WO2020062513A1 - 阵列基板和显示面板 - Google Patents

阵列基板和显示面板 Download PDF

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Publication number
WO2020062513A1
WO2020062513A1 PCT/CN2018/116880 CN2018116880W WO2020062513A1 WO 2020062513 A1 WO2020062513 A1 WO 2020062513A1 CN 2018116880 W CN2018116880 W CN 2018116880W WO 2020062513 A1 WO2020062513 A1 WO 2020062513A1
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WO
WIPO (PCT)
Prior art keywords
line
test line
bending section
cutting
test
Prior art date
Application number
PCT/CN2018/116880
Other languages
English (en)
French (fr)
Inventor
李泽尧
Original Assignee
惠科股份有限公司
重庆惠科金渝光电科技有限公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 惠科股份有限公司, 重庆惠科金渝光电科技有限公司 filed Critical 惠科股份有限公司
Priority to US16/982,588 priority Critical patent/US11175547B2/en
Publication of WO2020062513A1 publication Critical patent/WO2020062513A1/zh

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Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
    • G02F1/136—Liquid crystal cells structurally associated with a semi-conducting layer or substrate, e.g. cells forming part of an integrated circuit
    • G02F1/1362—Active matrix addressed cells
    • G02F1/136254—Checking; Testing
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
    • G02F1/136—Liquid crystal cells structurally associated with a semi-conducting layer or substrate, e.g. cells forming part of an integrated circuit
    • G02F1/1362—Active matrix addressed cells
    • G02F1/136259—Repairing; Defects
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
    • G02F1/1333—Constructional arrangements; Manufacturing methods
    • G02F1/133351—Manufacturing of individual cells out of a plurality of cells, e.g. by dicing
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
    • G02F1/136—Liquid crystal cells structurally associated with a semi-conducting layer or substrate, e.g. cells forming part of an integrated circuit
    • G02F1/1362—Active matrix addressed cells
    • G02F1/136286—Wiring, e.g. gate line, drain line
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
    • G02F1/136—Liquid crystal cells structurally associated with a semi-conducting layer or substrate, e.g. cells forming part of an integrated circuit
    • G02F1/1362—Active matrix addressed cells
    • G02F1/136259—Repairing; Defects
    • G02F1/136263—Line defects

Definitions

  • the present application relates to the field of display technology, and in particular, to an array substrate and a display panel.
  • the statements herein merely provide background information related to the present application and do not necessarily constitute prior art.
  • the liquid crystal display technology is widely used in the display of televisions, mobile phones, and public information.
  • the liquid crystal display is a flat and ultra-thin display device, and the entire society has a great demand for it.
  • multiple display panels are generally produced on a large glass substrate, and then the large glass substrate is divided into a plurality of individual display panels by a cutter wheel along a specific cutting line. Before cutting, it is necessary to perform some tests or inspections on the large glass substrate, so it is necessary to set some test circuits (conductive thin film circuits) on the large glass substrate to transmit electrical signals when the large glass substrate is tested or detected.
  • test circuits conductive thin film circuits
  • these test circuits are generally designed in a gap (cutting area) between a plurality of display panels. It is inevitable that a cross-line structure (that is, test circuit crossings transmitting different signals) exists in these test circuits. In order to prevent different electrical signals from interfering with each other, different test lines are insulated from each other through an insulating layer. However, when the cutter wheel cuts, because the cutter wheel cuts through this cross-wire structure, it is easy to cause short circuits between the two test lines transmitting different electrical signals, resulting in interference between the different signals.
  • the main purpose of the present application is to propose an array substrate, which aims to avoid short circuits between the two test lines on the array substrate that transmit different electrical signals.
  • an array substrate provided in this application includes:
  • a substrate body comprising a plurality of display units and a cutting area located between the plurality of display units;
  • a first test line provided in the cutting area
  • a second test line is provided in the cutting area, the second test line and the first test line are arranged to cross each other, and the second test line and the first test line are insulated from each other;
  • a cutting line is provided in the cutting area, and the first test line and / or the second test line includes a bending section, and the bending section is arranged to cross the cutting line.
  • the array substrate further includes a first cross-line portion, where the first cross-line portion is located at an intersection of the first test line and the second test line, and the first cross-line portion is located at On the cutting line.
  • the first test line includes a main body section, a connecting section, and a bent section
  • the connecting section connects the bent section and the main body section
  • the main body section crosses the second test line Settings.
  • the bent section is located on one side of the first crossover portion.
  • the first test line includes a bending section
  • the bending section includes a first bending section and a second bending section
  • the first bending section and the second bending section are respectively located at Opposite two sides of the first cross-line portion, and the first bending section and the second bending section are arranged to cross the cutting line.
  • the array substrate further includes a third test line, the third test line is provided in the cutting area, and is arranged to cross the first test line, and the third test line and the first test line A test lead is insulated from each other.
  • the array substrate further includes a second cross-line portion, where the second cross-line portion is located at the intersection of the first test line and the third test line, and the second cross-line portion is located On the cutting line.
  • the bending section further includes a third bending section, the third bending section is located on a side of the third test line remote from the second test line, and the third bending section Crossed with the cutting line.
  • an included angle between the bending section and the cutting line is greater than 0 ° and less than or equal to 90 °.
  • the present application also proposes an array substrate.
  • the array substrate includes:
  • the substrate body includes a plurality of display units and a cutting area, a plurality of the display units are arranged in an array, and a gap between the plurality of display units forms the cutting area;
  • a first test line provided in the cutting area
  • a second test line is provided in the cutting area, the second test line and the first test line are arranged to cross each other, and the second test line and the first test line are insulated from each other;
  • a cutting line is provided in the cutting area, and the first test line and / or the second test line includes a bending section, and the bending section is arranged to cross the cutting line.
  • the present application also proposes a display panel.
  • the display panel is formed by cutting an array substrate.
  • the array substrate includes:
  • a substrate body comprising a plurality of display units and a cutting area located between the plurality of display units;
  • a first test line provided in the cutting area
  • a second test line is provided in the cutting area, the second test line and the first test line are arranged to cross each other, and the second test line and the first test line are insulated from each other;
  • a cutting line is provided in the cutting area, and the first test line and / or the second test line includes a bending section, and the bending section is arranged to cross the cutting line.
  • the array substrate further includes a first cross-line portion, where the first cross-line portion is located at an intersection of the first test line and the second test line, and the first cross-line portion is located at On the cutting line.
  • the first test line includes a main body section, a connecting section, and a bent section
  • the connecting section connects the bent section and the main body section
  • the main body section crosses the second test line Settings.
  • the bent section is located on one side of the first crossover portion.
  • the bending section includes a first bending section and a second bending section, and the first bending section and the second bending section are located on opposite sides of the first crossover portion, respectively.
  • the first bending section and the second bending section are both arranged to cross the cutting line.
  • the array substrate further includes a third test line, the third test line is provided in the cutting area, and is arranged to cross the first test line, and the third test line and the first test line A test lead is insulated from each other.
  • the array substrate further includes a second cross-line portion, where the second cross-line portion is located at the intersection of the first test line and the third test line, and the second cross-line portion is located On the cutting line.
  • the bending section further includes a third bending section, the third bending section is located on a side of the third test line remote from the second test line, and the third bending section Crossed with the cutting line.
  • an included angle between the bending section and the cutting line is greater than 0 ° and less than or equal to 90 °.
  • a plurality of the display units are arranged in an array, and a gap between the plurality of display units forms the cutting area.
  • a plurality of display units and a cutting area located between the plurality of display units are provided on the substrate body, and a first test line and a second test line are provided in the cutting area.
  • the first test line It is arranged to cross the second test line, and the first test line and the second test line are insulated from each other, so that the first test line and the second test line independently transmit electrical signals;
  • the cutting area is further provided with a cutting line, and the first test line and / or the second test line includes a bending section, and the bending section and the cutting line are arranged to cross each other.
  • a short circuit occurs between the first test line and the second test line due to cutting by a cutter wheel, so that the display panel formed by cutting the array substrate will not be abnormal during subsequent applications.
  • FIG. 1 is a schematic structural diagram of an array substrate of the present application
  • FIG. 2 is a schematic diagram of a test circuit distribution according to an embodiment of the array substrate in FIG. 1;
  • FIG. 3 is a schematic cross-sectional view of a first cross-line portion of the array substrate in FIG. 1;
  • FIG. 4 is a schematic diagram of a test circuit distribution of another embodiment of the array substrate in FIG. 1;
  • FIG. 5 is a schematic diagram of a test circuit distribution of another embodiment of the array substrate in FIG. 1.
  • the directional indication is only used to explain in a specific posture (as shown in the drawings) (Shown) the relative positional relationship, movement, etc. of the various components, if the specific posture changes, the directional indicator will change accordingly.
  • the liquid crystal display panel includes an array substrate, a color filter substrate facing the array substrate, and a liquid crystal layer disposed between the array substrate and the color filter substrate.
  • an array substrate is made by a multi-pass photolithography process, and a multilayer functional film (such as an insulating functional film) and a conductive film are integrated thereon.
  • the conductive film exists in different shapes of lines, and plays a role of transmitting electrical signals in the manufacturing and using process of the liquid crystal display panel.
  • the conductive thin film circuit includes a first type of conductive film circuit and a second type of conductive film circuit.
  • the first type of conductive film circuit is designed in each single-chip liquid crystal display panel to transmit electrical signals for normal use of the liquid crystal display panel;
  • the second type of conductive thin film circuit is designed in a gap between a plurality of liquid crystal display panels, and is used to transmit electrical signals before cutting the array substrate to test or detect the array substrate.
  • the array substrate 100 proposed in the present application includes a substrate body 110, a first test line 120, a second test line 130, and a cutting line 112.
  • the substrate body 110 includes a plurality of display units 111 and a cutting area 113 located between the plurality of display units 111.
  • the first test line 120 is disposed in the cutting area 113;
  • the second test line 130 is disposed in the cutting area 113, and the second test line 130 and the first test line 120 are arranged to cross each other.
  • the second test line 130 and the first test line 120 are insulated from each other.
  • the cutting line 112 is disposed in the cutting area 113.
  • the first test line 120 and / or the second test line 130 includes a bending section 121, and the bending section 121 intersects the cutting line 112. Settings.
  • the plurality of display units 111 on the substrate body 110 are arranged in an array, and a gap between the plurality of display units 111 forms a cutting area 113.
  • the cutting area 113 is provided with a first test line 120 and a second test line 130.
  • the first test line 120 and the second test line 130 are both conductive thin film lines integrated on the array substrate 100.
  • the first test line 120 and the second test line 130 are respectively located on layers of different heights of the substrate body 110 and are insulated from each other by an insulating function layer 170 (as shown in FIG. 3).
  • the array substrate further includes a first cross-line portion 150 located at the intersection of the first test line 120 and the second test line 130.
  • intersection of the first test line 120 and the second test line 130 means that the projections of the first test line 120 and the second test line 130 in the plane where the substrate body 110 is located are arranged crosswise. That is, a cross-line portion is formed between the first test line 120 and the second test line 130.
  • a cross-line portion formed between the first test line 120 and the second test line 130 is defined as the first cross-line portion 150.
  • the first test line 120 may extend in the lateral direction or in the longitudinal direction.
  • the second test line 130 may extend in the lateral direction or in the longitudinal direction, which is not specifically limited herein.
  • the first test line 120 if the first test line 120 extends in the lateral direction, the second test line 130 extends in the longitudinal direction; if the first test line 120 extends in the longitudinal direction, the second test line 130 extends in the lateral direction; A cross-line portion is formed between the first test line 120 and the second test line 130.
  • the following description is made by taking the first test line 120 extending in the longitudinal direction and the second test line 130 extending in the lateral direction as an example.
  • the cutting line 112 in the cutting area 113 is mainly used to define the cutting track of the cutter wheel.
  • the cutting line 112 may extend in the lateral direction.
  • the cutting line 112 may also extend in the longitudinal direction, which is not specifically limited herein.
  • the first test line 120 includes a bending section 121, and the cutting line 112 and the bending section 121 of the first test line 120 are arranged crosswise.
  • the first test line 120 can be cut into at least two parts, so that the first test line 120 is disconnected, and a short circuit between the first test line 120 and the second test line 130 is avoided.
  • the second test line 130 includes a bending section 121, and the cutting line 112 and the bending section 121 of the second test line 130 are arranged in an intersection. In this way, when the cutter wheel cuts along the cutting line 112 When the second test line 130 is cut into at least two segments, the second test line 130 is disconnected, and a short circuit between the first test line 120 and the second test line 130 is avoided.
  • the cutting line 112 is extended in the longitudinal direction, and the first test line 120 includes a bending section 121.
  • the cutting line 112 and the bending section 121 of the first test line 120 are arranged in an intersection as an example for detailed description.
  • the first test line 120 includes a main body section 122, a connecting section 123, and a bending section 121.
  • the connecting section 123 is connected to the bending section. 121 and the main body section 122 are arranged in an intersection with the second test line 130.
  • the first cross-line portion 150 is located at the intersection of the main body segment 122 and the second test line 130.
  • the bending section 121 is provided in a straight line type.
  • the bending section 121 may be provided in a line type.
  • the number of the bending sections 121 is not specifically limited.
  • the number of the bending sections 121 may be one, two, or more.
  • the bent sections 121 of the first test line 120 are located on one side (upper or lower side) of the first crossover portion 150; for example, if The number of the bending sections 121 of the first test line 120 is two, and the two bending sections 121 are respectively located on opposite sides (upper and lower sides) of the first cross-line portion 150.
  • the connecting section 123 may be a straight line, an L-shape, or other special shapes, which are not specifically limited herein. In the embodiment of the present application, the connecting section 123 is L-shaped.
  • the first crossover portion 150 is located on the cutting line 112, that is, when the cutter wheel performs cutting, the first crossover portion 150 is cut.
  • the cutting line 112 and the bending section 121 of the first test line 120 can be set to cross, so that when the cutter wheel cuts along the cutting line 112, the bending section of the first test line 120 can be cut off. 121, and the first test line 120 is cut into at least two sections, so that the first test line 120 is disconnected, and a short circuit between the first test line 120 and the second test line 130 is avoided.
  • the first crossover portion 150 may also be located on one side of the cutting line 112, that is, the first crossover portion will not be cut when the cutter wheel performs cutting. 150, which can effectively avoid the potential short circuit between the first test line 120 and the second test line 130.
  • a plurality of display units 111 and a cutting area 113 located between the plurality of display units 111 are provided on the substrate body 110, and a first test line 120 and a second test line 130 are provided in the cutting area 113.
  • the first test line 120 and the second test line 130 are arranged in a cross, and the first test line 120 and the second test line 130 are insulated from each other, so that the first test line 120 and the second test line 130 are insulated from each other.
  • Each of the second test lines 130 independently transmits an electrical signal; the cutting area 113 is further provided with a cutting line 112, the first test line 120 and / or the second test line 130 includes a bending section 121, and the bend The folding section 121 and the cutting line 112 are arranged crosswise. In this way, a short circuit between the first test line 120 and the second test line 130 due to cutting by a cutter wheel can be effectively avoided, so that the array substrate 100 The display panel formed by cutting will not be abnormal in the subsequent application process.
  • the bent section 121 of the first test line 120 is located on the upper side of the first cross-line portion 150, and the bent section 121 is disposed to cross the cutting line 112.
  • the first test line 120 may be cut into two sections, so that the first test line 120 is disconnected, and a short circuit between the first test line 120 and the second test line 130 is avoided.
  • the bent section 121 of the first test line 120 is located on the lower side of the first cross-line portion 150, and the bent section 121 and the cutting line 112 are arranged to cross each other. Similarly, when the cutter wheel cuts along the cutting line 112, the first test line 120 can be cut into two sections, so that the first test line 120 is disconnected, and the occurrence between the first test line 120 and the second test line 130 is avoided. Short circuit.
  • the bending section 121 of the first test line 120 includes a first bending section 121 a and a second bending section 121 b.
  • the first bending section 121 a and the The second bending sections 121b are respectively located on opposite sides of the first cross section 150, and the first bending section 121a and the second bending section 121b are arranged to cross the cutting line 112.
  • the first cross-line portion 150 can be isolated, so that a short circuit between the first test line 120 and the second test line 130 can be effectively avoided.
  • the array substrate 100 further includes a third test line 140.
  • the third test line 140 is disposed in the cutting area 113 and is in line with the first test line. 120 is arranged crosswise, and the third test line 140 and the first test line 120 are insulated from each other.
  • the third test line 140 extends in a lateral direction, and the third test line 140 and the first test line 120 are located on layers of different heights of the array substrate 100 and are insulated from each other by an insulating function layer 170.
  • the array substrate further includes a second cross-line portion 160 located at the intersection of the first test line 120 and the third test line 130.
  • the intersection of the first test line 120 and the third test line 140 means that the projections of the first test line 120 and the third test line 140 on the plane where the substrate body 110 is located are arranged crosswise. That is, a cross-line portion is formed between the first test line 120 and the third test line 140.
  • a cross-line portion formed between the first test line 120 and the third test line 140 may be defined as the second cross-line portion 160.
  • the second cross-line portion 160 is located on the cutting line 112.
  • the bending section 121 of the first test line 120 further includes a third bending section 121c, and the third bending section 121c is located on the third test line 140 away from the second test.
  • the third bent section 121c is disposed to cross the cutting line 112. In this way, when the cutter wheel cuts along the cutting line 112, both the first and second cross-line portions 150 and 160 can be isolated, thereby avoiding a short circuit between the second and third test lines 130 and 140.
  • an included angle between the bending section 121 and the cutting line 112 is greater than 0 ° and less than or equal to 90 °.
  • an included angle between the bending section 121 and the cutting line 112 is 30 °, 60 °, 70 °, 90 °, or the like.
  • the bending section 121 includes a first bending section 121a, a second bending section 121b, and a third bending section 121c.
  • the present application also proposes a display panel, which is formed by cutting the above-mentioned array substrate 100.
  • a display panel which is formed by cutting the above-mentioned array substrate 100.
  • the specific structure of the array substrate 100 refer to the above embodiments. Since the array substrate 100 adopts all the technical solutions of all the above embodiments, it has at least all the beneficial effects brought by the technical solutions of the above embodiments, and is not described here again. One more detail.

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  • Physics & Mathematics (AREA)
  • Nonlinear Science (AREA)
  • Engineering & Computer Science (AREA)
  • Mathematical Physics (AREA)
  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Devices For Indicating Variable Information By Combining Individual Elements (AREA)
  • Manufacturing & Machinery (AREA)

Abstract

一种阵列基板（100）和由该阵列基板（100）切割形成的显示面板，其中，阵列基板（100）包括基板本体（110）、第一测试线（120）、第二测试线（130）及切割线（112）；基板本体（110）包括多个显示单元（111）和位于多个显示单元（111）之间的切割区（113）；第一测试线（120）与第二测试线（130）设于切割区（113）；第一测试线（120）与第二测试线（130）呈交叉设置且相互绝缘；第一测试线（120）和/或第二测试线（130）包括弯折段，弯折段与切割线（112）呈交叉设置。

Description

阵列基板和显示面板
相关申请
本申请要求2018年9月30日申请的，申请号为201811157046.9，名称为“阵列基板和显示面板”的中国专利申请的优先权，在此将其全文引入作为参考。
技术领域
本申请涉及显示技术领域，特别涉及一种阵列基板和显示面板。
背景技术
这里的陈述仅提供与本申请有关的背景信息，而不必然地构成现有技术。液晶显示技术被广泛应用于电视、手机以及公共信息的显示，液晶显示器为平面超薄的显示设备，整个社会对其需求量非常大。为了提高产能和生产效率，一般采用将多个显示面板在大玻璃基板上集中制作，再通过刀轮沿特定的切割线将大玻璃基板分割成为多个单独的显示面板。而在进行切割之前，需要对大玻璃基板做一些测试或者检测，所以需要在大玻璃基板上设置一些测试线路（导电薄膜线路），以在对大玻璃基板进行测试或者检测时传输电信号。
在一示例性实施例中，一般将这些测试线路设计在多个显示面板之间的间隙（切割区）中，这些测试线路中难免会存在跨线结构（即传输不同信号的测试线路交叉）。为了防止不同电信号之间相互干扰，不同的测试线路之间是通过绝缘层彼此绝缘的。然而，在刀轮进行切割时，由于刀轮会切过这种跨线结构，所以很容易造成传输不同电信号的两测试线路之间发生短路，从而导致不同信号之间相互干扰。
申请内容
本申请的主要目的是提出一种阵列基板，旨在避免该阵列基板上的传输不同电信号的两测试线之间发生短路。
为实现上述目的，本申请提出的一种阵列基板，包括：
基板本体，包括多个显示单元和位于多个显示单元之间的切割区；
第一测试线，设于所述切割区；
第二测试线，设于所述切割区，所述第二测试线与所述第一测试线呈交叉设置，所述第二测试线与所述第一测试线相互绝缘；以及
切割线，设于所述切割区，所述第一测试线和/或所述第二测试线包括弯折段，所述弯折段与所述切割线呈交叉设置。
可选地，所述阵列基板还包括第一跨线部，所述第一跨线部位于所述第一测试线与所述第二测试线的交叉重叠处，所述第一跨线部位于所述切割线上。
可选地，所述第一测试线包括主体段、连接段及弯折段，所述连接段连接所述弯折段与所述主体段，所述主体段与所述第二测试线呈交叉设置。
可选地，所述弯折段位于所述第一跨线部的一侧。
可选地，所述第一测试线包括弯折段，所述弯折段包括第一弯折段和第二弯折段，所述第一弯折段与所述第二弯折段分别位于所述第一跨线部的相对两侧，且所述第一弯折段与所述第二弯折段均与所述切割线呈交叉设置。
可选地，所述阵列基板还包括第三测试线，所述第三测试线设于所述切割区，且与所述第一测试线呈交叉设置，所述第三测试线与所述第一测试线相互绝缘。
可选地，所述阵列基板还包括第二跨线部，所述第二跨线部位于所述第一测试线与所述第三测试线的交叉重叠处，所述第二跨线部位于所述切割线上。
可选地，所述弯折段还包括第三弯折段，所述第三弯折段位于所述第三测试线的远离所述第二测试线的一侧，所述第三弯折段与所述切割线呈交叉设置。
可选地，所述弯折段与所述切割线之间的夹角大于0°且小于等于90°。
本申请还提出一种阵列基板，所述阵列基板包括：
基板本体，包括多个显示单元和切割区，多个所述显示单元呈阵列排布，多个所述显示单元之间的间隙形成所述切割区；
第一测试线，设于所述切割区；
第二测试线，设于所述切割区，所述第二测试线与所述第一测试线呈交叉设置，所述第二测试线与所述第一测试线相互绝缘；以及
切割线，设于所述切割区，所述第一测试线和/或所述第二测试线包括弯折段，所述弯折段与所述切割线呈交叉设置。
本申请还提出一种显示面板，所述显示面板由阵列基板切割形成，所述阵列基板包括：
基板本体，包括多个显示单元和位于多个显示单元之间的切割区；
第一测试线，设于所述切割区；
第二测试线，设于所述切割区，所述第二测试线与所述第一测试线呈交叉设置，所述第二测试线与所述第一测试线相互绝缘；以及
切割线，设于所述切割区，所述第一测试线和/或所述第二测试线包括弯折段，所述弯折段与所述切割线呈交叉设置。
可选地，所述阵列基板还包括第一跨线部，所述第一跨线部位于所述第一测试线与所述第二测试线的交叉重叠处，所述第一跨线部位于所述切割线上。
可选地，所述第一测试线包括主体段、连接段及弯折段，所述连接段连接所述弯折段与所述主体段，所述主体段与所述第二测试线呈交叉设置。
可选地，所述弯折段位于所述第一跨线部的一侧。
可选地，所述弯折段包括第一弯折段和第二弯折段，所述第一弯折段与所述第二弯折段分别位于所述第一跨线部的相对两侧，所述第一弯折段与所述第二弯折段均与所述切割线呈交叉设置。
可选地，所述阵列基板还包括第三测试线，所述第三测试线设于所述切割区，且与所述第一测试线呈交叉设置，所述第三测试线与所述第一测试线相互绝缘。
可选地，所述阵列基板还包括第二跨线部，所述第二跨线部位于所述第一测试线与所述第三测试线的交叉重叠处，所述第二跨线部位于所述切割线上。
可选地，所述弯折段还包括第三弯折段，所述第三弯折段位于所述第三测试线的远离所述第二测试线的一侧，所述第三弯折段与所述切割线呈交叉设置。
可选地，所述弯折段与所述切割线之间的夹角大于0°且小于等于90°。
可选地，多个所述显示单元呈阵列排布，多个所述显示单元之间的间隙形成所述切割区。
本申请的技术方案通过在基板本体上设置多个显示单元和位于多个显示单元之间的切割区，并在所述切割区设置第一测试线和第二测试线，所述第一测试线与所述第二测试线呈交叉设置，且所述第一测试线与所述第二测试线相互绝缘，以使所述第一测试线与所述第二测试线各自独立传输电信号；所述切割区还设有切割线，所述第一测试线和/或所述第二测试线包括弯折段，所述弯折段与所述切割线呈交叉设置，如此，可有效避免所述第一测试线与所述第二测试线之间因刀轮切割而发生短路，从而使得由该阵列基板切割形成的显示面板在后续的应用过程中不会出现异常。
附图说明
为了更清楚地说明本申请实施例或示例性技术中的技术方案，下面将对实施例或示例性技术描述中所需要使用的附图作简单地介绍，显而易见地，下面描述中的附图仅仅是本申请的一些实施例，对于本领域普通技术人员来讲，在不付出创造性劳动的前提下，还可以根据这些附图示出的结构获得其他的附图。
图1为本申请阵列基板的结构示意图；
图2为图1中阵列基板的一实施例的测试线路分布示意图；
图3为图1中阵列基板的第一跨线部处的截面示意图；
图4为图1中阵列基板的另一实施例的测试线路分布示意图；
图5为图1中阵列基板的又一实施例的测试线路分布示意图。
附图标号说明：
标号 名称 标号 名称
100 阵列基板 121c 第三弯折段
110 基板本体 122 主体段
111 显示单元 123 连接段
112 切割线 130 第二测试线
113 切割区 140 第三测试线
120 第一测试线 150 第一跨线部
121 弯折段 160 第二跨线部
121a 第一弯折段 170 绝缘功能层
121b 第二弯折段
本申请目的的实现、功能特点及优点将结合实施例，参照附图做进一步说明。
具体实施方式
下面将结合本申请实施例中的附图，对本申请实施例中的技术方案进行清楚、完整地描述，显然，所描述的实施例仅仅是本申请的一部分实施例，而不是全部的实施例。基于本申请中的实施例，本领域普通技术人员在没有作出创造性劳动前提下所获得的所有其他实施例，都属于本申请保护的范围。
需要说明，若本申请实施例中有涉及方向性指示（诸如上、下、左、右、前、后……），则该方向性指示仅用于解释在某一特定姿态（如附图所示）下各部件之间的相对位置关系、运动情况等，如果该特定姿态发生改变时，则该方向性指示也相应地随之改变。
另外，若本申请实施例中有涉及“第一”、“第二”等的描述，则该“第一”、“第二”等的描述仅用于描述目的，而不能理解为指示或暗示其相对重要性或者隐含指明所指示的技术特征的数量。由此，限定有“第一”、“第二”的特征可以明示或者隐含地包括至少一个该特征。另外，全文中出现的“和/或”的含义为，包括三个并列的方案，以“A和/或B”为例，包括A方案，或B方案，或A和B同时满足的方案。
另外，各个实施例之间的技术方案可以相互结合，但是必须是以本领域普通技术人员能够实现为基础，当技术方案的结合出现相互矛盾或无法实现时应当认为这种技术方案的结合不存在，也不在本申请要求的保护范围之内。
液晶显示面板包括阵列基板、与阵列基板对置的彩膜基板、以及设置在阵列基板与彩膜基板之间的液晶层。制备液晶显示面板时，为了提高产能，通常采用在一个较大的阵列基板（大玻璃基板）上集中制作多个液晶显示面板，然后通过刀轮沿切割区的切割线进行切割，最后得到多个独立的液晶显示面板。
本申请提出了一种阵列基板。一般而言，阵列基板是通过多道光刻工艺制作而成，其上集成了多层功能薄膜（例如绝缘功能薄膜）和导电薄膜。导电薄膜以不同形状的线路存在，在液晶显示面板的制作和使用过程中起到了传输电信号的作用。其中，该导电薄膜线路包括第一类导电薄膜线路和第二类导电薄膜线路，第一类导电薄膜线路设计在每个单片液晶显示面板内，用以传输电信号供液晶显示面板正常使用；第二类导电薄膜线路设计在多个液晶显示面板之间的间隙中，用以在对阵列基板进行切割前传输电信号，以对阵列基板进行测试或者检测。
请参阅图1至图3，本申请提出的阵列基板100，包括基板本体110、第一测试线120、第二测试线130及切割线112。所述基板本体110包括多个显示单元111和位于多个显示单元111之间的切割区113。所述第一测试线120设于所述切割区113；所述第二测试线130设于所述切割区113，所述第二测试线130与所述第一测试线120呈交叉设置，所述第二测试线130与所述第一测试线120相互绝缘。所述切割线112设于所述切割区113，所述第一测试线120和/或所述第二测试线130包括弯折段121，所述弯折段121与所述切割线112呈交叉设置。
具体而言，基板本体110上的多个显示单元111呈阵列排布，多个显示单元111之间的间隙形成切割区113。切割区113内设有第一测试线120和第二测试线130，第一测试线120和第二测试线130均为集成在阵列基板100上的导电薄膜线路。第一测试线120与第二测试线130分别位于基板本体110的不同高度的层上，并且通过绝缘功能层170相互绝缘（如图3所示）。所述阵列基板还包括第一跨线部150，所述第一跨线部150位于所述第一测试线120与所述第二测试线130的交叉重叠处。在此，需要说明的是，第一测试线120与第二测试线130呈交叉设置是指，第一测试线120与第二测试线130在基板本体110所在的平面内的投影呈交叉设置，也即第一测试线120与第二测试线130之间形成有跨线部。为了便于描述，将第一测试线120与第二测试线130之间形成的跨线部定义为第一跨线部150。
第一测试线120可以沿横向延伸，也可沿纵向延伸；同样，第二测试线130可以沿横向延伸，也可沿纵向延伸，在此不做具体限定。在本申请实施例中，若第一测试线120沿横向延伸，则第二测试线130沿纵向延伸；若第一测试线120沿纵向延伸，则第二测试线130沿横向延伸；如此才能使第一测试线120与第二测试线130之间形成跨线部。为了便于描述，下面将以第一测试线120沿纵向延伸，第二测试线130沿横向延伸为例进行介绍。
所述切割区113内的切割线112主要用以限定出刀轮的切割轨迹。其中，所述切割线112可以沿横向延伸，当然，所述切割线112也可以沿纵向延伸，在此也不做具体限定。需要指出的是，若切割线112沿纵向延伸，第一测试线120包括弯折段121，所述切割线112与第一测试线120的弯折段121呈交叉设置，这样，当刀轮沿切割线112进行切割时，才能将第一测试线120切割为至少两部分，从而将第一测试线120断开，避免了第一测试线120与第二测试线130之间发生短路。若切割线112沿横向延伸，第二测试线130包括弯折段121，所述切割线112与第二测试线130的弯折段121呈交叉设置，如此，当刀轮沿切割线112进行切割时，才能将第二测试线130切割为至少两段，从而将第二测试线130断开，避免了第一测试线120与第二测试线130之间发生短路。下面将以切割线112沿纵向延伸，第一测试线120包括弯折段121，所述切割线112与第一测试线120的弯折段121呈交叉设置为例进行详细描述。
在本申请实施例中，请参阅图2、图4及图5，所述第一测试线120包括主体段122、连接段123及弯折段121，所述连接段123连接所述弯折段121与所述主体段122，所述主体段122与所述第二测试线130呈交叉设置。所述第一跨线部150位于所述主体段122与所述第二测试线130的交叉重叠处。具体地，所述弯折段121呈直线型设置，当然，所述弯折段121也可呈折线型设置。关于所述弯折段121的数量将不做具体限定，例如，所述弯折段121的数量可以为一个、两个或者多个等。例如，若所述第一测试线120的弯折段121的数量为一个，则该弯折段121位于所述第一跨线部150的一侧（上侧或下侧）；又例如，若所述第一测试线120的弯折段121的数量为两个，则两所述弯折段121分别位于所述第一跨线部150的相对两侧（上侧和下侧）。下文将进行详细阐述。另外，关于所述连接段123的形状可以有多种，例如，所述连接段123可以为直线型、L形或者其它异形等，在此不做具体限定。在本申请实施例中，所述连接段123为L形。
请参阅图2、图4，在本申请实施例中，所述第一跨线部150位于所述切割线112上，即刀轮进行切割时，会切割该第一跨线部150。此时，由于导电薄膜具有延展性，使得第一测试线120的导电薄膜与第二测试线130的导电薄膜之间出现搭接而发生短路。所以，可通过使所述切割线112与第一测试线120的弯折段121呈交叉设置，这样当刀轮沿切割线112进行切割时，可通过切断该第一测试线120的弯折段121，而将第一测试线120切割为至少两段，从而将第一测试线120断开，避免了第一测试线120与第二测试线130之间发生短路。
当然，可以理解地，在其它实施例中，所述第一跨线部150也可位于所述切割线112的一侧，也即，刀轮进行切割时，不会切割该第一跨线部150，从而可有效避免第一测试线120与第二测试线130之间出现短路隐患。
本申请的技术方案通过在基板本体110上设置多个显示单元111和位于多个显示单元111之间的切割区113，并在所述切割区113设置第一测试线120和第二测试线130，所述第一测试线120与所述第二测试线130呈交叉设置，且所述第一测试线120与所述第二测试线130相互绝缘，以使所述第一测试线120与所述第二测试线130各自独立传输电信号；所述切割区113还设有切割线112，所述第一测试线120和/或所述第二测试线130包括弯折段121，所述弯折段121与所述切割线112呈交叉设置，如此，可有效避免所述第一测试线120与所述第二测试线130之间因刀轮切割而发生短路，从而使得由该阵列基板100切割形成的显示面板在后续的应用过程中不会出现异常。
关于第一测试线120的弯折段121的位置分布可以有多种，下面将进行详细阐述。
请参阅图2，在一实施例中，所述第一测试线120的弯折段121位于第一跨线部150的上侧，该弯折段121与切割线112呈交叉设置。当刀轮沿切割线112切割时，可将第一测试线120切割为两段，从而将第一测试线120断开，避免了第一测试线120与第二测试线130之间发生短路。
在另一实施例中，所述第一测试线120的弯折段121位于第一跨线部150的下侧，该弯折段121与切割线112呈交叉设置。同样，当刀轮沿切割线112切割时，可将第一测试线120切割为两段，从而将第一测试线120断开，避免了第一测试线120与第二测试线130之间发生短路。
请参阅图4，在又一实施例中，所述第一测试线120的弯折段121包括第一弯折段121a和第二弯折段121b，所述第一弯折段121a与所述第二弯折段121b分别位于所述第一跨线部150的相对两侧，且所述第一弯折段121a和所述第二弯折段121b均与所述切割线112呈交叉设置。当刀轮沿切割线112切割时，可将第一跨线部150孤立出来，从而能有效避免第一测试线120与第二测试线130之间发生短路。
请参阅图5，在上述各实施例的基础上，所述阵列基板100还包括第三测试线140，所述第三测试线140设于所述切割区113，且与所述第一测试线120呈交叉设置，所述第三测试线140与所述第一测试线120相互绝缘。
具体地，所述第三测试线140沿横向延伸，所述第三测试线140与第一测试线120位于阵列基板100的不同高度的层上，并且通过绝缘功能层170相互绝缘。所述阵列基板还包括第二跨线部160，所述第二跨线部160位于所述第一测试线120与所述第三测试线130的交叉重叠处。在此，需要说明的是，第一测试线120与第三测试线140呈交叉设置是指，第一测试线120与第三测试线140在基板本体110所在的平面内的投影呈交叉设置，也即第一测试线120与第三测试线140之间形成有跨线部。为了便于描述，可将第一测试线120与第三测试线140之间形成的跨线部定义为第二跨线部160。其中，所述第二跨线部160位于所述切割线112上。
在该实施例中，所述第一测试线120的弯折段121还包括第三弯折段121c，所述第三弯折段121c位于所述第三测试线140的远离所述第二测试线130的一侧，所述第三弯折段121c与所述切割线112呈交叉设置。如此，当刀轮沿切割线112切割时，可将第一跨线部150和第二跨线部160都孤立出来，从而避免了第二测试线130与第三测试线140之间发生短路。
在上述实施例的基础上，所述弯折段121与所述切割线112之间的夹角大于0°且小于等于90°。可选地，所述弯折段121与所述切割线112之间的夹角为30°、60°、70°、90°等。在此，所述弯折段121包括第一弯折段121a、第二弯折段121b及第三弯折段121c。
本申请还提出一种显示面板，该显示面板由上述阵列基板100切割形成。该阵列基板100的具体结构参照上述实施例，由于本阵列基板100采用了上述所有实施例的全部技术方案，因此至少具有上述实施例的技术方案所带来的所有有益效果，在此不再一一赘述。
以上所述仅为本申请的可选实施例，并非因此限制本申请的专利范围，凡是在本申请的发明构思下，利用本申请说明书及附图内容所作的等效结构变换，或直接/间接运用在其他相关的技术领域均包括在本申请的专利保护范围内。

Claims (20)

  1. 一种阵列基板，其中，所述阵列基板包括：
    基板本体，包括多个显示单元和位于多个显示单元之间的切割区；
    第一测试线，设于所述切割区；
    第二测试线，设于所述切割区，所述第二测试线与所述第一测试线呈交叉设置，所述第二测试线与所述第一测试线相互绝缘；以及
    切割线，设于所述切割区，所述第一测试线和/或所述第二测试线包括弯折段，所述弯折段与所述切割线呈交叉设置。
  2. 如权利要求1所述的阵列基板，其中，所述阵列基板还包括第一跨线部，所述第一跨线部位于所述第一测试线与所述第二测试线的交叉重叠处，所述第一跨线部位于所述切割线上。
  3. 如权利要求2所述的阵列基板，其中，所述第一测试线包括主体段、连接段及弯折段，所述连接段连接所述弯折段与所述主体段，所述主体段与所述第二测试线呈交叉设置。
  4. 如权利要求3所述的阵列基板，其中，所述弯折段位于所述第一跨线部的一侧。
  5. 如权利要求3所述的阵列基板，其中，所述弯折段包括第一弯折段和第二弯折段，所述第一弯折段与所述第二弯折段分别位于所述第一跨线部的相对两侧，所述第一弯折段与所述第二弯折段均与所述切割线呈交叉设置。
  6. 如权利要求1所述的阵列基板，其中，所述阵列基板还包括第三测试线，所述第三测试线设于所述切割区，且与所述第一测试线呈交叉设置，所述第三测试线与所述第一测试线相互绝缘。
  7. 如权利要求6所述的阵列基板，其中，所述阵列基板还包括第二跨线部，所述第二跨线部位于所述第一测试线与所述第三测试线的交叉重叠处，所述第二跨线部位于所述切割线上。
  8. 如权利要求7所述的阵列基板，其中，所述弯折段还包括第三弯折段，所述第三弯折段位于所述第三测试线的远离所述第二测试线的一侧，所述第三弯折段与所述切割线呈交叉设置。
  9. 如权利要求1所述的阵列基板，其中，所述弯折段与所述切割线之间的夹角大于0°且小于等于90°。
  10. 一种阵列基板，其中，所述阵列基板包括：
    基板本体，包括多个显示单元和切割区，多个所述显示单元呈阵列排布，多个所述显示单元之间的间隙形成所述切割区；
    第一测试线，设于所述切割区；
    第二测试线，设于所述切割区，所述第二测试线与所述第一测试线呈交叉设置，所述第二测试线与所述第一测试线相互绝缘；以及
    切割线，设于所述切割区，所述第一测试线和/或所述第二测试线包括弯折段，所述弯折段与所述切割线呈交叉设置。
  11. 一种显示面板，其中，所述显示面板由阵列基板切割形成，所述阵列基板包括：
    基板本体，包括多个显示单元和位于多个显示单元之间的切割区；
    第一测试线，设于所述切割区；
    第二测试线，设于所述切割区，所述第二测试线与所述第一测试线呈交叉设置，所述第二测试线与所述第一测试线相互绝缘；
    切割线，设于所述切割区，所述第一测试线和/或所述第二测试线包括弯折段，所述弯折段与所述切割线呈交叉设置。
  12. 如权利要求11所述的显示面板，其中，所述阵列基板还包括第一跨线部，所述第一跨线部位于所述第一测试线与所述第二测试线的交叉重叠处，所述第一跨线部位于所述切割线上。
  13. 如权利要求12所述的显示面板，其中，所述第一测试线包括主体段、连接段及弯折段，所述连接段连接所述弯折段与所述主体段，所述主体段与所述第二测试线呈交叉设置。
  14. 如权利要求13所述的显示面板，其中，所述弯折段位于所述第一跨线部的一侧。
  15. 如权利要求13所述的显示面板，其中，所述弯折段包括第一弯折段和第二弯折段，所述第一弯折段与所述第二弯折段分别位于所述第一跨线部的相对两侧，所述第一弯折段与所述第二弯折段均与所述切割线呈交叉设置。
  16. 如权利要求11所述的显示面板，其中，所述阵列基板还包括第三测试线，所述第三测试线设于所述切割区，且与所述第一测试线呈交叉设置，所述第三测试线与所述第一测试线相互绝缘。
  17. 如权利要求16所述的显示面板，其中，所述阵列基板还包括第二跨线部，所述第二跨线部位于所述第一测试线与所述第三测试线的交叉重叠处，所述第二跨线部位于所述切割线上。
  18. 如权利要求17所述的显示面板，其中，所述弯折段还包括第三弯折段，所述第三弯折段位于所述第三测试线的远离所述第二测试线的一侧，所述第三弯折段与所述切割线呈交叉设置。
  19. 如权利要求11所述的显示面板，其中，所述弯折段与所述切割线之间的夹角大于0°且小于等于90°。
  20. 如权利要求11所述的显示面板，其中，多个所述显示单元呈阵列排布，多个所述显示单元之间的间隙形成所述切割区。
PCT/CN2018/116880 2018-09-30 2018-11-22 阵列基板和显示面板 WO2020062513A1 (zh)

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