定位标尺的读数，以确定所述膜层边界的具体位置。
在本申请的方法中，读取与所述二级定位标记对应的所述二级定位标尺的读数，以确定所述膜层边界的具体位置的步骤包括：
若对应所述定位单元处的所述膜层边界正对于所述二级定位标记，则读取与之对应的所述二级定位标尺的读数，所述膜层边界距所述显示区域边缘的距离=所述二级定位标尺的读数与相邻两所述二级定位标记间的二级单位间距的乘积+读取的所述一级定位标尺的读数与所述一级单位间距的乘积；
若对应所述定位单元处的所述膜层边界位于相邻两所述二级定位标记之间，则读取所述膜层边界靠近所述显示区域一侧且与所述膜层边界相邻的所述二级定位标尺的读数，所述膜层边界距所述显示区域边缘的距离=读取的所述一级定位标尺的读数与所述一级单位间距的乘积+读取的所述二级定位标尺的读数与所述二级单位间距的乘积+二分之一的所述二级单位间距。
为解决上述技术问题，本申请还提供一种基板，包括衬底以及位于所述衬底上的膜层，所述基板在对应显示区域外围的非显示区域设置有多组定位单元，每组定位单元包括由所述显示区域边缘向所述基板边缘分别呈一字型等间距排列的至少两一级定位标记和至少两一级定位标尺，所述一级定位标记与所述一级定位标尺一一对应设置；
相邻两所述一级定位标记之间设置有呈一字型等间距排列的至少两二级定位标记，以及与所述二级定位标记一一对应设置的二级定位标尺；
其中，相邻两所述一级定位标记之间具有一级单位间距，相邻两所述二级定位标记之间具有二级单位间距，根据所述膜层的边界所对应的所述多组定位单元的所述一级定位标尺与所述二级定位标尺的读数，以及结合所述一级单位间距与所述二级单位间距用以确定所述膜层的边界的具体位置。
在本申请的基板中，所述一级定位标尺的读数由所述显示区域边缘向所述基板边缘依次递增，所述一级定位标尺的读数为与之对应的所述一级定位标记从所述显示区域边缘向所述基板边缘方向上的计数个数。
在本申请的基板中，相邻两所述一级定位标记之间的所述二级定位标尺的读数由所述显示区域边缘向所述基板边缘一侧依次递增，且所述二级定位标尺的读数为与之对应的所述二级定位标记在相邻两所述一级定位标记之间从所述一级定位标尺的读数增大的方向上的计数个数。
在本申请的基板中，所述膜层的边界的具体位置为所述膜层的边界距所述显示区域边缘的距离，所述膜层的边界距所述显示区域边缘的距离=所述膜层的边界所对应的所述多组定位单元的所述一级定位标尺的读数与所述一级单位间距的乘积+所述膜层的边界所对应的所述二级定位标尺的读数与所述二级单位间距的乘积。
本申请还提供一种基板，其包括衬底以及位于所述衬底上的膜层，所述基板在对应显示区域外围的非显示区域设置有多组定位单元，每组定位单元包括由所述显示区域边缘向所述基板边缘分别呈一字型等间距排列的至少两一级定位标记和至少两一级定位标尺，所述一级定位标记与所述一级定位标尺一一对应设置；
相邻两所述一级定位标记之间设置有呈一字型等间距排列的至少两二级定位标记，以及与所述二级定位标记一一对应设置的二级定位标尺；
其中，相邻两所述一级定位标记之间具有一级单位间距，相邻两所述二级定位标记之间具有二级单位间距，相邻两所述一级定位标记之间的间距等于相邻两所述一级定位标记之间的所述二级定位标记的个数与相邻两所述二级定位标记间的二级单位间距的乘积；
根据所述膜层的边界所对应的所述多组定位单元的所述一级定位标尺与所述二级定位标尺的读数，以及结合所述一级单位间距与所述二级单位间距用以确定所述膜层的边界的具体位置。
在本申请的基板中，所述一级定位标尺的读数由所述显示区域边缘向所述基板边缘依次递增，所述一级定位标尺的读数为与之对应的所述一级定位标记从所述显示区域边缘向所述基板边缘方向上的计数个数。
在本申请的基板中，相邻两所述一级定位标记之间的所述二级定位标尺的读数由所述显示区域边缘向所述基板边缘一侧依次递增，且所述二级定位标尺的读数为与之对应的所述二级定位标记在相邻两所述一级定位标记之间从所述一级定位标尺的读数增大的方向上的计数个数。
在本申请的基板中，所述膜层的边界的具体位置为所述膜层的边界距所述显示区域边缘的距离，所述膜层的边界距所述显示区域边缘的距离=所述膜层的边界所对应的所述多组定位单元的所述一级定位标尺的读数与所述一级单位间距的乘积+所述膜层的边界所对应的所述二级定位标尺的读数与所述二级单位间距的乘积。
本申请的有益效果为：相较于现有监控基板上膜层边界位置的方法，本申请通过在基板四周对应非显示区域的位置设置多组定位单元，每组定位单元均由一一对应的一级定位标记和一级定位标尺，以及嵌套于一级定位标记之下的二级定位标记和二级定位标尺构成。采用此设计，可以大幅提升膜层边界位置的确认精度，缩短开线时间，提升产能，减少人力成本。
下面结合附图，通过对本申请的具体实施方式详细描述，将使本申请的技术方案及其它有益效果显而易见。
图1为本申请实施例提供的一种基板的结构示意图；
图2为本申请实施例提供的三种不同的定位单元结构示意图；
图3为本申请实施例提供的另一种基板的结构示意图；
图4为本申请提供的用于监控图1中基板上的膜层边界位置的方法流程图；
图5为本申请提供的用于监控图3中基板上的膜层边界位置的方法流程图。
下面将结合本申请实施例中的附图，对本申请实施例中的技术方案进行清楚、完整地描述。显然，所描述的实施例仅仅是本申请一部分实施例，而不是全部的实施例。基于本申请中的实施例，本领域技术人员在没有作出创造性劳动前提下所获得的所有其他实施例，都属于本申请保护的范围。
在本申请的描述中，需要理解的是，术语“中心”、“纵向”、“横向”、“长度”、“宽度”、“厚度”、“上”、“下”、“前”、“后”、“左”、“右”、“竖直”、“水平”、“顶”、“底”、“内”、“外”、“顺时针”、“逆时针”等指示的方位或位置关系为基于附图所示的方位或位置关系，仅是为了便于描述本申请和简化描述，而不是指示或暗示所指的装置或元件必须具有特定的方位、以特定的方位构造和操作，因此不能理解为对本申请的限制。此外，术语“第一”、“第二”仅用于描述目的，而不能理解为指示或暗示相对重要性或者隐含指明所指示的技术特征的数量。由此，限定有“第一”、“第二”的特征可以明示或者隐含地包括一个或者更多个所述特征。在本申请的描述中，“/”表示或者的意思，“*”“=”“+”“-”等表示数学运算符号，“多个”的含义是两个或两个以上，除非另有明确具体的限定。
本申请针对现有监控基板上膜层边界位置的方法，存在监控精度不高，以及耗费大量的调试时间，生产效率较低的技术问题，本实施例能够解决该缺陷。
如图1所示，为本申请实施例提供的一种基板的结构示意图。所述基板1包括衬底10以及位于所述衬底10上的膜层11，所述基板1在对应显示区域A外围的非显示区域B设置有多组定位单元20，每组定位单元20包括由所述显示区域A边缘向所述基板1的边缘分别呈一字型等间距排列的至少两一级定位标记210和至少两一级定位标尺211，所述一级定位标记210与所述一级定位标尺211一一对应设置。如图中所示，多组所述定位单元20可以沿与所述显示区域A的四周边缘垂直的方向设置，可以对所述膜层11的四周边界进行精确定位，也可以沿所述显示区域A的对角线方向设置，可以对所述膜层11的四个角落的边界进行精确定位。
其中，所述基板1可以是阵列基板、彩色滤光片基板、柔性基板等，在本实施例中对基板的形式不做限定，对于需要对膜层边界的位置进行量测/定位的基板均可以采用本申请实施例中的基板的结构。本实施例中所述膜层11选用PI配向膜，但不以此为限，所述基板1上的其他需要确定边界位置的膜层均可。
由于在配向膜的设计中为不影响液晶分子的预倾角需要所述配向膜必须完全覆盖所述显示区域A，且所述配向膜的边界超出所述显示区域A的尺寸需要在设定的范围内，因此，本实施例以所述显示区域A的边界（边缘）为所述一级定位标尺211读数的起始点（起始点读数为0），相邻两所述一级定位标记210之间具有一级单位间距，所述一级定位标记210距所述显示区域A的边界的距离为一个一级单位间距的距离。
在本申请的实施例中，对每组所述定位单元20中所包含的所述一级定位标记210的个数不做限定，可以根据实际制程需要制作多个，但每个所述一级定位标记210均对应一个所述一级定位标尺211。其中，所述一级定位标尺211的读数由所述显示区域A的边缘向所述基板1的边缘依次递增，且所述一级定位标尺211的读数为与之对应的所述一级定位标记210从所述显示区域A的边缘向所述基板1的边缘方向上的计数个数。
所述一级定位标记210和所述一级定位标尺211可以通过光罩在所述膜层11成膜之前的任意膜层上制作，为了方便确认，建议以不透明材料或者较厚的彩膜色阻层、间隔柱、黑色矩阵等制作，不建议用ITO、PV等较薄且透明的膜层制作。
进一步的，所述一级定位标记210可以设置成多种易于加工和识别的形状，可以为正方形、长方形、圆形、菱形以及三角形等。在本实施例中，对所述一级定位标记210的具体形状不做限定，下面将以三角形定位标记为例详细说明本实施例的方案。
如图2所示，为本申请实施例提供的三种不同的定位单元。所述一级定位标记210沿垂直于所述显示区域A的边界的方向上等间距的分布，同一组所述定位单元20中相邻两所述一级定位标记210之间的距离为一个一级单位间距d1的距离。所述一级单位间距d1根据需要设计，如200μm/300μm/ 500μm/600μm等，此处不做限制。所述一级定位标尺211的读数为便于识别的计数符号，包括但不限于图中的三种计数符号。通常为了方便执行，同一个厂商建议统一采用一种定位标记和一种计数符号。
为了使监控精度更精确，本申请实施例还提供了另一种基板的结构示意图，如图3所示，可以在图1的基础上采用嵌套设计的定位标记和定位标尺。具体地，在相邻两所述一级定位标记210之间嵌套的设置有呈一字型等间距排列的至少两二级定位标记220，以及与所述二级定位标记220一一对应设置的二级定位标尺221。相邻两所述一级定位标记210之间的所述二级定位标尺221的读数由所述显示区域A的边缘向所述基板1的边缘一侧依次递增，且所述二级定位标尺221的读数为与之对应的所述二级定位标记220在相邻两所述一级定位标记210之间从所述一级定位标尺211的读数增大的方向上的计数个数。
为了使监控精度更精确，在所述显示区域A的边界到多组所述定位单元20的第一个所述一级定位标记210之间也可以以同样的方式设置至少两所述二级定位标记220以及与其对应的所述二级定位标尺221。
在另一种实施例中，所述二级定位标记220以及与其对应的所述二级定位标尺221可根据实际需要设置于部分相邻两所述一级定位标记210之间。
在本申请的实施例中，对每组所述定位单元20中所包含的所述二级定位标记220的个数不做限定，可以根据实际制程需要制作多个。其中，所述二级定位标记220与其相邻的所述一级定位标记210之间以及相邻两所述二级定位标记220之间具有二级单位间距d2，相邻两所述一级定位标记210之间的间距（即所述一级单位间距d1）等于相邻两所述一级定位标记210之间的所述二级定位标记220的个数与所述二级单位间距d2的乘积。在本实施例中，所述一级单位间距d1选用600μm，所述二级单位间距d2选用150μm，但并不以此为限。
其中，所述二级定位标记220以及所述二级定位标尺221的制作方法、所用的材料以及标记形状请参照上述对所述一级定位标记210以及所述一级定位标尺211的描述，此处不再赘述。
为了便于更好的区分，所述二级定位标记220的面积小于所述一级定位标记210的面积，所述二级定位标尺221的读数计数符号与所述一级定位标尺211的读数计数符号可以区别设置，或者是在位置关系上区别设置，如图3中所示，但并不以此为限，只要能够清楚的区分即可。
根据所述膜层11的边界所对应的所述多组定位单元20的所述一级定位标尺211与所述二级定位标尺221的读数，以及结合所述一级单位间距与所述二级单位间距用来确定所述膜层11的边界的具体位置，具体方法请参照以下监控基板上膜层边界位置的方法中的描述，此处不再赘述。
将上述具有所述定位单元20的基板用于膜层边界位置的确定，可以显著地缩短开线调试时间，节约劳动力，降低生产成本。
结合图1、图2以及图4所示，本申请还提供一种用于监控上述第一种基板1上所述膜层11边界位置的方法，所述方法包括以下步骤：
步骤S10，提供一基板1，所述基板1对应显示区域A外围的非显示区域B设置有多组定位单元20，每组定位单元20包括由所述显示区域A边缘向所述基板1边缘分别呈一字型等间距排列的至少两一级定位标记210和至少两一级定位标尺211，所述一级定位标记210与所述一级定位标尺211一一对应设置；
步骤S20，从所述显示区域A的边缘处开始由内向外分别采集所述膜层11的边界所对应所述多组定位单元20的位置信息；
步骤S30，根据所述位置信息确定所述膜层11边界所对应所述多组定位单元20的所述一级定位标记210，判断所述膜层11边界是否正对于所述一级定位标记210，读取所述一级定位标记210所对应的所述一级定位标尺211的读数，以确定所述膜层11边界的具体位置。
具体地，所述步骤S30中读取所述一级定位标记210所对应的所述一级定位标尺211的读数，以确定所述膜层11边界的具体位置包括以下步骤：
步骤S301，若所述膜层11边界正对于所述一级定位标记210，则读取所述膜层11边界正对的所述一级定位标记210所对应的所述一级定位标尺211的读数，所述膜层11边界距所述显示区域A边缘的距离等于所述一级定位标尺211的读数与相邻两所述一级定位标记210间的一级单位间距d1的乘积，从而确定了所述膜层11边界的具体位置；
如图2中M点所示，M点为所述膜层11边界上的一点，采用上述方法确定M点正对于所述定位单元20的所述一级定位标记210，读取与之对应的所述一级定位标尺211的读数为4，以所述一级单位间距d1为600μm为例，可以计算出对应该组定位单元20的所述膜层11边界距所述显示区域A边缘的距离为600μm*4=2400μm。
步骤S302，若所述膜层11边界位于相邻两所述一级定位标记210之间，则读取所述膜层11边界靠近所述显示区域A一侧且与所述膜层11边界相邻的所述一级定位标尺211的读数，所述膜层11边界距所述显示区域A边缘的距离=读取的所述一级定位标尺211的读数与所述一级单位间距d1的乘积+二分之一的所述一级单位间距d1，从而可以确定出所述膜层11边界的具体位置。
结合图3和图5所示，本申请还提供一种用于监控上述第二种基板1上所述膜层11边界位置的方法，所述方法包括以下步骤：
步骤S10，提供一基板1，所述基板1对应显示区域A外围的非显示区域B设置有多组定位单元20，每组定位单元20包括由所述显示区域A边缘向所述基板1边缘分别呈一字型等间距排列的至少两一级定位标记210和至少两一级定位标尺211，所述一级定位标记210与所述一级定位标尺211一一对应设置，以及在相邻两所述一级定位标记210之间嵌套设置的呈一字型等间距排列的至少两二级定位标记220，以及与所述二级定位标记220一一对应设置的二级定位标尺221。
步骤S20，从所述显示区域A的边缘处开始由内向外分别采集所述膜层11的边界所对应所述多组定位单元20的位置信息。
步骤S30，根据所述位置信息确定所述膜层11边界所对应所述多组定位单元20的所述一级定位标记210，判断所述膜层11边界是否正对于所述一级定位标记210。
具体地，所述步骤S30还包括以下步骤：
步骤S301，若所述膜层11边界正对于所述一级定位标记210，则读取所述膜层11边界正对的所述一级定位标记210所对应的所述一级定位标尺211的读数，所述膜层11边界距所述显示区域A边缘的距离等于所述一级定位标尺211的读数与相邻两所述一级定位标记210间的一级单位间距d1的乘积。
步骤S302，若对应所述定位单元20处的所述膜层11边界位于相邻两所述一级定位标记210之间，则读取所述膜层11边界靠近所述显示区域A一侧且与所述膜层11边界相邻的所述一级定位标尺211的读数。
步骤S303，确定所述膜层11边界所对应的所述二级定位标记220，判断所述膜层11边界是否正对于所述二级定位标记220，读取与所述二级定位标记220对应的所述二级定位标尺221的读数，以确定所述膜层11边界的具体位置。
具体地，读取与所述二级定位标记220对应的所述二级定位标尺221的读数，以确定所述膜层11边界的具体位置的方法包括以下步骤：
步骤S304，若对应所述定位单元20处的所述膜层11边界正对于所述二级定位标记220，则读取与之对应的所述二级定位标尺221的读数，所述膜层11边界距所述显示区域A边缘的距离=所述二级定位标尺221的读数与相邻两所述二级定位标记220间的二级单位间距d2的乘积+读取的所述一级定位标尺211的读数与所述一级单位间距d1的乘积；
如图3中的M’点所示，M’点为所述膜层11对应所述定位单元20处边界线上的一点，M’点正对于所述二级定位标记220，在所述定位单元20处所述膜层11边界距所述显示区域A边缘的距离=2（一级定位标尺211的读数）*600μm（一级单位间距d1）+3（二级定位标尺221的读数）*150μm（二级单位间距d2）=1650μm。
步骤S305，若对应所述定位单元20处的所述膜层11边界位于相邻两所述二级定位标记220之间，则读取所述膜层11边界靠近所述显示区域A一侧且与所述膜层11边界相邻的所述二级定位标尺221的读数，所述膜层11边界距所述显示区域A边缘的距离=读取的所述一级定位标尺211的读数与所述一级单位间距d1的乘积+读取的所述二级定位标尺221的读数与所述二级单位间距d2的乘积+二分之一的所述二级单位间距d2，从而能够确定所述膜层11边界的具体位置。
综上所述，本申请通过在基板四周对应非显示区域的位置设置多组定位单元，每组定位单元均由一一对应的一级定位标记和一级定位标尺，以及嵌套于一级定位标记之下的二级定位标记和二级定位标尺构成。采用此设计，可以大幅提升膜层边界位置的确认精度，缩短开线时间，提升产能，减少人力成本。
综上所述，虽然本申请已以优选实施例揭露如上，但上述优选实施例并非用以限制本申请，本领域的普通技术人员，在不脱离本申请的精神和范围内，均可作各种更动与润饰，因此本申请的保护范围以权利要求界定的范围为准。
Claims (14)
- 一种监控基板上膜层边界位置的方法，其中，所述方法包括以下步骤：步骤S10，提供一基板，所述基板对应显示区域外围的非显示区域设置有多组定位单元，每组定位单元包括由所述显示区域边缘向所述基板边缘分别呈一字型等间距排列的至少两一级定位标记和至少两一级定位标尺，所述一级定位标记与所述一级定位标尺一一对应设置；步骤S20，从所述显示区域的边缘处开始由内向外分别采集所述膜层的边界所对应所述多组定位单元的位置信息；步骤S30，根据所述位置信息确定所述膜层边界所对应所述多组定位单元的所述一级定位标记，读取所述一级定位标记所对应的所述一级定位标尺的读数，以确定所述膜层边界的具体位置。
- 根据权利要求1所述的方法，其中，所述一级定位标尺的读数由所述显示区域边缘向所述基板边缘依次递增，所述一级定位标尺的读数为与之对应的所述一级定位标记从所述显示区域边缘向所述基板边缘方向上的计数个数。
- 根据权利要求1所述的方法，其中，相邻两所述一级定位标记之间设置有呈一字型等间距排列的至少两二级定位标记，以及与所述二级定位标记相对应的二级定位标尺，相邻两所述一级定位标记之间的所述二级定位标尺的读数由所述显示区域边缘向所述基板边缘一侧依次递增，且所述二级定位标尺的读数为与之对应的所述二级定位标记在相邻两所述一级定位标记之间从所述一级定位标尺的读数增大的方向上的计数个数。
- 根据权利要求3所述的方法，其中，相邻两所述一级定位标记之间的间距等于相邻两所述一级定位标记之间的所述二级定位标记的个数与相邻两所述二级定位标记间的二级单位间距的乘积。
- 根据权利要求3所述的方法，其中，读取所述一级定位标记所对应的所述一级定位标尺的读数，以确定所述膜层边界的具体位置的步骤包括：若对应所述定位单元处的所述膜层边界正对于所述一级定位标记，则根据与之对应的所述一级定位标尺的读数与相邻两所述一级定位标记间的一级单位间距的乘积便为所述膜层边界距所述显示区域边缘的距离；若对应所述定位单元处的所述膜层边界位于相邻两所述一级定位标记之间，则读取所述膜层边界靠近所述显示区域一侧且与所述膜层边界相邻的所述一级定位标尺的读数，然后确定所述膜层边界所对应的所述二级定位标记，读取与所述二级定位标记对应的所述二级定位标尺的读数，以确定所述膜层边界的具体位置。
- 根据权利要求5所述的方法，其中，读取与所述二级定位标记对应的所述二级定位标尺的读数，以确定所述膜层边界的具体位置的步骤包括：若对应所述定位单元处的所述膜层边界正对于所述二级定位标记，则读取与之对应的所述二级定位标尺的读数，所述膜层边界距所述显示区域边缘的距离=所述二级定位标尺的读数与相邻两所述二级定位标记间的二级单位间距的乘积+读取的所述一级定位标尺的读数与所述一级单位间距的乘积；若对应所述定位单元处的所述膜层边界位于相邻两所述二级定位标记之间，则读取所述膜层边界靠近所述显示区域一侧且与所述膜层边界相邻的所述二级定位标尺的读数，所述膜层边界距所述显示区域边缘的距离=读取的所述一级定位标尺的读数与所述一级单位间距的乘积+读取的所述二级定位标尺的读数与所述二级单位间距的乘积+二分之一的所述二级单位间距。
- 一种基板，其包括衬底以及位于所述衬底上的膜层，所述基板在对应显示区域外围的非显示区域设置有多组定位单元，每组定位单元包括由所述显示区域边缘向所述基板边缘分别呈一字型等间距排列的至少两一级定位标记和至少两一级定位标尺，所述一级定位标记与所述一级定位标尺一一对应设置；相邻两所述一级定位标记之间设置有呈一字型等间距排列的至少两二级定位标记，以及与所述二级定位标记一一对应设置的二级定位标尺；其中，相邻两所述一级定位标记之间具有一级单位间距，相邻两所述二级定位标记之间具有二级单位间距，根据所述膜层的边界所对应的所述多组定位单元的所述一级定位标尺与所述二级定位标尺的读数，以及结合所述一级单位间距与所述二级单位间距用以确定所述膜层的边界的具体位置。
- 根据权利要求7所述的基板，其中，所述一级定位标尺的读数由所述显示区域边缘向所述基板边缘依次递增，所述一级定位标尺的读数为与之对应的所述一级定位标记从所述显示区域边缘向所述基板边缘方向上的计数个数。
- 根据权利要求8所述的基板，其中，相邻两所述一级定位标记之间的所述二级定位标尺的读数由所述显示区域边缘向所述基板边缘一侧依次递增，且所述二级定位标尺的读数为与之对应的所述二级定位标记在相邻两所述一级定位标记之间从所述一级定位标尺的读数增大的方向上的计数个数。
- 根据权利要求7所述的基板，其中，所述膜层的边界的具体位置为所述膜层的边界距所述显示区域边缘的距离，所述膜层的边界距所述显示区域边缘的距离=所述膜层的边界所对应的所述多组定位单元的所述一级定位标尺的读数与所述一级单位间距的乘积+所述膜层的边界所对应的所述二级定位标尺的读数与所述二级单位间距的乘积。
- 一种基板，其包括衬底以及位于所述衬底上的膜层，所述基板在对应显示区域外围的非显示区域设置有多组定位单元，每组定位单元包括由所述显示区域边缘向所述基板边缘分别呈一字型等间距排列的至少两一级定位标记和至少两一级定位标尺，所述一级定位标记与所述一级定位标尺一一对应设置；相邻两所述一级定位标记之间设置有呈一字型等间距排列的至少两二级定位标记，以及与所述二级定位标记一一对应设置的二级定位标尺；其中，相邻两所述一级定位标记之间具有一级单位间距，相邻两所述二级定位标记之间具有二级单位间距，相邻两所述一级定位标记之间的间距等于相邻两所述一级定位标记之间的所述二级定位标记的个数与相邻两所述二级定位标记间的二级单位间距的乘积；根据所述膜层的边界所对应的所述多组定位单元的所述一级定位标尺与所述二级定位标尺的读数，以及结合所述一级单位间距与所述二级单位间距用以确定所述膜层的边界的具体位置。
- 根据权利要求11所述的基板，其中，所述一级定位标尺的读数由所述显示区域边缘向所述基板边缘依次递增，所述一级定位标尺的读数为与之对应的所述一级定位标记从所述显示区域边缘向所述基板边缘方向上的计数个数。
- 根据权利要求12所述的基板，其中，相邻两所述一级定位标记之间的所述二级定位标尺的读数由所述显示区域边缘向所述基板边缘一侧依次递增，且所述二级定位标尺的读数为与之对应的所述二级定位标记在相邻两所述一级定位标记之间从所述一级定位标尺的读数增大的方向上的计数个数。
- 根据权利要求11所述的基板，其中，所述膜层的边界的具体位置为所述膜层的边界距所述显示区域边缘的距离，所述膜层的边界距所述显示区域边缘的距离=所述膜层的边界所对应的所述多组定位单元的所述一级定位标尺的读数与所述一级单位间距的乘积+所述膜层的边界所对应的所述二级定位标尺的读数与所述二级单位间距的乘积。
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US16/627,841 US11270949B2 (en) | 2019-11-19 | 2019-12-19 | Substrate and method for monitoring positions of boundaries of film layer on the substrate |
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201911131299.3 | 2019-11-19 | ||
| CN201911131299.3A CN110989217B (zh) | 2019-11-19 | 2019-11-19 | 一种基板及监控基板上膜层边界位置的方法 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| WO2021097991A1 true WO2021097991A1 (zh) | 2021-05-27 |
Family
ID=70084878
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| PCT/CN2019/126541 WO2021097991A1 (zh) | 2019-11-19 | 2019-12-19 | 一种基板及监控基板上膜层边界位置的方法 |
Country Status (2)
| Country | Link |
|---|---|
| CN (1) | CN110989217B (zh) |
| WO (1) | WO2021097991A1 (zh) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN112505957A (zh) * | 2020-12-11 | 2021-03-16 | 深圳市华星光电半导体显示技术有限公司 | 一种基板洗边方法、洗边装置及基板 |
Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104597642A (zh) * | 2015-02-16 | 2015-05-06 | 合肥京东方光电科技有限公司 | 一种液晶显示装置及其制备方法 |
| CN104698694A (zh) * | 2015-03-26 | 2015-06-10 | 合肥京东方光电科技有限公司 | 一种液晶面板对合设备及方法 |
| CN105974638A (zh) * | 2016-07-26 | 2016-09-28 | 京东方科技集团股份有限公司 | 一种显示基板及显示装置 |
| CN106873223A (zh) * | 2017-04-20 | 2017-06-20 | 武汉华星光电技术有限公司 | 一种液晶面板组件 |
| CN107039305A (zh) * | 2017-04-12 | 2017-08-11 | 武汉华星光电技术有限公司 | 监控衬底涂布位置的方法 |
| CN108183123A (zh) * | 2017-12-21 | 2018-06-19 | 武汉华星光电半导体显示技术有限公司 | 有机发光显示面板及其制作方法 |
| US10162273B2 (en) * | 2016-02-15 | 2018-12-25 | Boe Technology Group Co., Ltd. | Overlay key, method of forming the same, and method of measuring overlay accuracy |
Family Cites Families (28)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN100423261C (zh) * | 2003-09-15 | 2008-10-01 | 友达光电股份有限公司 | 发光装置 |
| KR101026935B1 (ko) * | 2003-12-10 | 2011-04-04 | 엘지디스플레이 주식회사 | 디스펜서 정렬장치 및 그 방법 |
| KR20050060669A (ko) * | 2003-12-17 | 2005-06-22 | 삼성전자주식회사 | 박막 트랜지스터 표시판의 제조 방법 |
| JP5061277B2 (ja) * | 2005-11-21 | 2012-10-31 | 株式会社ジャパンディスプレイイースト | 表示装置 |
| KR20070109406A (ko) * | 2006-05-11 | 2007-11-15 | 삼성에스디아이 주식회사 | 기판 정렬방법 |
| CN100559113C (zh) * | 2006-11-14 | 2009-11-11 | 胡厚飞 | 可方便辨识的量规 |
| JP5299873B2 (ja) * | 2010-11-30 | 2013-09-25 | 株式会社ジャパンディスプレイ | 液晶表示パネル |
| CN202432213U (zh) * | 2012-01-16 | 2012-09-12 | 上海能巍电气科技有限公司 | 免调节工具的机架式电源分配单元的安装挂钩 |
| CN202511726U (zh) * | 2012-04-13 | 2012-10-31 | 四川大学 | 非零起点游标卡尺 |
| JP5856006B2 (ja) * | 2012-04-27 | 2016-02-09 | 株式会社ジャパンディスプレイ | 液晶表示パネル |
| CN107533249B (zh) * | 2015-02-24 | 2021-04-09 | 阿科玛法国公司 | 高效率的漫射照明遮盖物 |
| CN104777665B (zh) * | 2015-04-28 | 2017-09-01 | 深圳市华星光电技术有限公司 | 黑色矩阵的制作方法 |
| CN104977745B (zh) * | 2015-06-24 | 2018-05-25 | 武汉华星光电技术有限公司 | 液晶显示面板用基板及液晶显示面板切割方法 |
| CN204955827U (zh) * | 2015-08-12 | 2016-01-13 | 徐州工业职业技术学院 | 一种学习专用笔 |
| CN105093697B (zh) * | 2015-08-21 | 2018-03-30 | 深圳市华星光电技术有限公司 | 基板及确定基板配向膜边界的位置的方法 |
| CN105708466A (zh) * | 2016-01-29 | 2016-06-29 | 王洪一 | 一种小血管直径测量尺 |
| CN206379069U (zh) * | 2016-12-13 | 2017-08-04 | 李兆龙 | 一种新型便携式真分数与假分数的演示教具 |
| CN106773525B (zh) * | 2017-03-01 | 2020-06-16 | 合肥京东方光电科技有限公司 | 掩模板、对位方法、显示面板、显示装置及其对盒方法 |
| CN106597760A (zh) * | 2017-03-02 | 2017-04-26 | 合肥京东方光电科技有限公司 | 显示面板母板及其制备方法 |
| CN107065283B (zh) * | 2017-04-17 | 2020-04-07 | 深圳市华星光电半导体显示技术有限公司 | 高ppi面板cf光罩共用的方法 |
| CN107450224B (zh) * | 2017-08-24 | 2020-05-19 | 深圳市华星光电技术有限公司 | Coa型阵列基板的制备方法 |
| CN107329295A (zh) * | 2017-08-25 | 2017-11-07 | 深圳市华星光电技术有限公司 | 一种聚酰亚胺薄膜位置测量方法及对位标记 |
| CN107505754A (zh) * | 2017-09-20 | 2017-12-22 | 深圳市华星光电技术有限公司 | 液晶显示面板及液晶显示器 |
| CN108663852A (zh) * | 2018-03-29 | 2018-10-16 | 上海中航光电子有限公司 | 显示面板和显示装置 |
| CN208847723U (zh) * | 2018-07-29 | 2019-05-10 | 上海天珑自动化设备有限公司 | 一种用于水质分析仪的样品杯 |
| CN209388070U (zh) * | 2018-11-21 | 2019-09-13 | 惠科股份有限公司 | 一种显示面板和显示装置 |
| CN109633956A (zh) * | 2018-11-26 | 2019-04-16 | 深圳市华星光电半导体显示技术有限公司 | Tft阵列基板及其对位方法 |
| CN109683402A (zh) * | 2019-02-19 | 2019-04-26 | 深圳市华星光电技术有限公司 | 一种液晶显示面板及显示装置 |
-
2019
- 2019-11-19 CN CN201911131299.3A patent/CN110989217B/zh active Active
- 2019-12-19 WO PCT/CN2019/126541 patent/WO2021097991A1/zh active Application Filing
Patent Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104597642A (zh) * | 2015-02-16 | 2015-05-06 | 合肥京东方光电科技有限公司 | 一种液晶显示装置及其制备方法 |
| CN104698694A (zh) * | 2015-03-26 | 2015-06-10 | 合肥京东方光电科技有限公司 | 一种液晶面板对合设备及方法 |
| US10162273B2 (en) * | 2016-02-15 | 2018-12-25 | Boe Technology Group Co., Ltd. | Overlay key, method of forming the same, and method of measuring overlay accuracy |
| CN105974638A (zh) * | 2016-07-26 | 2016-09-28 | 京东方科技集团股份有限公司 | 一种显示基板及显示装置 |
| CN107039305A (zh) * | 2017-04-12 | 2017-08-11 | 武汉华星光电技术有限公司 | 监控衬底涂布位置的方法 |
| CN106873223A (zh) * | 2017-04-20 | 2017-06-20 | 武汉华星光电技术有限公司 | 一种液晶面板组件 |
| CN108183123A (zh) * | 2017-12-21 | 2018-06-19 | 武汉华星光电半导体显示技术有限公司 | 有机发光显示面板及其制作方法 |
Also Published As
| Publication number | Publication date |
|---|---|
| CN110989217A (zh) | 2020-04-10 |
| CN110989217B (zh) | 2021-09-24 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN108132558B (zh) | 对位检测方法及显示装置 | |
| CN103744214A (zh) | 一种液晶显示器的玻璃基板的曝光方法 | |
| CN104317158B (zh) | 一种掩膜板、掩膜板组、彩膜基板及显示装置 | |
| CN106773525B (zh) | 掩模板、对位方法、显示面板、显示装置及其对盒方法 | |
| CN105182697B (zh) | 一种On Cell结构触摸显示屏及其制作方法、显示装置 | |
| CN105974638B (zh) | 一种显示基板及显示装置 | |
| US9298034B1 (en) | Liquid crystal display device and method for manufacturing the same | |
| CN104849901A (zh) | 柱状隔垫物的对位标识的制备方法和精度检测方法 | |
| CN104297989A (zh) | 基板、掩膜板及液晶显示装置 | |
| WO2021097991A1 (zh) | 一种基板及监控基板上膜层边界位置的方法 | |
| CN105867066B (zh) | 掩膜板、显示基板的制作方法、显示基板及显示装置 | |
| EP3214488B1 (en) | Display panel mother board, display panel and method for manufacturing same and display device | |
| US20170320224A1 (en) | Display panel | |
| CN110716359A (zh) | 阵列基板及其制造方法与对准精度检测方法 | |
| US20240111193A1 (en) | Display substrate, display panel, display device, method of detecting post spacer, and method of manufacturing post spacer | |
| CN108508658B (zh) | 彩膜基板、彩膜基板的制作方法及显示面板 | |
| WO2022199192A1 (zh) | Coa型阵列基板及其测量方法、液晶显示面板 | |
| CN106547139A (zh) | 一种液晶显示面板及液晶显示装置 | |
| US11270949B2 (en) | Substrate and method for monitoring positions of boundaries of film layer on the substrate | |
| CN103676299B (zh) | 彩膜基板、显示装置及彩膜基板的制造方法 | |
| JPH0360437A (ja) | 切断マーク | |
| CN110764327A (zh) | 阵列基板及其制备方法 | |
| CN101349826B (zh) | 显示器及测量该显示器对位组立偏移的方法 | |
| TWI416236B (zh) | 雙穩態顯示裝置 | |
| US20050062926A1 (en) | Indicator for deciding grinding amount of liquid crystal display panel and method for detecting grinding failure using the same |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| 121 | Ep: the epo has been informed by wipo that ep was designated in this application |
Ref document number: 19953289 Country of ref document: EP Kind code of ref document: A1 |
|
| NENP | Non-entry into the national phase |
Ref country code: DE |
|
| 122 | Ep: pct application non-entry in european phase |
Ref document number: 19953289 Country of ref document: EP Kind code of ref document: A1 |